CN102494708B - Method and device for verifying low-temperature test capacity of electric and electronic product - Google Patents
Method and device for verifying low-temperature test capacity of electric and electronic product Download PDFInfo
- Publication number
- CN102494708B CN102494708B CN201110331154.5A CN201110331154A CN102494708B CN 102494708 B CN102494708 B CN 102494708B CN 201110331154 A CN201110331154 A CN 201110331154A CN 102494708 B CN102494708 B CN 102494708B
- Authority
- CN
- China
- Prior art keywords
- temperature
- verified
- low
- value
- input end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention discloses a method and a device for verifying low-temperature test capacity of an electric and electronic product, which comprises the following steps of: (1), pre-setting an action temperature point of a temperature detection device, requiring that the temperature change rate of a temperature sensing medium of the temperature detection device is less than or equal to 1 DEG C per min, putting a temperature sensing device of the temperature detection device in the interior of a device to be verified, and opening and cooling the device to be verified; (2), when the temperature detection device detects that the interior temperature of the device to be verified is decreased to the pre-set action temperature point, recording an interior temperature value of the device to be verified at this time, namely recording a temperature value of the device to be verified; and (3), calculating a Z value of the temperature of the device to be verified, Z=(temperature value of the device to be verified-median)/standard IQR value, and when |z|<=2, judging that the low-temperature test capacity of the device to be verified is qualified. The invention provides the method for verifying the low-temperature test capacity, which is capable of making a breakthrough in a technology for verifying the low-temperature test capacity, enriching a quality control method of a laboratory and increasing the capacity and the level of the laboratory.
Description
Technical field
The present invention relates to test capability verification technique field, be specifically related to method and the device thereof of low-temperature test proficiency testing.
Background technology
Environmental test is the research class fail-test of environment for use to material and product function and performance impact around.Temperature is as one of three large basic environmental factors, the use that affects product at all times.Research shows, 40% product field failure is relevant with temperature.
Electric and electronic product low-temperature test is the ability that uses under low temperature environment, transports or store for check element, equipment and other products.The range of application of low-temperature test is very extensive, and the electric and electronic products such as space flight, boats and ships, household electrical appliance, electronic devices and components all will carry out low-temperature test.Therefore establishing criteria (GB 2423.1) to product correct to carry out low-temperature test most important to correct assessment product ability.
Proficiency testing is to utilize comparison between laboratory to determine an activity of the calibration/detectability in laboratory or the detectability of inspection body.Ability verification refers to any for the comparison between the laboratory of evaluation experimental chamber ability and measurement audit.The activity for example being operated by the accreditation body in country or region and the supplier of cooperative association, government department or industry organization or other formal proficiency testing plan thereof.
Carry out ability verification, there is positive effect to relating to the related side of detection/calibration:
For laboratory, be that it meets ISO/IEC 17025 standards, carry out the needs that internal quality control and external ability prove;
To accreditation body, it is the important technology approach of evaluating accredited laboratory's detection/rated capacity;
To the client in laboratory, be to prove that laboratory possesses the important evidence of a certain detectability;
To responsible departments of the government, be the effective measures of supervision laboratory ability and level.
Because ability verification all has the effect of highly significant in many industries, thereby, no matter in the world still at home, all paid close attention to widely at present.
The matching requirements of functipnal capability checking meets the homogeneity that proficiency testing requires, and can in whole proficiency testing process, keep stable, is not defectively attributed between the device that functipnal capability verifies or the variability of device itself with what guarantee to occur in proficiency testing.This point is most important to whole ability verification, and it can directly have influence on the result of final activity.
In addition, the matching requirements of functipnal capability checking is convenient to transport, cost is lower, easy for operation etc., and these features all have very positive effect to the smooth running of ability verification.
The device that there is no functipnal capability checking in industry at present can be verified low-temperature test ability.In industry, only low-temperature test equipment is calibrated at present, the verification mode of generally taking is according to relevant low-temperature test equipment calibrating standard, adopts the mode of the sensor combinations such as temperature polling instrument and platinum resistance or thermopair to calibrate low-temperature experimental device.There is following shortcoming in this mode: 1) proficiency testing equipment energy characteristic point can not be set, in the application, mainly refer to operating temperature point, certain specific temperature value at place when certain action occurs device, common low-temperature test equipment Alignment device can not arrange fixing operating temperature point, cannot obtain fixing temperature and read a little, therefore cannot be to participating in the laboratory implementation ability verification of proficiency testing; 2) said apparatus exists that cost is high equally, volume is large, transport inconvenient problem, the low-temperature test equipment Alignment devices such as said temperature logging at least several thousand, up to ten thousand at most, so expensive correcting device should not be used for carrying out ability verification, common low-temperature test equipment Alignment device belongs to high-accuracy electronic equipment, be not suitable for common logistics transportation, if adopt special logistics, further can improve the cost of ability verification.
Summary of the invention
First goal of the invention of the present invention is to provide a kind of method of electric and electronic product low-temperature test proficiency testing.
Another goal of the invention of the present invention is to provide a kind of low-temperature test proficiency testing device that utilizes said method to complete low-temperature test proficiency testing.
Realizing the technical scheme that first goal of the invention of the present invention takes is: a kind of method of electric and electronic product low-temperature test proficiency testing, and it comprises the following steps:
1) operating temperature of preset temperature pick-up unit point, requires the temperature sensing medium rate temperature change≤1 ℃/min of temperature-detecting device, the temperature sensing device of temperature-detecting device is put into device to be verified inner, opens device operation cooling to be verified;
2) in the time that temperature-detecting device detects that the internal temperature of device to be verified drops to above-mentioned default operating temperature point, record device to be verified internal temperature values now, record unit temp value to be verified;
3) calculate the Z value of above-mentioned unit temp to be verified,
when |, judge that device low-temperature test ability to be verified is qualified when Z|≤the 2.
Step 3) described in median, standard I QR value obtain in the following way: select 18 above devices to be verified carry out step 1 respectively), 2) correspondingly obtain 18 above unit temp values to be verified, calculate median and the standard I QR value of above-mentioned 18 above unit temp values to be verified.
Described temperature-detecting device is the electric temperature regulator compression-type temperature controller with fixing operating temperature point.
The present invention fully analyzes the requirement of the device to functipnal capability checking in low-temperature test ability verification, a kind of method of low-temperature test proficiency testing is provided, realize the technical breakthrough of low-temperature test being carried out to proficiency testing, enrich the quality control method in laboratory, improved laboratory ability and level.
Realizing the technical scheme that second goal of the invention of the present invention take is: a kind of low-temperature test proficiency testing device, comprise the compression-type temperature controller with fixing operating temperature point, on described temperature controller, be connected with temperature sensing device, the negative voltage input end of described temperature controller connects outside negative voltage input end by resistance, neon lamp successively, and the positive voltage input end of described temperature controller connects outside positive voltage input end.
The present invention also comprises box body, and described temperature controller is sealed in box body, and described temperature sensing device passes box body and is connected with external world's device to be verified, and described neon lamp, outside positive and negative voltage input end are arranged on box body.
Temperature controller of the present invention is the electric temperature regulator compression-type temperature controller with fixing operating temperature point, and temperature sensing medium rate temperature change≤1 of described temperature controller ℃/min.
As specific embodiments of the invention, described temperature sensing device is kapillary temperature-sensing probe.
The present invention adopts the compression-type temperature controller with fixing operating temperature point, meets the requirement of low-temperature test ability verification to matching requirements energy set temperature characteristic point; Temperature sensing medium rate temperature change≤1 ℃/min, in gradual change low-temperature test, can make response to the temperature variation of low temperature environment fast; Adopt electric temperature regulator compression-type temperature controller, can better meet the requirement of proficiency testing device to stability and repdocutbility; This apparatus structure is simple simultaneously, and volume is little, can be controlled in 0.004m
3left and right, and device inner structure is simply firm, and each components and parts also can stand common Transport Vibration, and cost is low, and convenient transportation is applicable to ability verification; Itself carries temperature indicating device compression-type temperature controller, and data read conveniently.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, the present invention will be further described:
Fig. 1 is the circuit theory diagrams of low-temperature test proficiency testing device of the present invention;
Fig. 2 is the circuit theory connection layout that uses low-temperature test proficiency testing device of the present invention.
Embodiment
As shown in Figure 2, low-temperature test proficiency testing device of the present invention, comprise the compression-type temperature controller 6 with fixing operating temperature point, on described temperature controller 6, be connected with temperature sensing device 3, the negative voltage input end 2 of described temperature controller 6 connects outside negative voltage input end N by resistance R, neon lamp 4 successively, and the positive voltage input end 1 of described temperature controller 6 connects outside positive voltage input end L; Described outside negative voltage input end N is a black binding post, and outside positive voltage input end L is a red binding post; The present invention also comprises box body 5, described temperature controller 6 is sealed in box body 5, described temperature sensing device 3 passes box body 5 and is connected with external world's device to be verified, described neon lamp 4, outside positive and negative voltage input end L, N are arranged on box body 5, and the temperature sensing device in the present embodiment is kapillary temperature-sensing probe.
Between the red binding post L of low-temperature test proficiency testing device of the present invention (also can select other temperature-detecting devices of the condition of defined in meeting method invention) and black post head N, load 220V ± 5%, (resistance of resistance R is R=120K Ω left and right to the alternating current of 50Hz ± 1%, circuit lead cross-sectional area: 1.0mm), as shown in Figure 2, the concrete steps of utilizing the method disclosed in the present and device to realize low-temperature test proficiency testing are:
1) the operating temperature point of the temperature controller 6 of default low-temperature test proficiency testing device is T1, the temperature range of T1 is from-10 ℃ to-70 ℃, the temperature-sensing probe 3 of low-temperature test proficiency testing device is put into device experiment case 7 to be verified, open chamber 7, start cooling from normal temperature;
2) in the time that temperature controller 6 detects that the internal temperature of chamber 7 drops to above-mentioned default operating temperature point T1, when observing neon lamp 4 and extinguishing, record neon lamp 4 and extinguish flash test case 7 internal temperature values now, record unit temp value to be verified;
3) calculate the Z value of above-mentioned unit temp to be verified,
adopt robust statistics Z than fraction method, the unit temp value to be verified of record to be processed, when |, judge that device experiment case 7 low-temperature test abilities to be verified are qualified, and then judge that validation laboratory of institute has the ability of carrying out low-temperature test when Z|≤the 2.
Above-mentioned steps 3) described in median, standard I QR value obtain in the following way: select the device to be verified of 18 above (being generally more than 20) carry out step 1 respectively), 2) correspondingly obtain 18 above unit temp values to be verified, median and the standard I QR value of calculating above-mentioned 18 above unit temp values to be verified, standard I QR value is standardization interquartile range.
Be the experimental data of low-temperature test proficiency testing device of the present invention below:
The uniformity testing report of device
According to the designing requirement of this device, each 100 of customized 1# sample (low-temperature test proficiency testing device) and 2# sample, therefrom randomly draw respectively 12 for uniformity testing, totally 24 samples, each sample repeated test 2 times.
Sample homogeneity assay data:
1# sample:
| Sample number into spectrum | Test value 1 (℃) | Test value 2 (℃) |
| 1 | -15.31 | -15.46 |
| 2 | -15.00 | -15.00 |
| 3 | -15.43 | -15.34 |
| 4 | -15.28 | -15.25 |
| 5 | -15.53 | -15.46 |
| 6 | -15.40 | -14.93 |
| 7 | -15.46 | -14.93 |
| 8 | -15.25 | -15.56 |
| 9 | -15.34 | -15.65 |
| 10 | -15.65 | -15.45 |
| 11 | -15.43 | -15.32 |
| 12 | -15.46 | -15.64 |
2# sample:
| Sample number into spectrum | Test value 1 (℃) | Test value 2 (℃) |
| 1 | -23.37 | -23.09 |
| 2 | -23.49 | -23.15 |
| 3 | -23.38 | -23.28 |
| 4 | -22.85 | -23.07 |
| 5 | -23.49 | -23.77 |
| 6 | -22.72 | -23.15 |
| 7 | -23.43 | -23.65 |
| 8 | -23.43 | -23.15 |
| 9 | -23.87 | -23.21 |
| 10 | -23.81 | -23.34 |
| 11 | -23.09 | -22.81 |
| 12 | -23.15 | -23.06 |
Sample homogeneity check analysis result:
1# sample one-way analysis of variance result
1.69＜F
0.05(11，12)＝2.72
The F statistics value calculating is less than F critical value, shows in the time of 0.05 level of significance, and low-temperature test testing cassete 1# sample operating temperature is uniform.
2# sample one-way analysis of variance result
2.24＜F
0.25(11，12)＝2.72
The F statistics value calculating is less than F critical value, shows in the time of 0.05 level of significance, and low-temperature test testing cassete 2# sample operating temperature is uniform.
Conclusion: low-temperature test proficiency testing device of the present invention meets uniformity requirement.
The test of low-temperature test proficiency testing device of the present invention to chamber, seemingly tests about the requirement of " test Ab: the low-temperature test of non heat dissipating specimen temperature gradual change " in standard according to GB/T 2423.1-2008 " electric and electronic product environmental test part 2: test method test A: low temperature ", IEC 60068-2-1:2007 " Environmental testing-Part 2-1:Tests-Test A:Cold " (Chinese is " environmental test-2-1 part: test-test A: low temperature ") or other associated class.
The service condition of low-temperature test proficiency testing device of the present invention:
Use this device to carry out CNAS T0436 and T0530 totally 2 ability verifications, there are respectively 123 and 170 laboratories to participate in proficiency testing, shown in specifically seeing the following form, median and the uniformity testing test value of all chamber test results of participating in the experiment are basically identical, prove that this device has good practicality.
CNAS T0436 statistics
CNAS T0530 statistics
Apparatus of the present invention are simple in structure, and reusable more than 200,000 times cost is low, and volume is little, and convenient transportation is very suitable for various ability verifications.
The above embodiment of the present invention is not limiting the scope of the present invention; embodiments of the present invention are not limited to this; according to foregoing of the present invention; according to ordinary skill knowledge and the customary means of this area; do not departing under basic fundamental thought prerequisite of the present invention; modification, replacement or the change of other various ways that said structure of the present invention is made, within all dropping on protection scope of the present invention.
Claims (4)
1. a method for electric and electronic product low-temperature test proficiency testing, is characterized in that, comprises the following steps:
1) operating temperature of preset temperature pick-up unit point, require the 1 ℃/min of temperature sensing medium rate temperature change < of temperature-detecting device, the temperature sensing device of temperature-detecting device is put into device to be verified inner, open device operation cooling to be verified;
2) in the time that temperature-detecting device detects that the internal temperature of device to be verified drops to above-mentioned default operating temperature point, record device to be verified internal temperature values now, record unit temp value to be verified;
3) calculate the Z value of above-mentioned unit temp to be verified,
, when |, judge that device low-temperature test ability to be verified is qualified when Z|≤the 2;
Median described in step 3), standard I QR value obtain in the following way: select 18 above devices to be verified to carry out respectively step 1), 2) correspondingly obtain 18 above unit temp values to be verified, calculate median and the standard I QR value of above-mentioned 18 above unit temp values to be verified;
Described temperature-detecting device is the electric temperature regulator compression-type temperature controller with fixing operating temperature point.
2. realize the low-temperature test proficiency testing device of method claimed in claim 1 for one kind, it is characterized in that: described low-temperature test proficiency testing device comprises the described compression-type temperature controller with fixing operating temperature point, on described temperature controller, be connected with temperature sensing device, the negative voltage input end of described temperature controller connects outside negative voltage input end by resistance, neon lamp successively, and the positive voltage input end of described temperature controller connects outside positive voltage input end;
Described temperature controller is the electric temperature regulator compression-type temperature controller with fixing operating temperature point, and the 1 ℃/min of temperature sensing medium rate temperature change < of described temperature controller.
3. low-temperature test proficiency testing device according to claim 2, it is characterized in that: described low-temperature test proficiency testing device also comprises box body, described temperature controller is sealed in box body, described temperature sensing device passes box body and is connected with external world's device to be verified, described neon lamp, outside positive and negative voltage input end are arranged on box body, described outside negative voltage input end is a black binding post, and described outside positive voltage input end is a red binding post.
4. low-temperature test proficiency testing device according to claim 3, is characterized in that: described temperature sensing device is kapillary temperature-sensing probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110331154.5A CN102494708B (en) | 2011-10-27 | 2011-10-27 | Method and device for verifying low-temperature test capacity of electric and electronic product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110331154.5A CN102494708B (en) | 2011-10-27 | 2011-10-27 | Method and device for verifying low-temperature test capacity of electric and electronic product |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102494708A CN102494708A (en) | 2012-06-13 |
| CN102494708B true CN102494708B (en) | 2014-06-25 |
Family
ID=46186552
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110331154.5A Active CN102494708B (en) | 2011-10-27 | 2011-10-27 | Method and device for verifying low-temperature test capacity of electric and electronic product |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102494708B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104344942A (en) * | 2014-10-24 | 2015-02-11 | 威凯检测技术有限公司 | Typical area environmental adaptability test method for LED (light emitting diode) street lamp |
| CN107356386A (en) * | 2017-06-22 | 2017-11-17 | 歌尔股份有限公司 | A kind of method that vibratory equipment confirms |
| CN112014653B (en) * | 2019-05-28 | 2023-05-12 | 山东交通学院 | Low-temperature test capability verification equipment for electrical and electronic products |
| CN111693798A (en) * | 2020-05-07 | 2020-09-22 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | High-low temperature test capability verification test box and high-low temperature test capability test method |
| CN113484468A (en) * | 2021-06-25 | 2021-10-08 | 广州市广软科技有限公司 | Motor vehicle environmental protection detection analysis method and system based on quartile algorithm |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102156230A (en) * | 2011-03-07 | 2011-08-17 | 上海出入境检验检疫局机电产品检测技术中心 | Temperature-increment testing capability verifying sample |
| CN202350821U (en) * | 2011-10-27 | 2012-07-25 | 广州威凯检测技术有限公司 | Low-temperature testing ability verifying device of electrotechnical and electronic product |
-
2011
- 2011-10-27 CN CN201110331154.5A patent/CN102494708B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102156230A (en) * | 2011-03-07 | 2011-08-17 | 上海出入境检验检疫局机电产品检测技术中心 | Temperature-increment testing capability verifying sample |
| CN202350821U (en) * | 2011-10-27 | 2012-07-25 | 广州威凯检测技术有限公司 | Low-temperature testing ability verifying device of electrotechnical and electronic product |
Non-Patent Citations (2)
| Title |
|---|
| 王秀芳，等.低温试验能力验证中的不确定度分析评估.《环境技术》.2008,第22-23页第2.1节、图1. * |
| 魏用林,等.实验室能力验证及稳健统计技术.《云南冶金》.2008,第37卷(第5期),第54页第2栏第3节第10)点,第55页第4节、表1. * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102494708A (en) | 2012-06-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102494708B (en) | Method and device for verifying low-temperature test capacity of electric and electronic product | |
| CN104820200B (en) | Battery management system functional check platform and self checking method and the method for inspection with self-checking function | |
| Zheng et al. | Lithium ion battery pack power fade fault identification based on Shannon entropy in electric vehicles | |
| CN203275630U (en) | Power frequency electric field probe calibration tester | |
| CN102393501B (en) | MOSFET reliability test analysis system and method thereof | |
| CN108226768A (en) | Temperature-compensating check system and method | |
| EP2977770A1 (en) | Leakage current detection method and device | |
| CN109709137B (en) | Battery water cooling plate temperature uniformity test equipment and method | |
| CN109752685A (en) | A kind of appraisal procedure, the system of distribution mutual inductor insulation performance | |
| CN104330737B (en) | Ice storing time circuit path resnstance transformer system and method | |
| CN106324510B (en) | A kind of battery detection method and device | |
| WO2019057006A1 (en) | Battery detection method | |
| CN104062618A (en) | Verification method for on-line monitoring device of double-signal-source capacitive equipment | |
| CN105629052A (en) | Chip power consumption real-time detection method | |
| CN108760090B (en) | Simulated environment temperature testing device | |
| CN202350821U (en) | Low-temperature testing ability verifying device of electrotechnical and electronic product | |
| Ranieri et al. | Electronic module for the thermal monitoring of a Li-ion battery cell through the electrochemical impedance estimation | |
| US20090093987A1 (en) | Method for accurate measuring stray capacitance of automatic test equipment and system thereof | |
| US9625517B2 (en) | Leakage current detection method and apparatus for detecting leakage of current from a board-mounted component | |
| CN209656238U (en) | A kind of electric and electronic product vibration test proficiency testing device | |
| Zhang et al. | Artificial Neural Network–Based Multisensor Monitoring System for Collision Damage Assessment of Lithium‐Ion Battery Cells | |
| CN104062619A (en) | Verification system for on-line monitoring device of double-signal-source capacitive equipment | |
| CN108287311A (en) | A kind of power battery short-circuit test machine and test method | |
| Stanciu et al. | Voltage sags and Total Harmonic Distortion monitoring in power systems. A case study | |
| CN113156273A (en) | Method and device for verifying electrical strength test capability |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C53 | Correction of patent for invention or patent application | ||
| CB02 | Change of applicant information |
Address after: 510663 Guangdong city of Guangzhou province Luogang District Tiantai Road No. 3 Applicant after: Vkan Certification and Testing Co., Ltd. Address before: 510663 Guangdong city of Guangzhou province Luogang District Tiantai Road No. 3 Applicant before: Guangzhou Vkan Certification & Testing Co.,Ltd. |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20120613 Assignee: Jiangsu Weinuo Testing Technology Co., Ltd. Assignor: Vkan Certification and Testing Co., Ltd. Contract record no.: X2019440000001 Denomination of invention: Method and device for verifying low-temperature test capacity of electric and electronic product Granted publication date: 20140625 License type: Common License Record date: 20190805 |