CN102967817B - Chip audio module test system and method for testing - Google Patents
Chip audio module test system and method for testing Download PDFInfo
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- CN102967817B CN102967817B CN201110257152.6A CN201110257152A CN102967817B CN 102967817 B CN102967817 B CN 102967817B CN 201110257152 A CN201110257152 A CN 201110257152A CN 102967817 B CN102967817 B CN 102967817B
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Abstract
The present invention relates to audio-frequency test technology, specifically a kind of chip audio module test system and method for testing are disclosed, it utilizes the module performance of chip self, ADC module and DAC module two kinds of tests are combined, it utilizes DAC module to go playing standard sound signal, signals collecting returns to analyze by ADC module, judges that whether chip audio module is qualified thus.Due to the restriction breaking away from testing tool, the present invention achieves the automatic test of volume production chip preferably, is conducive to the quality improving shipment chip.
Description
Technical field
The present invention relates to audio-frequency test technology, particularly relate to a kind of chip audio module test system and method for testing.
Background technology
Chip checking is the necessary links ensureing chip functions, for DAC module (Digital-to-Analog Conversion in AUDIO (audio frequency) module, digital to analog converter) and ADC module (Analog-to-DigitalConversion, analog to digital converter) checking in, the instrument used is needed to comprise the multiple instrument and equipments such as audio analyzer, signal generator, PC, complicated operation, the test of every sheet can not be carried out volume production chip, can ensure that the AUDIO functions of modules performance of the every chip block flowing to market is normal thus.
Specifically, DAC module and ADC module are normally separated two parts to test by existing DAC module and ADC module test method: when testing DAC module, first 1k is play by DAC module sinusoidal wave, then go in accessing to audio analyser to analyze the signal quality exported, obtain the index of signal, whether more qualified with standard value; During to ADC module testing, the sine wave of 1KHZ is produced with signal generator, then by the ADC module of signal access chip, data are imported into computer after ADC image data, utilize relevant routine analyzer to the data analysis obtained, calculate quality indication signal, whether qualified with standard comparing.Because this method needs to use multiple instrument and equipment, operation is comparatively complicated, can not test, affect AUDIO module quality thus to the every sheet chip of volume production.
Summary of the invention
In view of this, the object of the present invention is to provide a kind of chip audio module test system and method for testing, realize chip automatic test, ensure chip product quality preferably.
For solving above technical matters, technical scheme provided by the invention is, a kind of chip audio module test system, chip comprise CPU (central processing unit), ADC module and and DAC module, ADC module is connected by an external circuit with between DAC module, wherein: DAC module is used for playing standard sound signal, obtains DAC play signal; ADC module, for gathering DAC play signal, obtains ADC image data; CPU (central processing unit) is used for the performance index calculating ADC image data according to preset strategy, and compares with respective standard value, and whether analysis chip audio-frequency module is qualified.
More preferably, comprising storer, for writing ADC image data, processing for CPU (central processing unit).
More preferably, storer stores the standard audio signal made in advance.
More preferably, standard audio signal is sine wave signal.
More preferably, the frequency of sine wave signal is 1 ~ 3KHZ.
More preferably, external circuit is coupled circuit.
More preferably, coupled circuit comprises a coupling capacitance.
On this basis, the present invention is corresponding provides a kind of chip audio module test method, comprising:
DAC module playing standard sound signal, obtains DAC play signal;
ADC module acquires DAC play signal, obtains ADC image data;
CPU (central processing unit) calculates the performance index of ADC image data according to preset strategy, and compares with respective standard value, and whether analysis chip audio-frequency module is qualified.
More preferably, sine wave signal is prestored as standard audio signal.
More preferably, frequency is adopted to be that 1 ~ 3KHZ sine wave signal is as standard audio signal.
Compared with prior art, ADC module and DAC module two kinds of tests combine by the present invention, namely utilize DAC module playing standard sound signal, are then returned to analyze by signals collecting by ADC module, judge that whether chip audio module is qualified thus, the test of every sheet chip can be realized.The present invention utilizes the module of chip self, breaks away from the restriction of testing tool, achieves the automatic test to chip preferably.Add this test when chip volume production, effectively can improve the quality of shipment chip.
Accompanying drawing explanation
Fig. 1 is the external wiring diagram of chip audio module test system of the present invention;
Fig. 2 is the theory diagram of chip audio module test system of the present invention;
Fig. 3 is the process flow diagram of chip audio module test method of the present invention.
Embodiment
Core concept of the present invention is, utilize DAC module to go playing standard sound signal, signals collecting returns to analyze by ADC module, judges that whether chip audio module is qualified thus, realizes the automatic test of every sheet chip preferably.
Based on above-mentioned basic conception, technical solution of the present invention comprises hardware and software two parts, wherein needs the detailed problem considered to comprise: how to protect the signal levying the generation of normal chip DAC module clean; How the signal that DAC module produces is gathered again; How the signal that sampling is returned is analyzed; And, time of consuming when how to shorten the signal analysis that sampling is returned.
Specifically, for addressing these problems, the overall technical architecture of preferred embodiment of the present invention is divided into following step:
1, first make sinusoidal wave data, the quality of reference number and complete will be protected in manufacturing process, be supplied to DAC module and play.
2, write the driver of chip DAC module and ADC module, guarantee to make chip normal play go out sine wave and normal acquisition signal.
3, connect hardware, signal is taken back the ADC module of chip, the sine wave signal of broadcast is returned by ADC module acquires, external wiring diagram as shown in Figure 1.
4, DAP is write, in order to realize FFT (Fast Fourier Transformation, i.e. fast Fourier transform), SNR (signal to noise ratio (S/N ratio), be also called signal to noise ratio, the i.e. voltage of the output signal of amplifier and the ratio of the noise voltage simultaneously exported, conventional decibels represents), THD (Total HarmonicDistortion, total harmonic distortion represent the level of harmonic wave that sound device produces) calculates.
5, the data collected are kept in the RAM (Random Access Memory, random memory unit) of system, and chip self-operating routine analyzer can enter analyze to these data, calculates the indexs such as SNR and THD.
6, compare with standard value, draw qualified product whether conclusion.
In order to make those skilled in the art understand technical scheme of the present invention better, below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
See Fig. 2, represent the theory diagram of chip audio module test system of the present invention.This test macro comprises chip 100, storer 200 and external circuit 300, wherein: chip 100 comprise CPU (central processing unit) 101, ADC module 102 and with DAC module 103; Be connected by external circuit 300 between ADC module 102 with DAC module 103; More preferably, external circuit 300 is the coupled circuit comprising coupling capacitance C.Below respectively each ingredient of this test macro is described:
DAC module 103, is configured with corresponding audio frequency and plays driver, for playing standard sound signal, obtains DAC and broadcasts and revolve signal, gather voice data in order to be connected to ADC module 102;
ADC module 102, is configured with corresponding audio collection driver, for gathering DAC play signal, obtains ADC image data, carries out calculating, analyzing for CPU (central processing unit) 101;
CPU (central processing unit) 101, for according to preset strategy (algorithm), calculate ADC image data, obtain ADC image data performance index, and compare with respective standard value, whether analysis chip audio-frequency module is qualified.
The present embodiment comprises storer 200, and it can write ADC image data, carries out subsequent analysis process for CPU (central processing unit) 101.Especially, it stores the sinusoidal wave standard audio signal that makes in advance, and optimized frequency is 1KHZ, is undertaken testing, comparison by this signal, namely obtains the conclusion whether chip quality is qualified.
In the present embodiment, directly be connected by coupling capacitance C between DAC module 103 with ADC module 102, realize thus: utilize DAC module 103 to go playing standard sound signal, signals collecting returns to analyze by ADC module 102, whether final confirmation chip audio module is qualified.Because storage unit 200 stores standard audio signal, thus without the need to by external test facility, just can analyze quickly, whether comparison chip audio module qualified.
As can be seen here, in the test macro described in above-described embodiment, utilize the modular character of chip self, the automatic test to chip can be realized.Due to the restriction breaking away from testing tool, thus all add this test when can make chip volume production, be conducive to the quality improving shipment chip.
See Fig. 3, represent the process flow diagram of chip audio module test method of the present invention, be specially:
By DAC module playing standard sound signal, obtain DAC play signal, this standard audio signal is the sine wave signal made in advance being stored in memory inside, and its frequency is preferably 1 ~ 3KHZ (step S301);
This DAC play signal is taken back and gathers to ADC module, obtain ADC image data (step S302);
According to according to pre-defined algorithm, ADC image data is calculated by CPU (central processing unit), obtain the performance index of ADC image data, and compare with respective standard value, analysis chip audio-frequency module whether qualified (step 303 ~ S305).
This method of testing can realize the test of chip DAC module ADC module quickly, has broken away from the restriction of testing tool preferably.The method has been applied in the BBT test of chip at present, ensure that the quality of chip shipment preferably originally.
Below be only the preferred embodiment of the present invention, its key is to realize the logic of the hardware of DAC module and DC module automatic test, software algorithm and whole flow process.Conveniently, for chip product: as long as one of them is not up to standard for DAC module or ADC module, all judges that chip audio module does not meet performance index, and judge that whole chip quality is defective further.Therefore, DAC module and ADC module are integrally tested by the present invention, and no longer judge that the defective producing cause of chip quality is DAC module or ADC module.
It should be pointed out that above-mentioned preferred implementation should not be considered as limitation of the present invention, protection scope of the present invention should be as the criterion with claim limited range.For those skilled in the art, without departing from the spirit and scope of the present invention, can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (6)
1. a chip audio module test system, chip comprises CPU (central processing unit), ADC module and DAC module, it is characterized in that, ADC module is connected by an external circuit with between DAC module, described external circuit is coupled circuit, wherein: DAC module is used for playing standard sound signal, obtains DAC play signal; ADC module, for gathering DAC play signal, obtains ADC image data; CPU (central processing unit) is used for the performance index calculating ADC image data according to preset strategy, and compares with respective standard value, and whether analysis chip audio-frequency module is qualified;
Wherein,
Comprising storer, for writing ADC image data, processing for CPU (central processing unit);
Wherein, described storer stores the standard audio signal made in advance;
Wherein, coupled circuit comprises a coupling capacitance.
2. chip audio module test system as claimed in claim 1, it is characterized in that, standard audio signal is sine wave signal.
3. chip audio module test system as claimed in claim 2, it is characterized in that, the frequency of sine wave signal is 1 ~ 3KHZ.
4. a chip audio module test method, is characterized in that, comprising:
DAC module playing standard sound signal, obtains DAC play signal;
ADC module acquires DAC play signal, obtains ADC image data;
CPU (central processing unit) calculates the performance index of ADC image data according to preset strategy, and compares with respective standard value, and whether analysis chip audio-frequency module is qualified;
Storer, for writing ADC image data, processes for CPU (central processing unit), and stores the standard audio signal made in advance.
5. chip audio module test method as claimed in claim 4, is characterized in that, prestore sine wave signal as standard audio signal.
6. chip audio module test method as claimed in claim 5, is characterized in that, adopts frequency to be that 1 ~ 3KHZ sine wave signal is as standard audio signal.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104422865B (en) * | 2013-08-22 | 2017-06-20 | 上海东软载波微电子有限公司 | Wafer scale one-off programming OTP chip detecting methods and device |
| CN103747407B (en) * | 2013-12-27 | 2017-04-12 | 深圳英飞拓科技股份有限公司 | Audio module automatic test method based on FFT frequency sweep |
| CN107111538B (en) * | 2014-12-19 | 2020-05-19 | 杜比实验室特许公司 | Audio benchmarking with simulated audio real-time processing |
| CN106054058B (en) * | 2016-04-28 | 2019-01-25 | 芯海科技（深圳）股份有限公司 | One kind can be to multiple sigma-delta ADC chip testings and temperature controlled system and method |
| CN107340054B (en) * | 2017-06-23 | 2020-02-07 | 歌尔科技有限公司 | Method and device for testing noise of acoustic product |
| CN108064347A (en) * | 2017-11-28 | 2018-05-22 | 福建联迪商用设备有限公司 | The audio pin test method and test device of communication module |
| CN110825567A (en) * | 2019-07-17 | 2020-02-21 | 深圳芯智汇科技有限公司 | Test system and test method of audio chip |
| CN111065039B (en) * | 2020-03-18 | 2020-09-25 | 延锋伟世通电子科技（南京）有限公司 | Universal audio analysis system based on Dirana3 |
| CN112995880A (en) * | 2021-01-18 | 2021-06-18 | 讯喆微电子(合肥)有限公司 | Automatic testing system and method for audio module |
| CN112566005B (en) * | 2021-02-25 | 2021-07-16 | 易兆微电子(杭州)股份有限公司 | Audio chip testing method and device, electronic equipment and storage medium |
| CN113759194A (en) * | 2021-08-16 | 2021-12-07 | 国微集团(深圳)有限公司 | Human body signal collecting and generating device |
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