CN102789406A - Aided diagnosis method and system for testing mainboard - Google Patents
Aided diagnosis method and system for testing mainboard Download PDFInfo
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- CN102789406A CN102789406A CN2011101303883A CN201110130388A CN102789406A CN 102789406 A CN102789406 A CN 102789406A CN 2011101303883 A CN2011101303883 A CN 2011101303883A CN 201110130388 A CN201110130388 A CN 201110130388A CN 102789406 A CN102789406 A CN 102789406A
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- 238000012360 testing method Methods 0.000 title claims abstract description 197
- 238000003745 diagnosis Methods 0.000 title claims abstract description 31
- 238000000034 method Methods 0.000 title claims abstract description 30
- 230000008676 import Effects 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 238000010998 test method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 241000282326 Felis catus Species 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
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Abstract
An aided diagnosis method for testing a mainboard, and the aided diagnosis method comprises the following steps of: a storing procedure, storing a test command corresponding to each test item of the mainboard to be tested into storage equipment; an implementing procedure, when one test item of the mainbaord to be tested is in test failure, reading the test command corresponding to the test item and implementing the command; a recording procedure, recording an implementing result of the test command in a log file corresponding to the mainboard to be tested; a reading procedure, reading the implementing result of the test command on a normal mainboard corresponding to the test item; a comparing procedure, comparing the implementing result of the test command on the normal mainboard corresponding to the test item with an implementing result on the mainboard to be tested, and obtaining difference information of two implementing results, and displaying the difference information. The invention also provides an aided diagnosis system for testing the mainboard. The aided diagnosis system can assist an engineer to rapidly find out a problem reason of a mainboard test, so that production efficiency of the mainboard is improved.
Description
Technical field
The present invention relates to a kind of mainboard test aided diagnosis method and system.
Background technology
On the mainboard production line, generally use the method for operation test procedure on mainboard each test item to mainboard, test like internal memory, hard disk, CPU etc.If some test item test crashs wherein; Then need the slip-stick artist manually to import test command to this test item to this mainboard; Like dmidecode order, cat/proc/memoryinfo order etc.; And this test command compared at the execution result on this mainboard and this test command execution result on normal mainboard, thereby the reason place of investigation problem.When but the test item test crash is arranged at every turn, all need manual input test order, this work is more loaded down with trivial details.Lean on a large amount of execution result of manpower contrast not only very time-consuming simultaneously, and accuracy is not high, makes the slip-stick artist can't find out the reason of problem fast.
Summary of the invention
In view of above content, be necessary to provide a kind of mainboard test aided diagnosis method, can ancillary works teacher find out the reason of mainboard test problem fast, improve the production efficiency of mainboard.
Also be necessary to provide a kind of mainboard test assistant diagnosis system, can ancillary works teacher find out the reason of mainboard test problem fast, improve the production efficiency of mainboard.
A kind of mainboard test aided diagnosis method, may further comprise the steps: storing step one: each test command that each test item of mainboard to be measured is corresponding deposits in the memory device of computing machine; Execution in step one: when a certain test item test crash of mainboard to be measured, from memory device, read the corresponding test command of this test item, and carry out this test command; Recording step one: the execution result of this test command is recorded in the corresponding journal file of mainboard to be measured; Read step: from memory device, read the corresponding journal file of normal mainboard, thereby obtain the execution result of the corresponding test command of this test item on this normal mainboard; The contrast step: with the execution result of the corresponding test command of this test item on normal mainboard and the corresponding test command of this test item on mainboard to be measured execution result compare, draw the different information of these two kinds of execution results, and show this different information.
A kind of mainboard test assistant diagnosis system comprises: memory module is used for the memory device that each test command that each test item of mainboard to be measured is corresponding deposits computing machine in; Execution module when being used for a certain test item test crash when mainboard to be measured, reading the corresponding test command of this test item, and carries out this test command from memory device; Logging modle is used for the execution result of this test command is recorded in the corresponding journal file of mainboard to be measured; Read module is used for reading the corresponding journal file of normal mainboard from memory device, thereby obtains the execution result of the corresponding test command of this test item on this normal mainboard; The contrast module, be used for the execution result of the corresponding test command of this test item on normal mainboard and the corresponding test command of this test item on mainboard to be measured execution result compare, draw the different information of these two kinds of execution results, and show this different information.
Compared to prior art, said mainboard test aided diagnosis method and system can ancillary works teacher find out the reason of mainboard test problem fast, improve the production efficiency of mainboard.
Description of drawings
Fig. 1 is the running environment figure of mainboard test assistant diagnosis system of the present invention preferred embodiment.
Fig. 2 is the functional block diagram of mainboard test assistant diagnosis system of the present invention preferred embodiment.
Fig. 3 is the process flow diagram of mainboard test aided diagnosis method of the present invention preferred embodiment.
The main element symbol description
| |
1 |
| |
2 |
| Mainboard test |
20 |
| The |
21 |
| Mainboard to be measured | 3 |
| Display | 4 |
| |
201 |
| |
202 |
| |
203 |
| Read |
204 |
| The |
205 |
| |
206 |
Following embodiment will combine above-mentioned accompanying drawing to further specify the present invention.
Embodiment
Consulting shown in Figure 1ly, is the running environment figure of mainboard of the present invention test assistant diagnosis system preferred embodiment.
In the present embodiment; This mainboard test assistant diagnosis system 20 is stored in the memory device 2 of computing machine 1; Also store mainboard test procedure 21 in this memory device 2; Be used for each test item, test like CPU, SMbus (system magament bus, System Management Bus), internal memory etc. to each piece mainboard 3 to be measured that inserts this computing machine 1 successively.In addition, also comprise display 4 data output apparatus such as grade in this computing machine 1, and data input device such as mouse, keyboard.
Consulting shown in Figure 2ly, is the functional block diagram of mainboard of the present invention test assistant diagnosis system preferred embodiment.This mainboard test assistant diagnosis system 20 comprises memory module 201, execution module 202, logging modle 203, read module 204, contrast module 205 and statistical module 206.
For example, I
2C detect test command is used to test the SMbus test item of mainboard 3 to be measured, carries out I
2Behind the C detect test command, can draw on the SMbus of mainboard 3 to be measured to be affiliated to which equipment.
In computing machine 1, inserting each mainboard 3 to be measured one by one; Before testing with operation mainboard test procedure 21 pairs of each mainboards 3 to be measured; Need in computing machine 1, to insert earlier a normal mainboard (being called on-gauge plate again); Execution module 202 is used for reading memory device 2 each test command corresponding with each test item, and on this normal mainboard, carries out this each test command one by one.
In the process that each test item of operation mainboard test procedure 21 pairs of mainboards 3 to be measured is tested, execution module 202 also is used for when a certain test item test crash, from memory device 2, reading the test command of this test item correspondence, and carrying out this test command.
Read module 204 is used for reading the corresponding log file of said normal mainboard from memory device 2, thereby obtains the execution result of the corresponding test command of this test item on this normal mainboard.
The execution result of the corresponding test command of this test item that contrast module 205 is used for this test item execution result of corresponding test command on this normal mainboard and the log file of mainboard 3 to be measured are write down compares; Draw the different information of these two kinds of execution results, and show this different information.The user can diagnose out the reason of this test item test crash with reference to this different information, and with in this reason input computing machine 1.
Consulting shown in Figure 3ly, is the process flow diagram of mainboard of the present invention test aided diagnosis method preferred embodiment.
In computing machine 1, inserting each mainboard 3 to be measured one by one; Before testing with operation mainboard test procedure 21 pairs of each mainboards 3 to be measured; In computing machine 1, insert a normal mainboard earlier; Execution module 202 will read each corresponding with each test item in the memory device 2 test command, and on this normal mainboard, carry out this each test command one by one.
Step S01, each test item of 21 pairs of mainboards 3 to be measured of operation mainboard test procedure is tested.
Step S02, when a certain test item test crash, execution module 202 reads the corresponding test command of this test item from memory device 2, and carries out this test command.
Step S03, logging modle 203 is recorded in the execution result of this test command in the log file of mainboard 3 correspondences to be measured.
Step S04, read module 204 read the corresponding log file of said normal mainboard from memory device 2, thereby obtain the execution result of the corresponding test command of this test item on this normal mainboard.
Step S05; The execution result of the corresponding test command of this test item that writes down in the log file of contrast module 205 with the execution result of the corresponding test command of this test item on this normal mainboard and mainboard 3 to be measured compares; Draw the different information of these two kinds of execution results, and show this different information.The user can diagnose out the reason of this test item test crash with reference to this different information, and with in this reason input computing machine 1.
Step S06, memory module 201 is obtained the reason of this test item test crash of user's input, and this reason is deposited in the memory device 2.
When needs are analyzed the reason of various test item test crashs, statistical module 206 will be added up the reason of the various test crashs that write down in the memory device 2, and show the statistics of the shared number percent of reason that comprises these various test crashs.
Above embodiment is only unrestricted in order to technical scheme of the present invention to be described; Although the present invention is specified with reference to preferred embodiment; Those of ordinary skill in the art is to be understood that; Can make amendment or be equal to replacement technical scheme of the present invention, and not break away from the spirit and the scope of technical scheme of the present invention.
Claims (10)
1. a mainboard is tested aided diagnosis method, it is characterized in that this method may further comprise the steps:
Storing step one: each test command that each test item of mainboard to be measured is corresponding deposits in the memory device of computing machine;
Execution in step one: when a certain test item test crash of mainboard to be measured, from memory device, read the corresponding test command of this test item, and carry out this test command;
Recording step one: the execution result of this test command is recorded in the corresponding journal file of mainboard to be measured;
Read step: from memory device, read the corresponding journal file of normal mainboard, thereby obtain the execution result of the corresponding test command of this test item on this normal mainboard;
The contrast step: with the execution result of the corresponding test command of this test item on normal mainboard and the corresponding test command of this test item on mainboard to be measured execution result compare, draw the different information of these two kinds of execution results, and show this different information.
2. mainboard test aided diagnosis method as claimed in claim 1 is characterized in that this method also comprises:
Execution in step two: before mainboard to be measured is tested to each one by one, read each corresponding in memory device test command, and on a normal mainboard, carry out this each test command one by one with each test item.
3. mainboard test aided diagnosis method as claimed in claim 2 is characterized in that this method also comprises:
Recording step two: the execution result of this each test command on this normal mainboard is recorded in the corresponding journal file of this normal mainboard.
4. mainboard test aided diagnosis method as claimed in claim 1 is characterized in that this method also comprises:
Storing step two: receive the reason of user, and the reason of this test item test crash that will import deposits in the memory device in reference to this test item test crash of this different information input.
5. mainboard test aided diagnosis method as claimed in claim 4 is characterized in that this method also comprises:
Statistic procedure: when needs are analyzed the reason of various test item test crashs, the reason of the various test crashs that write down in the statistics memory device, and demonstration comprises the statistics of the shared number percent of reason of various test crashs.
6. a mainboard is tested assistant diagnosis system, it is characterized in that this system comprises:
Memory module is used for the memory device that each test command that each test item of mainboard to be measured is corresponding deposits computing machine in;
Execution module when being used for a certain test item test crash when mainboard to be measured, reading the corresponding test command of this test item, and carries out this test command from memory device;
Logging modle is used for the execution result of this test command is recorded in the corresponding journal file of mainboard to be measured;
Read module is used for reading the corresponding journal file of normal mainboard from memory device, thereby obtains the execution result of the corresponding test command of this test item on this normal mainboard;
The contrast module, be used for the execution result of the corresponding test command of this test item on normal mainboard and the corresponding test command of this test item on mainboard to be measured execution result compare, draw the different information of these two kinds of execution results, and show this different information.
7. mainboard test assistant diagnosis system as claimed in claim 6; It is characterized in that; Said execution module; Also be used for before mainboard to be measured is tested to each one by one, reading each corresponding in memory device test command, and on a normal mainboard, carry out this each test command one by one with each test item.
8. mainboard as claimed in claim 7 test assistant diagnosis system is characterized in that, said logging modle also is used for the execution result of this each test command on this normal mainboard is recorded in the corresponding journal file of this normal mainboard.
9. mainboard test assistant diagnosis system as claimed in claim 6; It is characterized in that; Said memory module also be used to receive the reason of user with reference to this test item test crash of this different information input, and the reason of this test item test crash that will import deposits in the memory device in.
10. mainboard test assistant diagnosis system as claimed in claim 9; It is characterized in that; This system also comprises statistical module; Be used for when needs are analyzed the reason of various test item test crashs, the reason of the various test crashs that write down in the statistics memory device, and demonstration comprises the statistics of the shared number percent of reason of various test crashs.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110130388.3A CN102789406B (en) | 2011-05-19 | 2011-05-19 | Mainboard test aided diagnosis method and system |
| TW100117895A TW201248396A (en) | 2011-05-19 | 2011-05-23 | Method and system for auxiliary diagnosing motherboard test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110130388.3A CN102789406B (en) | 2011-05-19 | 2011-05-19 | Mainboard test aided diagnosis method and system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102789406A true CN102789406A (en) | 2012-11-21 |
| CN102789406B CN102789406B (en) | 2016-06-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110130388.3A Expired - Fee Related CN102789406B (en) | 2011-05-19 | 2011-05-19 | Mainboard test aided diagnosis method and system |
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| Country | Link |
|---|---|
| CN (1) | CN102789406B (en) |
| TW (1) | TW201248396A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108802538A (en) * | 2018-07-12 | 2018-11-13 | 深圳市极致汇仪科技有限公司 | A kind of instrument diagnostic method and its system applied to comprehensive tester |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101593139A (en) * | 2008-05-30 | 2009-12-02 | 鸿富锦精密工业（深圳）有限公司 | Mainboard failure diagnosis device and diagnostic method thereof |
| US20110055634A1 (en) * | 2009-08-27 | 2011-03-03 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd | System and method for testing a computer |
-
2011
- 2011-05-19 CN CN201110130388.3A patent/CN102789406B/en not_active Expired - Fee Related
- 2011-05-23 TW TW100117895A patent/TW201248396A/en unknown
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101593139A (en) * | 2008-05-30 | 2009-12-02 | 鸿富锦精密工业（深圳）有限公司 | Mainboard failure diagnosis device and diagnostic method thereof |
| US20110055634A1 (en) * | 2009-08-27 | 2011-03-03 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd | System and method for testing a computer |
| CN101996117A (en) * | 2009-08-27 | 2011-03-30 | 鸿富锦精密工业（深圳）有限公司 | Computer test system and method thereof |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108802538A (en) * | 2018-07-12 | 2018-11-13 | 深圳市极致汇仪科技有限公司 | A kind of instrument diagnostic method and its system applied to comprehensive tester |
| CN108802538B (en) * | 2018-07-12 | 2020-06-26 | 深圳市极致汇仪科技有限公司 | Instrument diagnosis method and system applied to comprehensive tester |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201248396A (en) | 2012-12-01 |
| CN102789406B (en) | 2016-06-29 |
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