CN103063988B - Power bearing capacity testing method for surface mounting passive microwave circuit - Google Patents
Power bearing capacity testing method for surface mounting passive microwave circuit Download PDFInfo
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- CN103063988B CN103063988B CN201210583576.6A CN201210583576A CN103063988B CN 103063988 B CN103063988 B CN 103063988B CN 201210583576 A CN201210583576 A CN 201210583576A CN 103063988 B CN103063988 B CN 103063988B
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Abstract
The invention discloses a power bearing capacity testing method for a surface mounting passive microwave circuit. The testing method includes the steps of calculating peak current in a simulation mode when power of a to-be-tested microwave circuit set breaks through, choosing a short circuit transformer, connecting the short circuit transformer with the to-be-tested microwave circuit set to form a loop, obtaining short circuit current distribution of the to-be-tested microwave circuit set to find out a microwave circuit U corresponded by the position of the largest short circuit current, accessing the microwave circuit U to the loop to obtain the short circuit current distribution, and measuring out nominal voltage of the microwave circuit corresponded by the position of the short circuit current and a power bearing capacity value on the condition of short circuit peak current. The testing method divides a short circuit test under total power into a low-voltage large current test and a short circuit test of a single to-be-tested device under high voltage, so that test of the microwave circuit power bearing capacity can be finished on a low-power test platform through a simulation method and an analogue method, and the testing method is suitable for the batch test and is beneficial for improving production efficiency of the surface mounting passive microwave circuit.
Description
Technical field
The present invention relates to a kind of power bearing ability method of testing of surface mount passive microwave circuit.
Background technology
Along with the development of microwave technology, the design of microstrip circuit and system progressively becomes the design and devdlop of transmission line, monolithic integrated microwave circuit and microwave passive circuit, and surface mount is an importance of microwave current device development.Miniaturized surface attachment microwave device series of products mainly comprise power splitter, coupling mechanism, 90 degree of electric bridges etc., meet the demand of the electronic equipments such as radio communication, navigation, radar, have wide market outlook.
Surface mount passive microwave circuit, between dispatching from the factory or coming into operation, must test and make inscription indicating to its power bearing ability.Because, in the use procedure of microwave circuit, once power exceedes its power bearing ability, will breakdown device, mixed bad device, even affects the normal use of whole microwave telecommunication system.
But, traditional microwave circuit power bearing ability method of testing obviously can not meet the requirement of every device under test, therefore cannot test the power bearing ability of microwave circuit in bulk, traditional microwave circuit power bearing ability method of testing limits the batch production efficiency of surface mount passive microwave circuit.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, a kind of power bearing ability method of testing of surface mount passive microwave circuit is provided, short-circuit test under total power is resolved into the short-circuit test of single device under test under low-voltage, high-current test and high pressure, the test of microwave circuit power bearing ability can be made to be completed on miniwatt experiment porch by the method emulating and simulate, and be applicable to batch testing, contribute to the production efficiency improving surface mount passive microwave circuit.
The object of the invention is to be achieved through the following technical solutions: the power bearing ability method of testing of surface mount passive microwave circuit, it comprises the following steps:
S1: multiple microwave circuit cascade to be measured is serially connected, forms microwave circuit group to be measured;
S2: the peak point current of simulation calculation microwave circuit group to be measured when power disruption;
S3: according to the short circuit transformer that the peak point current Selection parameter calculated is suitable;
S4: be electrically connected with microwave circuit group to be measured by short circuit transformer, forms loop with microwave circuit group to be measured described in short circuit;
S5: the short-circuit current distribution being obtained microwave circuit group to be measured by short circuit transformer, and find out the microwave circuit U corresponding to short-circuit current maximum;
S6: remove other microwave circuit in microwave circuit group to be measured, only microwave circuit U is accessed loop, obtained the short-circuit current distribution of microwave circuit U by short circuit transformer, measure the power bearing ability value under the rated voltage of the microwave circuit now corresponding to short-circuit current maximum and short circuit peak condition.
The step obtaining the short-circuit current distribution of microwave circuit group to be measured by short circuit transformer described in step S5 is: the output being detected fault current under low-voltage condition by the leakage reactance reducing short circuit transformer.
The invention has the beneficial effects as follows:
(1) short-circuit test under total power is resolved into the short-circuit test of single device under test under low-voltage, high-current test and high pressure, the test of microwave circuit power bearing ability can be made to be completed on miniwatt experiment porch by the method emulating and simulate;
(2) be applicable to batch testing, contribute to the production efficiency improving surface mount passive microwave circuit;
(3) test process is easy to operate and test result accuracy is higher.
Accompanying drawing explanation
Fig. 1 is method of testing process flow diagram of the present invention.
Embodiment
Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail, but protection scope of the present invention is not limited to the following stated.
As shown in Figure 1, the power bearing ability method of testing of surface mount passive microwave circuit, it comprises the following steps:
S1: multiple microwave circuit cascade to be measured is serially connected, forms microwave circuit group to be measured;
S2: the peak point current of simulation calculation microwave circuit group to be measured when power disruption;
S3: according to the short circuit transformer that the peak point current Selection parameter calculated is suitable;
S4: be electrically connected with microwave circuit group to be measured by short circuit transformer, forms loop with microwave circuit group to be measured described in short circuit;
S5: the short-circuit current distribution being obtained microwave circuit group to be measured by short circuit transformer, and find out the microwave circuit U corresponding to short-circuit current maximum;
Herein, the leakage reactance by reducing short circuit transformer realizes the output detections of fault current under low-voltage condition;
S6: remove other microwave circuit in microwave circuit group to be measured, only microwave circuit U is accessed loop, obtained the short-circuit current distribution of microwave circuit U by short circuit transformer, measure the power bearing ability value under the rated voltage of the microwave circuit now corresponding to short-circuit current maximum and short circuit peak condition.
Claims (1)
1. the power bearing ability method of testing of surface mount passive microwave circuit, is characterized in that: it comprises the following steps:
S1: multiple microwave circuit cascade to be measured is serially connected, forms microwave circuit group to be measured;
S2: the peak point current of simulation calculation microwave circuit group to be measured when power disruption;
S3: according to the short circuit transformer that the peak point current Selection parameter calculated is suitable;
S4: be electrically connected with microwave circuit group to be measured by short circuit transformer, forms loop with microwave circuit group to be measured described in short circuit;
S5: the short-circuit current distribution being obtained microwave circuit group to be measured by short circuit transformer, by the output of fault current under the leakage reactance detection low-voltage condition of reduction short circuit transformer, described short-circuit current distribution can be obtained, and find out the microwave circuit U corresponding to short-circuit current maximum;
S6: remove other microwave circuit in microwave circuit group to be measured, only microwave circuit U is accessed loop, obtained the short-circuit current distribution of microwave circuit U by short circuit transformer, measure the power bearing ability value under the rated voltage of the microwave circuit now corresponding to short-circuit current maximum and short circuit peak condition.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210583576.6A CN103063988B (en) | 2012-12-28 | 2012-12-28 | Power bearing capacity testing method for surface mounting passive microwave circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210583576.6A CN103063988B (en) | 2012-12-28 | 2012-12-28 | Power bearing capacity testing method for surface mounting passive microwave circuit |
Publications (2)
| Publication Number | Publication Date |
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| CN103063988A CN103063988A (en) | 2013-04-24 |
| CN103063988B true CN103063988B (en) | 2014-12-31 |
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| CN201210583576.6A Active CN103063988B (en) | 2012-12-28 | 2012-12-28 | Power bearing capacity testing method for surface mounting passive microwave circuit |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| EP3254124A1 (en) * | 2015-02-06 | 2017-12-13 | Omicron electronics GmbH | Device and method for determining a parameter of a transformer |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1206260A (en) * | 1997-07-23 | 1999-01-27 | Lg情报通信株式会社 | Self-checking circuit in microwave equipment |
| JP2001091568A (en) * | 1999-09-17 | 2001-04-06 | Advantest Corp | Apparatus and method for testing semiconductor integrated circuit |
| JP3299152B2 (en) * | 1997-11-11 | 2002-07-08 | 日本電気株式会社 | Method and apparatus for forming high power dummy load for microwave test |
| CN101216528A (en) * | 2008-01-15 | 2008-07-09 | 中国科学院上海微系统与信息技术研究所 | On-chip test method for microwave power amplifier chip and its test system |
| CN202256521U (en) * | 2011-09-05 | 2012-05-30 | 瞿纯昊 | S parameter measurement device |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
-
2012
- 2012-12-28 CN CN201210583576.6A patent/CN103063988B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1206260A (en) * | 1997-07-23 | 1999-01-27 | Lg情报通信株式会社 | Self-checking circuit in microwave equipment |
| JP3299152B2 (en) * | 1997-11-11 | 2002-07-08 | 日本電気株式会社 | Method and apparatus for forming high power dummy load for microwave test |
| JP2001091568A (en) * | 1999-09-17 | 2001-04-06 | Advantest Corp | Apparatus and method for testing semiconductor integrated circuit |
| CN101216528A (en) * | 2008-01-15 | 2008-07-09 | 中国科学院上海微系统与信息技术研究所 | On-chip test method for microwave power amplifier chip and its test system |
| CN202256521U (en) * | 2011-09-05 | 2012-05-30 | 瞿纯昊 | S parameter measurement device |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
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