CN103021461B - A kind of initialized method of passive electronic label memorizer and device - Google Patents
A kind of initialized method of passive electronic label memorizer and device Download PDFInfo
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- CN103021461B CN103021461B CN201210481383.XA CN201210481383A CN103021461B CN 103021461 B CN103021461 B CN 103021461B CN 201210481383 A CN201210481383 A CN 201210481383A CN 103021461 B CN103021461 B CN 103021461B
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Abstract
The present invention relates to a kind of initialized method of passive electronic label memorizer, comprise the steps: to arrange the initial value of write time; Frequency is set and regulates parameter, regulate the frequency of oscillation value of described passive electronic label internal oscillator; Obtain the frequency of oscillation value of described internal oscillator, and obtain the particular value of described passive electronic label write time; The particular value of said write time is stored in the parameter region of described memorizer, covers the initial value of said write time, and use the particular value of this write time as to this passive electronic label initialized write time; Initialize the memorizer of described passive electronic label, to its write setting content. The invention still further relates to a kind of device realizing said method. Implement the initialized method of passive electronic label memorizer and the device of the present invention, have the advantages that so that initialization time is shorter and is relatively fixed.
Description
Technical field
The present invention relates to field of radio frequency identification, more particularly, it relates to a kind of initialized method of passive electronic label memorizer and device.
Background technology
RFID technique is owing to its reading speed is fast, decipherment distance is remote, data capacity is big and safety advantages of higher, and just progressively replacing bar codes technique becomes the leading role in Internet of Things application. The cost of passive electronic label is then the biggest obstacle that RFID technique substitutes bar codes technique. And the testing cost of passive tag chip is the important component part of passive electronic label cost. The test job of passive tag chip includes herein below: initializes memorizer, configuration parameter district, inject label identifier TID and the checking of agreement basic function. In general, the extra resource that test circuit increases is the least possible. The power consumption of passive tag chip determines its readwrite performance, and the extra resource that test circuit increases is more few, and the power consumption of passive tag chip is also more low; Time shared by test is short as far as possible. The testing time of passive tag chip directly determines its testing cost, and the time shared by test is more short, and testing cost is more low; Storage operation carries out write operation with word (WORD) for unit, initializes memorizer and occupies most times of passive tag chip test, and Fig. 1 illustrates that time when passive electronic label is tested is constituted; The test job of passive tag chip includes herein below: initializes memorizer, configuration parameter district, inject label identifier TID and the checking of agreement basic function, wherein initializes memorizer and account for the most testing time. And the time initializing memorizer was made up of call duration time and the time used by memory element of writing of test machine and passive electronic label.The passive tag chip memorizer initialized time is mainly determined by the Data writing time Twrite of the single WORD of memorizer, and the Data writing time Twrite of single WORD is had minimum write time requirement by memorizer, is typically expressed as Twr_min. The digital circuit that this Data writing time Twrite is chip self determines, chip internal agitator Fosc sum counter Wr_cnt control. But due to process deviation, the chip internal agitator Fosc produced has certain discreteness, and this has resulted in the uncertainty of Data writing time Twrite, cause certain difficulty to shortening the whole testing time. Additionally, when initializing, the call duration time between test equipment and passive electronic label is also the key components of passive tag chip memorizer initialized time. Test equipment can send the quantity of the memory element of instruction instruction single communication process operation, the quantity of the memory element of single communication process operation is more many, number of communications between test equipment and passive electronic label is more few, the time shared by call duration time between test equipment and passive electronic label is more short, but the time shared by single communication process is more long, the noise jamming in radio communication the cost causing single communication failure is more big simultaneously; The quantity of the memory element of single communication process operation is more few, time shared by single communication process is more short, the cost being caused single communication failure by the noise jamming in radio communication is more little, but the number of communications between test equipment and passive electronic label is more many, the time shared by call duration time between test test equipment and passive electronic label is more long.
Summary of the invention
The technical problem to be solved in the present invention is in that, for the defect that the above-mentioned initialization time of prior art is longer, it is provided that a kind of a kind of initialized method of passive electronic label memorizer that initialization time is shorter and device.
The technical solution adopted for the present invention to solve the technical problems is: a kind of initialized method of passive electronic label memorizer of structure, comprises the steps:
A) arranging the initial value of write time, the write time is the time of one digital data of described passive electronic label write under default setting, and it is more than the minimum write time required by this passive electronic label memorizer;
B) frequency is set and regulates parameter, regulate the frequency of oscillation value of described passive electronic label internal oscillator;
C) obtain the frequency of oscillation value of described internal oscillator, and obtain the particular value of described passive electronic label write time according to this value;
D) particular value of said write time is stored in the parameter region of described memorizer, covers the initial value of said write time, and use the particular value of write time as to this passive electronic label initialized write time;
E) memorizer of described passive electronic label is initialized, to its write setting content.
Further, described step B) farther include:
B1) use and described initially write the such as angle of incidence frequency set is regulated the parameter region of memorizer as described in parameter read-in;
B2) described internal oscillator obtains the frequency adjustment parameter of said write, and produces vibration in the frequency of oscillation of its correspondence according to this parameter.
Further, described step C) in obtain the particular value of said write time by obtaining the inverse of frequency of oscillation value of described internal oscillator.
Further, described parameter region is to set quantity or setting position, the memory area first processed when initializing in described memorizer; Said write time and described frequency regulate parameter and are sequentially stored in the starting position of described parameter region.
Further, described step E) in adopt elongated write command the memorizer of described passive electronic label is initialized.
Further, described step E) farther include:
E1) the write byte length value by repeatedly testing the described elongated write command obtained is obtained;
E2) write byte length value obtained above is adopted to initialize the memorizer of described passive tag chip.
The invention still further relates to a kind of device realizing said method, including:
Write time initial value setup unit: for arranging the initial value of write time, the write time is the time of one digital data of described passive electronic label write under default setting, and it is more than the minimum write time required by this passive electronic label memorizer;
Frequency regulates parameter set unit: is used for arranging frequency and regulates parameter, regulates the frequency of oscillation value of described passive electronic label internal oscillator;
Write time particular value acquisition unit: for obtaining the frequency of oscillation value of described internal oscillator, and obtain the particular value of described passive electronic label write time according to this value;
Write time special value storage element: for the particular value of said write time being stored in the parameter region of described memorizer, covering the initial value of said write time, and using the specific write time as to this passive electronic label initialized write time;
Initialize performance element: for initializing the memorizer of described passive electronic label, to its write setting content.
Further, described frequency adjustment parameter set unit farther includes:
Frequency regulates parameter read-in module: for using the initial value of said write time that the frequency set is regulated the parameter region of memorizer described in parameter read-in;
Frequency regulates parameter and reads module: for making the frequency that described internal oscillator obtains said write regulate parameter, and produce vibration in the frequency of oscillation of its correspondence according to this parameter.
Further, said write time particular value acquisition unit farther includes:
Write time particular value obtains module: the inverse for obtaining the frequency of oscillation value of described internal oscillator obtains the particular value of said write time.
Further, described initialization performance element farther includes:
Elongated write command length obtains module: for obtaining the write byte length value by repeatedly testing the described elongated write command obtained;
Initialize and perform module: for adopting write byte length value obtained above to initialize the memorizer of described passive tag chip.
Implement the initialized method of passive electronic label memorizer and the device of the present invention, have the advantages that due to first in memory parameter district write frequency regulate parameter, make internal oscillator can get rid of diversity produced by chip manufacturing, the particular value making the write time parameter that its agitator frequency of oscillation determines can be roughly the same just greater than the minimum write time of chip and each chip, and this makes initialization time shorter and is relatively fixed.
Accompanying drawing explanation
Fig. 1 is the composition schematic diagram that passive electronic label memorizer initializes the time used;
Fig. 2 is the flow chart of initial method in the initialized method of passive electronic label memorizer of the present invention and device embodiment;
Fig. 3 is the further flow chart of internal oscillator frequency regulating step in described embodiment;
The write word length that Fig. 4 is variable length write command in described embodiment obtains further flow chart;
Fig. 5 is the apparatus structure schematic diagram realizing described initial method in described embodiment.
Detailed description of the invention
Below in conjunction with accompanying drawing, embodiments of the present invention is further illustrated.
As in figure 2 it is shown, in the initialized method of passive electronic label memorizer of the present invention and device embodiment, its initial method comprises the steps:
Step S21 arranges the initial value of write time: in the present embodiment, passive electronic label is connected with test equipment when starting to test, as a kind of integrated circuit, when not starting to initialize, its internal not any data content, is only the semi-finished product produced on a production line. In test process, it is necessary to memorizer therein is initialized, and label data content is write in its memorizer, test can be completed, make this integrated circuit become the electronic tag that can use in subsequent steps. For this, in this step, test equipment arranges write time value. As it was previously stated, in the present embodiment, initialized main contents include above-mentioned memorizer write data, and the write time is the time of described passive electronic label one digital data of write. Due to passive electronic label itself, there is a minimum write time in it, every time stored to this passive electronic label, all can not less than this time; Otherwise, cannot be effectively written. So, in this step, the write time initial value of setting is more than the minimum write time required by this passive electronic label memorizer. In the present embodiment, being assigned with parameter region in the memorizer of passive electronic label, the parameter in the initial value of the write time in this step and subsequent step is just stored in this parameter region; Parameter region is to set quantity or setting position, the memory area first processed when initializing in described memorizer; Write time value and frequency regulate parameter and are sequentially stored in the starting position of this parameter region. Additionally, in the present embodiment, adopt the half-duplex operation mode identical with the agreement that passive tag chip is followed, adopt identical code/decode format, with the form of protocol extension instruction, passive tag chip is operated. The extended instruction used includes Set_para instruction, Write_word instruction, Test_osc instruction and Write_variable instruction. Wherein, frequency regulates parameter osc_para and writes time parameter time_para and respectively the frequency value F osc sum counter Wr_cnt of agitator is adjusted.
Step S22 arranges frequency and regulates parameter, regulates internal oscillator frequency: in this step, arranges frequency and regulates parameter, regulates the frequency of oscillation value of passive electronic label internal oscillator. As it was previously stated, it is a value set that this frequency regulates parameter, the frequency of oscillation of the internal oscillator which determined; And the frequency of oscillation of internal oscillator determines the particular value of write time. In the present embodiment, said frequencies regulates the setting of parameter and makes the particular value of write time can just greater than the minimum write time of this passive electronic label.
Step S23 obtains internal oscillator frequency value, and is written the setting value of time: in this step, obtains the frequency of oscillation of the internal oscillator regulating parametric oscillation according to said frequencies, calculates the particular value obtaining the write time.
Step S24 stores write time particular value, and it can be used as the initialized write time: in this step, the particular value of acquired write time is stored in the memory parameter district of passive electronic label, cover the initial value of the write time arranged in above-mentioned steps, and use the particular value of this write time as to this passive electronic label initialized write time.
Step S25 initializes memorizer, and to its write setting content: in this step, the memorizer of passive electronic label is initialized, the content that write sets.
As it is shown on figure 3, in the present embodiment, above-mentioned arrange that frequency regulates parameter, the step that regulates internal oscillator frequency farther includes:
Step S31 uses write time initial value that frequency is regulated parameter read-in: in this step, the frequency set in advance is regulated the above-mentioned memory parameter district of parameter read-in, specifically, write herein is to use the write time initial value arranged in above-mentioned steps to operate as the write time; The particular location of its storage, in above-mentioned parameter district, follows the storage position of above-mentioned write time initial value closely.
Step S32 internal oscillator reads this frequency and regulates parameter, and vibrates in the frequency of its correspondence: in this step, and internal oscillator is regulated by above-mentioned storing frequencies and obtains this parameter on the position of parameter, and starts vibration under the restriction of this parameter. In the present embodiment, above-mentioned storing frequencies regulates the memory location of parameter is fixing (for different passive tag chips).
As shown in Figure 4, in the present embodiment, above-mentioned initialization memorizer and to its write setting content step farther include:
Step S41 obtains the write length of variable length write command according to this initialized environment: in the present embodiment, after completing above-mentioned steps, actually to memorizer initialize adopt be elongated write command. Namely, in the initialization to the passive electronic label of each batch, the word length of write command write is consistent, but, in the initialization to the passive electronic label of different batches, the word length of write command write is probably different. Or length whether identical as write word length is how many, it is necessary to determining according to initialization specific environment parameter at that time, these ambient parameters include interference at that time, signal intensity etc. The method that can pass through progressively to strengthen or reduce write word length, chooses this write length value by repeatedly test. It is worth mentioning that, the initialization of above-mentioned different batches passive electronic label is comparatively special, typically, when actual passive tag chip is tested, it is wafer sort, and when carrying out wafer sort, to debug whole test system every time, here the test system debugged just determines test environment, response length value be also assured that, then under this test environment, the different chips in same batch not even with wafer all be same length value. When after a period of time, the passive electronic label wafer again produced, to regulate test system equally, and wafer sort now is the passive electronic label for different batches, namely the different passive electronic label in the present embodiment initializes, and it has different initialization context. In this step, the write byte length value by the repeatedly described elongated write command that independent chip testing obtains in this batch of wafer sort is obtained.
Step S42 uses above-mentioned write length write setting content when initializing: in this step, the write length value using elongated write command obtained above realizes the initialized subsequent step to this passive electronic label memorizer, including writing the tag recognition code of setting, agreement etc. in advance.
In the present embodiment, further relate to a kind of device realizing said method, as it is shown in figure 5, this device includes: write time initial value setup unit 51, frequency regulate parameter set unit 52, write time particular value acquisition unit 53, write time special value storage element 54 and initialize performance element 55. Wherein, write time initial value setup unit 51 is for arranging the initial value of write time, and the write time is the time of one digital data of described passive electronic label write under default setting, and it is more than the minimum write time required by this passive electronic label memorizer; Frequency regulates parameter set unit 52 and is used for arranging frequency adjustment parameter, regulates the frequency of oscillation value of described passive electronic label internal oscillator; Write time particular value acquisition unit 53 is for obtaining the frequency of oscillation value of described internal oscillator, and obtains the particular value of described passive electronic label write time according to this value; Write time special value storage element 54, for the particular value of said write time is stored in the parameter region of described memorizer, covers the initial value of said write time, and uses the specific write time as to this passive electronic label initialized write time; Initialize performance element 55 for initializing the memorizer of described passive electronic label, to its write setting content.
In the present embodiment, frequency adjustment parameter set unit 52 farther includes: regulate parameter read-in module 521 for using the initial value of said write time that the frequency set is regulated the frequency of the parameter region of memorizer described in parameter read-in; For making the frequency that described internal oscillator obtains said write regulate parameter, and in the frequency of oscillation of its correspondence, produce the frequency adjustment parameter reading module 522 of vibration according to this parameter.
And write time particular value acquisition unit 54 farther includes: the write time particular value of the particular value that the inverse for obtaining the frequency of oscillation value of described internal oscillator obtains the said write time obtains module 541. Initialize performance element 55 to farther include: the elongated write command length for obtaining the write byte length value by repeatedly testing the described elongated write command obtained obtains the initialization of module 551 and the memorizer for adopting write byte length value obtained above to initialize described passive tag chip and performs module 552.
In sum, in the present embodiment, use Set_para instruction that the default value (i.e. the initial value of above-mentioned write time) writing time parameter time_para is set. When test starts, all data of chip internal memorizer are all in unknown state, including writing time parameter time_para. Therefore Set_para instruction should be used before initializing the parameter region of memorizer to arrange and write time parameter time_para(and the initial value of above-mentioned write time) so that the Data writing time Twrite of oscillator frequency value Fosc passive tag chip within scope of design is all higher than requirement of the minimum write time Twr_min of memorizer; Then, use Test_write instruction modification frequency to regulate parameter osc_para, regulate chip internal oscillator frequency value Fosc. When test starts, all data of chip internal memorizer are all in unknown state, regulate parameter osc_para including frequency, in order to subsequent frequencies is measured more accurately, before frequency measurement, the frequency of memory inside should be regulated parameter osc_para and be revised as optimum; Then, Test_osc instruction is used to measure passive tag chip internal oscillator frequency value Fosc, and according to passive tag chip internal oscillator frequency value Fosc, calculate the specific particular value writing time parameter time_para(and above-mentioned write time) so that Data writing time Twrite more than and closest to memorizer the minimum write time require Twr_min;After completing above-mentioned steps, using Test_write instruction to be write in passive tag chip memorizer by the specific time parameter time_para that writes, follow-up test chips will write the time of memory element according to this state modulator; Then, Write_variable instruction is used by the specific time parameter time_para that writes after change, other address in memorizer to be initialized.
When initializing memorizer to shorten, test equipment and the call duration time of passive electronic label, should increase the quantity of the memory element of operation in single communication process as much as possible, reduce the number of communications of test machine and passive electronic label. But consider some noises in radio communication, test machine and the communication of passive electronic label have certain failed probability, in single communication process, the quantity of the memory element of operation is more many, the cost being caused single communication failure by the noise jamming in radio communication is more big, and it is longer that the testing time becomes on the contrary. Therefore this method uses elongated write command Write_variable to select the quantity of the memory element of operation in single communication process flexibly according to the quality in practical communication process.
When chip internal agitator possesses certain discreteness, by minimum testing cost, the memorizer carrying out write operation in units of WORD is carried out fast initialization, have the effect that and adopt the half-duplex operation mode identical with the agreement that passive tag chip is followed, adopt identical code/decode format, with the form of protocol extension instruction, passive tag chip is operated so that the extra resource that test circuit increases is minimum; The difficulty of testing time the shortizationest that chip internal agitator discreteness is brought is overcome with specific testing process; Adopt elongated write command when noise, to reduce the number of communications of test machine and passive electronic label in considering radio communication as much as possible, and then shorten the whole testing time.
Embodiment described above only have expressed the several embodiments of the present invention, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the scope of the claims of the present invention. It should be pointed out that, for the person of ordinary skill of the art, without departing from the inventive concept of the premise, it is also possible to making some deformation and improvement, these broadly fall into protection scope of the present invention. Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (7)
1. the initialized method of passive electronic label memorizer, it is characterised in that comprise the steps:
A) arranging the initial value of write time, the write time is the time of described passive electronic label one digital data of write, and it is more than the minimum write time required by this passive electronic label memorizer; Said write time initial value is stored in the parameter region of described passive electronic label memorizer;
B) frequency is set and regulates parameter, regulate the frequency of oscillation value of described passive electronic label internal oscillator;
C) obtain the frequency of oscillation value of described internal oscillator, and obtain the particular value of described passive electronic label write time according to this value;
D) particular value of said write time is stored in the parameter region of described passive electronic label memorizer, covers the initial value of said write time, and use the particular value of this write time as to this passive electronic label initialized write time;
E) described passive electronic label memorizer is initialized, to its write setting content;
Described step B) farther include:
The frequency set is regulated the parameter region of passive electronic label memorizer described in parameter read-in by the initial value B1) using the said write time;
B2) described internal oscillator obtains the frequency adjustment parameter of said write, and produces vibration in the frequency of oscillation of its correspondence according to this parameter;
Wherein, the parameter region of described passive electronic label memorizer is to set quantity or setting position, the memory area first processed when initializing in described memorizer; Said write time and described frequency regulate parameter and are sequentially stored in the starting position of described parameter region.
2. the initialized method of passive electronic label memorizer according to claim 1, it is characterised in that described step C) in calculate and obtain the particular value of said write time by obtaining the frequency of oscillation value of described internal oscillator.
3. the initialized method of passive electronic label memorizer according to claim 2, it is characterised in that described step E) in adopt elongated write command described passive electronic label memorizer is initialized.
4. the initialized method of passive electronic label memorizer according to claim 3, it is characterised in that described step E) farther include:
E1) the write byte length value by repeatedly testing the described elongated write command obtained is obtained;
E2) write byte length value obtained above is adopted to initialize described passive electronic label memorizer.
5. the device realizing passive electronic label memorizer initial method as claimed in claim 1, it is characterised in that including:
Write time initial value setup unit: for arranging the initial value of write time, the write time is the time of one digital data of described passive electronic label write under default setting, and it is more than the minimum write time required by this passive electronic label memorizer; The initial value of said write time is stored in the parameter region of described passive electronic label memorizer;
Frequency regulates parameter set unit: is used for arranging frequency and regulates parameter, regulates the frequency of oscillation value of described passive electronic label internal oscillator;
Write time particular value acquisition unit: for obtaining the frequency of oscillation value of described internal oscillator, and obtain the particular value of described passive electronic label write time according to this value;
Write time special value storage element: for the particular value of said write time being stored in the parameter region of described passive electronic label memorizer, cover the initial value of said write time, and use the particular value of write time as to this passive electronic label initialized write time;
Initialize performance element: be used for initializing described passive electronic label memorizer, to its write setting content;
Described frequency regulates parameter set unit and farther includes:
Frequency regulates parameter read-in module: for using the initial value of said write time that the frequency set is regulated the parameter region of memorizer described in parameter read-in;
Frequency regulates parameter and reads module: for making the frequency that described internal oscillator obtains said write regulate parameter, and produce vibration in the frequency of oscillation of its correspondence according to this parameter;
Wherein, the parameter region of described passive electronic label memorizer is to set quantity or setting position, the memory area first processed when initializing in described memorizer; Said write time and described frequency regulate parameter and are sequentially stored in the starting position of described parameter region.
6. device according to claim 5, it is characterised in that said write time particular value acquisition unit farther includes:
Write time particular value obtains module: the frequency of oscillation value for obtaining described internal oscillator obtains the particular value of said write time.
7. device according to claim 6, it is characterised in that described initialization performance element farther includes:
Elongated write command length obtains module: for obtaining the write byte length value by repeatedly testing the described elongated write command obtained;
Initialize and perform module: be used for adopting write byte length value obtained above to initialize described passive electronic label memorizer.
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| TWI379242B (en) * | 2009-02-25 | 2012-12-11 | Champtek Inc | Single-direction active rfid tag and method for setting parameter for the same |
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