CN202471906U - Rapid tester for performance of light emitting diode - Google Patents
Rapid tester for performance of light emitting diode Download PDFInfo
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- CN202471906U CN202471906U CN201220116036.2U CN201220116036U CN202471906U CN 202471906 U CN202471906 U CN 202471906U CN 201220116036 U CN201220116036 U CN 201220116036U CN 202471906 U CN202471906 U CN 202471906U
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Abstract
本实用新型属于发光二极管技术领域,是关于一种发光二极管性能快速测试仪。该测试仪包括6V直流电源、低频自激振荡电路、反相器电路、发光二极管测试端子、直流电源指示电路,运算放大器IC1使用的集成电路型号为LM324;一般测试装置有时需要测量两次,虽然两次测量过程不算复杂,但对于发光二极管使用量较大的工程,如,在制作LED广告或交通指示灯等批量测试就非常浪费时间。本实用新型所述的发光二极管性能快速测试仪是一个特殊的测试电路,该测试仪不用区分发光二极管的极性即可进行检测,快速判定其性能及发光亮度情况。发光二极管只要经过一次测量就可得到两个测试结果,比用普通万用表等测试手段有着简单、直观、省时、效率高等优点。
The utility model belongs to the technical field of light-emitting diodes, and relates to a fast performance tester for light-emitting diodes. The tester includes a 6V DC power supply, a low-frequency self-excited oscillation circuit, an inverter circuit, a light-emitting diode test terminal, and a DC power supply indicator circuit. The integrated circuit model used by the operational amplifier IC1 is LM324; The two measurement processes are not complicated, but for projects that use a large amount of light-emitting diodes, such as batch testing in the production of LED advertisements or traffic lights, it is very time-consuming. The light-emitting diode performance fast tester described in the utility model is a special test circuit, and the tester can detect without distinguishing the polarity of the light-emitting diode, and quickly judge its performance and luminous brightness. As long as the light-emitting diode is measured once, two test results can be obtained, which has the advantages of simplicity, intuition, time-saving, and high efficiency compared with ordinary multimeters and other testing methods.
Description
技术领域 technical field
本实用新型属于发光二极管检测技术领域,是关于一种发光二极管性能快速测试仪。 The utility model belongs to the technical field of light-emitting diode detection, and relates to a light-emitting diode performance fast tester. the
背景技术 Background technique
用于测试发光二极管性能的方法很多,但能够快速检测、且有性能对比的测试装置未见成品面市。对于发光二极管使用量大的生产领域,如果发光二极管不经过认真地检测与筛选,一旦性能有问题或发光较弱的发光二极管焊接到电路板上以后,重新返工拆换很不方便,而且很容易损坏电路板的焊盘,且非常影响生产效率。一般测试装置有时需要测量两次,虽然两次测量过程不算复杂,但对于发光二极管使用量较大的工程,如,在制作LED广告或交通指示灯等批量测试就非常浪费时间。本实用新型所述的发光二极管性能快速测试仪是一个特殊的测试电路,该测试仪不用区分发光二极管的极性即可进行检测,快速判定其性能及其发光亮度情况。发光二极管只要经过一次测量就可得到两个测试结果,比用普通万用表等测试手段有着简单、直观、省时、效率高优点。 There are many methods for testing the performance of light-emitting diodes, but there are no finished products on the market that can detect quickly and have performance comparison. For the production field where a large amount of light-emitting diodes are used, if the light-emitting diodes are not carefully tested and screened, once the light-emitting diodes with performance problems or weak light are soldered to the circuit board, it is very inconvenient to rework and replace them. Damage the pads of the circuit board and greatly affect the production efficiency. The general test device sometimes needs to measure twice. Although the two measurement processes are not complicated, it is very time-consuming for projects that use a large amount of light-emitting diodes, such as batch testing in the production of LED advertisements or traffic lights. The light-emitting diode performance fast tester described in the utility model is a special test circuit, and the tester can detect without distinguishing the polarity of the light-emitting diode, and quickly judge its performance and its luminous brightness. As long as the light-emitting diode is measured once, two test results can be obtained, which has the advantages of simplicity, intuition, time-saving and high efficiency compared with ordinary multimeter and other test methods. the
以下详细说明本实用新型所述的发光二极管性能快速测试仪在制作过程中所涉及的有关技术内容。 The relevant technical content involved in the production process of the fast light-emitting diode performance tester described in the present invention will be described in detail below. the
实用新型内容 Utility model content
发明目的及有益效果:一般测试装置有时需要测量两次,虽然两次测量过程不算复杂,但对于发光二极管使用量较大的工程,如,在制作LED广告或交通指示灯等批量测试就非常浪费时间。本实用新型所述的发光二极管性能快速测试仪是一个特殊的测试电路,该测试仪不用区分发光二极管的极性即可进行检测,快速判定其性能及发光亮度情况。发光二极管只要经过一次测量就可得到两个测试结果,比用普通万用表等测试手段有着简单、直观、省时、效率高等优点。 Purpose of the invention and beneficial effects: the general test device sometimes needs to measure twice, although the two measurement processes are not complicated, but for projects with a large amount of light-emitting diodes, such as batch tests such as making LED advertisements or traffic lights, it is very waste time. The light-emitting diode performance fast tester described in the utility model is a special test circuit, and the tester can detect without distinguishing the polarity of the light-emitting diode, and quickly judge its performance and luminous brightness. As long as the light-emitting diode is measured once, two test results can be obtained, which has the advantages of simplicity, intuition, time-saving, and high efficiency compared with ordinary multimeters and other testing methods. the
技术方案:发光二极管性能快速测试仪,它包括6V直流电源、低频自激振荡电路、反相器电路、发光二极管测试端子、直流电源指示电路,其特征在于: Technical solution: Light-emitting diode performance quick tester, which includes a 6V DC power supply, a low-frequency self-excited oscillation circuit, an inverter circuit, a light-emitting diode test terminal, and a DC power supply indicating circuit, and is characterized in that:
低频自激振荡电路:包括运算放大器IC1、电阻R1、电阻R2、电阻R3和电阻R4,运算放大器IC1使用的集成电路型号为LM324,运算放大器IC1的第1 脚接发光二极管测试端子A和电阻R3的一端,运算放大器IC1的第2脚接电阻R3的另一端和电阻R4的一端,电阻R4的另一端接运算放大器IC1的第7脚,运算放大器IC1的第3脚接电阻R1的一端和电阻R2的一端,运算放大器IC1的第4脚和电阻R1的另一端接6V直流电源正极VCC,运算放大器IC1的第11脚和电阻R2的另一端接电路地GND; Low-frequency self-excited oscillation circuit: including operational amplifier IC1, resistor R1, resistor R2, resistor R3 and resistor R4, the type of integrated circuit used in operational amplifier IC1 is LM324, the first pin of operational amplifier IC1 is connected to LED test terminal A and resistor R3 One end of the operational amplifier IC1, the second pin of the operational amplifier IC1 is connected to the other end of the resistor R3 and one end of the resistor R4, the other end of the resistor R4 is connected to the seventh pin of the operational amplifier IC1, the third pin of the operational amplifier IC1 is connected to one end of the resistor R1 and the resistor One end of R2, the 4th pin of the operational amplifier IC1 and the other end of the resistor R1 are connected to the positive pole VCC of the 6V DC power supply, the 11th pin of the operational amplifier IC1 and the other end of the resistor R2 are connected to the circuit ground GND;
反相器电路:由运算放大器IC1、电阻R6、电阻R7、电阻R8、电阻R9和电解电容C1组成,运算放大器IC1的第6脚接电阻R8的一端、电阻R9的一端,运算放大器IC1的第7脚接电阻R6的一端,电阻R6的另一端接发光二极管测试端子B,电阻R8的另一端接6V直流电源正极VCC,电阻R9的另一端接电路地GND,运算放大器IC1的第5脚接电解电容C1的正极和电阻R7的一端,运算放大器IC1的第7脚接电阻R7的另一端,电解电容C1的负极接电路地GND。
Inverter circuit: composed of operational amplifier IC1, resistor R6, resistor R7, resistor R8, resistor R9 and electrolytic capacitor C1, the 6th pin of operational amplifier IC1 is connected to one end of resistor R8, one end of resistor R9, and the first terminal of operational
直流电源指示电路:电阻R5的一端接6V直流电源正极VCC,电阻R5的另一端接发光二极管LED的正极,发光二极管LED的负极接电路地GND。 DC power supply indicating circuit: One end of the resistor R5 is connected to the positive pole of the 6V DC power supply VCC, the other end of the resistor R5 is connected to the positive pole of the light-emitting diode LED, and the negative pole of the light-emitting diode LED is connected to the circuit ground GND. the
电路工作原理:发光二极管性能快速测试仪由一路运算放大器接成低频自激振荡器,在输出端间歇地输出高电平或低电平;另一路运算放大器接成反相器形式。当振荡器电路输出高电平时,反相器则输出低电平;低频自激振荡器电路输出低电平时,反相器输出高电平。若在A和B两输出端驳接1支发光二极管,不论驳接发光二极管的极性如何,发光二极管总是随着振荡器电路的振荡频率,使发光二极管间歇地导通发光。直流电源电路中的发光二极管LED为直流电源状态指示,并可作为被检测发光二极管发光亮度的对照。运算放大器IC1选用的型号为LM324或LM358。 The working principle of the circuit: one operational amplifier is connected as a low-frequency self-excited oscillator, and the output terminal intermittently outputs high or low levels; the other operational amplifier is connected as an inverter. When the oscillator circuit outputs a high level, the inverter outputs a low level; when the low-frequency self-excited oscillator circuit outputs a low level, the inverter outputs a high level. If one light-emitting diode is connected to the two output terminals of A and B, no matter how the polarity of the connected light-emitting diode is, the light-emitting diode always follows the oscillation frequency of the oscillator circuit, so that the light-emitting diode is intermittently turned on and emits light. The light-emitting diode LED in the DC power supply circuit is an indication of the state of the DC power supply, and can be used as a comparison of the light-emitting brightness of the detected light-emitting diode. The type of operational amplifier IC1 is LM324 or LM358. the
附图说明 Description of drawings
附图1是本实用新型提供一个发光二极管性能快速测试仪的实施例电路工作原理图。
Accompanying
具体实施方式 Detailed ways
按照附图1所示发光二极管性能快速测试仪的电路工作原理图和附图说明及以下所述的元器件技术要求进行实施,即可实现本实用新型。
The utility model can be realized by implementing the circuit working principle diagram and the description of the accompanying drawings and the technical requirements of components described below according to the light-emitting diode performance quick tester shown in accompanying
元器件的选择及其技术参数 Selection of components and their technical parameters
IC1为运算放大器,推荐使用的集成电路型号为LM324或LM358,它是由四组相互独立的运算放大器组成的电路,它可在较宽的单电源电压范围内工作, 亦可在双电源条件下工作,电源电压工作范围:单电源3V~30V,双电源±1.5V~±15V;本实施例只用了四组运算放大器LM324中的IC1-A、IC1-D两个; IC1 is an operational amplifier. The recommended integrated circuit model is LM324 or LM358. It is a circuit composed of four sets of independent operational amplifiers. It can work in a wide range of single power supply voltage or under dual power supply conditions. Work, power supply voltage working range: single power supply 3V ~ 30V, dual power supply ± 1.5V ~ ± 15V; this embodiment only uses two IC1-A and IC1-D in four groups of operational amplifiers LM324;
LM324型集成电路的封装为双列直插式,其14个引脚和功能分别是: The package of LM324 integrated circuit is dual-in-line, and its 14 pins and functions are:
1脚OUTPUT1、2脚INPUT1-、3脚INPUT1+;4脚接电源的正极VCC;5脚INPUT 2+、6脚INPUT 2-、7脚OUTPUT 2;8脚OUTPUT 3、9脚INPUT 3-、10脚INPUT3+;11脚接电路地GND,即:直流电源的负极;12脚INPUT4+、13脚INPUT4-、14脚OUTPUT4;
1 pin OUTPUT1, 2 pins INPUT1-, 3 pins INPUT1+; 4 pins connected to the positive VCC of the power supply; 5
OUTPUT是运算放大器的输出端;INPUT+是运算放大器的正向输入端;INPUT-是运算放大器的反向输入端; OUTPUT is the output terminal of the operational amplifier; INPUT+ is the positive input terminal of the operational amplifier; INPUT- is the negative input terminal of the operational amplifier;
电路全部使用1/8金属膜电阻,电阻R1、电阻R2、电阻R3、电阻R8和电阻R9的阻值均为50k Ω; All circuits use 1/8 metal film resistors, and the resistance values of resistor R1, resistor R2, resistor R3, resistor R8 and resistor R9 are all 50k Ω;
电阻R4的阻值为10k Ω;电阻R5的阻值为1k Ω;电阻R6的阻值为910Ω;电阻R7的阻值为100k Ω; The resistance value of resistor R4 is 10k Ω; the resistance value of resistor R5 is 1k Ω; the resistance value of resistor R6 is 910Ω; the resistance value of resistor R7 is 100k Ω;
C1为电解电容,其容量为1μF、16V; C1 is an electrolytic capacitor with a capacity of 1μF and 16V;
AN为常开式按键开关; AN is a normally open key switch;
6V直流电源,可以使用4节5#碱性电池。 6V DC power supply, you can use four 5# alkaline batteries. the
电路制作要点、电路调试及使用 Main points of circuit making, circuit debugging and use
发光二极管性能快速测试仪的电路只要是使用性能完好的电子元器件,按照附图1所示元器件的连接关系进行焊接,并对物理接线认真核对和检查无误后,电路不需要任何调试即能正常工作; As long as the circuit of the light-emitting diode performance quick tester uses electronic components with good performance, solder them according to the connection relationship of the components shown in Figure 1, and carefully check the physical wiring and check that they are correct, the circuit does not need any debugging. normal work;
电解电容C1用于调整被测发光二极管闪亮的频率,电解电容C1的容量越大被测发光二极管闪亮的频率越低,电解电容C1容量的推荐值为1μF; The electrolytic capacitor C1 is used to adjust the flickering frequency of the light-emitting diode under test. The larger the capacity of the electrolytic capacitor C1, the lower the flickering frequency of the light-emitting diode under test. The recommended value of the capacity of the electrolytic capacitor C1 is 1 μF;
被测发光二极管闪亮的亮度可由调整电阻R6的阻值,若被测发光二极管闪亮的亮度不足,可适当减小电阻R6的阻值试之; The brightness of the light-emitting diode under test can be adjusted by adjusting the resistance value of the resistor R6. If the brightness of the light-emitting diode under test is not enough, the resistance value of the resistor R6 can be appropriately reduced;
发光二极管性能快速测试仪的测试端子A与测试端子B为被测发光二极管驳接端子,使用时被测发光二极管可以不用区分正负极。 The test terminal A and test terminal B of the light-emitting diode performance quick tester are the connection terminals of the light-emitting diode under test, and the light-emitting diode under test can be used without distinguishing the positive and negative poles. the
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Cited By (3)
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| CN102621467A (en) * | 2012-03-26 | 2012-08-01 | 朱虹 | Quick tester of LED performance |
| WO2014135644A1 (en) * | 2013-03-08 | 2014-09-12 | Osram Opto Semiconductors Gmbh | Method and device for measuring and optimising an optoelectronic component |
| WO2016124367A1 (en) * | 2015-02-05 | 2016-08-11 | Osram Opto Semiconductors Gmbh | Method and device for inspecting an optoelectronic component |
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- 2012-03-26 CN CN201220116036.2U patent/CN202471906U/en not_active Expired - Fee Related
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| CN102621467A (en) * | 2012-03-26 | 2012-08-01 | 朱虹 | Quick tester of LED performance |
| WO2014135644A1 (en) * | 2013-03-08 | 2014-09-12 | Osram Opto Semiconductors Gmbh | Method and device for measuring and optimising an optoelectronic component |
| CN105026941A (en) * | 2013-03-08 | 2015-11-04 | 欧司朗光电半导体有限公司 | Method and device for measuring and optimising an optoelectronic component |
| KR20150127124A (en) * | 2013-03-08 | 2015-11-16 | 오스람 옵토 세미컨덕터스 게엠베하 | Method and device for measuring and optimising an optoelectronic component |
| DE102013102322B4 (en) | 2013-03-08 | 2018-05-30 | Osram Opto Semiconductors Gmbh | Method and device for measuring and optimizing an optoelectronic component |
| US10132855B2 (en) | 2013-03-08 | 2018-11-20 | Osram Opto Semiconductors Gmbh | Method and device for measuring and optimizing an optoelectronic component |
| CN105026941B (en) * | 2013-03-08 | 2019-01-18 | 欧司朗光电半导体有限公司 | Method and apparatus for measuring and optimizing optoelectronic components |
| KR102136912B1 (en) | 2013-03-08 | 2020-07-22 | 오스람 옵토 세미컨덕터스 게엠베하 | Method and device for measuring and optimising an optoelectronic component |
| WO2016124367A1 (en) * | 2015-02-05 | 2016-08-11 | Osram Opto Semiconductors Gmbh | Method and device for inspecting an optoelectronic component |
| US10288671B2 (en) | 2015-02-05 | 2019-05-14 | Osram Opto Semiconductors Gmbh | Method and device for inspecting an optoelectronic component arranged on a connection board |
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Granted publication date: 20121003 Termination date: 20130326 |
