CN102778822A - 一种调焦调平装置 - Google Patents
一种调焦调平装置 Download PDFInfo
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- CN102778822A CN102778822A CN2011103219604A CN201110321960A CN102778822A CN 102778822 A CN102778822 A CN 102778822A CN 2011103219604 A CN2011103219604 A CN 2011103219604A CN 201110321960 A CN201110321960 A CN 201110321960A CN 102778822 A CN102778822 A CN 102778822A
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CN201110321960.4A CN102778822B (zh) | 2011-10-20 | 2011-10-20 | 一种调焦调平装置 |
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CN201110321960.4A CN102778822B (zh) | 2011-10-20 | 2011-10-20 | 一种调焦调平装置 |
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CN102778822A true CN102778822A (zh) | 2012-11-14 |
CN102778822B CN102778822B (zh) | 2014-08-13 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104849964A (zh) * | 2014-02-14 | 2015-08-19 | 上海微电子装备有限公司 | 一种焦面测量装置及其测量方法 |
CN105242501A (zh) * | 2015-11-10 | 2016-01-13 | 中国科学院光电技术研究所 | 一种高精度调焦调平测量系统 |
CN108139696A (zh) * | 2015-10-15 | 2018-06-08 | Asml荷兰有限公司 | 形貌测量系统 |
CN114383822A (zh) * | 2022-01-04 | 2022-04-22 | 中国科学院微电子研究所 | 用于光学系统调焦调平的检测装置及方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5191200A (en) * | 1991-03-07 | 1993-03-02 | U.S. Philips Corp. | Imaging apparatus having a focus-error and/or tilt detection device |
US6320658B1 (en) * | 1997-06-09 | 2001-11-20 | Nikon Corporation | Apparatus and method for detecting the position of a surface to be examined, exposure apparatus equipped with the detecting apparatus and method of producing the exposure apparatus, and method of producing devices using the exposure apparatus |
CN101169601A (zh) * | 2007-11-21 | 2008-04-30 | 上海微电子装备有限公司 | 一种调焦调平测量系统 |
CN102129183A (zh) * | 2010-01-19 | 2011-07-20 | 上海微电子装备有限公司 | 调焦调平测量装置 |
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2011
- 2011-10-20 CN CN201110321960.4A patent/CN102778822B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5191200A (en) * | 1991-03-07 | 1993-03-02 | U.S. Philips Corp. | Imaging apparatus having a focus-error and/or tilt detection device |
US6320658B1 (en) * | 1997-06-09 | 2001-11-20 | Nikon Corporation | Apparatus and method for detecting the position of a surface to be examined, exposure apparatus equipped with the detecting apparatus and method of producing the exposure apparatus, and method of producing devices using the exposure apparatus |
CN101169601A (zh) * | 2007-11-21 | 2008-04-30 | 上海微电子装备有限公司 | 一种调焦调平测量系统 |
CN102129183A (zh) * | 2010-01-19 | 2011-07-20 | 上海微电子装备有限公司 | 调焦调平测量装置 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104849964A (zh) * | 2014-02-14 | 2015-08-19 | 上海微电子装备有限公司 | 一种焦面测量装置及其测量方法 |
CN104849964B (zh) * | 2014-02-14 | 2017-08-25 | 上海微电子装备(集团)股份有限公司 | 一种焦面测量装置及其测量方法 |
CN108139696A (zh) * | 2015-10-15 | 2018-06-08 | Asml荷兰有限公司 | 形貌测量系统 |
CN105242501A (zh) * | 2015-11-10 | 2016-01-13 | 中国科学院光电技术研究所 | 一种高精度调焦调平测量系统 |
CN105242501B (zh) * | 2015-11-10 | 2017-07-11 | 中国科学院光电技术研究所 | 一种高精度调焦调平测量系统 |
CN114383822A (zh) * | 2022-01-04 | 2022-04-22 | 中国科学院微电子研究所 | 用于光学系统调焦调平的检测装置及方法 |
CN114383822B (zh) * | 2022-01-04 | 2024-02-09 | 中国科学院微电子研究所 | 用于光学系统调焦调平的检测装置及方法 |
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CN102778822B (zh) | 2014-08-13 |
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Effective date of registration: 20200803 Address after: 100190, No. 19 West Fourth Ring Road, Beijing, Haidian District Patentee after: Research Institute of aerospace information innovation, Chinese Academy of Sciences Address before: 100094, No. 9 Deng Nan Road, Beijing, Haidian District Patentee before: Academy of Opto-Electronics, Chinese Academy of Sciences Effective date of registration: 20200803 Address after: 100029 Beijing city Chaoyang District Beitucheng West Road No. 3 Patentee after: Institute of Microelectronics, Chinese Academy of Sciences Address before: 100190, No. 19 West Fourth Ring Road, Beijing, Haidian District Patentee before: Research Institute of aerospace information innovation, Chinese Academy of Sciences |