CN103135626A - Aging room temperature control system - Google Patents
Aging room temperature control system Download PDFInfo
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- CN103135626A CN103135626A CN 201110376536 CN201110376536A CN103135626A CN 103135626 A CN103135626 A CN 103135626A CN 201110376536 CN201110376536 CN 201110376536 CN 201110376536 A CN201110376536 A CN 201110376536A CN 103135626 A CN103135626 A CN 103135626A
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- temperature
- chip microcomputer
- controlled
- single chip
- control system
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Abstract
An aging room temperature control system comprises a single chip microcomputer. The single chip microcomputer is respectively connected with a fault detector, a fault display and a temperature display, connected with a heating box through an optical coupler, a zero-crossing trigger and a bidirectional thyristor in sequence and connected with a thermoelectric couple through an A/D (analog-to-digital) converter and a temperature changer, the thermoelectric couple is used for acquiring the temperature in an aging room, so that a temperature change curve is obtained, data are transmitted to the single chip microcomputer after A/D conversion, the change of the conduction angle of the thyristor is adjusted by calculating controlled quantity through a PID (proportion integration differentiation) controller according to various inputted commands, pulse triggering signals are outputted, the heating box is controlled to heat by driving the bidirectional thyristor through the zero-crossing trigger, a measuring value is prompted to recover to a set value by means of low-temperature heating and high-temperature ventilation, the change of load current is controlled, so that the temperature is automatically controlled in a closed-loop form.
Description
Technical field
The present invention relates to field aging room of electronic product technical field, particularly a kind of burn-in chamber temperature control system.
Background technology
Burn-in chamber is the equipment of a kind of high temperature, abominable test environment that simulates for high-performance electronic product (as: computing machine complete machine, display, terminating machine, auto electronic product, power supply unit, motherboard, monitor and switch type charger etc.), and this equipment has been widely used in the fields such as power supply electronic, computer, communication, bio-pharmaceuticals.
The high low temperature aging test of electronic product is to get rid of electronic product initial failure, controls the necessary means of product quality.The important technology index that the even property of temperature distributing disproportionation is burn-in chamber in burn-in chamber is placed on direct impact the aging result of electronic product in different burn-in chambers zones.At present, the aging room of electronic product of domestic a lot of enterprises, the scope that its temperature control system detects is only certain some temperature in burn-in chamber, thereby be difficult to solve the even practical problems of temperature distributing disproportionation in burn-in chamber, thereby greatly affected the experimental result of the high low temperature aging test of electronic product.
Summary of the invention
Problem for prior art exists the purpose of this invention is to provide a kind of burn-in chamber temperature control system, and it is simple in structure, laying is convenient and use and simple to operately can be effectively reach temperature automatically controlled purpose with the control form of closed loop
The technical solution used in the present invention is:
A kind of burn-in chamber temperature control system, comprise single-chip microcomputer 1, connection is connected in single-chip microcomputer 1 first I/O with fault detect, single-chip microcomputer 1 second I/O is connected that with fault 3 connect, single-chip microcomputer 1 the 3rd I/O is connected that with temperature 4 connect, the 4th I/O of single-chip microcomputer 1 is connected connection by optocoupler 5, zero cross fired 6, bidirectional triode thyristor 7 successively with heating cabinet, the 5th I/O of single-chip microcomputer 1 successively by A/D change 9, temperature variation 10 is connected connection with thermopair.
The present invention compared with prior art has the following advantages:
1. the present invention is reasonable in design, simple in structure and the circuit part line is simple;
2. traditional aging the temperature inside the box is controlled and is generally adopted the open loop temperature control principle, this mode belongs to leading control mode, although have response rapidly, the simple characteristics of control structure, but there is fatal weakness, i.e. system's cumulative errors, the present invention adopts the PID temperature control technology, can effectively address this problem, and PID control technology comparative maturity, flexibility and reliability.
Description of drawings
Accompanying drawing is structural representation of the present invention
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in detail.
With reference to accompanying drawing, a kind of burn-in chamber temperature control system, comprise single-chip microcomputer 1, connection is connected in single-chip microcomputer 1 first I/O with fault detect, single-chip microcomputer 1 second I/O is connected that with fault 3 connect, single-chip microcomputer 1 the 3rd I/O is connected that with temperature 4 connect, and the 4th I/O of single-chip microcomputer 1 is connected connection by optocoupler 5, zero cross fired 6, bidirectional triode thyristor 7 successively with heating cabinet, the 5th I/O of single-chip microcomputer 1 successively by A/D change 9, temperature variation 10 is connected connection with thermopair.
Principle of work of the present invention is:
by the temperature in thermopair 11 collection aging chambers, thereby draw temperature variation curve, send data to single-chip microcomputer 7 after transforming 9 through A/D, various command according to input, calculate controlled quentity controlled variable by the PID controller, then it is passed to controller, controller compares computing to it and inner setting value, regulate the variation of thyristor operating angle according to deviate output controlled quentity controlled variable, the output pulse triggering signal, by zero cross fired 6 drives bidirectional triode thyristors 7, thereby control heating cabinet 8 heating, utilize low-temperature heat, the method that high temperature ventilates impels measured value to return to set-point, the namely variation of control load electric current, thereby the control form with closed loop reaches temperature automatically controlled purpose.
Claims (1)
1. burn-in chamber temperature control system, comprise single-chip microcomputer (1), it is characterized in that: single-chip microcomputer (1) first I/O is connected 2 with fault detect) connect, single-chip microcomputer (1) second I/O is connected that with fault (3) connect, the 3rd I/O of single-chip microcomputer (1) is connected that with temperature (4) connect, the 4th I/O of single-chip microcomputer (1) is successively by optocoupler (5), zero cross fired (6), bidirectional triode thyristor (7) is connected 8 with heating cabinet) connect, the 5th I/O of single-chip microcomputer (1) is changed (9) by A/D successively, temperature variation (10) is connected 11 with thermopair) connect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110376536 CN103135626A (en) | 2011-11-23 | 2011-11-23 | Aging room temperature control system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110376536 CN103135626A (en) | 2011-11-23 | 2011-11-23 | Aging room temperature control system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103135626A true CN103135626A (en) | 2013-06-05 |
Family
ID=48495595
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201110376536 Pending CN103135626A (en) | 2011-11-23 | 2011-11-23 | Aging room temperature control system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103135626A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104076837A (en) * | 2014-07-15 | 2014-10-01 | 太仓市兴港金属材料有限公司 | Wind-free static high-temperature burn-in room |
| CN110296538A (en) * | 2019-06-13 | 2019-10-01 | 黄艺清 | Intelligent watering machine electrolytic circuit |
-
2011
- 2011-11-23 CN CN 201110376536 patent/CN103135626A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104076837A (en) * | 2014-07-15 | 2014-10-01 | 太仓市兴港金属材料有限公司 | Wind-free static high-temperature burn-in room |
| CN110296538A (en) * | 2019-06-13 | 2019-10-01 | 黄艺清 | Intelligent watering machine electrolytic circuit |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20130605 |