CN102830310B - Method for estimating residual life of power capacitor based on operating data - Google Patents

Method for estimating residual life of power capacitor based on operating data Download PDF

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CN102830310B
CN102830310B CN201210308206.1A CN201210308206A CN102830310B CN 102830310 B CN102830310 B CN 102830310B CN 201210308206 A CN201210308206 A CN 201210308206A CN 102830310 B CN102830310 B CN 102830310B
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capacitor
defect
life
formula
temperature
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CN102830310A (en
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郭成
李胜男
李明
许守东
徐志
魏承志
邢超
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Yunnan Power Grid Corp Technology Branch
Yunnan Electric Power Experimental Research Institute Group Co Ltd of Electric Power Research Institute
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Yunnan Power Grid Corp Technology Branch
Yunnan Electric Power Experimental Research Institute Group Co Ltd of Electric Power Research Institute
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Abstract

The invention discloses a method for estimating residual life of a power capacitor based on operating data. The method includes correcting life indexes of the power capacitor by fully considering influences of medium temperature of the power capacitor, supply voltage of a connected system, system background harmonic, operational defect of the power capacitor, and operation period. The residual life of the power capacitor can be estimated according to the life indexes. Warning signals can be given out to facilitate taking of necessary measures according to practical needs.

Description

A kind of method based on service data assessment power capacitor residual life
Technical field
The invention belongs to the method for assessment power capacitor operation conditions and residual life, particularly a kind of method assessing power capacitor operation conditions and residual life based on service data.
Background technology
Power capacitor is electricity supply and use equipment higher with failure rate important in electric system.Power capacitor, to raising power factor of electric network, improves quality of voltage and has vital role.The feature of power capacitor is once put into operation just by oepration at full load, in general, the designed life of power capacitor is normally in 20 ~ 30 years, but power capacitor does not often reach designed life under many circumstances, this is because its operation life is easily subject to the impact of self and external factor, such as operating capacitor is owing to being subject to the effect of electric field and thermal field, and its medium can constantly occur aging, thus affects its life-span.
The factor affecting capacitor operation life mainly contains running environment factor and apparatus factor.Running environment factor mainly comprises medium temperature, line voltage and electrical network background harmonics.Apparatus factor mainly comprises capacitor equipment of itself factor and external unit factor.Capacitor equipment of itself factor mainly comprises starting material, design, technique etc.External unit factor mainly refers to that the isolating switch with capacitor on same branch road resists with going here and there.The result produced by apparatus factor affects, is usually expressed as the operational defect of capacitor, as leakage of oil, fuse blows etc.
For a long time, the impact of single factor on the power capacitor life-span being just limited on the assessment of power capacitor residual life, or just analysis and evaluation qualitatively being carried out to influence factor, seldom having to appearing applicable comprehensive estimation method in engineering.The power capacitor lifetime estimation method major embodiment proposed No. 200980120673.8th, Chinese patent is the residual life by the temperature measurement unit to capacitor, voltage measurement unit and current measurement unit assessment capacitor, but this appraisal procedure obviously ignores electrical network background harmonics and apparatus factor to the impact in power capacitor life-span.
Summary of the invention
Patent documentation 1 proposes a kind of residual life diagnostic device of capacitor, it is characterized in that possessing:
Temperature measurement unit, for measuring the temperature of power storage body;
Voltage measurement unit, in order to measure the DC voltage of power storage body;
Current measurement unit, in order to measure the output DC current of power storage body.
Residual life arithmetic element, runs residual life according to discharge time, measuring tempeature and capacitor residual life characteristic.
The present invention, in view of prior art, fully takes into account the impact of mains by harmonics and apparatus factor, proposes a kind of easy Engineering Assessment Method.Its technical characteristic is: the residual life adopting temperature correction coefficient, voltage correction factor, harmonic wave correction factor, defect correction coefficient, life adjustment factor assessment power capacitor, and its step is as follows:
Step one: at capacitor chamber and capacitor case place mounting temperature sensor, measures ambient temperature θ 1with capacitor case temperature θ 2;
Step 2: install quality of power supply on-line monitoring terminal on capacitor institute connection bus, to obtain line voltage and harmonic value;
Step 3: read environment temperature θ 1, capacitor case temperature θ 2with busbar voltage U n, utilize formula calculable capacitor interior media maximum temperature θ n; If the θ that actual computation obtains n<50, then get θ n=50; Then according to formula accounting temperature correction factor k 1, k 1span be 0<k 1≤ 1;
Step 4: read busbar voltage U n, according to formula calculating voltage correction factor k 2, in formula, U efor the rated voltage of capacitor place bus, k 2span be 0<k 2≤ 1; If U n<1.1 × U e, get U n=1.1 × U e;
Step 5: read harmonic current resultant distortion rate value THD(I from quality of power supply on-line monitoring terminal) value; According to harmonic current resultant distortion rate situation, assessment obtains harmonic wave correction factor k 3; Concrete grammar is:
If harmonic current resultant distortion rate THD(I) <5%, k 3get 1.0;
If harmonic current resultant distortion rate 5%<THD(I) <30%, k 3get 0.95;
If harmonic current resultant distortion rate THD(I) >30%, k 3get 0.90;
Step 6: transfer capacitor operational defect record from production management system, and according to operational defect record, assessment defect correction coefficient k 4; Concrete grammar is:
Within the cycle of operation, if general defect and above record number of times≤1, k 4get 1.0;
If there is 1 major defect or 2 times and above general defect, k 4get 0.8;
If exist 1 time and above urgent defect or 2 times and above major defect or 4 times and above general defect, k 4get 0.6;
Defect type is defined as follows:
Defect type Definition
Urgent defect Should arrange process immediately, the time is no more than 24 hours
Significant deficiency Process is arranged in one week
General defect Process is arranged within three months
Step 7: according to putting into operation the time, determine time limit correction factor k 5, its computing formula is in formula, L efor the rated capacitor life-span, L 0for the used time limit.
Step 8: to the coefficient k drawn 1, k 2, k 3, calculate its integral mean, data sampling refreshes once by every 3 points of kinds, and integral time, length was one day (totally 1440 minutes, 480 sampled points), as k 1by formula calculate, the result K that can to obtain with a day be computation period 1; COEFFICIENT K 4and K 5all once calculate by refreshing every day, i.e. K 4=k 4, K 5=k 5;
Step 9: obtain temperature correction coefficient K according to final institute 1, voltage correction factor K 2, harmonic wave adjusted coefficient K 3, defect correction COEFFICIENT K 4, time limit adjusted coefficient K 5calculable capacitor life index K=K 1× K 2× K 3× K 4× K 5;
Step 10: if the capacitor life-span index K finally obtained is lower than 0.25, should early warning signal be sent; Finally, by formula L=L e× K calculates the residue operation life of assessment power capacitor.
Compared with prior art, advantage of the present invention is: (1) take into account running environment factor and apparatus factor to the impact of capacitor life-span; (2) factor affecting capacitor life-span is refined as medium temperature, line voltage, electrical network background harmonics, capacitor operational defect, the life index and residue operation life that obtain power capacitor can be assessed quantitatively.(3) the present invention is simple, and assessment result is reliable, has very strong operability.
Accompanying drawing explanation
Fig. 1 is frame diagram of the present invention;
Fig. 2 is process flow diagram of the present invention.
Below in conjunction with accompanying drawing, content of the present invention is described in further detail.
Embodiment
Embodiment
In this example, power capacitor is certain transformer station 10kV Capacitor banks.
Be illustrated in figure 1 system framework figure of the present invention.The raw data of collecting is needed to have: environment temperature, device housings temperature, busbar voltage, harmonic current resultant distortion rate, operational defect data, the putting equipment in service time limit, designed life etc.
Data information is compiled as follows: certain transformer station 10kV mono-section of bus capacitor group, manufacturer is Xi'an power capacitor company limited, put into operation the date 2007.8, a certain moment environment temperature 21 degree, skin temperature 42 degree, line voltage is 1.08 times of rated voltages, and harmonic current resultant distortion rate is 8%, defect record shows this capacitor and slight capacitor leakage of oil once occurred once, belongs to significant deficiency.
Be illustrated in figure 2 estimation flow figure of the present invention, the steps include:
The first step: read in environment temperature and device housings temperature:
By being arranged on the temperature sensor with capacitor case place near capacitor, obtain environment temperature θ 1=21 and capacitor case temperature θ 2=42.
Second step: read in line voltage and harmonic current resultant distortion rate value:
By being arranged on the quality of power supply on-line monitoring terminal on capacitor institute connection bus, obtain line voltage U n=1.08U ewith harmonic current resultant distortion rate value THD(I)=8%.
3rd step: accounting temperature correction factor k 1:
Utilize formula calculable capacitor interior media maximum temperature θ n=51.4 (if real
The θ that border calculates n<50, then get θ n=50);
Then according to formula accounting temperature correction factor k 1=0.88.
4th step, calculating voltage correction factor:
According to formula calculating voltage correction factor k 2=1.
5th step, calculates harmonic wave correction factor:
According to harmonic current resultant distortion rate situation, assessment obtains harmonic wave correction factor k 3, concrete grammar is:
If harmonic current resultant distortion rate THD(I) <5%, k 3get 1.0;
If harmonic current resultant distortion rate 5%<THD(I) <30%, k 3get 0.95;
If harmonic current resultant distortion rate THD(I) >30%, k 3get 0.90;
Harmonic wave correction factor k herein 3=0.95.
6th step, calculates defect correction coefficient:
Assessment defect correction coefficient k 4, concrete grammar is:
Within the cycle of operation, if general defect and above record number of times≤1, k 4get 1.0;
If there is the major defect of more than 1 time or the general defect of more than 2 times, k 4get 0.8;
If there is the general defect of the urgent defect of more than 1 time or the major defect of more than 2 times or more than 4 times, k 4get 0.6; Defect correction coefficient k herein 4=0.8.
7th step, calculates time limit correction factor:
According to putting into operation the time, determine time limit correction factor k 5, its computing formula is time limit correction factor k can be obtained 5=0.83.
8th step, with one day for computation of Period integral mean K1, K2, K3, K4, K5:
To the coefficient k drawn 1, k 2, k 3, calculate its integral mean, data sampling refreshes once by every 3 points of kinds, and integral time, length was one day (totally 1440 minutes, 480 sampled points), as k 1by formula calculate, the result K that can to obtain with a day be computation period 1; COEFFICIENT K 4and K 5all once calculate by refreshing every day, i.e. K 4=k 4, K 5=k 5, obtain with one day as computation of Period integral mean K 1=0.85, K 2=1.0, K 3=0.95, K 4=0.8, K 5=0.93.
9th step, calculable capacitor life index:
According to formula K=K 1× K 2× K 3× K 4× K 5calculable capacitor life index value is K=0.60.
Tenth step, calculable capacitor residue operation life and Risk-warning:
By formula L=L ethe residue operation life that × K assesses power capacitor is about 18 years;
Due to the capacitor life-span index K=0.60 finally obtained, lower than 0.25 limit value, known, this capacitor is still in good running status, therefore, does not send out Risk-warning signal.

Claims (1)

1. the method based on service data assessment power capacitor residual life, temperature correction coefficient, voltage correction factor, harmonic wave correction factor, defect correction coefficient, life adjustment factor is adopted to assess the life index of power capacitor respectively, it is characterized in that, step is as follows:
Step one: at capacitor chamber and capacitor case place mounting temperature sensor, measures ambient temperature θ 1with capacitor case temperature θ 2;
Step 2: install quality of power supply on-line monitoring terminal on capacitor institute connection bus, to obtain line voltage and harmonic value;
Step 3: read environment temperature θ 1, capacitor case temperature θ 2with busbar voltage U n, utilize formula calculable capacitor interior media maximum temperature θ n; If the θ that actual computation obtains n<50, then get θ n=50; Then according to formula accounting temperature correction factor k 1, k 1span be 0<k 1≤ 1;
Step 4: read busbar voltage U n, according to formula calculating voltage correction factor k 2, in formula, U efor the rated voltage of capacitor place bus, k 2span be 0<k 2≤ 1; If U n<1.1 × U e, get U n=1.1 × U e;
Step 5: read harmonic current resultant distortion rate value THD(I from quality of power supply on-line monitoring terminal) value; According to harmonic current resultant distortion rate situation, assessment obtains harmonic wave correction factor k 3; Concrete grammar is:
If harmonic current resultant distortion rate THD(I) <5%, k 3get 1.0;
If harmonic current resultant distortion rate 5%<THD(I) <30%, k 3get 0.95;
If harmonic current resultant distortion rate THD(I) >30%, k 3get 0.90;
Step 6: transfer capacitor operational defect record from production management system, and according to operational defect record, assessment defect correction coefficient k 4; Concrete grammar is:
Within the cycle of operation, if general defect and above record number of times≤1, k 4get 1.0;
If there is 1 major defect or 2 times and above general defect, k 4get 0.8;
If exist 1 time and above urgent defect or 2 times and above major defect or 4 times and above general defect, k 4get 0.6;
Step 7: according to putting into operation the time, determine time limit correction factor k 5, its computing formula is
In formula, L efor the rated capacitor life-span, L 0for the used time limit;
Step 8: to the coefficient k drawn 1, k 2, k 3, calculate its integral mean, data sampling refreshes once by every 3 points of kinds, and integral time, length was one day, totally 1440 minutes, 480 sampled points, as k 1by formula calculate, the result K that can to obtain with a day be computation period 1; COEFFICIENT K 4and K 5all once calculate by refreshing every day, i.e. K 4=k 4, K 5=k 5;
Step 9: obtain temperature correction coefficient K according to final institute 1, voltage correction factor K 2, harmonic wave adjusted coefficient K 3, defect correction COEFFICIENT K 4, time limit adjusted coefficient K 5calculable capacitor life index K=K 1× K 2× K 3× K 4× K 5;
Step 10: by formula L=L e× K calculates the residue operation life of power capacitor; In formula, L efor the specified serviceable life of power capacitor; If the capacitor life-span index K finally obtained is lower than 0.25, early warning signal should be sent.
CN201210308206.1A 2012-08-27 2012-08-27 Method for estimating residual life of power capacitor based on operating data Active CN102830310B (en)

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CN103412229B (en) * 2013-08-30 2016-04-06 华北电力大学（保定） A kind of Fault Locating Method of parallel capacitor group
CN103675533B (en) * 2013-11-28 2016-03-30 华为技术有限公司 DC bus electrolytic capacitor life test method and device
CN103823144B (en) * 2014-03-14 2017-05-17 云南电力试验研究院（集团）有限公司电力研究院 High-voltage shunt power capacitor operational monitoring system and method
CN105699797A (en) * 2014-11-25 2016-06-22 国网辽宁省电力有限公司丹东供电公司 Distribution network capacitor remaining life prediction method and distribution network capacitor remaining life prediction device
CN108663580A (en) * 2017-07-10 2018-10-16 山东光因照明科技有限公司 Electrochemical capacitor life tester
CN109375032B (en) * 2018-09-15 2021-04-30 宁波高云电气有限公司 Management system of high-power large-capacity capacitor
CN111130368B (en) * 2020-01-20 2021-03-19 爱士惟新能源技术(江苏)有限公司 Control method and system of photovoltaic inverter
CN113949189B (en) * 2020-07-15 2023-06-23 中车永济电机有限公司 Motor with a motor housing

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