CN103076332A - System for measuring vaporization time - Google Patents
System for measuring vaporization time Download PDFInfo
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- CN103076332A CN103076332A CN2013100116376A CN201310011637A CN103076332A CN 103076332 A CN103076332 A CN 103076332A CN 2013100116376 A CN2013100116376 A CN 2013100116376A CN 201310011637 A CN201310011637 A CN 201310011637A CN 103076332 A CN103076332 A CN 103076332A
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- vaporization
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Abstract
The invention discloses a system for measuring vaporization time. The system comprises a detector, a beam-expanding device, an imaging device, and an image processing device which are arranged in sequence, wherein a laser heating device and a sample to-be-detected are arranged between the beam-expanding device and the imaging device; the beam-expanding device is used for conducting beam-expanding processing on laser beams emitted by the detector; the laser heating device is used for emitting strong laser to heat the sample to-be-detected; the imaging device is used for real-time imaging of the vaporization generation area of the sample to-be-detected, and recording the image of the vaporization generation area of the sample to-be-detected during the heating process; and the image processing device is used for defining the vaporization time of the sample to-be-detected according to the image recorded by the imaging device. According to the method, the fluent change above the sample to-be-detected is measured according to an optical manner, the imaging device is used for imaging, and the image processing device is used for post processing, so as to obtain the accurate vaporization time of the sample to-be-detected.
Description
Technical field
The present invention relates to field of photoelectric technology, relate in particular to a kind of system for measuring vaporization time.
Background technology
Vaporization time after existing measurement sample is heated generally is to adopt thermometry, thermometry is the temperature that records testing sample by the mode of contact, namely accept the heat of sample by thermal sensing element, thereby obtain the temperature of sample, according to the vaporization time of the temperature computation testing sample that records.But the method is to conduct to realize thermometric by heat, and hot conduction need to be just accurate after thermal sensing element and testing sample reach thermal equilibrium, but the temperature hysteresis of thermal sensing element institute perception is in sample in the reality, inevitably there is the problem of the temperature hysteresis that records, makes the vaporization time that records inaccurate.
Summary of the invention
In view of above-mentioned analysis, the present invention aims to provide a kind of system for measuring vaporization time, in order to the accuracy of the vaporization time that solves further raising specimen.
Purpose of the present invention mainly is achieved through the following technical solutions:
A kind of system for measuring vaporization time comprises the detector, parallel beam expand device, imaging device and the image processing apparatus that set gradually, is provided with laser heating device and testing sample between described parallel beam expand device and the described imaging device;
Described detector is used for continuing to send laser beam to described parallel beam expand device;
Described parallel beam expand device, the laser beam that is used for described detector is sent expands processing;
Described laser heating device is used for sending light laser, by this light laser described testing sample is heated;
Described imaging device be used for real time imagery is carried out in the vaporization generation zone of described testing sample, and the vaporization of testing sample described in the record heating process produces the image in zone;
Described image processing apparatus is for the time of determining the vaporization of described testing sample according to the image of described imaging device record.
Preferably, between described testing sample and described imaging device, narrow band pass filter is set;
Described narrow band pass filter is used for the parasitic light of the laser beam that the described detector of filtering sends, and the laser beam behind the filtering veiling glare carries out imaging at described imaging device.
Preferably, described imaging device comprises: imaging len, diaphragm and camera;
Described imaging len is used for that described vaporization is produced the zone and carries out imaging processing;
Described diaphragm for the size of adjusting imaging beam, makes described vaporization produce zone imaging on described camera;
Described camera is used for recording the picture that described vaporization produces the zone.
Preferably, described image processing apparatus specifically is used for, the image behind the described camera imaging is processed, and when having the vaporization product to fly out in the image, then should constantly be the time that vaporization occurs described testing sample.
Beneficial effect of the present invention is as follows:
The invention provides a kind of system for measuring vaporization time, by a laser instrument is set before testing sample, the laser beam that laser instrument sends is through imaging on imaging device behind the parallel beam expand device, process the time that obtains the testing sample vaporization through image processing apparatus again, the present invention measures the variation in flow field, testing sample top by the mode of optics, and carry out imaging at imaging device, and carry out post-processed by image processing apparatus again, can obtain the accurate vaporization time of testing sample.
Other features and advantages of the present invention will be set forth in the following description, and becoming apparent from instructions of part perhaps understood by implementing the present invention.Purpose of the present invention and other advantages can realize and obtain by specifically noted structure in the instructions of writing, claims and accompanying drawing.
Description of drawings
Fig. 1 is the system schematic that is used for measuring vaporization time in the embodiment of the invention 1;
Fig. 2 is the system schematic that is used for measuring vaporization time in the embodiment of the invention 2.
Embodiment
Specifically describe the preferred embodiments of the present invention below in conjunction with accompanying drawing, wherein, accompanying drawing consists of the application's part, and is used for explaining together with embodiments of the present invention principle of the present invention.For clear and simplification purpose, when it may make theme of the present invention smudgy, with specifying in detail of known function and structure in the omission device described herein.
Embodiment 1
The embodiment of the invention provides a kind of system for measuring vaporization time, referring to Fig. 1, and this system
Comprise the detector, parallel beam expand device, imaging device and the image processing apparatus that set gradually, be provided with laser heating device and testing sample between described parallel beam expand device and the described imaging device;
Described detector is used for continuing to send laser beam to described parallel beam expand device;
Described parallel beam expand device, the laser beam that is used for described detector is sent expands processing;
Described laser heating device is used for sending light laser, by this light laser described testing sample is heated;
Described imaging device be used for real time imagery is carried out in the vaporization generation zone of described testing sample, and the vaporization of testing sample described in the record heating process produces the image in zone;
Described image processing apparatus is for the time of determining the vaporization of described testing sample according to the image of described imaging device record.
Wherein, described vaporization produces the upper area that the zone is specially described testing sample surface, and this upper area should be tried one's best near described testing sample.
The invention provides a kind of system for measuring vaporization time, by a laser instrument is set before testing sample, the laser beam that laser instrument sends is through imaging on imaging device behind the parallel beam expand device, process the time that obtains the testing sample vaporization through image processing apparatus again, the present invention measures the variation in flow field, testing sample top by the mode of optics, and carry out imaging at imaging device, carry out post-processed by image processing apparatus again, can obtain the accurate vaporization time of testing sample, and this system architecture is simple, operates conveniently.
Embodiment 2
The embodiment of the invention provides a kind of system for measuring vaporization time, and referring to Fig. 2, this system comprises detector, parallel beam expand device, narrow band pass filter and the imaging device that sets gradually;
The measuring principle of the embodiment of the invention is: if be normality in the variation of time shutter flow field, then light beam is uniform by the illumination of this flow field on the optical system image planes; Present different refractive index gradients if the variation of Media density appears in the testing sample upper area, when then light beam is by this zone deviation will occur, cause the camera upper illumination of practising physiognomy to change.The experimental data that camera records is exactly the variation of this illumination, starting point time of analytic sample vaporization then, thus determine the vaporization time of testing sample.
Place testing sample between described parallel beam expand device and the described narrow band pass filter, after the light beam that described detector sends expands through described parallel beam expand device, vaporization by testing sample produces the zone, again imaging on described imaging device after described narrow band pass filter filters out parasitic light in the light beam that described detector sends.
Wherein, described vaporization produces the upper area that the zone is specially described testing sample surface, and this upper area should be tried one's best near described testing sample.
The embodiment of the invention heats described testing sample by strong laser irradiation.
Described imaging device specifically comprises: imaging len, diaphragm and camera;
Described narrow band pass filter filters out the light beam that described vaporization behind the parasitic light in the light beam that described detector produces produces the zone and processes through imaging len, obtains imaging beam, and this imaging beam is imaging on described camera after diaphragm is adjusted size again.
Gather the image after the imaging, and the image after the imaging is processed through image processing apparatus, obtain the moment that described testing sample flies out, this is the time of described testing sample vaporization constantly.
The camera that the embodiment of the invention adopts is high speed camera, carries out taking pictures of two-forty by this camera, obtains photo in heat time heating time.
A kind of system for measuring vaporization time that provides by the embodiment of the invention, can measure accurately the vaporization time of testing sample, avoided the temperature delay of thermometry, the inaccurate problem of the vaporization time that causes, and in the embodiment of the invention as long as use the camera of low resolution just can measure accurately the vapourizing temperature of testing sample, saved to a certain extent testing cost.
In sum, the embodiment of the invention provides a kind of system for measuring vaporization time, measure the variation in flow field, testing sample top by the mode of optics, and carry out imaging at imaging device, carry out post-processed by image processing apparatus again, can obtain the accurate vaporization time of testing sample.
The above; only for the better embodiment of the present invention, but protection scope of the present invention is not limited to this, anyly is familiar with those skilled in the art in the technical scope that the present invention discloses; the variation that can expect easily or replacement all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claims.
Claims (4)
1. a system that is used for measuring vaporization time is characterized in that, comprises the detector, parallel beam expand device, imaging device and the image processing apparatus that set gradually, is provided with laser heating device and testing sample between described parallel beam expand device and the described imaging device;
Described detector is used for continuing to send laser beam to described parallel beam expand device;
Described parallel beam expand device, the laser beam that is used for described detector is sent expands processing;
Described laser heating device is used for sending light laser, by this light laser described testing sample is heated;
Described imaging device be used for real time imagery is carried out in the vaporization generation zone of described testing sample, and the vaporization of testing sample described in the record heating process produces the image in zone;
Described image processing apparatus is for the time of determining the vaporization of described testing sample according to the image of described imaging device record.
2. system according to claim 1 is characterized in that, between described testing sample and described imaging device narrow band pass filter is set;
Described narrow band pass filter is used for the parasitic light of the laser beam that the described detector of filtering sends, and the laser beam behind the filtering veiling glare carries out imaging at described imaging device.
3. system according to claim 1 and 2 is characterized in that, described imaging device comprises: imaging len, diaphragm and camera;
Described imaging len is used for that described vaporization is produced the zone and carries out imaging processing;
Described diaphragm for the size of adjusting imaging beam, makes described vaporization produce zone imaging on described camera;
Described camera is used for recording the picture that described vaporization produces the zone.
4. system according to claim 1 and 2 is characterized in that,
Described image processing apparatus specifically is used for, the image behind the described camera imaging processed, and when having the vaporization product to fly out in the image, then should constantly be the time that vaporization occurs described testing sample.
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| CN2013100116376A CN103076332A (en) | 2013-01-11 | 2013-01-11 | System for measuring vaporization time |
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| CN2013100116376A CN103076332A (en) | 2013-01-11 | 2013-01-11 | System for measuring vaporization time |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111308849A (en) * | 2019-11-18 | 2020-06-19 | 长春理工大学 | Ultra-high-speed time resolution camera shooting device and method based on schlieren technology |
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| CN2482691Y (en) * | 2001-06-29 | 2002-03-20 | 中国科学院金属研究所 | Measuring apparatus for interface dynamic information during the process of metal fast freezing |
| CN1487577A (en) * | 2002-08-29 | 2004-04-07 | ��ʽ����Һ���ȶ˼����������� | Crystallized state in site monitoring method |
| CN1711473A (en) * | 2002-10-30 | 2005-12-21 | I.S.L.公司 | Method for determining vanishing temperature of petroleum product crystals and device therefor |
| CN102507499A (en) * | 2011-11-17 | 2012-06-20 | 合肥工业大学 | Device for measuring atmospheric aerosol absorption coefficient by using photothermal interference |
| CN102607731A (en) * | 2012-04-15 | 2012-07-25 | 大连博控科技股份有限公司 | Thermocouple temperature sensor with fast response speed |
| CN102841052A (en) * | 2011-06-24 | 2012-12-26 | 日本板硝子株式会社 | Apparatus and method for measuring degree of cure of adhesive agent |
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2013
- 2013-01-11 CN CN2013100116376A patent/CN103076332A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5088833A (en) * | 1988-02-10 | 1992-02-18 | Nova Husky Research Corporation | Method and apparatus for monitoring cloud point or like transition temperature |
| JPH07159330A (en) * | 1993-12-10 | 1995-06-23 | Tani Denki Kogyo Kk | Imaging device and inspection apparatus using it |
| CN2482691Y (en) * | 2001-06-29 | 2002-03-20 | 中国科学院金属研究所 | Measuring apparatus for interface dynamic information during the process of metal fast freezing |
| CN1487577A (en) * | 2002-08-29 | 2004-04-07 | ��ʽ����Һ���ȶ˼����������� | Crystallized state in site monitoring method |
| CN1711473A (en) * | 2002-10-30 | 2005-12-21 | I.S.L.公司 | Method for determining vanishing temperature of petroleum product crystals and device therefor |
| CN102841052A (en) * | 2011-06-24 | 2012-12-26 | 日本板硝子株式会社 | Apparatus and method for measuring degree of cure of adhesive agent |
| CN102507499A (en) * | 2011-11-17 | 2012-06-20 | 合肥工业大学 | Device for measuring atmospheric aerosol absorption coefficient by using photothermal interference |
| CN102607731A (en) * | 2012-04-15 | 2012-07-25 | 大连博控科技股份有限公司 | Thermocouple temperature sensor with fast response speed |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111308849A (en) * | 2019-11-18 | 2020-06-19 | 长春理工大学 | Ultra-high-speed time resolution camera shooting device and method based on schlieren technology |
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Application publication date: 20130501 |