CN102565679A - Method and device for detecting limit value of power supply voltage - Google Patents
Method and device for detecting limit value of power supply voltage Download PDFInfo
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- CN102565679A CN102565679A CN2011104346664A CN201110434666A CN102565679A CN 102565679 A CN102565679 A CN 102565679A CN 2011104346664 A CN2011104346664 A CN 2011104346664A CN 201110434666 A CN201110434666 A CN 201110434666A CN 102565679 A CN102565679 A CN 102565679A
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Abstract
The embodiment of the invention discloses a method and a device for detecting a limit value of power supply voltage. The method comprises the following steps: respectively providing a standard power supply voltage signal and a tested power supply voltage signal for a standard IC (integrated circuit) and a tested IC, respectively providing a standard driving time sequence and a tested driving time sequence for the standard IC and the tested IC, judging whether an answer signal returned by the standard IC according to the received standard driving time sequence is the same with that which is returned by the tested IC according to the received tested driving time sequence or not, if so, regulating the voltage of the tested power supply voltage signal, initializing the standard driving time sequence and further performing the next-round detection; and if not, recording the voltage value of the tested power supply voltage signal and taking the recorded value as the limit value of the power supply voltage of the tested IC. The embodiment of the invention further discloses a device for detecting the limit value of the power supply voltage. According to the method and the device, the cost of detecting the limit value of the power supply voltage of the IC can be reduced, and the limit value of the power supply voltage of the IC can be automatically detected.
Description
Technical field
The present invention relates to electronic applications, relate in particular to a kind of method and device that detects the supply voltage ultimate value.
Background technology
Because receive the restriction of integrated circuit (IC, Integrated Circuit) production technology, all can there be certain tolerance in the IC parameters in practical application, each parameter that therefore detects IC is considerable.The magnitude of voltage of supply voltage has determined the duty of IC, and therefore, the supply voltage ultimate value that detects IC is of crucial importance, and at present, the method for the supply voltage ultimate value of detection IC is following:
Supply power to tested IC with by the circuit module that tested IC and other element constitute with the voltage source instrument; The duty of manual observation IC through manual shift voltage source instrument, progressively improves or reduces magnitude of voltage; Can't operate as normal up to IC, draw the supply voltage ultimate value of IC with the method.
Need special-purpose voltage source instrument and manual debugging to accomplish the detection of the supply voltage ultimate value of IC in the prior art; And special-purpose voltage source instrument is very expensive; It is very high to detect the cost that the supply voltage ultimate value of IC spent like this, and can't realize that robotization detects the supply voltage ultimate value of IC.
Summary of the invention
The embodiment of the invention provides a kind of method and device that detects the supply voltage ultimate value, reduces the cost that detects IC supply voltage ultimate value, and can realize that robotization detects the supply voltage ultimate value of IC.
In order to solve the problems of the technologies described above, a kind of method that detects the supply voltage ultimate value that the embodiment of the invention provides comprises:
To benchmark IC and tested IC benchmark supply voltage signal and tested supply voltage signal are provided respectively, the model of said benchmark IC and tested IC is identical;
Provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC; Parameter all the other parameters except that high level that said benchmark drives sequential and said tested driving sequential are all identical, and the high level of said tested driving sequential equals said tested supply voltage voltage of signals;
Whether judgment standard IC drives answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Then regulate said tested supply voltage voltage of signals; And the initialization benchmark drives sequential, returns and carries out the said step that benchmark supply voltage signal and tested supply voltage signal are provided respectively to benchmark IC and tested IC;
If judged result then writes down said tested supply voltage voltage of signals value for not, and with the supply voltage ultimate value of record value as tested IC.
Accordingly, a kind of device that detects the supply voltage ultimate value that the embodiment of the invention provides comprises:
Elementary driver element is used for providing benchmark supply voltage signal and benchmark to drive sequential to benchmark IC;
The secondary drive unit; Be used for survey supply voltage signal and tested driving sequential being provided to tested IC; Parameter all the other parameters except that high level that said benchmark drives sequential and said tested driving sequential are all identical; The high level of said tested driving sequential equals said tested supply voltage voltage of signals, and said benchmark IC is identical with said model by IC;
The adjustable voltage source unit is used to regulate the tested supply voltage voltage of signals that said secondary drive unit provides;
Main control unit; Whether being used for judgment standard IC, to drive answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Then control the adjustable voltage source unit and regulate the tested supply voltage voltage of signals that said secondary drive unit provides, the benchmark that controlling said elementary driver element initialization provides drives sequential, and carries out the detection of next round;
If judged result then writes down the tested supply voltage voltage of signals value that said secondary drive unit provides for not, and with the supply voltage ultimate value of record value as tested IC.
The embodiment of the invention; To benchmark IC and tested IC benchmark supply voltage signal and tested supply voltage signal are provided respectively; Provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC; Parameter all the other parameters except that high level that said benchmark drives sequential and said tested driving sequential are all identical, and the high level of said tested driving sequential equals said tested supply voltage voltage of signals, and whether judgment standard IC drives answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential of reception; If judged result is for being; Then regulate said tested supply voltage voltage of signals, and initialization benchmark driving sequential, carry out the detection of lower whorl again; If judged result writes down said tested supply voltage voltage of signals value for not, and with the supply voltage ultimate value of record value as tested IC.So just can detect the supply voltage ultimate value of IC, reduce the cost that detects IC supply voltage ultimate value, and can realize that robotization detects the supply voltage ultimate value of IC.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art; To do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below; Obviously, the accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills; Under the prerequisite of not paying creative work property, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is a kind of schematic flow sheet that detects the method for supply voltage ultimate value of the embodiment of the invention;
Fig. 2 is a kind of schematic flow sheet that detects another embodiment of method of supply voltage ultimate value of the embodiment of the invention;
Fig. 3 is a kind of schematic flow sheet that detects another embodiment of method of supply voltage ultimate value of the embodiment of the invention;
Fig. 4 is a kind of structural representation that detects the device of supply voltage ultimate value of the embodiment of the invention.
Embodiment
To combine the accompanying drawing in the embodiment of the invention below, the technical scheme in the embodiment of the invention is carried out clear, intactly description, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making the every other embodiment that is obtained under the creative work prerequisite, all belong to the scope of the present invention's protection.
Fig. 1 is a kind of schematic flow sheet that detects the method for supply voltage ultimate value of the embodiment of the invention, and is as shown in Figure 1, comprising:
S101, benchmark supply voltage signal and tested supply voltage signal are provided respectively to benchmark IC and tested IC.
It is understandable that benchmark supply voltage signal is exactly a benchmark IC supply voltage, tested supply voltage signal is exactly the supply voltage of tested IC.
Need to prove that the model of benchmark IC and tested IC is identical.
S102, provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC.
It is understandable that; Provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC; A pumping signal is provided just for benchmark IC and tested IC, can returns an answer signal according to this signal after letting benchmark IC and tested IC receive this signal.
Need to prove that the high level of tested driving sequential equals tested supply voltage voltage of signals in the testing process.
Need to prove that parameter all the other parameters except that high level that benchmark drives sequential and tested driving sequential are all identical, it must be identical the sequential that drives sequential being provided in the testing process benchmark IC and tested IC.Like all parameters except high level such as cycle of providing for benchmark IC and tested IC to drive sequential and dutycycles is identical, can guarantee that so just the answer signal that in benchmark IC and logic level scope that tested IC can bear, returns is identical.
Need to prove that step S102 is to benchmark IC and tested IC provides benchmark to drive sequential respectively and tested driving sequential can realize through following steps:
Provide benchmark to drive sequential to benchmark IC;
Obtain benchmark and drive sequential;
The benchmark that adjusting is obtained drives the high level of sequential, and the benchmark after will regulating drives sequential as tested driving sequential;
To tested IC tested driving sequential is provided.
Concrete implementation method can be following:
The dual power supply bus transceiver obtains to tested IC tested driving sequential is provided; The dual power supply bus transceiver is regulated the high level that the benchmark that gets access to drives sequential according to tested supply voltage voltage of signals; Driving sequential after output is regulated transfers to tested IC as tested driving sequential, and the high level of tested driving sequential equals tested supply voltage voltage of signals.
Parameter all the other parameters except that high level that the benchmark that just can guarantee to provide to benchmark IC and tested IC through above method drives sequential and tested driving sequential are all identical.
Whether S103, judgment standard IC drive answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Then execution in step S104 regulates tested supply voltage voltage of signals, and the initialization benchmark drives sequential.
If judged result is not, then execution in step 105 writes down tested supply voltage voltage of signals value, and with the supply voltage ultimate value of record value as tested IC.
Need to prove that judgment standard IC drives identical can the realization in the following manner of answer signal whether answer signal that sequential returns returns according to the tested driving sequential that receives with tested IC according to the benchmark that receives:
Single-chip microcomputer (MCU; Micro Control Unit), digital signal processor (DSP; Digital Signal Processing) or microprocessor (ARM; Advanced RISC Machines) one or more controllers in, whether judgment standard IC drives answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives.
Need to prove; When benchmark IC and tested IC receive drive sequential after, will the echo reply signal, the answer signal that returns can be logic level signal or protocol data; Specifically according to the difference of the IC that detects and difference; IC as detecting is simple integrated circuit, like the logical AND gate integrated circuit, will return a logic level signal when detecting this IC so; Like the IC that detects is complicated IC, like some wireless transceivers, sensor or microcontroller, will return a protocol data when detecting this IC so.Certainly protocol data also can be twin wire serial (I2C; Inter-Integrated Circuit or) protocol data or peripheral serial line interface (SPI; Serial Peripheral Interface) protocol data; As detect wireless transceiver and will return the SPI protocol data, will return the I2C protocol data like detecting sensor.
Need to prove, the sequential that it can be a plurality of cycles that the benchmark that benchmark IC receives drives tested driving sequential that sequential and tested IC receive, the answer signal that returns according to the driving sequential of reception of benchmark IC and tested IC also is the answer signal in a plurality of cycles like this.In this case; Whether can be judgment standard IC drive answer signal that sequential returns according to the benchmark that receives to step S103 identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Continue execution in step S103 judgment standard IC and drive the identical judgement of answer signal whether answer signal that sequential returns returns according to the tested driving sequential that receives with tested IC according to the benchmark that receives; Drive the answer signal end of transmission (EOT) that answer signal that sequential returns and tested IC return according to the tested driving sequential that receives until benchmark IC according to the benchmark that receives; Then execution in step S104 regulates tested supply voltage voltage of signals, and the initialization benchmark drives sequential; If judged result is that then execution in step S105 does not write down tested supply voltage voltage of signals value, and with the supply voltage ultimate value of record value as tested IC.
S104, the tested supply voltage voltage of signals of adjusting, and the initialization benchmark drives sequential.
When benchmark IC is identical with the answer signal that tested IC returns according to the driving sequential that receives; Just explanation tested supply voltage voltage of signals at this moment is in the safe range of tested IC; At this moment will regulate tested supply voltage voltage of signals, and just regulate the supply voltage of tested IC, and the initialization benchmark drives sequential; To benchmark IC and tested IC benchmark supply voltage signal and tested supply voltage signal are provided respectively with regard to execution in step S101, the detection of beginning next round.
It is understandable that the initialization benchmark drives sequential, is for after regulating tested supply voltage voltage of signals, restart to detect.
Need to prove, regulate tested supply voltage voltage of signals and can realize through following method:
The output voltage of signals of one or more variable voltage sources in the variable voltage source that adjusting is made up of digital-to-analog modular converter DAC and integrated transporting discharging, the variable voltage source of being made up of pulse-length modulation module PWM and field-effect transistor MOSFET, the variable voltage source formed by DC-DC power supply DC/DC and programmable resistance variable voltage source or by adjustable low pressure difference linearity Voltage stabilizing module LDO and potentiometer able to programme, the output signal that more than is provided to variable voltage source is identical with tested supply voltage signal.
Need to prove; Regulating tested supply voltage voltage of signals can be to heighten or turn down tested supply voltage voltage of signals; As transfer big or turn the digital signal pulse width of DAC in the variable voltage source of forming by DAC and integrated transporting discharging down; Regulate the output voltage of signals of variable voltage source, realize heightening or turning down tested supply voltage voltage of signals; And for example transfer big or turn the digital signal pulse width of PWM in the variable voltage source of forming by PWM and MOSFET down, the output voltage of signals of adjusting variable voltage source, tested supply voltage voltage of signals is heightened or is turned down in realization; And for example transfer big or turn resistance down by adjustable DC/DC in adjustable DC/DC and the programmable resistance variable voltage source, the output voltage of signals of regulating variable voltage source, tested supply voltage voltage of signals is heightened or is turned down in realization; And for example transfer big or turn the resistance of adjustable LDO in the variable voltage source of forming by adjustable LDO and potentiometer able to programme down, the output voltage of signals of regulating variable voltage source, tested supply voltage voltage of signals is heightened or is turned down in realization.So just can accomplish the maximum value and the minimal value of the supply voltage that detects IC.
Need to prove that step S104 heightens or turn down tested supply voltage voltage of signals, and initialization benchmark driving sequential, can also be:
Regulate tested supply voltage voltage of signals;
Store the information of voltage after the tested supply voltage Signal Regulation;
And the initialization benchmark drives sequential;
Read the tested supply voltage voltage of signals information in the storage;
Tested supply voltage voltage of signals information according in the storage is regulated tested supply voltage voltage of signals.
After regulating tested supply voltage voltage of signals,, can avoid like this driving the tested supply voltage voltage of signals in sequence change adjusting back because of carrying out the initialization benchmark with the storage of the information of voltage after the tested supply voltage Signal Regulation.The information of voltage of storing after the tested supply voltage Signal Regulation can pass through flash memory Flash Memory, synchronous DRAM (SDRAM; Synchronous Dynamic Random Access Memory) or EPROM (EEPROM; Electrically Erasable Programmable Read-Only Memory) one or more storeies in are stored the information of voltage after the tested supply voltage Signal Regulation.
S105, the tested supply voltage voltage of signals value of record, and with the supply voltage ultimate value of record value as tested IC.
The embodiment of the invention; To benchmark IC and tested IC benchmark supply voltage signal and tested supply voltage signal are provided respectively; Provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC; Parameter all the other parameters except that high level that said benchmark drives sequential and said tested driving sequential are all identical, and the high level of said tested driving sequential equals said tested supply voltage voltage of signals, and whether judgment standard IC drives answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential of reception; If judged result is for being; Then regulate said tested supply voltage voltage of signals, and initialization benchmark driving sequential, carry out the detection of lower whorl again; If judged result writes down said tested supply voltage voltage of signals value for not, and with the supply voltage ultimate value of record value as tested IC.So just can detect the supply voltage ultimate value of IC, reduce the cost that detects IC supply voltage ultimate value, and can realize that robotization detects the supply voltage ultimate value of IC.
Fig. 2 is the schematic flow sheet of another embodiment of a kind of method that detects the supply voltage ultimate value of the embodiment of the invention, and is as shown in Figure 2, comprising:
S201, obtain benchmark supply voltage signal.
Obtaining benchmark supply voltage voltage of signals is the voltage in the benchmark IC safe range.
Need to prove, obtain benchmark supply voltage signal and can realize in the following manner:
Analog-digital conversion (AD; Digital-to-Analog) analog-digital conversion module (ADC in chip, the MCU; Analog-to-Digital Converter), the ADC in the DSP or one or more circuit among the ADC in the ARM, obtain benchmark supply voltage signal.
S202, be resistance information, regulate tested supply voltage voltage of signals according to the resistance information that gets access to benchmark supply voltage voltage of signals information translation.
Convert the information of voltage that gets access to into resistance information and can realize that information of voltage converts resistance information into through the MCU among the top embodiment or DSP or ARM; The regulative mode of regulating tested supply voltage voltage of signals can be the output voltage of signals that realizes regulating variable voltage source through the feedback resistance of resistance information adjusting variable voltage source; Can also adopt the control method of describing among the top embodiment, not do repeat specification here.
Need to prove, regulate tested supply voltage voltage of signals purpose here and be in order before whole testing process, to be identical with the benchmark supply voltage signal that provides to tested IC with tested supply voltage voltage of signals to benchmark IC.It is more purposive in testing process, to regulate tested supply voltage voltage of signals like this, reduces and regulates number of times, and simultaneously, the tested supply voltage voltage of signals of also avoiding providing to tested IC is too high to burn out tested IC.
S203, benchmark supply voltage signal and tested supply voltage signal are provided respectively to benchmark IC and tested IC.
S204, provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC.
Whether S205, judgment standard IC drive answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Then execution in step S206 regulates tested supply voltage voltage of signals, and the initialization benchmark drives sequential.
If judged result is that then execution in step S207 does not write down tested supply voltage voltage of signals value, and with the supply voltage ultimate value of record value as tested IC.
S206, the tested supply voltage voltage of signals of adjusting, and the initialization benchmark drives sequential.
S207, the tested supply voltage voltage of signals value of record, and with the supply voltage ultimate value of record value as tested IC.
In the present embodiment; Increased among the embodiment in the above and regulated tested supply voltage voltage of signals before detecting, purpose is in order before whole testing process, to be identical with the benchmark supply voltage signal that provides to tested IC with tested supply voltage voltage of signals to benchmark IC.It is more purposive in testing process, to regulate tested supply voltage voltage of signals like this; Reduce and regulate number of times; The tested supply voltage voltage of signals that also can avoid providing to tested IC is too high to burn out tested IC; And can detect the supply voltage ultimate value of IC, reduce the cost that detects IC supply voltage ultimate value, realize that robotization detects the supply voltage ultimate value of IC.
Fig. 3 is the schematic flow sheet of another embodiment of a kind of method that detects the supply voltage ultimate value of the embodiment of the invention, and is as shown in Figure 3, comprising:
S301, obtain benchmark supply voltage signal.
S302, be resistance information, regulate tested supply voltage voltage of signals according to the resistance information that gets access to benchmark supply voltage voltage of signals information translation.
S303, benchmark supply voltage signal and tested supply voltage signal are provided respectively to benchmark IC and tested IC.
S304, provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC.
Whether S305, judgment standard IC drive answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; And execution in step S306 shows tested supply voltage voltage of signals information and judged result; If judged result is for being; Then execution in step S308 regulates tested supply voltage voltage of signals, and the initialization benchmark drives sequential.
If judged result is that then execution in step S309 does not write down tested supply voltage voltage of signals value, and with the supply voltage ultimate value of record value as tested IC.
S306, the tested supply voltage voltage of signals information of demonstration and judged result.
Whether with answer signal that tested IC according to the tested driving sequential that receive return identical as judgment standard IC according to the benchmark that receives if driving answer signal that sequential returns; Judged that the back just can demonstrate tested supply voltage voltage of signals information and judged result; Testing process transparence more like this can in time be known the state of detection.
Need to prove, show, can realize in the following manner to tested supply voltage voltage of signals information and judged result:
Through LCD (LCD; Liquid Crystal Display), electronic display (LED; Light Emitting Diode) or vacuum fluorescent display screen (VFD; Vacuum Fluorescent Display) one or more display screens in show tested supply voltage voltage of signals information and judged result.
Need to prove that all right execution in step S307 can also be any step among execution in step S306 or the step S307 according to tested supply voltage voltage of signals information and judged result formation characteristic curve certainly behind the execution of step S306.
S307, according to tested supply voltage voltage of signals information and judged result formation characteristic curve.
Whether with answer signal that tested IC according to the tested driving sequential that receive return identical as judgment standard IC according to the benchmark that receives if driving answer signal that sequential returns; Judged that the back just can be according to tested supply voltage voltage of signals information and judged result formation characteristic curve; As to generate the supply voltage maximum value that tested IC can be described be what volt; How many minimal values is is lied prostrate, and the safe range of the supply voltage of tested IC is how much to lie prostrate the curve map of how many volts.Can know the safe power supply voltage range of the supply voltage ultimate value of expressing tested IC like this.
S308, the tested supply voltage voltage of signals of adjusting, and the initialization benchmark drives sequential.
S309, the tested supply voltage voltage of signals value of record, and with the supply voltage ultimate value of record value as tested IC.
In the present embodiment; Increased and show to have regulated tested supply voltage voltage of signals information and judged result before the tested supply voltage voltage of signals; And according to the method for tested supply voltage voltage of signals information and judged result formation characteristic curve; Testing process transparence more like this can in time be known the state of detection, can know the safe power supply voltage range of the supply voltage ultimate value of expressing tested IC.And can detect the supply voltage ultimate value of IC, reduce the cost that detects IC supply voltage ultimate value, realize that robotization detects the supply voltage ultimate value of IC.
Fig. 4 is a kind of structural representation that detects the device of supply voltage ultimate value of the embodiment of the invention, and is as shown in Figure 4, comprising: elementary driver element 41, secondary drive unit 42, adjustable voltage source unit 43 and main control unit 44, wherein:
It is understandable that the benchmark supply voltage signal that elementary driver element 41 provides is exactly the supply voltage of benchmark IC.
It is understandable that the supply voltage that the tested supply voltage signal that secondary drive unit 42 provides is exactly tested IC.
Need to prove; Parameter all the other parameters except that high level of the tested driving sequential that benchmark driving sequential and the secondary drive unit 42 that elementary driver element 41 provides provides are all identical; The high level of tested driving sequential equals tested supply voltage voltage of signals, and benchmark IC is with identical by the model of IC.
Adjustable voltage source unit 43 is used to regulate the tested supply voltage voltage of signals that secondary drive unit 42 provides.
Need to prove that adjustable voltage source unit 43 can be:
One or more variable voltage sources in the variable voltage source of forming by DAC and integrated transporting discharging, the variable voltage source of forming by PWM and MOSFET pipe, the variable voltage source formed by adjustable DC/DC and programmable resistance variable voltage source or by adjustable LDO and potentiometer able to programme.
The output signal that more than is provided to variable voltage source equals the tested supply voltage signal that secondary drive unit 42 provides; And the supply voltage that the tested supply voltage signal that secondary drive unit 42 provides is tested IC; That is to say that the output signal of adjustable voltage source unit is exactly the supply voltage of tested IC.
Need to prove; The tested supply voltage voltage of signals of regulating 42 outputs of secondary drive unit can be to heighten or turn down the tested supply voltage voltage of signals of secondary drive unit 42 outputs; As transfer big or turn the digital signal pulse width of DAC in the variable voltage source of forming by DAC and integrated transporting discharging down, the tested supply voltage voltage of signals that secondary drive unit 42 is exported is heightened or is turned down in realization; And for example transfer big or turn the digital signal pulse width of PWM in the variable voltage source of forming by PWM and MOSFET down, realize heightening or the tested supply voltage voltage of signals exported of secondary drive unit 42 just; And for example transfer big or turn resistance down, realize heightening or turning down the tested supply voltage voltage of signals that secondary drive unit 42 is exported by adjustable DC/DC in adjustable DC/DC and the programmable resistance variable voltage source; And for example transfer big or turn the resistance of adjustable LDO in the variable voltage source of forming by adjustable LDO and potentiometer able to programme down, realize heightening or turning down the tested supply voltage voltage of signals that secondary drive unit 42 is exported.
If judged result then writes down the tested supply voltage voltage of signals value of secondary drive unit 42 outputs for not, and with the supply voltage ultimate value of record value as tested IC.
Need to prove that main control unit can be one or more controllers among MCU, DSP or the ARM.
Need to prove; When benchmark IC and tested IC receive drive sequential after, will the echo reply signal, the answer signal that returns can be logic level signal or protocol data; Specifically according to the difference of the IC that detects and difference; IC as detecting is simple integrated circuit, like the logical AND gate integrated circuit, will return a logic level signal when detecting this IC so; Like the IC that detects is complicated IC, like some wireless transceivers, sensor or microcontroller, will return a protocol data when detecting this IC so.Certainly protocol data also can be I2C protocol data or SPI protocol data, will return the SPI protocol data as detecting wireless transceiver, will return the I2C protocol data like detecting sensor.
Need to prove that the driving sequential that benchmark IC and tested IC receive can be the sequential in a plurality of cycles, the answer signal that returns according to the driving sequential of reception of benchmark IC and tested IC also is the answer signal in a plurality of cycles like this.In this case; Main control unit 44; Whether being used for judgment standard IC, to drive answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Continue to carry out judgment standard IC and drive the identical judgement of answer signal whether answer signal that sequential returns returns according to the tested driving sequential that receives with tested IC, drive the answer signal end of transmission (EOT) that answer signal that sequential returns and tested IC return according to the tested driving sequential that receives according to the benchmark that receives, then control the tested supply voltage voltage of signals that adjustable voltage source unit 43 is regulated the output of said secondary drive unit until said benchmark IC according to the benchmark that receives; Control elementary driver element 41 initialization benchmark and drive sequential, and carry out the detection of next round;
If judged result then writes down the tested supply voltage voltage of signals value of secondary drive unit 42 outputs for not, and with the supply voltage ultimate value of record value as tested IC.
Need to prove that this device can also comprise: regulon 45.
Combine to realize that through regulon 45 and secondary drive unit 42 the benchmark driving sequential that tested driving sequential that secondary drive unit 42 provide all the other parameters and elementary driving sequential 41 except that high level provide is identical.
Concrete implementation method can adopt the dual power supply bus transceiver to realize that process is following:
The power port of one side of dual power supply bus transceiver provides benchmark supply voltage signal to be connected with the port that benchmark drives sequential with elementary driver element 41 respectively with the IO port, and the power supply of this side of dual power supply bus transceiver is respectively benchmark supply voltage signal and the benchmark driving sequential that elementary driver element 41 provides with the driving sequential that is connected like this.
The opposite side power port of dual power supply bus transceiver provides the port of tested supply voltage signal to be connected with secondary drive unit 42, equals tested supply voltage voltage of signals with the high level that guarantees tested driving sequential.
The supply voltage that the dual power supply bus transceiver provides with reference to secondary drive unit 42 is regulated the high level that the benchmark that gets access to drives sequential, and the driving sequential after regulating is transferred to secondary drive unit 42; Secondary drive unit 42 as tested driving sequential, so just can realize that tested driving sequential all the other parameters except that high level that secondary drive unit 42 provides are identical with the benchmark driving sequential that elementary driving sequential 41 provides with the driving sequential of dual power supply bus transceiver transmission.
Here said dual power supply bus transceiver can be exported the dual power supply bus transceiver for three-state; That is to say the both sides of dual power supply bus transceiver; No matter be connected with port that elementary driver element 41 provides benchmark supply voltage signal and benchmark to drive sequential can for which side; Opposite side just provides the port of tested supply voltage signal and tested driving sequential to be connected with secondary drive unit 42; Because the side signal transmission after the ternary output dual power supply bus transceiver level conversion as can the signal after the level conversion being transferred to the right side from the left side, also can be transferred to the left side to controlling from the right side.
Need to prove that this device can also comprise: voltage sample unit 46.
The tested supply voltage voltage of signals of in testing process, regulating elementary driver element 41 outputs like this is more purposive, reduces and regulates number of times, and simultaneously, the tested supply voltage voltage of signals of also avoiding providing to tested IC is too high to burn out tested IC.Voltage sample unit 46 can be one or more among the interior ADC of ADC, the ADC in the DSP or the ARM in AD chip, the MCU.
Need to prove that this device can also comprise: display unit 47.
Testing process transparence more like this can in time be known the state of detection.
Need to prove that this device can also comprise: host computer 48.
Generate one and can explain how much tested IC supply voltage maximum value is and lies prostrate, how many minimal values is is lied prostrate, and tested IC safe power supply voltage range is how much to lie prostrate the curve map of how many volts.Can know the safe power supply voltage range of the supply voltage ultimate value of expressing tested IC like this.
Need to prove that this device can also comprise: storage unit 49.
Information of voltage after the tested supply voltage Signal Regulation that secondary drive unit 42 after regulating is provided can be avoided driving the tested supply voltage signal that the secondary drive unit 42 after sequence change is regulated provides because of elementary driver element 41 initialization benchmark like this.
In the present embodiment; Elementary driver element provides benchmark supply voltage signal and benchmark to drive sequential to benchmark IC; The secondary drive unit provides to tested IC and surveys supply voltage signal and tested driving sequential; Parameter all the other parameters except that high level that benchmark drives sequential and tested driving sequential are all identical, and benchmark IC is with identical by the model of IC, and whether the answer signal that main control unit judgment standard IC returns according to the benchmark driving sequential that receives is identical with the answer signal that tested IC returns according to the tested driving sequential of reception; If judged result is for being; Then control the adjustable voltage source unit and regulate the tested supply voltage voltage of signals that the secondary drive unit provides, control elementary driver element initialization benchmark and drive sequential, and carry out the detection of next round; If judged result then writes down the tested supply voltage voltage of signals value of secondary drive unit output for not, and with the supply voltage ultimate value of record value as tested IC.So just can detect the supply voltage ultimate value of IC, reduce the cost that detects IC supply voltage ultimate value, and can realize that robotization detects the supply voltage ultimate value of IC.
Above disclosedly be merely preferred embodiment of the present invention, can not limit the present invention's interest field certainly with this, the equivalent variations of therefore doing according to claim of the present invention still belongs to the scope that the present invention is contained.
Claims (17)
1. a method that detects the supply voltage ultimate value is characterized in that, comprising:
To benchmark IC and tested IC benchmark supply voltage signal and tested supply voltage signal are provided respectively, the model of said benchmark IC and tested IC is identical;
Provide benchmark to drive sequential and tested driving sequential respectively to benchmark IC and tested IC; Parameter all the other parameters except that high level that said benchmark drives sequential and said tested driving sequential are all identical, and the high level of said tested driving sequential equals said tested supply voltage voltage of signals;
Whether judgment standard IC drives answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Then regulate said tested supply voltage voltage of signals; And the initialization benchmark drives sequential, returns and carries out the said step that benchmark supply voltage signal and tested supply voltage signal are provided respectively to benchmark IC and tested IC;
If judged result then writes down said tested supply voltage voltage of signals value for not, and with the supply voltage ultimate value of record value as tested IC.
2. the method for claim 1 is characterized in that, the said tested supply voltage voltage of signals of said adjusting comprises:
Heighten said tested supply voltage voltage of signals;
Or,
Turn down said tested supply voltage voltage of signals.
3. the method for claim 1 is characterized in that, saidly before benchmark IC and tested IC provide benchmark supply voltage signal and tested supply voltage signal, comprises respectively:
Obtain benchmark supply voltage signal;
With benchmark supply voltage voltage of signals information translation is resistance information, and regulates tested supply voltage voltage of signals according to said resistance information, so that benchmark supply voltage signal is identical with tested supply voltage signal before detecting.
4. like each described method among the claim 1-3, it is characterized in that, saidly provide benchmark to drive sequential respectively and tested driving sequential comprises to benchmark IC and tested IC:
Provide benchmark to drive sequential to benchmark IC;
Obtain the benchmark that provides to benchmark IC and drive sequential;
Benchmark that adjusting gets access to drives the high level of sequential, and the driving of the benchmark after will regulating sequential is as tested driving sequential, and the high level of said tested driving sequential equals said tested supply voltage voltage of signals;
To tested IC tested driving sequential is provided.
5. like each described method among the claim 1-3, it is characterized in that said judgment standard IC drives answer signal that whether answer signal that sequential returns return according to the tested driving sequential that receives with tested IC according to the benchmark that receives and comprises after identical:
Show information of voltage and said judged result that tested supply voltage Signal Regulation is preceding;
And/or,
According to information of voltage before the tested supply voltage Signal Regulation and said judged result formation characteristic curve;
And/or,
Store the information of voltage after the tested supply voltage Signal Regulation.
6. like each described method among the claim 1-3, it is characterized in that said answer signal comprises:
Logic level signal or protocol data.
7. like each described method among the claim 1-3; It is characterized in that; Whether said judgment standard IC drives answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being that the step of then regulating said tested supply voltage voltage of signals comprises:
Whether judgment standard IC drives answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Continue to carry out said judgment standard IC and drive the identical judgement of answer signal whether answer signal that sequential returns returns according to the tested driving sequential that receives with tested IC according to the benchmark that receives; Drive the answer signal end of transmission (EOT) that answer signal that sequential returns and tested IC return according to the tested driving sequential that receives until said benchmark IC according to the benchmark that receives, then regulate the step of said tested supply voltage voltage of signals.
8. a device that detects the supply voltage ultimate value is characterized in that, comprising:
Elementary driver element is used for providing benchmark supply voltage signal and benchmark to drive sequential to benchmark IC;
The secondary drive unit; Be used for survey supply voltage signal and tested driving sequential being provided to tested IC; Parameter all the other parameters except that high level that said benchmark drives sequential and said tested driving sequential are all identical; The high level of said tested driving sequential equals said tested supply voltage voltage of signals, and said benchmark IC is identical with said model by IC;
The adjustable voltage source unit is used to regulate the tested supply voltage voltage of signals that said secondary drive unit provides;
Main control unit; Whether being used for judgment standard IC, to drive answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Then control the adjustable voltage source unit and regulate the tested supply voltage voltage of signals that said secondary drive unit provides, control said elementary driver element initialization benchmark and drive sequential, and carry out the detection of next round;
If judged result then writes down the tested supply voltage voltage of signals value that said secondary drive unit provides for not, and with the supply voltage ultimate value of record value as tested IC.
9. device as claimed in claim 8 is characterized in that, said adjustable voltage source unit is used to heighten or turn down the tested supply voltage voltage of signals that said secondary drive unit provides.
10. device as claimed in claim 8 is characterized in that, this device also comprises:
The voltage sample unit is used to obtain the benchmark supply voltage signal that said elementary driver element provides;
The benchmark supply voltage voltage of signals information translation that said main control unit also is used for said voltage sample unit is obtained is a resistance information, and said resistance information is transferred to said adjustable voltage source unit;
Said adjustable voltage source unit also is used for regulating the tested supply voltage voltage of signals that said secondary drive unit provides according to the resistance information of said main control unit transmission, so that the tested supply voltage signal of benchmark supply voltage signal that said elementary driver element is exported before detecting and the output of said secondary drive unit is identical.
11. device as claimed in claim 8 is characterized in that, this device also comprises:
Regulon; The benchmark that being used to obtain said elementary driver element provides drives sequential; The benchmark that adjusting gets access to drives the high level of sequential; Driving sequential after regulating is transferred to said secondary drive unit, and the high level of regulating the rear drive sequential equals said tested supply voltage voltage of signals;
Said secondary drive unit also is used to receive the driving sequential after said regulon is regulated, and the driving sequential after said regulon regulated is as tested driving sequential.
12., it is characterized in that this device also comprises like each described device among the claim 8-11:
Display unit is used to show the result that information of voltage and said main control unit before the tested supply voltage Signal Regulation that said secondary drive unit provides are judged;
And/or,
Host computer, the curve of formation characteristic as a result that information of voltage before the tested supply voltage Signal Regulation that is used for providing according to said secondary drive unit and said main control unit are judged;
And/or,
Storage unit is used to store the information of voltage after the tested supply voltage Signal Regulation that said secondary drive unit provides.
13. device as claimed in claim 12 is characterized in that, if said device comprises display unit, said display unit comprises:
Among LCDs LCD or electronic display LED or the vacuum fluorescent display screen VFD one or more;
If said device comprises storage unit, said storage unit comprises:
Through among flash memory Flash Memory, synchronous DRAM SDRAM or the programmable read only memory EEPROM one or more.
14., it is characterized in that said main control unit comprises: one or more among MCU, DSP or the ARM like each described device among the claim 8-11.
15. device as claimed in claim 14 is characterized in that, said voltage sample unit comprises: one or more among the ADC in AD chip, the said MCU, the ADC in the said DSP or the ADC in the said ARM.
16., it is characterized in that said variable voltage source unit comprises like each described device among the claim 8-11:
In the variable voltage source of forming by DAC and integrated transporting discharging, the variable voltage source of forming by PWM and field-effect transistor MOSFET, the variable voltage source formed by DC/DC and programmable resistance variable voltage source or by LDO and potentiometer able to programme one or more.
17. like each described device among the claim 8-11; Whether it is characterized in that also being used for judgment standard IC by said main control unit, to drive answer signal that sequential returns according to the benchmark that receives identical with the answer signal that tested IC returns according to the tested driving sequential that receives; If judged result is for being; Continue to carry out judgment standard IC and drive the identical judgement of answer signal whether answer signal that sequential returns returns according to the tested driving sequential that receives with tested IC according to the benchmark that receives; Drive the answer signal end of transmission (EOT) that answer signal that sequential returns and tested IC return according to the tested driving sequential that receives until said benchmark IC according to the benchmark that receives; Then control the adjustable voltage source unit and regulate the tested supply voltage voltage of signals that said secondary drive unit provides; Control elementary driver element initialization benchmark and drive sequential, and carry out the detection of next round;
If judged result then writes down the tested supply voltage voltage of signals value that said secondary drive unit provides for not, and with the supply voltage ultimate value of record value as tested IC.
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| CN201110434666.4A CN102565679B (en) | 2011-12-22 | 2011-12-22 | Method and device for detecting limit value of power supply voltage |
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| CN201110434666.4A CN102565679B (en) | 2011-12-22 | 2011-12-22 | Method and device for detecting limit value of power supply voltage |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108492846A (en) * | 2018-02-08 | 2018-09-04 | 中国空间技术研究院 | A kind of PROM evaluation methods and system based on aerospace applications |
| CN112782569A (en) * | 2019-11-11 | 2021-05-11 | 圣邦微电子（北京）股份有限公司 | Threshold value testing device and method for digital chip pin logic level |
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|---|---|---|---|---|
| JP2007159176A (en) * | 2005-11-30 | 2007-06-21 | Hitachi Ltd | Power unit |
| WO2009081522A1 (en) * | 2007-12-21 | 2009-07-02 | Advantest Corporation | Test apparatus and measurement device |
| US20100161264A1 (en) * | 2007-05-28 | 2010-06-24 | Advantest Corporation | Semiconductor test apparatus and test method |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007159176A (en) * | 2005-11-30 | 2007-06-21 | Hitachi Ltd | Power unit |
| US20100161264A1 (en) * | 2007-05-28 | 2010-06-24 | Advantest Corporation | Semiconductor test apparatus and test method |
| WO2009081522A1 (en) * | 2007-12-21 | 2009-07-02 | Advantest Corporation | Test apparatus and measurement device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108492846A (en) * | 2018-02-08 | 2018-09-04 | 中国空间技术研究院 | A kind of PROM evaluation methods and system based on aerospace applications |
| CN108492846B (en) * | 2018-02-08 | 2021-02-09 | 中国空间技术研究院 | PROM evaluation method and system based on aerospace application |
| CN112782569A (en) * | 2019-11-11 | 2021-05-11 | 圣邦微电子（北京）股份有限公司 | Threshold value testing device and method for digital chip pin logic level |
| CN112782569B (en) * | 2019-11-11 | 2023-09-05 | 圣邦微电子（北京）股份有限公司 | Threshold value testing device and method for digital chip pin logic level |
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| CN102565679B (en) | 2015-07-15 |
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