CN103185548B - 测量半导体机台的平台性能参数的辅助装置及方法 - Google Patents
测量半导体机台的平台性能参数的辅助装置及方法 Download PDFInfo
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CN101261455A (zh) * | 2008-04-17 | 2008-09-10 | 上海微电子装备有限公司 | 一种用于光刻机调焦系统性能评价的装置及方法 |
CN101458532A (zh) * | 2008-07-11 | 2009-06-17 | 华中科技大学 | 一种超精密双层宏微运动平台的同步控制系统 |
CN101806580A (zh) * | 2010-03-19 | 2010-08-18 | 东华大学 | 一种用于高精密影像测量仪的运动控制系统和方法 |
CN101813499A (zh) * | 2010-03-30 | 2010-08-25 | 上海市计量测试技术研究院 | 一种三维微触觉传感器的校准方法与装置 |
CN202582492U (zh) * | 2011-12-31 | 2012-12-05 | 睿励科学仪器(上海)有限公司 | 测量半导体机台的平台性能参数的辅助装置 |
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US7804579B2 (en) * | 2007-06-21 | 2010-09-28 | Asml Netherlands B.V. | Control system, lithographic projection apparatus, method of controlling a support structure, and a computer program product |
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CN101261455A (zh) * | 2008-04-17 | 2008-09-10 | 上海微电子装备有限公司 | 一种用于光刻机调焦系统性能评价的装置及方法 |
CN101458532A (zh) * | 2008-07-11 | 2009-06-17 | 华中科技大学 | 一种超精密双层宏微运动平台的同步控制系统 |
CN101806580A (zh) * | 2010-03-19 | 2010-08-18 | 东华大学 | 一种用于高精密影像测量仪的运动控制系统和方法 |
CN101813499A (zh) * | 2010-03-30 | 2010-08-25 | 上海市计量测试技术研究院 | 一种三维微触觉传感器的校准方法与装置 |
CN202582492U (zh) * | 2011-12-31 | 2012-12-05 | 睿励科学仪器(上海)有限公司 | 测量半导体机台的平台性能参数的辅助装置 |
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Denomination of invention: Auxiliary device and method for measuring platform performance parameters of semiconductor machine Effective date of registration: 20190121 Granted publication date: 20160309 Pledgee: Shanghai Xingcheng Investment Management Co., Ltd. Pledgor: Raintree Scientific Instruments (Shanghai) Corporation Registration number: 2019310000002 |
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Date of cancellation: 20191029 Granted publication date: 20160309 Pledgee: Shanghai Xingcheng Investment Management Co., Ltd. Pledgor: Ruili Scientific Instruments (Shanghai) Co., Ltd. Registration number: 2019310000002 |