CN102944792A - Electromagnetic interference (EMI) power supply filter temperature-rise test device and method - Google Patents
Electromagnetic interference (EMI) power supply filter temperature-rise test device and method Download PDFInfo
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- CN102944792A CN102944792A CN2012104596325A CN201210459632A CN102944792A CN 102944792 A CN102944792 A CN 102944792A CN 2012104596325 A CN2012104596325 A CN 2012104596325A CN 201210459632 A CN201210459632 A CN 201210459632A CN 102944792 A CN102944792 A CN 102944792A
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Abstract
The invention belongs to the technical field of electronic test and measurement, and in particular relates to an electromagnetic interference (EMI) power supply filter temperature-rise test device and a method for testing temperature rising of a great amount of EMI power supply filters with same specification. The device comprises a direct-current voltage stabilizing power supply, an EMI power supply filter, a connecting conducting wire and a temperature patrol instrument; and the filter to be tested is serially connected with the power supply through the conducting wire to form a test loop. The temperature patrol instrument measures and records surface temperature of the filter, and the difference between the highest surface temperature of the filter and the ambient room temperature is the temperature rising. For a direct-current power supply filter, the loading current I is equal to Ie, and for an alternative-current power supply filter, the loading current I is equal to 1.4Ie. Due to adopting the method, the efficiency is greatly improved, a great amount of cost is saved, the energy consumption of the temperature-rise test is remarkably reduced, a great amount of cost and resources can be saved, the test process is simple and convenient to operate, and safety and practicability can be realized.
Description
Technical field
The invention belongs to Electronic Testing and field of measuring technique, particularly a kind of EMI power-supply filter temperature-rise test device and method to same specification EMI power-supply filter in enormous quantities.
Background technology
Along with modern electronic technology is fast-developing, the Electro Magnetic Compatibility of electronic equipment seems more and more important, also in each class of electronic devices, obtain a wide range of applications as the EMI power-supply filter that suppresses electromagnetic interference (EMI), also the Performance Detection of EMI power-supply filter is had higher requirement simultaneously.The EMI power-supply filter mainly is comprised of inductance and electric capacity, and used inductance is the major loop of EMI power-supply filter, and the temperature rise of EMI power-supply filter can be thought what the thermal value by inductance caused.Classic method needs adaptive load to carrying out when the EMI power-supply filter is tested, large electric current (〉=energy consumption was higher when 20A) wave filter was tested, also there is certain potential safety hazard in alternating current supply filter (rated voltage is generally 250V, 440V) when testing, because the impedance phase of the power-supply filter of same specification model together, thereby for these characteristics, a kind of novel practical method of corresponding temperature rise test is proposed.
Summary of the invention
The object of the invention is to overcome the shortcoming of traditional detection means, for same specification model EMI power-supply filter in enormous quantities, a kind of low-power consumption is provided, accurately simulates EMI power-supply filter temperature-rise test device and the method for actual working state.
To achieve these goals, the technical solution adopted in the present invention is: EMI power-supply filter temperature-rise test device is characterized in that: comprise D.C. regulated power supply, connect wire, EMI power-supply filter, temperature polling instrument; D.C. regulated power supply is electrically connected with the EMI power-supply filter power end that is connected in series by connecting wire, temperature polling instrument be connected with a plurality of temperature sensors of measuring the EMI power-supply filter be connected in series, each surface of temperature sensor and the EMI power-supply filter that is connected in series is connected, measure, the surface temperature of record EMI power-supply filter, the temperature sensor that also comprises an ambient room temperature, be used for the measurement environment room temperature, the maximum surface temperature of EMI power-supply filter and the difference of ambient room temperature are the temperature rise of EMI power-supply filter, for DC wave filter, its loading current I=Ie, for alternating current supply filter, its loading current I=1.4Ie.
Described D.C. regulated power supply is WYK-6050 type dc current regulator power supply or WYK-30200 type dc current regulator power supply, links to each other with being connected wire between Switching Power Supply output wiring terminal and the wave filter.
The output terminal short circuit that the described EMI power-supply filter that is connected in series is last connects from beginning to end with wire between the wave filter, forms series loop.
Described temperature polling instrument is XMD-60Y liquid crystal temperature logging, and sensor front end directly contacts with the casing of filter surface during temperature survey, take maximum temperature as the filter table surface temperature.
EMI power-supply filter temperature-raising experimental method is characterized in that: the output voltage knob of rotation D.C. regulated power supply, until output current is the required electric current of test, at this moment output voltage is the total pressure drop of the EMI power-supply filter of participating in test; Total pressure drop can obtain the pressure drop parameter of single wave filter divided by the wave filter quantity of participating in the experiment.Recorded once in per 30 minutes behind the current load, until EMI power-supply filter surface temperature no longer raises and reaches till the thermal equilibrium, the maximum surface temperature of EMI power-supply filter and the difference of ambient room temperature are the temperature rise of EMI power-supply filter.
Advantage of the present invention is to improve the efficient of the temperature rise test of same specification EMI power-supply filter in enormous quantities, has saved a large amount of costs, significantly reduces the energy consumption of temperature rise test, makes process of the test easy and simple to handle, and is safe and practical.
Description of drawings
Below in conjunction with accompanying drawing by embodiment is described in detail the present invention.
Fig. 1 is structural representation in the embodiment of the invention;
Fig. 2 is three-phase and four-line wave filter wiring schematic diagram;
Fig. 3 is phase three-wire three wave filter wiring schematic diagram.
Among the figure: 1, D.C. regulated power supply; 2, connect wire; 3, EMI power-supply filter; 4, temperature polling instrument.
Embodiment
As shown in Figure 1, a kind of EMI power-supply filter temperature rise test practical approach comprises D.C. regulated power supply 1, connects wire 2, EMI power-supply filter 3, temperature polling instrument 4; D.C. regulated power supply 1 is electrically connected with EMI power-supply filter 3 power ends that are connected in series by connecting wire 2, temperature polling instrument 4 be connected with a plurality of temperature sensors of measuring the EMI power-supply filter 3 be connected in series, temperature sensor is connected with EMI power-supply filter 3 each surface that are connected in series, measure, the surface temperature of record EMI power-supply filter 3, the temperature sensor that also comprises an ambient room temperature, be used for the measurement environment room temperature, the maximum surface temperature of EMI power-supply filter 3 and the difference of ambient room temperature are the temperature rise of EMI power-supply filter 3, for DC wave filter, its loading current I=Ie, for alternating current supply filter, its loading current I=1.4Ie.
EMI power-supply filter temperature-raising experimental method, the output voltage knob of rotation D.C. regulated power supply 1, until output current is the required electric current of test, at this moment output voltage is the total pressure drop of the EMI power-supply filter 3 of participating in test; Total pressure drop can obtain the pressure drop parameter of single wave filter divided by the wave filter quantity of participating in the experiment.Recorded once in per 30 minutes behind the current load, until EMI power-supply filter 3 surface temperatures no longer raise and reach till the thermal equilibrium, the maximum surface temperature of EMI power-supply filter 3 and the difference of ambient room temperature are the temperature rise of EMI power-supply filter 3.
D.C. regulated power supply 1 is selected: measuring current I＜50A selects WYK-6050 type dc current regulator power supply power supply.Measuring current 50A≤I＜200A selects WYK-30200 type dc current regulator power supply power supply.
The DC wave filter test current
For DC wave filter, its heating power P=Ie
2* RDC
Wherein Ie is the wave filter rated current of participating in the experiment
RDC is the enameled wire direct current resistance of the interior inductance that assembles of wave filter
Therefore when loading current was identical, the heating power of wave filter was identical, can test under low-voltage, current state, not be used under the rated voltage adaptive load and tested, and significantly reduced energy consumption.
Single-phase alternating current source filter test current
For the single-phase alternating current source filter, if utilize DC current to come equivalent alternating current, what need to consider has two factors, the AC resistance RAC that (1) enameled wire generates because of skin effect, a RAC=0.076*r*f
1/2* RDC; (2) core loss of inductance mainly is the core loss of differential mode inductance, P=K* f
α* B
β
Wherein r is the radius of enameled wire
F is the wave filter rated frequency of participating in the experiment
K is the core loss coefficient
α frequency loss coefficient
β flux loss coefficient
By calculating single-phase alternating current source filter test current I=1.4Ie
3.Three-phase alternating current source filter test current
Three-phase alternating current source filter test current mode of connection as shown in Figure 2 and as shown in Figure 3, Fig. 2 is the three-phase and four-line wave filter, Fig. 3 is phase three-wire three wave filter mode of connection.The three-phase alternating current source filter, its test current is with the identical I=1.4Ie of single-phase alternating current source filter.
The parts that present embodiment is not described in detail and structure belong to well-known components and common structure or the conventional means of the industry, here not one by one narration.
Claims (5)
1.EMI the power-supply filter temperature-rise test device is characterized in that: comprise D.C. regulated power supply (1), connect wire (2), EMI power-supply filter (3), temperature polling instrument (4); D.C. regulated power supply (1) is electrically connected with EMI power-supply filter (3) power end that is connected in series by connecting wire (2), temperature polling instrument (4) be connected with a plurality of temperature sensors of measuring the EMI power-supply filter (3) be connected in series, each surface of temperature sensor and the EMI power-supply filter (3) that is connected in series is connected, measure, the surface temperature of record EMI power-supply filter (3), the temperature sensor that also comprises an ambient room temperature, be used for the measurement environment room temperature, the maximum surface temperature of EMI power-supply filter (3) and the difference of ambient room temperature are the temperature rise of EMI power-supply filter (3), for DC wave filter, its loading current I=Ie, for alternating current supply filter, its loading current I=1.4Ie.
2. EMI power-supply filter temperature-rise test device according to claim 1, it is characterized in that: described D.C. regulated power supply (1) is WYK-6050 type dc current regulator power supply or WYK-30200 type dc current regulator power supply, links to each other with being connected wire between Switching Power Supply output wiring terminal and the wave filter.
3. EMI power-supply filter temperature-rise test device according to claim 1 is characterized in that: a last output terminal short circuit of the described EMI power-supply filter (3) that is connected in series, connect from beginning to end with wire between the wave filter, and form series loop.
4. EMI power-supply filter temperature-rise test device according to claim 1, it is characterized in that: described temperature polling instrument (4) is XMD-60Y liquid crystal temperature logging, sensor front end directly contacts with the casing of filter surface during temperature survey, take maximum temperature as the filter table surface temperature.
5.EMI the power-supply filter temperature-raising experimental method is characterized in that: the output voltage knob of rotation D.C. regulated power supply (1), until output current is the required electric current of test, at this moment output voltage is the total pressure drop of the EMI power-supply filter (3) of participating in test; Total pressure drop can obtain the pressure drop parameter of single wave filter divided by the wave filter quantity of participating in the experiment; Per 30 minutes records once behind the current load, until EMI power-supply filter (3) surface temperature no longer raises and reaches till the thermal equilibrium, the maximum surface temperature of EMI power-supply filter (3) and the difference of ambient room temperature are the temperature rise of EMI power-supply filter (3).
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113533873A (en) * | 2020-04-21 | 2021-10-22 | 株洲中车时代电气股份有限公司 | Testing device and method for cable temperature rise test |
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| CN2171911Y (en) * | 1993-08-04 | 1994-07-13 | 杭州鸿雁电器公司 | Push-button switch |
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| CN102175939A (en) * | 2011-01-25 | 2011-09-07 | 国网电力科学研究院 | Power capacitor temperature rise test method |
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| CN113533873A (en) * | 2020-04-21 | 2021-10-22 | 株洲中车时代电气股份有限公司 | Testing device and method for cable temperature rise test |
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Application publication date: 20130227 |