CN102621467A - Quick tester of LED performance - Google Patents
Quick tester of LED performance Download PDFInfo
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- CN102621467A CN102621467A CN2012100813987A CN201210081398A CN102621467A CN 102621467 A CN102621467 A CN 102621467A CN 2012100813987 A CN2012100813987 A CN 2012100813987A CN 201210081398 A CN201210081398 A CN 201210081398A CN 102621467 A CN102621467 A CN 102621467A
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Abstract
The invention belongs to the technical field of LEDs, and particularly relates to a quick tester of LED performance, which includes a 6 VDC power supply, a low frequency self-oscillating circuit, a phase inverter circuit, an LED testing terminal and a DC power supply indicating circuit, and the model of the integrated circuit used by the computing amplifier IC1 is LM324. Ordinary testing device sometimes requires twice rather simple testing, which is not complicated, however is a huge time waste for the projects as manufacturing LED advertisement or traffic lights in need of a large a mount of LEDs. The quick tester of the LED performance is a special testing circuit, and can quickly judge the performance and the brightness of the LED by testing without the need of distinguishing the polarity of the LED at first. The quick tester of the LED performance can obtain two testing results by testing for once, and is simple, straightforward, time-saving and efficient as compared with the testing means as the ordinary multimeter.
Description
Technical field
The invention belongs to light emitting diode detection technique field, is about a kind of light emitting diode performance high speed tester.
Background technology
The method that is used to test the light emitting diode performance is a lot, but can fast detecting and have the proving installation of performance comparison not see that finished product appears on the market.For the big production field of light emitting diode use amount; If light emitting diode is without detecting in earnest and screening; After in case performance has problem or luminous more weak light emitting diode to be welded on the circuit board; Again doing over again, it is very inconvenient to change, and is easy to damage the pad of circuit board, and influences very much production efficiency.The general test device need measure twice sometimes, though twice measuring process is not very complicated, and for the bigger engineering of light emitting diode use amount, as, just lose time very much at batch testings such as making LED advertisement or stop-lights.Light emitting diode performance high speed tester of the present invention is a special test circuit, and the polarity that this tester need not be distinguished light emitting diode can detect, and judges its performance and luminosity situation thereof fast.Light emitting diode be as long as just can obtain two test results through one-shot measurement, than have simply with means of testing such as common multimeters, intuitively, save time, the high advantage of efficient.
Below specify light emitting diode performance high speed tester of the present invention related relevant technologies content in manufacturing process.
Summary of the invention
Goal of the invention and beneficial effect: the general test device need be measured twice sometimes; Though twice measuring process is not very complicated; But for the bigger engineering of light emitting diode use amount, as, just lose time very much at batch testings such as making LED advertisement or stop-lights.Light emitting diode performance high speed tester of the present invention is a special test circuit, and the polarity that this tester need not be distinguished light emitting diode can detect, and judges its performance and luminosity situation fast.Light emitting diode be as long as just can obtain two test results through one-shot measurement, than have simply with means of testing such as common multimeters, intuitively, save time, the efficient advantages of higher.
Technical scheme: light emitting diode performance high speed tester, it comprises 6V direct supply, LF self-oscillation circuit, inverter circuit, LED test terminal, direct supply indicating circuit, it is characterized in that:
LF self-oscillation circuit: comprise operational amplifier IC1, resistance R 1, resistance R 2, resistance R 3 and resistance R 4; The integrated circuit model that operational amplifier IC1 uses is LM324; The 1st pin sending and receiving optical diode calibrating terminal A of operational amplifier IC1 and an end of resistance R 3; The other end of the 2nd pin connecting resistance R3 of operational amplifier IC1 and an end of resistance R 4; The 7th pin of another termination operational amplifier IC1 of resistance R 4; The end of the 3rd pin connecting resistance R1 of operational amplifier IC1 and an end of resistance R 2, another termination 6V dc power anode VCC of the 4th pin of operational amplifier IC1 and resistance R 1, the other end connection circuit ground GND of the 11st pin of operational amplifier IC1 and resistance R 2;
Inverter circuit: form by operational amplifier IC1, resistance R 6, resistance R 7, resistance R 8, resistance R 9 and electrochemical capacitor C1; The end of the 6th pin connecting resistance R8 of operational amplifier IC1, an end of resistance R 9; The end of the 7th pin connecting resistance R6 of operational amplifier IC1, the other end sending and receiving optical diode calibrating terminal B of resistance R 6, another termination 6V dc power anode VCC of resistance R 8; The other end connection circuit ground GND of resistance R 9; The 5th pin of operational amplifier IC1 connects the positive pole of electrochemical capacitor C1 and an end of resistance R 7, the other end of the 7th pin connecting resistance R7 of operational amplifier IC1, the negative pole connection circuit ground GND of electrochemical capacitor C1.
Direct supply indicating circuit: a termination 6V dc power anode VCC of resistance R 5, the positive pole of the other end sending and receiving optical diode LED of resistance R 5, the negative pole connection circuit ground GND of LED.
The circuit working principle: light emitting diode performance high speed tester is connected into the LF self-oscillation device by one road operational amplifier, exports high level or low level off and at output terminal; Another road operational amplifier is connected into the phase inverter form.When pierce circuit output high level, phase inverter is output low level then; During LF self-oscillation device circuit output low level, phase inverter output high level.If refute at A and B two output terminals and to connect 1 light emitting diode, no matter the polarity of refuting the sending and receiving optical diode how, conducting is luminous off and on always light emitting diode, makes light emitting diode along with the oscillation frequency of pierce circuit.LED in the DC power supply circuit is the indication of direct supply state, and can be used as the contrast of lumination of light emitting diode brightness to be detected.The model that operational amplifier IC1 selects for use is LM324 or LM358.
Description of drawings
Accompanying drawing 1 is the embodiment circuit working schematic diagram that the present invention provides a light emitting diode performance high speed tester.
Embodiment
Implement according to the circuit working schematic diagram of the high speed tester of light emitting diode performance shown in the accompanying drawing 1 and the components and parts technical requirement of description of drawings and the following stated, can realize the present invention.
The selection of components and parts and technical parameter thereof
IC1 is an operational amplifier; The integrated circuit model of recommending to use is LM324 or LM358; The circuit that it is made up of four groups of separate operational amplifiers, it can be worked in the single-power voltage scope of broad, also can under the dual power supply condition, work; The supply voltage working range: single supply 3V～30V, dual power supply ± 1.5V～± 15V; Present embodiment has only been used two of IC1-A, IC1-D among four groups of operational amplifier LM324;
LM324 type integrated circuit be encapsulated as dual inline type, its 14 pins and function are respectively:
1 pin OUTPUT1,2 pin INPUT1-, 3 pin INPUT1+; 4 pin meet the anodal VCC of power supply; 5 pin INPUT 2+, 6 pin INPUT 2-, 7 pin OUTPUT 2; 8 pin OUTPUT, 3,9 pin INPUT 3-, 10 pin INPUT3+; 11 pin connection circuit ground GND, that is: the negative poles of direct supply; 12 pin INPUT4+, 13 pin INPUT4-, 14 pin OUTPUT4;
OUTPUT is the output terminal of operational amplifier; INPUT+ is the positive input of operational amplifier; INPUT-is the reverse input end of operational amplifier;
Circuit all uses 1/8 metalfilmresistor, and the resistance of resistance R 1, resistance R 2, resistance R 3, resistance R 8 and resistance R 9 is 50K Ω;
The resistance of resistance R 4 is 10K Ω; The resistance of resistance R 5 is 1K Ω; The resistance of resistance R 6 is 910 Ω; The resistance of resistance R 7 is 100K Ω;
C1 is an electrochemical capacitor, and its capacity is 1 μ F, 16V;
AN is a keyswitch open in usual;
The 6V direct supply can use 4 joint 5# alkaline batteries.
Circuit production main points, circuit debugging and use
The circuit of light emitting diode performance high speed tester is so long as the intact electronic devices and components of usability; Annexation according to components and parts shown in the accompanying drawing 1 is welded; And to the physics wiring conscientiously check and check errorless after, circuit can operate as normal without any need for debugging;
Electrochemical capacitor C1 is used to adjust the glittering frequency of tested light emitting diode, and the glittering frequency of the big more tested light emitting diode of the capacity of electrochemical capacitor C1 is low more, and the recommendation of electrochemical capacitor C1 capacity is 1 μ F;
The glittering brightness of tested light emitting diode can be by the resistance of adjustment resistance R 6, if the glittering luminance shortage of tested light emitting diode, can suitably reduce the resistance examination of resistance R 6;
The calibrating terminal A of light emitting diode performance high speed tester and calibrating terminal B are that tested light emitting diode is refuted connecting terminal, and tested light emitting diode can be distinguished both positive and negative polarity during use.
Claims (2)
1. light emitting diode performance high speed tester, it comprises 6V direct supply, LF self-oscillation circuit, inverter circuit, LED test terminal, direct supply indicating circuit, it is characterized in that:
The LF self-oscillation circuit comprises operational amplifier IC1, resistance R 1, resistance R 2, resistance R 3 and resistance R 4; The integrated circuit model that operational amplifier IC1 uses is LM324; The 1st pin sending and receiving optical diode calibrating terminal A of operational amplifier IC1 and an end of resistance R 3; The other end of the 2nd pin connecting resistance R3 of operational amplifier IC1 and an end of resistance R 4; The 7th pin of another termination operational amplifier IC1 of resistance R 4; The end of the 3rd pin connecting resistance R1 of operational amplifier IC1 and an end of resistance R 2, another termination 6V dc power anode VCC of the 4th pin of operational amplifier IC1 and resistance R 1, the other end connection circuit ground GND of the 11st pin of operational amplifier IC1 and resistance R 2;
Inverter circuit is made up of operational amplifier IC1, resistance R 6, resistance R 7, resistance R 8, resistance R 9 and electrochemical capacitor C1; The end of the 6th pin connecting resistance R8 of operational amplifier IC1, an end of resistance R 9; The end of the 7th pin connecting resistance R6 of operational amplifier IC1, the other end sending and receiving optical diode calibrating terminal B of resistance R 6, another termination 6V dc power anode VCC of resistance R 8; The other end connection circuit ground GND of resistance R 9; The 5th pin of operational amplifier IC1 connects the positive pole of electrochemical capacitor C1 and an end of resistance R 7, the other end of the 7th pin connecting resistance R7 of operational amplifier IC1, the negative pole connection circuit ground GND of electrochemical capacitor C1.
2. light emitting diode performance high speed tester according to claim 1; It is characterized in that: a termination 6V dc power anode VCC of resistance R 5 in the direct supply indicating circuit; The positive pole of the other end sending and receiving optical diode LED of resistance R 5, the negative pole connection circuit ground GND of LED.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100813987A CN102621467A (en) | 2012-03-26 | 2012-03-26 | Quick tester of LED performance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100813987A CN102621467A (en) | 2012-03-26 | 2012-03-26 | Quick tester of LED performance |
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| CN102621467A true CN102621467A (en) | 2012-08-01 |
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| CN2012100813987A Pending CN102621467A (en) | 2012-03-26 | 2012-03-26 | Quick tester of LED performance |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105026941A (en) * | 2013-03-08 | 2015-11-04 | 欧司朗光电半导体有限公司 | Method and device for measuring and optimising an optoelectronic component |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101109783A (en) * | 2006-07-18 | 2008-01-23 | 杨少辰 | Electrical parameter testing circuit for light emitting diode |
| CN202471906U (en) * | 2012-03-26 | 2012-10-03 | 朱虹 | Rapid tester for performance of light emitting diode |
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2012
- 2012-03-26 CN CN2012100813987A patent/CN102621467A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101109783A (en) * | 2006-07-18 | 2008-01-23 | 杨少辰 | Electrical parameter testing circuit for light emitting diode |
| CN202471906U (en) * | 2012-03-26 | 2012-10-03 | 朱虹 | Rapid tester for performance of light emitting diode |
Non-Patent Citations (1)
| Title |
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| 佚名: "发光二极管检测器电路图 http://www.elecfans.com/article/89/169/2009/2009073081923.html", 《电子发烧友》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105026941A (en) * | 2013-03-08 | 2015-11-04 | 欧司朗光电半导体有限公司 | Method and device for measuring and optimising an optoelectronic component |
| US10132855B2 (en) | 2013-03-08 | 2018-11-20 | Osram Opto Semiconductors Gmbh | Method and device for measuring and optimizing an optoelectronic component |
| CN105026941B (en) * | 2013-03-08 | 2019-01-18 | 欧司朗光电半导体有限公司 | Method and apparatus for measuring and optimizing photoelectron subassembly |
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Application publication date: 20120801 |