CN103294837A - 一种集成电路的验证调试方法及系统 - Google Patents
一种集成电路的验证调试方法及系统 Download PDFInfo
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103647966A (zh) * | 2013-12-20 | 2014-03-19 | 广东威创视讯科技股份有限公司 | 一种基于fpga图像数据检测方法及装置 |
CN105389239A (zh) * | 2015-12-10 | 2016-03-09 | 浪潮电子信息产业股份有限公司 | 天梭k1系统路由模块寄存器信息自动校验方法 |
CN110324508A (zh) * | 2018-03-29 | 2019-10-11 | 佳能株式会社 | 图像形成设备和图像形成设备的控制方法 |
CN115510782A (zh) * | 2022-08-31 | 2022-12-23 | 芯华章科技股份有限公司 | 定位验证错误的方法、电子设备和存储介质 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060156264A1 (en) * | 2003-10-31 | 2006-07-13 | Fujitsu Limited | Method and apparatus for supporting verification of system, and computer product |
CN1841079A (zh) * | 2005-03-28 | 2006-10-04 | 大唐移动通信设备有限公司 | 一种可编程逻辑器件配置的检测方法 |
CN101140596A (zh) * | 2007-10-12 | 2008-03-12 | 成都华微电子系统有限公司 | 现场可编程门阵列查找表验证方法 |
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- 2012-02-23 CN CN201210042767.1A patent/CN103294837B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060156264A1 (en) * | 2003-10-31 | 2006-07-13 | Fujitsu Limited | Method and apparatus for supporting verification of system, and computer product |
CN1841079A (zh) * | 2005-03-28 | 2006-10-04 | 大唐移动通信设备有限公司 | 一种可编程逻辑器件配置的检测方法 |
CN101140596A (zh) * | 2007-10-12 | 2008-03-12 | 成都华微电子系统有限公司 | 现场可编程门阵列查找表验证方法 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103647966A (zh) * | 2013-12-20 | 2014-03-19 | 广东威创视讯科技股份有限公司 | 一种基于fpga图像数据检测方法及装置 |
CN103647966B (zh) * | 2013-12-20 | 2016-03-30 | 广东威创视讯科技股份有限公司 | 一种基于fpga图像数据检测方法及装置 |
CN105389239A (zh) * | 2015-12-10 | 2016-03-09 | 浪潮电子信息产业股份有限公司 | 天梭k1系统路由模块寄存器信息自动校验方法 |
CN110324508A (zh) * | 2018-03-29 | 2019-10-11 | 佳能株式会社 | 图像形成设备和图像形成设备的控制方法 |
CN115510782A (zh) * | 2022-08-31 | 2022-12-23 | 芯华章科技股份有限公司 | 定位验证错误的方法、电子设备和存储介质 |
CN115510782B (zh) * | 2022-08-31 | 2024-04-26 | 芯华章科技股份有限公司 | 定位验证错误的方法、电子设备和存储介质 |
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Address after: 3 / F, C1 area, innovation building, 182 science Avenue, Science City, Guangzhou, Guangdong 510663 Patentee after: Guangzhou Ankai Microelectronics Co.,Ltd. Address before: 3 / F, C1 area, innovation building, 182 science Avenue, Science City, Guangzhou, Guangdong 510663 Patentee before: ANYKA (GUANGZHOU) MICROELECTRONICS TECHNOLOGY Co.,Ltd. |
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