CN103308286B - Method for detecting parameters of lenticular grating for three-dimensional printing - Google Patents
Method for detecting parameters of lenticular grating for three-dimensional printing Download PDFInfo
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- CN103308286B CN103308286B CN201310256926.2A CN201310256926A CN103308286B CN 103308286 B CN103308286 B CN 103308286B CN 201310256926 A CN201310256926 A CN 201310256926A CN 103308286 B CN103308286 B CN 103308286B
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- grating
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- electronic digital
- digital micrometer
- column mirror
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Abstract
The invention discloses a method for detecting parameters of a lenticular grating for three-dimensional printing. The method comprises the steps of fixedly placing the lenticular grating to be detected on a workbench; adjusting the position of an electronic digital micrometer on an electronic digital micrometer mounting base; moving the electronic digital micrometer along a first direction and acquiring data of the electronic digital micrometer mounting base in the first/second direction by using a data acquisition module, wherein the first direction is perpendicular to the second direction; saving the measured data of the electronic digital micrometer mounting base in the first direction and data of the electronic digital micrometer in the second direction; and analyzing test data, fitting the curved surface of the lenticular grating to be detected and calculating the parameters of the lenticular grating to be detected. By means of the method, the parameters of the lenticular grating to be detected can be detected in real time through a computer, printing of test strips or production of test images are not needed, and errors caused by artificial observation are avoided. The method has the advantages of high efficiency, high stability and high reliability.
Description
Technical field
The invention belongs to technical field of optical detection, relate to a kind of column mirror grating parameter detection method, particularly relate to a kind of stereosopic printing column mirror grating parameter detection method.
Background technology
In Traditional Printing Industry, common dimensional printing goods glides gradually in the status in Information Communication field.And make static two dimensional image become lifelike stereosopic printing, just impact the visual experience of people, become a new growth engines of printing industry.Original screen panel refraction point picture technology and printing technology have been merged in stereosopic printing, by the multiple image printing through specific coding process at grade, utilize grating to make plane picture present the mode of printing of three-dimensional stereoscopic visual effect or animation variable effects.At present, stereosopic printing market grating used is mainly cylindrical lens raster, be called for short column mirror grating, be apply at most, be also the most ripe grating material.
Column mirror grating board parameter comprises grid stroke number LPI (pitch p=25.4/LPI, unit: mm), thickness d, radius of curvature R, refractive index n and transmissivity S.Have selected sheet material, refractive index n and transmissivity S just fixes.Column mirror grating producer can provide the theoretical value of a column mirror grating line number, and owing to producing the existence of error in batches, this value is accurate not.Wright's major concern of stereosopic printing be the number of line accurately or the pitch of column mirror grating used.Because when using the stereo-picture of 3 D stereo software development stereosopic printing of specialty, that according to column mirror grating board parameter, longitudinal strip segmentation numbering is carried out to left and right visual pattern, again according to shooting time image institute occupy location order will number equally bar order arrange, form the image comprising steric information that a width is new.
The accuracy of column mirror grating line number is the committed step of stereosopic printing success or failure.When column mirror grating is proofreaded correct, the stereoscopic picture plane of printing can be very clear, do not rock a little, do not feel dizzy, and seems very comfortable.Otherwise then fuzzy pictures, dangles, and feels dizzy, uncomfortable, if become picture, then what become is not thorough, has ghost.So before stereosopic printing, the line number tool how accurately detecting column mirror grating used has very important significance.
Column mirror grating line number test process conventional is at present as follows:
(1) the Molded Line number of the 3 D grating provided according to column mirror grating producer, prints approximate range with grating testing software, then covers column mirror grating, relatively complete black complete white by which test-strips of observation;
(2) on the basis of this close test-strips, the more high-precision gratings strips of regeneration, covers column mirror grating test, until complete black complete white, corresponding gratings strips is exactly the grid stroke number that will look for.
He Saijun is in Master's thesis " the multi-view auto stereo display technique based on column mirror grating is studied " in 2009 and the patent CN 200810062514.4 " the general grating measurement method of parameters based on pole mirror grating LCD freedom stereoscopic display device " that obtains the authorization on January 13rd, 2010, adopt by observing complete black complete white RGB image based on the LCD free stereo display equipment of column mirror grating, measure line number and the pitch angle of column mirror grating.Can the method have made traditional printing test bar on LCD, show complete black complete white RGB image into, still obtain entirely black or entirely white effect by manual observation.
The defect of conventional stereo grating check and correction technology can be found out: (1) test and comparison bothers, and needs print a lot of test-strips or make a lot of test pattern from said method; (2) judged whether entirely black or entirely white by artificial vision, human factor impact is larger; (3) accuracy of detection cannot ensure.
In view of this, nowadays in the urgent need to designing a kind of new column mirror grating parameter detection method, to overcome now methodical above-mentioned defect.
Summary of the invention
Technical matters to be solved by this invention is: provide a kind of stereosopic printing column mirror grating parameter detection method, can accurately, quick, stereosopic printing column mirror grating line number LPI automatically.
For solving the problems of the technologies described above, the present invention adopts following technical scheme:
A kind of stereosopic printing column mirror grating parameter detection method, described detection method comprises the steps:
Step S1, by tested column mirror grating fixed placement on work top, tested column mirror grating have grating towards upper;
Step S2, the adjustment position of Electronic Digital Micrometer on Electronic Digital Micrometer mount pad, make contact be pressed near the low spot of initial grating, and continue to press down setpoint distance, locking Electronic Digital Micrometer position, and return to zero;
Step S3, Electronic Digital Micrometer mount pad move along first direction, are gathered by data acquisition module to the data of second direction in the position data of the first direction of Electronic Digital Micrometer mount pad and Electronic Digital Micrometer simultaneously; Described first direction is parallel with work top place plane;
The data of second direction in step S4, the position data of preserving the first direction of the Electronic Digital Micrometer mount pad measured and Electronic Digital Micrometer;
Step S5, test data to be analyzed, simulate tested column mirror grating curved surface, calculate the parameter of tested column mirror grating plate.
As a preferred embodiment of the present invention, in described step S3, described Electronic Digital Micrometer mount pad drives accurate lead screw nut body to realize along the movement of first direction by the motor with speed reduction unit, ensures its direction of motion, by its position data of high precision position grating record by pair of guide rails;
Electronic Digital Micrometer contact is passive movement in the motion of second direction, the contact of Electronic Digital Micrometer keeps in touch with tested column mirror grating curved surface when tested column mirror grating surface is mobile always, so the contact of Electronic Digital Micrometer has reacted the curved surface change on tested column mirror grating surface in the change in location of second direction;
Computing machine gathers the data of second direction in the data of Electronic Digital Micrometer mount pad first direction high precision position grating and Electronic Digital Micrometer by data acquisition module simultaneously; Show the contour curve of tested column mirror grating on the computer screen in real time, and mark transverse and longitudinal coordinate.
As a preferred embodiment of the present invention, the contact of described Electronic Digital Micrometer to be radius the be special bead of 5 microns.
As a preferred embodiment of the present invention, in described step S5, according to the first direction collected and second direction data, calculate the step of tested column mirror grating line number LPI, pitch p, thickness d and grating profile radius R:
In step S51, measurement data, first direction data are (x
1, x
2..., x
p) and second direction data be (z
1, z
2..., z
p);
Step S52, utilize above-mentioned data to show grating circular arc camber shape on computers in real time, and carry out screening to data and analyze;
Step S53, experiment curv beginning and end is not formed complete grating arc surface data delete;
Step S54, the first direction data marking off Article 1 grating are (x
11, x
12, x
13..., x
1 (m-1), x
1m), the second direction data of its correspondence are (z
11, z
12, z
13..., z
1 (m-1), z
1m); The first direction data of Article 2 grating are (x
21, x
22, x
23..., x
2 (s-1), x
2s), the second direction data of its correspondence are (z
21, z
22, z
23..., z
2 (s-1), z
2s); In like manner, the first direction data of n-th grating are (x
n1, x
n2, x
n3..., x
n (q-1), x
nq), the second direction data of its correspondence are (z
n1, z
n2, z
n3..., z
n (q-1), z
nq);
Step S55, to find out Article 1 grating to the coordinate of the minimum point of n-th grating be (x
1L, z
1L), (x
2L, z
2L) ..., (x
nL, z
nL), the coordinate of peak is (x
1H, z
1H), (x
2H, z
2H) ..., (x
nH, z
nH), go out grating radius R with least square fitting
1, R
2..., R
n;
Step S56, the average pitch calculating tested grating are
then the average line number of this original screen panel is the thickness of LPI=25.4/p, grating
and radius-of-curvature
As a preferred embodiment of the present invention, in step S1, align with the reference field of work top and be close in one end of tested column mirror grating; In step S2, Electronic Digital Micrometer contact is pressed near the low spot of tested grating Article 1, and continues to press down about 0.5mm, locking Electronic Digital Micrometer position, and return to zero.
As a preferred embodiment of the present invention, in step S4, while preservation measurement data, computer interface draws change curve in real time.
The stereosopic printing column mirror grating parameter detection method that the present invention proposes, its beneficial effect is:
1) the inventive method detects tested column mirror grating parameter in real time by computing machine, does not need printing test bar or makes test pattern, avoiding the error that artificial observation brings, have the advantage of high-level efficiency, high stability and high reliability;
2) the present invention can by tested column mirror grating shape of cross section by Real time vision out, concerning directly perceived, vivid tester;
3) because the inventive method horizontal and vertical position detection grating precision is high, the accuracy requirement doing stereosopic printing can be met;
4) apparatus structure that uses of column mirror grating parameter detection method of the present invention is simple, and the data value of detection is accurately reliable, has good market outlook.
Accompanying drawing explanation
Fig. 1-1 is the tested column mirror grating appearance schematic diagram of the present invention.
Fig. 1-2 is single tested column mirror grating Parameter Map.
Fig. 2 is the column mirror grating line number detection method schematic diagram of stereosopic printing of the present invention.
Fig. 3 is the column mirror grating line number pick-up unit schematic layout pattern of stereosopic printing of the present invention.。
Fig. 4 is test data schematic diagram.
Label title in accompanying drawing:
Tested column mirror grating 1; Electronic Digital Micrometer 2; Electronic Digital Micrometer contact 21; Electronic Digital Micrometer mount pad 3; Driving mechanism 4; Work top 5; Vertical reference face 51; Level reference 52; High precision position grating 6;
Pitch p; Thickness d; Radius of curvature R;
Article 1, the highest, the minimum point coordinate of grating are (x
1H, z
1H), (x
1L, z
1L);
The highest, the minimum point coordinate of Article 2 grating are (x
2H, z
2H), (x
2L, z
2L);
Article n-th, the highest, the minimum point coordinate of grating are (x
nH, z
nH), (x
nL, z
nL).
Embodiment
The preferred embodiments of the present invention are described in detail below in conjunction with accompanying drawing.
Embodiment one
Refer to Fig. 2, Fig. 3, present invention is disclosed a kind of stereosopic printing column mirror grating line number detection method, specifically comprise the following steps:
Tested column mirror grating 1 is positioned on marble countertop 5 by [step S1], the left end of column mirror grating 1 aligns with the vertical reference face 51 of marble countertop 5 and is close to, tested column mirror grating 1 have grating towards upper, plane is placed on the level reference 52 of marble countertop 5.
[step S2] starts test macro, all the sensors initialization; As shown in Fig. 1-1, Fig. 1-2, set up coordinate system, X-axis, Y-axis are arranged on marble countertop (or tested column mirror grating plane), or parallel with marble countertop (or tested column mirror grating plane).Motor drives Electronic Digital Micrometer mount pad 3 to move in X direction near rightmost Article 1 grating low spot, and continues to press down 0.3 ~ 0.8mm (as 0.5mm), also returns to zero in locking Electronic Digital Micrometer position.
[step S3] starts to measure, Electronic Digital Micrometer mount pad 3 moves along X negative direction, computing machine gathers the data of high precision position grating 6 and Electronic Digital Micrometer USB or serial ports by high-speed data acquisition card simultaneously, what high precision position grating 6 recorded is the position of the X-direction of Electronic Digital Micrometer mount pad 3, Electronic Digital Micrometer USB or serial ports record be the displacement that Electronic Digital Micrometer contact 21 produces in Z-direction, the contour curve of grating can be shown simultaneously on the computer screen in real time, and mark transverse and longitudinal coordinate.
Particularly, in the present embodiment, the movement of described Electronic Digital Micrometer mount pad 3 (namely parallel with work top direction) is in the horizontal direction realized by driving mechanism 4, driving mechanism 4 drives accurate lead screw nut body to realize by the motor of band speed reduction unit, ensured the direction of motion of Electronic Digital Micrometer mount pad 3 by pair of guide rails, record its position data by high precision position grating 6.Electronic Digital Micrometer contact 21 motion is in the vertical direction passive movement, Electronic Digital Micrometer contact 21 keeps in touch with tested column mirror grating curved surface when tested column mirror grating surface is mobile always, so the change in location in the vertical direction of Electronic Digital Micrometer contact 21 has reacted the curved surface change on tested column mirror grating 1 surface.Computing machine gathers the data of high precision position grating 6 and Electronic Digital Micrometer contact 21 by data acquisition module simultaneously; Show the contour curve of tested column mirror grating on the computer screen in real time, and mark transverse and longitudinal coordinate.
[step S4] is saved in the data of the X-direction measured in step S3 and Z-direction in database, can inquire about in the historical data later, and can show the historical data curve of grating on computer interface;
[step S5] analyzes test data, calculates grid stroke number LPI, pitch p, thickness d and grating profile radius R, and LPI dimensionless, its counit is mm.
Step S5 specifically comprises the steps:
The X-direction data of step S51, measurement are (x
1, x
2..., x
p) and Z-direction data be (z
1, z
2..., z
p);
Step S52, utilize above-mentioned data to show grating circular arc camber shape on computers in real time, and carry out screening to data and analyze;
Step S53, experiment curv beginning and end is not formed complete grating arc surface data delete;
Step S54, the X-direction data marking off Article 1 grating are (x
11, x
12, x
13..., x
1 (m-1), x
1m), the Z-direction data of its correspondence are (z
11, z
12, z
13..., z
1 (m-1), z
1m); The X-direction data of Article 2 grating are (x
21, x
22, x
23..., x
2 (s-1), x
2s), the Z-direction data of its correspondence are (z
21, z
22, z
23..., z
2 (s-1), z
2s); In like manner, the X-direction data of n-th grating are (x
n1, x
n2, x
n3..., x
n (q-1), x
nq), the Z-direction data of its correspondence are (z
n1, z
n2, z
n3..., z
n (q-1), z
nq);
Step S55, refer to Fig. 4, finding out Article 1 grating to the coordinate of the minimum point of n-th grating is (x
1L, z
1L), (x
2L, z
2L) ..., (x
nL, z
nL), the coordinate of peak is (x
1H, z
1H), (x
2H, z
2H) ..., (x
nH, z
nH), go out grating radius R with least square fitting
1, R
2..., R
n;
Step S56, the average pitch calculating tested grating are
then the average line number of this original screen panel is the thickness of LPI=25.4/p, grating
and radius-of-curvature
In sum, the stereosopic printing column mirror grating parameter detection method that the present invention proposes, tested column mirror grating parameter is detected in real time by computing machine, do not need printing test bar or make test pattern, avoid the error that artificial observation brings, there is the advantage of high-level efficiency, high stability and high reliability.Meanwhile, the present invention can by tested column mirror grating shape of cross section by Real time vision out, concerning directly perceived, vivid tester.Because the inventive method horizontal and vertical position data precision is high, the accuracy requirement doing stereosopic printing can be met.In addition, the apparatus structure that column mirror grating parameter detection method of the present invention uses is simple, and the data value of detection is accurately reliable, has good market outlook.
Here description of the invention and application is illustrative, not wants by scope restriction of the present invention in the above-described embodiments.Distortion and the change of embodiment disclosed are here possible, are known for the replacement of embodiment those those of ordinary skill in the art and the various parts of equivalence.Those skilled in the art are noted that when not departing from spirit of the present invention or essential characteristic, the present invention can in other forms, structure, layout, ratio, and to realize with other assembly, material and parts.When not departing from the scope of the invention and spirit, can other distortion be carried out here to disclosed embodiment and change.
Claims (7)
1. a stereosopic printing column mirror grating parameter detection method, is characterized in that, described detection method comprises the steps:
Step S1, by tested column mirror grating fixed placement on work top, tested column mirror grating have grating towards upper;
Step S2, the adjustment position of Electronic Digital Micrometer on mount pad, make contact be pressed near the low spot of tested grating Article 1, and continue to press down setpoint distance, locking Electronic Digital Micrometer position, and return to zero;
Step S3, Electronic Digital Micrometer mount pad move along first direction, are gathered by data acquisition module to the data of second direction in the position data of the first direction of Electronic Digital Micrometer mount pad and Electronic Digital Micrometer simultaneously; Described first direction is parallel with work top place plane, second direction and work top place plane orthogonal;
The data of second direction in step S4, the position data of preserving the first direction of the Electronic Digital Micrometer mount pad measured and Electronic Digital Micrometer;
Step S5, test data to be analyzed, simulate tested column mirror grating curved surface, calculate the parameter of tested column mirror grating plate.
2. stereosopic printing column mirror grating parameter detection method according to claim 1, is characterized in that:
In described step S3, described Electronic Digital Micrometer mount pad drives accurate lead screw nut body to realize along the movement of first direction by the motor with speed reduction unit, ensures its direction of motion, by its position data of high precision position grating record by pair of guide rails;
The contact of Electronic Digital Micrometer is passive movement in the motion of second direction, the contact of Electronic Digital Micrometer keeps in touch with tested column mirror grating curved surface when tested column mirror grating surface is mobile always, so the data variation of second direction has reacted the curved surface change on tested column mirror grating surface in Electronic Digital Micrometer, these data by USB port or serial ports by data collecting module collected;
Computing machine gathers the data of second direction in the data of Electronic Digital Micrometer mount pad first direction high precision position grating and Electronic Digital Micrometer by data acquisition module simultaneously; Show the contour curve of tested column mirror grating on the computer screen in real time, and mark transverse and longitudinal coordinate.
3. stereosopic printing column mirror grating parameter detection method according to claim 2, is characterized in that:
The bead that the contact of described Electronic Digital Micrometer is customization, radius is 5 microns.
4., according to the column mirror grating parameter detection method of the stereosopic printing one of claims 1 to 3 Suo Shu, it is characterized in that:
In described step S5, according to the data of the Electronic Digital Micrometer mount pad collected second direction in the data and Electronic Digital Micrometer of first direction, calculate the step of tested column mirror grating line number LPI, pitch p, thickness d and grating profile radius R:
In step S51, measurement data, first direction data are (x
1, x
2..., x
p) and second direction data be (z
1, z
2..., z
p);
Step S52, utilize above-mentioned data to show grating circular arc camber shape on computers in real time, and carry out screening to data and analyze;
Step S53, experiment curv beginning and end is not formed complete grating arc surface data delete;
Step S54, the first direction data marking off Article 1 grating are (x
11, x
12, x
13..., x
1 (m-1), x
1m), the second direction data of its correspondence are (z
11, z
12, z
13..., z
1 (m-1), z
1m); The first direction data of Article 2 grating are (x
21, x
22, x
23..., x
2 (s-1), x
2s), the second direction data of its correspondence are (z
21, z
22, z
23..., z
2 (s-1), z
2s); In like manner, the first direction data of n-th grating are (x
n1, x
n2, x
n3..., x
n (q-1), x
nq), the second direction data of its correspondence are (z
n1, z
n2, z
n3..., z
n (q-1), z
nq);
Step S55, to find out Article 1 grating to the coordinate of the minimum point of n-th grating be (x
1L, z
1L), (x
2L, z
2L) ..., (x
nL, z
nL), the coordinate of peak is (x
1H, z
1H), (x
2H, z
2H) ..., (x
nH, z
nH), go out grating radius R with least square fitting
1, R
2..., R
n;
Step S56, the average pitch calculating tested grating are
then the average line number of this original screen panel is the thickness of LPI=25.4/p, grating
and radius-of-curvature
5. stereosopic printing column mirror grating parameter detection method according to claim 1, is characterized in that:
In step S1, align with the reference field of work top and be close in one end of tested column mirror grating.
6. stereosopic printing column mirror grating parameter detection method according to claim 1, is characterized in that:
In step S2, regulating the position of Electronic Digital Micrometer on mount pad, contact is pressed near the low spot of tested grating Article 1, and continues to press down 0.3 ~ 0.8mm, also returns to zero in locking Electronic Digital Micrometer position.
7. stereosopic printing column mirror grating parameter detection method according to claim 1, is characterized in that:
In step S4, while preservation measurement data, computer interface draws change curve in real time.
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| CN201310256926.2A CN103308286B (en) | 2013-06-25 | 2013-06-25 | Method for detecting parameters of lenticular grating for three-dimensional printing |
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| CN104273678B (en) * | 2014-09-25 | 2016-06-01 | 中山市沙溪镇新顺怡印花绣花厂 | Naked can look the clothes of stereoscopic printing image |
| CN107655660A (en) * | 2017-10-31 | 2018-02-02 | 江苏中升立体显示科技有限公司 | The column mirror grating measurement method of parameters of bore hole 3D display equipment |
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| WO2000004360A1 (en) * | 1998-07-15 | 2000-01-27 | Eastman Chemical Company | Method for determining quality of lenticular sheet |
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