CN102621397A - Inductance measuring meter - Google Patents
Inductance measuring meter Download PDFInfo
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- CN102621397A CN102621397A CN2012101111229A CN201210111122A CN102621397A CN 102621397 A CN102621397 A CN 102621397A CN 2012101111229 A CN2012101111229 A CN 2012101111229A CN 201210111122 A CN201210111122 A CN 201210111122A CN 102621397 A CN102621397 A CN 102621397A
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Abstract
The invention discloses an inductance measuring meter, which comprises a signal input interface, a capacitance interface, an inductance interface and a voltmeter and further comprises a capacitor, an inductor to be measured and a signal generator which are used in a matched mode. The inductance measuring meter uses a capacitance and inductance (LC) resonant circuit to measure the inductance, experiment operation is convenient and simple, experiment results are easy to improve, and measuring efficiency is improved.
Description
Technical field
The invention belongs to Physical Experiment surveying instrument field, relate to a kind of measurement mechanism of electronic component parameter, be specially a kind of inductance measuring meter.
Background technology
Inductor is a large amount of basic electronic components that use in the electronic equipment.Inductance is the important parameter of inductor.The normal alternating current bridge method that adopts is surveyed inductance in the Physical Experiment; Though this method is comparatively accurate; But to the inductor of different quality factors, the structure of alternating current bridge is different, need adjust alternating current bridge repeatedly in the experiment simultaneously and make it to reach accurate balance; Practical operation comparatively bothers, and the student independently accomplishes certain difficulty.
Summary of the invention
The technical matters that the present invention will solve provides a kind of inductance measuring meter, and it utilizes LC resonant circuit inductance measuring easily.
In order to solve the problems of the technologies described above, the present invention realizes through following technical scheme:
A kind of inductance measuring meter of the present invention comprises signal input interface, capacitive interface, inductive interface and voltage table; Said capacitive interface and said inductive interface connect said signal input interface after being connected in series through lead, and said capacitive interface is connected in parallel through lead and said voltage table.
The present invention also comprises matching used capacitor, inductor to be measured and signal generator; Said capacitor links to each other with the capacitive interface of said inductance measuring meter through lead; Said inductor to be measured links to each other with the inductive interface of said inductance measuring meter through lead, and said signal generator links to each other with the signal input interface of said inductance measuring meter through lead.
The signal that said signal generator sends is the sinusoidal electric signals of frequency adjustable.
Said capacitor is a standard capacitor.
During actual measurement; Regulate the frequency of the sinusoidal electric signals of said signal generator output; Observe the reading of said voltage table simultaneously; When frequency is transferred to a certain value f; Said voltage table reading reaches maximum; The LC series circuit that be made up of said inductor to be measured and said capacitor this moment reaches electric resonance, and resonance frequency is obtained said inductor to be measured thus for
inductance value is the capacitance of said capacitor for C in
formula.
The beneficial effect that the present invention produces is to survey inductance with the conventional AC bridge method to compare experimental implementation more easy, just can draw inductance value to be measured through simple measurement, helps improving experiment effect, the raising efficiency of measurement.
Description of drawings
Below in conjunction with accompanying drawing the present invention is described further.
Fig. 1 is the formation synoptic diagram of a kind of inductance measuring meter of the present invention.
Fig. 2 is the schematic circuit of inductance measuring meter according to the invention.
Among the figure: 1. inductance measuring meter, 2. signal input interface, 3. capacitive interface, 4. inductive interface, 5. capacitor, inductor 6. to be measured, 7. voltage table, 8. signal generator.
Embodiment
Like Fig. 1, shown in Figure 2; Inductance measuring meter 1 of the present invention comprises signal input interface 2, capacitive interface 3, inductive interface 4 and voltage table 7; Said capacitive interface 3 connects said signal input interface 2 after being connected in series through lead with said inductive interface 4, and said capacitive interface 3 is connected in parallel with voltage table 7.
With inductance measuring meter 1 matching used device capacitor 5, inductor to be measured 6 and signal generator 8 are arranged; Said capacitor 5 links to each other with capacitive interface 3 through lead; Said inductor to be measured 6 links to each other with inductive interface 4 through lead, and said signal generator 8 links to each other with signal input interface 2 through lead.
The signal that said signal generator 8 sends is the sinusoidal electric signals of frequency adjustable.
Said capacitor 5 is a standard capacitor.
During actual measurement, the frequency of the sinusoidal electric signals of conditioning signal generator 8 output is observed the reading of voltage table 7 simultaneously, and when frequency was transferred to a certain value, the voltage table reading reached maximum, write down this frequency values f.Reach electric resonance by inductor 6 to be measured and the LC series circuit that capacitor 5 constitutes this moment, and resonance frequency is tried to achieve the inductance value
of inductor 6 to be measured thus for
Change the capacitor of different capacitances, repeat above-mentioned measurement, and obtain the mean value of gained inductance L.
Claims (4)
1. inductance measuring meter; It is characterized in that: comprise signal input interface (2), capacitive interface (3), inductive interface (4) and voltage table (7); Connect signal input interface (2) after said capacitive interface (3) and inductive interface (4) are connected in series through lead, said capacitive interface (3) is connected in parallel with voltage table (7).
2. a kind of inductance measuring meter according to claim 1; It is characterized in that: also comprise matching used capacitor (5), inductor to be measured (6) and signal generator (8); Said capacitor (5) links to each other with capacitive interface (3) through lead; Said inductor to be measured (6) links to each other with inductive interface (4) through lead, and said signal generator (8) links to each other with signal input interface (2) through lead.
3. a kind of inductance measuring meter according to claim 2 is characterized in that: the signal that said signal generator (8) sends is the sinusoidal electric signals of frequency adjustable.
4. a kind of inductance measuring meter according to claim 2 is characterized in that: said capacitor (5) is a standard capacitor.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2012101111229A CN102621397A (en) | 2012-04-13 | 2012-04-13 | Inductance measuring meter |
Applications Claiming Priority (1)
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CN2012101111229A CN102621397A (en) | 2012-04-13 | 2012-04-13 | Inductance measuring meter |
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CN102621397A true CN102621397A (en) | 2012-08-01 |
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CN2012101111229A Pending CN102621397A (en) | 2012-04-13 | 2012-04-13 | Inductance measuring meter |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103018575A (en) * | 2012-12-05 | 2013-04-03 | 合肥工业大学 | High-power inductance testing device, main circuit thereof and testing method thereof |
CN103760424A (en) * | 2014-01-18 | 2014-04-30 | 张新安 | Q instrument capable of measuring large capacitance through series connection comparison method |
CN110308335A (en) * | 2019-07-08 | 2019-10-08 | 中国科学院合肥物质科学研究院 | It is a kind of to exchange the resistance sense parameter measuring apparatus of magnet coil, method and system |
CN111090011A (en) * | 2020-02-13 | 2020-05-01 | 深圳飞骧科技有限公司 | Test device for measuring reactance element |
CN111175579A (en) * | 2019-12-30 | 2020-05-19 | 中国电子科技集团公司第十三研究所 | Device and system for detecting manufacturing consistency of multilayer substrates of 3D integrated LC filter |
CN112986670A (en) * | 2021-02-07 | 2021-06-18 | 石家庄通合电子科技股份有限公司 | Power device parameter measuring circuit and power device parameter measuring method |
-
2012
- 2012-04-13 CN CN2012101111229A patent/CN102621397A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103018575A (en) * | 2012-12-05 | 2013-04-03 | 合肥工业大学 | High-power inductance testing device, main circuit thereof and testing method thereof |
CN103018575B (en) * | 2012-12-05 | 2015-11-18 | 合肥工业大学 | A kind of method utilizing large power, electrically sensing electricity testing device to measure high-power inductance |
CN103760424A (en) * | 2014-01-18 | 2014-04-30 | 张新安 | Q instrument capable of measuring large capacitance through series connection comparison method |
CN110308335A (en) * | 2019-07-08 | 2019-10-08 | 中国科学院合肥物质科学研究院 | It is a kind of to exchange the resistance sense parameter measuring apparatus of magnet coil, method and system |
CN111175579A (en) * | 2019-12-30 | 2020-05-19 | 中国电子科技集团公司第十三研究所 | Device and system for detecting manufacturing consistency of multilayer substrates of 3D integrated LC filter |
CN111175579B (en) * | 2019-12-30 | 2022-04-01 | 中国电子科技集团公司第十三研究所 | Device and system for detecting manufacturing consistency of multilayer substrates of 3D integrated LC filter |
CN111090011A (en) * | 2020-02-13 | 2020-05-01 | 深圳飞骧科技有限公司 | Test device for measuring reactance element |
CN112986670A (en) * | 2021-02-07 | 2021-06-18 | 石家庄通合电子科技股份有限公司 | Power device parameter measuring circuit and power device parameter measuring method |
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Application publication date: 20120801 |