CN102759716A - Testing system of luminous element and method for testing luminous element - Google Patents
Testing system of luminous element and method for testing luminous element Download PDFInfo
- Publication number
- CN102759716A CN102759716A CN2011101068440A CN201110106844A CN102759716A CN 102759716 A CN102759716 A CN 102759716A CN 2011101068440 A CN2011101068440 A CN 2011101068440A CN 201110106844 A CN201110106844 A CN 201110106844A CN 102759716 A CN102759716 A CN 102759716A
- Authority
- CN
- China
- Prior art keywords
- light
- test
- emitting component
- voltage
- reference voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Led Devices (AREA)
Abstract
The invention relates to a testing system of a luminous element and a method for testing the luminous element. The method comprises the steps as follows: respectively covering the luminous element and a region on a circuit board at which no luminous element is arranged, obtaining reference voltage according to the brightness of the region at which the luminous element is not arranged, obtaining testing voltage according to the brightness of the driven luminous element, and judging whether the luminous element passes test according to the testing voltage and the reference voltage. According to the invention, the testing of the luminous element can be realized in an automatic manner instead of a manual manner, and the misjudgement probability can be reduced.
Description
Technical field
The present invention is about a kind of test macro and method of testing, especially about the test macro of light-emitting component and the method for testing light-emitting component.
Background technology
Light-emitting component is in order to producing light, and is applied on the various electronic products and as the pilot lamp of its electronic product.Modal light-emitting component is that (Light Emitter Diode, LED), light emitting diode has the advantage of the little and low power consumption of volume to light emitting diode, so light emitting diode is widely used day by day.
Generally speaking; Light emitting diode is to be set on the circuit board; And be connected with circuit on the circuit board and be able to produce light beam, wherein the circuit on the circuit board can pass through particular design and makes light emitting diode can produce the light beam of different colours or produce light beam with different frequency.Therefore can know that after light emitting diode was set on the circuit board, the circuit board that is provided with light emitting diode was installed on the various electronic products again.
Light emitting diode must be through test to guarantee whether light emitting diode can normally move after making completion.Know that according to above-mentioned in the test process of light emitting diode, light emitting diode must be arranged at and just be able to start on the circuit board, otherwise light emitting diode must extraly be connected in one drive circuit and can be driven.Generally; The test process of existing light emitting diode is with the manual drives light emitting diode by the tester; Make it produce light beam; Simultaneously, whether the tester is normal luminous and judge whether light emitting diode can normally move with this light emitting diode of visual inspection, and it is the test process of light emitting diode.Yet; The tester is through after testing for a long time; Eyes of testers is because of on the light beam that focuses on light emitting diode for a long time; So be easy to generate dazzle, therefore be easy to not luminous light emitting diode is judged as luminous and causes erroneous judgement, make that the test process of light emitting diode is not accurate enough.Moreover, slower with the speed that the manpower mode is tested, and carry out the standard that accuracy of test has not been inconsistent modernized factory building with the manpower mode.Therefore, need a kind of test macro of the light-emitting component that need not utilize manpower and the method for test light-emitting component.
Summary of the invention
The technical matters that the present invention will solve is, to the above-mentioned deficiency that prior art exists, a kind of test macro of the light-emitting component that need not utilize manpower and the method for test light-emitting component is provided.
Another technical matters that the present invention will solve is, to the above-mentioned deficiency that prior art exists, a kind of method that reduces the test macro and the test light-emitting component of the light-emitting component of judging probability by accident is provided.
The technical solution adopted for the present invention to solve the technical problems provides a kind of test macro of light-emitting component; In order to the light-emitting component of test setting on a circuit board; The test macro of this light-emitting component comprises host computer and test bench: wherein, this host computer is in order to export the test result of this light-emitting component; This test bench is connected in this host computer; In order to test this light-emitting component; This test bench comprises first light shield, first photosensitive circuit, second light shield, second photosensitive circuit and decision circuitry, and this first light shield is in order to be covered in the no light-emitting component zone on this circuit board; This first photosensitive circuit has first photo-sensitive cell, and this first photo-sensitive cell is positioned at this first light shield, and this first photosensitive circuit produces a reference voltage in order to the regional brightness of detecting according to this first photo-sensitive cell of this no light-emitting component; This second light shield is in order to be covered in this light-emitting component; This second photosensitive circuit has second photo-sensitive cell, and this second photo-sensitive cell is positioned at this second light shield, and this second photosensitive circuit produces test voltage in order to the brightness of this light-emitting component of detecting according to this second photo-sensitive cell; Whether whether this decision circuitry is connected to this first photosensitive circuit, this second photosensitive circuit and this host computer, determine this light-emitting component through test greater than this reference voltage in order to judge this test voltage.
Preferably, this decision circuitry comprises comparing unit and control module, and this comparing unit is connected in this first photosensitive circuit and this second photosensitive circuit, in order to relatively this test voltage and this reference voltage; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a positive logic connected mode; And this test voltage that obtains according to driven this light-emitting component is during greater than this reference voltage; This comparing unit is exported the accurate position of high logic signal; And when this test voltage is not more than this reference voltage, the accurate position of the low logic of this comparing unit output signal; Maybe work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a negative logic connected mode; And this test voltage is during less than this reference voltage; This accurate position of high logic signal of this comparing unit output; And this test voltage is when being not less than this reference voltage, and this comparing unit output should the accurate position of low logic signal; This control module is connected in this comparing unit and this host computer, should high logic accurate position signal or receive should the accurate position of low logic signal in order to receive, and when receiving this accurate position of low logic generation test crash signal to this host computer.
Preferably; After this control module receives this accurate position of high logic signal; This light-emitting component is closed and is obtained another test voltage by this second photosensitive circuit detecting, and this comparing unit judges that according to this another test voltage and this reference voltage whether this light-emitting component is through test; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with this positive logic connected mode; And when this another test voltage is not more than this reference voltage; Another accurate position of high logic signal of this comparing unit output; Make this control module according to this high logic accurate position signal and this another accurate position of high logic signal produce one through test signal to this host computer, and when this test voltage during greater than this reference voltage, this comparing unit output should the accurate signal of low logic; And be connected in this comparing unit with this negative logic connected mode when this first photosensitive circuit and this second photosensitive circuit; And when this another test voltage is not less than this reference voltage; This accurate position of high logic of comparing unit output this another signal; This control module is produced according to this high logic accurate position signal and this another accurate position of high logic signal should be through test signal to this host computer, and when this test voltage during less than this reference voltage, this comparing unit output should a low logic standard signal.
Preferably, this decision circuitry comprises comparing unit, and this comparing unit is connected in this first photosensitive circuit and this second photosensitive circuit, in order to relatively this test voltage and this reference voltage; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a positive logic connected mode; And this test voltage is during greater than this reference voltage; This comparing unit is exported the accurate position of high logic signal to this host computer; And when this test voltage is not more than this reference voltage, the accurate position of the low logic of this comparing unit output signal to this host computer; Maybe work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a negative logic connected mode; And this test voltage is during less than this reference voltage; This accurate position of high logic signal of this comparing unit output is to this host computer; And this test voltage is when being not less than this reference voltage, this comparing unit output should the accurate position of low logic signal to this host computer.
Preferably; After this host computer receives this accurate position of high logic signal; This light-emitting component is closed and is obtained another test voltage by this second photosensitive circuit detecting, and this comparing unit judges that according to this another test voltage and this reference voltage whether this light-emitting component is through test; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with this positive logic connected mode; And when this another test voltage is not more than this reference voltage; Another accurate position of high logic signal of this comparing unit output is to this host computer; And when this test voltage during greater than this reference voltage, this comparing unit output should the accurate position of low logic signal; And be connected in this comparing unit with this negative logic connected mode when this first photosensitive circuit and this second photosensitive circuit; And when this another test voltage is not less than this reference voltage; This accurate position of high logic of comparing unit output this another signal is to this host computer; And when this test voltage during less than this reference voltage, this comparing unit output should the accurate position of low logic signal.
Preferably; This host computer comprises test module; Produce this test through signal when receiving this high logic accurate position signal and this another accurate position of high logic signal when this host computer, maybe when this host computer receives this low logic standard signal, produce this test crash signal.
Preferably, the test macro of said light-emitting component also comprises computer peripheral apparatus, and this computer peripheral apparatus is connected in this host computer, should test pass through signal or this test crash signal in order to show.
Preferably, this computer peripheral apparatus is in order to show that this test is through the computer screen of signal or this test crash signal or with the PA-system of different these tests of sound prompting through signal or this test crash signal.
Preferably, this test bench is by RS232 interface connecting line or USB (UniversalSerious Bus, USB) interface joint face and be connected in this host computer, and this first photo-sensitive cell and this second photo-sensitive cell are photoresistance.
The present invention also provides a kind of method of testing light-emitting component, and in order to the light-emitting component of test setting on a circuit board, the method for this test light-emitting component comprises:
Cover the no luminous optical element zone on this light-emitting component and this circuit board respectively, and obtain a reference voltage, and obtain test voltage according to the brightness of driven this light-emitting component according to the brightness in this no light-emitting component zone; And
Judge that according to this test voltage and this reference voltage whether this light-emitting component is through test.
Preferably; This no light-emitting component zone and this light-emitting component of covering this measurand respectively are to utilize first light shield and second light shield to be covered in this no light-emitting component zone and this light-emitting component respectively respectively; And obtain this reference voltage according to the brightness in this no light-emitting component zone, and detect the brightness of this light-emitting component and obtain this test voltage by second photo-sensitive cell that is positioned at this second light shield by first photo-sensitive cell detecting that is positioned at this first light shield.
Preferably; When this first photo-sensitive cell and this second photo-sensitive cell are to be set up with a positive logic connected mode, and this test voltage is closed this light-emitting component during greater than this reference voltage; And when this test voltage is not more than this reference voltage, judge this light-emitting component test crash; Maybe working as the resistance of this first photo-sensitive cell and this second photo-sensitive cell is to be set up with a negative logic connected mode; And this test voltage is during less than this reference voltage; Close this light-emitting component, and this test voltage is judged this light-emitting component test crash when being not less than this reference voltage.
Preferably, when this light-emitting component is closed and by the detecting of this second photosensitive circuit and obtain another test voltage, and judge that according to this another test voltage and this reference voltage whether this light-emitting component is through testing; Wherein working as this first photosensitive circuit and this second photosensitive circuit is set up with this positive logic connected mode; And when this another test voltage is not more than this reference voltage; Judge this light-emitting component through test, and, judge this light-emitting component test crash when this test voltage during greater than this reference voltage; And be set up with this negative logic connected mode when this first photosensitive circuit and this second photosensitive circuit; And when this another test voltage is not less than this reference voltage; Judge this light-emitting component through test, and, judge this light-emitting component test crash when this test voltage during less than this reference voltage.
Preferably, the method for said test light-emitting component also comprises with the picture display mode and shows that this light-emitting component points out this light-emitting component through test or this light-emitting component test crash through test or this light-emitting component test crash or with sound mode.
The present invention detects not luminous brightness and obtains reference voltage by first photo-sensitive cell that is positioned at first light shield; Utilize second photo-sensitive cell be positioned at second light shield to detect luminous brightness and obtain test voltage again, and directly compare test voltage can judge that with reference voltage light-emitting component is whether luminous or when being closed, extinguish when the quilt driving.Because first photosensitive circuit and second photosensitive circuit is identical and its that position is set is quite approaching; When first photosensitive circuit makes its circuit parameter occurrence of errors because of some external factor; The circuit parameter of second photosensitive circuit also can occurrence of errors; So its error is little for the influence of reference voltage and test voltage, to reduce the probability of erroneous judgement.Moreover the present invention tests the method for light-emitting component and the test macro of light-emitting component can be carried out by host computer, that is can the automatic test mode test light-emitting component, and does not need to test by manual type.
Description of drawings
Fig. 1 is the schematic block follow diagram of method in first preferred embodiment that the present invention tests light-emitting component.
Fig. 2 is the structural representation of test macro in first preferred embodiment of light-emitting component of the present invention.
Fig. 3 is the internal circuit synoptic diagram of test macro in first preferred embodiment of light-emitting component of the present invention.
Fig. 4 is the internal circuit synoptic diagram of comparing unit in first preferred embodiment of the test macro of light-emitting component of the present invention.
Fig. 5 is the schematic block follow diagram of method in second preferred embodiment that the present invention tests light-emitting component.
Fig. 6 is the structural representation of test macro in second preferred embodiment of light-emitting component of the present invention.
Fig. 7 is the internal circuit synoptic diagram of test macro in second preferred embodiment of light-emitting component of the present invention.
Fig. 8 is the internal circuit synoptic diagram of comparing unit in second preferred embodiment of the test macro of light-emitting component of the present invention.
Embodiment
In view of the defective of prior art, the present invention provides a kind of method of test macro and test light-emitting component of light-emitting component.See also Fig. 1, it tests the schematic block follow diagram of method in first preferred embodiment of light-emitting component for the present invention.In this preferred embodiment, the method that the present invention tests light-emitting component may further comprise the steps: step S1: check whether a light-emitting component on the circuit board is in and extinguish state; Step S2: close light-emitting component, light-emitting component is in extinguishes state; Step S3: utilize one first light shield and one second light shield on the test bench to be covered in a no light-emitting component zone and the light-emitting component on the circuit board respectively; Step S4: driven light-emitting element makes light-emitting component produce a light beam; Step S5: utilization is positioned at one first photo-sensitive cell of first light shield to be detected the brightness in no light-emitting component zone and obtains a reference voltage, and utilizes the beam brightness of the one second photo-sensitive cell detecting light-emitting component that is positioned at second light shield and obtain a test voltage; Step S6: judge that whether test voltage is greater than reference voltage; Step S7: show the light-emitting component test crash with a picture display mode; Step S8: close light-emitting component and detect the brightness of pent light-emitting component and obtain another test voltage; And step S9: judge that whether another test voltage is greater than reference voltage.
In step S1, when light-emitting component is not to be in when extinguishing state, carry out step S2, extinguish state to guarantee that light-emitting component is in.After step S2 is complete, carry out once more step S1 to light-emitting component be in extinguish state till.Among the step S6, whether judge test voltage,, carry out step S7 and light-emitting component EOT when test voltage is not more than reference voltage greater than reference voltage; And, then carry out step S8 when test voltage during greater than reference voltage.Among the step S9, when another test voltage is not more than reference voltage, judge that light-emitting component is through test; And, judge the light-emitting component test crash when another test voltage during greater than reference voltage.
What need special instruction is that in the test bench of this preferred embodiment, whether its internal circuit is to adopt a positive logic connected mode to be set up, therefore, be to judge greater than reference voltage according to test voltage and another test voltage among step S6 and the step S9.And in other preferred embodiment, the internal circuit of test bench can adopt a negative logic connected mode to be set up, so whether its test voltage and another test voltage are to judge less than reference voltage.Structure about the internal circuit of test bench will specify after a while.
Next the test macro of light-emitting component of the present invention is described.Consult Fig. 2 and Fig. 3 simultaneously, Fig. 2 is the structural representation of test macro in first preferred embodiment of light-emitting component of the present invention, and Fig. 3 then is the internal circuit synoptic diagram of test macro in first preferred embodiment of light-emitting component of the present invention.The test macro 1 of light-emitting component comprises a host computer 10, a computer peripheral apparatus 11 and a test bench 12; And the test macro 1 of light-emitting component is in order to test the light-emitting component 131 on the circuit board 13; In this preferred embodiment, light-emitting component 131 is a light emitting diode.Circuit board 13 is connected in an on-off circuit 14; And on-off circuit 14 is connected in a power supply 15; On-off circuit 14 makes light-emitting component 131 produce a light beam L or be in and extinguish state, and power supply 15 gives circuit board 13 and on-off circuit 14 in order to electric power to be provided in order to drive or to cut out light-emitting component 131.
In the test macro 1 of light-emitting component; Host computer 10 is in order to the test result of output light-emitting component 131, and computer peripheral apparatus 11 is connected in host computer 10, and it is in order to show the test result of light-emitting component 131; In this preferred embodiment, computer peripheral apparatus 11 is a computer screen.Test bench 12 is connected in host computer 10, and in order to test light-emitting component 131, test bench 12 comprises one first light shield 121, one first photosensitive circuit 122, one second light shield 123, one second photosensitive circuit 124 and a decision circuitry 125.First light shield 121 is in order to be covered in no light-emitting component zone 132 on the circuit board 13 zone of light-emitting component 131 (that is be not provided with).First photosensitive circuit 122 has one first photo-sensitive cell cds1; The first photo-sensitive cell cds1 is positioned at first light shield 121; And in order to the brightness in the no light-emitting component of detecting zone 132, and first photosensitive circuit 122 produces a reference voltage V in order to the brightness according to no light-emitting component zone 132
Ref Second light shield 123 is in order to be covered in the light-emitting component 131 on the circuit board 13.Second photosensitive circuit 124 has one second photo-sensitive cell cds2; The second photo-sensitive cell cds2 is positioned at second light shield 123; And brightness in order to detecting light-emitting component 131; And second photosensitive circuit 124 produces a test voltage V in order to the brightness according to light-emitting component 131, and in this preferred embodiment, the first photo-sensitive cell cds1 and the second photo-sensitive cell cds2 are photoresistance.
Among Fig. 3; First photosensitive circuit 122 is except the first photoresistance cds1, and it more comprises one first resistance R 1 and one first capacitor C, 1, the first resistance R 1 is connected with the first photoresistance cds1 and first resistance R 1 is connected in voltage VCC; And the first photoresistance cds1 ground connection, wherein reference voltage V
RefBe voltage VCC dividing potential drop to be obtained by the first photoresistance cds1 and first resistance R 1.First capacitor C 1 is then parallelly connected with the first photoresistance cds1, in order to filter function to be provided.In second photosensitive circuit 124, test voltage V also obtains voltage VCC dividing potential drop according to the second photoresistance cds2 and second resistance R 2 of second photosensitive circuit 124, and its circuit arrangement and first photosensitive circuit 122 are identical and repeat no more.What need special instruction is; In first photosensitive circuit 122 and second photosensitive circuit 124; Not only the resistance value of the first photoresistance cds1 and the second photoresistance cds2 is identical; Its first resistance R 1 is identical with second resistance R 2, and first capacitor C 1 also second capacitor C 2 with second photosensitive circuit 124 is identical.Therefore can know that when the light-emitting component 131 that is covered by second light shield 123 did not produce light beam L, the test voltage V that second photosensitive circuit 124 is produced equaled reference voltage V
Ref
Next the decision circuitry 125 of test bench 12 is described.Please consult Fig. 3 and Fig. 4 simultaneously, Fig. 4 is the internal circuit synoptic diagram of comparing unit in first preferred embodiment of the test macro of light-emitting component of the present invention.Decision circuitry 125 is connected to first photosensitive circuit 122, second photosensitive circuit 124 and host computer 10, in order to judge that whether test voltage V is greater than reference voltage V
RefAnd whether decision light-emitting component 131 is through test.Decision circuitry 125 comprises a comparing unit 1251 and a control module 1252, and comparing unit 1251 is connected in first photosensitive circuit 122 and second photosensitive circuit 124 with the positive logic connected mode, in order to compare test voltage V and reference voltage V
RefAnd export the accurate position of corresponding logic signal.And control module 1252 is connected in comparing unit 1251 and host computer 10; In order to export corresponding signal to host computer 10 according to the accurate position of this logic signal; In this preferred embodiment; Comparing unit 1251 is a comparer, and the control module 1252 of test bench 12 is connected in host computer 10 by a RS232 interface connecting line.
Can know by Fig. 4; Comparing unit 1251 is by four operational amplifier (Operational Amplifier; OPA) 1251A, 1251B, 1251C and 1251D form; In this preferred embodiment, the second operational amplifier 1251B, the 3rd operational amplifier 1251C and four-operational amplifier 1251D are not activated and do not add explanation.Can know the reference voltage V that is produced by first photosensitive circuit 122 by Fig. 3 and Fig. 4
RefBy the INPUT 1-pin input of comparing unit 1251, and its INPUT 1-pin is the negative input end of the first operational amplifier 1251A.On the other hand, the test voltage V that second photosensitive circuit 124 is produced is by the INPUT 1+ pin input of comparing unit 1251, and its INPUT 1+ pin is the positive input terminal of the first operational amplifier 1251A.Know according to above-mentioned, according to the reference voltage V that circuit arrangement produced of first photosensitive circuit 122
RefInput to the negative input end of the first operational amplifier 1251A, and according to the test voltage V that circuit arrangement produced of second photosensitive circuit 124 input most the connected mode of the positive input terminal of the first operational amplifier 1251A be the positive logic connected mode.
Next the operation situation of the test macro 1 of light-emitting component of the present invention is described.Please consult Fig. 2 and Fig. 3 once more, when the test macro of light-emitting component 1 is set up completion, and circuit board 13 is connected in after the on-off circuit 14 light-emitting component 131 on the beginning testing circuit board 13.At first, whether 13 light-emitting component 131 is in and extinguishes state (that is step S1) on the check circuit plate, if not, closes light-emitting component 131 (that is step S2) by on-off circuit 14, and checks once more whether light-emitting component 131 is in and extinguish state.If light-emitting component 131 has been in and has extinguished state, then first light shield 121 of test bench 12 is covered in the no light-emitting component zone 132 of circuit board 13, and second light shield 123 of test bench 12 is covered in the light-emitting component 131 (that is step S3) of circuit board 13.After in definite dull thread gets into first light shield 121 and second light shield 123; By on-off circuit 14 driven light-emitting element 131; Make light-emitting component 131 produce a light beam L (that is step S4); At this moment, do not have light beam L to exist in first light shield 121, then have light beam L in second light shield 123.
Next, utilize the brightness (that is not having brightness) in the no light-emitting component of the first photo-sensitive cell cds1 detecting zone 132 that is positioned at first light shield 121 and obtain reference voltage V
Ref, and utilize the second photoresistance cds2 be positioned at second light shield 123 detect light-emitting component 131 light beam L brightness and obtain test voltage V.In first light shield 121, the first photoresistance cds1 does not detect light beam L, so the resistance value of the first photoresistance cds1 (for example being 5K Ω) is constant, and output is corresponding to the reference voltage V of this resistance value
Ref(for example being 1.5V).In second light shield 123; When the second photoresistance cds2 is shone by light beam L; The resistance value decline (for example dropping to 3K Ω) of the second photoresistance cds2 by 5K Ω; Because the resistance value of the second photoresistance cds2 descends, the test voltage V rising (for example rising to 2.5V) that second photosensitive circuit 124 is exported by 1.5V.
Its test voltage V is exported to the positive input terminal of comparing unit 1251 by second photosensitive circuit 124, and reference voltage V
RefThen exported to the negative input end of comparing unit 1251, and comparing unit 1251 judges that whether test voltage V is greater than reference voltage V by first photosensitive circuit 122
Ref(that is step S6).Judge test voltage V when comparing unit 1251 and be not more than reference voltage V
Ref(that is test voltage V approaches reference voltage V
Ref) time, it representes that driven light-emitting component 131 does not produce light beam L, so test voltage V should not change (that is keeping 1.5V) and is same as reference voltage V
RefOr approach reference voltage V
RefAt this moment; The accurate position of comparing unit 1251 outputs, one low logic signal to judging unit 1252; Make to receive the accurate position of low logic signal judgment unit 1252 generations one test crash signal to host computer 10, and the test crash signal shows light-emitting component 131 test crashs (that is step S7) by computer screen 11 with a picture display mode.Otherwise, when comparing unit 1251 judges that test voltage V is greater than reference voltage V
Ref(that is test voltage V is significantly greater than reference voltage V
Ref) time; The accurate position of comparing unit 1251 outputs, one high logic signal to judging unit 1252; And close light-emitting component 131 by on-off circuit 14, make the second photoresistance cds2 detect the brightness (that is not having brightness) of pent light-emitting component 131 and obtain another test voltage V ' (that is step S8).
At last, comparing unit 1251 judges that whether another test voltage V ' is greater than reference voltage V
Ref(that is step S8), when another test voltage V ' greater than reference voltage V
RefThe time; It representes that pent light-emitting component 131 still produces light beam L; So comparing unit 1251 produces the accurate position of low logic signal; Make to receive signal judgment unit, the accurate position of low logic 1252 output test crash signals, and the test crash signal shows light-emitting component 131 test crashs by computer screen 11 with the picture display mode equally to host computer 10.Be not more than reference voltage V and work as another test voltage V '
Ref(that is another test voltage V ' equals or approaches reference voltage V
Ref) time, it representes that pent light-emitting component 131 has been closed, making the brightness of second photoresistance cds2 detecting is no brightness.Therefore comparing unit 1251 produces another accurate position of high logic signal; Make to receive high logic accurate position signal and signal judgment unit 1252 outputs of the accurate position of another high logic are given host computer 10 through test signal, and show that with the picture display mode light-emitting component 131 is through test by computer screen 11 equally through test signal.The EOT of light-emitting component 131.
In addition, the present invention more provides one second preferred embodiment.See also Fig. 5, it tests the schematic block follow diagram of method in second preferred embodiment of light-emitting component for the present invention.The method that the present invention tests light-emitting component comprises: step S1*: utilize one first light shield on the test bench to be covered in the no light-emitting component zone on the circuit board; Step S2*: utilization is positioned at one first photo-sensitive cell of first light shield and detects the brightness in no light-emitting component zone and obtain a reference voltage; Step S3*: whether each light-emitting component on the check circuit plate is in and extinguishes state; Step S4*: close each light-emitting component, each light-emitting component is in extinguishes state; Step S5*: utilize second light shield of 1 on the test bench, one the 3rd light shield and one the 4th light shield to be covered in first light-emitting component, second light-emitting component and the 3rd light-emitting component on the circuit board respectively; Step S6*: drive each light-emitting component, make each light-emitting component produce light beam, and utilize each photo-sensitive cell that is positioned at each light shield to detect the beam brightness of each light-emitting component and obtain corresponding test voltage; Step S7*: judge that respectively whether corresponding test voltage is less than reference voltage; Step S8*: with sound prompting mode caution light-emitting component test crash; Step S9*: close each light-emitting component and detect the brightness of pent each light-emitting component and obtain corresponding another test voltage; And step S10*: judge that whether corresponding another test voltage is less than reference voltage.
In step S3*, when each light-emitting component is not to be in when extinguishing state, carry out step S4*, extinguish state to guarantee that each light-emitting component is in.After step S4* is complete, carry out once more step S3* to each light-emitting component be in extinguish state till.
Among the step S7*, judge that test voltage corresponding to each light-emitting component whether less than reference voltage, when arbitrary test voltage is not less than reference voltage, carries out step S8* and corresponding light-emitting component EOT.And, then carry out step S9* when test voltage during less than reference voltage.Among the step S10*, when arbitrary another test voltage is not less than reference voltage, judge that corresponding light-emitting component is through test; And, then judge corresponding light-emitting component test crash when arbitrary another test voltage during less than reference voltage.In the test bench of this preferred embodiment, its internal circuit adopts a negative logic connected mode to be set up, so its judgment standard is different with first preferred embodiment.
Next the test macro of light-emitting component of the present invention is described.Consult Fig. 6 and Fig. 7 simultaneously, Fig. 6 is the structural representation of test macro in second preferred embodiment of light-emitting component of the present invention, and Fig. 7 then is the internal circuit synoptic diagram of test macro in second preferred embodiment of light-emitting component of the present invention.The test macro 2 of light-emitting component comprises a host computer 20, a computer peripheral apparatus 21 and a test bench 22; And the test macro 2 of light-emitting component is in order to test one first light-emitting component 231, one second light-emitting component 232 and one the 3rd light-emitting component 233 on the circuit board 23; And circuit board 23 is connected in host computer 20, makes a plurality of light-emitting components 231～233 obtain electric power and can drive or close a plurality of light-emitting components 231～233 by the signal of host computer 20.This circuit board 23 is applied in the keyboard in this preferred embodiment; And a plurality of light-emitting components 231～233 are light emitting diode, that is first light-emitting component 231, second light-emitting component 232 and the 3rd light-emitting component 233 are respectively Num Lock pilot lamp, Caps Lock pilot lamp and Scrolllock pilot lamp on the keyboard.
In the test macro 2 of light-emitting component; Host computer 20 comprises a test module 201, and computer peripheral apparatus 21 is connected in host computer 20, and it is in order to show the test result of a plurality of light-emitting components 231～233; In this preferred embodiment, computer peripheral apparatus 21 is a PA-system.Test bench 22 is connected in host computer 20; In order to testing a plurality of light-emitting components 231～233, test bench 22 comprises one first light shield 221, one first photosensitive circuit 222, one second light shield 223, one second photosensitive circuit 224, one the 3rd light shield 225, one the 3rd photosensitive circuit 226, one the 4th light shield 227, one the 4th photosensitive circuit 228 and a decision circuitry 229.First light shield 221 is in order to be covered in no light-emitting component zone 234 on the circuit board 23 zone of light-emitting component (that is be not provided with).First photosensitive circuit 222 has one first photo-sensitive cell cds3; The first photo-sensitive cell cds3 is positioned at first light shield 221 and in order to the brightness in the no light-emitting component of detecting zone 234, and first photosensitive circuit 222 produces a reference voltage V in order to the brightness according to no light-emitting component regional 234
Ref *
Among Fig. 7; First photosensitive circuit 222 is except the first photoresistance cds3, and it comprises that more one first resistance R 3 and one first capacitor C, 3, the first resistance R 3 connect with the first photoresistance cds3 and first resistance R, 3 ground connection; And the first photoresistance cds3 is connected in voltage VCC, wherein reference voltage V
Ref *Be voltage VCC dividing potential drop to be obtained by the first photoresistance cds3 and first resistance R 3.First capacitor C 3 is then connected with the first photoresistance cds3; In order to filter function to be provided; What need pay special attention to is that the circuit arrangement of first photosensitive circuit 222 is different with first photosensitive circuit 122 of first preferred embodiment in this preferred embodiment, so the reference voltage V that obtains
Ref *Numerical value also different.
In second photosensitive circuit 224, the first test voltage V
1Also the second photoresistance cds4 and second resistance R 4 according to second photosensitive circuit 224 obtains voltage VCC dividing potential drop, and its circuit arrangement and first photosensitive circuit 222 are identical and repeat no more.In like manner, in the 3rd photosensitive circuit 226, the second test voltage V
2Also the 3rd photoresistance cds5 and the 3rd resistance R 5 according to the 3rd photosensitive circuit 226 obtains voltage VCC dividing potential drop.And in the 4th photosensitive circuit 228, the 3rd test voltage V
3Also the 4th photoresistance cds6 and the 4th resistance R 6 according to the 4th photosensitive circuit 22 obtains voltage VCC dividing potential drop.Identical with first preferred embodiment is; When first light-emitting component 231, second light-emitting component 232 and the 3rd light-emitting component 233 that are covered by second light shield 223, the 3rd light shield 225 and the 4th light shield 227 do not produce light beam L*, the first test voltage V that second photosensitive circuit 224, the 3rd photosensitive circuit 226 and the 4th photosensitive circuit 228 are produced
1, the second test voltage V
2And the 3rd test voltage V
3Equal reference voltage V
Ref *
Next the decision circuitry 229 of test bench 22 is described.Please consult Fig. 7 and Fig. 8 simultaneously, Fig. 8 is the internal circuit synoptic diagram of comparing unit in second preferred embodiment of the test macro of light-emitting component of the present invention.Decision circuitry 229 is connected to first photosensitive circuit 222, second photosensitive circuit 224, the 3rd photosensitive circuit 226, the 4th photosensitive circuit 228 and host computer 20, in order to judge test voltage V
1, V
2, V
3Whether greater than reference voltage V
Ref *And determine whether a plurality of light-emitting components 231～233 pass through test.Decision circuitry 229 comprises a comparing unit 2291 and a converting unit 2292; Comparing unit 2291 is to be connected in first photosensitive circuit 222, second photosensitive circuit 224, the 3rd photosensitive circuit 226 and the 4th photosensitive circuit 228 with the negative logic connected mode, in order to compare test voltage V
1, V
2, V
3With reference voltage V
Ref *And export the accurate position of corresponding logic signal.Converting unit 2292 is connected to comparing unit 2291 and host computer 20, in order to being the signal of specific format with the accurate position of a logic conversion of signals.In this preferred embodiment; Comparing unit 2291 is a comparer; Comparing unit 2291 is by a USB (Universal Serious Bus; USB) the interface connecting line is connected in host computer 20, and converting unit 2292 is for being the single chip microcomputer of the signal of USB form with the accurate position of a logic conversion of signals.
Can be known that by Fig. 8 comparing unit 2291 is made up of four operational amplifier 2291A, 2291B, 2291C and 2291D, in this preferred embodiment, four-operational amplifier 2291D is not activated and does not add explanation.Can know the reference voltage V that first photosensitive circuit 222 is produced by Fig. 7 and Fig. 8
Ref *Import by INPUT 1+ pin, INPUT 2+ pin and the INPUT 3+ pin of comparing unit 2291 respectively; Wherein INPUT 1+ pin is the positive input terminal of the first operational amplifier 2291A; INPUT 2+ pin is the positive input terminal of the second operational amplifier 2291B, and INPUT 3+ pin is the positive input terminal of the 3rd operational amplifier 2291C.On the other hand, the first test voltage V that produced of second photosensitive circuit 224
1By the INPUT 1-pin input of comparing unit 2291, and its INPUT 1-pin is the negative input end of the first operational amplifier 2291A.And the second test voltage V that the 3rd photosensitive circuit 226 is produced
2By the INPUT 2-pin input of comparing unit 2291, and its INPUT 2-pin is the negative input end of the second operational amplifier 2291B.The 3rd test voltage V that the 4th photosensitive circuit 228 is produced
3By the INPUT 3-pin input of comparing unit 2291, and its INPUT 3-pin is the negative input end of the 3rd operational amplifier 2291C.Know reference voltage V according to above-mentioned
Ref *Input to the positive input terminal of the first operational amplifier 2291A, and the first test voltage V
1, the second test voltage V
2And the 3rd test voltage V
3Most the first operational amplifier 2291A, the second operational amplifier 2291B are the negative logic connected mode with the connected mode of the negative input end of the 3rd operational amplifier 2291C in input respectively.
Next the operation situation of the test macro 2 of light-emitting component of the present invention is described.Please consult Fig. 6 and Fig. 7 once more, when the test macro of light-emitting component 2 is set up completion, and circuit board 23 is connected in after the host computer 20 a plurality of light-emitting components 231～233 on the beginning testing circuit board 23.At first; First light shield 221 of test bench 22 is covered in no light-emitting component zone 234 (that is step S1*) of circuit board 23; And after in definite dull thread gets into first light shield 221, the first photo-sensitive cell cds3 that utilization is positioned at first light shield 221 detects the brightness in no light-emitting component zone 234 and obtains a reference voltage V
Ref *(that is step S2*).In first light shield 221, the first photoresistance cds3 does not detect light beam L*, so the resistance value of the first photoresistance cds3 (for example being 5K Ω) is constant, and output is corresponding to the reference voltage V of this resistance value
Ref *(for example being 2V).Next whether a plurality of light-emitting components 231～233 of 23 are in and extinguish state (that is step S3*) on the check circuit plate; If not; Close a plurality of light-emitting components 231～233 (that is step S4*) by host computer 20 produces signals, and check once more whether a plurality of light-emitting components 231～233 are in and extinguish state.If a plurality of light-emitting components 231～233 have been in and extinguish state, then second light shield 223, the 3rd light shield 225 and the 4th light shield 227 of test bench 22 is covered in first light-emitting component 231, second light-emitting component 232 and the 3rd light-emitting component 233 (that is step S5*) of circuit board 23 respectively.
After in definite dull thread gets into second light shield 223, the 3rd light shield 225 and the 4th light shield 227; By producing signal, host computer 20 drives a plurality of light-emitting components 231～233; Make a plurality of light-emitting components 231～233 produce light beam L* respectively, and utilize respectively the second photoresistance cds4, the 3rd photoresistance cds5 and the 4th photoresistance cds6 detect first light-emitting component 231, second light-emitting component 232 and the 3rd light-emitting component 233 light beam L* brightness and obtain the first test voltage V
1, the second test voltage V
2And the 3rd test voltage V
3(that is step S6*).In second light shield 223, the second photoresistance cds4 is descended (for example dropping to 3K Ω by 5K Ω) the first test voltage V that second photosensitive circuit 224 is exported by light beam L* irradiation and its resistance value
1Descend (for example dropping to 1.25V) by 2V.And the second test voltage V
2And the 3rd test voltage V
3Also, then repeat no more in like manner.
Its first test voltage V
1, the second test voltage V
2And the 3rd test voltage V
3Exported to three negative input ends of comparing unit 2291, and reference voltage V
Ref *Then exported to the positive input terminal of comparing unit 1251, and comparing unit 1251 is judged the first test voltage V respectively by first photosensitive circuit 222
1, the second test voltage V
2And the 3rd test voltage V
3Whether less than reference voltage V
Ref *(that is step S7*).When comparing unit 2291 is judged arbitrary test voltage V
1, V
2Or V
3Be not less than reference voltage V
Ref *(that is test voltage V
1, V
2Or V
3Approach reference voltage V
Ref *) time, it representes that driven light-emitting component 231,232 or 233 does not produce light beam L*, so test voltage V
1, V
2Or V
3Should not change (that is keeping 2V) and be same as reference voltage V
Ref *Or approach reference voltage V
Ref *At this moment; The accurate position of comparing unit 2291 outputs, one low logic signal to host computer 20; And the test module in the host computer 20 201 receives the accurate position of low logic signal; And produce a test crash signal, and the test crash signal is represented corresponding light-emitting component 231,232 or 233 test crashs (that is step S8*) by PA-system 21 with sound prompting display mode.
Otherwise, when comparing unit 2291 is judged test voltage V
1, V
2Or V
3Less than reference voltage V
Ref *(that is test voltage V
1, V
2Or V
3Significantly less than reference voltage V
Ref *) time; The accurate position of comparing unit 2291 outputs, one high logic signal; The accurate position of high logic signal is converted into corresponding to a UBS format signal of the accurate position of high logic signal and is exported to host computer 20 through converting unit 2292; And host computer 20 produces signal and closes corresponding light-emitting component 231,232 or 233, makes corresponding photoresistance cds4, cds5 or cds6 detect the brightness (that is not having brightness) and the 4th corresponding test voltage V of acquisition of pent light-emitting component 231,232 or 233
4, the 5th test voltage V
5Or the 6th test voltage V
6(that is step S9*).
At last, comparing unit 2291 is judged the 4th test voltage V respectively
4, the 5th test voltage V
5Or the 6th test voltage V
6Whether less than reference voltage V
Ref *(that is step S10*) is as the 4th test voltage V of correspondence
4, the 5th test voltage V
5Or the 6th test voltage V
6Less than reference voltage V
Ref *The time; It representes that pent light-emitting component 231,232 or 233 still produces light beam L*; So comparing unit 2291 produces the accurate position of low logic signal; The accurate position of low logic signal is converted into corresponding to the 2nd UBS format signal of the accurate position of low logic signal and is exported to host computer 20 through converting unit 2292; Make the test module 201 of host computer 20 produce the test crash signal, and represent light-emitting component 231,232 or 233 test crashs with sound prompting mode by PA-system 21 according to the 2nd UBS format signal.
And as the 4th test voltage V
4, the 5th test voltage V
5Or the 6th test voltage V
6Be not less than reference voltage V
Ref *(that is the 4th test voltage V
4, the 5th test voltage V
5Or the 6th test voltage V
6Equal or approach reference voltage V
Ref *) time, it representes that pent light-emitting component 231,232 or 233 has been closed, making the brightness of photoresistance cds4, cds5 or cds6 detecting is no brightness.Therefore comparing unit 2291 produces another accurate position of high logic signal respectively; And another accurate position of high logic signal is converted into the 3rd UBS format signal corresponding to another accurate position of high logic signal by converting unit 2292; The test module 201 that receives a UBS format signal and the 3rd UBS format signal is produced through test signal, and represent that with the sound prompting mode light-emitting component 231,232 or 233 is through test by PA-system 21 in regular turn equally through test signal.Light-emitting component 231,232 or 233 EOT.
Can know according to above-mentioned each preferred embodiment; The present invention tests the method for light-emitting component and the test macro of light-emitting component is to detect not luminous brightness and obtain reference voltage by first photo-sensitive cell that is positioned at first light shield; Utilize second photo-sensitive cell be positioned at second light shield to detect luminous brightness and obtain test voltage again, and directly compare test voltage can judge that with reference voltage light-emitting component is whether luminous or when being closed, extinguish when the quilt driving.Because first photosensitive circuit and second photosensitive circuit is identical and its that position is set is quite approaching; When first photosensitive circuit makes its circuit parameter occurrence of errors because of some external factor; The circuit parameter of second photosensitive circuit also can occurrence of errors; So its error is little for the influence of reference voltage and test voltage, to reduce the probability of erroneous judgement.Moreover the present invention tests the method for light-emitting component and the test macro of light-emitting component can be carried out by host computer, that is can the automatic test mode test light-emitting component, and does not need to test by manual type.
The above is merely preferred embodiment of the present invention, is not in order to limiting claim scope of the present invention, and therefore all other do not break away from the equivalence of being accomplished under the disclosed spirit and change or modify, and all should be contained in the scope of the present invention.
Claims (14)
1. the test macro of a light-emitting component in order to the light-emitting component of test setting on a circuit board, is characterized in that the test macro of this light-emitting component comprises:
Host computer is in order to export the test result of this light-emitting component; And
Test bench is connected in this host computer, and in order to test this light-emitting component, this test bench comprises:
First light shield is in order to be covered in the no light-emitting component zone on this circuit board;
First photosensitive circuit has first photo-sensitive cell, and this first photo-sensitive cell is positioned at this first light shield, and this first photosensitive circuit produces a reference voltage in order to the regional brightness of detecting according to this first photo-sensitive cell of this no light-emitting component;
Second light shield is in order to be covered in this light-emitting component;
Second photosensitive circuit has second photo-sensitive cell, and this second photo-sensitive cell is positioned at this second light shield, and this second photosensitive circuit produces test voltage in order to the brightness of this light-emitting component of detecting according to this second photo-sensitive cell; And
Whether whether decision circuitry is connected to this first photosensitive circuit, this second photosensitive circuit and this host computer, determine this light-emitting component through test greater than this reference voltage in order to judge this test voltage.
2. the test macro of light-emitting component as claimed in claim 1 is characterized in that, this decision circuitry comprises:
Comparing unit is connected in this first photosensitive circuit and this second photosensitive circuit, in order to relatively this test voltage and this reference voltage; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a positive logic connected mode; And this test voltage that obtains according to driven this light-emitting component is during greater than this reference voltage; This comparing unit is exported the accurate position of high logic signal; And when this test voltage is not more than this reference voltage, the accurate position of the low logic of this comparing unit output signal; Maybe work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a negative logic connected mode; And this test voltage is during less than this reference voltage; This accurate position of high logic signal of this comparing unit output; And this test voltage is when being not less than this reference voltage, and this comparing unit output should the accurate position of low logic signal; And
Control module is connected in this comparing unit and this host computer, should high logic accurate position signal or receive should the accurate position of low logic signal in order to receive, and when receiving this accurate position of low logic generation test crash signal to this host computer.
3. the test macro of light-emitting component as claimed in claim 2; It is characterized in that; After this control module receives this accurate position of high logic signal; This light-emitting component is closed and is obtained another test voltage by this second photosensitive circuit detecting, and this comparing unit judges that according to this another test voltage and this reference voltage whether this light-emitting component is through test; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with this positive logic connected mode; And when this another test voltage is not more than this reference voltage; Another accurate position of high logic signal of this comparing unit output; Make this control module according to this high logic accurate position signal and this another accurate position of high logic signal produce one through test signal to this host computer, and when this test voltage during greater than this reference voltage, this comparing unit output should the accurate signal of low logic; And be connected in this comparing unit with this negative logic connected mode when this first photosensitive circuit and this second photosensitive circuit; And when this another test voltage is not less than this reference voltage; This accurate position of high logic of comparing unit output this another signal; This control module is produced according to this high logic accurate position signal and this another accurate position of high logic signal should be through test signal to this host computer, and when this test voltage during less than this reference voltage, this comparing unit output should a low logic standard signal.
4. the test macro of light-emitting component as claimed in claim 1 is characterized in that, this decision circuitry comprises comparing unit, and this comparing unit is connected in this first photosensitive circuit and this second photosensitive circuit, in order to relatively this test voltage and this reference voltage; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a positive logic connected mode; And this test voltage is during greater than this reference voltage; This comparing unit is exported the accurate position of high logic signal to this host computer; And when this test voltage is not more than this reference voltage, the accurate position of the low logic of this comparing unit output signal to this host computer; Maybe work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with a negative logic connected mode; And this test voltage is during less than this reference voltage; This accurate position of high logic signal of this comparing unit output is to this host computer; And this test voltage is when being not less than this reference voltage, this comparing unit output should the accurate position of low logic signal to this host computer.
5. the test macro of light-emitting component as claimed in claim 4; It is characterized in that; After this host computer receives this accurate position of high logic signal; This light-emitting component is closed and is obtained another test voltage by this second photosensitive circuit detecting, and this comparing unit judges that according to this another test voltage and this reference voltage whether this light-emitting component is through test; Wherein work as this first photosensitive circuit and this second photosensitive circuit and be connected in this comparing unit with this positive logic connected mode; And when this another test voltage is not more than this reference voltage; Another accurate position of high logic signal of this comparing unit output is to this host computer; And when this test voltage during greater than this reference voltage, this comparing unit output should the accurate position of low logic signal; And be connected in this comparing unit with this negative logic connected mode when this first photosensitive circuit and this second photosensitive circuit; And when this another test voltage is not less than this reference voltage; This accurate position of high logic of comparing unit output this another signal is to this host computer; And when this test voltage during less than this reference voltage, this comparing unit output should the accurate position of low logic signal.
6. the test macro of light-emitting component as claimed in claim 5; It is characterized in that; This host computer comprises test module; Produce this test through signal when receiving this high logic accurate position signal and this another accurate position of high logic signal when this host computer, maybe when this host computer receives this low logic standard signal, produce this test crash signal.
7. the test macro of light-emitting component as claimed in claim 6 is characterized in that, also comprises computer peripheral apparatus, and this computer peripheral apparatus is connected in this host computer, should test pass through signal or this test crash signal in order to show.
8. the test macro of light-emitting component as claimed in claim 7; It is characterized in that this computer peripheral apparatus is in order to show that this test is through the computer screen of signal or this test crash signal or with the PA-system of different these tests of sound prompting through signal or this test crash signal.
9. the test macro of light-emitting component as claimed in claim 1; It is characterized in that; This test bench is by RS232 interface connecting line or USB joint face and be connected in this host computer, and this first photo-sensitive cell and this second photo-sensitive cell are photoresistance.
10. method of testing light-emitting component in order to the light-emitting component of test setting on a circuit board, is characterized in that the method for this test light-emitting component comprises:
Cover the no luminous optical element zone on this light-emitting component and this circuit board respectively, and obtain a reference voltage, and obtain test voltage according to the brightness of driven this light-emitting component according to the brightness in this no light-emitting component zone; And
Judge that according to this test voltage and this reference voltage whether this light-emitting component is through test.
11. the method for test light-emitting component as claimed in claim 10; It is characterized in that; This no light-emitting component zone and this light-emitting component of covering this measurand respectively are to utilize first light shield and second light shield to be covered in this no light-emitting component zone and this light-emitting component respectively respectively; And obtain this reference voltage according to the brightness in this no light-emitting component zone, and detect the brightness of this light-emitting component and obtain this test voltage by second photo-sensitive cell that is positioned at this second light shield by first photo-sensitive cell detecting that is positioned at this first light shield.
12. the method for test light-emitting component as claimed in claim 11; It is characterized in that; When this first photo-sensitive cell and this second photo-sensitive cell are to be set up with a positive logic connected mode, and this test voltage is closed this light-emitting component during greater than this reference voltage; And when this test voltage is not more than this reference voltage, judge this light-emitting component test crash; Maybe working as the resistance of this first photo-sensitive cell and this second photo-sensitive cell is to be set up with a negative logic connected mode; And this test voltage is during less than this reference voltage; Close this light-emitting component, and this test voltage is judged this light-emitting component test crash when being not less than this reference voltage.
13. the method for test light-emitting component as claimed in claim 12; It is characterized in that; When this light-emitting component is closed and by the detecting of this second photosensitive circuit and obtain another test voltage, and judge that according to this another test voltage and this reference voltage whether this light-emitting component is through testing; Wherein working as this first photosensitive circuit and this second photosensitive circuit is set up with this positive logic connected mode; And when this another test voltage is not more than this reference voltage; Judge this light-emitting component through test, and, judge this light-emitting component test crash when this test voltage during greater than this reference voltage; And be set up with this negative logic connected mode when this first photosensitive circuit and this second photosensitive circuit; And when this another test voltage is not less than this reference voltage; Judge this light-emitting component through test, and, judge this light-emitting component test crash when this test voltage during less than this reference voltage.
14. the method for test light-emitting component as claimed in claim 10; It is characterized in that, also comprise with the picture display mode showing that this light-emitting component points out this light-emitting component through test or this light-emitting component test crash through test or this light-emitting component test crash or with sound mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101068440A CN102759716A (en) | 2011-04-27 | 2011-04-27 | Testing system of luminous element and method for testing luminous element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101068440A CN102759716A (en) | 2011-04-27 | 2011-04-27 | Testing system of luminous element and method for testing luminous element |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102759716A true CN102759716A (en) | 2012-10-31 |
Family
ID=47054227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011101068440A Pending CN102759716A (en) | 2011-04-27 | 2011-04-27 | Testing system of luminous element and method for testing luminous element |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102759716A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3315078A (en) * | 1962-10-13 | 1967-04-18 | Philips Corp | Optical feedback stabilizing circuit for a voltage source having a high internal resistance |
| US20070113124A1 (en) * | 2005-11-14 | 2007-05-17 | Chi-Tung Chang | Method of testing integrated circuit and apparatus therefor |
| US20090078853A1 (en) * | 2007-09-21 | 2009-03-26 | Lin Chung-Jyh | Light emitting device and control method thereof |
-
2011
- 2011-04-27 CN CN2011101068440A patent/CN102759716A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3315078A (en) * | 1962-10-13 | 1967-04-18 | Philips Corp | Optical feedback stabilizing circuit for a voltage source having a high internal resistance |
| US20070113124A1 (en) * | 2005-11-14 | 2007-05-17 | Chi-Tung Chang | Method of testing integrated circuit and apparatus therefor |
| US20090078853A1 (en) * | 2007-09-21 | 2009-03-26 | Lin Chung-Jyh | Light emitting device and control method thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105182371A (en) | GNSS product automatic test method based on function test | |
| CN107589568B (en) | Automatic learning and detecting device and method for LED lamp string | |
| CN110673022A (en) | Thin film keyboard PCBA testing device and method | |
| CN110261384B (en) | Detection device and detection method for silicon carbide chip | |
| CN205015449U (en) | Be shaded and adjust test system | |
| WO2021175257A1 (en) | Method for configuration updating of led display screen, receiving card, led display module, and led display screen | |
| CN101539604B (en) | Wiring detection system and wiring detection method | |
| CN101004879A (en) | Method and device for testing display screen | |
| CN109633322B (en) | Control circuit of electronic fuze test board | |
| CN203037756U (en) | Function detection apparatus for running recorders | |
| CN103901339A (en) | Device and method for detecting one-way reliability of carrier rocket two-out-of-three ignition circuit | |
| CN203572904U (en) | Flat cable testing device | |
| CN204241667U (en) | A kind of Intelligent lamp detection system | |
| CN107765117A (en) | A kind of test device and method of optical module self-healing | |
| CN102759716A (en) | Testing system of luminous element and method for testing luminous element | |
| TWI432751B (en) | Testing system of illuminating element and method for testing illuminating element | |
| CN211348585U (en) | UV-LED lamp source control circuit with short circuit and open circuit detection | |
| CN202956663U (en) | Automatic debugging instrument of engineering machinery full-power control system | |
| CN112985591B (en) | Photosensitive detection equipment and system | |
| CN108459232A (en) | touch screen test device and method | |
| CN205450169U (en) | Wire rod conduction testing tool | |
| CN101777326B (en) | VGA video card test tooling and method | |
| CN212229081U (en) | Withstand voltage ground connection automatic testing arrangement | |
| CN210119549U (en) | LED lamp automatic identification system applied to production line | |
| CN102879705A (en) | IC (integrated circuit) channel short/open circuit test method for flexible circuit board touch screen |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| AD01 | Patent right deemed abandoned |
Effective date of abandoning: 20121031 |
|
| C20 | Patent right or utility model deemed to be abandoned or is abandoned |