CN102890401B - Shutter delay measurement system for cameras - Google Patents
Shutter delay measurement system for cameras Download PDFInfo
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- CN102890401B CN102890401B CN201210327246.0A CN201210327246A CN102890401B CN 102890401 B CN102890401 B CN 102890401B CN 201210327246 A CN201210327246 A CN 201210327246A CN 102890401 B CN102890401 B CN 102890401B
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Abstract
The invention provides a shutter delay measurement system for cameras, and aims to solve the problem of asynchronous exposure in the process of splicing a plurality of cameras. The system consists of a camera to be measured (1), a constant-speed rotating disc (2) with a slit, a photoelectric geminate transistor (3), a master control central processing unit (CPU) (4), a controllable switch (5) and a uniform coded disc (6), wherein the disc rotates at constant speed, the master control CPU counts each time when the slit of the disc passes through the photoelectric geminate transistor, and sends a photo taking instruction to the controllable switch when times is equal to N, and a photo is taken. An exposure starting point is the position of the photoelectric geminate transistor, so that the delay and shutter time of each camera can be measured according to the position and smear of the slit after an image is formed, reference is provided for synchronous exposure control of the cameras, and the system is suitable for the field of multi-camera splicing.
Description
Technical field
The present invention relates to the technical field of camera shutter, be specifically related to a kind of camera shutter delay measurement system, be applicable to polyphaser Large visual angle splicing field.
Background technology
In recent years, along with the development of science and technology, civil camera image quality is become better and better, weight is more and more lighter, researchist carries out the aerial camera development of independent intellectual property right on the one hand, the direct civil camera by maturation is transformed on the one hand, making it to directly apply to aerial survey and investigation, when requiring the camera of Large visual angle, just needing the camera of two or more to combine according to certain angle.
Civil camera exposure time delay is subject to the impact of single camera internal hardware and acquisition parameters (shutter speed, F number and ISO etc.).In polyphaser splicing, the acquisition parameters of each camera is the same, so just only needs preset parameter, measures the delay time of each camera, in the process of taking pictures, apply compensation of delay, reach the accuracy requirement of synchronism, for successive image splicing provides reference.
Because normal domestic camera is taken pictures, from send photographing instruction to exposure, time delay is different, so just need a kind of device to measure the exposure time delay of each camera, for synchronism compensate foundation is provided.Classic method utilizes oscillograph multichannel measurement exposure signal.After control signal pulse sends, can measure response signal time relationship with it and accurately measure delay time, as Fig. 1, time delay T can directly be read by oscillograph.But civil camera internal circuit is complicated, and response signal cannot directly obtain.
Summary of the invention
Object of the present invention is exactly the limitation for prior art, provides a kind of camera shutter delay measurement system, and this system, in polyphaser splicing system, compensates fast gate delay, for synchronously exposure provides foundation.
The technical solution used in the present invention is: a kind of camera shutter delay measurement system, this system is by camera to be measured, band slit at the uniform velocity rotating circular disk, photoelectric tube, master cpu, gate-controlled switch and even code-disc composition, described band slit at the uniform velocity rotating circular disk uniform rotation, its slit is often through a photoelectric tube, master cpu once counts, when number of times equals N, master cpu sends photographing instruction to gate-controlled switch, namely once photo taking is carried out, because exposure starting point is exactly the position that photoelectric tube is corresponding on even code-disc after imaging, time delay T and the aperture time t of each camera to be measured can be measured according to the position of slit in imaging and slit smear, code-disc lattice number is directly read by even code-disc, band slit at the uniform velocity rotating circular disk rotating speed is M revolutions per second, code-disc has n lattice, then after imaging, the time of each correspondence is 1/ (M × n) second, if read T to comprise a lattice, then the shutter number this time recorded is T=a/ (M × n), and the time delay Δ t of measuring system itself is fixing, directly can be measured by oscillograph, obtain so the time delay of single shot can pass through simple computation (T-Δ t).
Wherein, at the uniform velocity rotating circular disk is coaxial for described even code-disc and described band slit.
Wherein, described camera to be measured is controlled to take pictures by gate-controlled switch.
Wherein, the low and high level that described gate-controlled switch can be sent by master cpu controls break-make.
Wherein, described code-disc scale and described band slit at the uniform velocity rotating circular disk rotating speed require to arrange according to measuring accuracy.
Wherein, described counts N can according to camera to be measured take pictures frame rate requirement arrange.
The present invention's beneficial effect is compared with prior art:
(1), in the present invention disc rotation speed and code-disc scale adjustable, meet different measuring accuracy requirements;
(2), in the present invention CPU counts N is adjustable, can meet difference and to take pictures the test request of frame frequency;
(3), the present invention can be directly used in shutter accuracy and measure, and without the need to obtaining inner exposure signal, directly take pictures to moving target, solving camera lens and shutter in classic method needs to be separated the drawback that could use photoelectric device measurement shutter.
Accompanying drawing explanation
Fig. 1 is traditional measurement signal timing diagram;
Fig. 2 is structural representation of the present invention;
Fig. 3 is principle of the invention key diagram;
Fig. 4 is present system Time delay measurement sequential chart.
Embodiment
The present invention is further illustrated below in conjunction with the drawings and specific embodiments.
As Fig. 2, this system is by camera 1 to be measured, and band slit at the uniform velocity rotating circular disk 2, photoelectric tube 3, master cpu 4, gate-controlled switch 5 and even code-disc 6 form.Disk 2 uniform rotation, its slit is often through a photoelectric tube 3, and master cpu 4 once counts, and when number of times equals N, master cpu 4 sends photographing instruction to gate-controlled switch 5, namely carries out once photo taking.Due to the position that exposure starting point is exactly photoelectric tube 3, after imaging, the delay time of each camera to be measured can be measured according to the position of slit in imaging.
The concrete model of camera 1(to be measured such as LEICAX1), band slit at the uniform velocity rotating disk 2 by stepper motor 256 times segment after according to one second two turns of Rotating with Uniform, meet accuracy requirement, circumference is divided into 1000 equal portions by even code-disc 6, namely can be regarded as to obtain the corresponding 0.5ms of a scale according to rotating speed.Photoelectric tube 3 adopts 5V power supply, blocking output is 0, do not block and export 3.3V level, master cpu 4 selects NXP P89LPC952 type single-chip microcomputer, and external interrupt 0 exports with photoelectric tube 3 and is connected, for counting, due to camera shooting frame frequency to be measured restriction, N at least needs to get 6, and namely rotating disk 2 uniform rotation at least 6 circle is taken pictures once, and repetitive measurement goes out delay value.Test is carried out under daylight lamp condition.
By Fig. 3, angle (i.e. code-disc lattice number) is directly read by even code-disc 6, and such as disc rotation speed is 2 revolutions per seconds, and code-disc has 1000 lattice, then after imaging, the time of each correspondence is 0.5ms.If read T to comprise a lattice, then the shutter number this time recorded is T=0.5ams.
The time delay of measuring system itself is fixing, directly can be measured by oscillograph, as Fig. 4, control signal is that system sends photographing instruction, measuring-signal is the response signal of photoelectric tube, Δ t can directly be read by oscillograph, obtains so the time delay of single shot can pass through simple computation (T-Δ t).Need repetitive measurement to try to achieve average and variance, average can be eliminated by compensation of delay.
The above; be only the embodiment in the present invention; but protection scope of the present invention is not limited thereto, any local of people in the technical scope disclosed by the present invention being familiar with this technology is revised or is replaced, and all should be encompassed in of the present invention comprising within scope.
Claims (6)
1. a camera shutter delay measurement system, it is characterized in that: this system is by camera to be measured (1), band slit at the uniform velocity rotating circular disk (2), photoelectric tube (3), master cpu (4), gate-controlled switch (5) and even code-disc (6) composition, described band slit is rotating circular disk (2) uniform rotation at the uniform velocity, its slit is often through a photoelectric tube (3), master cpu (4) once counts, when number of times equals N, master cpu (4) sends photographing instruction to gate-controlled switch (5), namely once photo taking is carried out, due to exposure starting point be exactly after imaging photoelectric tube (3) in the upper corresponding position of even code-disc (6), time delay T and the aperture time t of each camera to be measured can be measured according to the position of slit in imaging and slit smear, code-disc lattice number is directly read by even code-disc (6), band slit at the uniform velocity rotating circular disk (2) rotating speed is M revolutions per second, code-disc has n lattice, then after imaging, the time of each correspondence is 1/ (M × n) second, if read T to comprise a lattice, then the time delay this time recorded is T=a/ (M × n), and the time delay Δ t of measuring system itself is fixing, directly measured by oscillograph, obtain so the time delay of single shot can pass through simple computation (T-Δ t).
2. camera shutter delay measurement system according to claim 1, is characterized in that: described even code-disc (6) and described band slit at the uniform velocity rotating circular disk (2) are coaxial.
3. camera shutter delay measurement system according to claim 1, is characterized in that: described camera to be measured (1) is controlled to take pictures by gate-controlled switch (5).
4. camera shutter delay measurement system according to claim 1, is characterized in that: the low and high level that described gate-controlled switch (5) is sent by master cpu (4) controls break-make.
5. camera shutter delay measurement system according to claim 1, is characterized in that: described code-disc (6) scale and described band slit at the uniform velocity rotating circular disk (2) rotating speed require to arrange according to measuring accuracy.
6. camera shutter delay measurement system according to claim 1, is characterized in that: described counts N according to camera to be measured take pictures frame rate requirement arrange.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210327246.0A CN102890401B (en) | 2012-09-06 | 2012-09-06 | Shutter delay measurement system for cameras |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210327246.0A CN102890401B (en) | 2012-09-06 | 2012-09-06 | Shutter delay measurement system for cameras |
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| CN102890401A CN102890401A (en) | 2013-01-23 |
| CN102890401B true CN102890401B (en) | 2015-01-21 |
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| CN201210327246.0A Expired - Fee Related CN102890401B (en) | 2012-09-06 | 2012-09-06 | Shutter delay measurement system for cameras |
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Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103336405A (en) * | 2013-07-09 | 2013-10-02 | 中国科学院光电技术研究所 | Improved shutter delay measurement system |
| CN103345100A (en) * | 2013-07-09 | 2013-10-09 | 中国科学院光电技术研究所 | Improved aviation camera focusing system |
| CN104792495A (en) * | 2015-04-30 | 2015-07-22 | 信利光电股份有限公司 | Testing method of closing time and starting time of module shutter |
| CN107271162B (en) * | 2017-06-14 | 2019-06-25 | 东华大学 | A kind of time-division combined positioning method for spindle ingot end oscillation trajectory measuring system |
| CN107087120B (en) * | 2017-06-22 | 2019-07-12 | 中国科学院计算技术研究所 | It is a kind of for synchronizing the method and system of more CCD cameras |
| CN109506900B (en) * | 2018-11-05 | 2023-11-14 | 苏州工业职业技术学院 | Imaging frame rate detection system and detection method for near infrared camera |
| CN110505473B (en) * | 2019-08-08 | 2024-01-19 | 圆周率科技(常州)有限公司 | System for testing exposure time of camera equipment |
| CN113438473B (en) * | 2021-06-25 | 2022-05-10 | 广州极飞科技股份有限公司 | Method and device for testing camera shutter lag time and terminal equipment |
| CN114441137A (en) * | 2022-01-12 | 2022-05-06 | 上海宏景智驾信息科技有限公司 | Camera time delay measuring system and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2005148380A (en) * | 2003-11-14 | 2005-06-09 | Nikon Corp | Shutter inspecting device for camera |
| CN201408324Y (en) * | 2009-04-29 | 2010-02-17 | 重庆师范大学 | Camera shutter test instrument |
| CN102508407A (en) * | 2011-11-04 | 2012-06-20 | 北京航空航天大学 | Device for detecting time response of full frame transfer type CCD (Charge Coupled Device) mechanical shutter |
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2012
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005148380A (en) * | 2003-11-14 | 2005-06-09 | Nikon Corp | Shutter inspecting device for camera |
| CN201408324Y (en) * | 2009-04-29 | 2010-02-17 | 重庆师范大学 | Camera shutter test instrument |
| CN102508407A (en) * | 2011-11-04 | 2012-06-20 | 北京航空航天大学 | Device for detecting time response of full frame transfer type CCD (Charge Coupled Device) mechanical shutter |
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