CN102830293B - Method and system for quickly calibrating field uniformity of transient electromagnetic field - Google Patents
Method and system for quickly calibrating field uniformity of transient electromagnetic field Download PDFInfo
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- CN102830293B CN102830293B CN201210309485.3A CN201210309485A CN102830293B CN 102830293 B CN102830293 B CN 102830293B CN 201210309485 A CN201210309485 A CN 201210309485A CN 102830293 B CN102830293 B CN 102830293B
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- test bar
- reference test
- probe
- transient electromagnetic
- calibration plane
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Abstract
The invention discloses a method and a system for quickly calibrating field uniformity of transient electromagnetic field. The method includes the steps of selecting apexes of a rectangular calibrating plane as measuring points; placing a rotary shaft (2) at the center of the calibrating plane, adjusting a positioning device (4) to limit a test bar (3) in the calibrating plane, and selecting length of the test bar (3) to enable a probe (6) to reach the apexes of the calibrating planes; rotating the test bar (3) in the calibrating plane to enable the probe (6) to locate at the apexes of the calibrating plane respectively, and using the probe (6) to measure values of field intensity of the apexes of the calibrating plane. The method and the system require no frequent movement of a support for supporting and fixing the probe, and after the support is fixed, repeated adjustment of the specific position and angle of the probe on the support is not needed. The method and the system are simple in calibrating process, fast in calibration and short in calibrating time.
Description
Technical field
The present invention relates to the collimation technique field of the field uniformity of electromagnetic field, particularly a kind of method and system of quickly calibrated transient electromagnetic field field uniformity.
Background technology
In prior art, the calibration steps of transient electromagnetic field field uniformity and system conventionally need frequent mobile for supporting and the position of the support of static probe; And after the position of support is fixing, also need repeatedly to adjust the particular location of probe on support.Therefore, there is calibration process complexity, loaded down with trivial details in the calibration steps of prior art and system, and calibration speed is slow, calibrates the problem of length consuming time.
At present, be starved of that a kind of process is easy, speed is fast, calibration steps and the system of short transient electromagnetic field field uniformity consuming time.
Summary of the invention
The object of this invention is to provide a kind of system of quickly calibrated transient electromagnetic field field uniformity.
Another object of the present invention is to provide a kind of method of quickly calibrated transient electromagnetic field field uniformity.
The system of quickly calibrated transient electromagnetic field field uniformity provided by the invention comprises support bar, rotating shaft, reference test bar, locating device, probe and oscillograph, the top of described support bar is located in described rotating shaft, one end of described reference test bar is installed in described rotating shaft and can rotates around described rotating shaft, described probe is fixed on the free end of described reference test bar, and described probe is electrically connected with described oscillograph, the junction of described reference test bar and described rotating shaft is provided with described locating device, described locating device is for being limited to described reference test bar in a plane at described reference test bar place, and can make described reference test bar fixing at an arbitrary position.
Preferably, described system also comprises the base affixed with the bottom of described support bar.
Preferably, the height of described support bar is adjustable.
Preferably, described system also comprises the length adjustment device of being located on described reference test bar, for regulating the length of described reference test bar.
The method of quickly calibrated transient electromagnetic field field uniformity provided by the invention adopts the system of described quickly calibrated transient electromagnetic field field uniformity, and the method comprises the steps:
The summit of selected rectangle calibration plane is measurement point;
Described rotating shaft is placed in to the center of calibration plane, by described regulating positioning device, described reference test bar is limited in calibration plane, by selecting the length of described reference test bar to make described probe can arrive each summit place of calibration plane;
In calibration plane, rotate described reference test bar, make described probe lay respectively at each summit place of calibration plane, obtain the field intensity value at each summit place of calibration plane by described probe measurement.
Preferably, regulate the length of described reference test bar to make described probe can arrive each summit of calibration plane by described length adjustment device.
Preferably, described rectangle calibration plane comprises square calibration plane.
The present invention has following beneficial effect:
(1) compare with system with the calibration steps of prior art, described method and system do not need frequent mobile for supporting and the position of the support of static probe, and after the position of support is fixing, do not need repeatedly to adjust the particular location of probe on support yet;
(2) calibration process of described method and system is easy, and calibration speed is fast, calibrates consuming time short.
Brief description of the drawings
The schematic diagram of the method and system of the quickly calibrated transient electromagnetic field field uniformity that Fig. 1 provides for the embodiment of the present invention 1;
The process flow diagram of the method for the quickly calibrated transient electromagnetic field field uniformity that Fig. 2 provides for various embodiments of the present invention;
The schematic diagram of the method and system of the quickly calibrated transient electromagnetic field field uniformity that Fig. 3 provides for the embodiment of the present invention 2;
The schematic diagram of the method and system of the quickly calibrated transient electromagnetic field field uniformity that Fig. 4 provides for the embodiment of the present invention 3.
Embodiment
Below in conjunction with drawings and Examples, summary of the invention of the present invention is further described.
Embodiment 1:
The system of the quickly calibrated transient electromagnetic field field uniformity that the present embodiment provides comprises support bar 1, rotating shaft 2, reference test bar 3, locating device 4, base 5, probe 6 and oscillograph 7, as shown in Figure 1.The top of support bar 1 is located in rotating shaft 2.The bottom of support bar 1 and base 5 are affixed.In the present embodiment, the height of support bar 1 is for example adjustable.One end of reference test bar 3 is installed in rotating shaft 2 and can 2 rotates around the shaft.Probe 6 is fixed on the free end of reference test bar 3, and probe 6 is electrically connected with oscillograph 7.Reference test bar 3 is provided with locating device 4 with the junction of rotating shaft 2.Locating device 4 is for reference test bar 3 being limited in a plane at reference test bar 3 places, and can make reference test bar 3 fixing at an arbitrary position.In the present embodiment, the length of reference test bar 3 is for example non-adjustable, need to be according to the length of the size Selection reference test bar 3 of calibration plane.
As depicted in figs. 1 and 2, the method for the quickly calibrated transient electromagnetic field field uniformity that the present embodiment provides adopts said system, and the method comprises the steps:
S1: four summits of selected rectangle calibration plane ABCD are that A, B, C and D point are measurement point;
S2: the center that the rotating shaft of above-mentioned calibration system 2 is placed in to rectangle calibration plane ABCD, by regulating positioning device 4, reference test bar 3 is limited in calibration plane ABCD, by selecting the length of reference test bar 3 to make to pop one's head in 6 each summit places that can arrive calibration plane ABCD;
S3: rotate reference test bar 3 in calibration plane ABCD, the 6 each summit places that lay respectively at calibration plane ABCD that make to pop one's head in, by the 6 field intensity value E that measure respectively the each summit of calibration plane ABCD place that pop one's head in
a, E
b, E
cand E
d.
The field intensity value E at each summit place of the calibration plane ABCD that described method obtains
a, E
b, E
cand E
dbe used for the field uniformity of the transient electromagnetic field of analyzing and evaluate calibration plane ABCD.
Embodiment 2:
The system of the quickly calibrated transient electromagnetic field field uniformity that the present embodiment provides comprises support bar 1, rotating shaft 2, reference test bar 3, locating device 4, base 5, probe 6, oscillograph 7 and length adjustment device 8, as shown in Figure 3.The top of support bar 1 is located in rotating shaft 2.The bottom of support bar 1 and base 5 are affixed.In the present embodiment, the height of support bar 1 is for example adjustable.One end of reference test bar 3 is installed in rotating shaft 2 and can 2 rotates around the shaft.Probe 6 is fixed on the free end of reference test bar 3, and probe 6 is electrically connected with oscillograph 7.Reference test bar 3 is provided with locating device 4 with the junction of rotating shaft 2.Locating device 4 is for reference test bar 3 being limited in a plane at reference test bar 3 places, and can make reference test bar 3 fixing at an arbitrary position.Length adjustment device 8 is located on reference test bar 3, for regulating the length of reference test bar 3.
As shown in Figures 2 and 3, the method for the quickly calibrated transient electromagnetic field field uniformity that the present embodiment provides adopts said system, and the method comprises the steps:
S1: four summits of selected for example square calibration plane FGHI are that F, G, H and I point are measurement point;
S2: the center that the rotating shaft of above-mentioned calibration system 2 is placed in to calibration plane FGHI, by regulating positioning device 4, reference test bar 3 is limited in calibration plane FGHI, by regulating the length of reference test bar 3 to make to pop one's head in 6 each summit places that can arrive calibration plane FGHI;
S3: rotate reference test bar 3 in calibration plane FGHI, the 6 each summit places that lay respectively at calibration plane FGHI that make to pop one's head in, by the 6 field intensity value E that measure respectively the each summit of calibration plane FGHI place that pop one's head in
f, E
g, E
hand E
i;
The field intensity value E at each summit place of the calibration plane FGHI that described method obtains
f, E
g, E
hand E
ibe used for the field uniformity of the transient electromagnetic field of analyzing and evaluate calibration plane FGHI.
Embodiment 3:
The present embodiment adopts the system of the quickly calibrated transient electromagnetic field field uniformity identical with embodiment 2.
As shown in Figure 4, select for example foursquare the first calibration plane JKLM, and obtain the field intensity value E at J, K, L and M point place for the calibration steps described in this calibration plane employing embodiment 2
j, E
k, E
land E
m.Selected foursquare the second calibration plane NOPQ, and four summits of the second calibration plane NOPQ are for example respectively the mid point on each limit of the first calibration plane JKLM.For the second calibration plane NOPQ, adopt calibration steps described in embodiment 2 to obtain the field intensity value E at N, O, P and Q point place
n, E
o, E
pand E
q.The field intensity value E that described method obtains
j, E
k, E
l, E
m, E
n, E
o, E
pand E
qbe used for the field uniformity of the transient electromagnetic field of analyzing and evaluate the first calibration plane JKLM.The field intensity value E that described method obtains
n, E
o, E
pand E
qbe used for the field uniformity of the transient electromagnetic field of analyzing and evaluate the second calibration plane NOPQ.
Compare with system with the calibration steps of prior art, described method and system do not need frequent mobile for supporting and the position of the support of static probe, and the position of support fixing after, do not need repeatedly to adjust the particular location of probe on support yet.The calibration process of described method and system is easy, and calibration speed is fast, calibrates consuming time short.
Should be appreciated that the above detailed description of technical scheme of the present invention being carried out by preferred embodiment is illustrative and not restrictive.Those of ordinary skill in the art modifies reading the technical scheme that can record each embodiment on the basis of instructions of the present invention, or part technical characterictic is wherein equal to replacement; And these amendments or replacement do not make the essence of appropriate technical solution depart from the spirit and scope of various embodiments of the present invention technical scheme.
Claims (7)
1. the system of quickly calibrated transient electromagnetic field field uniformity, it is characterized in that, this system comprises support bar (1), rotating shaft (2), reference test bar (3), locating device (4), probe (6) and oscillograph (7), the top of described support bar (1) is located in described rotating shaft (2), one end of described reference test bar (3) is installed on described rotating shaft (2) above and can rotates around described rotating shaft (2), described probe (6) is fixed on the free end of described reference test bar (3), and described probe (6) is electrically connected with described oscillograph (7), described reference test bar (3) is provided with described locating device (4) with the junction of described rotating shaft (2), described locating device (4) is for being limited to described reference test bar (3) in a plane at described reference test bar (3) place, and can make described reference test bar (3) fixing at an arbitrary position.
2. the system of quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, described system also comprises the base (5) affixed with the bottom of described support bar (1).
3. the system of quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, the height of described support bar (1) is adjustable.
4. the system of quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, described system also comprises the length adjustment device (8) of being located on described reference test bar (3), for regulating the length of described reference test bar (3).
5. the method for quickly calibrated transient electromagnetic field field uniformity, the method adopts the system of quickly calibrated transient electromagnetic field field uniformity claimed in claim 1, it is characterized in that, and the method comprises the steps:
The summit of selected rectangle calibration plane is measurement point;
Described rotating shaft (2) is placed in to the center of calibration plane, by regulating described locating device (4) that described reference test bar (3) is limited in calibration plane, by selecting the length of described reference test bar (3) to make described probe (6) can arrive each summit place of calibration plane;
In calibration plane, rotate described reference test bar (3), make described probe (6) lay respectively at each summit place of calibration plane, measure the field intensity value at each summit place of calibration plane by described probe (6).
6. the method for quickly calibrated transient electromagnetic field field uniformity according to claim 5, it is characterized in that, regulate the length of described reference test bar (3) to make described probe (6) can arrive each summit of calibration plane by described length adjustment device (8).
7. the method for quickly calibrated transient electromagnetic field field uniformity according to claim 5, is characterized in that, described rectangle calibration plane comprises square calibration plane.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210309485.3A CN102830293B (en) | 2012-08-27 | 2012-08-27 | Method and system for quickly calibrating field uniformity of transient electromagnetic field |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210309485.3A CN102830293B (en) | 2012-08-27 | 2012-08-27 | Method and system for quickly calibrating field uniformity of transient electromagnetic field |
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| CN102830293A CN102830293A (en) | 2012-12-19 |
| CN102830293B true CN102830293B (en) | 2014-11-12 |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103645455B (en) * | 2013-12-19 | 2016-08-24 | 北京无线电计量测试研究所 | Probe correcting device |
| CN107121600B (en) * | 2017-06-07 | 2023-04-07 | 中国工程物理研究院应用电子学研究所 | Automatic testing device for testing uniformity of antenna radiation field |
| CN109613343B (en) * | 2018-12-05 | 2020-10-27 | 北京无线电计量测试研究所 | Quasi-optical measurement system and method for normal emissivity of terahertz radiator |
| CN111337756A (en) * | 2020-04-24 | 2020-06-26 | 中国人民解放军63892部队 | Method for evaluating electric field uniformity of test region of pulse excitation reverberation chamber |
| CN111551794B (en) * | 2020-06-11 | 2022-06-28 | 中国人民解放军军事科学院国防工程研究院工程防护研究所 | Simple field uniformity testing device and testing method thereof |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0821242A2 (en) * | 1996-07-23 | 1998-01-28 | Thermo Voltek Europe B.V. | An electromagnetic compatibility (EMC) test cell |
| CN102590642A (en) * | 2012-02-29 | 2012-07-18 | 北京无线电计量测试研究所 | Calibrating method and system for field uniformity of transient electromagnetic field |
| CN102608558A (en) * | 2012-03-31 | 2012-07-25 | 上海市计量测试技术研究院 | Radiation field uniformity calibration positioner |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07270468A (en) * | 1994-03-31 | 1995-10-20 | Otsuka Sci Kk | Electromagnetic wave reflecting desk |
| JP2001165983A (en) * | 2000-11-06 | 2001-06-22 | Nec Corp | Method and apparatus for generating uniform electric field |
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2012
- 2012-08-27 CN CN201210309485.3A patent/CN102830293B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0821242A2 (en) * | 1996-07-23 | 1998-01-28 | Thermo Voltek Europe B.V. | An electromagnetic compatibility (EMC) test cell |
| CN102590642A (en) * | 2012-02-29 | 2012-07-18 | 北京无线电计量测试研究所 | Calibrating method and system for field uniformity of transient electromagnetic field |
| CN102608558A (en) * | 2012-03-31 | 2012-07-25 | 上海市计量测试技术研究院 | Radiation field uniformity calibration positioner |
Non-Patent Citations (2)
| Title |
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| JP特开2001-165983A 2001.06.22 * |
| JP特开平7-270468A 1995.10.20 * |
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Granted publication date: 20141112 Termination date: 20160827 |