CN103076531A - Light emitting diode (LED) failure detection circuit based on MBI5039 chip and detection method - Google Patents
Light emitting diode (LED) failure detection circuit based on MBI5039 chip and detection method Download PDFInfo
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- CN103076531A CN103076531A CN2012105864699A CN201210586469A CN103076531A CN 103076531 A CN103076531 A CN 103076531A CN 2012105864699 A CN2012105864699 A CN 2012105864699A CN 201210586469 A CN201210586469 A CN 201210586469A CN 103076531 A CN103076531 A CN 103076531A
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Abstract
The invention discloses a light emitting diode (LED0 failure detection circuit based on an MBI5039 chip and a detection method. In the overall scheme, a constant-voltage power supply is mainly used for powering a single chip microprocessor, the MBI5039 chip and an LED, and the MBI5039 chip completes the constant-current control and gain control of the LED working current and open-circuit or short-circuit failure detection and information return of the LED; and the single chip microprocessor supplies a control logic signal to the MBI5039 chip, receives a failure return signal of the MBI5039 chip and transmits the failure return signal to a display unit to be displayed. Due to the adoption of the LED failure detection circuit and the detection method, random open-circuit and the short-circuit failure state of the LED in a LED array during the normal working process can be detected online, and the fault information prompting can be conducted.
Description
Technical field
The present invention relates to the circuit of LED technology, be specifically related to the led failure detection technique.
Background technology
Along with the develop rapidly of semiconductor technology, light emitting diode (LED) has been widely used in the products such as illumination, luminescence display and indication.
Because light emitting diode, it generally adopts the mode of array to arrange in use, to reach good result of use.Concrete such as signal light path, various advertising indicator boards etc.
Owing to use for a long time, some light emitting diode in the light emitting diode matrix can occur losing efficacy and can't work, and affects like this result of use of whole light emitting diode matrix.Only have in the past the integral replacing light emitting diode matrix for this situation, this will increase cost greatly.
Therefore the failure detection of light emitting diode matrix and failure message prompting become the problem that the Related product design is considered emphatically day by day in the course of normal operation.
The failure state of light emitting diode is divided into open circuit and short circuit two states in the course of normal operation, existing technology can only detect light emitting diode under short-circuit condition the inefficacy number and carry out information indicating, online detection and failure message prompting when up to the present also not having a kind of detection technique can realize that the light emitting diode in the light emitting diode matrix in the course of normal operation is in open circuit or two kinds of failure states of short circuit at random.
Summary of the invention
The present invention is directed in the prior art and can't detect the problem that light emitting diode is in the open failure state, and provide a kind of led failure testing circuit based on the MBI5039 chip and based on the detection method of this testing circuit.Scheme provided by the invention can detect online in the course of normal operation that light emitting diode is in open circuit or two kinds of failure states of short circuit at random in the light emitting diode matrix, and carries out the failure message prompting.
In order to achieve the above object, the present invention adopts following technical scheme:
Based on the led failure testing circuit of MBI5039 chip, this testing circuit comprises:
Constant voltage source, described constant voltage source is stablized the constant voltage operation source for MBI5039 chip, single-chip microcomputer and light emitting diode to be detected provide;
At least one MBI5039 chip, described MBI5039 chip controls connects light emitting diode to be detected, realization is detected constant current control, gain control and light-emitting diode open-circuit or the short-circuit failure of light emitting diode working current to be detected, and the information that detects is reached single-chip microcomputer;
Single-chip microcomputer, described single-chip microcomputer sends the steering logic signal to the MBI5039 chip, and receives and process the fail message that detects that the MBI5039 chip sends;
The information result that display unit, described display unit receive and the demonstration single-chip microcomputer is handled well.
In the preferred embodiment of testing circuit, described constant voltage source provides the constant pressure source of DC5V.
Further, if described MBI5039 chip is a plurality of, is connected in series between them and is connected to form with the loop with single-chip microcomputer.
Based on the led failure detection method of above-mentioned testing circuit, it comprises the steps:
(1) to the single-chip microcomputer power supply, single-chip microcomputer carries out first self check and initial work to constant voltage source first, and at this moment all light emitting diodes to be detected are all not luminous;
(2) after single-chip microcomputer is finished initial work, send one group of control data and deliver to the MBI5039 chip, the trigger mode of the working current gain of light emitting diode, the detecting of losing efficacy and the threshold voltage of light-emitting diodes tube short circuit detecting are set;
(3) single-chip microcomputer sends one group of demonstration data to the MBI5039 chip, and the MBI5039 chip is lighted light emitting diode to be detected according to the demonstration data;
(4) lighting light emitting diode simultaneously, the voltage drop that each current channel of MBI5039 chip Auto-Sensing produces at chip internal, if voltage drop that current channel produces is arranged not in default threshold values, then sends a string potential pulse by data-out port, and reach single-chip microcomputer;
(5) single-chip microcomputer receives the voltage pulse train of MBI5039 chip output, by counting and translation operation, thereby obtains the inefficacy number of light emitting diode and send the display unit information of carrying out to show.
By such scheme the LED in the light emitting diode matrix is carried out failure detection, can guarantee no matter LED is in the open failure state or is in the short-circuit failure state, can both effectively count the inefficacy number of LED in the light emitting diode matrix.
Description of drawings
Further specify the present invention below in conjunction with the drawings and specific embodiments.
Fig. 1 is the schematic diagram of testing circuit among the present invention.
Embodiment
For technological means, creation characteristic that the present invention is realized, reach purpose and effect is easy to understand, below in conjunction with concrete diagram, further set forth the present invention.
Led failure testing circuit provided by the invention detects online with failure message when utilizing the realization of MBI5039 chip that the light emitting diode in the light emitting diode matrix in the course of work is in open circuit or two kinds of failure states of short circuit at random and points out.
Wherein MBI5039 is 16 road constant-current driven chips, has the programmable current gain control in 64 rank, and the scope that gain is adjusted can be used for the aspects such as brightness adjustment, temperature compensation from 200% to 12.5% of current setting value.Error detection function when having normal operating conditions adopts the mode of " data are advanced, and mistake goes out " to detect and repay.Alarm function with temperature overheating provides system to adopt necessary safeguard measure.
Referring to Fig. 1, whole testing circuit 100 provided by the invention mainly partly is made of constant voltage source 101, single-chip microcomputer 102, MBI5039 chip 103 and display unit 104 etc.
In testing circuit of the present invention, adopt at least a MBI5039 chip 103, detect as required the number of light emitting diode 200 and decide for the number that adopts MBI5039 chip 103.
MBI5039 chip 103 detects the negative electrode that interface connects respectively corresponding reflective diode 200 to be detected when concrete the connection, so that mutually arranged side by side between the light emitting diode 200 to be detected; Each MBI5039 chip 103 is connected to single-chip microcomputer 102 by corresponding output port simultaneously.
Simultaneously MBI5039 chip 103 joins with single-chip microcomputer 102 by the SD1 interface on it and SD0 interface and forms the detection loop, when if a plurality of MBI5039 chip 103 is arranged, by the SD1 interface on it and SD0 interface serial connection, join to forming with single-chip microcomputer 102 again and detect the loop between the MBI5039 chip 103.
As shown in Figure 1, have three MBI5039 chips 103 in the testing circuit example that it provides, these three MBI5039 chips 103 all pass through corresponding output port (such as pin CK, ST, OE) be connected to single-chip microcomputer 102, simultaneously between these three MBI5039 chips 103, the SD1 interface of first MBI5039 chip 103 connects single-chip microcomputer 102, SD0 interface on it connects the SD1 interface of second MBI5039 chip 103, and the SD0 interface of second MBI5039 chip 103 connects the SD1 interface of the 3rd MBI5039 chip 103, the SD0 interface of last the 3rd MBI5039 chip 103 connects single-chip microcomputer 102 again, can enough detect the loop thus.
Single-chip microcomputer 102 is used for providing the steering logic signal to MBI5039 chip 103 and receive the inefficacy repayment signal that MBI5039 chip 103 detects when detecting, and this signal is processed the number that obtains occurring in the light emitting diode 200 to be detected the light emitting diode of open failure state and short-circuit failure state.
Based on the testing circuit that such scheme forms, its process of carrying out the detection of light emitting diode failure state is as follows:
At first set testing circuit according to such scheme, and after itself and light emitting diode to be detected connected, with DC5V constant voltage source 101 pluggeds.
Behind DC5V constant voltage source 101 pluggeds, it will provide the constant voltage working power for all the MBI5039 chips 103 in single-chip microcomputer 102, the testing circuit and light emitting diode 200 to be detected.
Single-chip microcomputer 102 carries out first self check and initial work after connecting working power, at this moment all light emitting diodes to be detected 200 are all not luminous.
After single-chip microcomputer 102 is finished initial work, send first one group of control data and deliver to MBI5039 chips 103 all in the testing circuit, each MBI5039 chip 103 arranges the trigger mode of the working current gain of light emitting diode 200, the detecting of losing efficacy and the threshold voltage of light-emitting diodes tube short circuit detecting according to obtaining the control data.
At MBI5039 chip 103 after setting completed, single-chip microcomputer 102 sends one group to each MBI5039 chip 103 and shows data, and each MBI5039 chip 103 drives according to the demonstration data that receive and lights the light emitting diode 200 that connects.
Lighting light emitting diode 200 simultaneously, each MBI5039 chip produces each current channel of Auto-Sensing at chip internal voltage drop, and the threshold voltage of the voltage drop value that detects and the predefined light-emitting diodes tube short circuit detecting of MBI5039 chip compared, judge whether this voltage drop is in this threshold value, if voltage drop that current channel produces is arranged not in default threshold values, then sends a string potential pulse by data-out port to single-chip microcomputer 102.
Single-chip microcomputer receives the voltage pulse train that MBI5039 chip 103 data-out ports are sent in the whole testing circuit, section is by counting and translation operation within it, thereby obtain the number of the inefficacy light emitting diode in the light emitting diode to be detected, and the result that will calculate forms corresponding display command and is sent to display unit 104 information of carrying out and shows.
The above-mentioned course of work can repeat after single-chip microcomputer is finished initial work, thereby finishes online detection and failure message prompting when the light emitting diode in the light emitting diode matrix is in open circuit or two kinds of failure states of short circuit at random in the course of normal operation.
More than show and described ultimate principle of the present invention, principal character and advantage of the present invention.The technician of the industry should understand; the present invention is not restricted to the described embodiments; that describes in above-described embodiment and the instructions just illustrates principle of the present invention; without departing from the spirit and scope of the present invention; the present invention also has various changes and modifications, and these changes and improvements all fall in the claimed scope of the invention.The claimed scope of the present invention is defined by appending claims and equivalent thereof.
Claims (4)
1. based on the led failure testing circuit of MBI5039 chip, it is characterized in that described testing circuit comprises:
Constant voltage source, described constant voltage source is stablized the constant voltage operation source for MBI5039 chip, single-chip microcomputer and light emitting diode to be detected provide;
At least one MBI5039 chip, described MBI5039 chip controls connects light emitting diode to be detected, realization is detected constant current control, gain control and light-emitting diode open-circuit or the short-circuit failure of light emitting diode working current to be detected, and the information that detects is reached single-chip microcomputer;
Single-chip microcomputer, described single-chip microcomputer sends the steering logic signal to the MBI5039 chip, and receives and process the fail message that detects that the MBI5039 chip sends;
The information result that display unit, described display unit receive and the demonstration single-chip microcomputer is handled well.
2. the led failure testing circuit based on the MBI5039 chip according to claim 1 is characterized in that described constant voltage source provides the constant pressure source of DC5V.
3. the led failure testing circuit based on the MBI5039 chip according to claim 1 is characterized in that, if described MBI5039 chip is a plurality of, is connected in series between them and is connected to form with the loop with single-chip microcomputer.
4. based on the led failure detection method of MBI5039 chip, it is characterized in that described detection method comprises the steps:
(1) to the single-chip microcomputer power supply, single-chip microcomputer carries out first self check and initial work to constant voltage source first, and at this moment all light emitting diodes to be detected are all not luminous;
(2) after single-chip microcomputer is finished initial work, send one group of control data and deliver to the MBI5039 chip, the trigger mode of the working current gain of light emitting diode, the detecting of losing efficacy and the threshold voltage of light-emitting diodes tube short circuit detecting are set;
(3) single-chip microcomputer sends one group of demonstration data to the MBI5039 chip, and the MBI5039 chip is lighted light emitting diode to be detected according to the demonstration data;
(4) lighting light emitting diode simultaneously, the voltage drop that each current channel of MBI5039 chip Auto-Sensing produces at chip internal, if voltage drop that current channel produces is arranged not in default threshold values, then sends a string potential pulse by data-out port, and reach single-chip microcomputer;
(5) single-chip microcomputer receives the voltage pulse train of MBI5039 chip output, by counting and translation operation, thereby obtains the inefficacy number of light emitting diode and send the display unit information of carrying out to show.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2012105864699A CN103076531A (en) | 2012-12-28 | 2012-12-28 | Light emitting diode (LED) failure detection circuit based on MBI5039 chip and detection method |
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| CN2012105864699A CN103076531A (en) | 2012-12-28 | 2012-12-28 | Light emitting diode (LED) failure detection circuit based on MBI5039 chip and detection method |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104865485A (en) * | 2015-04-24 | 2015-08-26 | 句容华源电器设备有限公司 | Isolation switch conductive loop contact failure fault detection method |
| CN107300665A (en) * | 2017-06-13 | 2017-10-27 | 江苏固立得精密光电有限公司 | A kind of LED chip pressure drop method for monitoring abnormality of multiple light courcess |
| CN110108973A (en) * | 2019-05-07 | 2019-08-09 | 武汉辉天同康科技有限公司 | A kind of bonder terminal test macro |
| CN113176490A (en) * | 2021-05-06 | 2021-07-27 | 天津市中环电子计算机有限公司 | Method for evaluating and testing service life of screen of industrial all-in-one machine |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1159269A (en) * | 1997-08-27 | 1999-03-02 | Nippon Signal Co Ltd:The | Driving device for signal light |
| CN201654179U (en) * | 2010-02-09 | 2010-11-24 | 深圳市博远交通设施有限公司 | Miss spot detection device of LED induced screen |
| CN201838296U (en) * | 2010-10-09 | 2011-05-18 | 深圳市洲明科技股份有限公司 | Automatic dead pixel detecting device of LED (light-emitting diode) display |
| CN102186276A (en) * | 2011-03-08 | 2011-09-14 | 天利半导体（深圳）有限公司 | LED (light emitting diode) constant current driving circuit with current detection and LED backlight system |
-
2012
- 2012-12-28 CN CN2012105864699A patent/CN103076531A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1159269A (en) * | 1997-08-27 | 1999-03-02 | Nippon Signal Co Ltd:The | Driving device for signal light |
| CN201654179U (en) * | 2010-02-09 | 2010-11-24 | 深圳市博远交通设施有限公司 | Miss spot detection device of LED induced screen |
| CN201838296U (en) * | 2010-10-09 | 2011-05-18 | 深圳市洲明科技股份有限公司 | Automatic dead pixel detecting device of LED (light-emitting diode) display |
| CN102186276A (en) * | 2011-03-08 | 2011-09-14 | 天利半导体（深圳）有限公司 | LED (light emitting diode) constant current driving circuit with current detection and LED backlight system |
Non-Patent Citations (1)
| Title |
|---|
| 吴仲佑: "交通导引显示屏解决方案——具有侦测功能的智能型LED驱动芯片", 《现代显示》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104865485A (en) * | 2015-04-24 | 2015-08-26 | 句容华源电器设备有限公司 | Isolation switch conductive loop contact failure fault detection method |
| CN107300665A (en) * | 2017-06-13 | 2017-10-27 | 江苏固立得精密光电有限公司 | A kind of LED chip pressure drop method for monitoring abnormality of multiple light courcess |
| CN110108973A (en) * | 2019-05-07 | 2019-08-09 | 武汉辉天同康科技有限公司 | A kind of bonder terminal test macro |
| CN113176490A (en) * | 2021-05-06 | 2021-07-27 | 天津市中环电子计算机有限公司 | Method for evaluating and testing service life of screen of industrial all-in-one machine |
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Application publication date: 20130501 |