CN203037753U - EMI power filter temperature rise test device - Google Patents
EMI power filter temperature rise test device Download PDFInfo
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- CN203037753U CN203037753U CN 201220603227 CN201220603227U CN203037753U CN 203037753 U CN203037753 U CN 203037753U CN 201220603227 CN201220603227 CN 201220603227 CN 201220603227 U CN201220603227 U CN 201220603227U CN 203037753 U CN203037753 U CN 203037753U
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- temperature
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- supply
- emi
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- 238000005259 measurement Methods 0.000 claims abstract description 4
- 230000001105 regulatory Effects 0.000 claims description 11
- 239000004973 liquid crystal related substance Substances 0.000 claims description 2
- 238000005265 energy consumption Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 abstract 2
- 238000011105 stabilization Methods 0.000 abstract 1
- 230000003044 adaptive Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 210000003491 Skin Anatomy 0.000 description 1
- 230000000875 corresponding Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
Abstract
The utility model belongs to the technical field of electronic test and measurement and especially relates to an EMI power filter temperature rise test device for testing the temperature rise of a large batch of EMI power filters of the same specification. The device comprises a direct-current voltage stabilization power supply, EMI power filters, a connecting wire and a temperature inspection instrument, wherein the filters to be tested are connected in series with the wire through the power supply to form a test loop. The temperature inspection instrument measures and records the surface temperatures of the filters, and the difference of the maximum surface temperature of each filter and the ambient room temperature is the temperature rise of the filter. For a direct-current power supply filter, the loading current I is equal to Ie; and for an alternating-current power supply filter, the loading current I is equal to 1.4 times of Ie. Due to the adoption of the method, the efficiency is greatly improved, a lot of cost is saved, the energy consumption of the temperature rise test is significantly reduced, a lot of cost and resources are saved, operations in the test process are simple, and the device is safe and practical.
Description
Technical field
The utility model belongs to Electronic Testing and field of measuring technique, particularly a kind of EMI power-supply filter temperature rise test device to same specification EMI power-supply filter in enormous quantities.
Background technology
Along with the modern electronic technology fast development, the Electromagnetic Compatibility of Power Electronics performance seems more and more important, also in each class of electronic devices, obtained to use widely as the EMI power-supply filter that suppresses electromagnetic interference (EMI), also the Performance Detection of EMI power-supply filter has been had higher requirement simultaneously.The EMI power-supply filter mainly is made up of inductance and electric capacity, and used inductance is the major loop of EMI power-supply filter, and the temperature rise of EMI power-supply filter can be thought what the thermal value by inductance caused.Classic method needs adaptive load to carrying out when the EMI power-supply filter is tested, big electric current (〉=energy consumption was higher when 20A) wave filter was tested, also there is certain potential safety hazard in alternating current supply filter (rated voltage is generally 250V, 440V) when testing, because the impedance phase of the power-supply filter of same specification model together, thereby at these characteristics, a kind of novel practical method of corresponding temperature rise test is proposed.
The utility model content
The purpose of this utility model is to overcome the shortcoming of traditional detection means, at same specification model EMI power-supply filter in enormous quantities, a kind of low-power consumption is provided, accurately simulates the EMI power-supply filter temperature rise test device of actual working state.
To achieve these goals, the technical scheme that the utility model adopts is: EMI power-supply filter temperature rise test device is characterized in that: comprise D.C. regulated power supply, connect lead, EMI power-supply filter, temperature polling instrument; D.C. regulated power supply is electrically connected with the EMI power-supply filter power end that is connected in series by connecting lead, temperature polling instrument is connected with a plurality of temperature sensors of measuring the EMI power-supply filter that is connected in series, each surface of temperature sensor and the EMI power-supply filter that is connected in series is connected, measure, the surface temperature of record EMI power-supply filter, the temperature sensor that also comprises an ambient room temperature, be used for the measurement environment room temperature, the maximum surface temperature of EMI power-supply filter and the difference of ambient room temperature are the temperature rise of EMI power-supply filter, for DC wave filter, its loading current I=Ie, for alternating current supply filter, its loading current I=1.4Ie.
[0005]Described D.C. regulated power supply is WYK-6050 type dc current regulator power supply or WYK-30200 type dc current regulator power supply, links to each other with being connected lead between Switching Power Supply output wiring terminal and the wave filter.
The output terminal short circuit that the described EMI power-supply filter that is connected in series is last connects from beginning to end with lead between the wave filter, forms series loop.
Described temperature polling instrument is XMD-60Y liquid crystal temperature logging, and sensor front end directly contacts with the wave filter surface of shell during temperature survey, is the filter table surface temperature with the maximum temperature.
The utility model has the advantages that the efficient of the temperature rise test that improves same specification EMI power-supply filter in enormous quantities, saved a large amount of costs, significantly reduce the energy consumption of temperature rise test, make process of the test easy and simple to handle, safe and practical.
Description of drawings
Below in conjunction with accompanying drawing by embodiment is described in detail the utility model.
Fig. 1 is structural representation among the utility model embodiment;
Fig. 2 is three-phase and four-line wave filter wiring schematic diagram;
Fig. 3 is phase three-wire three wave filter wiring schematic diagram.
Among the figure: 1, D.C. regulated power supply; 2, connect lead; 3, EMI power-supply filter; 4, temperature polling instrument.
Embodiment
As shown in Figure 1, a kind of EMI power-supply filter temperature rise test device comprises D.C. regulated power supply 1, connects lead 2, EMI power-supply filter 3, temperature polling instrument 4; D.C. regulated power supply 1 is electrically connected with EMI power-supply filter 3 power ends that are connected in series by connecting lead 2, temperature polling instrument 4 is connected with a plurality of temperature sensors of measuring the EMI power-supply filter 3 that is connected in series, temperature sensor is connected with EMI power-supply filter 3 each surface that are connected in series, measure, the surface temperature of record EMI power-supply filter 3, the temperature sensor that also comprises an ambient room temperature, be used for the measurement environment room temperature, the maximum surface temperature of EMI power-supply filter 3 and the difference of ambient room temperature are the temperature rise of EMI power-supply filter 3, for DC wave filter, its loading current I=Ie, for alternating current supply filter, its loading current I=1.4Ie.
EMI power-supply filter temperature-raising experimental method, the output voltage knob of rotation D.C. regulated power supply 1 is the required electric current of test until output current, at this moment output voltage is the total pressure drop of the EMI power-supply filter 3 of participating in test; Total pressure drop can obtain the pressure drop parameter of single wave filter divided by the wave filter quantity of participating in the experiment.Electric current loads the per 30 minutes records in back once, until EMI power-supply filter 3 surface temperatures no longer raise and reach till the thermal equilibrium, the maximum surface temperature of EMI power-supply filter 3 and the difference of ambient room temperature are the temperature rise of EMI power-supply filter 3.
D.C. regulated power supply 1 is selected for use: measuring current I＜50A selects WYK-6050 type dc current regulator power supply power supply for use.Measuring current 50A≤I＜200A selects WYK-30200 type dc current regulator power supply power supply for use.
The DC wave filter test current
For DC wave filter, its heating power P=Ie
2* RDC
Wherein Ie is the wave filter rated current of participating in the experiment
RDC is the enameled wire direct current resistance of the interior inductance that assembles of wave filter
Therefore when loading current was identical, the heating power of wave filter was identical, can test under low-voltage, current state, not be used under the rated voltage adaptive load and tested, and significantly cut down the consumption of energy.
Single-phase alternating current source filter test current
For the single-phase alternating current source filter, if utilize DC current to come equivalent alternating current, what need to consider has two factors, the AC resistance RAC that (1) enameled wire generates because of skin effect, a RAC=0.076*r*f
1/2* RDC; (2) core loss of inductance mainly is the core loss of differential mode inductance, P=K* f
α* B
β
Wherein r is the radius of enameled wire
F is the wave filter rated frequency of participating in the experiment
K is the core loss coefficient
α frequency loss coefficient
β flux loss coefficient
By calculating single-phase alternating current source filter test current I=1.4Ie.
Three-phase alternating current source filter test current
Three-phase alternating current source filter test current mode of connection as shown in Figure 2 and as shown in Figure 3, Fig. 2 is the three-phase and four-line wave filter, Fig. 3 is phase three-wire three wave filter mode of connection.The three-phase alternating current source filter, its test current is with the identical I=1.4Ie of single-phase alternating current source filter.
The parts that present embodiment is not described in detail and structure belong to well-known components and common structure or the conventional means of the industry, here not narration one by one.
Claims (4)
1.EMI power-supply filter temperature rise test device is characterized in that: comprise D.C. regulated power supply (1), connect lead (2), EMI power-supply filter (3), temperature polling instrument (4); D.C. regulated power supply (1) is electrically connected with EMI power-supply filter (3) power end that is connected in series by connecting lead (2), temperature polling instrument (4) is connected with a plurality of temperature sensors of measuring the EMI power-supply filter (3) that is connected in series, each surface of temperature sensor and the EMI power-supply filter (3) that is connected in series is connected, measure, the surface temperature of record EMI power-supply filter (3), the temperature sensor that also comprises an ambient room temperature, be used for the measurement environment room temperature, the maximum surface temperature of EMI power-supply filter (3) and the difference of ambient room temperature are the temperature rise of EMI power-supply filter (3), for DC wave filter, its loading current I=Ie, for alternating current supply filter, its loading current I=1.4Ie.
2. EMI power-supply filter temperature rise test device according to claim 1, it is characterized in that: described D.C. regulated power supply (1) is WYK-6050 type dc current regulator power supply or WYK-30200 type dc current regulator power supply, links to each other with being connected lead between Switching Power Supply output wiring terminal and the wave filter.
3. according to claim 1 EMI power-supply filter temperature rise test device, it is characterized in that: a last output terminal short circuit of the described EMI power-supply filter (3) that is connected in series, connect from beginning to end with lead between the wave filter, form series loop.
4. according to claim 1EMI power-supply filter temperature rise test device, it is characterized in that: described temperature polling instrument (4) is XMD-60Y liquid crystal temperature logging, sensor front end directly contacts with the wave filter surface of shell during temperature survey, is the filter table surface temperature with the maximum temperature.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220603227 CN203037753U (en) | 2012-11-15 | 2012-11-15 | EMI power filter temperature rise test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220603227 CN203037753U (en) | 2012-11-15 | 2012-11-15 | EMI power filter temperature rise test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203037753U true CN203037753U (en) | 2013-07-03 |
Family
ID=48689864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220603227 Expired - Fee Related CN203037753U (en) | 2012-11-15 | 2012-11-15 | EMI power filter temperature rise test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203037753U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944792A (en) * | 2012-11-15 | 2013-02-27 | 西安开容电子技术有限责任公司 | Electromagnetic interference (EMI) power supply filter temperature-rise test device and method |
-
2012
- 2012-11-15 CN CN 201220603227 patent/CN203037753U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944792A (en) * | 2012-11-15 | 2013-02-27 | 西安开容电子技术有限责任公司 | Electromagnetic interference (EMI) power supply filter temperature-rise test device and method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130703 Termination date: 20141115 |
|
| EXPY | Termination of patent right or utility model |