CN102568613B - Automatic installation device with memory grain clamp - Google Patents
Automatic installation device with memory grain clamp Download PDFInfo
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- CN102568613B CN102568613B CN201110455444.0A CN201110455444A CN102568613B CN 102568613 B CN102568613 B CN 102568613B CN 201110455444 A CN201110455444 A CN 201110455444A CN 102568613 B CN102568613 B CN 102568613B
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- memory grain
- clamp
- memory
- automatic installation
- grain clamp
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Abstract
The invention provides an automatic installation device with a memory grain clamp. The automatic installation device comprises a main support, wherein the main support is provided with a braking engine and an elastic transmitting rail driven by the braking engine; the elastic transmitting rail comprises two parallel spring sheets which are provided with positioning protrusions; the main support is provided with a rail supporting plate for supporting the spring sheets; the main support is provided with a press-in port which is located below the elastic transmitting rail, and the rail supporting plate is broken at the press-in port; and a suppressing device is arranged right above the press-in port. According to the automatic installation device with the memory grain clamp, disclosed by the invention, a control channel of a memory tester can directly control the automatic replacement and test of the clamp; the automatic installation device can carry out remote online replacement on different grains of same structure or grains of different structures and multiplex an existing single grain clamp; and in addition, the device is not limited to the memory grain test and can be applied to tests of other similar chip products.
Description
[technical field]
The present invention relates to calculator memory design and production field, particularly a kind of automatic installation apparatus of memory grain clamp.
[background technology]
Computing machine and various electronic equipment are widely used in the various aspects of the modern life, the design and production performance requirement of internal memory product grows with each passing day thereupon, thereby the performance test of internal memory product has been occupied in the production cycle of product to very large proportion, more can react intuitively the performance of final products to the performance test of memory grain.But; the individual particle list fixture mode using in the design analysis stage of product at present; can only test individual particle in real time; in the time need to testing isostructural variable grain or the particle of different structure; must manually change; this is all great waste to human resources and test duration, is also not easy to the Long-distance Control of tester.The front-end and back-end of test often adopt machine operation hand to carry out concurrent testing to improve testing efficiency, but it involves great expense, to existing single fixture resource of design analysis stage also reusable not.
[summary of the invention]
The object of this invention is to provide a kind of automatic installation apparatus of memory grain clamp, can realize the Long-distance Control that the control terminal of tester is automatically changed, tested different memory grain clamps.
To achieve these goals, the present invention adopts following technical scheme:
An automatic installation apparatus for memory grain clamp, comprises main body rack, the elasticity transmission track that retro-engine is installed on main body rack and is driven by retro-engine; Elastic transmission track is two parallel spring leafs, and spring leaf is provided with positioning convex; Main body rack is provided with the rail supported plate of support spring sheet; Main body rack is provided with and is pressed into mouth, is pressed into mouth and is positioned at elastic transmission track below, and rail supported plate is pressing porch to disconnect; Directly over being pressed into mouthful, being provided with and suppressing device.
The present invention further improves and is: the below that is pressed into mouth is provided with the fixture pickup groove of location memory grain clamp; Described fixture pickup groove is connected with the control channel load board of memory test device.
The present invention further improves and is: memory grain clamp comprises upper clip and lower clamping piece, and memory grain is held between upper and lower intermediate plate, and each test pin of memory grain is exposed from lower clamping piece.
The present invention further improves and is: main body rack is provided with fixture and is written into mouth, and the width that fixture is written into mouthful is less than the width of memory grain clamp.
The present invention further improves and is: retro-engine connects the corresponding control channel of the control channel load board of memory test device by electricly connecting line.
The present invention further improves and is: suppress device and be positioned at directly over fixture pickup groove, by retro-engine control; When tested memory grain clamp is positioned at while being pressed into mouthful top, retro-engine stops transmission stopping elasticity transmission track, and retro-engine is sent ready signal, suppresses device and depresses, and depresses and sends into pickup groove and test being pressed into a mouthful memory grain clamp for top; Be completed, the control channel load board of memory test device is sent enabling signal, when retro-engine receives this enabling signal, suppresses device and upsprings, and grain clamp is together upspring with elasticity transmission track simultaneously.
The present invention further improves and is: spring leaf is provided with some positioning convex, and memory grain clamp is fixed between adjacent positioned projection.
The present invention further improves and is: retro-engine is bidirectional braking device.
The present invention further improves and is: described automatic installation apparatus also comprise for by memory grain clamp to be measured be pressed into mouthful centralising device aliging; Pickup groove baffle plate is installed on main body rack.
The present invention further improves and is: described centralising device is infrared ray centralising device.
With respect to prior art, tool of the present invention has the following advantages: the automatic installation apparatus of memory grain clamp of the present invention, realize automatic replacing, the test of directly being controlled fixture by memory test device control channel; This device can to isostructural variable grain or the particle of different structure carries out remote online replacing, the existing individual particle fixture of reusable; In addition, this device is not limited only to the test of memory grain, also the test of available and other similar chip products.
[brief description of the drawings]
Fig. 1 is fixture transmission track structural representation;
Fig. 2 is fixture fixed slot configurations schematic diagram;
Fig. 3 electricly connects part-structure schematic diagram;
Fig. 4 suppresses the not structural representation of depressed state of device;
Fig. 5 is the structural representation that suppresses device depressed state.
[embodiment]
Below in conjunction with accompanying drawing, using method of the present invention is described further.
Referring to shown in Fig. 1, is the fixture transmission track part of component devices, and it mainly comprises main body rack 10, the elasticity transmission track 2 that retro-engine 1 is installed on main body rack 10 and is driven by retro-engine 1.Main body rack 10 is box-like, and its top is provided with fixture and is written into mouth 11, and fixture is written into mouth 11 elasticity transmission track 2 is exposed so that memory grain clamp is installed from here.Memory grain clamp comprises upper clip and lower clamping piece, and memory grain is held between upper and lower intermediate plate, and each test pin of memory grain is exposed from lower clamping piece, so that detect.
Elastic transmission track 2 is two parallel spring leafs 21, and spring leaf 21 is provided with positioning convex, memory grain clamp is positioned between two adjacent protrusion; When elastic transmission track 2 moves, by positioning convex and spring leaf acting in conjunction, drive memory grain clamp motion.Fixture is written into mouthful 11 reference positions for elasticity transmission track 2, memory grain clamp is written into mouth 11 by fixture and is installed on elastic transmission track 2, the width that fixture is written into mouth 11 is slightly less than the width of memory grain clamp, memory grain clamp is proceeded to after elastic transmission track 2, can not be written into mouth 11 from fixture and deviate from.Main body rack 10 is provided with the rail supported plate of support spring sheet 21, with support spring sheet 21.Main body rack 10 is provided with and is pressed into mouth, is pressed into mouth and is positioned at elastic transmission track 2 belows; Rail supported plate is pressing porch to disconnect, and spring leaf 21 is herein not supported.Directly over being pressed into mouthful, being provided with and suppressing device 3.
Retro-engine 1 is bidirectional braking device, directly controls by electricly connecting part, and its function is for being pressed into some being placed in No. 1 to No. 8 memory grain clamp (dut1～dut8) mouth and suppressing between device 3.The core that elasticity transmission track 2 is this part, is placed in parallel on main body rack 10, and for loading and transmitting grain clamp, its elastic performance is to coordinate to suppress device 3 and complete fixture to compressing into and ejecting in pickup groove 4.
Suppress device 3 and be provided with centralising device, for memory grain clamp to be measured mouthful is alignd with being pressed into; Retro-engine 1 is controlled memory grain clamp to be measured and is moved to while being pressed into mouth top, centralising device is opened, and whether memory grain clamp to be measured mouthful aligns with being pressed into, if not alignment, suppress device 3 and send signal controlling retro-engine 1 and finely tune, memory grain clamp to be measured mouthful is alignd with being pressed into; Centralising device type of the prior art is many, as laser centring device, infrared ray centralising device etc.; For example infrared ray centralising device can arrange a through hole on memory grain clamp to be measured, an infrared transmitter and an infrared remote receiver are set in the upper and lower both sides of fixture, when centering, infrared transmitter, through hole and infrared remote receiver are on same straight line, the signal that infrared transmitter sends can be received by infrared receiving set, illustrates that centering completes; If through hole skew, infrared remote receiver just cannot receive the signal that infrared transmitter sends, now suppressing device 3 sends signal controlling retro-engine 1 and finely tunes, until infrared transmitter, through hole and infrared remote receiver are on same straight line, the signal that infrared transmitter sends can be received by infrared receiving set, and centering completes.After centering, pickup groove baffle plate stretches out from main body rack 10, blocks the fixture that is pressed into mouthful both sides, makes to suppress device 3 and be pressed into Shi Buhui and have influence on the fixture of both sides.
Refer to shown in Fig. 2, fixture pickup groove 4, is directly connected with the control channel load board of memory test device, for the tested memory grain clamp of fixed placement, each memory grain pin is connected with the corresponding each test channel of memory test device.Fixture pickup groove 4 is arranged at and is pressed into a mouthful below.
Refer to shown in Fig. 3, this figure is for electricly connecting part schematic diagram; Electricly connect line 51 one end and be connected with the retro-engine 1 of fixture transmission track 2, the other end is directly connected with the corresponding control channel of the control channel load board of memory test device, realizes the transmission of control channel to retro-engine 1 control command.
Refer to shown in Fig. 4 and Fig. 5, for suppressing the view of suppressing of device, suppressing device 3 is positioned at directly over fixture pickup groove 4, controlled by retro-engine 1, when tested grain clamp is positioned at while being pressed into mouthful top, retro-engine 1 stops transmission, sends ready signal, suppress device 3 and depress, a memory grain clamp that is pressed into mouthful top is depressed and sent into pickup groove 4 and test; In the time that retro-engine 1 receives enabling signal, suppress device 3 and upspring, grain clamp is together upspring with elasticity transmission track 2 simultaneously.
The automatic installation apparatus of memory grain clamp of the present invention, realizes Auto-mounting and the replacing of directly being controlled fixture by memory test device control channel.This device can to isostructural variable grain or the particle of different structure carries out remote online replacing, the existing individual particle fixture of reusable.In addition, this device is not limited only to the test of memory grain, also the test of available and other similar chip products.
Claims (9)
1. the automatic installation apparatus of a memory grain clamp, it is characterized in that, comprise main body rack (10), the elasticity transmission track (2) that retro-engine (1) is installed on main body rack (10) and is driven by retro-engine (1); Elastic transmission track (2) is two parallel spring leafs (21), and spring leaf (21) is provided with positioning convex; Main body rack (10) is provided with the rail supported plate of support spring sheet (21); Main body rack (10) is provided with fixture and is written into mouthful (11) and is pressed into mouth, is pressed into mouth and is positioned at elastic transmission track (2) below, and rail supported plate is pressing porch to disconnect; Directly over being pressed into mouthful, being provided with and suppressing device (3); Memory grain clamp comprises upper clip and lower clamping piece, and memory grain is held between upper and lower intermediate plate, and each test pin of memory grain is exposed from lower clamping piece.
2. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 1, is characterized in that, the below that is pressed into mouth is provided with the fixture pickup groove (4) of location memory grain clamp; Described fixture pickup groove (4) is connected with the control channel load board of memory test device.
3. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 2, is characterized in that, the width that fixture is written into mouthful (11) is less than the width of memory grain clamp.
4. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 2, is characterized in that, retro-engine (1) connects the corresponding control channel of the control channel load board of memory test device by electricly connecting line (51).
5. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 2, is characterized in that, suppresses device (3) and is positioned at directly over fixture pickup groove (4), is controlled by retro-engine (1); When tested memory grain clamp is positioned at while being pressed into mouthful top, retro-engine (1) stops transmission stopping elasticity transmission track (2), retro-engine (1) is sent ready signal, suppress device (3) and depress, a memory grain clamp that is pressed into mouthful top is depressed and sent into pickup groove (4) and test; Be completed, the control channel load board of memory test device is sent enabling signal, when retro-engine (1) receives this enabling signal, suppresses device (3) and upsprings, and grain clamp is together upspring with elasticity transmission track (2) simultaneously.
6. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 1, is characterized in that, spring leaf (21) is provided with some positioning convex, and memory grain clamp is fixed between adjacent positioned projection.
7. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 1, is characterized in that, retro-engine (1) is bidirectional braking device.
8. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 2, is characterized in that, described automatic installation apparatus also comprise for by memory grain clamp to be measured be pressed into the centralising device that aligns of mouth; Main body rack is provided with pickup groove baffle plate on (10).
9. the automatic installation apparatus of a kind of memory grain clamp as claimed in claim 8, is characterized in that, described centralising device is infrared ray centralising device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110455444.0A CN102568613B (en) | 2011-12-23 | 2011-12-23 | Automatic installation device with memory grain clamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110455444.0A CN102568613B (en) | 2011-12-23 | 2011-12-23 | Automatic installation device with memory grain clamp |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102568613A CN102568613A (en) | 2012-07-11 |
| CN102568613B true CN102568613B (en) | 2014-10-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110455444.0A Active CN102568613B (en) | 2011-12-23 | 2011-12-23 | Automatic installation device with memory grain clamp |
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| CN (1) | CN102568613B (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6046421A (en) * | 1997-11-06 | 2000-04-04 | Computer Service Technology, Inc. | PCB Adapter for a test connector assembly for an automatic memory module handler for testing electronic memory modules |
| CN100412559C (en) * | 2005-04-20 | 2008-08-20 | 威盛电子股份有限公司 | Chip testing method and relevant apparatus |
| CN201259507Y (en) * | 2008-08-29 | 2009-06-17 | 番禺得意精密电子工业有限公司 | Test device |
| US7884631B2 (en) * | 2009-02-25 | 2011-02-08 | Kingston Technology Corp. | Parking structure memory-module tester that moves test motherboards along a highway for remote loading/unloading |
| CN202404913U (en) * | 2011-12-23 | 2012-08-29 | 山东华芯半导体有限公司 | Automatic mounting device for memory grain clamp |
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2011
- 2011-12-23 CN CN201110455444.0A patent/CN102568613B/en active Active
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| Publication number | Publication date |
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| CN102568613A (en) | 2012-07-11 |
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Address after: 710075 Shaanxi City, Xi'an province high tech Road No. 38, innovation center, A, block, floor 4 Patentee after: XI'AN UNIIC SEMICONDUCTORS Co.,Ltd. Address before: 710055 Shaanxi City, Xi'an province high tech Road No. 38, innovation center, A, block, floor 4 Patentee before: Xi'an Sinochip Semiconductors Co., Ltd. |