CN102564288A - Method for measuring conductive film on touch screen - Google Patents
Method for measuring conductive film on touch screen Download PDFInfo
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- CN102564288A CN102564288A CN2011104222515A CN201110422251A CN102564288A CN 102564288 A CN102564288 A CN 102564288A CN 2011104222515 A CN2011104222515 A CN 2011104222515A CN 201110422251 A CN201110422251 A CN 201110422251A CN 102564288 A CN102564288 A CN 102564288A
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- resistance value
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Abstract
The invention discloses a method for measuring a conductive film on a touch screen. The method comprises the following steps of: a) presetting a film thickness value corresponding to different surface resistance values; b) acquiring n resistance values on the conductive film by using probes which are arranged in an array mode; c) subtracting the resistance values of the probes in a marginal area; d) selecting the resistance values of at least three adjacent probes from the resistance values of a non-marginal area at random, calculating the surface resistance values formed by the selected resistance values, and selectively calculating other resistance values of the non-marginal area repeatedly by the method to acquire m surface resistance values; e) comparing the m surface resistance values, regarding the thickness of the conductive film as a uniform thickness if differences of all the surface resistance values are in a threshold range, and otherwise, regarding the thickness of the conductive film as a non-uniform thickness if the differences of all the surface resistance values are not in a threshold range; and f) performing optimization calculation on the m surface resistance values to acquire the average surface resistance value, and finding a corresponding film thickness value according to the preset film thickness value in the step a) to finish the thickness measurement of the conductive film. The measurement method is simple and convenient, and is short in time, high in efficiency and low in cost.
Description
Technical field
The present invention relates to touch-screen and make art, refer in particular to the uniformity coefficient of measurement touch-screen upper conductive film in a kind of touch-screen processing procedure and the method for thickness.
Background technology
In the touch-screen processing procedure, behind coated with conductive film on glass,, then have only to the test of touch-screen finished product stage and just carry out the yield test if do not carry out the yield test, in case defective products occurs, then need destroy whole touch screen, very waste.Moreover the measurement of conducting film resistance mainly adopts method of optics to measure film thickness on the market at present, and this equipment cost is higher, and the measurement time is longer.
Summary of the invention
Fundamental purpose of the present invention provides a kind of method of measuring the touch-screen upper conductive film, to solve the problem that the existing cost of aforementioned prior art measuring method is high and the time is long.
For realizing above-mentioned purpose, the present invention adopts following technical scheme:
A kind of method of measuring the touch-screen upper conductive film comprises the steps:
A) the preset pairing film thickness value of different facial resistance value;
B) utilize the probe of arrayed on conducting film, to gather n resistance value, each resistance value is respectively the resistance value between adjacent two probes, forms the resistance value set;
C) abandon fringe region the control pin resistance value;
D) resistance value of optional at least three adjacent probe in the resistance value of non-marginarium calculates the face resistance value that this selected resistance value forms, and repeats other resistance value of aforementioned non-marginarium is selected to calculate according to this method, obtains m face resistance value;
E) more above-mentioned m face resistance value if the difference of each face resistance value in fault value scope, then is regarded as the thickness of conducting film for even, otherwise is inhomogeneous;
F) above-mentioned m face resistance value is optimized calculating, obtains the mean value of face resistance value and, accomplish the measurement of conducting film thickness according to the abovementioned steps preset film thickness value of finding out correspondence a).
Preferably, in abovementioned steps d) in, selected resistance value is the resistance value of foursquare four adjacent probe.
The present invention compared with prior art has tangible advantage and beneficial effect; Particularly; Can be known that by technique scheme it adopts the method for measuring surface resistance value to judge the uniformity coefficient and the thickness of film, this kind measuring method is simple, convenient, the time is short, efficient is high; And, adopt measuring method of the present invention can behind the vitreous coating conducting film, promptly carry out the fraction defective test fully, if defective products occurs, then only need to get final product at flush away conducting film on glass, greatly reduce production cost.
For more clearly setting forth architectural feature of the present invention and effect, come the present invention is elaborated below in conjunction with accompanying drawing and specific embodiment.
Description of drawings
Fig. 1 is the synoptic diagram of arranging of resistance value set among the present invention's the embodiment.
Embodiment
Please with reference to shown in Figure 1, specify the method for measurement touch-screen upper conductive film of the present invention, it comprises the steps:
A) the preset pairing film thickness value of different facial resistance value, for example the pairing film thickness value of face resistance value m1 is h1, the pairing film thickness value of face resistance value m2 is h2 etc.;
B) utilize the probe of arrayed on conducting film, to gather n resistance value; Each resistance value is respectively the resistance value between adjacent two probes, forms resistance value set K, like the resistance value a1 among Fig. 1, a2 ... Resistance value b1, b2 ... ... Resistance value f1, f2
C) abandon fringe region the control pin resistance value, like the resistance value a1 among Fig. 1, a2 ... Deng;
D) resistance value (being the best wherein) of optional at least three adjacent probe in the resistance value of non-marginarium with foursquare four face resistance values; Calculate formed resistance value R of selected resistance value; And repeat all resistance values of aforementioned non-marginarium are selected to calculate according to this method, obtain m face resistance value R1, R2
E) more above-mentioned m face resistance value R1, R2 ...,, otherwise be inhomogeneous if the difference of each face resistance value in fault value scope, then is regarded as the thickness of conducting film for even; Wherein fault value range size can be provided with according to needing;
F) with above-mentioned m face resistance value R1, R2 ... Be optimized calculating, obtain the mean value of face resistance value and, accomplish the measurement of conducting film thickness according to the abovementioned steps preset film thickness value h that finds out correspondence a).
Comprehensive, present invention focuses on to adopt the method for measuring surface resistance value to judge the uniformity coefficient and the thickness of film, its measuring method is simple, convenient, the time is short, efficient is high; And, adopt measuring method of the present invention can behind the vitreous coating conducting film, promptly carry out the fraction defective test fully, if defective products occurs, then only need to get final product at flush away conducting film on glass, greatly reduce production cost.
The above; It only is preferred embodiment of the present invention; Be not that technical scope of the present invention is done any restriction, so every foundation technical spirit of the present invention all still belongs in the scope of technical scheme of the present invention any trickle modification, equivalent variations and modification that above embodiment did.
Claims (2)
1. a method of measuring the touch-screen upper conductive film is characterized in that: comprise the steps:
A) the preset pairing film thickness value of different facial resistance value;
B) utilize the probe of arrayed on conducting film, to gather n resistance value, each resistance value is respectively the resistance value between adjacent two probes, forms the resistance value set;
C) abandon fringe region the control pin resistance value;
D) resistance value of optional at least three adjacent probe in the resistance value of non-marginarium calculates the face resistance value that this selected resistance value forms, and repeats other resistance value of aforementioned non-marginarium is selected to calculate according to this method, obtains m face resistance value;
E) more above-mentioned m face resistance value if the difference of each face resistance value in fault value scope, then is regarded as the thickness of conducting film for even, otherwise is inhomogeneous;
F) above-mentioned m face resistance value is optimized calculating, obtains the mean value of face resistance value and, accomplish the measurement of conducting film thickness according to the abovementioned steps preset film thickness value of finding out correspondence a).
2. the method for measurement touch-screen upper conductive film according to claim 1 is characterized in that: in abovementioned steps d) in, selected resistance value is the resistance value of foursquare four adjacent probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011104222515A CN102564288A (en) | 2011-12-16 | 2011-12-16 | Method for measuring conductive film on touch screen |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011104222515A CN102564288A (en) | 2011-12-16 | 2011-12-16 | Method for measuring conductive film on touch screen |
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| Publication Number | Publication Date |
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| CN102564288A true CN102564288A (en) | 2012-07-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2011104222515A Pending CN102564288A (en) | 2011-12-16 | 2011-12-16 | Method for measuring conductive film on touch screen |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107272947A (en) * | 2017-06-09 | 2017-10-20 | 奇酷互联网络科技（深圳）有限公司 | Determination method, device and the terminal of adhesive film of touch screen thickness |
| CN109540971A (en) * | 2018-12-29 | 2019-03-29 | 宁波石墨烯创新中心有限公司 | Conductive film uniformity detection, system and method |
| CN115214066A (en) * | 2022-09-19 | 2022-10-21 | 四川省众望科希盟科技有限公司 | Automatic control method, system, terminal and medium for thickness of rolled film |
-
2011
- 2011-12-16 CN CN2011104222515A patent/CN102564288A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107272947A (en) * | 2017-06-09 | 2017-10-20 | 奇酷互联网络科技（深圳）有限公司 | Determination method, device and the terminal of adhesive film of touch screen thickness |
| CN107272947B (en) * | 2017-06-09 | 2020-04-17 | 奇酷互联网络科技（深圳）有限公司 | Method and device for determining thickness of touch screen film and terminal |
| CN109540971A (en) * | 2018-12-29 | 2019-03-29 | 宁波石墨烯创新中心有限公司 | Conductive film uniformity detection, system and method |
| CN115214066A (en) * | 2022-09-19 | 2022-10-21 | 四川省众望科希盟科技有限公司 | Automatic control method, system, terminal and medium for thickness of rolled film |
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Application publication date: 20120711 |