CN102827606A - Method for adjusting Eu<3+> luminous intensity in oxide semiconductor substrate - Google Patents
Method for adjusting Eu<3+> luminous intensity in oxide semiconductor substrate Download PDFInfo
- Publication number
- CN102827606A CN102827606A CN2012103105928A CN201210310592A CN102827606A CN 102827606 A CN102827606 A CN 102827606A CN 2012103105928 A CN2012103105928 A CN 2012103105928A CN 201210310592 A CN201210310592 A CN 201210310592A CN 102827606 A CN102827606 A CN 102827606A
- Authority
- CN
- China
- Prior art keywords
- colloidal sol
- oxide semiconductor
- tio
- sio
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Luminescent Compositions (AREA)
- Glass Melting And Manufacturing (AREA)
- Glass Compositions (AREA)
Abstract
The invention relates to a method for adjusting Eu<3+> luminous intensity in an oxide semiconductor substrate. The method is characterized by comprising the following steps of: preparing TiO2 sol and SiO2 sol, preparing the TiO2 sol and the SiO2 sol into a mixed solution, adding rare earth Eu<3+> into the sol, drying a glass substrate, soaking into prepared Eu<3+>-doped compound oxide semiconductor sol, and lifting with a vertical lifting film coating method to obtain a gel film; and repeatedly performing the vertical lifting film coating method till a required thickness is achieved to obtain a Eu<3+>-doped compound oxide semiconductor film. The Eu<3+>-doped compound oxide semiconductor film is regulated and controlled by selecting different mixture ratios of sol volume. A method for mixing two types of sol is adopted, so that adjustment of the Eu<3+> luminous intensity is realized, and future realization of the preparation of an oxide semiconductor device for a rare earth ion high-strength luminous film becomes possible.
Description
Technical field
The present invention relates to Eu in a kind of adjusting oxide semiconductor matrix
3+The method of luminous intensity belongs to the rare earth ion doped oxide semiconductor transparent film method field of preparation, is specially through regulating TiO
2And SiO
2The colloidal sol proportioning is regulated Eu
3+The luminous intensity of adulterated oxide semiconductor thin-film.
Background technology
TiO
2, SiO
2And their laminated film has obtained in fields such as optical thin film and microtronics using widely because its high thermostability and chemicalstability, low thermal expansivity and adjustable specific refractory power.Especially to TiO
2-SiO
2Laminated film is because its specific refractory power can be regulated in the scope of a broad.Therefore, can be used for preparing optical waveguide film and gradient-index film etc. easily.In recent years, the optical property of rare earth ion doped collosol and gel oxide semiconductor material is because its potential application at aspects such as laserable material, transmitter, highdensity frequency domain optical storage and optical fiber communication amplifiers has obtained concern widely.Therefore, rare earth ion doped TiO
2-SiO
2The luminosity of laminated film can be because TiO
2And SiO
2Coupling improve and strengthen physical phenomenon and the available new function that possibly also can derive and make new advances.
Summary of the invention
The technical problem that solves
For fear of the weak point of prior art, the present invention proposes Eu in a kind of adjusting oxide semiconductor matrix
3+The method of luminous intensity is an experimental technique with a kind of preparation technology sol-gel method simple to operation, the adjustable rare earth ion doped oxide semiconductor thin-film of preparation luminous intensity.
Technical scheme
Eu in a kind of adjusting oxide semiconductor matrix
3+The method of luminous intensity is characterized in that step is following:
Step 1 preparation TiO
2Colloidal sol and SiO
2Colloidal sol:
Preparation TiO
2Colloidal sol: positive four butyl esters of metatitanic acid are dissolved in the absolute ethyl alcohol, at room temperature stir and obtained A solution in 0.5 ~ 1 hour, then acetate, deionized water and methyl ethyl diketone are dissolved in the absolute ethyl alcohol and obtained B solution at room temperature ultrasonic 10 ~ 15 minutes; In stirring, B solution is dripped in the A solution then, drip end back restir and obtained yellow limpid TiO in 0.5 ~ 1 hour
2Colloidal sol; Said TiO
2The material mol ratio is Ti (OC in the colloidal sol
4H
9)
4: acetate (H+): H
2O: methyl ethyl diketone=1:0.25:6:0.5; Said TiO
2The concentration of colloidal sol is 0.4mol/L;
Preparation SiO
2Colloidal sol: tetraethoxy, deionized water, absolute ethyl alcohol and Virahol are mixed, and 50 ℃ of stirring in water bath and dripping hydrochloric acid continue to stir the SiO that 2 ~ 3h obtains transparent and stable
2Colloidal sol; Said SiO
2The volume ratio of material is a tetraethoxy in the colloidal sol: deionized water: absolute ethyl alcohol: Virahol=16:4:15:15; The amount of said hydrochloric acid is 8/50ml;
Step 3: after the glass substrate oven dry, immerse the Eu that makes
3+In the adulterated composite oxide semiconductor colloidal sol, adopt vertically to lift plating method and slowly lift with the speed of 4 ~ 6cm/min and obtain gel-film; Gel-film is dry under 100 ℃, and 300 ℃ ~ 550 ℃ following pre-burnings are cooled to room temperature again;
Step 4: repeating step 3 plated films are until desired thickness, with the gel film that makes 500 ℃ of annealing 4 ~ 5 hours in air, obtain Eu then
3+Adulterated composite oxide semiconductor film.
Said glass substrate was soaked earlier 1 ~ 2 hour with washing composition, Hydrogen chloride, deionized water, acetone, ethanol successively separately, and ultrasonic cleaning is 10 ~ 15 minutes then, and washed glass substrate is put into ethanol.
Beneficial effect
Eu in a kind of adjusting oxide semiconductor matrix that the present invention proposes
3+The method of luminous intensity is crucial suitable calcined temperature and the annealing process of confirming, through selecting the different proportioning regulation and control of sol volume Eu
3+Adulterated oxide semiconductor thin-film.Through adopting the method for mixing two kinds of colloidal sols, realized Eu
3+The adjusting of luminous intensity is for the preparation of the oxide semiconductor element of realization rare earth ion HS light-emitting film later on provides a kind of possibility.
Description of drawings
Fig. 1 is the schema that the present invention adopts the colloidal sol preparation;
Fig. 2 is the different ratios blended Eu under the different calcined temperatures that make of the present invention
3+Adulterated composite oxides are partly led the pl-figure of film;
Fig. 2 is Eu under ℃ pre-burning a.300
3+Adulterated composite oxide semiconductor film light photoluminescence figure;
Fig. 2 is Eu under ℃ pre-burning b.400
3+Adulterated composite oxide semiconductor film light photoluminescence figure;
Fig. 2 is Eu under ℃ pre-burning c.500
3+Adulterated composite oxide semiconductor film light photoluminescence figure;
Fig. 2 is Eu under ℃ pre-burning d.550
3+Adulterated composite oxide semiconductor film light photoluminescence figure.
Embodiment
Combine embodiment, accompanying drawing that the present invention is further described at present:
Embodiment 1
TiO
2The preparation of colloidal sol: with positive four butyl esters of metatitanic acid is raw material; Absolute ethyl alcohol is a solvent; Methyl ethyl diketone is a sequestrant, is catalyzer with acetate, and raw material is dissolved in the solvent; Stir under the room temperature and obtained A solution in 0.5 ~ 1 hour, then acetate, deionized water, sequestrant (methyl ethyl diketone (AcAc)) are dissolved in the absolute ethyl alcohol and obtained B solution at room temperature ultrasonic 10 ~ 15 minutes.At last the B drips of solution is added in the intensively stirred A solution, drips end back restir and obtained yellow limpid colloidal sol in 0.5 ~ 1 hour, the material mol ratio is Ti (OC in the colloidal sol
4H
9)
4: catalyzer (H+): H
2O:AcAc=1:0.25:6:0.5, synthetic TiO
2Colloidal sol, the concentration of colloidal sol are 0.4mol/L;
SiO
2The preparation of colloidal sol: tetraethoxy, deionized water, absolute ethyl alcohol, Virahol are mixed; 50 ℃ of left and right sides stirring in water bath also drip several hydrochloric acid; Continue to stir the colloidal sol that 2 ~ 3h obtains transparent and stable; The volume ratio of material is a tetraethoxy in the colloidal sol: deionized water: absolute ethyl alcohol: Virahol=16:4:15:15, and the amount of hydrochloric acid is 8/50ml;
Eu
3+The preparation of adulterated composite oxide semiconductor colloidal sol: according to TiO
2/ (TiO
2+ SiO
2)=0.2,0.5,0.8 and 1.0 ratio (TV is 50ml) be mixed sols stir about 1 hour at room temperature directly, again with a certain amount of rare earth Eu
3+, with Eu
3+With (TiO
2+ SiO
2) mol ratio be 1.4% to join in the above-mentioned colloidal sol, continue to stir 0.5 ~ 1 hour Eu
3+Adulterated composite oxide semiconductor colloidal sol at room temperature left standstill in the air 24 ~ 48 hours;
Lifting plating method with dipping slowly lifts with the speed of 4 ~ 6cm/min on the glass substrate of clean dried and obtains gel-film; Each layer film is through pre-burning 15 ~ 20min under 100 ℃ of drying 10 ~ 15min, the 300 ℃ of temperature; Repeat plated film until desired thickness after being cooled to room temperature again, then the gel film that makes was annealed 4 ~ 5 hours in 500 ℃ of air.The luminous intensity of PE LS55 spectrophotofluorometer test result show sample about the 615nm place of U.S. PE company is adjustable from 2.046arb.unit to 75.684arb.unit.
TiO
2The preparation of colloidal sol: with positive four butyl esters of metatitanic acid is raw material; Absolute ethyl alcohol is a solvent; Methyl ethyl diketone is a sequestrant, is catalyzer with acetate, and raw material is dissolved in the solvent; Stir under the room temperature and obtained A solution in 0.5 ~ 1 hour, then acetate, deionized water, sequestrant (methyl ethyl diketone (AcAc)) are dissolved in the absolute ethyl alcohol and obtained B solution at room temperature ultrasonic 10 ~ 15 minutes.At last the B drips of solution is added in the intensively stirred A solution, drips end back restir and obtained yellow limpid colloidal sol in 0.5 ~ 1 hour, the material mol ratio is Ti (OC in the colloidal sol
4H
9)
4: catalyzer (H+): H
2O:AcAc=1:0.25:6:0.5, synthetic TiO
2Colloidal sol, the concentration of colloidal sol are 0.4mol/L;
SiO
2The preparation of colloidal sol: tetraethoxy, deionized water, absolute ethyl alcohol, Virahol are mixed; 50 ℃ of left and right sides stirring in water bath also drip several hydrochloric acid; Continue to stir the colloidal sol that 2 ~ 3h obtains transparent and stable; The volume ratio of material is a tetraethoxy in the colloidal sol: deionized water: absolute ethyl alcohol: Virahol=16:4:15:15, and the amount of hydrochloric acid is 8/50ml;
Eu
3+The preparation of adulterated composite oxide semiconductor colloidal sol: according to TiO
2/ (TiO
2+ SiO
2)=0.2,0.5,0.8 and 1.0 ratio (TV is 50ml) be mixed sols stir about 1 hour at room temperature directly, again with a certain amount of rare earth Eu
3+, with Eu
3+With (TiO
2+ SiO
2) mol ratio be 1.4% to join in the above-mentioned colloidal sol, continue to stir 0.5 ~ 1 hour Eu
3+Adulterated composite oxide semiconductor colloidal sol at room temperature left standstill in the air 24 ~ 48 hours;
Lifting plating method with dipping slowly lifts with the speed of 4cm/min on the glass substrate of clean dried and obtains gel-film; Each layer film is through pre-burning 15 ~ 20min under 100 ℃ of drying 10 ~ 15min, the 400 ℃ of temperature; Repeat plated film until desired thickness after being cooled to room temperature again, then the gel film that makes was annealed 4 ~ 5 hours in 500 ℃ of air.The luminous intensity of PE LS55 spectrophotofluorometer test result show sample about the 615nm place of U.S. PE company is adjustable from 1.58arb.unit to 72.924arb.unit.
Embodiment 3
TiO
2The preparation of colloidal sol: with positive four butyl esters of metatitanic acid is raw material; Absolute ethyl alcohol is a solvent; Methyl ethyl diketone is a sequestrant, is catalyzer with acetate, and raw material is dissolved in the solvent; Stir under the room temperature and obtained A solution in 0.5 ~ 1 hour, then acetate, deionized water, sequestrant (methyl ethyl diketone (AcAc)) are dissolved in the absolute ethyl alcohol and obtained B solution at room temperature ultrasonic 10 ~ 15 minutes.At last the B drips of solution is added in the intensively stirred A solution, drips end back restir and obtained yellow limpid colloidal sol in 0.5 ~ 1 hour, the material mol ratio is Ti (OC in the colloidal sol
4H
9)
4: catalyzer (H+): H
2O:AcAc=1:0.25:6:0.5, synthetic TiO
2Colloidal sol, the concentration of colloidal sol are 0.4mol/L;
SiO
2The preparation of colloidal sol: tetraethoxy, deionized water, absolute ethyl alcohol, Virahol are mixed; 50 ℃ of left and right sides stirring in water bath also drip several hydrochloric acid; Continue to stir the colloidal sol that 2 ~ 3h obtains transparent and stable; The volume ratio of material is a tetraethoxy in the colloidal sol: deionized water: absolute ethyl alcohol: Virahol=16:4:15:15, and the amount of hydrochloric acid is 8/50ml;
Eu
3+The preparation of adulterated composite oxide semiconductor colloidal sol: according to TiO
2/ (TiO
2+ SiO
2)=0.2,0.5,0.8 and 1.0 ratio (TV is 50ml) be mixed sols stir about 1 hour at room temperature directly, again with a certain amount of rare earth Eu
3+, with Eu
3+With (TiO
2+ SiO
2) mol ratio be 1.4% to join in the above-mentioned colloidal sol, continue to stir 0.5 ~ 1 hour Eu
3+Adulterated composite oxide semiconductor colloidal sol at room temperature left standstill in the air 24 ~ 48 hours;
Lifting plating method with dipping slowly lifts with the speed of 4 ~ 6cm/min on the glass substrate of clean dried and obtains gel-film; Each layer film is through pre-burning 15 ~ 20min under 100 ℃ of drying 10 ~ 15min, the 500 ℃ of temperature; Repeat plated film until desired thickness after being cooled to room temperature again, then the gel film that makes was annealed 4 ~ 5 hours in 500 ℃ of air.The luminous intensity of PE LS55 spectrophotofluorometer test result show sample about the 615nm place of U.S. PE company is adjustable from 7.76arb.unit to 120.556arb.unit.
Embodiment 4
TiO
2The preparation of colloidal sol: with positive four butyl esters of metatitanic acid is raw material; Absolute ethyl alcohol is a solvent; Methyl ethyl diketone is a sequestrant, is catalyzer with acetate, and raw material is dissolved in the solvent; Stir under the room temperature and obtained A solution in 0.5 ~ 1 hour, then acetate, deionized water, sequestrant (methyl ethyl diketone (AcAc)) are dissolved in the absolute ethyl alcohol and obtained B solution at room temperature ultrasonic 10 ~ 15 minutes.At last the B drips of solution is added in the intensively stirred A solution, drips end back restir and obtained yellow limpid colloidal sol in 0.5 ~ 1 hour, the material mol ratio is Ti (OC in the colloidal sol
4H
9)
4: catalyzer (H+): H
2O:AcAc=1:0.25:6:0.5, synthetic TiO
2Colloidal sol, the concentration of colloidal sol are 0.4mol/L;
SiO
2The preparation of colloidal sol: tetraethoxy, deionized water, absolute ethyl alcohol, Virahol are mixed; 50 ℃ of left and right sides stirring in water bath also drip several hydrochloric acid; Continue to stir the colloidal sol that 2 ~ 3h obtains transparent and stable; The volume ratio of material is a tetraethoxy in the colloidal sol: deionized water: absolute ethyl alcohol: Virahol=16:4:15:15, and the amount of hydrochloric acid is 8/50ml;
Eu
3+The preparation of adulterated composite oxide semiconductor colloidal sol: according to TiO
2/ (TiO
2+ SiO
2)=0.2,0.5,0.8 and 1.0 ratio (TV is 50ml) be mixed sols stir about 1 hour at room temperature directly, again with a certain amount of rare earth Eu
3+, with Eu
3+With (TiO
2+ SiO
2) mol ratio be 1.4% to join in the above-mentioned colloidal sol, continue to stir 0.5 ~ 1 hour Eu
3+Adulterated composite oxide semiconductor colloidal sol at room temperature left standstill in the air 24 ~ 48 hours;
Lifting plating method with dipping slowly lifts with the speed of 4 ~ 6cm/min on the glass substrate of clean dried and obtains gel-film; Each layer film is through pre-burning 15 ~ 20min under 100 ℃ of drying 10 ~ 15min, the 550 ℃ of temperature; Repeat plated film until desired thickness after being cooled to room temperature again, then the gel film that makes was annealed 4 ~ 5 hours in 500 ℃ of air.The luminous intensity of PE LS55 spectrophotofluorometer test result show sample about the 615nm place of U.S. PE company is adjustable from 3.589arb.unit to 159.812arb.unit.
Claims (2)
1. regulate Eu in the oxide semiconductor matrix for one kind
3+The method of luminous intensity is characterized in that step is following:
Step 1 preparation TiO
2Colloidal sol and SiO
2Colloidal sol:
Preparation TiO
2Colloidal sol: positive four butyl esters of metatitanic acid are dissolved in the absolute ethyl alcohol, at room temperature stir and obtained A solution in 0.5 ~ 1 hour, then acetate, deionized water and methyl ethyl diketone are dissolved in the absolute ethyl alcohol and obtained B solution at room temperature ultrasonic 10 ~ 15 minutes; In stirring, B solution is dripped in the A solution then, drip end back restir and obtained yellow limpid TiO in 0.5 ~ 1 hour
2Colloidal sol; Said TiO
2The material mol ratio is Ti (OC in the colloidal sol
4H
9)
4: acetate (H+): H
2O: methyl ethyl diketone=1:0.25:6:0.5; Said TiO
2The concentration of colloidal sol is 0.4mol/L;
Preparation SiO
2Colloidal sol: tetraethoxy, deionized water, absolute ethyl alcohol and Virahol are mixed, and 50 ℃ of stirring in water bath and dripping hydrochloric acid continue to stir the SiO that 2 ~ 3h obtains transparent and stable
2Colloidal sol; Said SiO
2The volume ratio of material is a tetraethoxy in the colloidal sol: deionized water: absolute ethyl alcohol: Virahol=16:4:15:15; The amount of said hydrochloric acid is 8/50ml;
Step 2 preparation Eu
3+Adulterated composite oxide semiconductor colloidal sol: according to TiO
2/ (TiO
2+ SiO
2Two kinds of TiO of the mixed of)=0.2 ~ 1.0
2And SiO
2Colloidal sol is stir about 1 hour at room temperature, again with rare earth Eu
3+, according to Eu
3+/ (TiO
2+ SiO
2) mol ratio 1.4% join in the above-mentioned colloidal sol, continue to stir and to obtain Eu in 0.5 ~ 1 hour
3+Adulterated composite oxide semiconductor colloidal sol at room temperature left standstill in the air 24 ~ 48 hours;
Step 3: after the glass substrate oven dry, immerse the Eu that makes
3+In the adulterated composite oxide semiconductor colloidal sol, adopt vertically to lift plating method and slowly lift with the speed of 4 ~ 6cm/min and obtain gel-film; Gel-film is dry under 100 ℃, and 300 ℃ ~ 550 ℃ following pre-burnings are cooled to room temperature again;
Step 4: repeating step 3 plated films are until desired thickness, with the gel film that makes 500 ℃ of annealing 4 ~ 5 hours in air, obtain Eu then
3+Adulterated composite oxide semiconductor film.
2. according to Eu in the said adjusting oxide semiconductor of claim 1 matrix
3+The method of luminous intensity is characterized in that:
Said glass substrate was soaked earlier 1 ~ 2 hour with washing composition, Hydrogen chloride, deionized water, acetone, ethanol successively separately, and ultrasonic cleaning is 10 ~ 15 minutes then, and washed glass substrate is put into ethanol.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2012103105928A CN102827606A (en) | 2012-08-28 | 2012-08-28 | Method for adjusting Eu<3+> luminous intensity in oxide semiconductor substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2012103105928A CN102827606A (en) | 2012-08-28 | 2012-08-28 | Method for adjusting Eu<3+> luminous intensity in oxide semiconductor substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102827606A true CN102827606A (en) | 2012-12-19 |
Family
ID=47330921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2012103105928A Pending CN102827606A (en) | 2012-08-28 | 2012-08-28 | Method for adjusting Eu<3+> luminous intensity in oxide semiconductor substrate |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102827606A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102154009A (en) * | 2011-03-08 | 2011-08-17 | 西北大学 | SiO2: RE light-emitting film taking TiO2 nanotube array as carrier and preparation method thereof |
-
2012
- 2012-08-28 CN CN2012103105928A patent/CN102827606A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102154009A (en) * | 2011-03-08 | 2011-08-17 | 西北大学 | SiO2: RE light-emitting film taking TiO2 nanotube array as carrier and preparation method thereof |
Non-Patent Citations (2)
Title |
---|
王丹红等: "ZnO缓冲层退火温度对TiO2:Eu/ZnO薄膜光致发光性能的影响", 《材料导报B:研究篇》, vol. 25, no. 11, 30 November 2011 (2011-11-30) * |
赵建果等: "退火温度对Eu3+掺杂TiO2-SiO2复合薄膜的发光影响", 《功能材料与器件学报》, vol. 17, no. 4, 31 August 2011 (2011-08-31) * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101337772B (en) | Method for preparing transparent rare-earth-doped bismuth titanate luminous ferro-electricity thin film | |
CN103408229A (en) | Method for preparing silica broadband antireflection film by adjusting porosity | |
CN103723928A (en) | Preparation method of ultra-hydrophilic nano TiO2 thin film | |
CN103325859A (en) | Preparation method of ITO thin film | |
CN105776884A (en) | Porous silica anti-reflective film and preparation method thereof | |
CN111364015A (en) | WO for intelligent window3Preparation method of laminated composite electrochromic film | |
CN101898872B (en) | Method for preparing NiO2 inorganic complex organic electrochromic film | |
CN102758200B (en) | Preparing method for sol-gel silica film | |
CN102351434A (en) | Cerium-aluminum codoped zinc oxide film and preparation method thereof | |
CN101786798B (en) | Vanadium-based multiple coating liquid, composite film and preparation method and application thereof | |
CN102746846A (en) | Preparation method of zinc oxide-titanium oxide composite semiconductor film with adjustable luminescent intensity | |
CN102463130A (en) | Method for preparing modified TiO2 coatings by sol-gel method | |
CN102827606A (en) | Method for adjusting Eu<3+> luminous intensity in oxide semiconductor substrate | |
CN103666473B (en) | Method for preparing europium ion doped lanthanum aluminum long afterglow light-emitting film | |
CN105776886A (en) | Preparation method of silicon oxide anti-reflection film with low refraction rate | |
CN114644461B (en) | Preparation technology of multifunctional ATO hydrophobic coating based on sol-gel method | |
CN107892488B (en) | Blue light eye-protecting glass is prevented to coating film type | |
CN105088199A (en) | Method for preparing VO2 nanometer film with surface orderly microstructure | |
CN103553361B (en) | A kind of Al 2o 3-SiO 2-TiO 2the preparation method of inorganic anti-reflection film | |
CN102593239A (en) | Preparation method of latticed textured azo compound (AZO) transparent conductive membrane | |
CN103193386B (en) | The preparation method of the mesoporous glass of europium doping phosphoric acid aluminium | |
CN102251236A (en) | Yttrium-aluminum co-doped zinc oxide film and preparation method thereof | |
CN112831076B (en) | Preparation method of high-water-resistance transparent polyimide film | |
CN104005011A (en) | Preparation method for Cu-Al co-doped p-type ZnO film | |
CN103113897B (en) | Method for preparing rare-earth metal fluoride REF3 film with trifluoroacetate solution |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20121219 |