CN102749606B - Measurement method and device for optical voltage transformer dynamic property research - Google Patents

Measurement method and device for optical voltage transformer dynamic property research Download PDF

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Publication number
CN102749606B
CN102749606B CN201210207736.7A CN201210207736A CN102749606B CN 102749606 B CN102749606 B CN 102749606B CN 201210207736 A CN201210207736 A CN 201210207736A CN 102749606 B CN102749606 B CN 102749606B
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signal
module
voltage transformer
optical voltage
digital
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CN102749606A (en
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李慧
毕兰
崔利阳
李立京
许文渊
张春熹
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Anhui Huachi Kinetic Energy Technology Co ltd
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Beihang University
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Abstract

The invention discloses a test method and a device for optical voltage transformer dynamic property research. A board NI7813R which contains field programmable gate array (FPGA) is utilized to substitute the FPGA in the closed-loop detection circuit of the original optical voltage transformer, an isolation device is arranged between an analog-digital/digital-analog converter of the closed-loop detection circuit and the FPGA of the board NI7813R for connection and communication, and the FPGA of the board NI7813R is connected with a computer through a peripheral component interconnect (PCI) bus; the test device has the capabilities of high speed data acquiring, storing and processing, closed-loop state variables can be displayed and stored by the computer, so the working condition of a system closed loop is monitored in real time; no other external equipment is needed, sine excitation signals and step-input singles with tunable frequency are provided by a hardware of the measurement device, so the frequency characteristic and the closed-loop step response performance of an optical voltage mutual inductance system are tested; and the frequency characteristic of an internal function module in an optical voltage transformer can be tested, a high frequency dynamic model of the module is built, and a foundation is laid for the optical voltage transformer dynamic property research.

Description

A kind of method of testing for the research of optical voltage transformer dynamic property and device
Technical field
The present invention relates to a kind of optical voltage transformer, particularly relate to a kind of method of testing for the optical voltage transformer dynamic property research based on Pockels effect and device.
Background technology
Dynamic property research is an important content of optical voltage transformer research; the dynamic property of national standard IEC 60044-8 to optical voltage transformer explicitly calls for: in high-tension measurement, require that voltage transformer (VT) at least should have the frequency response characteristic of a few KHz and the response time of several milliseconds; for some purposes such as traveling-wave protection relay, the survey frequency of needs is up to hundreds of kHz.Show according to existing documents and materials, the existing optical voltage transformer experimental prototype bandwidth based on Pockels effect is up to 40kHz both at home and abroad at present, the existing optical voltage transformer product bandwidth based on Pockels effect is up to 10kHz both at home and abroad at present, also there is a certain distance with the requirement of national standard.Therefore, to study and the dynamic property of improving optical voltage transformer has important scientific value and Practical significance.
Frequency characteristic and step response rise time, regulating time and overshoot are all weigh the important indicator of optical voltage transformer dynamic property, but it is more difficult to carry out frequency characteristic test to optical voltage transformer, because this not only needs external equipment to provide the high-frequency ac voltage signal of frequency-adjustable as sinusoidal excitation signal, and supporting equipment is needed to carry out the output response signal of high speed acquisition mutual inductor and analyzing and processing.High-frequency ac voltage signal is realized by signal generator and transformer in prior art, frequency characteristic test is realized again by lock-in amplifier and oscillograph, this brings very large difficulty to frequency characteristic test and research work, is unfavorable for the research of optical voltage transformer dynamic property.
On the other hand, in the monitoring of optical voltage transformer system closed loop states and system, the foundation of internal module high frequency dynamic model is the foundation studying and improve dynamic performance.And optical voltage transformer system closed loop control process all carries out in FPGA in prior art, and closed loop states variable is with Microsecond grade Rapid Variable Design, is difficult to real-time monitoring system closed loop states.In prior art, the mode often through theory deduction is set up to the model of optical voltage transformer internal system module, be difficult to the dynamic model of approaching to reality detecting signal unit, be unfavorable for carrying out of optical voltage transformer dynamic property research work.
Summary of the invention
The object of this invention is to provide a kind of method of testing for the research of optical voltage transformer dynamic property and device.Described device, without the need to any additional equipment, utilizes own hardware just can provide the sinusoidal excitation signal of frequency-adjustable, realizes the frequency characteristic test of optical voltage transformer system, and provides step input signal to realize the test of closed loop step response performance.And the described proving installation for the research of optical voltage transformer dynamic property has the ability of high-speed data acquisition, Storage and Processing, and speed can reach nanosecond order, can the closed loop states variable of extract real-time and monitoring optical voltage transformer system.Further, present invention also offers a kind of method setting up the high frequency dynamic model of each functional module of optical voltage transformer internal system.Visible, technical scheme provided by the invention is that the raising of optical voltage transformer dynamic property provides a kind of favourable support study dies platform.
Proving installation for the research of optical voltage transformer dynamic property provided by the invention, the board NI7813R containing FPGA is utilized to replace FPGA in original optical voltage transformer closed-loop detection circuit, and the AD of closed-loop detection circuit, FPGA between D/A converter and board NI7813R are provided with spacer assembly connecting communication, and on board NI7813R, FPGA connects computing machine by pci bus; Base when described board NI7813R comprises one piece of FPGA and 40M; FPGA on described NI7813R comprises 160 digital input/output line DIO, also comprises detecting signal unit, signal generating unit I, signal generating unit II and signal sum unit; Described detecting signal unit is for receiving the output signal of A/D converter, also for by the output signal of AD data demodulates, closed-loop control, generation mutual inductor output module and produce staircase waveform and square-wave signal, and together with the signal produced with signal generating unit I or signal generating unit II, be added in signal sum unit, finally by DIO and spacer assembly, enter D/A converter; Described detecting signal unit comprises receiver module I, receiver module II, demodulation module, closed loop control algorithm module, mutual inductor output module, staircase waveform generation module, square wave generation module; The signal that in described detecting signal unit, the output data of each functional module and described signal generating unit I, signal generating unit II produce all time synchronized sends computing machine to; Described computing machine comprises operation interface, signal acquisition module and data processing module, and described operation interface is for the selection of functional test and to parameter assignment in signal generating unit I and signal generating unit II; Described signal acquisition module is used for the signal of the output data of each functional module in real time display and storage signal detecting unit and described signal generating unit I, signal generating unit II generation; Data processing module is used for processing the data in signal acquisition module, obtains frequency characteristic and the high frequency dynamic model of optical voltage transformer system response curve, step response curve and optical voltage transformer internal module.
The present invention also provides a kind of method of testing based on described proving installation, and described method of testing can produce the digital sine pumping signal I of frequency-adjustable by signal generating unit I, test the frequency characteristic of optical voltage transformer system; Digital step signal can be produced by signal generating unit I, the step response process of optical voltage transformer system is tested; The digital oblique wave pumping signal II of characteristic frequency can be produced by signal generating unit II, testing photoelectronic detector and front frequency characteristic of putting filtering circuit, data processing module based on measured frequency characteristic by the method establishment photodetector of Model Distinguish and the front high frequency dynamic model putting filtering circuit; The method of testing of above difference in functionality is selected to realize by the operation interface of computing machine very easily.
The invention has the advantages that:
(1) just can easily the dynamic property of measuring optical voltage transformer (VT) without the need to additional electronic equipment, as frequency response characteristic and step response performance.
(2) proving installation provided by the invention has the ability of high-speed data acquisition, Storage and Processing, can realize display and the storage of closed loop states variable, real-time monitoring system closed-loop working state.
(3) method of testing provided by the invention and device, can measure the frequency characteristic of optical voltage transformer inner function module, sets up the high frequency dynamic model of module, for the research of optical voltage transformer dynamic property lays the foundation.
Accompanying drawing explanation
Fig. 1 is the structural representation of optical voltage transformer system in prior art;
Fig. 2 the invention provides the proving installation structural representation for the research of optical voltage transformer dynamic property;
Fig. 3 is detailed detecting signal unit structured flowchart provided by the invention;
Fig. 4 a, Fig. 4 b the invention provides the digital sine pumping signal I for the test of optical voltage transformer system response;
Fig. 5 a, Fig. 5 b the invention provides the digital step signal for optical voltage transformer system step response test;
Fig. 6 a, Fig. 6 b, Fig. 6 c be the invention provides for detector and front put filtering circuit frequency characteristic test digital oblique wave pumping signal II and; The schematic diagram that digital cosine pumping signal produces;
Fig. 7 is the frequency characteristic of the optical voltage transformer system utilizing method of testing of the present invention and device gained;
Fig. 8 is the step response curve of the optical voltage transformer system utilizing method of testing of the present invention and device gained;
Fig. 9 for utilize method of testing of the present invention and device to detector and before put filtration module frequency characteristic test result;
Figure 10 is the result utilizing method of testing of the present invention and device to realize closed loop states variable to show in real time.
Embodiment
Below in conjunction with drawings and Examples, the present invention is described in detail.
Be illustrated in figure 1 the theory structure schematic diagram based on Pockels effect optical voltage transformer in prior art, be made up of light path and closed-loop detection circuit.Light path part comprises light source, circulator, the polarizer, phase-modulator and sensing unit, and closed-loop detection circuit comprises photodetector, frontly puts filtering circuit, A/D converter, FPGA, D/A converter and D/A driving circuit.The light that light source sends arrives sensing unit successively after circulator, the polarizer, phase-modulator.Due to Pockels effect, voltage signal to be measured is converted to and carries non-inequality phase differential by sensing unit light signal, described light signal is back to phase-modulator and the polarizer by the effect of reflectance coating in sensing unit, and interferes at polarizer place.Interference light intensity expression formula is:
Wherein α is light path total losses, I 0for incident intensity, with be respectively t and the t-τ moment phase modulation through phase-modulator, τ is the time that light transmits at sensing unit.When adopting square-wave frequency modulation and staircase waveform feedback scheme, for feeding back the bench height of staircase waveform.
Interference light intensity signal is coupled into photodetector by coupling mechanism, and photodetector detects interference light intensity signal and is converted into electric signal, after front putting filtering circuit and A/D converter, send into FPGA.The closed-loop error signal act as input of FPGA carry out demodulation, demodulation result is sent in the closed loop control algorithm of FPGA.In existing optical voltage transformer, closed loop control algorithm generally adopts integration control, namely carries out cumulative integral to demodulation result, obtains magnitude of voltage to be measured.Obtain the bench height feeding back staircase waveform after integral result being multiplied by feedback factor, produce feedback staircase waveform by cumulative for bench height.Produce modulated square wave simultaneously.Modulated square wave and feedback staircase waveform are by D/A converter and D/A driving circuit is after-applied to phase-modulator, be converted into phase modulation.The bench height of feedback staircase waveform with Pockels phase shift equal and opposite in direction, direction is contrary, then optical voltage transformer is operated in closed-loop steady state.
In prior art, the solution of optical voltage transformer system closed-loop error signal is in harmonious proportion close-loop feedback etc. and all carries out in the FPGA of closed-loop detection circuit, and the data in FPGA to be generally connected the display and storage that realize data with computing machine by serial ports.Closed loop cycle in FPGA is Microsecond grade, but due to serial ports cannot high speed real-time transmission data, causing can not extract real-time system closed loop states variable, monitoring system closed-loop working state.And it is more difficult to utilize prior art to carry out frequency characteristic test to optical voltage transformer system, high-frequency ac voltage required when being difficult to obtain test, is difficult to the high frequency response output signal of high speed acquisition mutual inductor.
The present invention devises a kind of proving installation for the research of optical voltage transformer dynamic property, this proving installation improves original optical voltage transformer, utilize and replace FPGA in original optical voltage transformer closed-loop detection circuit containing the board NI7813R of FPGA, and closed-loop detection circuit AD, be provided with spacer assembly connecting communication between D/A converter and the FPGA of board NI7813R.Data on board NI7813R in FPGA can by pci bus high speed real-time be sent to computing machine.Closed loop states variable in system can not only be sent to computing machine by board NI7813R by described proving installation in real time to carry out showing and storing, and the dynamic perfromance of optical voltage transformer system can be measured, and the high frequency dynamic model of internal module in system can be set up.
The described proving installation for the research of optical voltage transformer dynamic property is made up of spacer assembly, board NI7813R and computing machine, and its structured flowchart as shown in Figure 2.Signal isolating device adopts magnetic coupling isolation method to reduce the noise of signal transmission between closed-loop detection circuit and board NI7813R.Described signal isolating device is made up of magnetic coupling isolating chip and cable interface.Magnetic coupling isolating chip side is connected with cable interface, and opposite side is connected with D/A converter with the A/D converter in optical voltage transformer testing circuit.Cable interface is connected with the digital IO line (DIO) of FPGA on board NI7813R by cable.
It is XC2V3000 that described board NI7813R comprises one piece of FPGA(model) and 40M time base.FPGA on described NI7813R comprises 160 digital input/output line DIO.In the present invention, the FPGA on board NI7813R is improved, add detecting signal unit, signal generating unit I, signal generating unit II and signal sum unit.Described signal generating unit I, signal generating unit II, signal sum unit and detecting signal unit are all arranged on FPGA.Described 160 digital input/output lines (DIO) are all embedded on FPGA, for being connected with AD, DA.Described board NI7813R is connected with computing machine by the PCI slot of computing machine.
Described computing machine can be various types of computing machine, notebook, laptop computer and industrial computer, and comprises operation interface, signal acquisition module and data processing module.Described operation interface, signal acquisition module and data processing module are arranged on computing machine.
Below will carry out functional realiey description respectively to detecting signal unit provided by the invention, signal generating unit I, signal generating unit II, signal sum unit, operation interface, signal acquisition module and data processing module.
Detecting signal unit
Described detecting signal unit comprises receiver module I, receiver module II, demodulation module, closed loop control algorithm module, mutual inductor output module, staircase waveform generation module, square wave generation module, and its structured flowchart as shown in Figure 3.
Described receiver module I can receive and store A/D conversion after data and the demodulation module sent on board NI7813R in FPGA.Simultaneously, the output data of receiver module I are transferred to computing machine by pci bus.Receiver module I input end is connected with DIO, and output terminal is connected with demodulation module and computing machine.
Data after described receiver module II can receive and store A/D conversion are also transferred to computing machine by pci bus, display real-time in signal acquisition module on computers and storage.Receiver module II input end is connected with DIO, exports data and is transferred to computing machine by pci bus.
Demodulation module is for realizing the demodulation of closed-loop error signal, and its input end is connected with receiver module I, and for gathering the data of A/D converter in receiver module I and realizing the demodulation of closed-loop error signal, its output terminal is connected with closed loop control algorithm module.And the data that demodulation exports can be transferred to computing machine by pci bus.
Closed loop control algorithm module input is connected with demodulation module, and output terminal is connected with staircase waveform generation module with mutual inductor output module, and wherein closed-loop control can be realized by integrator.The data of described mutual inductor output module can be transferred to computing machine by pci bus.Described staircase waveform generation module is all connected with signal sum unit with the output terminal of square wave generation module.
The output signal of described demodulation module, closed loop control algorithm module and mutual inductor output module constitutes the closed loop states variable of optical voltage transformer.
The closed-loop error signal that the data that demodulation module receives have been essentially modulated, therefore this demodulation module is mainly through adopting a little to data according to the positive and negative half period of modulated square wave, positive half period data sum is deducted negative half-cycle data sum, realize digital demodulation process, obtain the closed-loop error of optical voltage transformer system, send into closed loop control algorithm module.If closed loop control algorithm module is integrator, produce output signal after carrying out cumulative integration to closed-loop error signal, the output signal of closed loop control algorithm module sends into staircase waveform generation module and mutual inductor output module respectively.Mutual inductor output module will obtain the output of optical voltage transformer after the smoothing filtering of reception data.Staircase waveform generation module obtains the bench height of staircase waveform after the output signal of closed loop control algorithm module is multiplied by feedback factor, and the bench height of this staircase waveform is carried out cumulative obtaining staircase waveform.Described staircase waveform delivers to signal sum unit, sends into D/A converter with other input data of signal sum unit after being added summation together with square wave by DIO together with spacer assembly.Utilize sequential control, by the output data of each functional module of described detecting signal unit by pci bus synchronous transmission to computing machine, and real-time display and storage in signal acquisition module on computers, realizes the real-time display of closed loop states variable.
Signal generating unit I
The function of signal generating unit I is for producing signal to realize the test of the close-loop dynamic performance such as frequency characteristic and step response.The input end of signal generating unit I to be connected with computing machine by pci bus and to communicate, and output terminal is connected with signal sum unit.
Signal generating unit I produces test signal required when optical voltage transformer system carries out frequency characteristic test, as digital step signal required when digital sinusoidal excitation signal I and step response test.Described digital sine pumping signal I is made up of step, its bench height Δ V 1(t) in INVENTIONPeriodic digital sinusoidal variations, as shown in (a) in Fig. 4.By bench height Δ V 1(t) and Δ V 1(t-τ) carries out addition summation just can obtain V 1(t)=Δ V 1(t)+Δ V 1(t-τ) be i.e. described digital sine pumping signal I, V 1t () is as shown in (b) in Fig. 4.Described digital step signal V 1' (t) is made up of step, its bench height Δ V 1' (t) is at t 0be 0, t before moment 0be fixed value after moment, as shown in Figure 5.By bench height Δ V 1' (t) and Δ V 1' (t-τ) carries out addition summation just can obtain V 1' (t)=Δ V 1' (t)+Δ V 1' (t-τ) can produce the digital step signal of described optical voltage transformer equivalent inpnt.Digital step signal V 1' the maximal value of (t) is set to 2 15if carry out the cumulative value that obtains of suing for peace more than 2 to bench height 15then deduct 2 15rear continuation adds up.
The digital test signal that described signal generating unit I produces gives signal sum unit, and after the output signal that signal sum unit and ladder involve square wave module is added, will by being transferred to D/A converter, D/A driving circuit and phase-modulator after DIO and spacer assembly successively.From formula (1), the bench height variable quantity of digital signal is converted to phase modulation difference by phase-modulator.Can obtain according to voltage transformer (VT) Closed loop operation principle, bench height changes the phase differential that the phase differential caused can replace voltage transformer (VT) impressed voltage to produce, therefore pumping signal when described digital step signal can be tested as optical voltage transformer step response, described digital sine pumping signal I can as the sinusoidal excitation signal of optical voltage transformer system response test.The frequency f of sinusoidal excitation signal 1can be expressed as:
f 1 = 1 m · nτ - - - ( 2 )
Wherein τ is the transit time of light in the optical sensing unit of optical voltage transformer, n is the adjustment parameter of bench height duration, its value is positive integer, minimum value is 1, n τ is the duration of each bench height, and m is the step number that the digital sine Curves of composition one-period needs.By adjusting the value of m and n, the frequency of the sinusoidal excitation signal needed for test can be changed.In computing machine, operation interface can set the value of m and n at any time, and the value of m and n is transferred to the DIO of board NI7813R by pci bus and then is transferred to signal generating unit I.F 1value up to tens to hundreds of kHz, can realize the high frequency dynamic performance testing of optical voltage transformer system.
Signal generating unit II
The function of signal generating unit II realizes optical voltage transformer internal module frequency characteristic test, in order to the foundation of functional module high frequency dynamic model each in closed-loop system lays the foundation for producing signal.The input end of signal generating unit II is connected with computing machine by pci bus, and its output terminal is connected with signal sum unit.
Digital oblique wave pumping signal II required when signal generating unit II produces optical voltage transformer internal module frequency characteristic test.If the inner forward path module of tested optical voltage transformer be detector and before put filtering circuit, then digital oblique wave pumping signal II has form as Suo Shi (a) in Fig. 6, i.e. the bench height Δ V of digital oblique wave pumping signal II 2t () each variable quantity is identical value h, by bench height Δ V 2(t) and Δ V 2(t-τ) carries out addition summation just can obtain the i.e. V of described digital oblique wave pumping signal II 2(t)=Δ V 2(t)+Δ V 2(t-τ).Bench height Δ V 2t the maximal value of () is set to 2 16if, more than 2 16then bench height value is deducted 2 16rear continuation change.The maximal value of numeral oblique wave pumping signal II is also set to 2 16if carry out the cumulative value that obtains of suing for peace more than 2 to bench height 16then deduct 2 16the rear continuation bench height that adds up obtains digital oblique wave pumping signal II, as shown in (b) in Fig. 6.
Described digital oblique wave pumping signal II is transferred to D/A converter, D/A driving circuit and phase-modulator successively by signal sum unit (the now output of staircase waveform module and square wave module is 0), DIO and spacer assembly.Numeral oblique wave pumping signal II (i.e. V 2(t)) through the modulation link of phase-modulator by the bench height Δ V of oblique wave 2t () is converted to phase modulation difference and described phase modulation is poor digital cosine signal is changed to after the interference link of phase-modulator be equivalent to photodetector digital cosine pumping signal, as shown in Figure 6 (c).Change bench height variable quantity h and the bench height rate of change f of digital oblique wave pumping signal II jt, just can change to the frequency f of the digital sine pumping signal of photodetector input 2, the frequency f of described digital sine pumping signal 2can be expressed as:
f 2 = h 2 16 · f jt = h 2 1 · 1 nτ 6 - - - ( 3 )
f t=f 2×nτ
Wherein h is bench height variable quantity, and n is the adjustment parameter of bench height duration, and its value is positive integer, and minimum value is the duration that 1, n τ is each step.In computing machine, operation interface can set the value of h and n at any time, and the value of h and n is transferred to the DIO of board NI7813R by pci bus and then is transferred to signal generating unit II.F 2value up to tens kHz, can realize the characteristic test to optical voltage transformer internal module, and then set up the high frequency dynamic model of module.
Signal sum unit
Signal sum unit is transferred to D/A converter by DIO and spacer assembly after being used for that the input waveform of input end is added summation.Signal sum unit input end is connected with staircase waveform generation module, square wave generation module, signal generating unit I and signal generating unit II, and output terminal is connected with DIO.
Operation interface
Operation interface is used for parameter assignment in signal generating unit I and signal generating unit II, the frequency of digital sine pumping signal and the generation of step signal during for changing frequency characteristic test.
Signal acquisition module
Described signal acquisition module is used in real time display and stores digital sine pumping signal I, digital step signal, digital oblique wave pumping signal II, the output of optical voltage transformer and closed loop states variable.The output of described digital sine pumping signal I and digital step signal, digital oblique wave pumping signal II, optical voltage transformer is produced by signal generating unit I, signal generating unit II and mutual inductor output module respectively and is transferred to computing machine respectively by pci bus high-speed synchronous, deposits in Computer Cache.Described closed loop states variable comprises state variable in closed-loop error, closed-loop control and feedback states variable, produced by demodulation module, closed loop control algorithm module and staircase waveform generation module respectively and be transferred to computing machine by pci bus high-speed synchronous, depositing in Computer Cache.Signal acquisition module obtains these data and carries out real-time display and storage from Computer Cache, achieve the high speed acquisition to frequency characteristic test process input signal and output response signal, achieve the real-time display to closed loop states variable in optical voltage transformer system, for optical voltage transformer system dynamic property research and optimize lay the foundation.
Data processing module
The data that signal acquisition module stores by data processing module carry out data processing, obtain the high frequency dynamic model of optical voltage transformer system response curve, step response curve and optical voltage transformer internal module.Described data processing comprises: frequency characteristic test data processing, the process of step response test data and internal system module high frequency dynamic model test processes, described frequency characteristic test process refers to the process of system input signal digital sine pumping signal I and the optical voltage transformer sinusoidal response signal output of optical voltage transformer (namely in frequency characteristic test process) two paths of signals, concrete mode is: after first carrying out the data prediction such as trend term removal and stable state intercepting to the data of two paths of signals, utilize relevant function method or Fourier transform, obtain Amplitude Ration and the phase differential of this two paths of signals, with the Amplitude Ration of trying to achieve under the digital sine pumping signal of different frequency and phase differential for ordinate, take frequency as horizontal ordinate curve plotting figure, namely the frequency characteristic of optical voltage transformer system is obtained, the process of described step response test data, it is then the process of system input signal digital step signal and optical voltage transformer step response (output of the optical voltage transformer namely in step response test process) two paths of signals, the time delay of the transient process outputed signal by optical voltage transformer and relatively digital step signal, namely obtains the step response of optical voltage transformer system, described to system forward channel module detector and the front high frequency dynamic model putting filtering circuit, then for front to put the response output of filtering circuit and the process of digital cosine pumping signal two paths of signals, digital oblique wave pumping signal II is first utilized to obtain digital cosine pumping signal, the method of recycling frequency characteristic test data processing obtains detector and the front frequency characteristic putting filtering circuit, finally by method establishment photodetector and the front high frequency dynamic model putting filtering circuit of Model Distinguish.
In the present embodiment, relate to a kind of method of testing of optical voltage transformer being carried out to frequency characteristic test on described proving installation, its concrete implementation step is as follows:
Step one: the frequency utilizing the digital sine pumping signal I that operation interface Setting signal generating unit I produces in computing machine;
Step 2: detecting signal unit produces staircase waveform and square wave, signal generating unit I produces the digital sine pumping signal I of given frequency, after staircase waveform, square wave and digital sine pumping signal I are added by signal sum unit, be sent to D/A converter simultaneously;
Step 3: be transferred to D/A driving circuit and phase-modulator successively by the signal of D/A converter, arrives photodetector, the front detecting signal unit put on filtering circuit, A/D converter and board NI7813R through the interference link of light path after bench height is converted to phase signal by phase-modulator;
Step 4: utilize the receiver module I in detecting signal unit to receive the output signal of A/D converter, and by this output signal successively by demodulation module, closed loop control algorithm module, mutual inductor output module and the staircase waveform generation module in detecting signal unit, the bench height of staircase waveform generation module generation staircase waveform is the close-loop feedback signal of system; Meanwhile, demodulation module, closed loop control algorithm module and staircase waveform generation module output signal separately, show in real time by the signal acquisition module of pci bus high-speed transfer to computing machine and store, so that observe the closed-loop error of system when different frequency sine inputs;
Step 5: the digital sine pumping signal I in signal generating unit I is synchronously transferred to computing machine by pci bus with the system output signal in corresponding mutual inductor output module by sequential control.Now the output signal of optical voltage transformer is the frequency response output signal of optical voltage transformer system;
Step 6: utilize signal acquisition module that the output signal of the digital sine pumping signal I and corresponding optical voltage transformer that are sent to computing machine is synchronously carried out real-time display and storage;
Step 7: utilize computer operation interface to change the frequency of digital sine pumping signal I in step one, repeats step 2 to step 6;
Step 8: by the test figure under the different frequency sinusoidal excitation signal that stores in step 6, utilize data processing module to process, obtain the frequency characteristic of optical voltage transformer system.Utilize above-mentioned method of testing can measure the high frequency dynamic property of optical voltage transformer, survey frequency can up to tens kHz.Moreover, in test process, can also show and store the closed loop states variable of optical voltage transformer system in real time, realize the Real-Time Monitoring to system closed loop states, for the research work of Optical voltage transformer dynamic property lays the foundation.
In the present embodiment, also relate to a kind of method of optical voltage transformer being carried out to step response test on described proving installation, its concrete implementation step is as follows:
Step one: the staircase waveform generation module in detecting signal unit and square wave generation module produce staircase waveform and square wave respectively, synchronous signal generating unit I produces digital step signal, and signal sum unit is sent to D/A converter after staircase waveform, square wave and digital step signal being added;
Step 2: after D/A converter, signal is transferred to D/A driving circuit and phase-modulator successively, arrives photodetector, the front detecting signal unit put on filtering circuit, A/D converter and board NI7813R after bench height is converted to phase signal by phase-modulator through the interference link of light path;
Step 3: the receiver module I in detecting signal unit receives the output signal of A/D converter, and by this output signal successively by demodulation module, closed loop control algorithm module, mutual inductor output module and the staircase waveform generation module in detecting signal unit; And the output signal of demodulation module, closed loop control algorithm module, mutual inductor output module and staircase waveform generation module, is shown in real time by the signal acquisition module of pci bus high-speed transfer to computing machine and is stored;
Step 4: be transferred to computing machine by synchronous with the system output signal in mutual inductor output module for the digital step signal in signal generating unit I by pci bus by sequential control.Now the output signal of optical voltage transformer is the phase step response signals of system;
Step 5: the output signal of the digital step signal and corresponding optical voltage transformer that are sent to computing machine is carried out real-time display and storage by signal acquisition module;
Step 6: the data that data processing module processing signals acquisition module stores, obtains the step response curve of optical voltage transformer system.
In addition, in the present embodiment, a kind of method setting up the high frequency dynamic model of each functional module of optical voltage transformer internal system is also related to.For detector in optical voltage transformer system and before put filtering circuit, the method setting up its high frequency dynamic model is:
Step one: utilize operation interface control signal generating unit II in computing machine to produce the digital oblique wave pumping signal II of different frequency;
Step 2: the digital oblique wave pumping signal II that signal generating unit II produces, is sent to D/A converter by signal sum unit DIO and spacer assembly; Now the square wave of entering signal sum unit and staircase waveform are 0;
Data after step 3: D/A changes are transferred to the interference link of D/A driving circuit, phase-modulator and light path successively, through phase-modulator with after interfering link, the bench height of oblique wave is converted to cosine signal, be equivalent to photodetector cosine input, through front putting filtering circuit after cosine signal exports from photodetector, obtain the detecting signal unit sent into after cosine response signal is converted to digital signal by cosine response signal A/D converter on board NI7813R;
Step 4: the receiver module II in detecting signal unit receives the output signal of A/D converter.By sequential control, the output signal of receiver module II and digital oblique wave pumping signal II synchronous high-speed are transferred to computing machine;
Step 5: the digital oblique wave pumping signal II being sent to computing machine is converted to the cosine function of digital oblique wave bench height by signal acquisition module, and the output signal of itself and A/D converter carries out simultaneous display and storage;
Step 6: utilize operation interface to change the frequency of digital oblique wave pumping signal, repeats step 2 to step 5; The detector under different cosine pumping signal and front cosine response of putting filtering circuit can be obtained, detector and frontly put the forward path module that filtering circuit is optical voltage transformer closed-loop system;
Step 7: processed by the data separate data processing module stored in step 5, obtains photodetector and the front frequency characteristic putting filtering circuit;
Step 8: data processing module sets up photodetector and the front high frequency dynamic model putting filtering circuit by according to gained frequency characteristic by Model Distinguish.
Below with the method described in the specific embodiment application embodiment of the present invention and device.This is tested optical voltage transformer experimental prototype used and has structure as shown in Figure 1, and in light path, light source adopts SLD light source, and output power is 600 μ W.In testing circuit, A/D converter adopts 12 conversions, and D/A adopts 16 to be parallel converters, and optical fiber transit time τ is 3.6 μ s.Be illustrated in figure 7 the frequency characteristic curve diagram utilizing described proving installation and described method to measure gained optical voltage transformer experimental prototype.As we know from the figure, measuring highest frequency when utilizing described proving installation to carry out frequency characteristic test and can reach tens kHz, is 21.3796KHz by the bandwidth of the known system of frequency characteristic.
Be illustrated in figure 8 the step response curve figure utilizing described proving installation and described method to measure gained optical voltage transformer experimental prototype.The value of horizontal ordinate is multiplied by the expression time after τ.When t=50 τ moment and t=180 μ s, it is the digital step signal of 10000 that signal generating module I creates a fixed value.Can find out that system reaches stable when t=150 τ and t=540 μ s from system step response output signal, illustrative system has good governing speed.
Be illustrated in figure 9 and utilize described proving installation and described method to measure detector and the front frequency characteristic putting filtering circuit in optical voltage transformer experimental prototype.Within the scope of 150Hz-86200Hz, get 22 Frequency points carry out test survey to detector and front frequency characteristic of putting filtering circuit, choosing of Frequency point is realized by regulating parameter h and n.As can be seen from the frequency characteristic of test result gained, detector and before put filtering circuit and be made up of proportional component and high-pass filtering link.By Model Distinguish, obtain detector and the front high frequency dynamic model putting filtering circuit is:
H ( s ) = 5.202 × 10 - 4 s 2.653 × 10 - 4 s + 1
As shown in Figure 10 for utilizing described proving installation to realize the result example shown in real time closed loop states variable.In optical voltage transformer experimental prototype, closed loop control algorithm adopts integrator to realize, and the now output of voltage transformer (VT) is the state variable in closed-loop control.To the additional alternating voltage of optical voltage transformer, test result is shown in real time in the window that voltage transformer (VT) exports in the drawings.The closed-loop error of optical voltage transformer is presented in demodulation result window in real time, and as can be seen from the figure the data point of closed-loop error is positioned near zero always, illustrates that optical voltage transformer system is in closed-loop steady state.In Figure 10, close-loop feedback signal is the superposed signal of staircase waveform and square wave, embodies feedback states variable.In Figure 10, each data point is spaced apart the transit time (in this experimental system be 3.6 microseconds) of light at optical sensing unit.Described device can realize real-time display and the memory function of nanosecond order.

Claims (7)

1. the proving installation for the research of optical voltage transformer dynamic property, it is characterized in that: described device is without the need to any additional equipment, own hardware is utilized to provide the sinusoidal excitation signal of frequency-adjustable, realize the frequency characteristic test of optical voltage transformer system, and provide step input signal to realize the test of closed loop step response performance; And the described proving installation for the research of optical voltage transformer dynamic property has the ability of high-speed data acquisition, Storage and Processing, can the function of monitoring system state variable and test macro internal high frequency dynamic model;
Described proving installation contains board NI7813R, and AD, is provided with spacer assembly connecting communication between D/A converter and the FPGA of board NI7813R, and on board NI7813R, FPGA connects computing machine by pci bus; Base when described board NI7813R comprises one piece of FPGA and 40M; FPGA on described NI7813R comprises 160 digital input/output line DIO, also comprises detecting signal unit, signal generating unit I, signal generating unit II and signal sum unit;
Described detecting signal unit is for receiving the output signal of A/D converter, also for by the output signal of AD data demodulates, closed-loop control, generation mutual inductor output module and produce staircase waveform and square-wave signal, and together with the signal produced with signal generating unit I or signal generating unit II, after signal sum unit place is added, finally by DIO and spacer assembly, enter D/A converter;
The function of signal generating unit I is for producing signal to realize frequency characteristic and step response close-loop dynamic performance is tested; The input end of signal generating unit I to be connected with computing machine by pci bus and to communicate, and output terminal is connected with signal sum unit;
The function of signal generating unit II realizes optical voltage transformer internal module frequency characteristic test, in order to the foundation of functional module high frequency dynamic model each in closed-loop system lays the foundation for producing signal; The input end of signal generating unit II is connected with computing machine by pci bus, and its output terminal is connected with signal sum unit;
The signal that the output data of described detecting signal unit and described signal generating unit I, signal generating unit II produce all time synchronized sends computing machine to;
Described computing machine comprises operation interface, signal acquisition module and data processing module, and described operation interface is for the selection of functional test and to parameter assignment in signal generating unit I and signal generating unit II; Described signal acquisition module is used for the signal of the output data of each functional module in real time display and storage signal detecting unit and described signal generating unit I, signal generating unit II generation; Data processing module is used for processing the data in signal acquisition module, obtains the high frequency dynamic model of optical voltage transformer system response curve, step response curve and optical voltage transformer inner function module.
2. a kind of proving installation for the research of optical voltage transformer dynamic property according to claim 1, it is characterized in that: described spacer assembly is made up of magnetic coupling isolating chip and cable interface, magnetic coupling isolating chip side is connected with cable interface, and opposite side is connected with D/A converter with the A/D converter in optical voltage transformer testing circuit; Cable interface is connected with the digital IO line DIO of FPGA on board NI7813R by cable; In described proving installation, on board NI7813R, FPGA is connected with computing machine by pci bus; Described computing machine comprises operation interface, signal acquisition module and data processing module.
3. a kind of proving installation for the research of optical voltage transformer dynamic property according to claim 1, is characterized in that: described detecting signal unit comprises receiver module I, receiver module II, demodulation module, closed loop control algorithm module, mutual inductor output module, staircase waveform generation module and square wave generation module; Described receiver module I can receive and store A/D data and send into the demodulation module in FPGA; Demodulation module is for realizing the demodulation of closed-loop error signal, and its output terminal is connected with closed loop control algorithm module; Closed loop control algorithm module input is connected with demodulation module, and output terminal is connected with staircase waveform generation module with mutual inductor output module; Described receiver module II can receive and store A/D data; The output data of each functional module of described detecting signal unit are transferred to computing machine by pci bus, and real-time display and storage in signal acquisition module on computers.
4. a kind of proving installation for the research of optical voltage transformer dynamic property according to claim 1, is characterized in that: the data processing that the data that signal acquisition module stores by described data processing module are carried out comprises: frequency characteristic test data processing, the process of step response test data and internal system module high frequency dynamic model test processes; Described frequency characteristic test process, be then the process of system input signal digital sine pumping signal I and optical voltage transformer sinusoidal response signal two paths of signals: after first trend term removal and the pre-service of stable state data intercept being carried out to data, utilize relevant function method or Fourier transform, obtain Amplitude Ration and the phase differential of this two paths of signals, with the Amplitude Ration of trying to achieve under the digital sine pumping signal of different frequency and phase differential for ordinate, take frequency as horizontal ordinate curve plotting figure, namely obtain the frequency characteristic of optical voltage transformer system; The process of described step response test data, it is then the process of system input signal digital step signal and optical voltage transformer step response two paths of signals, the time delay of the transient process outputed signal by optical voltage transformer and relatively digital step signal, namely obtains the step response of optical voltage transformer system; Described internal system module high frequency dynamic model test processes, then for front to put the response output of filtering circuit and the process of digital cosine pumping signal two paths of signals, digital oblique wave pumping signal II is first utilized to obtain digital cosine pumping signal, the method of recycling frequency characteristic test data processing obtains detector and the front frequency characteristic putting filtering circuit, finally by method establishment photodetector and the front high frequency dynamic model putting filtering circuit of Model Distinguish.
5. application is as claimed in claim 1 for a kind of method of testing for the research of optical voltage transformer dynamic property of the proving installation of optical voltage transformer dynamic property research, it is characterized in that: carry out frequency characteristic test to optical voltage transformer, concrete steps are as follows:
Step one: the frequency utilizing the digital sine pumping signal I that operation interface Setting signal generating unit I produces in computing machine;
Step 2: detecting signal unit produces staircase waveform and square wave, signal generating unit I produces the digital sine pumping signal I of given frequency, after staircase waveform, square wave and digital sine pumping signal I are added by signal sum unit, be sent to D/A converter simultaneously;
Step 3: be transferred to D/A driving circuit and phase-modulator successively by the signal of D/A converter, arrives photodetector, the front detecting signal unit put on filtering circuit, A/D converter and board NI7813R through the interference link of light path after bench height is converted to phase signal by phase-modulator;
Step 4: utilize the receiver module I in detecting signal unit to receive the output signal of A/D converter, and by this output signal successively by demodulation module, closed loop control algorithm module, mutual inductor output module and the staircase waveform generation module in detecting signal unit, the bench height of staircase waveform generation module generation staircase waveform is the close-loop feedback signal of system; Meanwhile, demodulation module, closed loop control algorithm module and staircase waveform generation module output signal separately, show in real time by the signal acquisition module of pci bus high-speed transfer to computing machine and store, so that observe the closed-loop error of system when different frequency sine inputs;
Step 5: the digital sine pumping signal I in signal generating unit I is synchronously transferred to computing machine by pci bus with the system output signal in corresponding mutual inductor output module by sequential control, now the output signal of optical voltage transformer is the frequency response output signal of optical voltage transformer system;
Step 6: utilize signal acquisition module that the output signal of the digital sine pumping signal I and corresponding optical voltage transformer that are sent to computing machine is synchronously carried out real-time display and storage;
Step 7: utilize computer operation interface to change the frequency of digital sine pumping signal I in step one, repeats step 2 to step 6;
Step 8: by the test figure under the different frequency sinusoidal excitation signal that stores in step 6, utilize data processing module to process, obtain the frequency characteristic of optical voltage transformer system.
6. application is as claimed in claim 1 for a kind of method of testing for the research of optical voltage transformer dynamic property of the proving installation of optical voltage transformer dynamic property research, it is characterized in that: carry out step response test to optical voltage transformer, concrete steps are as follows:
Step one: the staircase waveform generation module in detecting signal unit and square wave generation module produce staircase waveform and square wave respectively, synchronous signal generating unit I produces digital step signal, and signal sum unit is sent to D/A converter after staircase waveform, square wave and digital step signal being added;
Step 2: after D/A converter, signal is transferred to D/A driving circuit and phase-modulator successively, arrives photodetector, the front detecting signal unit put on filtering circuit, A/D converter and board NI7813R after bench height is converted to phase signal by phase-modulator through the interference link of light path;
Step 3: the receiver module I in detecting signal unit receives the output signal of A/D converter, and by this output signal successively by demodulation module, closed loop control algorithm module, mutual inductor output module and the staircase waveform generation module in detecting signal unit; And the output signal of demodulation module, closed loop control algorithm module, mutual inductor output module and staircase waveform generation module, is shown in real time by the signal acquisition module of pci bus high-speed transfer to computing machine and is stored;
Step 4: be transferred to computing machine by synchronous with the system output signal in mutual inductor output module for the digital step signal in signal generating unit I by pci bus by sequential control; Now the output signal of optical voltage transformer is the phase step response signals of system;
Step 5: the output signal of the digital step signal and corresponding optical voltage transformer that are sent to computing machine is carried out real-time display and storage by signal acquisition module;
Step 6: the data that data processing module processing signals acquisition module stores, obtains the step response curve of optical voltage transformer system.
7. application is as claimed in claim 1 for a kind of high frequency Dynamic Model method for the research of optical voltage transformer dynamic property of the proving installation of optical voltage transformer dynamic property research, it is characterized in that comprising the steps:
Step one: utilize operation interface control signal generating unit II in computing machine to produce the digital oblique wave pumping signal II of different frequency;
Step 2: the digital oblique wave pumping signal II that signal generating unit II produces, is sent to D/A converter by signal sum unit, DIO and spacer assembly; Now the square wave of entering signal sum unit and staircase waveform are 0;
Data after step 3: D/A changes are transferred to the interference link of D/A driving circuit, phase-modulator and light path successively, through phase-modulator with after interfering link, the bench height of oblique wave is converted to cosine signal, be equivalent to photodetector cosine input, through front putting filtering circuit after cosine signal exports from photodetector, obtain the detecting signal unit sent into after cosine response signal is converted to digital signal by cosine response signal A/D converter on board NI7813R;
Step 4: the receiver module II in detecting signal unit receives the output signal of A/D converter; By sequential control, the output signal of receiver module II and digital oblique wave pumping signal II synchronous high-speed are transferred to computing machine;
Step 5: the digital oblique wave pumping signal II being sent to computing machine is converted to the cosine function of digital oblique wave bench height by signal acquisition module, and the output signal of itself and A/D converter carries out simultaneous display and storage;
Step 6: utilize operation interface to change the frequency of digital oblique wave pumping signal, repeats step 2 to step 5; Namely the detector under different cosine pumping signal and front cosine response of putting filtering circuit is obtained, detector and frontly put the forward path module that filtering circuit is optical voltage transformer closed-loop system;
Step 7: processed by the data separate data processing module stored in step 5, obtains photodetector and the front frequency characteristic putting filtering circuit;
Step 8: data processing module sets up photodetector and the front high frequency dynamic model putting filtering circuit by according to gained frequency characteristic by Model Distinguish.
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