CN103166640A - Method and system for monitoring change of reference voltage of converter - Google Patents
Method and system for monitoring change of reference voltage of converter Download PDFInfo
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- CN103166640A CN103166640A CN2012105481615A CN201210548161A CN103166640A CN 103166640 A CN103166640 A CN 103166640A CN 2012105481615 A CN2012105481615 A CN 2012105481615A CN 201210548161 A CN201210548161 A CN 201210548161A CN 103166640 A CN103166640 A CN 103166640A
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
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Abstract
The invention provides a method and system for monitoring change of a reference voltage of a converter, comprising a converter and a controller, wherein the converter is such as an analog digital converter (ADC). The converter is configured to receive sensor signal for inducting a physical quantity to be measured, and to generate output signal based on the sensor signal and the reference voltage. The converter is further configured to alternately receiving a calibration voltage for replacing the sensor signal, and to generate output signal based on the calibration voltage and the reference voltage. The controller is configured to compare the output signal based on the calibration voltage and the reference voltage with an expected value of the output signal based on an assumed value of the calibration voltage and the reference voltage, in order to detect change of the reference voltage; and the controller is configured to, based on the detected change of the reference voltage, compensate the output signal based on the sensor signal and the reference voltage.
Description
The cross reference of related application
The application requires the U.S. Provisional Application the 61/576th of submission on December 16th, 2011, the U.S. Provisional Application the 61/576th that No. 684 and on December 16th, 2011 submit to, the rights and interests of No. 454, and require the U. S. application the 13/679th of submission on November 16th, 2012, the priority of No. 370, its whole disclosures are incorporated into way of reference accordingly.
Technical field
The present invention relates to and use reference voltage to be used for analog signal conversion as digital signal and the transducer that vice versa, for example analogue-to-digital converters (" ADC ").
Background technology
Modern vehicle comprises having complicated circuit to be used for carrying out the system of difference in functionality.Common circuit comprises the analogue-to-digital converters (" ADC ") with sensor communication.Sensor measurement physical quantity, and the analog electrical signal of the physical quantity of generation indication measurement.ADC receives analog signal from transducer, and is converted into digital electric signal (that is, digital value, digital output code etc.).
Analog sensor signal is voltage signal (that is, transducer input V normally
IN).ADC is by inputting V with transducer
INWith reference voltage V
REFCompare to produce for transducer input V
INDigital output code.Reference voltage V
REFCan externally be provided to ADC or can be generated in itself inside of ADC.Reference voltage V
REFBe intended for transducer input V
INAccurate ' gage ' by comparison.Under error-free operation, according to following equation, ADC produces and is used for transducer input V
INDigital output code:
Output=V
IN* (2
n/ V
REF)
Wherein " output " is the digital output code of decimal system form, and " n " be ADC resolution the position quantity.The quantity of the centrifugal pump that resolution indication ADC can produce in analog-value range.Value is usually with the binary form storage, so resolution represents with the position.For example, resolution is that the ADC of eight can input V with analog sensor
INBe encoded to the value of 256 varying levels, because 2
8=256.
According in the above equation that is used for the generating digital output code that illustrates, digital output code and reference voltage V
REFChange inversely.According to following description, be apparent that for embodiments of the present invention digital output code is reference voltage V
REFFunction.Similarly, in order to make ADC output be used for given transducer input V
INThe exact figure output code, reference voltage V
REFMust be accurate.
ADC is along with aging and drift about.These drift about directly and the reference voltage V that in transfer process, ADC uses
REFThe ratio that is varied to.Compared with absolute precision, because the aging drift that causes is relatively larger problem.Internal error can be calibrated, but offset drift is difficult.In the situation that possible, should come selection reference voltage according to aging characteristics, this keeps sufficient accuracy in the life expectancy of the system that uses ADC.
Some systems, for example the battery monitoring system in motor vehicle, have the demand of overload ADC.These demands comprise the relatively long life-span (for example, the life-span is than long ten times of life-span of conventional vehicles), and along with passage of time high accuracy demand relatively.
Summary of the invention
Target of the present invention comprises the variation of following the trail of the reference voltage that uses in change between analog signal and digital signal by analogue-to-digital converters (" ADC ") and/or during the lifetime of system that uses transducer, compensates the variation of this reference voltage.
In order to realize one or more above target and other target, the invention provides the system with ADC.ADC receives the sensor signal of the measured physical quantity of indication, and produces output signal based on sensor signal and reference voltage.ADC also is configured to alternately receive the calibration voltage that replaces sensor signal, and produces output signal based on calibration voltage and reference voltage.
In addition, in order to realize one or more above target and other target, the invention provides the system with the first and second voltage generators, transducer, ADC and controller.The first voltage generator produces reference voltage.Transducer is configured to produce the sensor signal of the measured physical quantity of indication.ADC produces output signal based on input signal and reference voltage.The second voltage generator is configured to produce calibration voltage.Controller reads and processes the digital output signal based on sensor signal and reference voltage generation by ADC, and selectively reads and process the digital output signal based on sensor signal and calibration voltage generation by ADC.
Same, in order to realize one or more above target and other target, the invention provides method.Described method is included in ADC and receives the sensor signal of the measured physical quantity of indication and generate output signal based on sensor signal and reference voltage by ADC.Described method also is included in ADC and selectively receives the calibrating signal that replaces sensor signal and generate output signal based on calibration voltage and reference voltage by ADC.
Description of drawings
Fig. 1 shows and is used for monitoring by the block diagram of analogue-to-digital converters (" ADC ") in the system of the variation of carrying out the reference voltage that between analog signal and digital signal, conversion is used according to embodiment of the present invention;
Fig. 2 shows the sequential chart of indication when the second outside reference voltage generator of the system shown in Fig. 1 is activated to produce the second reference voltage according to the embodiment of the present invention; And
What Fig. 3 showed according to the present invention another execution mode is used for monitoring by the block diagram of ADC in the system of the variation of carrying out the reference voltage that between analog signal and digital signal, conversion is used.
Embodiment
Detailed execution mode of the present invention is disclosed at this; Yet, understanding that disclosed execution mode is only demonstration of the present invention, it can be with different being implemented with optional form.Accompanying drawing and unnecessary drafting in proportion; Some features can be exaggerated or minimize to illustrate the details of specific components.Therefore, ad hoc structure disclosed herein be not read as restriction with details function, and be only to use representative basis of the present invention as professor those skilled in the art are many-sided.
With reference now to Fig. 1,, show and be used for monitoring by the block diagram of analogue-to-digital converters (" ADC ") 12 in the system 10 of the variation of carrying out the reference voltage that between analog signal and digital signal, conversion is used according to embodiment of the present invention.By monitoring the variation of the reference voltage that ADC 12 uses in conversion process, make system 10 can detect the integrality of ADC 12.Outside reference voltage generator 14 is provided to ADC 12 to be used for conversion process with reference voltage.This reference voltage is the first reference voltage V
REF1According to explained above, ADC 12 is to use the first reference voltage V in output digit signals inputting analog signal conversion
REF1
Described system comprises transducer 16.Transducer 16 measure physical quantities, and the analog electrical signal of the physical quantity of generation indication measurement.The analog signal that is generated by transducer 16 is voltage signal, and is denoted as transducer input V at this
IN
In normal running, when Port Multiplier is configured to output transducer voltage V
INThe time, ADC 12 is by inputting V with transducer
INWith reference voltage V
REF1Compare to produce for transducer input V
INDigital output code.Similarly, be used for transducer input V
INDigital output code depend on reference voltage V
REF1Therefore, in order to make ADC 12 outputs be used for transducer input V
INThe exact figure output code, the first reference voltage V
REF1Must be accurate.
The second pedestal generator 20 interrelates with the switchgear 24 with switch S 1.Switch S 1 is movably between two position of the switch.In first position of the switch, switch S 1 is connected to voltage supply V
DDThereby, be provided for the electric power of its operation to the second pedestal generator 20.As supplying V by voltage
DDThe result of electric power is provided, and the second pedestal generator 20 is activated to produce the second reference voltage V
REF2Thereby, and export the second reference voltage V
REF2As calibration voltage V
CALIn the second switch position, switch S 1 is connected to ground (shown in Fig. 1), thereby is not provided for the electric power of its operation to the second pedestal generator 20.Therefore, in fact export 0V as calibration voltage V from the second pedestal generator 20
CAL
Except control signal CAL/IN is provided to switch S 1 in case make switch S 1 therein the second pedestal generator 20 be switched on to produce the second reference voltage V
REF2As calibration voltage V
CALPrimary importance outside, control signal CAL/IN simultaneously is provided to Port Multiplier 22 from controller 18, goes out as shown in fig. 1.The selection class of operation of Port Multiplier 22 is similar to the handover operation of switch S 1, because Port Multiplier 22 is selected calibration voltage V when reception control signal CAL/IN
CALOn the other hand, when control signal CAL/IN not being provided to switch S 1 from controller 18, thereby and when control signal CAL/IN not being provided to Port Multiplier 22, Port Multiplier 22 is selected transducers input V
IN
Similarly, when controlling the second pedestal generator 20 to produce the second reference voltage V according to operation described above
REF2As calibration voltage V
CALThe time, Port Multiplier 22 is selected calibration voltage V
CALRather than transducer input V
IN, and with calibration voltage V
CALBe provided to ADC 12.In this case, in fact, the second reference voltage V
REF2Replace transducer input V
INBe provided to ADC 12 as analog input signal.Conversely, be the second reference voltage V specifically at analog input signal
REF2During, ADC 12 uses the first reference voltage V
REF1This analog input signal is converted to digital output code.
Optionally, when controlling the second pedestal generator 20 with output 0V according to operation described above, Port Multiplier 22 is selected transducer input V
INRather than 0V, and transducer is inputted V
INBe provided to ADC 12.In this case, according to the ADC operation of routine, transducer is inputted V
INBe provided to ADC 12.Then ADC 12 uses the first reference voltage V
REF1Transducer is inputted V
INBe converted to digital output code.
In a word, system 10 is configured in normal manipulation mode, transducer be inputted V
INBe provided to ADC 12.For example, ADC 12 can input V with transducer
INBe converted to digital voltage, thereby be the desired function of vehicle execution.ADC 12 can comprise many channels.For the particular channel test drift to ADC 12, the second pedestal generator 20 produces the second reference voltage V
REF2As calibration voltage V
CAL, described calibration voltage V
CALBe applied to ADC 12 to continue the short time (that is, when system 10 is placed in test pattern).Any time in its whole useful life, system 10 can be placed in test pattern, so that the particular channel in ADC 12 is tested drift.At this calibration voltage V
CALAfter being applied in, if one or more channel of ADC 12 is detected as beyond scope, system 10 can produce notification signal to indicate due to drift to the driver, and system 10 may need to safeguard (perhaps replacing).
For system 10 being placed in test pattern, controller 18 control switch S1 closed (for example, by control signal CAL/IN), thereby voltage supply V
DDBe provided for the electric power of its operation to the second pedestal generator 20.Then, start the second pedestal generator 20 to produce the second reference voltage V
REF2As calibration voltage V
CALTo be used for being provided to Port Multiplier 22.In test pattern, 18 pairs of Port Multipliers of controller, 22 forbidding transducer input V
INTo avoid transducer input V
INBe provided to ADC 12, enable simultaneously input to Port Multiplier 22 to make thus calibration voltage V
CAL(it is the second reference voltage V during test pattern
REF2) by and to ADC 12.
Carry out at the particular channel of ADC 12 and measure to determine that voltage is whether in preset range.If measuring voltage is in scope, controller 18 determines that the particular channel of ADC 12 may not show as drifting state.If measuring voltage is outside scope, controller 18 determines that the particular channel of ADC 12 shows drifting state.At this time, the user is apprised of system 10 may need to safeguard or replace.By the short period apply calibration voltage V
CAL(that is, the second reference voltage V
REF2), this state can keep the second pedestal generator 20(or power supply V
DD) integrality, itself do not drift about along with the time to guarantee these parts.The second reference voltage V
REF2Value can input V with transducer
INHas the same or different order of magnitude.
With reference now to Fig. 2,, in addition again with reference to figure 1, the indication that shows according to the embodiment of the present invention ought be activated to produce the second reference voltage V by the second pedestal generator 20
REF2As calibration voltage V
CALThe time sequential Figure 30.Sequential Figure 30 represents the test waveform for detection of ADC 12 integralities.Again, when provide control signal CAL/IN to switch S 1 that the second pedestal generator 20 is associated the time from controller 18, the second pedestal generator 20 is activated to produce the second reference voltage V
REF2The control signal CAL/IN that periodically provides from controller 18 is provided sequential Figure 30.Similarly, periodically will replace transducer input V
INThe second reference voltage V
REF2Be provided to ADC 12.
Because replace transducer input V
INThe second reference voltage V
REF2Only by short-term be provided to ADC 12, due to aging the second reference voltage V that causes
REF2Variation be minimized.As a result of, from the first reference voltage V of pedestal generator 14
REF1Relatively large variation can be compensated.Recall with analog input signal transducer input V for example
INBe converted in digital output code the first reference voltage V that ADC 12 uses from the first pedestal generator 14
REF1Similarly, in order to ensure accurately transducer being inputted V
INBe converted to digital output code, expected compensation the first reference voltage V
REF1Variation.
Continuation is with reference to figure 2, and in order to minimize the calibration number of times, controller 18 is followed the trail of the first reference voltage V that is provided to ADC 12 from the first pedestal generator 14
REF1Variation, and will replace transducer input V according to following equation in some time
INThe second reference voltage V
REF2Be provided to ADC12:
Δt[N]=f(ΔV[N],ΔV[N-1],…,ΔV[1])N≥1
Δt[N]=t[N]–t[N-1]
ΔV[N]=V
REF_MEAS[N]–V
REF_MEAS[N-1]
V
REF_MEASAs the second reference voltage V
REF2Replace transducer input V
INWhen being provided to ADC12, the output of the digital code of ADC 12.Thus, Δ V[N] be during N control signal CAL/IN and N-1 control signal CAL/IN, as the second reference voltage V
REF2Replace transducer input V
INWhen being provided to ADC 12, the difference between the output of the digital code of ADC 12.
Especially, the expression formula that is fit to is:
Δt[N]=tMIN+(tMAX-tMIN)/(1+k*ΔV[N])N≥1
Perhaps
Δt[N]=tMIN+(tMAX-tMIN)*exp(-k*ΔV[N])N≥1
In order to follow the trail of the first reference voltage V
REF1Along with the variation of time, controller 18 is analyzed V by at least one group of N sampling
REF_MEASMeasured value.When the second reference voltage V
REF2When constant, this variation is at V
REF_MEASMeasured value will be recognizable when changing along with the time each other.On the contrary, according to the second reference voltage V
REF2Predetermined variation, this variation is at V
REF_MEASWhen change will not be recognizable to measured value along with the time each other.Detecting when changing, controller 18 can compensate variation by the bucking voltage that considerations is used for the ineffective treatment variation.At ADC 12, transducer is inputted V
INBe converted to the operating period of digital output code, by controller 18 with respect to this bucking voltage.
In addition, controller 18 can be carried out the first and second reference voltage (V
REF1And V
REF2) between authenticity examination or evaluation.Especially, if Δ V[N] difference between value is no more than specific lower threshold (based on predefined boundary), and the authenticity value of measuring is unaffected.As long as measured value surpasses lower threshold, deterioratedly just begun.When surpassing upper limit threshold, measure integrity value by farthest deteriorated, reach minimum value.In this case, measurement is insecure, and should activate warning.
Turn back to Fig. 1, controller 18 also is configured to receive temperature sensor signal from temperature sensor 26.Temperature sensor 26 can monitoring system 10 the temperature that comprises one or more parts in ADC 12, the first pedestal generator 14 and the second pedestal generator 20.For assistance tracking the first reference voltage V
REF1In variation and/or compensate this variation, controller 18 can use this temperature signal.
With reference now to Fig. 3,, continue in addition with reference to figure 1, show the block diagram of the system 40 of the reference voltage variation that is used for monitoring ADC of another execution mode according to the present invention.In the present embodiment, analogue-to-digital converters or ADC 12.System 40 comprises the similar parts with system 10, and these parts are labeled out with identical reference numerals.Especially, system 40 comprises for the first reference voltage V
REF1Be provided to ADC 12 the first pedestal generator 14, be used for the second reference voltage V
REF2Be provided to ADC 12 the second pedestal generator 20, be used for to receive and process controller 18 and temperature sensor 26 from the digital output code of ADC 12.System 40 will comprise other parts that do not illustrate in the drawings (for example transducer 16, Port Multiplier 22 or switchgear 24).
The ADC 12 of the system 40 shown in Fig. 3 comprises inner Port Multiplier (not shown).Inner Port Multiplier is selected between two inputs: the second reference voltage V
REF2With transducer input V
INEspecially, when starting resistor generator 42, inner Port Multiplier is selected transducer input V
INRather than the second reference voltage V
REF2In this case, according to the ADC operation of routine, transducer is inputted V
INBe provided to ADC 12.On the other hand, when voltage generator 42 forbidding, inner Port Multiplier is selected the second reference voltage V
REF2Rather than transducer input V
INIn this case, in fact, the second reference voltage V
REF2Replace transducer input V
INBe provided to ADC 12.
Conversely, as described above, ADC 12 uses the first reference voltage V
REF1Produce the digital output code of selected input.In addition, when replacing transducer input V
INThe second reference voltage V
REF2When being provided to ADC 12, controller 18 is along with time series analysis numeral output code.In order to follow the trail of the first reference voltage V
REF1Variation and/or change in order to compensate these, controller 18 is carried out this analysis in mode described above.
With reference to figure 1 and 3, in order to minimize the drift in ADC 12 channels, can use following method in system 10.
1) data of storage electronic device (data that provide as electronic device fabricators) in the form of controller 18 inside or algorithm;
2) when making electronic circuit, proofread and correct the channel of ADC 12 to be used for initial the adjustment, also to record the difference of interchannel;
3) periodically channel ground connection (passing through switchgear) is measured drift in this particular moment; And
4) compensate for channel correspondingly, and use drift in the previous data estimation that loads and other channel of compensation.
Above method also can be applied to being independent of controller 18(or other suitable equipment) ADC12, as long as can obtain proper data, if perhaps some in them enough approach to share identical variations in temperature, above method even can be applied to these.If the IC of some ADC of containing 12 sufficient distance each other with the temperature drift of share similar (for example opens, due to the thermal source in same circuits), if temperature contrast is identified in advance and is tabulated or otherwise store, above method can be employed, thereby controller 18 can be estimated remaining ADC 12 drift by the measurement of single IC.
Connection over the ground can be used as external reference, because it is the most stable value in system 10.Yet, if ground connection is difficult to obtain or inconvenient (for example, with positive number measured value, noisy ground as a reference, etc.), can use other source (outside ADC 12 and controller 18).
As the described herein, at least some execution modes of the present invention relate to the theory of introducing the second reference voltage that changes for monitoring ADC reference voltage.Whether follow predetermined variation for the voltage of check measurement, by extra reference voltage, can produce the voltage with predetermined variation.When the operating condition of also monitoring such as temperature, this ability is possible especially.By double self-detection, these execution modes can provide a kind of reference voltage assessment.Comparatively speaking, only by a reference voltage, if not impossible, also be difficult to know due to the variation in external condition, aging etc. the reference voltage that causes.As the described herein, the re-set target of at least some execution modes of the present invention is the variations that minimize reference voltage in obtaining system.
Further as the described herein, some embodiments of the present invention relate to the vehicular sensing system (that is the vehicular sensing system that, contains aging adaptive faculty) that is configured to minimize the adc circuit burn-in effects.
Other execution mode of the present invention provides wherein, and transducer is to form the environment of the digital-analog convertor (" DAC ") of contrast with ADC.DAC is opposite with the ADC effect, and namely DAC is converted to analog output signal with digital input signals.Yet DAC also carries out this conversion with reference voltage.With regard to itself, the same with ADC, be accurate in order to change, reference voltage must be accurate.
Although more than described exemplary embodiment, and be not intended to these execution modes and describe all possible form of the present invention.Just the opposite, the statement that uses in this manual is descriptive statement rather than restrictive statement, and understands in the situation that do not depart from spirit and scope of the invention and can carry out different changes to the present invention.Additionally, the feature of the different execution modes of implementing can be combined to form the further execution mode of the present invention.
Claims (20)
1. system comprises:
Transducer, it is configured to receive the sensor signal of the physical quantity of indication measurement, and produce output signal based on described sensor signal and reference voltage, described transducer also is configured to alternately receive the calibration voltage that replaces described sensor signal, and produces described output signal based on described calibration voltage and described reference voltage.
2. system according to claim 1, wherein:
Controller, it is configured to control described transducer and when receives the described calibration voltage that replaces described sensor signal.
3. system according to claim 1 also comprises:
Controller, it is configured to comparing with the desired value based on the output signal of the assumed value of described calibration voltage and described reference voltage based on the output signal of described calibration voltage and described reference voltage, to detect the variation of described reference voltage.
4. system according to claim 3, wherein:
Described controller also is configured to variation according to detected described reference voltage and compensates described output signal based on described sensor signal and described reference voltage.
5. system according to claim 1 also comprises:
Voltage generator, it is configured to produce described reference voltage, and described reference voltage is provided to described transducer.
6. system according to claim 1 also comprises:
Voltage generator, it is configured to produce the described calibration voltage that receives for described transducer.
7. system according to claim 1 also comprises:
Transducer, it is configured to produce the described sensor signal that receives for described transducer.
8. system according to claim 1, wherein:
Described transducer is analogue-to-digital converters.
9. system comprises:
The first voltage generator, it is configured to produce reference voltage;
Transducer, it is configured to produce output signal based on input signal and described reference voltage;
The second voltage generator, it is configured to produce calibration voltage;
Transducer, it is configured to produce the sensor signal of the physical quantity of indication measurement; And
Controller, it is configured to control described transducer to receive described sensor signal as described input signal, thereby described transducer produces the output signal based on described sensor signal and described reference voltage, and described controller be configured to control described transducer alternately receive replace described sensor signal described calibration voltage as described input signal, thereby described transducer produces the output signal based on described calibration voltage and described reference voltage.
10. system according to claim 9, wherein:
Described controller also is configured to comparing with the desired value based on the output signal of the assumed value of described calibration voltage and described reference voltage based on the described output signal of described calibration voltage and described reference voltage, to detect the variation of described reference voltage.
11. system according to claim 10, wherein:
Described controller also is configured to variation according to the described reference voltage that detects and compensates described output signal based on described sensor signal and described reference voltage.
12. system according to claim 9, wherein:
Described transducer is analogue-to-digital converters.
13. a method comprises:
Receive the sensor signal of the physical quantity of indication measurement at the transducer place, and by the output signal of described transducer generation based on described sensor signal and reference voltage; And
The place alternately receives the calibrating signal that replaces described sensor signal at described transducer, and by the output signal of described transducer generation based on described calibration voltage and described reference voltage.
14. method according to claim 13 also comprises:
Control described transducer and when receive the described calibration voltage that replaces described sensor signal, thereby described transducer periodically receives the described calibration voltage that replaces described sensor signal.
15. method according to claim 13 also comprises:
To compare with the desired value based on the output signal of the assumed value of described calibration voltage and described reference voltage based on the output signal of described calibration voltage and described reference voltage, to detect the variation of described reference voltage.
16. method according to claim 15 also comprises:
According to the compensating for variations of the described reference voltage that the detects described output signal based on described sensor signal and described reference voltage.
17. method according to claim 13 also comprises:
The place generates described reference voltage at voltage generator, and described reference voltage is provided to described transducer from described voltage generator.
18. method according to claim 13 also comprises:
The place generates the described calibration voltage that receives for described transducer at voltage generator.
19. method according to claim 13 also comprises:
The place generates the described sensor signal that receives for described transducer at transducer.
20. method according to claim 13, wherein:
Described transducer is analogue-to-digital converters.
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161576454P | 2011-12-16 | 2011-12-16 | |
| US201161576684P | 2011-12-16 | 2011-12-16 | |
| US61/576,684 | 2011-12-16 | ||
| US61/576,454 | 2011-12-16 | ||
| US13/679,370 US8736468B2 (en) | 2011-12-16 | 2012-11-16 | Method and system for monitoring for variation of converter voltage reference |
| US13/679,370 | 2012-11-16 |
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|---|---|
| CN103166640A true CN103166640A (en) | 2013-06-19 |
| CN103166640B CN103166640B (en) | 2016-08-24 |
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| CN201210548161.5A Active CN103166640B (en) | 2011-12-16 | 2012-12-17 | For monitoring the method and system of the change of converter voltage reference |
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| CN104660258A (en) * | 2013-11-21 | 2015-05-27 | 上海航空电器有限公司 | Analog acquisition circuit with automatic calibration function and calibration method of analog acquisition circuit |
| CN104764468A (en) * | 2014-01-08 | 2015-07-08 | 因文西斯系统公司 | Slew rate detection circuit |
| CN116185119A (en) * | 2023-04-23 | 2023-05-30 | 深圳市九天睿芯科技有限公司 | CIM-based voltage regulating circuit, chip and electronic equipment |
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| CN110166049A (en) * | 2019-06-10 | 2019-08-23 | 中车大连机车车辆有限公司 | Analog-to-digital conversion datum drift automatic compensating method and device |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104660258A (en) * | 2013-11-21 | 2015-05-27 | 上海航空电器有限公司 | Analog acquisition circuit with automatic calibration function and calibration method of analog acquisition circuit |
| CN104764468A (en) * | 2014-01-08 | 2015-07-08 | 因文西斯系统公司 | Slew rate detection circuit |
| CN104764468B (en) * | 2014-01-08 | 2018-10-26 | 因文西斯系统公司 | Conversion rate detection circuit |
| CN116185119A (en) * | 2023-04-23 | 2023-05-30 | 深圳市九天睿芯科技有限公司 | CIM-based voltage regulating circuit, chip and electronic equipment |
| CN116185119B (en) * | 2023-04-23 | 2023-07-21 | 深圳市九天睿芯科技有限公司 | CIM-based voltage regulating circuit, chip and electronic equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103166640B (en) | 2016-08-24 |
| DE102012222935A1 (en) | 2013-06-20 |
| DE102012222935B4 (en) | 2023-03-16 |
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