CN102841285A - Alternating current mutual inductor detection circuit - Google Patents
Alternating current mutual inductor detection circuit Download PDFInfo
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- CN102841285A CN102841285A CN 201110171328 CN201110171328A CN102841285A CN 102841285 A CN102841285 A CN 102841285A CN 201110171328 CN201110171328 CN 201110171328 CN 201110171328 A CN201110171328 A CN 201110171328A CN 102841285 A CN102841285 A CN 102841285A
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Abstract
The invention discloses an alternating current mutual inductor detection circuit, which comprises a mutual inductor, wherein a first pin of the mutual inductor is connected with a detector through a fourth diode, a first resistor and a third resistor which are sequentially connected in series, a first diode is inversely connected between the first pin of the mutual inductor and the ground, a second pin of the mutual inductor is connected with the detector through a third diode, the first resistor and the third resistor which are sequentially connected in series, and a second diode is inversely connected between a second pin of the mutual inductor and the ground; and an electrolytic capacitor is connected between a connection terminal of the fourth diode and the third diode and the ground, a second resistor is connected between a connection terminal of the first diode and the third diode and the ground, a ceramic capacitor is connected between the detector and the ground, and a voltage-regulator diode is inversely connected between the detector and the ground. The alternating current mutual inductor detection circuit disclosed by the invention has a simple structure, is convenient to use, and can be used for detecting the electric leakage of the circuit.
Description
Technical field
The present invention relates to a kind of application circuit, concrete relate to a kind of D.C mutual-inductor testing circuit.
Background technology
The D.C mutual-inductor testing circuit has functions such as measurement, demonstration and analysis.Existing D.C mutual-inductor testing circuit is varied of a great variety, but most complex structure, function is complicated; And only need under the application scenario of function singleness at some, adopt complicated circuit to come testing circuit whether to leak electricity often, cost can increase so on the one hand; In addition on the one hand; After circuit structure was in a single day complicated, its labile factor was behind so just reducing product percent of pass virtually also increasing.
Summary of the invention
For overcoming deficiency of the prior art, the object of the present invention is to provide a kind of D.C mutual-inductor testing circuit simple in structure.
In order to solve the problems of the technologies described above, realize above-mentioned purpose, the present invention has adopted following technical scheme:
A kind of D.C mutual-inductor testing circuit; Comprise a mutual inductor; First pin of said mutual inductor is through the 4th diode, first resistance and the 3rd resistance connection detector of series connection successively; Reversal connection first diode between first pin of said mutual inductor and the ground, second pin of said mutual inductor is connected said detecting device with said the 3rd resistance, reversal connection second diode between second pin of said mutual inductor and the ground through the 3rd diode, said first resistance of series connection successively; Be connected electrochemical capacitor between the terminals of said the 4th diode and said the 3rd diode and the ground; Be connected second resistance between the link of said first resistance and said the 3rd resistance and the ground; Be connected ceramic disc capacitor, reversal connection voltage stabilizing diode between said detecting device and the ground between said detecting device and the ground.
The course of work of D.C mutual-inductor testing circuit of the present invention is following:
Detecting device passes said mutual inductor, begins to detect leakage current after powering on, and the words excessive when said mutual inductor leakage current feed back to detecting device later on through first diode, second diode, the 3rd diode and the 4th diode rectification.When leakage current greater than 5.1V is, said detecting device detects and is leaky, and when leakage current is lower than 5.1V, said detecting device detects and is normal phenomenon.
The present invention has the following advantages:
D.C mutual-inductor testing circuit of the present invention simple in structure, easy to use.
Above-mentioned explanation only is the general introduction of technical scheme of the present invention, understands technological means of the present invention in order can more to know, and can implement according to the content of instructions, below with preferred embodiment of the present invention and conjunction with figs. specify as after.Embodiment of the present invention is provided by following examples and accompanying drawing thereof in detail.
Description of drawings
Fig. 1 is the circuit theory diagrams of D.C mutual-inductor testing circuit of the present invention.
Embodiment
Below in conjunction with accompanying drawing and embodiment technology implementation process of the present invention is further specified.
Referring to shown in Figure 1; A kind of D.C mutual-inductor testing circuit; Comprise a mutual inductor HGQ; First pin 1 of said mutual inductor HGQ is through the 4th diode D4, first resistance R 1 and the 3rd resistance R 3 connection detector FAN of series connection successively; The reversal connection first diode D1 between first pin 1 of said mutual inductor HGQ and the ground, second pin 2 of said mutual inductor HGQ is connected said detecting device FAN with said the 3rd resistance R 3, the reversal connection second diode D2 between second pin 2 of said mutual inductor HGQ and the ground through the 3rd diode D3, said first resistance R 1 of series connection successively; Be connected electrochemical capacitor E1 between the terminals of said the 4th diode D4 and said the 3rd diode D3 and the ground; Be connected second resistance R 2 between the link of said first resistance R 1 and said the 3rd resistance R 3 and the ground; Be connected ceramic disc capacitor C1, reversal connection voltage stabilizing diode W1 between said detecting device FAN and the ground between said detecting device FAN and the ground.
The foregoing description just is to let the one of ordinary skilled in the art can understand content of the present invention and enforcement according to this in order technical conceive of the present invention and characteristics to be described, to be its objective is, can not limit protection scope of the present invention with this.The variation or the modification of every equivalence that the essence of content has been done according to the present invention all should be encompassed in protection scope of the present invention.
Claims (1)
1. D.C mutual-inductor testing circuit; Comprise a mutual inductor (HGQ); It is characterized in that: first pin (1) of said mutual inductor (HGQ) is through the 4th diode (D4), first resistance (R1) and the 3rd resistance (R3) connection detector (FAN) of series connection successively; Reversal connection first diode (D1) between first pin (1) of said mutual inductor (HGQ) and the ground; Second pin (2) of said mutual inductor (HGQ) is connected said detecting device (FAN) with said the 3rd resistance (R3), reversal connection second diode (D2) between second pin (2) of said mutual inductor (HGQ) and the ground through the 3rd diode (D3), said first resistance (R1) of series connection successively; Be connected electrochemical capacitor (E1) between the terminals of said the 4th diode (D4) and said the 3rd diode (D3) and the ground; Be connected second resistance (R2) between the link of said first resistance (R1) and said the 3rd resistance (R3) and the ground; Be connected ceramic disc capacitor (C1), reversal connection voltage stabilizing diode (W1) between said detecting device (FAN) and the ground between said detecting device (FAN) and the ground.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110171328 CN102841285A (en) | 2011-06-23 | 2011-06-23 | Alternating current mutual inductor detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110171328 CN102841285A (en) | 2011-06-23 | 2011-06-23 | Alternating current mutual inductor detection circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102841285A true CN102841285A (en) | 2012-12-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201110171328 Pending CN102841285A (en) | 2011-06-23 | 2011-06-23 | Alternating current mutual inductor detection circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102841285A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105164543A (en) * | 2013-04-05 | 2015-12-16 | 欧米克朗电子仪器有限公司 | Method and device for testing a transformer |
| CN110350760A (en) * | 2019-06-01 | 2019-10-18 | 上海沪工焊接集团股份有限公司 | A kind of sample hold method of the input peak point current of inverter |
-
2011
- 2011-06-23 CN CN 201110171328 patent/CN102841285A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105164543A (en) * | 2013-04-05 | 2015-12-16 | 欧米克朗电子仪器有限公司 | Method and device for testing a transformer |
| US9817053B2 (en) | 2013-04-05 | 2017-11-14 | Omicron Electronics Gmbh | Method and apparatus for testing a transformer |
| CN105164543B (en) * | 2013-04-05 | 2018-04-10 | 欧米克朗电子仪器有限公司 | Method and apparatus for testing transformer |
| CN110350760A (en) * | 2019-06-01 | 2019-10-18 | 上海沪工焊接集团股份有限公司 | A kind of sample hold method of the input peak point current of inverter |
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| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20121226 |