CN102680485A - Defect marking device and method used for marking defect in electrode material - Google Patents
Defect marking device and method used for marking defect in electrode material Download PDFInfo
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- CN102680485A CN102680485A CN2012100305509A CN201210030550A CN102680485A CN 102680485 A CN102680485 A CN 102680485A CN 2012100305509 A CN2012100305509 A CN 2012100305509A CN 201210030550 A CN201210030550 A CN 201210030550A CN 102680485 A CN102680485 A CN 102680485A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/04—Construction or manufacture in general
- H01M10/0404—Machines for assembling batteries
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65C—LABELLING OR TAGGING MACHINES, APPARATUS, OR PROCESSES
- B65C9/00—Details of labelling machines or apparatus
- B65C9/26—Devices for applying labels
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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Abstract
A device and a method used for marking a defect on an electrode material of a secondary battery. The device comprises: a conveying unit used for providing the electrode material at a controlled conveying speed; a defect detection unit used for detecting the defects on the electrode material which is conveyed continuously; a defect marking unit used for attaching a marking tag on a defect area containing the defects; and an integrated control unit used for jointly controlling a supply unit and the defect marking unit, thus all kinds of defects existing on the electrode material can be detected, and marking tag attaching operations used for providing visual tags can be performed automatically.
Description
Technical field
One or more embodiment of the present invention relates to the apparatus and method that detect defective at the electrode material that is used for secondary cell.
Background technology
Secondary cell is good in many aspects, makes secondary cell be applied to cover the various technical fields of all industrial circles.Secondary cell is widely used as the energy source of mobile electronic devices such as comprising digital camera, mobile phone, notebook computer; And the energy source as hybrid electrically power automobile (hybrid electronic automobiles) is also very outstanding, and hybrid electrically power automobile proposes as the air-polluting scheme of gasoline that solve to use fossil fuel and diesel engine.
Summary of the invention
One or more embodiment of the present invention is included in the apparatus and method that the electrode material that is used for secondary cell detects defective; The various types of defectives that are present in thus on the electrode material are to be detected, and are used to provide the markup tags attaching operation of visible labels to automatically perform.
Extra aspect will partly be set forth in the following description, and partly obvious from this statement, perhaps can the convention through putting into practice given embodiment.
According to one or more embodiments of the present invention, comprise at the device of the electrode material marked defective that is used for secondary cell: feed unit provides this electrode material with in check feed speed; Defect detection unit detects the defective in this electrode material that provides continuously; The flaw labeling unit attaches markup tags comprising on the defect area of this defective; With integrated control module, jointly control this feed unit and this flaw labeling unit.
This integrated control module can be controlled the flaw labeling operation of feed speed and this flaw labeling unit of this feed unit, makes this feed speed and this flaw labeling operation be coupled to each other.
This integrated control module can be controlled the flaw labeling operation of feed speed and this defect detection unit and this flaw labeling unit of this feed unit, makes this feed speed and this flaw labeling operation be coupled to each other.
When this defect area when the direction of the supply arrives the sticking position of this markup tags, this integrated control module can convert this feed speed of this electrode material at a slow speed into.
This integrated control module can progressively convert the feed speed of this electrode material at a slow speed between the very first time and second time; Receive the information relevant at this integrated control module of this very first time from this defect detection unit, arrive the sticking position of this markup tags at this defect area of this second time with the detection of this defect area.
This integrated control module can progressively be regulated this feed speed of this electrode material according to the stage of flaw labeling operation.
This integrated control module can be controlled this feed speed of this electrode material; In the phase one that does not detect this defective; This integrated control module keeps first speed fast; Detecting the subordinate phase of this defective; This integrated control module with this feed speed from the first fast rate conversion to medium second speed, arrive phase III of the sticking position of this markup tags at this defect area, this integrated control module converts this feed speed into slow third speed from this medium second speed; And in the stage of the attaching of accomplishing this markup tags, this integrated control module returns to the first fast speed with this feed speed from this slow third speed.
This flaw labeling unit can comprise: image obtains the unit, obtains at least one surperficial image of this electrode material; And graphics processing unit, receive the image that obtains by this image acquisition unit and extract this defect area.
This flaw labeling unit can comprise labelling machine, and this labelling machine has markup tags and on this defect area, carries out markup tags attaching operation.
This flaw labeling unit further comprises guidance unit, and this guidance unit supports and allows this labelling machine on the Width of this electrode material, to move.
A plurality of these flaw labeling unit can laterally arrange along the Width of this electrode material.
Each of this a plurality of flaw labelings unit can be arranged on the fixed position along this Width of this electrode material.
After the incision operation on this electrode material, can set the sticking position of this markup tags that attaches by this flaw labeling unit.
After this incision operation; The whole width of this electrode material can be divided into first bundle and second bundle with narrow width; This first the bundle can advance to high relatively position and this second the bundle advance to low relatively position, and this flaw labeling unit can comprise be positioned at upside and receive this first the bundle the first flaw labeling unit and be positioned at downside and receive this second the bundle the second flaw labeling unit.
According to one or more embodiments of the present invention; A kind of method in the electrode material mark defective that is used for secondary cell is disclosed; This method detects the defective on the electrode material that provides continuously; This method attaches markup tags comprising on the defect area of this defective, and this method comprises the operation that detects this defective on this electrode material; When detecting this defective, the feed speed of this electrode material is reduced to medium second speed from the first fast speed; When this defect area when the direction of the supply arrives the sticking position of this markup tags, the feed speed of this electrode material is reduced to slow third speed from this medium second speed, and on this defect area, attaches this markup tags; And when accomplishing the attaching of this markup tags, this feed speed of this electrode material is returned to this first fast speed from this slow third speed.
When detecting this defective, the labelling machine that is used for the attaching of this markup tags can move to the position of this defect area along the Width of this electrode material.
Description of drawings
To the following description of embodiment, these and/or other aspect will become obviously and be more readily understood in conjunction with the drawings, in the accompanying drawings:
Fig. 1 illustrates the flaw labeling device in electrode material mark defective that is used for according to the embodiment of the present invention;
Fig. 2 is the figure that the flaw labeling unit of Fig. 1 is shown;
Fig. 3 illustrates curve map, and it shows the variation of transfer rate according to the state of the art of flaw labeling device;
Fig. 4 is that mark is used for the process flow diagram of method of defective of the electrode material of secondary cell according to the embodiment of the present invention, and this process flow diagram shows the operation of being carried out by integrated control module;
Fig. 5 illustrates the flaw labeling device of another embodiment according to the present invention; And
Fig. 6 illustrates the flaw labeling unit of Fig. 5.
Embodiment
Now will be in detail with reference to the embodiment of the flaw labeling device of the defective of the electrode material that is used for the mark secondary cell, its example is shown in the drawings.
The secondary cell that can charge and discharge can form in such a way: electrode assemblie is contained in the external shell such as metal can, in the flexible exterior of perhaps packing into the member.Here, electrode assemblie can form in such a way: through between positive electrode plate and negative electrode plate, plug stacked body that dividing plate forms with the roll of volume around; Perhaps form in such a way: positive electrode plate and negative electrode plate sequence stack and dividing plate is plugged in therebetween.
Positive electrode plate and negative electrode plate can form through jetting slurry type material on the electrode material of the supplied of continuous stream.For example, when electrode material provided the injection machine that passes then on the supply route through donor rollers, active material can be ejected on it.Here, in the active material that sprays on electrode material, can add bubble or pin hole, and active material can be separated or contaminated.
Fig. 1 illustrates the flaw labeling device in electrode material 10 mark defectives that is used for according to the embodiment of the present invention.For example; In the flaw labeling device; A pair of not coiling body (not shown) and again coiling body 180 can be arranged in two ends, electrode material 10 is not being reeled on the coiling body, again coiling body 180 never the coiling body (not shown) launch and the electrode material 10 that stands processed is reeled with scroll again; And not the coiling body (not shown) and again the device between the coiling body 180 can arrange along the direction of the supply Z1 of electrode material 10; Thereby receive the electrode material 10 provide continuously,, and markup tags is attached on the detected defect area with the defective in the detecting electrode material 10.
For example, the defective that exists on the automatic detecting electrode material 10 of flaw labeling device, and markup tags is attached on the detected defect area, the workman of identification marking label can remove, reprocesses or repair this detected defect area after making.
The flaw labeling device is used for detecting automatically being present in the defective on the electrode material 10, and is used for the defect area that marker detection arrives, and comprises: a plurality of donor rollers 110 that are used for providing with in check feed speed electrode material 10; Be used to detect the defect detection unit 120 that is present in the defective on the electrode material 10 that provides; Flaw labeling unit 130, be used for predetermined visual label for example markup tags be attached to the defect area that detects by defect detection unit 120; With integrated control module 150, the operation that is used to control the feed speed of donor rollers 110 and controls flaw labeling unit 130.
For example; Integrated control module 150 can jointly be controlled the controller 118 and the controller 138 that is used to control flaw labeling unit 130 that is used to control donor rollers 110, makes that integrated control module 150 can controller 118 and 138 be controlled feed speed and markup tags attaches operation through adding.
When electrode material 10 twines donor rollers 110 that in the vertical directions replace each other a part of; Electrode material 10 can be advanced with zigzag; And when electrode material 10 was maintained between the donor rollers 110, electrode material 10 can be advanced at the feed speed with suitable Tension Control.Though in Fig. 1, do not illustrate, tension force provides the unit (not shown) can arrange discretely to the electrode material that provides continuously 10 suitable tension force to be provided.Tension force provides the unit can prevent to have flexible electrodes material 10 and in process is provided, is crumpled owing to weak rigidity.
The feed speed of donor rollers 110 can keep consistently; But will describe like the back; After defect detection unit 120 detects defect areas defect area towards flaw labeling unit 130 near the time, for markup tags is attached on the defect area, feed speed can change according to the stage.
For example, donor rollers 110 can be connected to suitable driving element 115 (for example supplying with motor) drivingly, and the driving of driving element 115 can be according to the control of integrated control module 150 and by controller 118 controls.
In flaw labeling device according to this embodiment; Supplying with the operation of operation and flaw labeling can be coupled to each other through operation of control supply jointly and flaw labeling operation; And according to each stage of flaw labeling operation, feed speed can be regulated adaptively or progressively regulated.
Here; The flaw labeling operation comprises that (through defect detection unit 120) is used for the operation of the defective of existence on the detecting electrode material 10 and the operation that (through flaw labeling unit 130) is used on detected defect area, attaching markup tags, and this defective for example is bubble or the pollution that produces in the active material 15 that is injected on the electrode material 10.Therefore, when needs, supply with operation and flaw labeling operation for close-coupled, integrated control module 150 can jointly be controlled donor rollers 110, defect detection unit 120 and flaw labeling unit 130.
For example, visually can discern the workman in order to allow detected defect area, markup tags can be attached on the surface of detected defect area.Afterwards, the workman of identification marking label can remove, reprocesses or repair detected defect area.
Image obtains unit 121 can comprise at least one optical system.This optical system can comprise be arranged on the electrode material 10 or under and the light source 123 of exposure light, and detect this light and be the image acquisition unit 125 of electric signal the image transitions of electrode material 10.For example; Light source 123 can be provided with in same side with image acquisition unit 125 together; This same side for example is the upside or the downside of electrode material 10, and light source 123 can obtain the image information relevant with the surface of electrode material 10 through receiving from the light of the surface reflection of electrode material 10.For example, in order to obtain the image information relevant with basal surface with the top surface of electrode material 10, image obtain unit 121 can comprise be arranged on the electrode material 10 with under first image obtain unit 121a and second image obtains unit 121b.
For example, graphics processing unit 128 is carried out pre-service on the image information that is received, then with this image transitions for easily to detect the image of defect area from it.Pre-service can comprise the filtration that is used to remove the high frequency noise composition, be used to offset because the illumination compensation of the discrimination difference that the variation of lighting environment causes etc.
Fig. 2 is the figure that the flaw labeling unit 130 of Fig. 1 is shown.With reference to figure 2; Flaw labeling unit 130 can comprise labelling machine 135 and guidance unit 131; Labelling machine 135 has markup tags and markup tags is attached on the electrode material 10, and guidance unit 131 supports labelling machine 135 and allows labelling machine 135 on the Width Z2 of electrode material 10, to move.For example, guidance unit 131 can form and support labelling machine 135 moving at Width Z2.The operation of labelling machine 135 can be controlled by the controller 138 of special use, and controller 138 can be according to the operation of controlling labelling machine 135 from the instruction of integrated control module 150.
In flaw labeling device according to the embodiment of Fig. 1; The sticking position of the markup tags adjacent with flaw labeling unit 130 can be set after the otch on the electrode material 10 (slitting) operation, and the attaching of markup tags can be in the execution of the downstream of the cutting machine 170 of carrying out incision operation.Incision operation refers to wherein on perpendicular to the Width Z2 of direction of the supply Z1 the wide width of electrode material 10 is divided into the cutting operation of little width, and electrode material 10 can be divided into suitable width as required.The Dan Shu of the electrode material 10 that for example, gets into from the upper reaches of cutting machine 170 can be divided into three beams 10a, 10b and 10c when passing two cutting machines 170.
For example; Divided bundle 10a, 10b and 10c can advance to the position of departing from each other in the downstream of cutting machine 170; Be that the first material 10a of broad ways Z2 in the central part office can advance to high relatively position, broad ways Z2 can advance to low relatively position at the second material 10b and the 3rd material 10c of sidepiece office.For the first material 10a and second and third material 10b and the 10c that separate in upper and lower side space; The first flaw labeling unit 130a and the second flaw labeling unit 130b can be arranged apart; And the first flaw labeling unit 130a at upside can carry out label at the second flaw labeling unit 130b of downside and attach advancing to execution label attaching on the first material 10a of relative high position on second material 10b that advances to relative lower position and the 3rd material 10c.
Because the sticking position of markup tags is set the incision operation of cutting apart electrode material 10 after, thus when the execution cutting operation when removing defect area, can reduce the electrode material 10 that is dropped and prevent the wasting of resources.
In the flaw labeling device according to the embodiment of Fig. 1, the feed speed of electrode material 10 progressively changed according to the stage, thereby on detected defect area, carried out the attaching of markup tags reposefully.The feed speed of electrode material 10 can be regulated according to the intervention of controller 118 and from the instruction of integrated control module 150.
Fig. 3 illustrates curve map, and it shows the variation of feed speed according to the state of the art of flaw labeling device.With reference to figure 3, on electrode material 10, do not detect among the phase one P1 of defective therein, electrode material 10 provides with the first speed V1.The first speed V1 can be set to the fast relatively speed in whole inspection technology, and can be held up to detecting defective.At phase one P1, promptly carry out technology through the inspection technology that remains on constant speed.
Detect the subordinate phase P2 of defect area therein through defect detection unit 120; Obtain about detecting the information of defect area at integrated control module 150, change the feed speed of electrode material 10 into slow second speed V2 from the first speed V1 fast then than the first speed V1.For example, LS retardation that is used to reduce the feed speed of electrode material 10 is operated, and makes that the feed speed of electrode material 10 progressively changes to the state at a slow speed of attaching markup tags from fast state when defect area during near the sticking position of markup tags.
The point that defect area is detected corresponding to be used to reduce feed speed retardation LS beginning, after extra rate conversion, second speed V2 can be adjusted to the third speed V3 slower than second speed V2.Retardation, LS finished at the some place of the attaching end of markup tags.
At subordinate phase P2, integrated control module 150 can obtain the position of defect area, can drive flaw labeling unit 130 through using controller 118, and can the mobile initiation command that be used for mobile labelling machine 135 be sent to the position of defect area.For example; The position of the defect area on Width Z2 can be imported into controller 138 through integrated control module 150; When the position of defect area is set to the target location; Labelling machine 135 can be moved to the target location, and labelling machine 135 can keep the motionless sticking position that is provided to markup tags up to defect area along direction of the supply Z1.
Defect area is provided to the phase III P3 of the sticking position of markup tags along direction of the supply Z1 therein, and the feed speed of electrode material 10 is converted into the third speed V3 that is slower than second speed V2.For example, when defect area arrived the sticking position of markup tags, phase III P3 can begin (initiate), and when markup tags was attached on the defect area, phase III P3 can finish.Here, the labelling machine 135 that remains on the position of defect area is attached to markup tags on the defect area.
Alternately, when defect area along direction of the supply Z1 during near the sticking position of markup tags, phase III P3 can begin before defect area arrive sticking position, and can after markup tags is attached on the defect area, finish.
The stage P4 that the attaching of markup tags therein finishes, the transfer rate of electrode material 10 returns to the first speed V1 fast from third speed V3.In another embodiment, can set and make rate conversion progressively to carry out the acceleration that third speed V3 accelerates to the first speed V1.
After the electrode material that provides via continuous stream 10 was cut into the unit of preliminary dimension and forms independent battery lead plate, the battery lead plate (positive electrode plate and negative electrode plate) that has an opposed polarity through sequence stack simultaneously plugged dividing plate betwixt and forms electrode assemblie.Electrode assemblie can form secondary cell through being placed in the pot container or through being sealed in to have in the flexible external member.
Fig. 4 is that mark is used for the process flow diagram of method of defective of the electrode material 10 of secondary cell according to the embodiment of the present invention, and this process flow diagram shows the operation through integrated control module 150 execution.
Defective (operation S10) on the electrode material 10 that integrated control module 150 inspections provide continuously.For example, integrated control module 150 control defect detection units 120 make the image of the electrode material 10 that integrated control module 150 obtains to provide continuously, analyze the image that is obtained and extract the defect area that is present on the electrode material 10 then.
Afterwards; When having defect area (operation S20) on definite electrode material 10; Integrated control module 150 is carried out first and is slowed down, and in first slowed down, the feed speed of electrode material 10 converted the second speed V2 (operation S30) that is slower than the first speed V1 into from the first speed V1 fast.Integrated control module 150 is operated retardation, and in this retardation, feed speed slows down at the sticking position that defect area arrives markup tags before, makes the attaching of markup tags to carry out reposefully.
For example, integrated control module 150 can obtain the positional information relevant with defect area, and can drive the labelling machine 135 that attaches markup tags.Promptly; Integrated control module 150 can pass through to use the position coordinates of defect area and on the Width Z2 of electrode material 10, drive labelling machine 135 through the set positions with defect area as the target area, makes integrated control module 150 can make labelling machine 135 keep the motionless sticking position that arrives markup tags up to defect area.
Afterwards; When confirming that defect area arrives the sticking position of markup tags (operation S40); Integrated control module 150 is carried out second and is slowed down, and in second slowed down, the feed speed of electrode material 10 converted the third speed V3 (operation S50) that is slower than second speed V2 into from second speed V2.Through progressively reduce the transfer rate of electrode material 10 with first deceleration (operation S30) and second deceleration (operation S50), integrated control module 150 can allow the attaching of markup tags by execution reposefully.
Afterwards, integrated control module 150 drives flaw labeling unit 130, makes markup tags be attached to (operation S60) on the defect area.
When the attaching of the markup tags relevant with defect area was accomplished, integrated control module 150 returned to the first speed V1 (operation S70) fast with the feed speed of electrode material 10 from slow third speed V3.Here, integrated control module 150 can be operated acceleration, and in this acceleration, the feed speed of electrode material 10 progressively accelerates to the first fast speed V1 from slow third speed V3.
Fig. 5 illustrates the flaw labeling device of another embodiment according to the present invention.This flaw labeling device comprises the top surface and the basal surface of contact electrode material 10 and the donor rollers 210 of electrode material 10 is provided; Detection is present in the defect detection unit 220 of the defective on the electrode material 10 that provides; Provide predetermined mark to arrive the flaw labeling unit 230 of detected defect area; The integrated control module 250 that supply operation that jointly control is relevant with electrode material 10 and flaw labeling are operated.
Whole operations of integrated control module 250 control devices; Comprise with electrode material 10 relevant supplies and operating; And jointly control the defect detection unit 220 and flaw labeling unit 230 that relates to the flaw labeling operation, make integrated control module 250 allow the join operation between transfer operations and the flaw labeling operation.
In the flaw labeling device according to the embodiment of Fig. 5, a plurality of labelling machines 235 laterally arrange.Fig. 6 illustrates the flaw labeling unit 230 of Fig. 5.Labelling machine 235 can laterally arrange along the Width Z2 of electrode material 10, makes labelling machine 235 can handle the defective that the random site on Width Z2 detects.The position of the labelling machine 235 that for example, laterally arranges can fixedly make their moving on Width Z2 to fix.
Alternately, each labelling machine 235 can form and make each labelling machine 235 have at the limited of Width Z2 to move, and has the appointed area of its different with adjacent labelling machine 235 oneself.Under this situation, flaw labeling unit 230 can comprise having markup tags and carry out the labelling machine 235 and the guidance unit (not shown) that moves that guides labelling machine 235 that markup tags attaches operation.
Because labelling machine 235 laterally arranges along the Width Z2 of electrode material 10; So do not need transfer operation that labelling machine 235 is sent to defect area; And can prevent because the time delay that transfer operation causes makes and can carry out inspection technology fast and reduce the whole process time.
In flaw labeling device according to the embodiment of Fig. 5; Can be after incision operation on electrode material 10, carry out the attaching of markup tags, and the Dan Shu of the electrode material 10 that gets into from the upper reaches of cutting machine 270 can be split into three beams 10a, 10b and 10c when passing two cutting machines 270.
For example; Divided bundle 10a, 10b and 10c can advance to the position of departing from each other in the downstream of cutting machine 270; Promptly; The first material 10a of the central part office on Width Z2 can advance to high relatively position, and the second material 10b and the 3rd material 10c of the sidepiece office on Width Z2 can advance to low relatively position.For the first material 10a and second and third material 10b and the 10c that separate in upper and lower side space; Can the first flaw labeling unit 230a arranged apart and the second flaw labeling unit 230b; The first flaw labeling unit 230a at upside can carry out label at the second flaw labeling unit 230b of downside and attach advancing to execution label attaching on the first material 10a of relative high position on second material 10b that advances to relative lower position and the 3rd material 10c.
In the flaw labeling devices and methods therefor according to one or more embodiments of the present invention, the sequence of operations that is used to detect the various types of defectives on the electrode material that is present in secondary cell and is used on defect area attaching markup tags is automatically performed.Particularly, according to one or more embodiments of the present invention, markup tags attaching operation and electrode material feed speed are coupled to each other and make that the attaching of markup tags can correctly be carried out.
Should be appreciated that exemplary embodiment described herein should only be interpreted as descriptive implication rather than the purpose in order to limit.Characteristic in each embodiment or aspect description should typically be interpreted as other similar characteristics or the aspect that can be used in other embodiments.
The present invention requires the rights and interests at the korean patent application No.10-2011-0022888 of Korea S Department of Intellectual Property submission on March 15th, 2011, and its disclosed full content is combined in here as a reference.
Claims (16)
1. a flaw labeling device is used for the electrode material mark defective of secondary cell, and said flaw labeling device comprises:
Feed unit provides said electrode material with in check feed speed;
Defect detection unit detects the defective in the said electrode material that provides continuously;
The flaw labeling unit attaches markup tags comprising on the defect area of said defective; With
Integrated control module is jointly controlled said feed unit and said flaw labeling unit.
2. flaw labeling device according to claim 1, wherein said integrated control module are controlled the flaw labeling operation of the feed speed and the said flaw labeling unit of said feed unit, make the operation of said feed speed and said flaw labeling be coupled to each other.
3. flaw labeling device according to claim 1; Wherein said integrated control module is controlled the flaw labeling operation of feed speed and the said defect detection unit and the said flaw labeling unit of said feed unit, makes the operation of said feed speed and said flaw labeling be coupled to each other.
4. flaw labeling device according to claim 1, wherein when said defect area when the direction of the supply arrives the sticking position of said markup tags, said integrated control module converts the said feed speed of said electrode material at a slow speed into.
5. flaw labeling device according to claim 1; Wherein said integrated control module progressively converted the feed speed of said electrode material at a slow speed between the very first time and second time; Receive the information relevant at said integrated control module of the said very first time from said defect detection unit, arrive the sticking position of said markup tags at said said defect area of second time with the detection of said defect area.
6. flaw labeling device according to claim 1, wherein said integrated control module are progressively regulated the said feed speed of said electrode material according to the stage of flaw labeling operation.
7. flaw labeling device according to claim 6, wherein said integrated control module is controlled the said feed speed of said electrode material,
In the phase one that does not detect said defective, said integrated control module keeps the first fast speed,
Detecting the subordinate phase of said defective, said integrated control module with said feed speed from the first fast rate conversion to medium second speed,
Arrive phase III of the sticking position of said markup tags at said defect area, said integrated control module converts said feed speed into slow third speed from said medium second speed, and
In the stage of the attaching of accomplishing said markup tags, said integrated control module returns to the said first fast speed with said feed speed from said slow third speed.
8. flaw labeling device according to claim 1, wherein said flaw labeling unit comprises:
Image obtains the unit, obtains at least one surperficial image of said electrode material; With
Graphics processing unit receives the image that is obtained by said image acquisition unit and extracts said defect area.
9. flaw labeling device according to claim 1, wherein said flaw labeling unit comprises labelling machine, said labelling machine has markup tags and on said defect area, carries out markup tags attaching operation.
10. flaw labeling device according to claim 9, wherein said flaw labeling unit also comprises guidance unit, said guidance unit supports and allows said labelling machine on the Width of said electrode material, to move.
11. flaw labeling device according to claim 1, wherein a plurality of said flaw labelings unit laterally arranges along the Width of said electrode material.
12. flaw labeling device according to claim 11, each of wherein said a plurality of flaw labelings unit is arranged on the fixed position along the said Width of said electrode material.
13. flaw labeling device according to claim 1 wherein after the incision operation on said electrode material, is set the sticking position of the said markup tags that is attached by said flaw labeling unit.
14. flaw labeling device according to claim 13, wherein after said incision operation, the whole width of said electrode material is divided into first bundle and second bundle with narrow width,
Wherein said first bundle advances to high relatively position and said second bundle advances to low relatively position, and
Said flaw labeling unit comprise be positioned at upside and receive said first the bundle the first flaw labeling unit and be positioned at downside and receive said second the bundle the second flaw labeling unit.
15. a method is being used for the electrode material mark defective of secondary cell, said method detects the defective on the said electrode material that provides continuously, and said method attaches markup tags comprising on the defect area of said defective, and said method comprises:
Detect the said defective on the said electrode material;
When detecting said defective, the feed speed of said electrode material is reduced to medium second speed from the first fast speed;
When said defect area when the direction of the supply arrives the sticking position of said markup tags, the feed speed of said electrode material is reduced to slow third speed from said medium second speed, and on said defect area, attaches said markup tags; And
When accomplishing the attaching of said markup tags, the said feed speed of said electrode material is returned to the said first fast speed from said slow third speed.
16. method according to claim 15, wherein when detecting said defective, the labelling machine that is used for the attaching of said markup tags moves to the position of said defect area along the Width of said electrode material.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020110022888A KR101275815B1 (en) | 2011-03-15 | 2011-03-15 | Apparatus for detecting defects in the electrode material for secondary battery and method for the same |
| KR10-2011-0022888 | 2011-03-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102680485A true CN102680485A (en) | 2012-09-19 |
| CN102680485B CN102680485B (en) | 2016-06-01 |
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| CN201210030550.9A Active CN102680485B (en) | 2011-03-15 | 2012-02-10 | The flaw labeling device and method of marking of defects in electrode material |
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| Publication number | Publication date |
|---|---|
| KR101275815B1 (en) | 2013-06-18 |
| CN102680485B (en) | 2016-06-01 |
| KR20120105211A (en) | 2012-09-25 |
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