CN102865847B - Spline curve compensation method for measuring profile deviation based on path unit - Google Patents
Spline curve compensation method for measuring profile deviation based on path unit Download PDFInfo
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- CN102865847B CN102865847B CN201210381392.1A CN201210381392A CN102865847B CN 102865847 B CN102865847 B CN 102865847B CN 201210381392 A CN201210381392 A CN 201210381392A CN 102865847 B CN102865847 B CN 102865847B
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Abstract
The invention belongs to the technical field of numerical control machining, and particularly relates to a spline curve compensation method for measuring profile deviation based on a path unit. The method comprises the following steps: selecting profile measurement points, measuring the profile measurement points one by one, and calculating the deviations between the measurement data of the measurement points and the standard profile data; mapping the calculated deviation data of the measurement points to a coordinate system, and connecting the deviation data points together with a spline curve; acquiring the deviation value of each of machining points from the spline curve; and compensating the deviation values to corresponding path points. According to the invention, the path unit is used as the object and the mode of spline error compensation is used to effectively avoid unsmooth inflection points of the path caused by a linear method, so that a compensation path can be more smooth, the high-precision and high-speed machining requirements can be met, a better surface effect can be acquired, and the path compensation can be carried out on a work piece with relatively large deformation; and the method is simple and easy to use, the programming efficiency is high, and the production cost can be effectively lowered.
Description
Technical field
The invention belongs to CNC processing technology field, particularly a kind of SPL compensation method of the measurement profile variation based on path unit.
Background technology
During the contour machinings such as chamfering, for ensureing machining precision and the consistance of product batch machining, particular jig is usually selected to position; This locator meams, all very high to the requirement of fixture and operator, if there is position or angular deviation, or workpiece stress deformation, the product processed just there will be the quality problems such as chamfering width is inconsistent, have impact on the qualification rate of product aesthetics and product.What require along with Product Precision improves constantly, there is profile measurement compensation technique in the basis of fixture location, namely after product orientation clamping, measurements and calculations are carried out to the profile of product, then compensate in machining path by measuring the deviation data obtained, thus ensure the machining precision of product, improve qualification rate and the product quality of product.
At present, digital control system generally adopts the realization of macroprogram method to the path compensation measuring profile, due to the restriction by program itself, macroprogram can not contact between each measurement point of overall thinking when calculating, the calculating between adjacent two measurement points can only be carried out, therefore, its graph of errors only can carry out in a linear fashion.Like this when relatively large deviation appears in absolute fix and reference position, the path flex point of minute shape may be there is at measured node place, cause adding and occur rib at finished surface man-hour, have impact on surface quality.For reducing the appearance of flex point, just needing to take to increase measurement point or control supplied materials deflection and improve the means such as frock precision to reduce departure, virtually adding production cost; In addition, in the debug phase at technique initial stage, usually need repeatedly to debug macroprogram, this not only requires higher to technician, and length consuming time, and cost is high.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, providing a kind of take path unit as the parameter setting method of object, not only can eliminate path flex point, and ensure machined surface quality, and be simple and easy to use, programming efficiency is high, effectively reduces production cost.
In order to solve the problems of the technologies described above, the present invention is achieved by the following technical solutions.
Based on a SPL compensation method for the measurement profile variation of path unit, comprise the following steps:
A. selected some profile measurement points are measured one by one, and calculate the deviation of each measurement point measurement data and reference profile data respectively;
B. each point deviation data calculated is mapped in coordinate system, and adopts SPL to be coupled together at each variation strong point, generate a batten deviation curve;
C. the deviate of each processing stand is obtained from batten deviation curve;
D. the deviate of each processing stand obtained is compensated in corresponding path point.
Preferably, in described step B, smooth in any position for guaranteeing the path after compensating, the optional position of described SPL is cut and is vowed continuously.
Compared with prior art, beneficial effect of the present invention is: the present invention take path unit as object, adopt the mode of batten error compensation, effectively prevent the rough path flex point that linear method causes, compensating for path is fairing more, meet high-precision high-speed processing request, obtain better surface effect simultaneously, the path compensation to moderate finite deformation amount workpiece can be completed; And be simple and easy to use, programming efficiency is high, effectively reduces production cost.
Accompanying drawing explanation
Fig. 1 is the schematic flow sheet of measurement profile variation SPL provided by the invention compensation method.
Fig. 2 is the measurement data schematic diagram of the profile measurement point that the embodiment of the present invention provides.
Fig. 3 is that the embodiment of the present invention is used for the schematic diagram of the computing method explaining measurement point measurement data and reference profile data deviation.
Fig. 4 is the schematic diagram of the generation batten deviation curve that the embodiment of the present invention provides.
Fig. 5 is the machining path schematic diagram before and after the compensation that provides of the embodiment of the present invention.
Embodiment
Below in conjunction with accompanying drawing and embodiment, the present invention is described in further detail.
As shown in Figure 1, the SPL compensation method of the measurement profile variation based on path unit of the present invention, comprises the following steps:
Step 101, selected profile measurement point is measured one by one, and calculates the deviation of each measurement point measurement data and reference profile data.
Fig. 2 shows the schematic diagram to a square cross profile measurement, and baseline profile curve S 1 have selected ten measurement points, and point 1 to point 10 is respectively the position that ten measurement point actual measurements go out.
Fig. 3 explains the computing method of measurement point measurement data and reference profile data deviation, i.e. deviate △ ε=± actual spot of measurement to the vertical range of baseline profile curve, measurement point be positioned at outside baseline profile get on the occasion of, be positioned at inner side get negative value.
Step 102, is mapped to each point deviation data calculated in coordinate system, and adopts SPL to be coupled together at each variation strong point, generates a batten deviation curve.
As shown in Figure 4, coordinate is laterally defined as the expanded position of product profile each point, and namely horizontal line S1 ' represents the evolute of baseline profile curve S 1; Coordinate is longitudinally defined as the departure of measurement data.According to the deviate that step 101 calculates, corresponding coordinate points is found in the position corresponding respectively to measurement point 1 to 10, then couples together with SPL M.Meanwhile, play end point when generating for avoiding SPL M and cut and vow the inconsistent and processing effect at Influential cases 1 place, arrow adjustment is cut to the first and last point of SPL M, first and last point is cut and vows continuously.
Step 103, obtains the deviate of each processing stand from batten deviation curve M.
Step 104, compensates to the deviate of each processing stand obtained in step 103 in corresponding path point.
Fig. 5 shows the signal of the contour path before and after compensating.As shown in Figure 5, the baseline profile machining path that curve L1 generates for square cross, curve L1 ' is the actual machining path after compensating.
Although above to invention has been detailed description, the present invention is not limited thereto, those skilled in the art can carry out various amendment according to principle of the present invention.Therefore, all amendments done according to the principle of the invention, all should be understood to fall into protection scope of the present invention.
Claims (2)
1., based on the SPL compensation method of the measurement profile variation of path unit, it is characterized in that: comprise the steps:
A. selected some profile measurement points carry out on-line measurement one by one, and calculate the deviation of each measurement point measurement data and reference profile data respectively;
B. each point deviation data calculated is mapped in coordinate system, coordinate is laterally defined as the expanded position of workpiece profile each point, coordinate is longitudinally defined as the departure of measurement data, and adopts SPL to be coupled together at each variation strong point, generates a batten deviation curve;
C. the deviate of each processing stand is obtained from batten deviation curve;
D. the deviate of each processing stand obtained is compensated in corresponding path point.
2. the SPL compensation method of the measurement profile variation based on path unit according to claim 1, is characterized in that: the optional position of SPL described in step B is cut and vowed continuously.
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