CN103048550A - Test system and test data calibration method of S-parameter of surface mount microwave device - Google Patents
Test system and test data calibration method of S-parameter of surface mount microwave device Download PDFInfo
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- CN103048550A CN103048550A CN2012105839589A CN201210583958A CN103048550A CN 103048550 A CN103048550 A CN 103048550A CN 2012105839589 A CN2012105839589 A CN 2012105839589A CN 201210583958 A CN201210583958 A CN 201210583958A CN 103048550 A CN103048550 A CN 103048550A
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Abstract
The invention discloses a test system and a test data calibration method of an S-parameter of a surface mount microwave device. The output of a tested device is connected with a directional coupler, and the directional coupler is connected with a signal generator; and two paths of output of the directional coupler are respectively and sequentially connected with a central controller through a power detector and an analog-to-digital converter. The test system also comprises a voltage detection circuit, a current detection circuit and a temperature detection circuit, wherein the output of the voltage detection circuit, the current detection circuit and the temperature detection circuit is connected with the central controller through the analog-to-digital converter. The calibration method comprises the following steps of: confirming a calibration status; using a mechanical calibration kit for calibration; using an electronic calibration kit for calibration. The S-parameter of a filter device can be tested in a high-power or large-dynamic-range working status, and the test power and frequency range is wide; the temperature, voltage and current of the tested device can be detected, so that the user safety and stability are improved; and the accuracy of test results of the S-parameter can be further improved by a double calibration method.
Description
Technical field
The present invention relates to a kind of microwave device test macro, particularly relate to a kind of surface mount microwave device S parameter test system and test data calibration steps.
Background technology
Along with the development of microwave technology, the design of microstrip circuit and system progressively becomes design and the application of transmission line, monolithic integrated microwave circuit and microwave passive circuit, and surface mount is an importance of microwave current device development.Miniaturization surface mount microwave device series of products mainly comprise power splitter, coupling mechanism, 90 degree electric bridges etc., satisfy miniaturization, surface mount and the electrical property demand of the electronic equipments such as radio communication, navigation, radar, have wide market outlook.
The S parameter is the scattering parameter of microwave device, is defined in transmission and the reflection characteristic of any imperfect multiport network under the condition of given frequency and system impedance.For any radio frequency and microwave device, when operating power was excessive, its some physical characteristics all can change, and such as the variation of temperature, the variation of amplifier working point etc., the variation of these physical characteristicss all will directly cause the variation of microwave device S parameter.
Many Adoption Networks of test analyser of traditional microwave device S parameter is realized, but network analyzer can only be finished the test of tested microwave device in the small-signal situation, can't test exactly the parameters of microwave device under real work state or high power work state, therefore, the also duty of emulation measured device under true environment effectively.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, provide a kind of can the filtering device S parameter of test job under the high power work state, and can detect simultaneously surface mount microwave device S parameter test system and the test data calibration steps of microwave device operating voltage, electric current and temperature, before test, test macro is carried out accurate data calibration, help further to improve microwave device S parameter testing result's accuracy.
The objective of the invention is to be achieved through the following technical solutions: surface mount microwave device S parameter test system, it is comprised of four S parameter detecting circuits, each S parameter detecting circuit is made of power detector and analog to digital converter, the output that measured surface mounts microwave device respectively with directional coupler a, directional coupler b links to each other, the input of directional coupler a and directional coupler b also is connected with signal generator respectively, the two-way output of directional coupler a is connected with the input of central controller with analog to digital converter by power detector respectively successively, and the two-way output of directional coupler b also is connected with the input of central controller with analog to digital converter by power detector respectively successively;
It also comprises voltage detecting circuit, current detection circuit and temperature sensing circuit, voltage detecting circuit, current detection circuit and temperature sensing circuit are connected input and are all connected measured surface and mount microwave device, and voltage detecting circuit, current detection circuit and temperature sensing circuit are connected output and all are connected with central controller by analog to digital converter.
Further, surface mount microwave device S parameter test system also comprises a host computer that is used for the S parameter that records is carried out analysis and calculation, and host computer links to each other with central controller by bus.
Surface mount microwave device S parameter test system data calibration method, it comprises the step of frequency mixer test scalar calibration, described frequency mixer test scalar calibration steps comprises following substep:
S11: confirm align mode: check the process that each channel error is proofreaied and correct, the trace applicable for the scalar frequency mixer then adds state;
S12: use mechanically calibrated external member to calibrate, it may further comprise the steps:
S121: start frequency deviation;
S122: the passage that selection will be calibrated;
S123: the port that selection will be calibrated;
S124: select test port, manually carry out the calibration of frequency mixer scalar;
S13: use Electronic Calibration external member ECal to calibrate, it may further comprise the steps:
S131: start frequency deviation;
S132: the passage that selection will be calibrated;
S133: the port that selection will be calibrated;
S134: select test port, start the calibration of scalar frequency mixer;
S135: open power meter and sensor;
S136: selected test port is connected to Electronic Calibration external member ECal, and Electronic Calibration external member ECal is connected to the USB interface of proving installation by the USB wiring;
S137: calculate calibration factor, automatically open error correcting function.
The invention has the beneficial effects as follows:
1) can the filtering device S parameter of test job under high-power or great dynamic range duty, and measured power can reach the milliwatt level to multikilowatt, but and the scope of test frequency wider;
2) the S parameter test system can detect the temperature of microwave device, so that can be measured the variation of measured device temperature under high-power continuous action and burn analysis;
3) can detect microwave device operating voltage and electric current, so that the S parameter test system can detect electric current, the change in voltage of measured device under high-power continuous action, improve the safety and stability that microwave device uses;
4) provide a kind of and before test, test macro has been carried out accurate data calibration based on the mechanically calibrated and test data calibration steps dual calibration of Electronic Calibration, helped further to improve microwave device S parameter testing result's accuracy.
Description of drawings
Fig. 1 is the structural representation block diagram of S parameter test system of the present invention;
Fig. 2 is for using mechanically calibrated external member to carry out the operational flowchart of calibration steps;
Fig. 3 is for using Electronic Calibration external member ECal to carry out the operational flowchart of calibration steps.
Embodiment
Below in conjunction with accompanying drawing technical scheme of the present invention is described in further detail, but protection scope of the present invention is not limited to the following stated.
As shown in Figure 1, surface mount microwave device S parameter test system, it is comprised of four S parameter detecting circuits, each S parameter detecting circuit is made of power detector and analog to digital converter, the output that measured surface mounts microwave device respectively with directional coupler a, directional coupler b links to each other, the input of directional coupler a and directional coupler b also is connected with signal generator respectively, the two-way output of directional coupler a is connected with the input of central controller with analog to digital converter by power detector respectively successively, and the two-way output of directional coupler b also is connected with the input of central controller with analog to digital converter by power detector respectively successively.
It also comprises voltage detecting circuit, current detection circuit and temperature sensing circuit, voltage detecting circuit, current detection circuit and temperature sensing circuit are connected input and are all connected measured surface and mount microwave device, and voltage detecting circuit, current detection circuit and temperature sensing circuit are connected output and all are connected with central controller by analog to digital converter.
Further, surface mount microwave device S parameter test system also comprises a host computer that is used for the S parameter that records is carried out analysis and calculation, and host computer links to each other with central controller by bus.
Surface mount microwave device S parameter test system data calibration method, it comprises the step of frequency mixer test scalar calibration, described frequency mixer test scalar calibration steps comprises following substep:
S11: confirm align mode: check the process that each channel error is proofreaied and correct, the trace applicable for the scalar frequency mixer then adds state;
S12: as shown in Figure 2, use mechanically calibrated external member to calibrate, it may further comprise the steps:
S121: start frequency deviation;
S122: the passage that selection will be calibrated;
S123: the port that selection will be calibrated;
S124: select test port, manually carry out the calibration of frequency mixer scalar;
S13: as shown in Figure 3, use Electronic Calibration external member ECal to calibrate, it may further comprise the steps:
S131: start frequency deviation;
S132: the passage that selection will be calibrated;
S133: the port that selection will be calibrated;
S134: select test port, start the calibration of scalar frequency mixer;
S135: open power meter and sensor;
S136: selected test port is connected to Electronic Calibration external member ECal, and Electronic Calibration external member ECal is connected to the USB interface of proving installation by the USB wiring;
S137: calculate calibration factor, automatically open error correcting function.
Claims (3)
1. surface mount microwave device S parameter test system, it is characterized in that: it is comprised of four S parameter detecting circuits, each S parameter detecting circuit is made of power detector and analog to digital converter, the output that measured surface mounts microwave device respectively with directional coupler a, directional coupler b links to each other, the input of directional coupler a and directional coupler b also is connected with signal generator respectively, the two-way output of directional coupler a is connected with the input of central controller with analog to digital converter by power detector respectively successively, and the two-way output of directional coupler b also is connected with the input of central controller with analog to digital converter by power detector respectively successively;
It also comprises voltage detecting circuit, current detection circuit and temperature sensing circuit, voltage detecting circuit, current detection circuit and temperature sensing circuit are connected input and are all connected measured surface and mount microwave device, and voltage detecting circuit, current detection circuit and temperature sensing circuit are connected output and all are connected with central controller by analog to digital converter.
2. surface mount microwave device S parameter test system according to claim 1 is characterized in that: it also comprises a host computer that is used for the S parameter that records is carried out analysis and calculation, and host computer links to each other with central controller by bus.
3. surface mount microwave device S parameter test system data calibration method is characterized in that: it comprises the step of frequency mixer test scalar calibration, and described frequency mixer test scalar calibration steps comprises following substep:
S11: confirm align mode: check the process that each channel error is proofreaied and correct, the trace applicable for the scalar frequency mixer then adds state;
S12: use mechanically calibrated external member to calibrate, it may further comprise the steps:
S121: start frequency deviation;
S122: the passage that selection will be calibrated;
S123: the port that selection will be calibrated;
S124: select test port, manually carry out the calibration of frequency mixer scalar;
S13: use Electronic Calibration external member ECal to calibrate, it may further comprise the steps:
S131: start frequency deviation;
S132: the passage that selection will be calibrated;
S133: the port that selection will be calibrated;
S134: select test port, start the calibration of scalar frequency mixer;
S135: open power meter and sensor;
S136: selected test port is connected to Electronic Calibration external member ECal, and Electronic Calibration external member ECal is connected to the USB interface of proving installation by the USB wiring;
S137: calculate calibration factor, automatically open error correcting function.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103293505A (en) * | 2013-06-06 | 2013-09-11 | 中国电子科技集团公司第四十一研究所 | Electronic calibration component and temperature compensation method for broadening operating temperature range thereof |
| CN103809100A (en) * | 2014-03-07 | 2014-05-21 | 上海华虹宏力半导体制造有限公司 | Automatic test system for wafer |
| CN104374424A (en) * | 2014-11-07 | 2015-02-25 | 江苏博普电子科技有限责任公司 | Test system for remotely monitoring long-term reliability of microwave power device |
| CN104849687A (en) * | 2015-04-23 | 2015-08-19 | 中国电子科技集团公司第四十一研究所 | Microwave automatic test system calibration method based on scattering parameter cascading |
| CN109507499A (en) * | 2018-11-07 | 2019-03-22 | 中电科仪器仪表有限公司 | S parameter detection device and method |
| CN112834976A (en) * | 2020-12-30 | 2021-05-25 | 国网河北能源技术服务有限公司 | Ultrahigh frequency sensor arrangement verification method based on transmission loss and terminal equipment |
| CN116840759A (en) * | 2023-07-04 | 2023-10-03 | 成都泰格微电子研究所有限责任公司 | Rapid calibration system and method suitable for hybrid integrated circuit test system |
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| CN202018486U (en) * | 2011-03-07 | 2011-10-26 | 中国电子科技集团公司第十三研究所 | Testing device for microwave surface-mounting component |
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| US20080136423A1 (en) * | 2006-12-06 | 2008-06-12 | Thomas Ludwig | Measurement Arrangement for Determining the Characteristic line Parameters by Measuring Scattering Parameters |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103293505A (en) * | 2013-06-06 | 2013-09-11 | 中国电子科技集团公司第四十一研究所 | Electronic calibration component and temperature compensation method for broadening operating temperature range thereof |
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| CN103809100A (en) * | 2014-03-07 | 2014-05-21 | 上海华虹宏力半导体制造有限公司 | Automatic test system for wafer |
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| CN104849687A (en) * | 2015-04-23 | 2015-08-19 | 中国电子科技集团公司第四十一研究所 | Microwave automatic test system calibration method based on scattering parameter cascading |
| CN104849687B (en) * | 2015-04-23 | 2017-11-21 | 中国电子科技集团公司第四十一研究所 | A kind of microwave Calibration Method for ATS based on scattering parameter cascade |
| CN109507499A (en) * | 2018-11-07 | 2019-03-22 | 中电科仪器仪表有限公司 | S parameter detection device and method |
| CN109507499B (en) * | 2018-11-07 | 2021-10-26 | 中电科思仪科技股份有限公司 | S parameter detection device and method |
| CN112834976A (en) * | 2020-12-30 | 2021-05-25 | 国网河北能源技术服务有限公司 | Ultrahigh frequency sensor arrangement verification method based on transmission loss and terminal equipment |
| CN116840759A (en) * | 2023-07-04 | 2023-10-03 | 成都泰格微电子研究所有限责任公司 | Rapid calibration system and method suitable for hybrid integrated circuit test system |
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