CN102654398B - 摄影测量系统 - Google Patents

摄影测量系统 Download PDF

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Publication number
CN102654398B
CN102654398B CN201210052918.1A CN201210052918A CN102654398B CN 102654398 B CN102654398 B CN 102654398B CN 201210052918 A CN201210052918 A CN 201210052918A CN 102654398 B CN102654398 B CN 102654398B
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CN
China
Prior art keywords
point
mirror
image
cloud
points
Prior art date
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Active
Application number
CN201210052918.1A
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English (en)
Chinese (zh)
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CN102654398A (zh
Inventor
C·M·阿什福德
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Boeing Co
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Boeing Co
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Publication date
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Publication of CN102654398A publication Critical patent/CN102654398A/zh
Application granted granted Critical
Publication of CN102654398B publication Critical patent/CN102654398B/zh
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/02—Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g. controlling overlapping of pictures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201210052918.1A 2011-03-04 2012-03-02 摄影测量系统 Active CN102654398B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/040,833 US8358333B2 (en) 2011-03-04 2011-03-04 Photogrammetry measurement system
US13/040,833 2011-03-04

Publications (2)

Publication Number Publication Date
CN102654398A CN102654398A (zh) 2012-09-05
CN102654398B true CN102654398B (zh) 2017-05-03

Family

ID=45656212

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201210052918.1A Active CN102654398B (zh) 2011-03-04 2012-03-02 摄影测量系统

Country Status (6)

Country Link
US (1) US8358333B2 (https=)
EP (1) EP2495527B1 (https=)
JP (1) JP6126786B2 (https=)
CN (1) CN102654398B (https=)
AU (1) AU2012200263B2 (https=)
CA (1) CA2763190C (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9200899B2 (en) * 2012-03-22 2015-12-01 Virtek Vision International, Inc. Laser projection system and method
US9789462B2 (en) 2013-06-25 2017-10-17 The Boeing Company Apparatuses and methods for accurate structure marking and marking-assisted structure locating
CN103542981B (zh) * 2013-09-28 2015-07-29 大连理工大学 一种双目视觉测量转动惯量的方法
JP2016035403A (ja) * 2014-08-01 2016-03-17 シャープ株式会社 レーザ測距装置
US10239178B2 (en) * 2016-10-17 2019-03-26 Virtek Vision International, ULC Laser projector with dynamically adaptable focus
CN107492146A (zh) * 2017-07-25 2017-12-19 深圳市魔眼科技有限公司 三维模型构建方法、装置、移动终端、存储介质及设备
US11361466B2 (en) * 2018-11-30 2022-06-14 Casio Computer Co., Ltd. Position information acquisition device, position information acquisition method, recording medium, and position information acquisition system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1400842A1 (en) * 1996-06-05 2004-03-24 Pieter O. Zanen Method for three-dimensional measurement and imaging having focus-related convergence compensation
CN1670479A (zh) * 2004-03-15 2005-09-21 清华大学 基于视频图像测量飞行器飞行高度的方法
CN101216304A (zh) * 2007-01-04 2008-07-09 财团法人工业技术研究院 物体尺寸估测之系统及方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0912966A1 (en) * 1996-07-11 1999-05-06 Mirai S.r.l. Method for the creation of tridimensional numerical models
JP2003065737A (ja) * 2001-08-28 2003-03-05 Topcon Corp 表面形状測定装置及びその方法、並びに表面状態図化装置
EP1422495A4 (en) * 2001-07-30 2009-06-03 Topcon Corp SURFACE MEASUREMENT DEVICE, SURFACE FORMAT METHOD, SURFACE STATE GRAPHIC DEVICE
JP2003329424A (ja) * 2002-05-14 2003-11-19 Mitsubishi Electric Corp 三次元形状計測装置
US7643025B2 (en) * 2003-09-30 2010-01-05 Eric Belk Lange Method and apparatus for applying stereoscopic imagery to three-dimensionally defined substrates
US8723928B2 (en) * 2008-07-11 2014-05-13 Panasonic Corporation Three-dimensional shape measuring apparatus, integrated circuit, and three-dimensional shape measuring method
US20110199335A1 (en) * 2010-02-12 2011-08-18 Bo Li Determining a Position of an Object Using a Single Camera

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1400842A1 (en) * 1996-06-05 2004-03-24 Pieter O. Zanen Method for three-dimensional measurement and imaging having focus-related convergence compensation
CN1670479A (zh) * 2004-03-15 2005-09-21 清华大学 基于视频图像测量飞行器飞行高度的方法
CN101216304A (zh) * 2007-01-04 2008-07-09 财团法人工业技术研究院 物体尺寸估测之系统及方法

Also Published As

Publication number Publication date
US20120224030A1 (en) 2012-09-06
JP6126786B2 (ja) 2017-05-10
EP2495527B1 (en) 2023-01-04
AU2012200263A1 (en) 2012-09-20
CN102654398A (zh) 2012-09-05
CA2763190A1 (en) 2012-09-04
EP2495527A2 (en) 2012-09-05
AU2012200263B2 (en) 2014-10-09
EP2495527A3 (en) 2016-07-27
CA2763190C (en) 2014-06-10
US8358333B2 (en) 2013-01-22
JP2012185158A (ja) 2012-09-27

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