CN103063988A - Power bearing capacity testing method for surface mounting passive microwave circuit - Google Patents

Power bearing capacity testing method for surface mounting passive microwave circuit Download PDF

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Publication number
CN103063988A
CN103063988A CN2012105835766A CN201210583576A CN103063988A CN 103063988 A CN103063988 A CN 103063988A CN 2012105835766 A CN2012105835766 A CN 2012105835766A CN 201210583576 A CN201210583576 A CN 201210583576A CN 103063988 A CN103063988 A CN 103063988A
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China
Prior art keywords
circuit
microwave circuit
short
microwave
short circuit
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CN2012105835766A
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CN103063988B (en
Inventor
张波
吴永清
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CHENGDU TIGER MICROELECTRONICS INSTITUTE Co Ltd
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CHENGDU TIGER MICROELECTRONICS INSTITUTE Co Ltd
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Abstract

The invention discloses a power bearing capacity testing method for a surface mounting passive microwave circuit. The testing method includes the steps of calculating peak current in a simulation mode when power of a to-be-tested microwave circuit set breaks through, choosing a short circuit transformer, connecting the short circuit transformer with the to-be-tested microwave circuit set to form a loop, obtaining short circuit current distribution of the to-be-tested microwave circuit set to find out a microwave circuit U corresponded by the position of the largest short circuit current, accessing the microwave circuit U to the loop to obtain the short circuit current distribution, and measuring out nominal voltage of the microwave circuit corresponded by the position of the short circuit current and a power bearing capacity value on the condition of short circuit peak current. The testing method divides a short circuit test under total power into a low-voltage large current test and a short circuit test of a single to-be-tested device under high voltage, so that test of the microwave circuit power bearing capacity can be finished on a low-power test platform through a simulation method and an analogue method, and the testing method is suitable for the batch test and is beneficial for improving production efficiency of the surface mounting passive microwave circuit.

Description

The power bearing ability method of testing of surface mount passive microwave circuit
Technical field
The present invention relates to a kind of power bearing ability method of testing of surface mount passive microwave circuit.
Background technology
Along with the development of microwave technology, the design of microstrip circuit and system progressively becomes design and the application of transmission line, monolithic integrated microwave circuit and microwave passive circuit, and surface mount is an importance of microwave current device development.Miniaturization surface mount microwave device series of products mainly comprise power splitter, coupling mechanism, 90 degree electric bridges etc., satisfy the demand of the electronic equipments such as radio communication, navigation, radar, have wide market outlook.
Surface mount passive microwave circuit must be tested and make inscription to its power bearing ability and indicate between being dispatched from the factory or coming into operation.Because, in the use procedure of microwave circuit, in case power surpasses its power bearing ability, will breakdown device, mixed bad device, even affect the normal use of whole microwave telecommunication system.
Yet, traditional microwave circuit power bearing ability method of testing obviously can not satisfy the requirement of every device under test, therefore can't test in bulk the power bearing ability of microwave circuit, traditional microwave circuit power bearing ability method of testing has limited the batch production efficient of surface mount passive microwave circuit.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, a kind of power bearing ability method of testing of surface mount passive microwave circuit is provided, short-circuit test under the total power is resolved into the short-circuit test of single device under test under low-voltage, high-current test and the high pressure, the test of microwave circuit power bearing ability is finished at the miniwatt experiment porch by the method for emulation and simulation, and applicable to batch testing, help to improve the production efficiency of surface mount passive microwave circuit.
The objective of the invention is to be achieved through the following technical solutions: the power bearing ability method of testing of surface mount passive microwave circuit, it may further comprise the steps:
S1: a plurality of microwave circuit cascades to be measured are serially connected, consist of microwave circuit group to be measured;
S2: the peak point current of simulation calculation microwave circuit group to be measured when power disruption;
S3: select the suitable short circuit transformer of parameter according to the peak point current that calculates;
S4: the short circuit transformer is electrically connected with microwave circuit group to be measured, consists of the loop with the described microwave circuit group to be measured of short circuit;
S5: the short-circuit current that obtains microwave circuit group to be measured by the short circuit transformer distributes, and finds out the corresponding microwave circuit U of short-circuit current maximum;
S6: remove other microwave circuit in the microwave circuit group to be measured, only with microwave circuit U access loop, the short-circuit current that obtains microwave circuit U by the short circuit transformer distributes, and measures the rated voltage of the corresponding microwave circuit of short-circuit current maximum this moment and the power bearing ability value under the short circuit peak condition.
The step that short-circuit current that the short circuit transformer obtains microwave circuit group to be measured distributes of passing through described in the step S5 is: detect the output of fault current under the low-voltage condition by the leakage reactance that reduces the short circuit transformer.
The invention has the beneficial effects as follows:
(1) short-circuit test under the total power is resolved into the short-circuit test of single device under test under low-voltage, high-current test and the high pressure, the test of microwave circuit power bearing ability is finished at the miniwatt experiment porch by the method for emulation and simulation;
(2) applicable to batch testing, help to improve the production efficiency of surface mount passive microwave circuit;
(3) test process is easy to operate and the test result accuracy is higher.
Description of drawings
Fig. 1 is method of testing process flow diagram of the present invention.
Embodiment
Below in conjunction with accompanying drawing technical scheme of the present invention is described in further detail, but protection scope of the present invention is not limited to the following stated.
As shown in Figure 1, the power bearing ability method of testing of surface mount passive microwave circuit, it may further comprise the steps:
S1: a plurality of microwave circuit cascades to be measured are serially connected, consist of microwave circuit group to be measured;
S2: the peak point current of simulation calculation microwave circuit group to be measured when power disruption;
S3: select the suitable short circuit transformer of parameter according to the peak point current that calculates;
S4: the short circuit transformer is electrically connected with microwave circuit group to be measured, consists of the loop with the described microwave circuit group to be measured of short circuit;
S5: the short-circuit current that obtains microwave circuit group to be measured by the short circuit transformer distributes, and finds out the corresponding microwave circuit U of short-circuit current maximum;
Realize the output detections of fault current under the low-voltage condition herein, by the leakage reactance that reduces the short circuit transformer;
S6: remove other microwave circuit in the microwave circuit group to be measured, only with microwave circuit U access loop, the short-circuit current that obtains microwave circuit U by the short circuit transformer distributes, and measures the rated voltage of the corresponding microwave circuit of short-circuit current maximum this moment and the power bearing ability value under the short circuit peak condition.

Claims (2)

1. the power bearing ability method of testing of surface mount passive microwave circuit, it is characterized in that: it may further comprise the steps:
S1: a plurality of microwave circuit cascades to be measured are serially connected, consist of microwave circuit group to be measured;
S2: the peak point current of simulation calculation microwave circuit group to be measured when power disruption;
S3: select the suitable short circuit transformer of parameter according to the peak point current that calculates;
S4: the short circuit transformer is electrically connected with microwave circuit group to be measured, consists of the loop with the described microwave circuit group to be measured of short circuit;
S5: the short-circuit current that obtains microwave circuit group to be measured by the short circuit transformer distributes, and finds out the corresponding microwave circuit U of short-circuit current maximum;
S6: remove other microwave circuit in the microwave circuit group to be measured, only with microwave circuit U access loop, the short-circuit current that obtains microwave circuit U by the short circuit transformer distributes, and measures the rated voltage of the corresponding microwave circuit of short-circuit current maximum this moment and the power bearing ability value under the short circuit peak condition.
2. the power bearing ability method of testing of surface mount passive microwave circuit according to claim 1 is characterized in that: the step that short-circuit current that the short circuit transformer obtains microwave circuit group to be measured distributes of passing through described in the step S5 is: detect the output of fault current under the low-voltage condition by the leakage reactance that reduces the short circuit transformer.
CN201210583576.6A 2012-12-28 2012-12-28 Power bearing capacity testing method for surface mounting passive microwave circuit Active CN103063988B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201210583576.6A CN103063988B (en) 2012-12-28 2012-12-28 Power bearing capacity testing method for surface mounting passive microwave circuit

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Application Number Priority Date Filing Date Title
CN201210583576.6A CN103063988B (en) 2012-12-28 2012-12-28 Power bearing capacity testing method for surface mounting passive microwave circuit

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CN103063988A true CN103063988A (en) 2013-04-24
CN103063988B CN103063988B (en) 2014-12-31

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107407706A (en) * 2015-02-06 2017-11-28 欧米克朗电子有限公司 Transformer parameter determines apparatus and method

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1206260A (en) * 1997-07-23 1999-01-27 Lg情报通信株式会社 Self-checking circuit in microwave equipment
JP2001091568A (en) * 1999-09-17 2001-04-06 Advantest Corp Apparatus and method for testing semiconductor integrated circuit
JP3299152B2 (en) * 1997-11-11 2002-07-08 日本電気株式会社 Method and apparatus for forming high power dummy load for microwave test
CN101216528A (en) * 2008-01-15 2008-07-09 中国科学院上海微系统与信息技术研究所 On-chip test method for microwave power amplifier chip and its test system
CN202256521U (en) * 2011-09-05 2012-05-30 瞿纯昊 S parameter measurement device
CN102621470A (en) * 2012-03-31 2012-08-01 中国电子科技集团公司第十三研究所 Method for testing performance of semiconductor microwave power chip packaging shell

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1206260A (en) * 1997-07-23 1999-01-27 Lg情报通信株式会社 Self-checking circuit in microwave equipment
JP3299152B2 (en) * 1997-11-11 2002-07-08 日本電気株式会社 Method and apparatus for forming high power dummy load for microwave test
JP2001091568A (en) * 1999-09-17 2001-04-06 Advantest Corp Apparatus and method for testing semiconductor integrated circuit
CN101216528A (en) * 2008-01-15 2008-07-09 中国科学院上海微系统与信息技术研究所 On-chip test method for microwave power amplifier chip and its test system
CN202256521U (en) * 2011-09-05 2012-05-30 瞿纯昊 S parameter measurement device
CN102621470A (en) * 2012-03-31 2012-08-01 中国电子科技集团公司第十三研究所 Method for testing performance of semiconductor microwave power chip packaging shell

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107407706A (en) * 2015-02-06 2017-11-28 欧米克朗电子有限公司 Transformer parameter determines apparatus and method
CN107407706B (en) * 2015-02-06 2019-11-08 欧米克朗电子有限公司 Transformer parameter measurement device and method
US10794964B2 (en) 2015-02-06 2020-10-06 Omicron Electronics Gmbh Device and method for determining a parameter of a transformer

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