CN102662149A - Method for testing power performance indexes - Google Patents
Method for testing power performance indexes Download PDFInfo
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- CN102662149A CN102662149A CN2012101078201A CN201210107820A CN102662149A CN 102662149 A CN102662149 A CN 102662149A CN 2012101078201 A CN2012101078201 A CN 2012101078201A CN 201210107820 A CN201210107820 A CN 201210107820A CN 102662149 A CN102662149 A CN 102662149A
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Abstract
The invention discloses a method for testing power performance indexes, particularly relates to intelligent instrument control technology and belongs to the technical field of intelligent control systems. The method includes that electronic engineers compile a GPIB (general purpose interface bus) instruction group card of performance indexes required by fault testing for a circuit board; program development personnel build a database for storing each GPIB instruction group required by testing for the corresponding performance index; the instruction groups are inputted into the database via a user interface; and programmers write an intelligent GPIB instruction interpreter. Software development personnel do not need to know specific electronic and electrical professional knowledge of the tested performance indexes, and accordingly requirements on comprehensive abilities of various personnel in a system are greatly lowered. In addition, severe shortcomings that GPIB instructions are directly bound with programming languages traditionally, programs need to be modified even if the used GPIB instructions or parameters are changed subtly, and software development personnel and electronic and electrical engineers need to work together are overcome.
Description
Technical field
The present invention relates to a kind of power source performance indication test method, relate in particular to a kind of intelligence instrument control technology, belong to the intelligence control system technical field.
Background technology
Along with computer application constantly develops, computer technology the system failure automatically in the test to well using, for the power type of radar system power supply various; Maintenance after breaking down; General maintenance personal is difficult to solve, and utilizes computing machine to carry out that the power fail test is main sets up the fault expert knowledge library according to the principle of power supply etc. earlier, after power supply breaks down; Utilize computer software it to be carried out subtest, judge fault location according to the flow process of fault expert knowledge library.
The foundation of a fault expert knowledge library (comprising fault tree) is not only and is required theoretic analysis and will carry out a large amount of practical tests; Select the best way, instruction and parameter for use, and set up a power supply or test out a fault and need test a large amount of test points and different performance levels repeatedly.When the test board of traditional calculating machine software development control GPIB (General Purpose Interfaces Bus) bus; Because the GPIB instruction is various; Parameter is indefinite; Old design method is that the flow sequence that GPIB instruction, parameter and GPIB instruction are carried out is all write in the concrete program code; The important disadvantages that the program that the function of GPIB instruction is realized realizing with flow process is combined closely is: as long as the used GPIB instruction of test and parameter have the small variation will update routine, software developer and electronics, Electrical Engineer must work the while together, depend on the strong developer of integration capability; Even introduced Object-oriented Technique, also be simplified package to the GPIB basic function.
Summary of the invention
The purpose of this invention is to provide a kind of general circuit board testing performance index method, this method parameter is revised flexibly, does not need the update routine code, and the method versatility is good.Can let research and development of software personnel and electronics, Electrical Engineer accomplish fully to share out the work and help one another, work according to his ability.
For realizing above-mentioned purpose, the present invention adopts following technical scheme:
A kind of general circuit board testing performance index method, this method may further comprise the steps:
Work out the GPIB instruction group card of the required performance index of board failure test by the Electronics Engineer;
The program development personnel have set up a database, deposit the used GPIB instruction group of each testing performance index;
Through user interface the instruction group is entered into database;
The programmer writes an intelligent GPIB instruction interpretation device;
When concrete testing power supply performance index; For after interpreter specifies GPIB instruction group ID, interpreter is sense order from database automatically just, and explains one by one and carry out in the program; If the GPIB of standard instruction; Then instruction execution unit mails to intelligence instrument through gpib bus, the intelligence instrument execution command, and return test result; If self-defining instruction (like time delay command, computations etc.) is just carried out by interpreter call instruction performance element respective function (like the time delay command function, maximizing function, minimum value function, average function and the expression formula etc. that counts); Last instruction of this GPIB instruction group is the instruction of return results, promptly obtains relevant characters that test point is surveyed.
In the test process, when changing the order of certain instruction in the GPIB instruction group, parameter or instruction as required, the tester gets final product through the user interface modifications database.(need not the program development personnel participates in)
Required performance index are like voltage, electric current, resistance, ripple factor or oscillogram etc.
The circuit test personnel only need to operate according to the guide of the guide of software, just can obtain the required relevant characters of test point easily, and offer fault diagnosis module, use for judging.
The present invention compares prior art and has following advantage:
Power source performance indication test method of the present invention has been set up one and has been overlapped the method flow of the performance index of test point on the testing circuit board.Set up a data stock and put the used GPIB instruction group of each testing performance index; The Electronics Engineer works out instruction group card; Be entered into database by the keyboarder through user interface of software; The programmer writes an intelligent GPIB instruction interpretation device, in when test program, be the given GPIB instruction of interpreter group ID after, interpreter is sense order from database automatically just, and explains execution.And execution result returned to caller.
The research and development of software personnel do not understand the concrete electronics of test performance index, electric professional knowledge, and this greatly reduces the requirement to all kinds of personnel's integration capabilities in the system.Overcome traditional: as long as used GPIB instruction of test and parameter have the small variation will update routine directly the critical defect that bundles of GPIB instruction and parameter and programming language; Software developer and electronics, Electrical Engineer must work simultaneously together, depend on the strong developer of integration capability.
Superiority of the present invention also is embodied in: the testing performance index instruction and the parameter modification of test point are very flexible, directly through friendly software input interface, do not need the update routine code.
The present invention has added self-defined computing function, and code reusability is good, and the method versatility is good.Can let research and development of software personnel and electronics, Electrical Engineer accomplish fully to share out the work and help one another, work according to his ability.
Program code is irrelevant with the test point and the performance index of concrete certain circuit among the present invention, and the GPIB instruction does not bundle with program, does not need update routine when modify instruction and parameter.The program versatility is good.
The order of the required GPIB instruction of testing performance index is embodied in lane database, can make amendment through software interface, rather than by programming language fixing realization in program, can not revise.
Description of drawings
Fig. 1 is a GPIB test system hardware structural drawing;
Fig. 2 is fault diagnostic workflow figure;
Fig. 3 is a power source performance index test process flow diagram.
Fig. 4 is a GPIB instruction group database table.
Embodiment
To combine accompanying drawing and specific embodiment that a kind of power source performance indication test method of the present invention is done to describe in detail further below.
In the method involved in the present invention, the workflow that is designed according to invention is following:
1. Fig. 1 is the hardware structure diagram of whole fault diagnosis system, i.e. the residing system environments of testing performance index, and computing machine inserts a gpib interface card; Interconnect through gpib bus and testing tool; Instrument is through adapter and measurand (UUT), and promptly power supply links to each other.
2. the Electronics Engineer works out the required GPIB instruction group card of testing performance index of power supply test point; The program development personnel have set up a database, deposit the used GPIB instruction group of each testing performance index; Be entered into database through user interface; Fig. 4 is a GPIB instruction group database table.
3. when concrete testing power supply performance index, utilize the program development personnel to write an intelligent GPIB instruction interpretation device, its interpretation process is: in the program for behind the interpreter appointment GPIB instruction group ID; Like ID is 4, and interpreter is sense order from database automatically just, and explains one by one and carry out; If the GPIB of standard instruction; Then instruction execution unit mails to intelligence instrument through gpib bus, if self-defining instruction, like time delay command; Maximizing function, minimum value function, average function and the expression formula etc. that counts are just carried out by interpreter call instruction performance element.Last instruction that generally should the instruction group is the instruction of return results.At last execution result is returned to caller.Like Fig. 3 power source performance index test process flow diagram.
4. according to the strategy in the fault experts database, be out of order, point out next step performance index that will test or provide the maintenance suggestion by diagnosis after obtaining performance index for failure analysis module.Like Fig. 2 power source performance index judgment task process flow diagram;
5. if when setting up experts database or testing performance index, need be to concrete certain instruction in the GPIB instruction group, the order of parameter or instruction is made an amendment, and the tester only needs make amendment through user interface.Need not the program development personnel participates in.
Show the example of the used GPIB instruction of test performance index group among Fig. 4 of the present invention, comprised the field title in the table, and recorded content, field title implication is described below:
Instruction group ID is the sign of a used instruction group of performance index of test;
The sequencing that instructs in the instruction sequences one instruction group;
Instruction type indicates it is the type of instruction, and the and function name is corresponding, when instructing for interpreter interprets, makes and judges to use which kind of performance element to execute instruction;
The name identifiers of instrument ID intelligence instrument;
Instruction comprises standard GPIB instruction and custom instruction of the present invention;
The argument section of parameter instruction;
The purposes of exegetic interpretation instruction;
Wherein the MAX in the custom instruction is a maximizing, and MIN is for minimizing, and AVER is for averaging, and L20 is that result who instructs the execution back to be returned of 20 for order in this instruction group.
Claims (3)
1. general circuit board testing performance index method, this method may further comprise the steps:
Work out the GPIB instruction group card of the required performance index of board failure test by the Electronics Engineer;
The program development personnel have set up a database, deposit the used GPIB instruction group of each testing performance index;
Through user interface the instruction group is entered into database;
The programmer writes an intelligent GPIB instruction interpretation device;
When concrete testing power supply performance index; For after interpreter specifies GPIB instruction group ID, interpreter is sense order from database automatically just, and explains one by one and carry out in the program; If the GPIB of standard instruction; Then instruction execution unit mails to intelligence instrument through gpib bus, the intelligence instrument execution command, and return test result; If self-defining instruction is just carried out by interpreter call instruction performance element respective function; Last instruction of this GPIB instruction group is the instruction of return results, promptly obtains relevant characters that test point is surveyed.
2. ask 1 described general circuit board testing performance index method according to right, in the test process, when changing the order of certain instruction in the GPIB instruction group, parameter or instruction as required, the tester gets final product through the user interface modifications database.
3. ask 1 described general circuit board testing performance index method according to right, required performance index are like voltage, electric current, resistance, ripple factor or oscillogram.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210107820.1A CN102662149B (en) | 2012-04-13 | 2012-04-13 | Method for testing power performance indexes |
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| CN201210107820.1A CN102662149B (en) | 2012-04-13 | 2012-04-13 | Method for testing power performance indexes |
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| CN102662149A true CN102662149A (en) | 2012-09-12 |
| CN102662149B CN102662149B (en) | 2014-05-28 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103116656A (en) * | 2013-03-08 | 2013-05-22 | 南京信息工程大学 | Circuit fault diagnostic system based on fault logic interpreter and achieving method thereof |
| CN105912472A (en) * | 2016-04-12 | 2016-08-31 | 中国船舶重工集团公司第七〇二研究所 | Software design method capable of variable customization in battery testing system |
| CN106646273A (en) * | 2017-02-22 | 2017-05-10 | 郑州云海信息技术有限公司 | Switching power supply performance test method, system and device |
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| CN1314301A (en) * | 2000-03-20 | 2001-09-26 | 因温特奥股份公司 | Method for controlling lift |
| CN201637838U (en) * | 2010-01-28 | 2010-11-17 | 南京国睿安泰信科技股份有限公司 | Radar power-supply testing system based on GPIB interface control |
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2012
- 2012-04-13 CN CN201210107820.1A patent/CN102662149B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1314301A (en) * | 2000-03-20 | 2001-09-26 | 因温特奥股份公司 | Method for controlling lift |
| CN201637838U (en) * | 2010-01-28 | 2010-11-17 | 南京国睿安泰信科技股份有限公司 | Radar power-supply testing system based on GPIB interface control |
Non-Patent Citations (3)
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| 彭其圣等: "基于GPIB总线技术的I/O接口控制系统设计", 《计量与测试技术 》 * |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103116656A (en) * | 2013-03-08 | 2013-05-22 | 南京信息工程大学 | Circuit fault diagnostic system based on fault logic interpreter and achieving method thereof |
| CN103116656B (en) * | 2013-03-08 | 2016-01-13 | 南京信息工程大学 | Based on circuit fault diagnosis system and its implementation of fault logic interpreter |
| CN105912472A (en) * | 2016-04-12 | 2016-08-31 | 中国船舶重工集团公司第七〇二研究所 | Software design method capable of variable customization in battery testing system |
| CN106646273A (en) * | 2017-02-22 | 2017-05-10 | 郑州云海信息技术有限公司 | Switching power supply performance test method, system and device |
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| CN102662149B (en) | 2014-05-28 |
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