CN102721707A - 用于测量ltcc收缩率和介电常数的装置 - Google Patents
用于测量ltcc收缩率和介电常数的装置 Download PDFInfo
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- CN102721707A CN102721707A CN2011100787278A CN201110078727A CN102721707A CN 102721707 A CN102721707 A CN 102721707A CN 2011100787278 A CN2011100787278 A CN 2011100787278A CN 201110078727 A CN201110078727 A CN 201110078727A CN 102721707 A CN102721707 A CN 102721707A
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- ltcc substrate
- inductive capacity
- specific inductive
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- 239000000758 substrate Substances 0.000 claims abstract description 37
- 230000005540 biological transmission Effects 0.000 claims abstract description 16
- 230000001939 inductive effect Effects 0.000 claims description 25
- 239000000463 material Substances 0.000 abstract description 11
- 238000000034 method Methods 0.000 abstract description 11
- 238000004088 simulation Methods 0.000 abstract description 9
- 238000005259 measurement Methods 0.000 abstract description 6
- 238000005245 sintering Methods 0.000 description 14
- 238000004364 calculation method Methods 0.000 description 6
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000012938 design process Methods 0.000 description 1
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CN201110078727.8A CN102721707B (zh) | 2011-03-30 | 2011-03-30 | 用于测量ltcc收缩率和介电常数的装置 |
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CN102721707A true CN102721707A (zh) | 2012-10-10 |
CN102721707B CN102721707B (zh) | 2014-08-06 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103308778A (zh) * | 2013-07-03 | 2013-09-18 | 四川大学 | 介电常数测量装置 |
CN104833857A (zh) * | 2015-02-11 | 2015-08-12 | 嘉兴佳利电子有限公司 | 一种ltcc材料介电常数的测试方法及其适用于该方法的夹具和谐振环器件 |
CN105116234A (zh) * | 2015-09-07 | 2015-12-02 | 工业和信息化部电子工业标准化研究院 | 微波介质材料的复介电常数的多频段测量装置及系统 |
CN109950229A (zh) * | 2017-12-20 | 2019-06-28 | 矽品精密工业股份有限公司 | 量测结构 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002057514A (ja) * | 2000-08-09 | 2002-02-22 | Nippon Valqua Ind Ltd | Nrdガイド回路 |
JP2006038703A (ja) * | 2004-07-28 | 2006-02-09 | Kyocera Corp | 誘電定数測定法及び伝送線路設計法 |
CN101515661A (zh) * | 2009-03-26 | 2009-08-26 | 上海大学 | 嵌套环形结构平行馈线的微带双模滤波器 |
CN102004121A (zh) * | 2010-09-27 | 2011-04-06 | 东南大学 | 同时测量陶瓷收缩率和介电常数的装置及方法 |
CN201955313U (zh) * | 2011-03-30 | 2011-08-31 | 南京邮电大学 | 用于测量ltcc收缩率和介电常数的装置 |
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2011
- 2011-03-30 CN CN201110078727.8A patent/CN102721707B/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002057514A (ja) * | 2000-08-09 | 2002-02-22 | Nippon Valqua Ind Ltd | Nrdガイド回路 |
JP2006038703A (ja) * | 2004-07-28 | 2006-02-09 | Kyocera Corp | 誘電定数測定法及び伝送線路設計法 |
CN101515661A (zh) * | 2009-03-26 | 2009-08-26 | 上海大学 | 嵌套环形结构平行馈线的微带双模滤波器 |
CN102004121A (zh) * | 2010-09-27 | 2011-04-06 | 东南大学 | 同时测量陶瓷收缩率和介电常数的装置及方法 |
CN201955313U (zh) * | 2011-03-30 | 2011-08-31 | 南京邮电大学 | 用于测量ltcc收缩率和介电常数的装置 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103308778A (zh) * | 2013-07-03 | 2013-09-18 | 四川大学 | 介电常数测量装置 |
CN103308778B (zh) * | 2013-07-03 | 2015-08-19 | 四川大学 | 介电常数测量装置 |
CN104833857A (zh) * | 2015-02-11 | 2015-08-12 | 嘉兴佳利电子有限公司 | 一种ltcc材料介电常数的测试方法及其适用于该方法的夹具和谐振环器件 |
CN105116234A (zh) * | 2015-09-07 | 2015-12-02 | 工业和信息化部电子工业标准化研究院 | 微波介质材料的复介电常数的多频段测量装置及系统 |
CN105116234B (zh) * | 2015-09-07 | 2018-04-10 | 工业和信息化部电子工业标准化研究院 | 微波介质材料的复介电常数的多频段测量装置及系统 |
CN109950229A (zh) * | 2017-12-20 | 2019-06-28 | 矽品精密工业股份有限公司 | 量测结构 |
CN109950229B (zh) * | 2017-12-20 | 2020-11-03 | 矽品精密工业股份有限公司 | 量测结构 |
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CN102721707B (zh) | 2014-08-06 |
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Application publication date: 20121010 Assignee: Jiangsu Nanyou IOT Technology Park Ltd. Assignor: NANJING University OF POSTS AND TELECOMMUNICATIONS Contract record no.: 2016320000212 Denomination of invention: Device for measuring LTCC shrinkage and dielectric constant Granted publication date: 20140806 License type: Common License Record date: 20161118 |
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Assignee: Jiangsu Nanyou IOT Technology Park Ltd. Assignor: NANJING University OF POSTS AND TELECOMMUNICATIONS Contract record no.: 2016320000212 Date of cancellation: 20180116 |
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Effective date of registration: 20181009 Address after: 221600 Jiangsu Peixian Economic Development Zone Hanxing Road East Patentee after: JIANGSU HUACHANG ALUMINUM FACTORY Co.,Ltd. Address before: 210003 new model road 66, Gulou District, Nanjing, Jiangsu Patentee before: NANJING University OF POSTS AND TELECOMMUNICATIONS |
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Granted publication date: 20140806 |