CN102523041B - Off-line and on-line test integrated multi-wavelength optical path component - Google Patents
Off-line and on-line test integrated multi-wavelength optical path component Download PDFInfo
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- CN102523041B CN102523041B CN201110456019.3A CN201110456019A CN102523041B CN 102523041 B CN102523041 B CN 102523041B CN 201110456019 A CN201110456019 A CN 201110456019A CN 102523041 B CN102523041 B CN 102523041B
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Abstract
The invention provides an off-line and on-line test integrated multi-wavelength optical path component, which is characterized in that optical detection signals of off-line test wavelength or on-line test wavelength are coupled to an input end A of a 2x2 optical directional coupler through 3x1 WDM (wavelength division multiplex), a branch C and a branch D of the directional coupler are respectively connected with In1 end of a 1x2 optical switch and one end of a band-pass filter of 1625nm (or 1650nm) wave band, the band-pass filter can only allow optical signals with awavelength ranging from 1600nm to 1670nm to pass, the other end of the band-pass filter is connected with a In2 end of the 1x2 optical switch, and an output end of the optical switch is connected with an optical fiber output port of an instrument.
Description
Technical field
The present invention relates to fiber optic communication field, particularly relate to the multi-wavelength optical path component of a kind of integrated off-line and on-line testing.
Background technology
In fiber optic communication systems, optical time domain reflectometer (OTDR) is optical fiber telecommunications system requisite tester in optical fiber cable line construction, maintenance and repairing.In optical time domain reflectometer, the detectable signal usually adopting light path as shown in Figure 1 to be sent by lasing light emitter is injected into tested optical fiber.Wherein, 1310nm wave band and the LASER Light Source of 1550nm wave band needed for test, WDM is wavelength division multiplexer, LASER Light Source is injected into tested optical fiber through WDM, optical directional coupler, the light signal returned in optical fiber is injected into photo-detector through optical directional coupler again, carries out subsequent treatment again after light signal is converted to the signal of telecommunication.Because the test wavelength of optical time domain reflectometer is consistent with the emission wavelength of optical transmitter and receiver in lightguide cable link, for avoiding producing conflict, traditional optical time domain reflectometer can only aptitude test under optical transmitter and receiver off-line state.
But along with the rise of FTTx networking, PON develop rapidly, this just requires optical time domain reflectometer except having off-line test wavelength (as 1310nm wave band and 1550nm wave band), also to have the on-line testing ability adopting 1625nm wave band or 1650nm wave band, namely tested optical fiber is having the on-line testing function that can start optical time domain reflectometer in Communication ray situation, now, traditional light path cannot meet new test request, if reason is the on-line testing that will realize 1625nm wave band or 1650nm wave band on the one hand, filter must be accessed in light path, so that the light signal of the non-1625nm wave band returned in optical fiber or non-1650nm wave band (the 1310nm wave band launched as optical transmitter and receiver or 1550nm wave band optical signal) all filterings, in order to avoid cause interference to the test of optical time domain reflectometer, but the light path after access filter then cannot realize the off-line test function of 1310nm wave band and 1550nm wave band, common solution is that employing two is overlapped independently light path and circuit and realized (as shown in Figure 2), but this method can cause the significantly increase of instrument cost.
In prior art, realize off-line test and on-line testing function, need two to overlap independently light path and circuit, and pass through two independently optical interface access tested optical fiber, cost is high and test is inconvenient; And the present invention adopts integrated light path design technology, and just can realize off-line and on-line testing function by single light.
Summary of the invention
In the prior art of OTDR, realize off-line test and on-line testing function, need two to overlap independently light path and circuit, and pass through two independently optical interface access tested optical fiber, cost is high and test is inconvenient.The invention solves the integrated design technology of the light path of off-line test and on-line testing in optical time domain reflectometer product, and realize the connection with tested optical fiber by single optical interface.
The object of the invention is to the defect overcoming above-mentioned technical problem, propose the multi-wavelength optical path component of a kind of integrated off-line and on-line testing, it is characterized in that:
The light detecting signal of off-line test wavelength or on-line testing wavelength is coupled to the A input of 2x2 optical directional coupler through the WDM of 3x1; The C branch of directional coupler and D branch are connected respectively to the In1 end of 1x2 optical switch and one end of 1625nm wave band or 1650nm wave band band pass filter; Band pass filter can only allow the light signal in 1600-1670nm wave-length coverage pass through, and the other end of band pass filter is connected to the In2 end of 1x2 optical switch, the fiber-optic output mouth of the instrument that the output out of optical switch is then connected to.
According to a preferred embodiment of the invention, wherein when needs carry out off-line wavelength measurement, In1 port is selected by controlling optical switch, the In1 port of the 1310nm wave band then returned in tested optical fiber or the optical signals optical switch of 1550nm wave band, the C branch of 2x2 optical directional coupler, to be exported by B branch and to be injected into photo-detector, realizing traditional off-line wavelength measurement function.
According to a preferred embodiment of the invention, wherein when the online wavelength measurement of needs, the same optical switch that only need control selects In2 port, the D branch of the In2 port of the 1625nm wave band then returned in tested optical fiber or the optical signals optical switch of 1650nm wave band, band pass filter, 2x2 optical directional coupler, exported by B branch and be injected into photo-detector again, realize the online wavelength measurement function of 1625nm wave band or 1650nm wave band.
According to a preferred embodiment of the invention, wherein said off-line test wavelength is 1310nm wave band and 1550nm wave band.
According to a preferred embodiment of the invention, wherein said on-line testing wavelength is as 1625nm wave band or 1650nm wave band.
According to still another embodiment of the invention, the multi-wavelength optical path component of a kind of integrated off-line and on-line testing is also provided, it is characterized in that:
Adopt 2 × 2 wavelength division multiplex devices, optical band pass filter and 1 × 2 optical switch that off-line test wavelength and on-line testing wavelength are integrated in an integrated light path; Integrated light path adopts single optical interface to realize being connected with tested optical fiber.
Although the present invention will be described in conjunction with some exemplary enforcements and using method hereinafter, it will be appreciated by those skilled in the art that and be not intended to the present invention to be limited to these embodiments.Otherwise, be intended to cover all substitutes be included in spirit of the present invention and scope that appending claims defines, correction and equivalent.
Other advantages of the present invention, target and feature will be set forth to a certain extent in the following description, and to a certain extent, based on will be apparent to those skilled in the art to investigating hereafter, or can be instructed from the practice of the present invention.Target of the present invention and other advantages can by specifications below, claims, and in accompanying drawing, specifically noted structure realizes and obtains.
Accompanying drawing explanation
Fig. 1 is traditional inner light path block diagram of optical time domain reflectometer, is made up of, owing to not having 1625nm LASER Light Source, cannot realizes on-line testing 1310nm, 1550nm two kinds of LASER Light Source, DWM wavelength division multiplexer, an optical coupler and a photodetector;
Fig. 2 shows and usually adopts two cover independent optical paths and circuit realiration on-line testing and off-line test function;
Fig. 3 shows the integrated monochromatic light interface light path principle block diagram of integrated off-line test wavelength of the present invention and on-line testing wavelength.
Embodiment
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in further detail.It should be noted that according to the execution mode of logic menu resource intelligent configuration method of the present invention as just example, but the invention is not restricted to this embodiment.
Next, the specific embodiment of the present invention is described in detail with reference to the accompanying drawings.
Fig. 3 shows the integrated monochromatic light interface light path principle block diagram of integrated off-line test wavelength of the present invention and on-line testing wavelength.Present invention employs the technology that 2x2 optical directional coupler is combined with 1x2 optical switch, both can realize the test of traditional off-line wavelength at single optical fiber access port, 1625nm wave band or the online wavelength measurement function of 1650nm wave band can be realized again.
As shown in Figure 3, the light detecting signal of off-line test wavelength (as 1310nm wave band and 1550nm wave band) or on-line testing wavelength (as 1625nm wave band or 1650nm wave band) is coupled to the A input of 2x2 optical directional coupler through the WDM of 3x1, the C branch of directional coupler and D branch are connected respectively to the In1 end of 1x2 optical switch and one end of 1625nm wave band (or 1650nm wave band) band pass filter, band pass filter can only allow the light signal of 1600-1670nm pass through, the other end of band pass filter is connected to the In2 end of 1x2 optical switch, the fiber-optic output mouth of the instrument that the output out of optical switch is then connected to.When needs carry out off-line wavelength measurement, In1 port is selected by controlling optical switch, the In1 port of the 1310nm wave band then returned in tested optical fiber or the optical signals optical switch of 1550nm band wavelength, the C branch of 2x2 optical directional coupler, to be exported by B branch and to be injected into photo-detector, realizing traditional off-line wavelength measurement function; When the online wavelength measurement of needs, the same optical switch that only need control selects In2 port, the D branch of the In2 port of the 1625nm wave band then returned in tested optical fiber or the optical signals optical switch of 1650nm band wavelength, band pass filter, 2x2 optical directional coupler, exported by B branch and be injected into photo-detector again, realize the online wavelength measurement function of 1625nm wave band or 1650nm band wavelength.
Beneficial effect of the present invention is as follows:
(1) by employing 2 × 2 wavelength division multiplex device, optical band pass filter and 1 × 2 optical switch, off-line test wavelength and on-line testing wavelength are integrated in an integrated light path;
(2) integrated light path adopts single optical interface to realize being connected with tested optical fiber.
(1) integrated optics design of integration reduces complete machine cost;
(2) single optical interface is user-friendly to, and for performing different test functions, tested optical fiber need not be changed to different optical interfaces again.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, obviously, those skilled in the art can carry out various change and modification to the present invention and not depart from the spirit and scope of the present invention.Like this, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention is also intended to comprise these change and modification.
Claims (3)
1. a multi-wavelength optical path component for integrated off-line and on-line testing, is characterized in that:
The light detecting signal of off-line test wavelength or on-line testing wavelength is coupled to the A input of 2x2 optical directional coupler through the WDM of 3x1;
The C branch of directional coupler and D branch are connected respectively to the In1 end of 1x2 optical switch and one end of 1625nm wave band or 1650nm wave band band pass filter;
Band pass filter can only allow the light signal in 1600-1670nm wave-length coverage pass through, and the other end of band pass filter is connected to the In2 end of 1x2 optical switch, the fiber-optic output mouth of the instrument that the output out of optical switch is then connected to;
When needs carry out off-line wavelength measurement, In1 port is selected by controlling optical switch, the In1 port of the 1310nm wave band then returned in tested optical fiber or the optical signals optical switch of 1550nm wave band, the C branch of 2x2 optical directional coupler, to be exported by B branch and to be injected into photo-detector, realizing traditional off-line wavelength measurement function;
When the online wavelength measurement of needs, the same optical switch that only need control selects In2 port, the D branch of the In2 port of the 1625nm wave band then returned in tested optical fiber or the optical signals optical switch of 1650nm wave band, band pass filter, 2x2 optical directional coupler, exported by B branch and be injected into photo-detector again, realize the online wavelength measurement function of 1625nm wave band or 1650nm wave band.
2. the multi-wavelength optical path component of integrated off-line according to claim 1 and on-line testing, wherein: described off-line test wavelength is 1310nm wave band and 1550nm wave band.
3. the multi-wavelength optical path component of integrated off-line according to claim 1 and on-line testing, wherein: described on-line testing wavelength is as 1625nm wave band or 1650nm wave band.
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| CN109634834B (en) * | 2017-10-09 | 2021-10-26 | 展讯通信（上海）有限公司 | Method and device for verifying exclusive access in synchronous multithreading system |
| CN113285756B (en) * | 2021-07-22 | 2021-10-22 | 西安奇芯光电科技有限公司 | PLC chip, single-fiber bidirectional optical assembly, optical module and working method |
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Address after: No. 726 Changzheng Road, Bengbu, Anhui Province Patentee after: The 41st Institute of CETC Address before: 266000 Qingdao economic and Technological Development Zone, Shandong Xiangjiang Road, No. 98 Patentee before: The 41st Institute of CETC |
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Effective date of registration: 20190307 Address after: 266000 No. 98 Xiangjiang Road, Huangdao District, Qingdao City, Shandong Province Patentee after: China Electronics Technology Instrument and Meter Co., Ltd. Address before: No. 726 Changzheng Road, Bengbu, Anhui Province Patentee before: The 41st Institute of CETC |
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Address after: Huangdao Xiangjiang Road 266555 Shandong city of Qingdao Province, No. 98 Patentee after: CLP kesiyi Technology Co.,Ltd. Address before: 266000 No. 98 Xiangjiang Road, Huangdao District, Shandong, Qingdao Patentee before: CHINA ELECTRONIC TECHNOLOGY INSTRUMENTS Co.,Ltd. |