CN103076532A - Failure detection circuit and detection method for light emitting diode (LED) - Google Patents
Failure detection circuit and detection method for light emitting diode (LED) Download PDFInfo
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Abstract
The invention discloses a failure detection circuit and a detection method for a light emitting diode (LED). A plurality of voltage-stabilizing diodes in the detection circuit are respectively connected in parallel to two ends of each LED in an LED array; a constant-voltage power supply supplies power to the LED array; and a constant-current control circuit is in control connection with two ends of each LED string in the LED array and is used for detecting voltage drop of each LED in each LED string in real time. The detection method comprises the following steps of: firstly, detecting the work state of each LED in each LED string in the LED array in real time by the detection circuit; secondly, allowing voltage values at two ends of a collector electrode and a transmitting electrode on a triode in the detection circuit to change along with the change of failure conditions of each LED in each LED string; and thirdly, determining the failure state of the LED by detecting change conditions of the voltage values of two ends of the collector electrode and the transmitting electrode on the triode. According to the failure detection circuit and the detection method disclosed by the invention, online detection and fault information prompt required by the fact that the LED in the LED array is randomly positioned in two failure states of open circuit or short circuit in normal work process can be realized.
Description
Technical field
The present invention relates to the circuit of LED technology, be specifically related to detect the technology of led failure.
Background technology
Along with the develop rapidly of semiconductor technology, light emitting diode (LED) has been widely used in the products such as illumination, luminescence display and indication.
Because light emitting diode, it generally adopts the mode of array to arrange in use, to reach good result of use.Concrete such as signal light path, various advertising indicator boards etc.
Owing to using for a long time, some light emitting diode in the light emitting diode matrix can occur losing efficacy and can't work, and affects like this result of use of whole light emitting diode matrix.Only have in the past the integral replacing light emitting diode matrix for this situation, this will increase cost greatly.
Therefore the failure detection of light emitting diode matrix and failure message prompting become the problem that the Related product design is considered emphatically day by day in the course of normal operation.
The failure state of light emitting diode is divided into open circuit and short circuit two states in the course of normal operation, existing technology can only detect light emitting diode under short-circuit condition the inefficacy number and carry out information indicating, online detection and failure message prompting when up to the present also not having a kind of detection technique can realize that the light emitting diode in the light emitting diode matrix in the course of normal operation is in open circuit or two kinds of failure states of short circuit at random.
Summary of the invention
The failure detection technology that the present invention is directed to existing light emitting diode can only detect the problem of the inefficacy number of light emitting diode under short-circuit condition, and the detection method that a kind of led failure testing circuit is provided and implements based on this testing circuit.Online detection and failure message prompting when this technical scheme can realize that the light emitting diode in the light emitting diode matrix in the course of normal operation is in open circuit or two kinds of failure states of short circuit at random.
In order to achieve the above object, the present invention adopts following technical scheme:
A kind of led failure testing circuit, described testing circuit comprises some voltage stabilizing diodes, constant voltage source, constant-current control circuit, described some voltage stabilizing diodes are connected in parallel on respectively the two ends of each light emitting diode in the light emitting diode matrix, described constant voltage source is to power light emitting diode arrays, so that each light emitting diode string all is in the constant current duty in the light emitting diode matrix, the voltage drop of each light emitting diode in each light emitting diode string is detected at the two ends of each light emitting diode string in real time in the described constant-current control circuit control linkage light emitting diode matrix.
In the preferred embodiment of testing circuit, more than the high 0.5V of forward drop of the voltage stabilizing value of described voltage stabilizing diode than light emitting diode.
Further, described testing circuit also comprises single-chip microcomputer, and described single-chip microcomputer and constant-current control circuit join.
Further, described constant-current control circuit mainly is comprised of triode, the first resistance, voltage stabilizing diode, the second resistance, negative pole and the single-chip microcomputer of each light emitting diode string in the collector connecting luminous diode array of described triode; The emitter of triode is by the second resistance eutral grounding; The base stage of triode is passed through the positive pole of each light emitting diode string in the first resistance connecting luminous diode array, and by voltage stabilizing diode ground connection.
Further, described triode is operated in magnifying state.
Led failure detection method based on above-mentioned testing circuit is implemented comprises the steps:
(1) detects in real time the duty of every light emitting diode in each light emitting diode string in the light emitting diode matrix by testing circuit;
(2) magnitude of voltage at the collector and emitter two ends on the triode in the testing circuit will occur according to the failure conditions of every light emitting diode in the light emitting diode string to change;
(3) situation of change of the magnitude of voltage at the collector and emitter two ends on the detection transistor is determined the failure state of light emitting diode.
In the preferred embodiment of detection method, described detection method comprises that also single-chip microcomputer becomes the changing value of the collector and emitter both end voltage value on the triode in the testing circuit into digital quantity by analog to digital conversion, and application FUZZY ALGORITHMS FOR CONTROL, calculate the number of the light emitting diode that produces failure of removal, send display unit to carry out the step that information shows.
Further, the situation of change of the magnitude of voltage at the collector and emitter two ends on the triode is as follows in the described step (2):
(21) if when certain diode is short-circuited in certain light emitting diode string in the light emitting diode matrix, Vf falls in the diode drop that breaks down will vanishing; The magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends increases a Vf value; Such as the light emitting diode string n light emitting diode is arranged, and the fault that all is short-circuited, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends increases n Vf value;
(22) if when open circuit occurs in certain diode in certain light emitting diode string in the light emitting diode matrix, the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends reduces by a Vz-Vf value, wherein Vz is the voltage stabilizing value that is connected to the stabilivolt of the LED that open circuit occurs, the forward voltage drop value when Vf is light emitting diode work; If the light emitting diode string has the n light emitting diode, and open fault occurs all, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends reduces n (Vz-Vf) value;
(23) if n light emitting diode in certain light emitting diode string in the light emitting diode matrix, when wherein having n1 light emitting diode to be short-circuited with n2 light emitting diode generation open circuit, and n=n1+n2, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends is changed to n1 * Vf-n2 * (Vz-Vf).
Compared with the prior art, scheme provided by the invention can effectively be carried out light emitting diode in the light emitting diode matrix (LED) failure detection, can guarantee no matter LED is in the open failure state or is in the short-circuit failure state, can both effectively count the inefficacy number of LED in the light emitting diode matrix.
Description of drawings
Further specify the present invention below in conjunction with the drawings and specific embodiments.
Fig. 1 is the schematic diagram of testing circuit among the present invention.
Embodiment
For technological means, creation characteristic that the present invention is realized, reach purpose and effect is easy to understand, below in conjunction with concrete diagram, further set forth the present invention.
Referring to Fig. 1, led failure testing circuit 100 provided by the invention detects online with failure message in the time of can being at random open circuit or two kinds of failure states of short circuit to the light emitting diode in the light emitting diode matrix in the course of work and points out.
As figure shows, this testing circuit 100 for light emitting diode matrix by some light emitting diode strings 200 and connect and form, each light emitting diode string 200 is formed by some light emitting diodes 201 serial connections.For the ease of follow-up statement, light emitting diode matrix adopts led array to represent, light emitting diode string 200 adopts 200 expressions of LED string, and light emitting diode 201 adopts LED(201) expression.
Simultaneously, testing circuit 100 mainly comprises some voltage stabilizing diodes 101, constant voltage source 102, constant-current control circuit 103, single-chip microcomputer 104 and display unit 105.
Some voltage stabilizing diodes 101 are attempted by respectively each LED(201 in each LED string 200) on so that each LED(201 in the led array) on and connect a voltage stabilizing diode 101.
The voltage stabilizing value of concrete voltage stabilizing diode 101 is than LED(201) the high 0.5V of forward drop more than.
Constant voltage source 102 is the led array power supply, so that each LED string 200 all is in the constant current duty in the led array.
Constant-current control circuit 103 is for detection of the duty of each LED in each LED string 200 in the led array.Have several constant-current control circuits 103 in the whole testing circuit, the voltage drop of each LED201 in each LED string 200 is detected at the two ends of each LED string 200 in each constant-current control circuit 103 control linkage led array in real time.
Concrete, constant-current control circuit 103 mainly is comprised of triode VT1, the first resistance R 1, voltage stabilizing diode VZ1, the second resistance R L1, and wherein the collector of triode VT1 (being the C end) connects the negative pole of each LED string 200 in the led array; The emitter of triode VT1 (being the E end) is by the second resistance R L1 ground connection; The base stage of triode VT1 (being the B end) connects the positive pole of each LED string 200 in the led array by the first resistance R 1, and by voltage stabilizing diode VZ1 ground connection.
In constant-current control circuit 103, triode VT1 works in magnifying state as the constant current gauge tap; Voltage stabilizing diode VZ1 provides a reference voltage for triode VT1; The first resistance R 1 provides base bias current for triode VT1; The second resistance R L1 is used for adjusting the electric current in whole LED loop.
When specific works, this triode is operated in magnifying state.
The structure of all the other constant-current control circuits 103 among the figure is same as described above, is not given unnecessary details herein.
In order can the information that detect to be shown, testing circuit provided by the invention also comprises a single-chip microcomputer 104 and display unit 105.
Constant-current control circuit 103 in this single-chip microcomputer 104 and the testing circuit joins, the collector of triode VT1 joins in concrete and the constant-current control circuit 103, be used for the changing value of the collector and emitter both end voltage value on the testing circuit triode is become digital quantity by analog to digital conversion, and application FUZZY ALGORITHMS FOR CONTROL, calculate the number of the LED that produces failure of removal, send display unit 105 information of carrying out to show.
Based on above-mentioned testing circuit, the present invention detects with the process of failure message prompting as follows to open circuit or the two kinds of failure states of short circuit of LED in the led array online in real time:
(1) is arranged on according to such scheme and sets led failure testing circuit 100 in the led array.
(2) by the testing circuit 100 real-time duties that detect the every LEDs (201) in each LED string 200 in the led array;
(3) magnitude of voltage at the collector and emitter two ends on the triode on the constant-current control circuit 103 will occur to change according to the failure conditions of every LEDs (201) in the corresponding LED string 200 in the testing circuit 100, and is specific as follows:
(31) if when certain LEDs is short-circuited in certain LED string in the led array, the forward drop Vf of the LED that breaks down will vanishing; Transistor collector in the corresponding constant-current control circuit and the magnitude of voltage at emitter two ends increase a Vf value; Such as the LED string n LED arranged, and the fault that all is short-circuited, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends increases n Vf value;
(32) if when open circuit occurs in certain LEDs in certain LED string in the led array, transistor collector in the corresponding constant-current control circuit and the magnitude of voltage at emitter two ends reduce by a Vz-Vf value, wherein Vz is the voltage stabilizing value that is connected to the stabilivolt of the LED that open circuit occurs, the forward voltage drop value when Vf is light emitting diode work; If the LED string has n LED, and open fault all occurs, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends reduces n (Vz-Vf) value (implication of Vz and Vf is the same);
(33) if n LED in certain LED string in the led array, when wherein having the n1 LEDs to be short-circuited with n2 LEDs generation open circuit, and n=n1+n2, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends is changed to that n1 * Vf-n2 * (Vz-Vf), wherein the implication of Vz and Vf is the same.
(4) situation of change of the magnitude of voltage at the collector and emitter two ends on the detection transistor is determined the failure state of light emitting diode.
(5) single-chip microcomputer becomes the changing value of the collector and emitter both end voltage value on the triode in the testing circuit into digital quantity by analog to digital conversion, and application FUZZY ALGORITHMS FOR CONTROL, calculate the number of the light emitting diode that produces failure of removal, send the display unit information of carrying out to show.
As from the foregoing, detection scheme provided by the invention is as long as can know very quickly and accurately in the led array that according to the magnitude of voltage situation of change at the transistor collector in the constant-current control circuit in the testing circuit and emitter two ends what LED are short-circuited in that LED string, what LED open a way.
Above demonstration and described ultimate principle of the present invention, principal character and advantage of the present invention.The technician of the industry should understand; the present invention is not restricted to the described embodiments; that describes in above-described embodiment and the instructions just illustrates principle of the present invention; without departing from the spirit and scope of the present invention; the present invention also has various changes and modifications, and these changes and improvements all fall in the claimed scope of the invention.The claimed scope of the present invention is defined by appending claims and equivalent thereof.
Claims (8)
1. led failure testing circuit, it is characterized in that, described testing circuit comprises some voltage stabilizing diodes, constant voltage source, constant-current control circuit, described some voltage stabilizing diodes are connected in parallel on respectively the two ends of each light emitting diode in the light emitting diode matrix, described constant voltage source is to power light emitting diode arrays, so that each light emitting diode string all is in the constant current duty in the light emitting diode matrix, the voltage drop of each light emitting diode in each light emitting diode string is detected at the two ends of each light emitting diode string in real time in the described constant-current control circuit control linkage light emitting diode matrix.
2. a kind of led failure testing circuit according to claim 1 is characterized in that, more than the high 0.5V of forward drop of the voltage stabilizing value of described voltage stabilizing diode than light emitting diode.
3. a kind of led failure testing circuit according to claim 1 is characterized in that, described testing circuit also comprises single-chip microcomputer, and described single-chip microcomputer and constant-current control circuit join.
4. according to claim 1 or 3 described a kind of led failure testing circuits, it is characterized in that, described constant-current control circuit mainly is comprised of triode, the first resistance, voltage stabilizing diode, the second resistance, negative pole and the single-chip microcomputer of each light emitting diode string in the collector connecting luminous diode array of described triode; The emitter of triode is by the second resistance eutral grounding; The base stage of triode is passed through the positive pole of each light emitting diode string in the first resistance connecting luminous diode array, and by voltage stabilizing diode ground connection.
5. a kind of led failure testing circuit according to claim 4 is characterized in that, described triode is operated in magnifying state.
6. the led failure detection method is characterized in that, described detection method comprises the steps:
(1) detects in real time the duty of every light emitting diode in each light emitting diode string in the light emitting diode matrix by testing circuit;
(2) magnitude of voltage at the collector and emitter two ends on the triode in the testing circuit will occur according to the failure conditions of every light emitting diode in the light emitting diode string to change;
(3) situation of change of the magnitude of voltage at the collector and emitter two ends on the detection transistor is determined the failure state of light emitting diode.
7. led failure detection method according to claim 6, it is characterized in that, described detection method comprises that also single-chip microcomputer becomes the changing value of the collector and emitter both end voltage value on the triode in the testing circuit into digital quantity by analog to digital conversion, and application FUZZY ALGORITHMS FOR CONTROL, calculate the number of the light emitting diode that produces failure of removal, send display unit to carry out the step that information shows.
8. led failure detection method according to claim 6 is characterized in that, the situation of change of the magnitude of voltage at the collector and emitter two ends in the described step (2) on the triode is as follows:
(21) if when certain diode is short-circuited in certain light emitting diode string in the light emitting diode matrix, Vf falls in the diode drop that breaks down will vanishing; The magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends increases a Vf value; Such as the light emitting diode string n light emitting diode is arranged, and the fault that all is short-circuited, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends increases n Vf value;
(22) if when open circuit occurs in certain diode in certain light emitting diode string in the light emitting diode matrix, the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends reduces by a Vz-Vf value, wherein Vz is the voltage stabilizing value that is connected to the stabilivolt of the LED that open circuit occurs, the forward voltage drop value when Vf is light emitting diode work; If the light emitting diode string has the n light emitting diode, and open fault occurs all, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends reduces n (Vz-Vf) value;
(23) if n light emitting diode in certain light emitting diode string in the light emitting diode matrix, when wherein having n1 light emitting diode to be short-circuited with n2 light emitting diode generation open circuit, and n=n1+n2, then the magnitude of voltage at the transistor collector in the constant-current control circuit and emitter two ends is changed to n1 * Vf-n2 * (Vz-Vf).
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| CN107300665A (en) * | 2017-06-13 | 2017-10-27 | 江苏固立得精密光电有限公司 | A kind of LED chip pressure drop method for monitoring abnormality of multiple light courcess |
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| CN110189689A (en) * | 2019-06-20 | 2019-08-30 | 深圳市艾希亿智能科技有限公司 | LED display control circuit |
| CN110944431A (en) * | 2019-12-16 | 2020-03-31 | 华帝股份有限公司 | LED lamp failure detection circuit and electrical and temperature failure detection method |
| CN114868025A (en) * | 2020-02-20 | 2022-08-05 | 元平台技术有限公司 | System with dedicated light emitting diodes for performance characterization |
| CN116416911A (en) * | 2021-12-30 | 2023-07-11 | 深圳市明微电子股份有限公司 | A port voltage stabilization method and system for LED display |
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| CN114415061A (en) * | 2022-02-25 | 2022-04-29 | 深圳市泛海三江电子股份有限公司 | Lighting lamp LED fault detection circuit and device |
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