CN102522060B - Power supply method and power supply circuit for scan chip - Google Patents
Power supply method and power supply circuit for scan chip Download PDFInfo
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- CN102522060B CN102522060B CN201110455672.8A CN201110455672A CN102522060B CN 102522060 B CN102522060 B CN 102522060B CN 201110455672 A CN201110455672 A CN 201110455672A CN 102522060 B CN102522060 B CN 102522060B
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Abstract
The invention discloses a power supply method and a power supply circuit for a scan chip. The power supply method comprises the following steps: whether the scan chip is in the scan period or not is judged according to the drive wave shape of the drive circuit of the scan chip, if not, the voltage of a first predetermined threshold value is provided for the scan chip and is lower than the working voltage of the scan chip. According the invention, the problem that the scan chip still causes power consumption during the non scan period of the plasma display drive is solved, thereby reducing the power consumption and achieving the purpose of reducing unnecessary power loss.
Description
Technical field
The present invention relates to appliance field, in particular to a kind of method of supplying power to and feed circuit that scan chip.
Background technology
In the driving of the plasma display of present stage, in scan period, generally by adding positive voltage at addressing electrode, scan electrode adds negative pressure and carries out address discharge.In the meantime, maintaining electrode adds malleation a part of negative charge of address discharge is attracted to maintain on the medium of electrode surface, what add due to scan electrode is negative voltage, and what therefore on scan electrode medium, accumulate is positive charge, and this just discharges and get ready for maintenance phase.As shown in Figure 1, aspect scanning chip power supply, in non-scan period, the ground end that terminates to scanning chip by the ground of the power supply (Vsc_i) that is 95V by an output voltage, the output terminal of power supply is received the power input (VH) of scanning chip (Scan Chip) scanning chip is powered; In scan period, by the ground of the power supply of 95V is terminated to respect to ground-55V power supply (Vy) is upper, thereby form the operating voltage of scanning chip.
In the method for supplying power to of the scanning chip of present stage, in non-scan period, the power supply of scanning chip is the float power of 95V left and right, that is to say, at non-scan period scanning chip, be also work, the power consumption that this has just increased plasma display, has caused unnecessary loss.
For above-mentioned problem, effective solution is not yet proposed at present.
Summary of the invention
The invention provides a kind of method of supplying power to and feed circuit that scan chip, at least to solve in prior art, because scanning chip also carries out work in the non-scan period, cause plasma display to produce the problem of unnecessary power attenuation.
According to an aspect of the present invention, provide a kind of method of supplying power to that scans chip, the method comprises: according to the drive waveforms judgement of the driving circuit of scanning chip, whether scan chip in the scan period; When judging scanning chip in the non-scan period, the voltage of the first predetermined threshold is provided for scanning chip, wherein, the voltage of the first predetermined threshold is lower than the operating voltage of scanning chip.
Preferably, according to the drive waveforms judgement scanning chip of the driving circuit of scanning chip whether after the scan period, the method of supplying power to of this scanning chip also comprises: when judging scanning chip in the scan period, the voltage of the second predetermined threshold is provided for scanning chip, wherein, the voltage of the second predetermined threshold is equal to or greater than the operating voltage of scanning chip.
Preferably, for scanning chip provides the step of the voltage of the first predetermined threshold to comprise: disconnect the switch being connected with the high voltage supply end of scanning chip according to control signal, make high voltage supply end be high-impedance state; Or make the diode cut-off being connected with the high voltage supply end that scans chip, so that high voltage supply end is high-impedance state.
According to a further aspect in the invention, a kind of feed circuit that scan chip are provided, comprise: driving circuit, the output terminal of driving circuit is connected with the ground end of scanning chip, power supply, the negative pole of power supply is connected or is connected with the output terminal of driving circuit with ground, the positive pole of power supply is connected with the high voltage supply end of scanning chip by control device, wherein, control device is for when scanning chip in the non-scan period, by the Control of Voltage between the high voltage supply end of scanning chip and ground end, be the voltage of the first predetermined threshold, wherein, the voltage of the first predetermined threshold is lower than the operating voltage of scanning chip.
Preferably, when judging scanning chip in the scan period, control device is also the voltage of the second predetermined threshold for the Control of Voltage between the high voltage supply end of scanning chip and ground are held, wherein, the voltage of the second predetermined threshold is equal to or greater than the operating voltage of scanning chip, the ground end of scanning chip is connected with the negative pole of controlling power supply by the switch in scan period closure, controls the plus earth of power supply.
Preferably, the switch of control assembly for being controlled by control signal, wherein, one end of switch is connected with the positive pole of power supply by resistance, and is connected with the ground end of scanning chip by capacitor, and the other end of switch is connected with the high voltage supply end of scanning chip.
Preferably, control assembly is diode, and wherein, the positive pole of diode is connected with the positive pole of power supply by resistance, and the negative pole of diode is connected with the high voltage supply end of scanning chip, and is connected with the ground end of scanning chip by capacitor.
Preferably, the first predetermined threshold is 40V.
Preferably, the second predetermined threshold is 95V.
In the present invention, by scanning chip is controlled at the voltage of non-scan period, making to scan chip did not work in the non-scan period, thereby just can not produce power consumption in the non-scan period yet, solved the non-scan period driving at plasma display, scanning chip also can produce the problem of power consumption, has reduced plasma display and has driven the power consumption in non-scan period, has reached the object that reduces unnecessary power attenuation.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide a further understanding of the present invention, forms the application's a part, and schematic description and description of the present invention is used for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is according to the circuit diagram of the feed circuit of the scanning chip of correlation technique;
Fig. 2 is according to a kind of preferred flow charts of the method for supplying power to of the scanning chip of the embodiment of the present invention;
Fig. 3 is a kind of preferred circuit figure according to the feed circuit of the scanning chip of the embodiment of the present invention;
Fig. 4 is the another kind of preferred circuit figure according to the feed circuit of the scanning chip of the embodiment of the present invention.
Embodiment
Hereinafter with reference to accompanying drawing, also describe the present invention in detail in conjunction with the embodiments.It should be noted that, in the situation that not conflicting, embodiment and the feature in embodiment in the application can combine mutually.
Embodiment 1
As shown in Figure 2, the invention provides a kind of method of supplying power to of preferred scanning chip, the method comprises:
S202: whether scan chip in the scan period according to the drive waveforms judgement of the driving circuit of scanning chip;
S204: when judging scanning chip in the non-scan period, provide the voltage of the first predetermined threshold for scanning chip, wherein, the voltage of the first predetermined threshold is lower than the operating voltage of scanning chip.
In above preferred embodiment, by scanning chip is controlled at the voltage of non-scan period, making to scan chip did not work in the non-scan period, thereby just can not produce power consumption in the non-scan period yet, solved the non-scan period driving at plasma display, scanning chip also can produce the problem of power consumption, has reduced plasma display and has driven the power consumption in non-scan period, has reached the object that reduces unnecessary power attenuation.
Also to scanning chip, the power supply in the scan period time improves in the present invention, to be reached for the scanning of scanning chip, provides rational voltage.To achieve these goals, concrete, on the basis of each preferred embodiment of the present invention, when judging scanning chip in the scan period, the voltage of the second predetermined threshold is provided for scanning chip, and wherein, the voltage of the second predetermined threshold is equal to or greater than the operating voltage of scanning chip.In above-mentioned preferred implementation, the voltage of the operating voltage that is equal to or greater than scanning chip is provided for scanning chip the scan period at scanning chip, thereby has guaranteed the normal work of scanning chip.
The non-scan period of scanning chip in order to be reached for provides the voltage lower than the operating voltage of scanning chip, the invention provides two kinds of preferred implementations, comprising:
1) according to control signal, disconnect the switch being connected with the high voltage supply end of scanning chip, make high voltage supply end be high-impedance state.
For example, can adopt feed circuit as shown in Figure 3, the negative pole of the power supply of 95V (Vsc_i) is connected with the output terminal of driving circuit, the positive pole of power supply is connected with the high voltage supply end (VH) of scanning chip by switch (S2), the other end of switch (S2) is connected with the ground end (GND) of scanning chip by capacitor, the positive pole of the control power supply (Vy) of 55V is connected with ground, and negative pole is connected with the ground end of scanning chip by switch (S1).By increasing a gauge tap (S2) on the high voltage supply circuit at scanning chip, in the non-scan period of scanning chip, this gauge tap disconnects, in the scan period of scanning chip, switch S 1, S2 closure, so just by move to-55V of the voltage of Vyg this point, and power input (VH) voltage of scanning chip is 40V left and right, thereby scanning chip is normally worked, and on the electrode scanning, produces scanning impulse.
2) the diode cut-off that makes to be connected with the high voltage supply end that scans chip, so that high voltage supply end is high-impedance state.
For example, can adopt feed circuit as shown in Figure 4, the output terminal of driving circuit is connected with the ground end of scanning chip, the positive pole of diode (D) is connected by the positive pole of the power supply of a resistance (R) and 40V, the negative pole of diode is connected with the high voltage supply end (VH) of scanning chip, the positive pole of the control power supply (Vy) of 55V is connected with ground, and negative pole is connected with the ground end of scanning chip by switch (S1).Utilize the unilateal conduction effect of diode (D); when the drive waveforms of the output of driving circuit shows to scan chip in the non-scan period; when the voltage zero-cross on Vyg point rises; diode cut-off; because scanning chip power supply voltage difference is lower than 40V; scanning chip quits work, and the voltage on Vyg is through the output protection diode output of overscanning chip.In the scan period of scanning chip, switch S 1 closure, when the voltage zero-cross on Vyg point declines, diode D conducting, the power supply (Vsc_i) of scanning chip is 40V like this, and ground (Vy) is-55V, and the voltage difference at scanning chip two ends is 95V, scanning chip is normally worked, thereby produces scanning impulse on the electrode scanning.
By the different times in plasma display drive waveforms, different supply voltages is provided to scanning chip, making to scan chip did not work in non-sweep time, by the forward conduction effect of scanning chip output protection diode, scanning chip ground terminal voltage is outputed on the scan electrode of plasma display; And in scan period, unilateal conduction effect due to diode, by being stored in 40V voltage on electrochemical capacitor, be added to respectively power end and the ground end of scanning chip with-55V power supply, like this, scanning chip is normally worked, one of the electrode output scanning with respect to ground-55V voltage, and the electrode not scanning output with respect to ground+40V voltage.
In above-mentioned preferred implementation, by increasing diode or gauge tap, make the high voltage supply end that scans chip present high-impedance state in the non-scan period, thereby for scanning chip provides the voltage lower than the operating voltage of scanning chip, by the forward conduction effect of scanning chip output protection diode, scanning chip ground terminal voltage is outputed on the scan electrode of plasma display; And in scan period, due to the unilateal conduction effect of diode, by power supply be added to respectively power end and the ground end of scanning chip with respect to the negative supply power source on ground, make to scan chip and normally work.Reached and under the prerequisite of the normal work of scanning chip, reduced the object of plasma display power consumption, and in circuit, increase gauge tap guaranteeing, diode etc., method is simple, be easy to realize.
It should be noted that the magnitudes of voltage such as above-mentioned 40V, 55V, 95V just for a better understanding of the present invention, do not form the present invention is limited improperly.
Embodiment 2
The present invention also provides a kind of feed circuit of preferred scanning chip, to realize in above-described embodiment, relates to the power supply of scanning chip is controlled.The feed circuit of this scanning chip comprise: driving circuit, the output terminal of driving circuit is connected with the ground end of scanning chip, power supply, the negative pole of power supply is connected or is connected with the output terminal of driving circuit with ground, the positive pole of power supply is connected with the high voltage supply end of scanning chip by control device, wherein, control device is for when scanning chip in the non-scan period, by the Control of Voltage between the high voltage supply end of scanning chip and ground end, be the voltage of the first predetermined threshold, wherein, the voltage of the first predetermined threshold is lower than the operating voltage of scanning chip.
In above-mentioned preferred implementation, by scanning chip is controlled at the voltage of non-scan period, making to scan chip did not work in the non-scan period, thereby just can not produce power consumption in the non-scan period yet, solved the non-scan period driving at plasma display, scanning chip also can produce the problem of power consumption, has reduced plasma display and has driven the power consumption in non-scan period, has reached the object that reduces unnecessary power attenuation.
Also to scanning chip, the feed circuit in the scan period time improve in the present invention, so that this circuit can provide rational voltage for the scanning of scanning chip.To achieve these goals, concrete, on the basis of each preferred embodiment of the present invention, when judging scanning chip in the scan period, control device is also for being the voltage of the second predetermined threshold by the Control of Voltage between the high voltage supply end of scanning chip and ground end, and wherein, the voltage of the second predetermined threshold is equal to or greater than the operating voltage of scanning chip, the ground end of scanning chip is connected with the negative pole of controlling power supply by the switch in scan period closure, controls the plus earth of power supply.In above-mentioned preferred implementation, the voltage of the operating voltage that is equal to or greater than scanning chip is provided for scanning chip the scan period at scanning chip, thereby has guaranteed the normal work of scanning chip.
In a preferred embodiment of the invention, the switch of control assembly for being controlled by control signal, as shown in Figure 3, wherein, one end of switch (S2) is connected with the positive pole of power supply (Vsc_i) by resistance, and be connected with the ground end (GND) of scanning chip by capacitor (C), the other end of switch (S2) is connected with the high voltage supply end (VH) of scanning chip.In above-mentioned preferred implementation, one end by the switch controlled by control signal is connected with the high voltage supply end of scanning chip, and then can be in the adjustment to scanning chip power supply by the control realization to switch of the different scanning cycle of scanning chip, preferably, the non-scan period at scanning chip can not work so that scan chip by cut-off switch, reduced the power attenuation of non-scan period, simultaneously the method little, simple in structure to the change of circuit own, be easy to realize.
The present invention also provides the feed circuit of another type, to realize the control to scanning chip power supply, in a preferred embodiment of the invention, control assembly can be diode, as shown in Figure 4, wherein, the positive pole of diode (D) is connected with the positive pole of the power supply (Vsc_i) of scanning chip by resistance (R), the negative pole of diode (D) is connected with the high voltage supply end (VH) of scanning chip, and is connected with the ground end (GND) of scanning chip by capacitor (C).In above-mentioned preferred implementation, by the forward conduction effect of scanning chip output protection diode, scanning chip ground terminal voltage is outputed on the scan electrode of plasma display; And in scan period, unilateal conduction effect due to diode, by power supply be added to respectively power end and the ground end of scanning chip with respect to the negative supply power source on ground, make to scan chip and normally work, thereby realized the reasonable control to the non-scan period power supply of scanning chip.
Based on preferred embodiment above-mentioned, the first predetermined threshold is 40V, and the second predetermined threshold is 95V.Because when the supply voltage of scanning chip is during lower than 40V, scanning chip will quit work, thereby the first predetermined threshold is controlled to 40V and just can guarantees that scanning chip did not work in the non-scan period below, simultaneously also for scanning chip provides the operating voltage of 95V in the scan period, reached and guaranteed that, under the prerequisite of the normal work of scanning chip, minimizing plasma display drives the object in the power consumption of non-scan period.
As can be seen from the above description, the present invention has realized following technique effect:
The present invention is by suitably adjusting scanning chip power method of supplying power to, and the non-scanner driving at plasma display allows scanning chip not work; And in scan period, to plasma display scanning chip, provide suitable operating voltage, can save the power consumption of the non-scan period driving at plasma display, thereby reduce the power consumption of plasma display.
Obviously, those skilled in the art should be understood that, above-mentioned each module of the present invention or each step can realize with general calculation element, they can concentrate on single calculation element, or be distributed on the network that a plurality of calculation elements form, alternatively, they can be realized with the executable program code of calculation element, thereby, they can be stored in memory storage and be carried out by calculation element, and in some cases, can carry out shown or described step with the order being different from herein, or they are made into respectively to each integrated circuit modules, or a plurality of modules in them or step are made into single integrated circuit module to be realized.Like this, the present invention is not restricted to any specific hardware and software combination.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (8)
1. a method of supplying power to that scans chip, is characterized in that, comprising:
According to the drive waveforms of the driving circuit of scanning chip, judge that whether described scanning chip is in the scan period;
When judging scanning chip during in the non-scan period, for described scanning chip provides the voltage of the first predetermined threshold, wherein, the voltage of described the first predetermined threshold is lower than the operating voltage of described scanning chip;
Wherein, describedly for providing the step of the voltage of the first predetermined threshold, described scanning chip comprises: according to control signal, disconnect the switch being connected with the high voltage supply end of described scanning chip, make described high voltage supply end be high-impedance state; Or make the diode cut-off being connected with the high voltage supply end of described scanning chip, so that described high voltage supply end is high-impedance state.
2. method according to claim 1, is characterized in that, is judging that described scanning chip whether after the scan period, also comprises according to the drive waveforms of driving circuit of scanning chip:
When judging described scanning chip in the scan period, for described scanning chip provides the voltage of the second predetermined threshold, wherein, the voltage of described the second predetermined threshold is equal to or greater than the operating voltage of described scanning chip.
3. feed circuit that scan chip, is characterized in that, comprising:
Driving circuit, the output terminal of described driving circuit is connected with the ground end of scanning chip,
Power supply, the negative pole of described power supply is connected or is connected with the output terminal of described driving circuit with ground, the positive pole of described power supply is connected with the high voltage supply end of described scanning chip by control device, wherein, described control device is at described scanning chip during in the non-scan period, by the Control of Voltage between the described high voltage supply end of described scanning chip and described end, be the voltage of the first predetermined threshold, wherein, the voltage of described the first predetermined threshold is lower than the operating voltage of described scanning chip.
4. feed circuit according to claim 3, it is characterized in that, when judging described scanning chip in the scan period, described control device is also for being the voltage of the second predetermined threshold by the Control of Voltage between the described high voltage supply end of described scanning chip and described end, wherein, the voltage of described the second predetermined threshold is equal to or greater than the operating voltage of described scanning chip, holding by the switch in described scan period closure of described scanning chip is connected with the negative pole of controlling power supply describedly, the plus earth of described control power supply.
5. according to the feed circuit described in claim 3 or 4, it is characterized in that, the switch of described control device for being controlled by control signal, wherein, one end of described switch is connected with the positive pole of described power supply by resistance, and be connected by described the end of capacitor and described scanning chip, the other end of described switch is connected with the described high voltage supply end of described scanning chip.
6. according to the feed circuit described in claim 3 or 4, it is characterized in that, described control device is diode, wherein, the positive pole of described diode is connected with the positive pole of described power supply by resistance, the negative pole of described diode is connected with the described high voltage supply end of described scanning chip, and is connected by described the end of capacitor and described scanning chip.
7. feed circuit according to claim 3, is characterized in that, described the first predetermined threshold is 40V.
8. feed circuit according to claim 4, is characterized in that, described the second predetermined threshold is 95V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201110455672.8A CN102522060B (en) | 2011-12-30 | 2011-12-30 | Power supply method and power supply circuit for scan chip |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201110455672.8A CN102522060B (en) | 2011-12-30 | 2011-12-30 | Power supply method and power supply circuit for scan chip |
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| CN102522060A CN102522060A (en) | 2012-06-27 |
| CN102522060B true CN102522060B (en) | 2014-03-26 |
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| CN114062905B (en) * | 2022-01-17 | 2022-05-17 | 绍兴中芯集成电路制造股份有限公司 | Chip abrupt voltage testing method and device and storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005134640A (en) * | 2003-10-30 | 2005-05-26 | Seiko Epson Corp | Optoelectronic device, driving method for optoelectronic device, and electronic equipment |
| CN1928969A (en) * | 2005-09-09 | 2007-03-14 | 富士通日立等离子显示器股份有限公司 | Plasma display device and method of driving the same |
| CN101583988A (en) * | 2007-10-05 | 2009-11-18 | Lg电子株式会社 | Plasma display device |
| CN101996572A (en) * | 2009-08-18 | 2011-03-30 | 三星Sdi株式会社 | Plasma display device and method of driving the same |
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- 2011-12-30 CN CN201110455672.8A patent/CN102522060B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005134640A (en) * | 2003-10-30 | 2005-05-26 | Seiko Epson Corp | Optoelectronic device, driving method for optoelectronic device, and electronic equipment |
| JP4747488B2 (en) * | 2003-10-30 | 2011-08-17 | セイコーエプソン株式会社 | Electro-optical device, driving method of electro-optical device, and electronic apparatus |
| CN1928969A (en) * | 2005-09-09 | 2007-03-14 | 富士通日立等离子显示器股份有限公司 | Plasma display device and method of driving the same |
| CN101583988A (en) * | 2007-10-05 | 2009-11-18 | Lg电子株式会社 | Plasma display device |
| CN101996572A (en) * | 2009-08-18 | 2011-03-30 | 三星Sdi株式会社 | Plasma display device and method of driving the same |
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Granted publication date: 20140326 Termination date: 20161230 |