CN102569496A - Process method for detecting defects of solar cell assembly - Google Patents
Process method for detecting defects of solar cell assembly Download PDFInfo
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- CN102569496A CN102569496A CN2010105998590A CN201010599859A CN102569496A CN 102569496 A CN102569496 A CN 102569496A CN 2010105998590 A CN2010105998590 A CN 2010105998590A CN 201010599859 A CN201010599859 A CN 201010599859A CN 102569496 A CN102569496 A CN 102569496A
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- solar cell
- image
- defects
- test assembly
- process method
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Photovoltaic Devices (AREA)
Abstract
The invention relates to a process method for detecting defects of a solar cell assembly, and the process method comprises the following steps: embedding a solar cell test assembly, connecting a positive electrode and a negative electrode of an outgoing wire, closing a cover, forming a dark room, reflecting an image of the solar cell test assembly through infrared light and observing the displayed image and a marked process flow. The distribution characteristic of the diffusion length of a solar cell can be intuitively displayed by applying the electroluminescent image of the solar cell, and through analysis on the image, the problems which are possible to exist in all links, suck as diffusion, passivation, screen printing, sintering and the like of a solar cell chip of the solar cell test assembly can be found within a short period of time. Therefore, the defects of the solar cell chip can be easily observed, the existing problems, such as hidden cracks, surface pollution, sintering defects, material defects, broken gate and the like of the solar cell chip can be timely corrected, the scrappage of the whole solar cell component can be avoided, and particularly, in large-scale production, the service life of the solar cell component can be prolonged, the electrical performances can be improved, the yield can be improved and the benefits can be also increased.
Description
Technical field
Solar module defects detection process of the present invention, what relate to is the technical field that monitoring and research solar module are produced.Be used to evaluate and test solar module and battery strings parameter.
Background technology
In the solar module production process, through regular meeting take place be since the employee in operating process repeating welding or gesture not right, that causes solar battery chip crosses weldering, latent splitting; On the other hand, because many solar battery chips some problems will occur in sintering process,, like this, badly influence the useful life and the electrical property of solar module as phenomenons such as our latently splitting of often with the naked eye can't see, low-power.Very easily cause the integral body of solar module to scrap
Summary of the invention
Some defectives before the objective of the invention is to overcome; Utilize the electroluminescence brightness of solar cell to be proportional to the principle of minority diffusion length; Through the analysis of image, we can find effectively at short notice that each link such as solar battery chip, diffusion, passivation, wire mark and sintering maybe in-problem solar module defects detection process.Its technology is achieved in that and sets input current, and the time for exposure, store path etc. are interior; It is characterized in that: insert the solar cell test assembly; Connect the positive and negative electrode electrode of outlet, close lid, form the darkroom; Infrared light reflection solar cell test assembly image, the technical process of observing display image and marking; Described input current is in the scope of 1A-10A; Time for exposure is in the scope of 0.1s-25.5s.Obvious advantage and the effect implemented after this technology are: applied solar energy battery electroluminescence image shows the distribution characteristics of solar cell diffusion length intuitively; Through the analysis of image, we can find problem that each links such as solar battery chip, diffusion, passivation, wire mark and sintering possibly exist at short notice effectively.We just are easy to observe the defective of solar battery chip like this, as former solar battery chip latent split, problems such as surface contamination, sintering defective, fault in material, disconnected grid, revised timely; Avoided the integral body of solar module to scrap; Especially in large-scale production, prolong the useful life of solar module, improved electrical property; Can improve output, increase benefit.
Embodiment
Be with power 190W below, length is 1580mm, and the assembly of width 808mm is an example, and the present invention is further described:
Open the tester mains switch, set input current 2A, time for exposure 0.2s; After configuring the storage route in the computer, two people are flat to lift the long 1580mm that the last process lamination is good, and the assembly of wide 808mm is put on the work top that the solar module defect detector processed by optical glass; Connect line electrode with crocodile clip, it is anodal that red positive source connects battery component, and the power cathode of black connects the battery component negative pole; After clipping, cover the tester top cover, form a darkroom; During test, start the tester power supply, be defeated by under the effect of assembly forward current; Send infrared light, the infrared light image exposure is reflected to display screen and shows, observes display image; Judge that whether solar battery chip has anomalies such as latent sliver, poor efficiency sheet, faulty soldered joint, if having, can carry out mark at defective regional a mouse click right button; Return repairing, avoided the integral body of solar module to scrap.
Claims (3)
1. solar module defects detection process comprises input current being set, the time for exposure; The path etc. that is stored in computer is characterized in that interior: insert the solar cell test assembly, connect the positive and negative electrode electrode of outlet; Close lid; Form the darkroom, infrared light reflection solar cell test assembly image, the technical process of observing display image and marking.
2. solar module defects detection process according to claim 1, it is characterized in that: described input current is in the scope of 1A-10A.
3. solar module defects detection process according to claim 1, it is characterized in that: the time for exposure is in the scope of 0.1s-25.5s.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105998590A CN102569496A (en) | 2010-12-17 | 2010-12-17 | Process method for detecting defects of solar cell assembly |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105998590A CN102569496A (en) | 2010-12-17 | 2010-12-17 | Process method for detecting defects of solar cell assembly |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102569496A true CN102569496A (en) | 2012-07-11 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010105998590A Pending CN102569496A (en) | 2010-12-17 | 2010-12-17 | Process method for detecting defects of solar cell assembly |
Country Status (1)
| Country | Link |
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| CN (1) | CN102569496A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944576A (en) * | 2012-11-19 | 2013-02-27 | 英利能源（中国）有限公司 | Test method for welding defects of solar cell string |
| CN104569722A (en) * | 2014-12-31 | 2015-04-29 | 江苏武进汉能光伏有限公司 | Test method of thin-film battery micro-short circuit |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101246927A (en) * | 2007-02-14 | 2008-08-20 | 北京行者多媒体科技有限公司 | Photovoltaic application of amorphous germanium thin film |
| WO2009026661A1 (en) * | 2007-08-30 | 2009-03-05 | Bt Imaging Pty Ltd | Photovoltaic cell manufacturing |
-
2010
- 2010-12-17 CN CN2010105998590A patent/CN102569496A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101246927A (en) * | 2007-02-14 | 2008-08-20 | 北京行者多媒体科技有限公司 | Photovoltaic application of amorphous germanium thin film |
| WO2009026661A1 (en) * | 2007-08-30 | 2009-03-05 | Bt Imaging Pty Ltd | Photovoltaic cell manufacturing |
Non-Patent Citations (1)
| Title |
|---|
| 杨畅民 等: "《晶体硅光伏电池的电致发光成像检测方法与实验研究》", 《第十届中国太阳能光伏会议论文集》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944576A (en) * | 2012-11-19 | 2013-02-27 | 英利能源（中国）有限公司 | Test method for welding defects of solar cell string |
| CN102944576B (en) * | 2012-11-19 | 2015-05-13 | 英利能源（中国）有限公司 | Test method for welding defects of solar cell string |
| CN104569722A (en) * | 2014-12-31 | 2015-04-29 | 江苏武进汉能光伏有限公司 | Test method of thin-film battery micro-short circuit |
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120711 |