CN103248444A - System integration device and system integration method for test parameters based on unit combination - Google Patents
System integration device and system integration method for test parameters based on unit combination Download PDFInfo
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Abstract
The invention relates to a system integration device and a system integration method of test parameters based on the unit combination. The device comprises a main control computer and an exchange board, and also comprises a switch unit, a lower variable-frequency generation unit, a digitalized instrument generation unit, a base band signal generation unit and an upper variable-frequency generation unit, which are connected and communicated with one another; the lower variable-frequency generation unit is matched with the digitalized instrument generation unit and used for receiving and testing a test signal; and the base band signal generation unit is matched with the upper variable-frequency generation unit and used for generating and transmitting an excitation signal. By adopting the scheme, a test system with high performance and low cost is easy to establish, and different instrument functions can be realized by maximally utilizing fewest standard universal units.
Description
Technical field
The invention belongs to the automatic test technology field, in particular a kind of based on the system integration device and method of unit combination towards test parameter.
Background technology
Though because the Auto-Test System that traditional instrument makes up plays a part very important in weaponry, but also expose a lot of problems: 1) integration test and the sealing of fault diagnosis system system that is made up by traditional instrument, platform is single, so standardization, versatility, flexibility, extensibility are relatively poor.The same quasi-instrument of different company lacks unified interface standard, and is compatible very poor between the instrument; 2) integration test that is made up by traditional instrument with the fault diagnosis system hardware cost is higher, volume greatly, upgrading and difficult in maintenance.Traditional instrument is exactly the tester with complete instrumental function, has fixing hardware resource and special-purpose bus interface, and the inside of different instruments comprises the nextport hardware component NextPort of numerous identical functions, and redundancy is very high.The traditional instrument interchangeability of different manufacturers is relatively poor, generally can't exchange, and badly influences upgrading and the maintenance of integration test and fault diagnosis system; 3) restricted at integrated test system and the distance between the measurand of measurand, can not be too far away, if two measurand distances are far away just very difficult unified in a test macro, therefore the integrated test system based on desk-top instrument can't realize distributed synchronization test, remote testing and fault diagnosis system.
The integrated approach of existing test macro mainly is made of main control computer, tester (as desk-top or card insert type), interface adapter.The system buildup person selects corresponding instrument and adapter according to system's needs, and main control computer is by the required parameter testing of the system that finishes of STD bus such as GPIB, VXI, PXI control many conventional desktop instruments (as frequency spectrograph, signal source, power meter, oscilloscope, network analyzer and SONOAN etc.).
The system hardware aspect mainly is the test macro towards instrument, has a lot of standards now based on the Auto-Test System of traditional instrument, comprises desk-top instrument with IEEE and based on the cassette instrument of VXI, PXI bus.Test macro is according to function and the corresponding instrument and equipment of parameter testing increase in demand, the instrument internal of composition system comprises the assembly of numerous identical functions, for example, most of conventional desktop instrument all includes panel and display, and in integrated test system, the panel of instrument and display all are obsolete usually, and for microwave measuring instrument, its inside has also comprised numerous same components, for example down-conversion assembly, intermediate frequency process assembly, up-conversion assembly and baseband signal generating assembly.
Aspect system's realization, at first need to convert measured parameter to common instrument parameter (such as frequency spectrum parameter, noise parameter, power parameter, frequency parameter etc.), choosing corresponding measuring instrument (as desk-top instrument or cassette instrument) then connects together with main control computer by STD bus, realize that by the SCPI order of main control computer by standard corresponding instrument parameter is finished in the control of instrument to be measured, finish corresponding calculating or conversion by main control computer according to the instrument parameter that obtains afterwards and finish final measured parameter and measure.In sum, have the test macro integration mode now and realize all towards instrument in the hardware system of building, though relatively simple on system realizes, hardware cost is higher, is difficult to satisfy the modern needs of testing development.
Therefore, there is defective in prior art, needs to improve.
Summary of the invention
Technical problem to be solved by this invention is at the deficiencies in the prior art, provides a kind of based on the system integration device and method of unit combination towards test parameter.
Technical scheme of the present invention is as follows:
A kind of based on the system integration device of unit combination towards test parameter, comprise main control computer, switch, wherein, comprise that also switch element, down-conversion generating unit, digitizer generating unit, baseband signal generating unit, up-conversion generating unit interconnect and communication mutually;
Described down-conversion generating unit and described digitizer generating unit cooperatively interact, and are used for reception and the test of test signal;
Described baseband signal generating unit and described up-conversion generating unit are used for cooperatively interacting, for generation of pumping signal and transmission.
Described system integration device, wherein, described down-conversion generating unit is used for realizing that the radiofrequency signal of test signal to the frequency translation of intermediate-freuqncy signal, downconverts to fixing intermediate frequency with the radiofrequency signal of importing and outputs to the digitizer generating unit;
Described digitizer generating unit is used for realizing Digital Down Convert, resolution bandwidth filtering, video filtering and the video detection of input test signal.
Described baseband signal generating unit produces modulation signal, point-frequency signal or sweep signal for generation of the baseband signal of the test signal analog-modulated by described up-conversion generating unit.
Described system integration device, wherein, the described mode of interconnecting adopts bus standard LXI to connect.
A kind ofly it is characterized in that based on the system integration method of unit combination towards test parameter, may further comprise the steps:
Steps A: export after measured signal is transformed into the fixed intermediate frequency signal;
Step B: will obtain the IQ signal after described fixed intermediate frequency signal condition, sampling and the Digital Down Convert, the line amplitude of going forward side by side and frequency computation part are with result of calculation output and demonstration;
Step C: the baseband signal of generation produces modulation signal, point-frequency signal or sweep signal by analog-modulated;
Step D: produce pumping signal and output through the up-conversion generating unit.
Described based on the system integration method of unit combination towards test parameter, wherein, described steps A is also specifically carried out following steps:
Steps A 1: at 0 wave band, measured signal is through program control step switch attenuator, millimeter wave SYTX, wide-band microwave SYTX, low pass filter enters the fundamental wave mixing device in the 0 wave band frequency conversion assembly, fundamental wave mixing with first local oscillator, through switching amplifier and band pass filter second frequency converter in the 0 wave band frequency converter assembly, the second local oscillator difference frequency intermediate frequency of winning, 1,2,3 wave bands, measured signal is successively through program control step switch attenuator, millimeter wave SYTX arrives wide-band microwave SYTX, through after the preliminary election with the corresponding harmonic wave difference frequency of first local oscillator intermediate-freuqncy signal of winning, at 4 wave bands, signal is successively through program control step switch attenuator, in millimeter wave SYTX, at first pass through preliminary election, in frequency mixer, carry out corresponding harmonic mixing with two frequencys multiplication of first local oscillator then, through switching amplifier and band pass filter second frequency converter in the 0 wave band frequency converter assembly, with the second local oscillator difference frequency intermediate frequency of winning;
After 2: the first intermediate-freuqncy signals of steps A are synthetic after switch is selected with outer mixed frequency input signal, carry out the flatness compensation, compensation back signal is through power splitter, one the tunnel outputs to broadband option plate, one the tunnel exports second intermediate-freuqncy signal with the 3rd local oscillator mixing of local oscillator unit output, the 3rd local oscillation signal and pectination ripple signal uppermixing produce pectination ripple calibrating signal simultaneously, the gain, bandwidth and the flatness that are used for calibration intermediate frequency process path, second intermediate-freuqncy signal produces the 3rd intermediate-freuqncy signal through simulation prefilter and the 4th local oscillation signal mixing again, output after low pass is selected.
Described based on the system integration method of unit combination towards test parameter, wherein, described step B also specifically carries out following steps:
Step B1: after first intermediate-freuqncy signal, second intermediate-freuqncy signal and the 3rd intermediate-freuqncy signal amplified by input attenuation, programme-controlled gain amplification, filtering and buffering, through adc circuit conversion output;
Step B2: carry out storing local storage into after digital filtering, the I/Q resolution process through FPGA, undertaken showing after amplitude, frequency and signal pulsewidth calculate by DSP again.
Described based on the system integration method of unit combination towards test parameter, wherein, specifically carry out among the described step C: baseband signal produces the change over clock of D/A converter through the DDS circuit, highest frequency reaches the Wave data of memory, will convert to through D/A converter according to the change over clock frequency and produce modulation signal, point-frequency signal or sweep signal.
Described based on the system integration method of unit combination towards test parameter, wherein, among the described step D, when the pumping signal that described up-conversion generating unit produces is high band signal, realized by the YIG oscillator of signal generator inside and the method for digital down converter.
Described based on the system integration method of unit combination towards test parameter, wherein, among the described step D, when the pumping signal that described up-conversion generating unit produces is the low band signal, by the method realization of signal frequency split and signal mixing.
Described based on the system integration method of unit combination towards test parameter, wherein, the mode of described output is for adopting bus standard LXI.
Adopt such scheme, have following advantage:
1, miniaturization test cell, hardware configuration is made up of minimum open standard hardware cell.
2, be easy to make up high-performance, test macro cheaply.As long as farthest utilize the least possible standard universal unit, just can realize different instrumental functions, and unnecessary increasing in the functional block that repeats spends, so just can concentrate one's energy to improve the performance of each functional block, this makes the cost that reduces whole system when improving systematic function become possibility.
3, be convenient to upgrading, long service life.When test macro need upgrade or occur to wear out out-of-date situation, only need acquire or replace direct affected functional unit rather than a whole set of instrument.This has just reduced the cost of the out-of-date instrument for the treatment of of aged, has also reduced relevant technical risk simultaneously.
4, very long product and system support the cycle, will be no longer dependent on specific hardware device.
5, owing to extracted the general character of measuring instrument, therefore compare with traditional Auto-Test System, the test macro integrated approach that the present invention proposes will have very little system bulk.
Description of drawings
Fig. 1 the present invention is based on unit combination towards the structural representation of the system integration device of test parameter.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in detail.
Embodiment 1
As shown in Figure 1, the present invention is by concluding the principle of universal test instrument, with the generation of signal be received as research object, whole test system is divided into the hardware testing unit of minimum open standard: i.e. baseband signal generating unit, the up-conversion generating unit, the down-conversion generating unit, digitizer generating unit and switch element, wherein the basic test unit is minimum unit and the basis of forming test macro, it was neither had the blocking instrument of complete instrumental function in the past, neither a kind of interface card that simply meets certain STD bus, but form according to the modern measuring instrument basic principle, by realizing function, employing technology integrality, the standardization of interface and standard are designed the series unit that series has complete structure and standalone feature.The single function that can not directly finish all purpose instrument in these unit, but can constitute the hardware composition of realizing a kind of all purpose instrument complete function by a plurality of unit are connected.For the range of application of extend testing system, adapt under the new situation to the needs of distributed testing and remote testing simultaneously, the connection bus between each unit adopts bus standard LXI of new generation to connect.When carrying out the system integration, as long as at the corresponding test cell of parameters selection of needs tests, and be aided with corresponding method of testing and can realize complete parameter measurement.This is integrated directly integrated towards the test macro of parameter from carrying out the transition to towards instrument with test macro just, and is then more direct with respect to the former the inventive method.
In sum, the blocking design that two processes carry out takes place and receives and has very strong flexibility and configurability in the present invention according to pumping signal, the signal that not only can realize the microwave and millimeter wave frequency range produces and measures, and is also very convenient for generation and the measurement of low-band signal.Device and method of the present invention can be taken into account test performance and expense, can obtain the good test macro of cost performance again.
When carrying out system integrated, need to select to satisfy the test cell that test function requires, then by the configuration suitable data with trigger bus group and dress up high performance test macro.Target of the present invention be exactly propose a kind of based on unit combination towards the parameter test system integrated approach, the following describes the system integration that how to utilize the test cell of dividing above to realize signal source and spectrum analysis.
1, hardware platform builds
1.1, the structure of spectrum measurement function
What spectrum analyzer was realized as receiver is test to the measured piece output signal, therefore when making up, select corresponding unit to make up according to actual needs on the shown measurement path, the concrete selection: down-conversion generating unit 104, digitizer generating unit 103 and computer 101 can make up, as shown in Figure 1.
Wherein: down-conversion generating unit 104 realizes that radiofrequency signal to the frequency translation of intermediate-freuqncy signal, downconverts to fixing intermediate frequency with the radiofrequency signal of importing and outputs to digitizer generating unit 103; 103 of digitizer generating units are the operations that realizes Digital Down Convert, resolution bandwidth filtering, video filtering and video detection.Computer 101 plays two effects here: the one, by the LXI bus three unit are carried out sweep parameter control; The 2nd, spectrum analysis and Presentation Function.Concrete workflow is as follows: LXI down-conversion generating unit 104 is sent into LXI digitizer generating unit 103 after measured signal is transformed into the fixed intermediate frequency signal.By digitizer generating unit 103 it is nursed one's health, obtains after sampling and the Digital Down Convert after the IQ signal, carry out the calculation of parameter of amplitude, frequency again by DSP, at last result of calculation is passed to computer 101 by the LXI bus and show, thus the function of realization frequency spectrograph.
At 0 wave band, signal enters fundamental wave mixing device in the 0 wave band frequency conversion assembly through the program control step switch attenuator of 10dB, the program control step attenuator of 60dB, millimeter wave SYTX, wide-band microwave SYTX, 4GHz low pass filter successively by input, fundamental wave mixing with first local oscillator (YIG oscillator), through switching amplifier and band pass filter second frequency converter in the 0 wave band frequency converter assembly, the second local oscillator 4.6GHz difference frequency intermediate frequency of winning.At 1,2,3 wave bands, signal arrives wide-band microwave SYTX through the program control step switch attenuator of 10dB, the program control step attenuator of 60dB, millimeter wave SYTX successively, through after the preliminary election with the corresponding harmonic wave difference frequency of first local oscillator intermediate-freuqncy signal of winning.At 4 wave bands, signal is successively through the program control step switch attenuator of 10dB, the program control step attenuator of 60dB, in millimeter wave SYTX, at first pass through preliminary election, in frequency mixer, carry out corresponding harmonic mixing with two frequencys multiplication of first local oscillator then, through switching amplifier and band pass filter second frequency converter in the 0 wave band frequency converter assembly, with the second local oscillator difference frequency intermediate-freuqncy signal of winning.
Each wave band first intermediate-freuqncy signal and outer mixed frequency input signal are after switch is selected, synthetic one road signal carries out the flatness compensation, compensation back signal is through a power splitter, and one the tunnel outputs to broadband option plate, and one the tunnel exports second intermediate-freuqncy signal with the 3rd local oscillator mixing of local oscillator unit output.The 3rd local oscillation signal also produces pectination ripple calibrating signal with pectination ripple signal uppermixing simultaneously.This calibrating signal is used for calibrating gain, bandwidth and the flatness of intermediate frequency process path.Second intermediate-freuqncy signal produces the 3rd intermediate-freuqncy signal through simulation prefilter and the 4th local oscillation signal mixing again, enters the digitizer generating unit after this signal path 2MHz band low pass logical and 12.5MHz is selected.
First intermediate-freuqncy signal, second intermediate-freuqncy signal and the 3rd intermediate-freuqncy signal are imported by front panel signal input end of intermediate frequency mouth, handle by signal processing circuit of intermediate frequency, comprise input attenuation, programme-controlled gain amplification, filtering and buffering amplification etc., the signal that makes adc circuit receive has enough bandwidth and suitable amplitude, and then guarantees the precision of ADC conversion.Sending into FPGA through the digital signal of ADC quantification carries out storing local storage into after the processing such as digital filtering, I/Q decomposition, carry out calculation of parameter such as amplitude, frequency, signal pulsewidth again by DSP, at last result of calculation is passed to computer 101 by CPU by the LXI bus and show.
All control all is to be finished by pci bus by the embedded type CPU unit in the digitizer generating unit 103, comprising: channel attenuation, gain, filtering bandwidth selection, sampling clock generation circuit control, the Digital Signal Processing based on FPGA and DSP, data storage and Data Transmission Controlling.
1.2, the structure of pumping signal generation systems
Signal takes place as broad-spectrum modern intelligent microwave measuring instrument, mainly provides various test and excitation signals.In the unit system structure in the present invention, should choose baseband signal generating unit, up-conversion generating unit and main control computer and constitute.
Concrete workflow is as follows: the waveform format that baseband signal generator is set according to the user, FPGA circuit and waveform generator by inside produce the Wave data that needs, certainly these data also can be produced by main control computer simulation software (as Matlab) or other LXI equipment, download in the baseband signal generating unit 105 by the LXI bus then, produce the change over clock of DAC by the mode of DDS, the Wave data of memory will convert analog signal to through DAC according to the frequency of change over clock, thus output IQ modulation signal.In baseband signal generating unit 105, also can realize the most basic various modulation functions and various functional nucleotide sequence by adopting digital circuit.The baseband signal that baseband signal generating unit 105 produces produces required various modulation signals, point-frequency signal or sweep signal by the analog-modulated of up-conversion generating unit 106 inside.
The operation principle of LXI baseband signal generating unit 105 is as follows: CPU is according to the waveform format of setting, hardware circuit by FPGA produces the output data of D/A converter and leaves in the memory, certainly these data also can be produced by main control computer simulation software (as Matlab) or other LXI equipment, download in the baseband signal generating unit 105 by the LXI bus then; The DDS circuit produces the change over clock of D/A converter, and highest frequency reaches, and the Wave data of memory will convert analog signal to through D/A converter according to the change over clock frequency, export from connector after crossing filtering.
Up-conversion generating unit 106 high band signals are mainly realized by the YIG oscillator of signal generator inside, the method for digital down converter, the low band signal adopts the method for signal frequency split and signal mixing to realize, during frequency division YIG oscillator be tuned to corresponding band, digital down converter output is respectively 2,4,8,16 frequency divisions of YIG oscillator.The signal phase mixing that is come by signal behind the frequency division of local oscillation signal and reference rings during mixing obtains.
The output of YIG oscillator enters frequency multiplier.The main effect of frequency multiplier is that the YIG oscillator output signal is carried out 2 frequencys multiplication.Another effect of frequency multiplier is the merit branch, namely is that output with oscillator is coupled out respectively and delivers to digital down converter and sampling is amplified.
The output of frequency multiplier enters modulation amplification filtering assembly, realizes that pre-fixed ampllitude merit branch, amplification, linear modulation, pulse modulation and the harmonic wave of signal suppresses.Because suppressing to adopt the switch low pass filter, realizes signal harmonic.Another effect of modulation amplification filtering assembly is that the low band signal that digital down converter produces is merged to main road output.
Frequency stability and accuracy index are partly finished by frequency synthesis.It comprises that high performance reference ring, the little ring of numbers of high-resolution, high-purity local oscillator ring, sampling frequency-changing and YO phase demodulation and error drive.CPU at first arranges the output frequency of YIG oscillator roughly by the DAC that presets in the YO driving.High-purity local oscillator ring is with undistorted ground of the microwave signal sampling frequency-changing of the Gigahertz level of the YIG oscillator output intermediate-freuqncy signal to ten megahertz levels.The high-resolution signal of intermediate-freuqncy signal and the output of decimal ring carries out frequency/phase relatively, and the error voltage that obtains is accurately regulated the output of YIG oscillator and made it to be locked on the assigned frequency.
The power control of complete machine and amplitude modulation(PAM) are made of two ALC rings.When the output high-band frequencies, by coupling geophone the radio frequency output signal is coupled out sub-fraction and it is converted to corresponding direct voltage, this voltage is compared with the reference voltage in the ALC ring flat-plate, the error voltage that obtains removes to drive the linear modulator in the modulation merit branch amplification filtering assembly, regulate radio-frequency power and equate up to detecting circuit and reference voltage, thereby realize power control.When the output frequency low-band frequency, be coupled accordingly detection and modulator are all in digital down converter inside.The amplitude modulation(PAM) of complete machine and pulse modulation are realized by radio frequency part and ALC ring.Frequency modulation(FM) and phase place are modulated at frequency synthesis and partly realize.
In the present invention, single test cell can't have been realized a certain complete parameter measurement function, has only correlation measurement unit combined and just can finish a complete parameter measurement.This has just fundamentally changed test system structure scheme and method, legacy test system towards be instrument, namely finish the measurement of a certain parameter by the corresponding function of instrument, belong to the indirect type metering system.And device and method of the present invention is then more direct on method of testing directly towards measured parameter.When carrying out parameter measurement, at first need to realize requirement according to measuring, choose corresponding test cell and select corresponding testing scheme can finish parameter measurement.
Adopt open, general, extendible software architecture among the present invention; provide towards tested object, based on the detecting information modeling environment of ATML; TPS exploitation and the running environment of signal-oriented are provided; realize that TPS transplants and the independence of test resource hardware, realize the fusion of the shared and detecting information of test data.On the basis of TPS, at the test macro that LXI test cell of the present invention is formed, exploitation signal analysis and signal produce software unit, realize integrated towards the testing system software of parameter simultaneously.
Be divided into user interface layer, intermediate layer, core layer, layer plug, driving layer and unit layer on the implementation method of the present invention.In order to realize unit interchangeability to the full extent, fundamentally realize the independence of test driver and programmable interface bus, in driving layer, adopted the thought based on The interchangeable virtual instruments test driver (IVI-TD), by formulating the test driver interface of seeking unity of standard, meeting specific specifications, solved the independence of test program and hardware device.The test cell that adds if desired or more renew only need provide the driver that meets codes and standards, builds at instrument then and carries out simple configuration in the unit and get final product.
For the test request of compatibility, on core layer, designed conversion layer, adopt adapter and dynamic link libraries technology, method of testing is read and changes, can reach directly and carry out, improved versatility and flexibility; Core layer comprises mainly that instrument is built, method of testing generation, instrument calibration and metering, test program execution and data analysis and 5 plug-in units of demonstration.Wherein the method for testing generation is the main tool of carrying out test program development, method of testing adopts " test plan+basic operation " pattern in the present invention, be several basic operations make up to finish one relatively the complete function unit be a test plan, several test plans combine and realize that a complete parameter measurement function is a test program.Basic operation is the minimum unit that method of testing generates editor, and equivalence is the handling function of unit drives program usually.Resource Manager Subsystem provides with the complete synthesization instrument of cell formation and has built management platform, and finishes unit self-test, unit interface setting, element identifier (element ID), calibration data editor etc.The unit layer is the software lowermost layer of synthesization instrument, is the hardware carrier of unit drives software, and each operation finally realizes by the call unit functions of the equipments in the method for testing.The intermediate layer will provide the various unit at the weaponry parameter on the basis of core layer, and spectral analysis unit, S parameter analytic unit and signal generation unit, the user can realize producing towards the signal of the various signal analysis of parameter and various forms by these unit.
Testing system software of the present invention is integrated except the function that can realize the traditional measurement instrument, and it can directly face measured parameter topmost feature, such as transmitting power, receiving sensitivity, the frequency accuracy in radio station, the standing-wave ratio of antenna feeder etc.To finish the test job of a certain parameter like this, just can not as the control traditional instrument, can finish by simple order again, and to produce corresponding test program according to measured parameter and corresponding method of testing, test program is by controlling the test that just can finish measured parameter to a plurality of test cells.
The present invention realizes testing towards measured parameter by test program generation technique and graphical design environment when specific implementation.At first, according to the test description of test parameter generation signal-oriented, setting up the testing requirement model of signal-oriented and using a kind of unified reference format that the testing requirement model is described is the key that generates test program.Test description parts in the ATML standard are described for the testing requirement of signal-oriented standard definition are provided.ATML test description standard has been listed the information of the test program of carrying out at a specific UUT, comprise testing setup, grouping and sequence step, and the estimation steps of test result, test boundary etc., for generation, execution and the diagnosis of test program such as infer at the Open architecture standard that provides.
Should be understood that, for those of ordinary skills, can be improved according to the above description or conversion, and all these improvement and conversion all should belong to the protection range of claims of the present invention.
Claims (10)
1. one kind based on the system integration device of unit combination towards test parameter, comprise main control computer, switch, it is characterized in that, comprise that also switch element, down-conversion generating unit, digitizer generating unit, baseband signal generating unit, up-conversion generating unit interconnect and communication mutually;
Described down-conversion generating unit and described digitizer generating unit cooperatively interact, and are used for reception and the test of test signal;
Described baseband signal generating unit and described up-conversion generating unit are used for cooperatively interacting, for generation of pumping signal and transmission.
2. the system as claimed in claim 1 integrating device, it is characterized in that, described down-conversion generating unit is used for realizing that the radiofrequency signal of test signal to the frequency translation of intermediate-freuqncy signal, downconverts to fixing intermediate frequency with the radiofrequency signal of importing and outputs to the digitizer generating unit;
Described digitizer generating unit is used for realizing Digital Down Convert, resolution bandwidth filtering, video filtering and the video detection of input test signal.
Described baseband signal generating unit produces modulation signal, point-frequency signal or sweep signal for generation of the baseband signal of the test signal analog-modulated by described up-conversion generating unit.
3. system integration device as claimed in claim 2 is characterized in that, the described mode of interconnecting adopts bus standard LXI to connect.
4. one kind based on the system integration method of unit combination towards test parameter, it is characterized in that, may further comprise the steps:
Steps A: export after measured signal is transformed into the fixed intermediate frequency signal;
Step B: will obtain the IQ signal after described fixed intermediate frequency signal condition, sampling and the Digital Down Convert, the line amplitude of going forward side by side and frequency computation part are with result of calculation output and demonstration;
Step C: the baseband signal of generation produces modulation signal, point-frequency signal or sweep signal by analog-modulated;
Step D: produce pumping signal and output through the up-conversion generating unit.
5. as claimed in claim 4ly it is characterized in that based on the system integration method of unit combination towards test parameter described steps A is also specifically carried out following steps:
Steps A 1: at 0 wave band, measured signal is through program control step switch attenuator, millimeter wave SYTX, wide-band microwave SYTX, low pass filter enters the fundamental wave mixing device in the 0 wave band frequency conversion assembly, fundamental wave mixing with first local oscillator, through switching amplifier and band pass filter second frequency converter in the 0 wave band frequency converter assembly, the second local oscillator difference frequency intermediate frequency of winning, 1,2,3 wave bands, measured signal is successively through program control step switch attenuator, millimeter wave SYTX arrives wide-band microwave SYTX, through after the preliminary election with the corresponding harmonic wave difference frequency of first local oscillator intermediate-freuqncy signal of winning, at 4 wave bands, signal is successively through program control step switch attenuator, in millimeter wave SYTX, at first pass through preliminary election, in frequency mixer, carry out corresponding harmonic mixing with two frequencys multiplication of first local oscillator then, through switching amplifier and band pass filter second frequency converter in the 0 wave band frequency converter assembly, with the second local oscillator difference frequency intermediate frequency of winning;
After 2: the first intermediate-freuqncy signals of steps A are synthetic after switch is selected with outer mixed frequency input signal, carry out the flatness compensation, compensation back signal is through power splitter, one the tunnel outputs to broadband option plate, one the tunnel exports second intermediate-freuqncy signal with the 3rd local oscillator mixing of local oscillator unit output, the 3rd local oscillation signal and pectination ripple signal uppermixing produce pectination ripple calibrating signal simultaneously, the gain, bandwidth and the flatness that are used for calibration intermediate frequency process path, second intermediate-freuqncy signal produces the 3rd intermediate-freuqncy signal through simulation prefilter and the 4th local oscillation signal mixing again, output after low pass is selected.
6. as claimed in claim 5ly it is characterized in that based on the system integration method of unit combination towards test parameter described step B also specifically carries out following steps:
Step B1: after first intermediate-freuqncy signal, second intermediate-freuqncy signal and the 3rd intermediate-freuqncy signal amplified by input attenuation, programme-controlled gain amplification, filtering and buffering, through adc circuit conversion output;
Step B2: carry out storing local storage into after digital filtering, the I/Q resolution process through FPGA, undertaken showing after amplitude, frequency and signal pulsewidth calculate by DSP again.
7. as claimed in claim 6 based on the system integration method of unit combination towards test parameter, it is characterized in that, specifically carry out among the described step C: baseband signal produces the change over clock of D/A converter through the DDS circuit, highest frequency reaches the Wave data of memory, will convert to through D/A converter according to the change over clock frequency and produce modulation signal, point-frequency signal or sweep signal.
8. as claimed in claim 7 based on the system integration method of unit combination towards test parameter, it is characterized in that, among the described step D, when the pumping signal that described up-conversion generating unit produces is high band signal, realized by the YIG oscillator of signal generator inside and the method for digital down converter.
9. as claimed in claim 7 based on the system integration method of unit combination towards test parameter, it is characterized in that, among the described step D, when the pumping signal that described up-conversion generating unit produces is the low band signal, by the method realization of signal frequency split and signal mixing.
10. as claimed in claim 7ly it is characterized in that based on the system integration method of unit combination towards test parameter that the mode of described output is for adopting bus standard LXI.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104280638A (en) * | 2014-10-14 | 2015-01-14 | 成都天奥测控技术有限公司 | Multifunctional synchronous testing device |
| CN104635049A (en) * | 2013-11-08 | 2015-05-20 | 苏州普源精电科技有限公司 | Spectrum analyzer with calibration function |
| CN105842669A (en) * | 2016-03-29 | 2016-08-10 | 智举电子科技（上海）有限公司 | K-band radar testing system |
| CN106877946A (en) * | 2017-01-18 | 2017-06-20 | 上海创远仪器技术股份有限公司 | A kind of high-performance channel simulator automatically controls receiver and its checking device |
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| CN108459203A (en) * | 2017-12-26 | 2018-08-28 | 北京航天测控技术有限公司 | A kind of ultra wide band scanning frequency pulse power detection device and method |
| CN108988962A (en) * | 2018-07-25 | 2018-12-11 | 北京无线电计量测试研究所 | A kind of correcting device and method of wideband vector modulated signal Error Vector Magnitude |
| CN109541311A (en) * | 2018-12-17 | 2019-03-29 | 西北工业大学 | Aviation conversion power supply system alternating voltage distortion parameter test system and its method |
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| CN110554259A (en) * | 2019-08-07 | 2019-12-10 | 中电科仪器仪表有限公司 | Integrated vector network analyzer suitable for modulation domain and measurement method |
| CN110726874A (en) * | 2019-10-29 | 2020-01-24 | 中国科学院微电子研究所 | D/A data acquisition and analysis method based on remote frequency spectrograph communication |
| CN111274185A (en) * | 2020-01-10 | 2020-06-12 | 中国地质科学院地质研究所 | Method and system for solving communication interface data compatibility in instrument old part replacement |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011025817A1 (en) * | 2009-08-26 | 2011-03-03 | Bae Systems National Security Solutions Inc. | Synthetic instrument unit |
| CN102497237A (en) * | 2011-12-01 | 2012-06-13 | 北京航天测控技术有限公司 | Radio frequency and microwave synthetic instrument based on PXIe (PCI Extensions for Instrumentation) synthetic instrument architecture |
| CN102508044A (en) * | 2011-11-18 | 2012-06-20 | 北京航天测控技术有限公司 | Signal analysis device and configurating method thereof |
| CN202503522U (en) * | 2012-01-13 | 2012-10-24 | 上海创远仪器技术股份有限公司 | Super heterodyne harmonic detection device |
-
2013
- 2013-05-16 CN CN201310180564.3A patent/CN103248444B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011025817A1 (en) * | 2009-08-26 | 2011-03-03 | Bae Systems National Security Solutions Inc. | Synthetic instrument unit |
| CN102508044A (en) * | 2011-11-18 | 2012-06-20 | 北京航天测控技术有限公司 | Signal analysis device and configurating method thereof |
| CN102497237A (en) * | 2011-12-01 | 2012-06-13 | 北京航天测控技术有限公司 | Radio frequency and microwave synthetic instrument based on PXIe (PCI Extensions for Instrumentation) synthetic instrument architecture |
| CN202503522U (en) * | 2012-01-13 | 2012-10-24 | 上海创远仪器技术股份有限公司 | Super heterodyne harmonic detection device |
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104635049A (en) * | 2013-11-08 | 2015-05-20 | 苏州普源精电科技有限公司 | Spectrum analyzer with calibration function |
| CN104635049B (en) * | 2013-11-08 | 2019-02-05 | 苏州普源精电科技有限公司 | A kind of spectrum analyzer with calibration function |
| CN104280638A (en) * | 2014-10-14 | 2015-01-14 | 成都天奥测控技术有限公司 | Multifunctional synchronous testing device |
| CN105842669A (en) * | 2016-03-29 | 2016-08-10 | 智举电子科技（上海）有限公司 | K-band radar testing system |
| CN106877946B (en) * | 2017-01-18 | 2020-09-18 | 上海创远仪器技术股份有限公司 | High-performance channel simulator automatic control receiver and verification device thereof |
| CN106877946A (en) * | 2017-01-18 | 2017-06-20 | 上海创远仪器技术股份有限公司 | A kind of high-performance channel simulator automatically controls receiver and its checking device |
| CN108036939A (en) * | 2017-11-10 | 2018-05-15 | 哈尔滨理工大学 | A kind of rolling bearing detects signal imitation processing system |
| CN108459203A (en) * | 2017-12-26 | 2018-08-28 | 北京航天测控技术有限公司 | A kind of ultra wide band scanning frequency pulse power detection device and method |
| CN108988962A (en) * | 2018-07-25 | 2018-12-11 | 北京无线电计量测试研究所 | A kind of correcting device and method of wideband vector modulated signal Error Vector Magnitude |
| CN108988962B (en) * | 2018-07-25 | 2021-09-10 | 北京无线电计量测试研究所 | Device and method for correcting error vector amplitude of broadband vector modulation signal |
| CN109541311A (en) * | 2018-12-17 | 2019-03-29 | 西北工业大学 | Aviation conversion power supply system alternating voltage distortion parameter test system and its method |
| CN109752695A (en) * | 2018-12-29 | 2019-05-14 | 北京航天测控技术有限公司 | A kind of linear frequency modulation simulation system based on PXI bus |
| CN110554259A (en) * | 2019-08-07 | 2019-12-10 | 中电科仪器仪表有限公司 | Integrated vector network analyzer suitable for modulation domain and measurement method |
| CN110726874A (en) * | 2019-10-29 | 2020-01-24 | 中国科学院微电子研究所 | D/A data acquisition and analysis method based on remote frequency spectrograph communication |
| CN110726874B (en) * | 2019-10-29 | 2021-11-19 | 中国科学院微电子研究所 | D/A data acquisition and analysis method based on remote frequency spectrograph communication |
| CN111274185A (en) * | 2020-01-10 | 2020-06-12 | 中国地质科学院地质研究所 | Method and system for solving communication interface data compatibility in instrument old part replacement |
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