CN103278762A - Testing device and testing method for solar cell chips - Google Patents
Testing device and testing method for solar cell chips Download PDFInfo
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- CN103278762A CN103278762A CN2013102118446A CN201310211844A CN103278762A CN 103278762 A CN103278762 A CN 103278762A CN 2013102118446 A CN2013102118446 A CN 2013102118446A CN 201310211844 A CN201310211844 A CN 201310211844A CN 103278762 A CN103278762 A CN 103278762A
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
The invention discloses a testing device for a plurality of solar cells, the testing device comprises a bearing disk, a light shield and a light guiding structure, wherein the bearing disk is used for bearing wafers of the cells to be tested, the light shield is located on the bearing disk and covers all the wafers of the cells to be tested, a window is formed in the top or the side wall of the light shied, the light guiding structure is fixed on the light shield through the window of the light shield, the two end portions of the light guiding structure are provided with openings, the opening of the first end portion is located outside the light shield, the opening of the second end portion is located inside the light shield, and the sizes of the openings of the light guiding structure are same as those of solar cell chips to be tested; in the testing process of the wafers of the cells, an external light source irradiates light on the chips to be tested of the wafers of the cells through the light guiding structure in an incident mode. According to the structure, due to arrangement of the light shield, all the wafers of the solar cells are covered; the testing light source only irradiates the light on the chips of the wafers of the solar cells through the light guiding structure in the incident mode and does not irradiate the light on chips adjacent to the chips of the wafers of the solar cells, and therefore the chips adjacent to the chips of the wafers of the solar cells are prevented from affecting a testing result.
Description
Technical field
The present invention relates to the solar cell test field, relate more specifically to a kind of device for multijunction solar cell chip testing, it is particularly suitable for the multijunction solar cell based on the two-sided growth of substrate.
Background technology
The multijunction solar cell chip generally adopts MOCVD equipment to go up epitaxial growth two junction batteries at substrate (as Ge, InP, GaAs etc.), and substrate itself is as end battery.Be example with battery at the bottom of the Ge, generally when test the type cell photoelectric performance, only need will in, the top battery separates and forms single chip, need not to separate end battery, this because end battery short circuit electric current far above in the upper strata, the top battery, even do not separate end battery, the photogenerated current that battery produces at the bottom of the battery chip that closes on mutually conducts at the survey chip through substrate and also can not impact test result.
Conventional three-junction solar battery adopts germanium as substrate, its advantage be germanium material with in, top battery material lattice coupling, easily grown crystal matter measured in, the top battery, but its shortcoming also is tangible, the battery band gap is too low at the bottom of the germanium, the short-circuit current that produces much larger than in, the top battery, cause energy dissipation.At the band-gap problem, people have developed band-gap, the novel multijunction cell epitaxial structure of lattice mismatch, mainly contain upside-down mounting three junction batteries and based on the three-joint solar cell of the two-sided growth of substrate, its band gap is formed basically identical, but two-sided growth is owing to need not upside-down mounting growth, therefore need not to adopt in follow-up chip technology technology such as bonding that epitaxial loayer is inverted, is shifted, and greatly reduces technology difficulty.
Summary of the invention
The invention discloses a kind of proving installation of multijunction solar cell, it arranges a light shield and is used for the whole solar cell disk is all covered, and testing light source only is incident on the chip of solar cell disk by a guide structure, and its contiguous unglazed photograph of chip, thereby avoided the influence of adjacent chips to test result.
Concrete scheme of the present invention is: the solar cell test device, and it comprises: carrier is used for carrying mesuring battary disk; Light shield is positioned on the described carrier, and described mesuring battary disk is all covered, and its top or sidewall have window; Guide structure, window fixed by described light shield is on light shield, and both ends have opening, and wherein the opening of first end is positioned at outside the described light shield, the opening of the second end is positioned at described light shield, its opening size and solar battery chip to be measured measure-alike; In the battery wafer test process, external light source is incident on the chip to be measured of described battery disk by described guide structure.
In when test, described light shield is installed on the carrier, and the whole solar cell disk is all covered, and cushion is equipped with in its sidewall bottom, guarantees that light shield and described carrier are combined closely and light tight.
The window fixed of described guide structure by described light shield is on light shield, and it can be positioned at top or the sidewall of light shield.In certain embodiments, guide structure is positioned at the top of light shield, and its sidewall and light shield window edge are combined closely.In certain embodiments, guide structure is positioned at the sidewall of light shield.In certain embodiments, the window of described light shield is rectangle, and its length breadth ratio is identical with the cross section length breadth ratio of described guide structure.
Preferably, the opening of described guide structure first end is greater than the opening of the second end.In certain embodiments, described guide structure is divided into two parts, and first is concentration structure, and second portion is light guide structure, and wherein concentration structure can be down bucking ladder, and light guide structure can be rectangular cylinder.Particularly, the length and width in described rectangular cylinder cross section equate substantially with battery chip length and width to be measured; The opening of described the second end is 3 ~ 5mm from the height of mesuring battary chip.In certain embodiments, described guide structure is for falling trapezoidal optical prism or light funnel.
Aforementioned proving installation is specially adapted to adopt the solar cell of two-sided growth on the substrate.Concrete grammar comprises following step: comprise step: a two-sided growth multijunction solar cell disk to be measured is provided, and Qi Ding, middle battery material layer are separated into a series of unit by chip size, and end battery material layer does not separate; Described solar cell disk after the aforementioned processing is placed in the aforementioned proving installation, and wherein the to-be-measured cell of solar cell disk is corresponding with second opening of described guide structure; One testing light source is provided, is incident to by described guide structure on the to-be-measured cell of described solar cell disk, test relative photo electrical quantity.
Compared with prior art, the present invention has the following advantages at least:
The device of the solar cell test that the present invention is disclosed is being surveyed chip because testing light source can only shine by described guide structure, and its contiguous unglazed photograph of chip, thereby avoided the influence of adjacent chips to test result.Further, adopt device disclosed by the invention to test, the end battery of battery chip need not to separate and can accurately test, therefore thereby can directly adopt the chip technology flow process of conventional multijunction cell such as the making of the multijunction solar cell chip of the two-sided growth of substrate, greatly reduce technology difficulty and cost.
Description of drawings
Accompanying drawing is used to provide further understanding of the present invention, and constitutes the part of instructions, is used from explanation the present invention with embodiments of the invention one, is not construed as limiting the invention.In addition, the accompanying drawing data are to describe summary, are not to draw in proportion.
Fig. 1 has illustrated a kind of epitaxial structure of two-sided growth multijunction solar cell chip.
Fig. 2 has illustrated will be subjected to the influence of its adjacent chips at the survey chip by the two-sided growth multijunction solar cell of employing conventionally test device to test chip.
Fig. 3 has illustrated the two-sided growth multijunction solar cell of employing conventionally test device to test chip, even end battery is separated, the electric current that battery produces at the bottom of surveying the contiguous chip of chip still can conduct to by substrate and survey chip.
Fig. 4 has illustrated a kind of device for the chip testing of two-sided growth multijunction solar cell of the embodiment of the invention 1.
Fig. 5 has illustrated a kind of device for the chip testing of two-sided growth multijunction solar cell of the embodiment of the invention 2.
Among the figure:
101: the top battery
102: middle battery
103: end battery
104: substrate
105: front electrode
106: backplate
200: carrier
301: light shield
302: guide structure
302a: fall bucking ladder
302b: rectangular cylinder
303: the light shield cushion.
Embodiment
Multijunction solar cell based on the two-sided growth of substrate can obtain by following method: please refer to accompanying drawing 1, adopt gallium arsenide twin polishing substrate 104, at first in upper surface epitaxial growth routine, top battery 102,101, then with the substrate upset, at the end battery 103 of its lower surface epitaxial growth lattice mismatch.Different with conventional three junction batteries is: three knot battery short circuit electric currents of two-sided growth multijunction cell mate substantially, requirement is when adopting its photoelectric properties of conventionally test device to test, simultaneously will in, the top and bottom battery all separates, otherwise the short-circuit current I that contiguous battery chip produces
2To impact test result, thereby cause erroneous judgement to end battery performance, please refer to accompanying drawing 2.
Please refer to accompanying drawing 3, for easy to operate, cell substrate is not separated when test usually, and just each sub-battery functi on layer is separated.If yet adopt conventional all-metal carrier carrying battery disk, even end battery is separated, the end battery current I2 of adjacent chips still can conduct to through substrate and survey battery.
At the problems referred to above, following embodiment discloses a kind of for the device based on the multijunction solar cell chip testing of the two-sided growth of substrate, it arranges a light shield and is used for the whole solar cell disk is all covered, and testing light source only is incident on the chip of solar cell disk by a guide structure, and its contiguous unglazed photograph of chip, thereby avoided the influence of adjacent chips to test result.Adopt this kind device to test, the end battery of battery chip need not to separate and can accurately test.
Describe embodiments of the present invention in detail below with reference to drawings and Examples, how the application technology means solve technical matters to the present invention whereby, and the implementation procedure of reaching technique effect can fully understand and implements according to this.
Embodiment 1
In the present embodiment, solar cell to be measured is the multijunction solar cell disk based on the two-sided growth of substrate, wherein in, top battery 102,101 adopts common process to separate, end battery 103 does not separate, chip is square, the length of side is 10mm.
Please refer to accompanying drawing 4, a kind of proving installation of solar cell comprises: carrier 200, light shield 301, guide structure 302.
Particularly, carrier 200 is metal material, can directly adopt and conventionally test device identical materials.
Test for convenience, light shield 301 can be adopted upper and lower lifting design, rise when placing or extract the test battery disk, fall during test, and guarantee that light shield cushion 303 and carrier 200 fit tightly.When light shield 301 was fallen, the distance of guide structure 302 lower surfaces and carrier 200 was 3mm to 5mm, guaranteed not have scattered light and entered contiguous battery chip.
In test, aforementioned multijunction solar cell disk to be measured is positioned over carrier 200, to have the light shield 301 of guide structure 302 then on carrier 200, the mesuring battary disk is all covered, the opening of the bottom of guide structure 302 is aimed at chip to be measured.Testing light source light is incident to the upper end opening of guide structure and exposes on the chip to be measured of solar cell disk from the opening of bottom, can test the relative photo electrical quantity of single chip.
Embodiment 2
Please refer to accompanying drawing 5, guide structure 302 adopts the light funnel in the present embodiment, and it is divided into two parts up and down, top is the 302a of falling the bucking ladder, the 302a of falling bucking ladder upper surface is that the length of side is the square of 15mm, and lower surface is that the length of side is 10mm or smaller square, and the 302a of falling the bucking ladder highly is 10mm.Optical prism 302 bottoms are square column 302b, and its length of side equates that with the 302a of falling the bucking ladder lower surface length of side on top it highly is 10mm to 20mm.The top design of light shield 301 has window, and window is square, and the length of side is between the 10mm to 15mm, and it is 13mm that present embodiment is preferably selected its length of side.
Aforementioned each embodiment is by arranging guide structure and light shield, and testing light source can only shine by guide structure and survey chip, and its contiguous unglazed photograph of chip, this has just been avoided the influence of adjacent chips to test result.Further, adopt the device of aforementioned each embodiment to test, the end battery of battery chip need not to separate and can accurately test, and therefore the chip technology flow process of conventional multijunction cell can be directly adopted in the making of two-sided growth battery chip, greatly reduces technology difficulty and cost.
Claims (10)
1. solar cell test device, it comprises:
Carrier is used for carrying mesuring battary disk;
Light shield is positioned on the described carrier, and described mesuring battary disk is all covered, and its top or sidewall have window;
Guide structure, window fixed by described light shield is on light shield, and both ends have opening, and wherein the opening of first end is positioned at outside the described light shield, the opening of the second end is positioned at described light shield, its opening size and solar battery chip to be measured measure-alike;
In the battery wafer test process, external light source exposes on the chip to be measured of described battery disk by described guide structure.
2. solar cell test device according to claim 1, it is characterized in that: described guide structure is optical prism or light funnel.
3. solar cell test device according to claim 1, it is characterized in that: the opening of the first end of described guide structure is greater than the opening of the second end.
4. solar cell test device according to claim 3, it is characterized in that: described guide structure is divided into two parts, and first is for falling bucking ladder, and second portion is rectangular cylinder.
5. solar cell test device according to claim 4 is characterized in that: the length and width in the cross section of the rectangular cylinder of described guide structure equate with battery chip length and width to be measured.
6. solar cell test device according to claim 4, it is characterized in that: the end opening of the rectangular cylinder of described guide structure is 3-5mm from battery chip height to be measured.
7. solar cell test device according to claim 4, it is characterized in that: the window of described light shield is rectangle, its length breadth ratio is identical with the cross section length breadth ratio of described guide structure.
8. solar cell test device according to claim 1 is characterized in that: the window fixed of described guide structure by described light shield is on light shield, and its sidewall and light shield window edge are combined closely.
9. solar cell test device according to claim 1 is characterized in that: cushion is equipped with in described light shield sidewall bottom, guarantees that light shield and described carrier are combined closely and light tight.
10. the method for testing of a solar cell comprises step:
One two-sided growth multijunction solar cell disk to be measured is provided, and Qi Ding, middle battery material layer are separated into a series of unit by chip size, and end battery material layer does not separate;
Described solar cell disk after the aforementioned processing is placed in arbitrary solar cell test device of aforementioned claim 1 ~ 9, wherein the to-be-measured cell of solar cell disk is corresponding with second opening of described guide structure;
One testing light source is provided, is incident to by described guide structure on the to-be-measured cell of described solar cell disk, test relative photo electrical quantity.
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| CN201310211844.6A CN103278762B (en) | 2013-05-30 | 2013-05-30 | Solar battery chip testing apparatus and method of testing |
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| CN201310211844.6A CN103278762B (en) | 2013-05-30 | 2013-05-30 | Solar battery chip testing apparatus and method of testing |
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| CN103278762B CN103278762B (en) | 2015-08-19 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2018223268A1 (en) * | 2017-06-05 | 2018-12-13 | 深圳市汇顶科技股份有限公司 | Chip testing probe, chip testing device, and testing method |
| CN110324003A (en) * | 2019-04-30 | 2019-10-11 | 上海道口材料科技有限公司 | A kind of multijunction solar cell recessiveness defect non-destructive testing method and system |
| WO2024078142A1 (en) * | 2022-10-09 | 2024-04-18 | 北京曜能光电科技有限公司 | Online characterization method and apparatus for multi-junction solar cell |
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2013
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| CN201707421U (en) * | 2010-03-25 | 2011-01-12 | 曹文瑞 | Solar cell detector of improved mobile dark box |
| CN102575820A (en) * | 2010-10-08 | 2012-07-11 | 夏普株式会社 | Simulated sunlight light irradiation device and inspection device for solar cell panel |
| CN102749673A (en) * | 2011-04-20 | 2012-10-24 | 国际商业机器公司 | Structure and method fir homogenizing light-pipe for solar concentrators |
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| CN202633335U (en) * | 2012-05-02 | 2012-12-26 | 天津蓝天太阳科技有限公司 | Novel solar cell unit |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018223268A1 (en) * | 2017-06-05 | 2018-12-13 | 深圳市汇顶科技股份有限公司 | Chip testing probe, chip testing device, and testing method |
| CN110324003A (en) * | 2019-04-30 | 2019-10-11 | 上海道口材料科技有限公司 | A kind of multijunction solar cell recessiveness defect non-destructive testing method and system |
| WO2024078142A1 (en) * | 2022-10-09 | 2024-04-18 | 北京曜能光电科技有限公司 | Online characterization method and apparatus for multi-junction solar cell |
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| CN103278762B (en) | 2015-08-19 |
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