CN103018594A - Capacitive touch screen testing method and system, and electronic equipment - Google Patents
Capacitive touch screen testing method and system, and electronic equipment Download PDFInfo
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Abstract
The invention belongs to the technical field of touch screen testing and provides a capacitive touch screen testing method and system, and electronic equipment. The method comprises the following steps of: acquiring sampling signals which respectively correspond to node capacitance on a capacitive touch screen; and converting the sampling signals into processible touch data, analyzing the touch data according to a pre-stored standard value and outputting an analysis result. The method and the system has the function of automatically testing the capacitive touch screen, an operation-experience-type testing mode of a tester is avoided, the testing time is shortened, and the reliability of a testing result is improved. In addition, when the capacitive touch screen testing system is arranged in a whole machine with a display screen for testing, the display screen can be used for displaying the analysis result output from the analysis module, so that the whole machine serves as a professional test fixture, and the performance test of the capacitive touch screen is independently finished without depending on external equipment.
Description
Technical field
The invention belongs to the testing touch screen technical field, relate in particular to a kind of method of testing, system and electronic equipment of capacitive touch screen.
Background technology
Capacitive touch screen is that a kind of electric current of human body that utilizes is responded to the touch-screen that carries out work, and it is widely used in various portable terminals, the particularly smart mobile phone.
Because the plant produced touch-screen is to have yield problem and process deviation, also have some touch-screens to cause damage because of the later stage factor, for example touch-screen scratches, the flexible circuit dash-board injury, therefore as the necessary links of quality control, for the electronic equipment that adopts capacitive touch screen, in its production run except need to testing the modules before assembling and parts, also need the complete machine after the assembling is tested, this complete machine refers to be equipped with at least capacitive touch screen and touch-screen drives chip, can move the electronic equipment of base program.
The method of testing of the capacitive touch screen that prior art provides is by the test man operating experience of complete machine to be finished, this kind method of testing length consuming time, the Test coverage face is limited, may ignore the test to some capacitive nodes, and test result mainly depends on test man's subjective feeling, and test result reliability is relatively poor.
Disclosed above-mentioned information is only for increasing the understanding to background technology of the present invention in this background technology this part, so it may comprise the prior art known to persons of ordinary skill in the art that does not consist of this state.
Summary of the invention
The object of the present invention is to provide a kind of method of testing of capacitive touch screen, be intended to solve and existingly by the test man operating experience of complete machine realized the method length consuming time of capacitive touch screen test, the problem that the Test coverage face is limited and test result reliability is relatively poor.
The present invention is achieved in that a kind of method of testing of capacitive touch screen, said method comprising the steps of:
Obtain sampled signal corresponding to each node capacitor difference on the capacitive touch screen;
After converting described sampled signal to accessible touch data, according to the standard value that prestores described touch data is analyzed the output analysis result.
Another object of the present invention is to provide a kind of test macro of capacitive touch screen, described system comprises:
Memory module is used for prestoring standard value;
Acquisition module is used for obtaining sampled signal corresponding to each node capacitor difference on the capacitive touch screen; And
Analysis module after being used for converting the described sampled signal that described acquisition module obtains to accessible touch data, is analyzed the output analysis result to described touch data according to the described standard value that described memory module prestores.
Another object of the present invention is to provide a kind of electronic equipment, comprise capacitive touch screen, described electronic equipment also comprises the above the test macro of capacitive touch screen.
The method of testing of capacitive touch screen provided by the invention and system prestore the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and according to standard value and sampled signal the performance of each capacitive node is analyzed, the output analysis result, realized the autorun to capacitive touch screen, avoided test man's operating experience formula test mode, shortened the test duration, improved the reliability of test result.In addition, when the test macro of this capacitive touch screen is built in system test with display screen, display screen can be used for the analysis result of display analysis module output, thereby utilize complete machine to serve as the measurement jig of specialty, do not relying in the situation of external equipment the performance test of complete independently capacitive touch screen.
Description of drawings
Fig. 1 is the process flow diagram of the method for testing of capacitive touch screen provided by the invention;
Fig. 2 is the structural drawing of the test macro of capacitive touch screen provided by the invention;
Fig. 3 is the structural drawing of analysis module among Fig. 2.
Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, is not intended to limit the present invention.
Problem for the method for testing existence that has capacitive touch screen now, the method of testing of capacitive touch screen provided by the invention prestores the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and according to standard value and sampled signal the performance of each capacitive node is analyzed.
Fig. 1 shows the flow process of the method for testing of capacitive touch screen provided by the invention.
In step S11, obtain sampled signal corresponding to each node capacitor difference on the capacitive touch screen.Sampled signal wherein can be the respective electrical pulse signal that the capacitive node on the capacitive touch screen sends after being subject to external trigger, and/or drive the original touch position data of directly obtaining the chip, characterize the capacitive node position that is triggered from the touch-screen of capacitive touch screen, and/or from the driving chip of the touch-screen of capacitive touch screen all raw data that directly obtain, that characterize all capacitive nodes.
In step S12, convert sampled signal to accessible touch data after, touch data is analyzed the output analysis result according to the standard value that prestores.
Among the present invention, when sampled signal was electric impulse signal, the data that sampled signal converted to accessible touch data were specially: electric impulse signal is carried out mould/number conversion process, obtain touch data; And when sampled signal is the original touch position data of directly obtaining from touch-screen driving chip, because it is to store with certain data memory format that original touch data drives in the chip at touch-screen, therefore need the original touch data of this kind data memory format storage is made up, cutting and/or the processing such as abandon, to convert accessible data layout to, for example, if original touch position data is short in the original touch position data that touch-screen drives in the chip, and the low address space in touch-screen driving chip is deposited the high byte data of original touch position data, the low byte data of original touch position data are deposited in high address space in touch-screen driving chip, the step that then sampled signal is converted to accessible touch data is: original touch position data is carried out combined treatment, the original touch position data of low address is moved to left after 8, add the original touch position data of high address.
As one embodiment of the present of invention, according to the standard value that prestores touch data being analyzed namely is that the standard value that basis prestores is carried out the maximal value test analysis to touch data, at this moment, the standard value that prestores comprises a maximal value, then according to the standard value that prestores touch data is analyzed, the step of output analysis result is specially: judge that whether touch data surpasses maximal value, and the position coordinates of node capacitor that will be corresponding above peaked touch data is exported as analysis result.
As an alternative embodiment of the invention, according to the standard value that prestores touch data being analyzed namely is that the standard value that basis prestores is carried out the minimum value test analysis to touch data, at this moment, the standard value that prestores comprises a minimum value, then according to the standard value that prestores touch data is analyzed, the step of output analysis result is specially: judge whether touch data reaches minimum value, and the position coordinates of node capacitor corresponding to the touch data that will not reach minimum value is exported as analysis result, certainly, in the position coordinates of output node electric capacity, also the touch data of correspondence together can be exported.
As another embodiment of the present invention, according to the standard value that prestores touch data being analyzed namely is that the standard value that basis prestores is carried out adjacent test bias analysis to touch data, at this moment, the standard value that prestores comprises an adjacent deviation standard value, then according to the standard value that prestores touch data is analyzed, the step of output analysis result specifically may further comprise the steps: the absolute value of difference between the touch data of calculating present node electric capacity and the touch data of each adjacent node electric capacity, and with the absolute value of each difference touch data divided by present node electric capacity, obtain the adjacent deviate suitable with adjacent node electric capacity number; Judge whether each adjacent deviate surpasses adjacent deviation standard value, and the position coordinates of present node electric capacity that will be corresponding above the adjacent deviate of adjacent deviation standard value is exported as analysis result, certainly, in the position coordinates of output present node electric capacity, also the touch data of correspondence, adjacent deviate together can be exported.
As another embodiment of the present invention, according to the standard value that prestores touch data being analyzed namely is that the standard value that basis prestores is carried out the analysis of whole screen test bias to touch data, at this moment, the standard value that prestores comprises a whole screen deviation standard value, then according to the standard value that prestores touch data is analyzed, the step of output analysis result specifically may further comprise the steps: the mean value that calculates the touch data of whole node capacitors, and after the touch data of present node electric capacity deducted this mean value, with the absolute value of the data that the obtain touch data divided by present node electric capacity, obtain whole screen deviate corresponding to present node electric capacity; Judge whether each whole screen deviate surpasses whole screen deviation standard value, and the position coordinates of present node electric capacity that will be corresponding above the whole screen deviate of whole screen deviation standard value is exported as analysis result, certainly, in the position coordinates of output present node electric capacity, also the touch data of correspondence, whole screen deviate together can be exported.
And in actual application, the step of touch data being analyzed according to the standard value that prestores also can comprise simultaneously above-mentionedly carries out the maximal value test analysis, touch data is carried out the minimum value test analysis, touch data is carried out adjacent test bias analysis, touch data carried out the combination of two or more analyses of whole screen test bias in analyzing touch data.The below illustrates the detailed process of each analysis:
The touch data of supposing the node capacitor in last minute zone to be tested of capacitive touch screen distributes shown in following table one:
Table one
| X1 | X2 | X3 | |
| Y1 | 3000 | 2500 | 2000 |
| Y2 | 3100 | 2600 | 1800 |
| Y3 | 3300 | 2700 | 2200 |
Wherein, position coordinates (the X1 of node capacitor, Y1) touch data is 3000, position coordinates (the X1 of node capacitor, Y2) touch data is 3100, position coordinates (the X1 of node capacitor, Y3) touch data is 3300, and the touch data of the position coordinates (X2, Y1) of node capacitor is 2500, position coordinates (the X2 of node capacitor, Y2) touch data is 2600, and the touch data of the position coordinates (X2, Y3) of node capacitor is 2700, position coordinates (the X3 of node capacitor, Y1) touch data is 2000, and the touch data of the position coordinates (X3, Y2) of node capacitor is 1800, the touch data of the position coordinates (X3, Y3) of node capacitor is 2200.Simultaneously, suppose that the maximal value that prestores is 3200, the minimum value that prestores is 2000, and the adjacent deviation standard value that prestores is 0.2, and the whole screen deviation standard value that prestores is 0.25, then in the maximal value test analysis, touch data corresponding to node capacitor that can judge position coordinates (X1, Y3) exceeds maximal value, thereby output is as the position coordinates (X1 of analysis result, Y3), perhaps prompting exceeds maximal value etc.; Touch data is being carried out in the minimum value test analysis, and touch data corresponding to node capacitor that can judge position coordinates (X3, Y2) do not reach minimum value, thereby output perhaps points out to exceed minimum value etc. as the position coordinates (X3, Y2) of analysis result; In touch data being carried out adjacent test bias analysis, calculate the adjacent deviate of each node capacitor, with position coordinates (X2, Y2) be example, calculating location coordinate (X2 at first, Y2) with position coordinates (X2, Y1) difference of touch data is 100 between, corresponding adjacent deviate is 100/2600=0.038, in like manner calculate position coordinates (X2, Y2) with position coordinates (X2, Y3) the adjacent deviate between is 100/2600=0.038, adjacent deviate between position coordinates (X2, Y2) and the position coordinates (X1, Y2) is 500/2600=0.192, position coordinates (X2, Y2) with position coordinates (X3, Y2) the adjacent deviate between is 800/2600=0.307, owing to there is the adjacent deviate 0.307 that surpasses adjacent deviation standard value, then exports the position coordinates (X2 as analysis result, Y2), perhaps prompting exceeds adjacent deviation etc.; In touch data being carried out whole screen test bias analysis, the mean value that calculates the touch data of whole node capacitors is 2578, and obtains whole screen deviate corresponding to present node electric capacity shown in following table two:
Table two
| X1 | X2 | X3 | |
| Y1 | 0.141 | 0.031 | 0.289 |
| Y2 | 0.168 | 0.008 | 0.432 |
| Y3 | 0.219 | 0.045 | 0.172 |
Can find out position coordinates (X3, Y1) and position coordinates (X3, Y2) divide other whole screen deviate to surpass whole screen deviation standard value, then export position coordinates (X3, Y1) and position coordinates (X3 as analysis result, Y2), perhaps prompting exceeds whole screen deviation etc.
The method of testing of capacitive touch screen provided by the invention prestores the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and according to standard value and sampled signal the performance of each capacitive node is analyzed, the output analysis result, realized the autorun to capacitive touch screen, avoided test man's operating experience formula test mode, shortened the test duration, improved the reliability of test result.When this method of testing was applied to system test with display screen, display screen can show the analysis result of output.
Fig. 2 shows the structure of the test macro of capacitive touch screen provided by the invention, for convenience of explanation, only shows part related to the present invention.
The test macro of capacitive touch screen provided by the invention comprises: memory module 13 is used for prestoring standard value; Acquisition module 11, be used for obtaining sampled signal corresponding to each node capacitor difference on the capacitive touch screen, this sampled signal can be the respective electrical pulse signal that the capacitive node on the capacitive touch screen sends after being subject to external trigger, and/or drive the original touch position data of directly obtaining the chip, characterize the capacitive node position that is triggered from the touch-screen of capacitive touch screen, and/or from the driving chip of the touch-screen of capacitive touch screen all raw data that directly obtain, that characterize all capacitive nodes; Analysis module 12 after being used for converting the sampled signal that acquisition module 11 obtains to accessible touch data, is analyzed the output analysis result to touch data according to the standard value that memory module 13 prestores.
Fig. 3 shows the structure of analysis module 12 among Fig. 2.
Particularly, when the standard value that prestores when memory module 13 comprised a maximal value, as one embodiment of the present of invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal that is used for acquisition module 11 is obtained converts accessible touch data to; Maximal value analysis module 122 is used for judging that whether the touch data that pretreatment module 121 is converted to surpasses the maximal value that memory module 13 prestores, and the position coordinates of node capacitor that will be corresponding above this peaked touch data is exported as analysis result.
When the standard value that prestores when memory module 13 comprised a minimum value, as another embodiment of the present invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal that is used for acquisition module 11 is obtained converts accessible touch data to; Minimum value analysis module 123 is used for judging whether the touch data that pretreatment module 121 is converted to reaches the minimum value that memory module 13 prestores, and the position coordinates that will not reach node capacitor corresponding to the touch data of this minimum value is exported as analysis result;
When the standard value that prestores when memory module 13 comprised an adjacent deviation standard value, as an again embodiment of the present invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal that is used for acquisition module 11 is obtained converts accessible touch data to; Adjacent variance analysis module 124, be converted to for calculating pretreatment module 121, the absolute value of difference between the touch data of the touch data of present node electric capacity and each adjacent node electric capacity, and with the absolute value of each difference touch data divided by present node electric capacity, obtain the adjacent deviate suitable with adjacent node electric capacity number, judge that afterwards whether each adjacent deviate surpasses the adjacent deviation standard value that memory module 13 prestores, and the position coordinates of present node electric capacity that will be corresponding above the adjacent deviate of adjacent deviation standard value is exported as analysis result.
When the standard value that prestores when memory module 13 comprised a whole screen deviation standard value, as an again embodiment of the present invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal that is used for acquisition module 11 is obtained converts accessible touch data to; Whole screen variance analysis module 125, be converted to for calculating pretreatment module 121, the mean value of the touch data of whole node capacitors, and after the touch data of present node electric capacity deducted this mean value, with the absolute value of the data that the obtain touch data divided by present node electric capacity, obtain whole screen deviate corresponding to present node electric capacity, judge that afterwards whether each whole screen deviate surpasses the whole screen deviation standard value that memory module 13 prestores, and the position coordinates of present node electric capacity that will be corresponding above the whole screen deviate of whole screen deviation standard value is exported as analysis result.
Certainly, in actual application, analysis module 12 can also comprise two or more in maximal value analysis module 122, minimum value analysis module 123, adjacent variance analysis module 124, the whole screen variance analysis module 125 simultaneously.
In the test macro of capacitive touch screen provided by the invention, memory module 13 prestores the standard value of capacitive node sampled data, in test process, the sampled signal of acquisition module 11 each capacitive node of automatic acquisition, analysis module 12 is analyzed the performance of each capacitive node according to standard value and sampled signal, the output analysis result, realized the autorun to capacitive touch screen, avoided test man's operating experience formula test mode, shortened the test duration, improved the reliability of test result.When this test macro is built in system test with display screen, display screen can be used for the analysis result of display analysis module 12 outputs, thereby utilize complete machine to serve as the measurement jig of specialty, do not relying in the situation of external equipment the performance test of complete independently capacitive touch screen.
The present invention also provides a kind of electronic equipment, and this electronic equipment comprises capacitive touch screen, also comprises as mentioned above the test macro of capacitive touch screen.Preferably, this electronic equipment is capacitance touching control equipment.
Further, when wherein sampled signal is that acquisition module 11 utilizes communication protocol to drive when directly obtaining the chip from the touch-screen of capacitive touch screen, the touch-screen that this electronic equipment also further includes capacitive touch screen drives chip.
In addition, for convenient test, electronic equipment also comprises a display screen, is used for the analysis result of display analysis module 12 outputs.
The method of testing of capacitive touch screen provided by the invention and system prestore the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and according to standard value and sampled signal the performance of each capacitive node is analyzed, the output analysis result, realized the autorun to capacitive touch screen, avoided test man's operating experience formula test mode, shortened the test duration, improved the reliability of test result.In addition, when the test macro of this capacitive touch screen is built in system test with display screen, display screen can be used for the analysis result of display analysis module 12 outputs, thereby utilize complete machine to serve as the measurement jig of specialty, do not relying in the situation of external equipment the performance test of complete independently capacitive touch screen.
One of ordinary skill in the art will appreciate that all or part of step that realizes in above-described embodiment method is can control relevant hardware by program to finish, described program can be in being stored in the storage mediums such as ROM/RAM, disk, Flash, disk, CD.
The above only is preferred embodiment of the present invention, not in order to limiting the present invention, all any modifications of doing within the spirit and principles in the present invention, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. the method for testing of a capacitive touch screen is characterized in that, said method comprising the steps of:
Obtain sampled signal corresponding to each node capacitor difference on the capacitive touch screen;
After converting described sampled signal to accessible touch data, according to the standard value that prestores described touch data is analyzed the output analysis result.
2. the method for testing of capacitive touch screen as claimed in claim 1, it is characterized in that, described sampled signal is the respective electrical pulse signal that the described capacitive node on the described capacitive touch screen sends after being subject to external trigger, and/or drive the original touch position data of directly obtaining the chip, characterize the capacitive node position that is triggered from the touch-screen of described capacitive touch screen, and/or from the driving chip of the touch-screen of described capacitive touch screen all raw data that directly obtain, that characterize all capacitive nodes.
3. the method for testing of capacitive touch screen as claimed in claim 1 is characterized in that, described standard value comprises a maximal value, and the standard value that described basis prestores is analyzed described touch data, and the step of output analysis result is specially:
Judge that whether described touch data surpasses described maximal value, and the position coordinates of node capacitor that will be corresponding above described peaked touch data is exported as described analysis result.
4. the method for testing of capacitive touch screen as claimed in claim 1 is characterized in that, described standard value comprises a minimum value, and the standard value that described basis prestores is analyzed described touch data, and the step of output analysis result is specially:
Judge whether described touch data reaches described minimum value, and the position coordinates that will not reach node capacitor corresponding to the touch data of described minimum value is exported as described analysis result.
5. the method for testing of capacitive touch screen as claimed in claim 1 is characterized in that, described standard value comprises an adjacent deviation standard value, and the standard value that described basis prestores is analyzed described touch data, and the step of output analysis result may further comprise the steps:
The absolute value of difference between the touch data of calculating present node electric capacity and the touch data of each adjacent node electric capacity, and with the absolute value of each difference touch data divided by described present node electric capacity, obtain the adjacent deviate suitable with the number of described adjacent node electric capacity;
Judge that whether each adjacent deviate surpasses described adjacent deviation standard value, and the position coordinates of present node electric capacity that will be corresponding above the adjacent deviate of described adjacent deviation standard value is exported as described analysis result.
6. the method for testing of capacitive touch screen as claimed in claim 1 is characterized in that, described standard value comprises a whole screen deviation standard value, and the standard value that described basis prestores is analyzed described touch data, and the step of output analysis result may further comprise the steps:
Calculate the mean value of the touch data of whole node capacitors, and after the touch data of present node electric capacity deducted described mean value, with the absolute value of the data that the obtain touch data divided by described present node electric capacity, obtain whole screen deviate corresponding to described present node electric capacity;
Judge that whether each whole screen deviate surpasses described whole screen deviation standard value, and the position coordinates of present node electric capacity that will be corresponding above the whole screen deviate of described whole screen deviation standard value is exported as described analysis result.
7. the test macro of a capacitive touch screen is characterized in that, described system comprises:
Memory module is used for prestoring standard value;
Acquisition module is used for obtaining sampled signal corresponding to each node capacitor difference on the capacitive touch screen; And
Analysis module after being used for converting the described sampled signal that described acquisition module obtains to accessible touch data, is analyzed the output analysis result to described touch data according to the described standard value that described memory module prestores.
8. the test macro of capacitive touch screen as claimed in claim 7 is characterized in that, the described standard value that described memory module prestores comprises maximal value, minimum value, adjacent deviation standard value, whole screen deviation standard value, and described analysis module comprises:
Pretreatment module, the described sampled signal that is used for described acquisition module is obtained converts accessible touch data to;
The maximal value analysis module is used for judging that whether the described touch data that described pretreatment module is converted to surpasses described maximal value, and the position coordinates of node capacitor that will be corresponding above described peaked touch data is exported as described analysis result;
The minimum value analysis module is used for judging whether the described touch data that described pretreatment module is converted to reaches described minimum value, and the position coordinates that will not reach node capacitor corresponding to the touch data of described minimum value is exported as described analysis result;
Adjacent variance analysis module, be used for calculating the absolute value of difference between the touch data of the touch data of that described pretreatment module is converted to, present node electric capacity and each adjacent node electric capacity, and with the absolute value of each difference touch data divided by present node electric capacity, obtain the adjacent deviate suitable with adjacent node electric capacity number, judge that afterwards whether each adjacent deviate surpasses described adjacent deviation standard value, and the position coordinates of present node electric capacity that will be corresponding above the adjacent deviate of described adjacent deviation standard value is exported as described analysis result; And
Whole screen variance analysis module, the mean value of the touch data of that described pretreatment module is converted to for calculating, whole node capacitors, and after the touch data of present node electric capacity deducted described mean value, with the absolute value of the data that the obtain touch data divided by present node electric capacity, obtain whole screen deviate corresponding to present node electric capacity, judge that afterwards whether each whole screen deviate surpasses described whole screen deviation standard value, and the position coordinates of present node electric capacity that will be corresponding above the whole screen deviate of described whole screen deviation standard value is exported as described analysis result.
9. an electronic equipment comprises capacitive touch screen, it is characterized in that, described electronic equipment also comprises the test macro just like claim 7 or 8 each described capacitive touch screens.
10. electronic equipment as claimed in claim 9 is characterized in that, described electronic equipment is capacitance touching control equipment, and described electronic equipment also comprises:
The touch-screen of described capacitive touch screen drives chip; And
Display screen is used for the described analysis result that shows that described analysis module is exported.
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103245864A (en) * | 2013-05-10 | 2013-08-14 | 苏州欧菲光科技有限公司 | Touch screen testing system and method |
| WO2015095541A1 (en) * | 2013-12-19 | 2015-06-25 | Clarus Vision, Inc. | Methods and apparatuses for testing capacitive touch screen films |
| CN105260077A (en) * | 2015-11-30 | 2016-01-20 | 华勤通讯技术有限公司 | Electronic device and detection method for capacitive touch screen of electronic device |
| CN105652114A (en) * | 2015-12-25 | 2016-06-08 | 广东欧珀移动通信有限公司 | Power supply method, power supply device and testing jig in testing display screen |
| CN106526398A (en) * | 2016-10-28 | 2017-03-22 | 昆山国显光电有限公司 | Detection method and device of capacitive touch screen |
| CN107466369A (en) * | 2017-06-15 | 2017-12-12 | 深圳市汇顶科技股份有限公司 | Fingerprint chip detecting method, apparatus and system |
| CN107703395A (en) * | 2017-10-31 | 2018-02-16 | 惠州市德赛西威汽车电子股份有限公司 | A kind of pulse test system and method for testing for vehicle-carrying display screen |
| CN107943642A (en) * | 2017-11-15 | 2018-04-20 | 歌尔科技有限公司 | A kind of performance test methods of capacitance touch sensing device |
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| WO2019127313A1 (en) * | 2017-12-29 | 2019-07-04 | 深圳市汇顶科技股份有限公司 | Method for calibrating node capacitors |
| CN110188014A (en) * | 2019-05-29 | 2019-08-30 | 浙江大学 | A kind of anti-interference test method for capacitive touch screen |
| CN111596802A (en) * | 2020-05-26 | 2020-08-28 | Oppo（重庆）智能科技有限公司 | Touch screen calibration method and device and computer readable storage medium |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101545937B (en) * | 2008-12-30 | 2012-04-25 | 深圳创维－Rgb电子有限公司 | System and method for touch screen testing |
| CN102425843A (en) * | 2011-12-07 | 2012-04-25 | 广东美的制冷设备有限公司 | Air-conditioning device supporting sliding regulation of setting information and controlling method for air-conditioning device |
| CN102654543A (en) * | 2012-05-23 | 2012-09-05 | 东莞通华液晶有限公司 | Method for testing capacitive touch screens and testing equipment thereof |
-
2012
- 2012-11-30 CN CN201210501337.1A patent/CN103018594B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101545937B (en) * | 2008-12-30 | 2012-04-25 | 深圳创维－Rgb电子有限公司 | System and method for touch screen testing |
| CN102425843A (en) * | 2011-12-07 | 2012-04-25 | 广东美的制冷设备有限公司 | Air-conditioning device supporting sliding regulation of setting information and controlling method for air-conditioning device |
| CN102654543A (en) * | 2012-05-23 | 2012-09-05 | 东莞通华液晶有限公司 | Method for testing capacitive touch screens and testing equipment thereof |
Cited By (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103245864A (en) * | 2013-05-10 | 2013-08-14 | 苏州欧菲光科技有限公司 | Touch screen testing system and method |
| CN106461714B (en) * | 2013-12-19 | 2019-06-18 | 克拉鲁斯视觉公司 | Method and apparatus for testing capacitor touch-screen film |
| WO2015095541A1 (en) * | 2013-12-19 | 2015-06-25 | Clarus Vision, Inc. | Methods and apparatuses for testing capacitive touch screen films |
| US9410907B2 (en) | 2013-12-19 | 2016-08-09 | Clarus Vision, Inc. | Methods and apparatuses for testing capacitive touch screen films |
| CN106461714A (en) * | 2013-12-19 | 2017-02-22 | 克拉鲁斯视觉公司 | Methods and apparatuses for testing capacitive touch screen films |
| CN105260077A (en) * | 2015-11-30 | 2016-01-20 | 华勤通讯技术有限公司 | Electronic device and detection method for capacitive touch screen of electronic device |
| CN105652114A (en) * | 2015-12-25 | 2016-06-08 | 广东欧珀移动通信有限公司 | Power supply method, power supply device and testing jig in testing display screen |
| CN105652114B (en) * | 2015-12-25 | 2018-01-19 | 广东欧珀移动通信有限公司 | Method of supplying power to, device and measurement jig during a kind of test display screen |
| CN106526398A (en) * | 2016-10-28 | 2017-03-22 | 昆山国显光电有限公司 | Detection method and device of capacitive touch screen |
| CN106526398B (en) * | 2016-10-28 | 2019-08-27 | 昆山国显光电有限公司 | The detection method and detection device of capacitive touch screen |
| CN107466369A (en) * | 2017-06-15 | 2017-12-12 | 深圳市汇顶科技股份有限公司 | Fingerprint chip detecting method, apparatus and system |
| CN107703395A (en) * | 2017-10-31 | 2018-02-16 | 惠州市德赛西威汽车电子股份有限公司 | A kind of pulse test system and method for testing for vehicle-carrying display screen |
| CN107943642A (en) * | 2017-11-15 | 2018-04-20 | 歌尔科技有限公司 | A kind of performance test methods of capacitance touch sensing device |
| CN107943642B (en) * | 2017-11-15 | 2021-02-19 | 歌尔科技有限公司 | Performance test method of capacitive touch sensing device |
| WO2019127313A1 (en) * | 2017-12-29 | 2019-07-04 | 深圳市汇顶科技股份有限公司 | Method for calibrating node capacitors |
| CN110383226A (en) * | 2017-12-29 | 2019-10-25 | 深圳市汇顶科技股份有限公司 | The calibration method of node capacitor |
| CN110383226B (en) * | 2017-12-29 | 2023-01-31 | 深圳市汇顶科技股份有限公司 | Calibration method of node capacitance |
| CN109188143A (en) * | 2018-09-20 | 2019-01-11 | 新辉开科技（深圳）有限公司 | A kind of method and system detecting capacitive touch screen functional sheet |
| CN110188014A (en) * | 2019-05-29 | 2019-08-30 | 浙江大学 | A kind of anti-interference test method for capacitive touch screen |
| CN111596802A (en) * | 2020-05-26 | 2020-08-28 | Oppo（重庆）智能科技有限公司 | Touch screen calibration method and device and computer readable storage medium |
| CN111596802B (en) * | 2020-05-26 | 2022-12-02 | Oppo（重庆）智能科技有限公司 | Touch screen calibration method and device and computer readable storage medium |
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