CN102799102A - Self-tuning method and device for temperature control parameters of passive CPT (Coherent Population Trapping) atomic clock - Google Patents
Self-tuning method and device for temperature control parameters of passive CPT (Coherent Population Trapping) atomic clock Download PDFInfo
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- CN102799102A CN102799102A CN2012102260292A CN201210226029A CN102799102A CN 102799102 A CN102799102 A CN 102799102A CN 2012102260292 A CN2012102260292 A CN 2012102260292A CN 201210226029 A CN201210226029 A CN 201210226029A CN 102799102 A CN102799102 A CN 102799102A
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Abstract
The invention discloses a self-tuning method for temperature control parameters of a passive CPT (Coherent Population Trapping) atomic clock. The method comprises the following steps of: acquiring digital temperature information of an atomic vapor bubble and a VCSEL (Vertical Cavity Surface Emitting Laser); carrying out PID (Proportion Integration Differentiation) operations on difference values between the digital temperature information which is subjected to filtering processing and digital quantities corresponding to temperature set points; carrying out PWM (Pulse Width Modulation) and delta-sigma modulation on a result obtained after the PID operations, and then, outputting the result to a peripheral circuit for heating and refrigerating; and self-tuning temperature control PID parameters of the atomic vapor bubble and the VCSEL. The invention further discloses a self-tuning device for the temperature control parameters of the passive CPT atomic clock. The method and the device have the advantages that the full-duplex communication between the passive CPT atomic clock and an upper computer is realized, the self-tuning of the temperature control PID parameters can be carried out, the accuracy of regulation of temperature control is improved, the power consumption is low, and the accuracy is high.
Description
Technical field
The invention belongs to the atomic clock field, the temperature control parameter self-tuning method that is specifically related to a kind of passive-type CPT atomic clock also relates to a kind of temperature control parameter self-tuning device of passive-type CPT atomic clock, is applicable to passive-type CPT atomic clock.
Background technology
Passive-type CPT atomic clock is based on a kind of atomic clock that relevant bi-coloured light realizes with the CPT resonance effect of atomic interaction generation, owing to the clear superiority on its power consumption and the volume is developed rapidly.Passive-type CPT atomic clock mainly is made up of physical system, microwave system, servo-drive system and temperature control system four parts.Physical system is the core component of passive-type CPT atomic clock, mainly is made up of atom steam bubble, VCSEL, photodetector etc.Control atom steam bubble in the physical system and VCSEL temperature stable more, physical system and then atomic clock serviceability are good more.Particularly with temperature long-term rise and fall be controlled at the little scope of trying one's best be obtain passive-type CPT atomic clock outstanding in, the essential condition of long-term frequency stability index.Atom steam bubble and VCSEL work in different temperatures in the physical system of the passive-type CPT atomic clock that we develop, and need carry out temperature control respectively.Wherein atom steam bubble need guarantee enough work atom and laser interaction acquisition high-quality CPT frequency discrimination signal through the heating temperature control in higher temperature; And VCSEL need just can provide the laser of required wavelength when hanging down than the temperature of physical system of living in, therefore needs through the refrigeration temperature control in lower temperature.In addition, because employed VCSEL output wavelength is very obvious with temperature variation, need could keep stablizing of output wavelength than high one to two magnitude of atom steam bubble to the temperature-controlled precision of VCSEL.
At present existing multiple temperature control system scheme is applied to atomic clock; Temperature control system power consumption through Realization of Analog Circuit and volume are big and be not easy to regulate; Be not suitable for being applied to the passive-type CPT atomic clock of small size, low-power consumption, the Signal-to-Noise that digital temperature control circuit commonly used exists controlled variable to be difficult to regulate, gather hangs down and causes problems such as temperature-controlled precision is not high.
Summary of the invention
The object of the present invention is to provide a kind of temperature control parameter self-tuning method of passive-type CPT atomic clock.This method utilization is carried out full-duplex communication based on the host computer and the passive-type CPT atomic clock of LabVIEW development platform, has realized adjusting certainly to atom steam bubble in the physical system of passive-type CPT atomic clock and VCSEL temperature control parameter.
Another object of the present invention is to provide a kind of temperature control parameter self-tuning device of passive-type CPT atomic clock.This device can be controlled atom steam bubble in the physical system of passive-type CPT atomic clock and VCSEL temperature effectively; And under factor affecting such as variation of ambient temperature and noise, the temperature control parameter is carried out from adjusting through host computer based on the LabVIEW development platform.This device precision is high, low in energy consumption, satisfies the requirement of passive-type CPT atomic clock to high precision and low-power consumption, and has greatly saved the human resources when temperature control is debugged, and is very beneficial for the commercialization of passive-type CPT atomic clock.
To achieve these goals, the present invention adopts following technical scheme:
A kind of temperature control parameter self-tuning method of passive-type CPT atomic clock may further comprise the steps:
Step 1, gather the temperature information of atom steam bubble and VCSEL, and convert corresponding digital temperature information to and be delivered to microcontroller;
Step 3, calculating are through the digital temperature information of the atom steam bubble after the Filtering Processing and the difference of the pairing digital quantity of atom steam bubble temperature set points; This difference is carried out the PID computing; The PID calculated result is carried out the modulation of PWM and delta-sigma, utilize result after PWM and delta-sigma are modulated to control heater strip and heat; Calculate through the digital temperature information of the VCSEL after the Filtering Processing and the difference of the pairing digital quantity of VCSEL temperature set points; This difference is carried out the PID computing; The PID calculated result is carried out the modulation of PWM and delta-sigma, utilize result after PWM and delta-sigma are modulated to control TEC and freeze;
Step 4, the temperature control pid parameter value of atom steam bubble is carried out from adjusting; The temperature control pid parameter value of VCSEL is carried out from adjusting.
Aforesaid step 1 may further comprise the steps:
Step 1.1, first thermistor is arranged at the atom steam bubble place, second thermistor is arranged on the VCSEL place;
Step 1.2, the information of the first thermistor collection is sent to the digital temperature information that obtains atom steam bubble after analog to digital converter is changed through first Wheatstone bridge and first instrument amplifier successively; The information of the second thermistor collection is sent to the digital temperature information that obtains VCSEL after analog to digital converter is changed through second Wheatstone bridge and second instrument amplifier successively;
Step 1.3, analog to digital converter are sent to microcontroller with the digital temperature information of atom steam bubble and the digital temperature information of VCSEL.
Filtering Processing in the aforesaid step 2 is based on Kalman filtering.
The temperature control pid parameter value to atom steam bubble in the aforesaid step 4 carries out may further comprise the steps from adjusting:
Step 4.1, judge the data that can collect reflection atom steam bubble temperature variation based on the host computer of LabVIEW development platform, if can, then carry out tracing display, and get into step 4.2 with the form of oscillogram; If can not, then wait for until overtime, and the output error prompting, finish from adjusting;
The sweep starting point and the sweep stopping point of the temperature control pid parameter value of step 4.2, initialization atom steam bubble; Send atom steam bubble PID initial value to microcontroller; The optimum P of initialization atom steam bubble, I, D value are null value; With atom steam bubble P value initialization is atom steam bubble P scan value starting point, and atom steam bubble P value is sent atom steam bubble P value to microcontroller after increasing with fixed step size, and microcontroller carries out temperature control under atom steam bubble P value;
Step 4.3, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.4, increase atom steam bubble P value with fixed step size; Judge whether atom steam bubble P value is atom steam bubble P scan value terminal point; If, then with the quadratic sum of difference in the step 4.3 a hour corresponding atom steam bubble P value be made as the optimum P value of atom steam bubble, and atom steam bubble optimum P value is sent to microcontroller; Microcontroller carries out temperature control under the optimum P value of atom steam bubble, get into step 4.5; If not, then atom steam bubble P value being sent to microcontroller, microcontroller carries out temperature control and returns step 4.3 under atom steam bubble P value;
Step 4.5, be atom steam bubble I scan value starting point with atom steam bubble I value initialization; Atom steam bubble I value is sent atom steam bubble I value to microcontroller after increasing with fixed step size, and microcontroller carries out temperature control under optimum P value of atom steam bubble and atom steam bubble I value;
Step 4.6, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.7, increase atom steam bubble I value with fixed step size; Judge whether atom steam bubble I value is atom steam bubble I scan value terminal point; If, then with the quadratic sum of difference in the step 4.6 a hour corresponding atom steam bubble I value be made as the optimum I value of atom steam bubble, and atom steam bubble optimum I value is sent to microcontroller; Microcontroller carries out temperature control under optimum P value of atom steam bubble and the optimum I value of atom steam bubble, get into step 4.8; If not, then atom steam bubble I value being sent to microcontroller, microcontroller carries out temperature control and returns step 4.6 under optimum P value of atom steam bubble and atom steam bubble I value;
Step 4.8, be atom steam bubble D scan value starting point with atom steam bubble D value initialization; Atom steam bubble D value is sent atom steam bubble D value to microcontroller after increasing with fixed step size, and microcontroller carries out temperature control under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and atom steam bubble D value;
Step 4.9, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.10, increase atom steam bubble D value with fixed step size; Judge whether atom steam bubble D value is atom steam bubble D scan value terminal point; If, then with the quadratic sum of difference in the step 4.9 a hour corresponding atom steam bubble D value be made as the optimum D value of atom steam bubble, and atom steam bubble optimum D value is sent to microcontroller; Microcontroller carries out temperature control under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and the optimum D value of atom steam bubble, get into step 4.11; If not, then atom steam bubble D value being sent to microcontroller, microcontroller carries out temperature control and returns step 4.9 under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and atom steam bubble D value;
The difference of optimal PID parameter value before the temperature control of step 4.11, the temperature control optimal PID parameter value that calculates current atom steam bubble and atom steam bubble; If difference is less than setting value; Then finish the adjusting certainly of temperature control pid parameter value of atom steam bubble, otherwise, step 4.2 returned.
The temperature control pid parameter value to VCSEL in the aforesaid step 4 carries out may further comprise the steps from adjusting:
Step 5.1, judge the data that can collect reflection VCSEL temperature variation based on the host computer of LabVIEW development platform, if can, then carry out tracing display, and get into step 5.2 with the form of oscillogram; If can not, then wait for until overtime, and the output error prompting, finish from adjusting;
The sweep starting point and the sweep stopping point of step 5.2, initialization VCSEL temperature control pid parameter value; Send the PID initial value to microcontroller; The optimum P of initialization VCSEL, I, D value are null value; With the P value initialization of VCSEL is the P scan value starting point of VCSEL, and the P value that the P value of VCSEL is sent VCSEL after increasing with fixed step size is to microcontroller, and microcontroller carries out temperature control under the P of VCSEL value;
Step 5.3, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.4, the P value of VCSEL of increasing with fixed step size; Whether the P value of judging VCSEL is the P scan value terminal point of VCSEL; If the P value of then that the quadratic sum of difference in the step 5.3 is hour corresponding VCSEL is made as the optimum P value of VCSEL, and the optimum P value of VCSEL is sent to microcontroller; Microcontroller carries out temperature control under the optimum P value of VCSEL, get into step 5.5; If not then the P value with VCSEL is sent to microcontroller, microcontroller carries out temperature control and returns step 5.3 under the P of VCSEL value;
Step 5.5, be the I scan value starting point of VCSEL with the I value initialization of VCSEL, the I value that the I value of VCSEL is sent VCSEL after increasing with fixed step size is to microcontroller, and microcontroller carries out temperature control under the I value of the optimum P value of VCSEL and VCSEL;
Step 5.6, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.7, the I value of VCSEL of increasing with fixed step size; Whether the I value of judging VCSEL is the I scan value terminal point of VCSEL; If the I value of then that the quadratic sum of difference in the step 5.6 is hour corresponding VCSEL is made as the optimum I value of VCSEL, and the optimum I value of VCSEL is sent to microcontroller; Microcontroller carries out temperature control under the optimum I value of the optimum P value of VCSEL and VCSEL, get into step 5.8; If not then the I value with VCSEL is sent to microcontroller, microcontroller carries out temperature control and returns step 5.6 under the I value of the optimum P value of VCSEL and VCSEL;
Step 5.8, be the D scan value starting point of VCSEL with the D value initialization of VCSEL; The D value that the D value of VCSEL is sent VCSEL after increasing with fixed step size is to microcontroller, and microcontroller carries out temperature control under the D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL;
Step 5.9, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.10, the D value of VCSEL of increasing with fixed step size; Whether the D value of judging VCSEL is the D scan value terminal point of VCSEL; If the D value of then that the quadratic sum of difference in the step 5.9 is hour corresponding VCSEL is made as the optimum D value of VCSEL, and the optimum D value of VCSEL is sent to microcontroller; Microcontroller carries out temperature control under the optimum D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL, get into step 5.11; If not then the D value with VCSEL is sent to microcontroller, microcontroller carries out temperature control and returns step 5.9 under the D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL;
Step 5.11, calculate the optimum temperature control pid parameter value of current VCSEL and the difference of the optimum temperature control pid parameter value of preceding VCSEL, less than setting value, then finish the adjusting certainly of temperature control pid parameter value of VCSEL as if difference, otherwise, step 5.2 returned.
A kind of temperature control parameter self-tuning device of passive-type CPT atomic clock comprises
First thermistor is used to measure the temperature of atom steam bubble;
Second thermistor is used to measure the temperature of VCSEL;
The first waveform transformation module is used for the output of first thermistor is carried out the shaping amplification and is sent to analog to digital converter;
The second waveform transformation module is used for the output of second thermistor is carried out the shaping amplification and is sent to analog to digital converter;
Analog to digital converter, the data that are used to carry out after analog to digital conversion also will be changed are sent to microcontroller;
Microcontroller is used to carry out data acquisition and PID computing, and controls the folding of first switch and second switch according to the PID operation result, through RS232 interface and upper machine communication;
First switch is connected with heater strip through first low-pass filter;
Second switch is connected with TEC through second low-pass filter;
Heater strip is used to heat atom steam bubble; With
TEC is used to the VCSEL that freezes.
The aforesaid first waveform transformation module comprises first Wheatstone bridge and the first instrument amplifier that connects successively; The described second waveform transformation module comprises second Wheatstone bridge and the second instrument amplifier that connects successively.
Compared with prior art, advantage of the present invention and beneficial effect are:
1, the present invention has realized passive-type CPT atomic clock and based on the full-duplex communication between the host computer of LabVIEW development platform; Remedy the deficiency that the digital quantity of the inner reflection of passive-type CPT atomic clock temperature variation can't be measured, improved VCSEL and temperature controlled debugging of atom steam bubble and diagnostic mode in the physical system of passive-type CPT atomic clock.
When 2, debugging the temperature control pid parameter; The present invention adopts the host computer based on the LabVIEW development platform to carry out improved the degree of regulation of temperature control pid parameter, and whole debug process need not human intervention from adjusting; Greatly save human resources, helped the commercialization of passive-type CPT atomic clock.
3, the temperature control circuit of the present invention's realization is low in energy consumption, precision is high, has obviously improved passive-type CPT frequency stability of atomic clock, is particularly suitable for being applied to passive-type CPT atomic clock.
Description of drawings
Fig. 1 is the principle schematic of apparatus of the present invention;
Fig. 2 is the principle schematic of first Wheatstone bridge of the present invention/second Wheatstone bridge;
Fig. 3 is the schematic flow sheet of the inventive method;
The schematic flow sheet that Fig. 4 adjusts for the inventive method pid parameter certainly.
Wherein: 1-atom steam bubble, 2-VCSEL, 3-first thermistor, 4-second thermistor, 5-first Wheatstone bridge; 6-second Wheatstone bridge, 7-first instrument amplifier, 8-second instrument amplifier, 9-analog to digital converter, 10-microcontroller; 11-first switch, 12-second switch, 13-first low-pass filter, 14-second low-pass filter, 15-heater strip; 16-TEC, 17-level switch module, 18-RS232 interface, 19-host computer.
Embodiment
Below in conjunction with accompanying drawing, technical scheme of the present invention is done further to describe in detail.
Like Fig. 3 ~ shown in Figure 4, a kind of temperature control parameter self-tuning method of passive-type CPT atomic clock may further comprise the steps:
Step 1, gather the temperature information of atom steam bubble 1 and VCSEL2, and convert corresponding digital temperature information to and be delivered to microcontroller 10;
Step 1 may further comprise the steps:
Step 1.1, first thermistor 3 is arranged at atom steam bubble 1 place, second thermistor 4 is arranged on the VCSEL2 place;
Step 1.2, the information that first thermistor 3 is gathered are sent to the digital temperature information that obtains atom steam bubble 1 after analog to digital converter 9 is changed through first Wheatstone bridge 5 and first instrument amplifier 7 successively; The information that second thermistor 4 is gathered is sent to the digital temperature information that obtains VCSEL2 after analog to digital converter 9 is changed through second Wheatstone bridge 6 with second instrument amplifier 8 successively;
Step 1.3, analog to digital converter 9 are sent to microcontroller 10 with the digital temperature information of atom steam bubble 1 and the digital temperature information of VCSEL2.
The digital temperature information of step 2,10 pairs of atom steam bubbles 1 of microcontroller and VCSEL2 is carried out Filtering Processing;
Filtering Processing in the step 2 is based on Kalman filtering.
Step 3, calculating are through the digital temperature information of the atom steam bubble 1 after the Filtering Processing and the difference of the pairing digital quantity of atom steam bubble temperature set points; This difference is carried out the PID computing; The PID calculated result is carried out the modulation of PWM and delta-sigma, utilize result after PWM and delta-sigma are modulated to control heater strip 15 and heat; Calculate through the digital temperature information of the VCSEL2 after the Filtering Processing and the difference of the pairing digital quantity of VCSEL temperature set points; This difference is carried out the PID computing; The PID calculated result is carried out the modulation of PWM and delta-sigma, utilize result after PWM and delta-sigma are modulated to control TEC16 and freeze;
Step 4, the temperature control pid parameter value of atom steam bubble is carried out from adjusting; The temperature control pid parameter value of VCSEL is carried out from adjusting.
The temperature control pid parameter value to atom steam bubble in the step 4 carries out may further comprise the steps from adjusting:
Step 4.1, judge the data that can collect reflection atom steam bubble temperature variation based on the host computer of LabVIEW development platform 19, if can, then carry out tracing display, and get into step 4.2 with the form of oscillogram; If can not, then wait for until overtime, and the output error prompting, finish from adjusting;
The sweep starting point and the sweep stopping point of the temperature control pid parameter value of step 4.2, initialization atom steam bubble; Send atom steam bubble PID initial value to microcontroller 10; The optimum P of initialization atom steam bubble, I, D value are null value; With atom steam bubble P value initialization is atom steam bubble P scan value starting point, and atom steam bubble P value is sent atom steam bubble P value to microcontroller 10 after increasing with fixed step size, and microcontroller 10 carries out temperature control under atom steam bubble P value;
Step 4.3, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.4, increase atom steam bubble P value with fixed step size; Judge whether atom steam bubble P value is atom steam bubble P scan value terminal point; If, then with the quadratic sum of difference in the step 4.3 a hour corresponding atom steam bubble P value be made as the optimum P value of atom steam bubble, and atom steam bubble optimum P value is sent to microcontroller 10; Microcontroller 10 carries out temperature control under the optimum P value of atom steam bubble, get into step 4.5; If not, then atom steam bubble P value being sent to microcontroller 10, microcontroller 10 carries out temperature control and returns step 4.3 under atom steam bubble P value;
Step 4.5, be atom steam bubble I scan value starting point with atom steam bubble I value initialization; Atom steam bubble I value is sent atom steam bubble I value to microcontroller 10 after increasing with fixed step size, and microcontroller 10 carries out temperature control under optimum P value of atom steam bubble and atom steam bubble I value;
Step 4.6, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.7, increase atom steam bubble I value with fixed step size; Judge whether atom steam bubble I value is atom steam bubble I scan value terminal point; If, then with the quadratic sum of difference in the step 4.6 a hour corresponding atom steam bubble I value be made as the optimum I value of atom steam bubble, and atom steam bubble optimum I value is sent to microcontroller 10; Microcontroller 10 carries out temperature control under optimum P value of atom steam bubble and the optimum I value of atom steam bubble, get into step 4.8; If not, then atom steam bubble I value being sent to microcontroller 10, microcontroller 10 carries out temperature control and returns step 4.6 under optimum P value of atom steam bubble and atom steam bubble I value;
Step 4.8, be atom steam bubble D scan value starting point with atom steam bubble D value initialization; Atom steam bubble D value is sent atom steam bubble D value to microcontroller 10 after increasing with fixed step size, and microcontroller 10 carries out temperature control under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and atom steam bubble D value;
Step 4.9, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.10, increase atom steam bubble D value with fixed step size; Judge whether atom steam bubble D value is atom steam bubble D scan value terminal point; If, then with the quadratic sum of difference in the step 4.9 a hour corresponding atom steam bubble D value be made as the optimum D value of atom steam bubble, and atom steam bubble optimum D value is sent to microcontroller 10; Microcontroller 10 carries out temperature control under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and the optimum D value of atom steam bubble, get into step 4.11; If not, then atom steam bubble D value being sent to microcontroller 10, microcontroller 10 carries out temperature control and returns step 4.9 under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and atom steam bubble D value;
The difference of optimal PID parameter value before the temperature control of step 4.11, the temperature control optimal PID parameter value that calculates current atom steam bubble and atom steam bubble; If difference is less than setting value; Then finish the adjusting certainly of temperature control pid parameter value of atom steam bubble, otherwise, step 4.2 returned.
The temperature control pid parameter value to VCSEL in the step 4 carries out may further comprise the steps from adjusting:
Step 5.1, judge the data that can collect reflection VCSEL temperature variation based on the host computer of LabVIEW development platform 19, if can, then carry out tracing display, and get into step 5.2 with the form of oscillogram; If can not, then wait for until overtime, and the output error prompting, finish from adjusting;
The sweep starting point and the sweep stopping point of step 5.2, initialization VCSEL temperature control pid parameter value; Send the PID initial value to microcontroller 10; The optimum P of initialization VCSEL, I, D value are null value; With the P value initialization of VCSEL is the P scan value starting point of VCSEL, sends P value to the microcontroller 10 of VCSEL after the P value of VCSEL increases with fixed step size, and microcontroller 10 carries out temperature control under the P of VCSEL value;
Step 5.3, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.4, the P value of VCSEL of increasing with fixed step size; Whether the P value of judging VCSEL is the P scan value terminal point of VCSEL; If the P value of then that the quadratic sum of difference in the step 5.3 is hour corresponding VCSEL is made as the optimum P value of VCSEL, and the optimum P value of VCSEL is sent to microcontroller 10; Microcontroller 10 carries out temperature control under the optimum P value of VCSEL, get into step 5.5; If not then the P value with VCSEL is sent to microcontroller 10, microcontroller 10 carries out temperature control and returns step 5.3 under the P of VCSEL value;
Step 5.5, be the I scan value starting point of VCSEL with the I value initialization of VCSEL, send I value to the microcontroller 10 of VCSEL after the I value of VCSEL increases with fixed step size, microcontroller 10 carries out temperature control under the I value of the optimum P value of VCSEL and VCSEL;
Step 5.6, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.7, the I value of VCSEL of increasing with fixed step size; Whether the I value of judging VCSEL is the I scan value terminal point of VCSEL; If the I value of then that the quadratic sum of difference in the step 5.6 is hour corresponding VCSEL is made as the optimum I value of VCSEL, and the optimum I value of VCSEL is sent to microcontroller 10; Microcontroller 10 carries out temperature control under the optimum I value of the optimum P value of VCSEL and VCSEL, get into step 5.8; If not then the I value with VCSEL is sent to microcontroller 10, microcontroller 10 carries out temperature control and returns step 5.6 under the I value of the optimum P value of VCSEL and VCSEL;
Step 5.8, be the D scan value starting point of VCSEL with the D value initialization of VCSEL; Send D value to the microcontroller 10 of VCSEL after the D value of VCSEL increases with fixed step size, microcontroller 10 carries out temperature control under the D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL;
Step 5.9, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.10, the D value of VCSEL of increasing with fixed step size; Whether the D value of judging VCSEL is the D scan value terminal point of VCSEL; If the D value of then that the quadratic sum of difference in the step 5.9 is hour corresponding VCSEL is made as the optimum D value of VCSEL, and the optimum D value of VCSEL is sent to microcontroller 10; Microcontroller 10 carries out temperature control under the optimum D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL, get into step 5.11; If not then the D value with VCSEL is sent to microcontroller 10, microcontroller 10 carries out temperature control and returns step 5.9 under the D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL;
Step 5.11, calculate the optimum temperature control pid parameter value of current VCSEL and the difference of the optimum temperature control pid parameter value of preceding VCSEL, less than setting value, then finish the adjusting certainly of temperature control pid parameter value of VCSEL as if difference, otherwise, step 5.2 returned.
The inventive method is based on following principle:
As shown in Figure 1; First thermistor 3 and second thermistor 4 are placed atom steam bubble place 1 and VCSEL2 place respectively, and first thermistor 3 and second thermistor 4 are connected respectively to first Wheatstone bridge 5 and second Wheatstone bridge 6 of the physical system outside that is positioned at passive-type CPT atomic clock through lead-in wire.Wherein front end temperature collection circuit schematic diagram is as shown in Figure 2.Fixed resistance resistance on first Wheatstone bridge 5 and second Wheatstone bridge 6 is respectively 20k Ω and 5k Ω, and reference voltage is 2.5V, and filter capacitor is 2.2 μ F.The voltage output of first Wheatstone bridge 5 and second Wheatstone bridge 6 is carried out difference through first instrument amplifier 7 and second instrument amplifier 8 respectively and is amplified, and the resistance R G that the instrument amplifier gain wherein is set is 100 Ω, and the instrument amplifier gain is 1001.Result after the amplification gathers and converts into digital signal by analog to digital converter 9 again, and wherein analog-digital bit is 24, and reference voltage is 2.5V, and input clock is 10MHz, and data output rate is 39.0625Hz.
Microcontroller 10 obtains the reflection atom steam bubble 1 of analog to digital converter 9 two paths conversion and the digital signal of VCSEL2 temperature through the SPI interface.Obtaining two kinds of data is employed between analog to digital converter 9 two paths constantly and accomplishes under the switching way.Can know that through calculating atom steam bubble 1 is 0 with the pairing digital quantity of VCSEL2 temperature controlling point.Microcontroller 10 at first is to adopt Kalman filtering algorithm that two kinds of digital signals are carried out Filtering Processing respectively; The signal after then the microcontroller calculation of filtered is handled and the difference of the pairing digital quantity of temperature controlling point; And this difference is carried out PID calculate, wherein the pid parameter value comes from the host computer based on the LabVIEW development platform.In order to improve accuracy of temperature control, the mode that the result after microcontroller calculates PID adopts delta-sigma (Delta-Sigma) modulation and PWM modulation technique to combine is handled.The PWM modulation generation cycle is fixed, and the square wave of EDM Generator of Adjustable Duty Ratio changes equivalent analog quantity through the adjusting to duty cycle square wave, utilizes digital quantity to come the purpose that mimic channel is controlled to reach.Modulate the square wave control switch that obtains with PWM; At any time, it is output as ON and OFF two states, and all signals between this method can make from the processor to the controlled device all are digital forms; Need not to carry out again the digital-to-analog conversion process, and the antijamming capability of this scheme strengthens greatly also.The delta-sigma method is a kind of method of utilizing over-sampling mechanism to improve precision.When needs were exported a certain specific power, the dutycycle of output PWM square wave was no longer fixing, but recently improved the PWM square wave degree of regulation in output cycle according to the duty that the delta-sigma algorithm is repeatedly regulated the PWM square wave.The number of times of regulating in whole output cycle the inside is many more, and the degree of regulation of output PWM square wave is high more.
Microcontroller 10 outputs to first switch 11 and second switch 12 through the two-way PWM square wave that the I/O pin will pass through the delta-sigma modulation; First switch 11 connects first low-pass filter 13; Second switch 12 connects second low-pass filter 13; The controlled quentity controlled variable of two low-pass filters, 13,14 outputs is respectively to the TEC16 of the heater strip 15 of controlling atom steam bubble 1 temperature and control VCSEL2 temperature, thereby realizes temperature controlling.
In temperature controlled processes, mainly realize the adjusting certainly of pid parameter based on the host computer of LabVIEW development platform, and the result after the digital signal of reflection temperature variation and PID calculated monitors in real time.
In the practical implementation process, the program that runs on microcontroller is as shown in Figure 3, and concrete flow process is following:
(1) behind the start-up routine; Initialization analog to digital converter (process 3-1); The data output rate and the sampling channel of analog to digital converter are set; Wherein data output rate is made as 39.0625Hz, and the passage of gathering the digital signal of reflection atom steam bubble temperature variation is made as anode input channel 0 and negative terminal input channel 1, and the passage of gathering the digital signal of reflection VCSEL temperature variation is made as anode input channel 6 and negative terminal input channel 7.
(2) wait for the generation of interrupting (process 3-2); When accomplishing the interruption generation that causes when once sampling by analog to digital converter; Microcontroller is selected sampling channel (process 3-3), reads by turns the digital signal (process 3-5) that digital signal of atom steam bubble temperature variation (process 3-4) and reflection VCSEL temperature variation are reflected in negate.Read after the digital signal of reflection temperature variation; At first digital signal is carried out digital filtering and handle (process 3-6) and (process 3-7); Then filtered data are carried out PID and calculate (process 3-8 and 3-9); Result after afterwards PID being calculated carries out delta-sigma modulation (process 3-10 and 3-11) and PWM modulated process (3-12 and 3-13); Export modulation result to peripheral circuit (process 3-14 and 3-15) at last, and will reflect that the digital signal of temperature variation and PID result of calculation are sent to the host computer (process 3-16 and 3-17) based on the LabVIEW development platform.
(3) wait for the generation of interrupting (process 3-2); When the interruption that is caused by the host computer transmission data based on the LabVIEW development platform takes place; Microcontroller is accepted the pid parameter value (process 3-18) that is used for carrying out the PID computing that host computer sends, and the pid parameter value that is kept among the FLASH is upgraded (process 3-19), after the completion; Restart program (process 3-20) through house dog, thereby the pid parameter that is kept among the FLASH is worth to come into force.
In the practical implementation process, the program that runs on the host computer is as shown in Figure 4.The idiographic flow of program is following:
(1) after the startup LabVIEW program; Can judgement collect the reflection atom steam bubble of passive-type CPT atomic clock transmission and the digital signal (process 4-1) of VCSEL temperature variation; If can collect data; Then the program logarithm according to this form of oscillogram carry out tracing display (process 4-2), and start-up parameter is from the button (process 4-3) of adjusting.If can not collect, then wait for until overtime, and the output error prompting.At first be adjusting certainly to atom steam bubble temperature control parameter.
(2) variation range of initialization atom steam bubble temperature control pid parameter, P value scope is 0.00001 ~ 3, and I value scope is 0.00001 ~ 3, and the D value range is 0.00001 ~ 3, and sends the microcontroller (process 4-4) of PID initial value to passive-type CPT atomic clock.The optimum P of initialization, I, D value are null value (process 4-5), and optimum P, I, D value are used for preserving the optimum value that certain stage obtains.
(3) be sweep starting point (process 4-6) with P value initialization, the P value is sent the P value to microcontroller (process 4-7) after increasing with fixed step size, and microcontroller carries out temperature control under this parameter.The LabVIEW program begins the data that collect are counted, and counts when reaching set definite value (2000) when counting, calculates the quadratic sum (process 4-8) of the difference of this part data digital signal corresponding with temperature controlling point (0).Afterwards; Continuation increases the P value with fixed step size; Microcontroller carries out temperature control after parameter value changes, the data of LabVIEW programmed acquisition temperature control under this parameter value, and count; When counting up to setting value (2000), calculate the quadratic sum of the difference of this segment data digital signal corresponding (0) with temperature controlling point.When the P value is increased to sweep stopping point (process 4-9), with the error amount quadratic sum a hour corresponding P value be made as optimum P value (process 4-10), and put optimum P value and be sent to microcontroller (process 4-11) for the P value.
(4) be sweep starting point (process 4-12) with I value initialization, the I value is sent the I value to microcontroller (process 4-13) after increasing with fixed step size, and microcontroller carries out temperature control under this parameter.The LabVIEW program begins the data that collect are counted, and when the counting number reaches set definite value (2000), calculates the quadratic sum (process 4-14) of the difference of this part data digital signal corresponding with temperature controlling point (0).Afterwards; Continuation increases the I value with fixed step size; Microcontroller carries out temperature control after parameter value changes, the data of LabVIEW programmed acquisition temperature control under this parameter value, and count; When counting up to setting value (2000), calculate the quadratic sum of the difference of this segment data digital signal corresponding (0) with temperature controlling point.When the P value is increased to sweep stopping point (process 4-15), with the error amount quadratic sum a hour corresponding I value be made as optimum I value (process 4-16), and put optimum I value and be sent to microcontroller (process 4-17) for the I value.
(5) be sweep starting point (process 4-18) with D value initialization, the D value is sent the D value to microcontroller (process 4-19) after increasing with fixed step size, and microcontroller carries out temperature control under this parameter.The LabVIEW program begins the data that collect are counted, and when the counting number reaches set definite value (2000), calculates the quadratic sum (process 4-20) of the difference of this part data digital signal corresponding with temperature controlling point (0).Afterwards; Continuation increases the D value with fixed step size; Microcontroller carries out temperature control after parameter value changes, the data of LabVIEW programmed acquisition temperature control under this parameter value, and count; When counting up to setting value (2000), calculate the quadratic sum of the difference of this segment data digital signal corresponding (0) with temperature controlling point.When the D value is increased to sweep stopping point (process 4-21), with the error amount quadratic sum a hour corresponding D value be made as optimum D value (process 4-22), and put optimum D value and be sent to microcontroller (process 4-23) for the D value.
(6) judge whether current optimal pid parameter value and optimal PID parameter value before have very big-difference (process 4-24), if difference is less than setting value, parameter self-tuning is accomplished (process 4-25), otherwise, continue scanning PID (getting back to process 4-6).
So far, accomplished the adjusting certainly of atom steam bubble temperature control parameter, and realized adjusting certainly in the same way VCSEL temperature control parameter.
Like Fig. 1 ~ shown in Figure 2, a kind of temperature control parameter self-tuning device of passive-type CPT atomic clock comprises
First thermistor 3 is used to measure the temperature of atom steam bubble 1;
Second thermistor 4 is used to measure the temperature of VCSEL;
The first waveform transformation module is used for the output of first thermistor 3 is carried out the shaping amplification and is sent to analog to digital converter 9;
The second waveform transformation module is used for the output of second thermistor 4 is carried out the shaping amplification and is sent to analog to digital converter 9;
Analog to digital converter 9, the data that are used to carry out after analog to digital conversion also will be changed are sent to microcontroller 10;
Microcontroller 10 is used to carry out data acquisition and PID computing, and controls the folding of first switch 11 and second switch 12 according to the PID operation result, through RS232 interface and host computer 19 communications;
First switch 11 is connected with heater strip 15 through first low-pass filter 13;
Second switch 12 is connected with TEC16 through second low-pass filter 14;
Heater strip 15 is used to heat atom steam bubble 1; With
TEC16 is used to the VCSEL2 that freezes.
A kind of temperature control parameter self-tuning device of passive-type CPT atomic clock, the described first waveform transformation module comprise first Wheatstone bridge 5 and first instrument amplifier 7 that connects successively; The described second waveform transformation module comprises second Wheatstone bridge 6 and second instrument amplifier 8 that connects successively.
A kind of temperature control parameter self-tuning device of passive-type CPT atomic clock also comprises level switch module, is used for the mutual conversion between Transistor-Transistor Logic level and the RS232 level, so that microcontroller and upper function proper communication;
The RS232 interface is as the communication interface between microcontroller and the host computer;
Based on the host computer of LabVIEW development platform, be used for showing in real time the data of reflection atom steam bubble and VCSEL temperature variation, and the temperature control pid parameter of atom steam bubble and VCSEL is carried out from adjusting.
The first waveform transformation module comprises first Wheatstone bridge 5 and first instrument amplifier 7 that connects successively; The described second waveform transformation module comprises second Wheatstone bridge 6 and second instrument amplifier 8 that connects successively.
Apparatus of the present invention are based on following principle:
The physical system of passive-type CPT atomic clock is development voluntarily, has only related to atom steam bubble 1 and VCSEL2 wherein here.Thermistor is NTC (negative temperature coefficient) thermistor, and it has high sensitivity, responds fast characteristics, can effectively reflect variation of temperature.Fixed resistance on first Wheatstone bridge 5 and second Wheatstone bridge 6 adopt precision for ± 0.02%, temperature coefficient for ± 5ppm/ ℃ precision resistance with the error that reduces bridge resistor and introduce and reduce thermonoise; Wherein with electric bridge that VCSEL place thermistor links to each other on the fixed resistance resistance be 5k Ω, be 20k Ω with fixed resistance resistance on the electric bridge that atom steam bubble place thermistor links to each other.Instrument amplifier adopts the INA333 chip of TI company, is used for amplifying the output signal of electric bridge, and it has advantages such as high cmrr, low noise, small size and low-power consumption.Analog to digital converter adopts the ADS1256 chip of TI company.Microcontroller adopts the MSP430F2619 single-chip microcomputer of TI company.Level transferring chip adopts the MAX3222 chip of TI company.Switch adopts the TS5A4624 of TI company.The RS232 interface is DB9.Host computer based on the LabVIEW development platform is the common computer that the LabVIEW of NI company software has been installed.
As shown in Figure 1: first thermistor 3 and second thermistor 4 lay respectively at that atom steam bubble place 1 links to each other with first Wheatstone bridge 5 with VCSEL place 2, the first thermistors 3 in the physical system of passive-type CPT atomic clock, and second thermistor 4 links to each other with second Wheatstone bridge 6; First Wheatstone bridge 5 links to each other with first instrument amplifier 7; Second Wheatstone bridge 6 links to each other with second instrument amplifier 8, and first instrument amplifier 7 links to each other with analog to digital converter 9, and second instrument amplifier 8 links to each other with analog to digital converter 9; Analog to digital converter 9 links to each other with the SPI interface of microcontroller 10; The I/O pin output of microcontroller 10 links to each other with first switch 11, and the I/O pin output of microcontroller 10 links to each other with second switch 12, and first switch 11 links to each other with first low-pass filter 13; Second switch 12 links to each other with second low-pass filter 14; First low-pass filter 13 links to each other with heater strip 15, and second low-pass filter 14 links to each other with TEC16, and the UART interface of microcontroller 10 links to each other with level switch module 17; Level switch module 17 links to each other with RS232 interface 18, and RS232 interface 18 links to each other with host computer 19 based on the LabVIEW development platform.Wherein the concrete connected mode of Wheatstone bridge and thermistor is as shown in Figure 2, and thermistor links to each other with Wheatstone bridge one arm, and other three arms of Wheatstone bridge link to each other with fixed resistance.
Specific embodiment described herein only is that the present invention's spirit is illustrated.Person of ordinary skill in the field of the present invention can make various modifications or replenishes or adopt similar mode to substitute described specific embodiment, but can't depart from spirit of the present invention or surmount the defined scope of appended claims.
Claims (7)
1. the temperature control parameter self-tuning method of a passive-type CPT atomic clock is characterized in that, may further comprise the steps:
Step 1, gather the temperature information of atom steam bubble (1) and VCSEL (2), and the digital temperature information that converts correspondence to is delivered to microcontroller (10);
Step 2, microcontroller (10) carry out Filtering Processing to the digital temperature information of atom steam bubble (1) and VCSEL (2);
Step 3, calculating are through the digital temperature information of the atom steam bubble (1) after the Filtering Processing and the difference of the pairing digital quantity of atom steam bubble temperature set points; This difference is carried out the PID computing; The PID calculated result is carried out the modulation of PWM and delta-sigma, utilize result after PWM and delta-sigma are modulated to control heater strip (15) and heat; Calculate through the digital temperature information of the VCSEL (2) after the Filtering Processing and the difference of the pairing digital quantity of VCSEL temperature set points; This difference is carried out the PID computing; The PID calculated result is carried out the modulation of PWM and delta-sigma, utilize result after PWM and delta-sigma are modulated to control TEC (16) and freeze;
Step 4, the temperature control pid parameter value of atom steam bubble is carried out from adjusting; The temperature control pid parameter value of VCSEL is carried out from adjusting.
2. the temperature control parameter self-tuning method of a kind of passive-type CPT atomic clock according to claim 1 is characterized in that described step 1 may further comprise the steps:
Step 1.1, first thermistor (3) is arranged at atom steam bubble (1) locates, second thermistor (4) is arranged on VCSEL (2) locates;
Step 1.2, the information that first thermistor (3) is gathered are sent to the digital temperature information that obtains atom steam bubble (1) after analog to digital converter (9) is changed through first Wheatstone bridge (5) and first instrument amplifier (7) successively; The information that second thermistor (4) is gathered is sent to the digital temperature information that obtains VCSEL (2) after analog to digital converter (9) is changed through second Wheatstone bridge (6) and second instrument amplifier (8) successively;
Step 1.3, analog to digital converter (9) are sent to microcontroller (10) with the digital temperature information of atom steam bubble (1) and the digital temperature information of VCSEL (2).
3. the temperature control parameter self-tuning method of a kind of passive-type CPT atomic clock according to claim 2 is characterized in that the Filtering Processing in the described step 2 is based on Kalman filtering.
4. the temperature control parameter self-tuning method of a kind of passive-type CPT atomic clock according to claim 1 is characterized in that, the temperature control pid parameter value to atom steam bubble in the described step 4 carries out may further comprise the steps from adjusting:
Step 4.1, judge the data that can collect reflection atom steam bubble temperature variation based on the host computer (19) of LabVIEW development platform, if can, then carry out tracing display, and get into step 4.2 with the form of oscillogram; If can not, then wait for until overtime, and the output error prompting, finish from adjusting;
The sweep starting point and the sweep stopping point of the temperature control pid parameter value of step 4.2, initialization atom steam bubble; Send atom steam bubble PID initial value to microcontroller (10); The optimum P of initialization atom steam bubble, I, D value are null value; With atom steam bubble P value initialization is atom steam bubble P scan value starting point, and atom steam bubble P value is sent atom steam bubble P value to microcontroller (10) after increasing with fixed step size, and microcontroller (10) carries out temperature control under atom steam bubble P value;
Step 4.3, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.4, increase atom steam bubble P value with fixed step size; Judge whether atom steam bubble P value is atom steam bubble P scan value terminal point; If, then with the quadratic sum of difference in the step 4.3 a hour corresponding atom steam bubble P value be made as the optimum P value of atom steam bubble, and atom steam bubble optimum P value is sent to microcontroller (10); Microcontroller (10) carries out temperature control under the optimum P value of atom steam bubble, get into step 4.5; If not, then atom steam bubble P value being sent to microcontroller (10), microcontroller (10) carries out temperature control and returns step 4.3 under atom steam bubble P value;
Step 4.5, be atom steam bubble I scan value starting point with atom steam bubble I value initialization; Atom steam bubble I value is sent atom steam bubble I value to microcontroller (10) after increasing with fixed step size, and microcontroller (10) carries out temperature control under optimum P value of atom steam bubble and atom steam bubble I value;
Step 4.6, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.7, increase atom steam bubble I value with fixed step size; Judge whether atom steam bubble I value is atom steam bubble I scan value terminal point; If, then with the quadratic sum of difference in the step 4.6 a hour corresponding atom steam bubble I value be made as the optimum I value of atom steam bubble, and atom steam bubble optimum I value is sent to microcontroller (10); Microcontroller (10) carries out temperature control under optimum P value of atom steam bubble and the optimum I value of atom steam bubble, get into step 4.8; If not, then atom steam bubble I value being sent to microcontroller (10), microcontroller (10) carries out temperature control and returns step 4.6 under optimum P value of atom steam bubble and atom steam bubble I value;
Step 4.8, be atom steam bubble D scan value starting point with atom steam bubble D value initialization; Atom steam bubble D value is sent atom steam bubble D value to microcontroller (10) after increasing with fixed step size, and microcontroller (10) carries out temperature control under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and atom steam bubble D value;
Step 4.9, the atom steam bubble temperature data that collects is counted; Count when counting and to reach counting during setting value, the quadratic sum of all the atom steam bubble temperature datas in the count setting value and the difference of the pairing digital quantity of atom steam bubble temperature set points;
Step 4.10, increase atom steam bubble D value with fixed step size; Judge whether atom steam bubble D value is atom steam bubble D scan value terminal point; If, then with the quadratic sum of difference in the step 4.9 a hour corresponding atom steam bubble D value be made as the optimum D value of atom steam bubble, and atom steam bubble optimum D value is sent to microcontroller (10); Microcontroller (10) carries out temperature control under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and the optimum D value of atom steam bubble, get into step 4.11; If not, then atom steam bubble D value being sent to microcontroller (10), microcontroller (10) carries out temperature control and returns step 4.9 under the optimum P value of atom steam bubble, the optimum I value of atom steam bubble and atom steam bubble D value;
The difference of optimal PID parameter value before the temperature control of step 4.11, the temperature control optimal PID parameter value that calculates current atom steam bubble and atom steam bubble; If difference is less than setting value; Then finish the adjusting certainly of temperature control pid parameter value of atom steam bubble, otherwise, step 4.2 returned.
5. the temperature control parameter self-tuning method of a kind of passive-type CPT atomic clock according to claim 1 is characterized in that, the temperature control pid parameter value to VCSEL in the described step 4 carries out may further comprise the steps from adjusting:
Step 5.1, judge the data that can collect reflection VCSEL temperature variation based on the host computer (19) of LabVIEW development platform, if can, then carry out tracing display, and get into step 5.2 with the form of oscillogram; If can not, then wait for until overtime, and the output error prompting, finish from adjusting;
The sweep starting point and the sweep stopping point of step 5.2, initialization VCSEL temperature control pid parameter value; Send the PID initial value to microcontroller (10); The optimum P of initialization VCSEL, I, D value are null value; With the P value initialization of VCSEL is the P scan value starting point of VCSEL, sends P value to the microcontroller (10) of VCSEL after the P value of VCSEL increases with fixed step size, and microcontroller (10) carries out temperature control under the P of VCSEL value;
Step 5.3, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.4, the P value of VCSEL of increasing with fixed step size; Whether the P value of judging VCSEL is the P scan value terminal point of VCSEL; If the P value of then that the quadratic sum of difference in the step 5.3 is hour corresponding VCSEL is made as the optimum P value of VCSEL, and the optimum P value of VCSEL is sent to microcontroller (10); Microcontroller (10) carries out temperature control under the optimum P value of VCSEL, get into step 5.5; If not then the P value with VCSEL is sent to microcontroller (10), microcontroller (10) carries out temperature control and returns step 5.3 under the P of VCSEL value;
Step 5.5, be the I scan value starting point of VCSEL with the I value initialization of VCSEL; Send I value to the microcontroller (10) of VCSEL after the I value of VCSEL increases with fixed step size, microcontroller (10) carries out temperature control under the I value of the optimum P value of VCSEL and VCSEL;
Step 5.6, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.7, the I value of VCSEL of increasing with fixed step size; Whether the I value of judging VCSEL is the I scan value terminal point of VCSEL; If the I value of then that the quadratic sum of difference in the step 5.6 is hour corresponding VCSEL is made as the optimum I value of VCSEL, and the optimum I value of VCSEL is sent to microcontroller (10); Microcontroller (10) carries out temperature control under the optimum I value of the optimum P value of VCSEL and VCSEL, get into step 5.8; If not then the I value with VCSEL is sent to microcontroller (10), microcontroller (10) carries out temperature control and returns step 5.6 under the I value of the optimum P value of VCSEL and VCSEL;
Step 5.8, be the D scan value starting point of VCSEL with the D value initialization of VCSEL; Send D value to the microcontroller (10) of VCSEL after the D value of VCSEL increases with fixed step size, microcontroller (10) carries out temperature control under the D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL;
Step 5.9, the VCSEL temperature data that collects is counted, when counting is counted when reaching the counting setting value quadratic sum of all the VCSEL temperature datas in the count setting value and the difference of the pairing digital quantity of VCSEL temperature set points;
Step 5.10, the D value of VCSEL of increasing with fixed step size; Whether the D value of judging VCSEL is the D scan value terminal point of VCSEL; If the D value of then that the quadratic sum of difference in the step 5.9 is hour corresponding VCSEL is made as the optimum D value of VCSEL, and the optimum D value of VCSEL is sent to microcontroller (10); Microcontroller (10) carries out temperature control under the optimum D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL, get into step 5.11; If not then the D value with VCSEL is sent to microcontroller (10), microcontroller (10) carries out temperature control and returns step 5.9 under the D value of the optimum I value of the optimum P value of VCSEL, VCSEL and VCSEL;
Step 5.11, calculate the optimum temperature control pid parameter value of current VCSEL and the difference of the optimum temperature control pid parameter value of preceding VCSEL, less than setting value, then finish the adjusting certainly of temperature control pid parameter value of VCSEL as if difference, otherwise, step 5.2 returned.
6. the temperature control parameter self-tuning device of a passive-type CPT atomic clock is characterized in that, comprises
First thermistor (3) is used to measure the temperature of atom steam bubble (1);
Second thermistor (4) is used to measure the temperature of VCSEL;
The first waveform transformation module is used for the output of first thermistor (3) is carried out the shaping amplification and is sent to analog to digital converter (9);
The second waveform transformation module is used for the output of second thermistor (4) is carried out the shaping amplification and is sent to analog to digital converter (9);
Analog to digital converter (9), the data that are used to carry out after analog to digital conversion also will be changed are sent to microcontroller (10);
Microcontroller (10) is used to carry out data acquisition and PID computing, and controls the folding of first switch (11) and second switch (12) according to the PID operation result, through RS232 interface and host computer (19) communication;
First switch (11) is connected with heater strip (15) through first low-pass filter (13);
Second switch (12) is connected with TEC (16) through second low-pass filter (14);
Heater strip (15) is used to heat atom steam bubble (1); With
TEC (16), VCSEL (2) is used to freeze.
7. the temperature control parameter self-tuning device of a passive-type CPT atomic clock is characterized in that, the described first waveform transformation module comprises first Wheatstone bridge (5) and the first instrument amplifier (7) that connects successively; The described second waveform transformation module comprises second Wheatstone bridge (6) and the second instrument amplifier (8) that connects successively.
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