CN102494708A - Method and device for verifying low-temperature test capacity of electric and electronic product - Google Patents
Method and device for verifying low-temperature test capacity of electric and electronic product Download PDFInfo
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- CN102494708A CN102494708A CN2011103311545A CN201110331154A CN102494708A CN 102494708 A CN102494708 A CN 102494708A CN 2011103311545 A CN2011103311545 A CN 2011103311545A CN 201110331154 A CN201110331154 A CN 201110331154A CN 102494708 A CN102494708 A CN 102494708A
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Abstract
The invention discloses a method and a device for verifying low-temperature test capacity of an electric and electronic product, which comprises the following steps of: (1), pre-setting an action temperature point of a temperature detection device, requiring that the temperature change rate of a temperature sensing medium of the temperature detection device is less than or equal to 1 DEG C per min, putting a temperature sensing device of the temperature detection device in the interior of a device to be verified, and opening and cooling the device to be verified; (2), when the temperature detection device detects that the interior temperature of the device to be verified is decreased to the pre-set action temperature point, recording an interior temperature value of the device to be verified at this time, namely recording a temperature value of the device to be verified; and (3), calculating a Z value of the temperature of the device to be verified, and then, judging that the low-temperature test capacity of the device to be verified is qualified. The invention provides the method for verifying the low-temperature test capacity, which is capable of making a breakthrough in a technology for verifying the low-temperature test capacity, enriching a quality control method of a laboratory and increasing the capacity and the level of the laboratory.
Description
Technical field
The present invention relates to test capability verification technique field, be specifically related to the method and the device thereof of low-temperature test proficiency testing.
Background technology
Environmental test be around the research environment for use to one type of fail-test of material and product function and performance impact.Temperature is as one of three big basic environmental factors, the use that influences product at all times.Research shows that 40% product field failure is relevant with temperature.
The electric and electronic product low-temperature test is to be used for the ability that check element, equipment and other products use under low temperature environment, transport or store.The range of application of low-temperature test is very extensive, and electric and electronic products such as space flight, boats and ships, household electrical appliance, electronic devices and components all will carry out low-temperature test.Therefore establishing criteria (GB 2423.1) is most important to the correct low-temperature test correct assessment product ability of carrying out of product.
Proficiency testing is to utilize comparison between the laboratory to confirm an activity of the detectability of breadboard calibration/detectability or inspection body.Ability verification refers to the comparison between any laboratory that is used for evaluation experimental chamber ability and measures audit.For example by the activity of supplier's running of country or regional accreditation body and cooperative association, government department or industry organization or other formal proficiency testing plan.
Carry out ability verification, the related side who relates to detection/calibration had positive effect:
As far as the laboratory, be that it satisfies ISO/IEC 17025 standards, carry out the needs that internal soundness control and external ability prove;
To accreditation body, be the important technology approach of estimating accredited laboratory's detection/rated capacity;
To breadboard client, be the important evidence that the proof laboratory possesses a certain detectability;
To responsible departments of the government, be the effective measures of supervision laboratory ability and level.
Because ability verification all has the effect of highly significant in many industries, thereby, at present no matter still at home, all receive widely and paying close attention in the world.
The matching requirements of functipnal capability checking satisfies the homogeneity that proficiency testing requires, and can in whole proficiency testing process, keep stable, defectively is not attributed between the device that functipnal capability verifies or the variability of device itself with what guarantee to occur in the proficiency testing.This point is most important to whole ability verification, and it can directly have influence on the result of final activity.
In addition, the matching requirements of functipnal capability checking is convenient to transport, cost is lower, easy for operation etc., and these characteristics all have very positive effect to the smooth running of ability verification.
Still the device that does not have the functipnal capability checking in the industry at present can be verified the low-temperature test ability.Only only low-temperature test equipment is calibrated in the industry at present; The verification mode of generally taking is according to relevant low-temperature test equipment calibrating standard, adopts the mode of temperature polling instrument and sensor combinations such as RTD or thermopair that low temperature test equipment is calibrated.There is following shortcoming in this mode: 1) proficiency testing equipment energy characteristic point can not be set; Mainly be meant the operating temperature point among the application; Certain specific temperature value at place when promptly certain action takes place device; Common low-temperature test Equipment Alignment device can not be provided with fixing operating temperature point, can't obtain fixing temperature and read a little, therefore can't be to participating in the laboratory implementation ability verification of proficiency testing; 2) there is the problem that cost is high, volume is big, transport inconvenience equally in said apparatus; Low-temperature test Equipment Alignment devices such as said temperature logging at least several thousand, up to ten thousand at most, so expensive correcting device should not be used for carrying out ability verification; Common low-temperature test Equipment Alignment device belongs to high-accuracy electronic equipment; Be not suitable for common logistics transportation,, further can improve the cost of ability verification if adopt special logistics.
Summary of the invention
First goal of the invention of the present invention provides a kind of method of electric and electronic product low-temperature test proficiency testing.
Another goal of the invention of the present invention provides a kind of low-temperature test proficiency testing device that utilizes said method to accomplish the low-temperature test proficiency testing.
Realize that the technical scheme that first goal of the invention of the present invention is taked is: a kind of method of electric and electronic product low-temperature test proficiency testing, it may further comprise the steps:
1) operating temperature of preset temperature pick-up unit point requires the temperature sensing medium rate temperature change≤1 ℃/min of temperature-detecting device, and it is inner that the temperature sensing device of temperature-detecting device is put into device to be verified, opens device operation cooling to be verified;
When the internal temperature that 2) detects device to be verified when temperature-detecting device drops to above-mentioned preset operating temperature point, write down the device to be verified internal temperature values of this moment, promptly write down unit temp value to be verified;
3) the Z value of the above-mentioned unit temp to be verified of calculating;
judges that device low-temperature test ability to be verified is qualified when | Z|≤2.
Median described in the step 3), standard I QR value obtain through following mode: select the device to be verified more than 18 to carry out step 1), 2 respectively) the corresponding unit temp value to be verified that obtains more than 18, calculate the median and the standard I QR value of above-mentioned unit temp value to be verified more than 18.
Described temperature-detecting device is the electric temperature regulator compression-type temperature controller with fixing operating temperature point.
The present invention fully analyzes the requirement of the device of in the low-temperature test ability verification functipnal capability being verified; A kind of method of low-temperature test proficiency testing is provided; Realized low-temperature test is carried out the technical breakthrough of proficiency testing; Enrich breadboard quality control method, improved laboratory ability and level.
Realize that the technical scheme that second goal of the invention of the present invention taked is: a kind of low-temperature test proficiency testing device; Comprise compression-type temperature controller with fixing operating temperature point; Be connected with temperature sensing device on the described temperature controller; The negative voltage input end of described temperature controller connects the negative exterior voltage input end through resistance, neon lamp successively, and the positive voltage input end of described temperature controller connects outside positive voltage input end.
The present invention also comprises box body, and described temperature controller is sealed in the box body, and described temperature sensing device passes box body and links to each other with external world's device to be verified, and described neon lamp, outside positive and negative voltage input end are arranged on the box body.
Temperature controller of the present invention is the electric temperature regulator compression-type temperature controller with fixing operating temperature point, and temperature sensing medium rate temperature change≤1 of said temperature controller ℃/min.
As specific embodiment of the present invention, described temperature sensing device is the kapillary temperature-sensing probe.
The present invention adopts the compression-type temperature controller with fixing operating temperature point, satisfies the low-temperature test ability verification can be provided with temperature characterisitic point to matching requirements requirement; Response in the gradual change low-temperature test, can be made to the temperature variation of low temperature environment fast in temperature sensing medium rate temperature change≤1 ℃/min; Adopt the electric temperature regulator compression-type temperature controller, can better satisfy of the requirement of proficiency testing device stability and repdocutbility; This apparatus structure is simple simultaneously, and volume is little, can be controlled in 0.004m
3About, and the device inner structure is simply firm, and each components and parts also can stand common transportation vibration, and cost is low, and convenient transportation is fit to ability verification; Itself carries temperature indicating device compression-type temperature controller, and data read conveniently.
Description of drawings
Below in conjunction with accompanying drawing the present invention is further specified:
Fig. 1 is the circuit theory diagrams of low-temperature test proficiency testing device of the present invention;
Fig. 2 is to use the circuit theory connection layout of low-temperature test proficiency testing device of the present invention.
Embodiment
As shown in Figure 2; Low-temperature test proficiency testing device of the present invention; Comprise compression-type temperature controller 6 with fixing operating temperature point; Be connected with temperature sensing device 3 on the described temperature controller 6, the negative voltage input end 2 of described temperature controller 6 connects negative exterior voltage input end N through resistance R, neon lamp 4 successively, and the positive voltage input end 1 of described temperature controller 6 connects outside positive voltage input end L; Described negative exterior voltage input end N is a black binding post, and outside positive voltage input end L is a red binding post; The present invention also comprises box body 5; Described temperature controller 6 is sealed in the box body 5; Described temperature sensing device 3 passes box body 5 and links to each other with external world's device to be verified; Described neon lamp 4, outside positive and negative voltage input end L, N are arranged on the box body 5, and the temperature sensing device in the present embodiment is the kapillary temperature-sensing probe.
Between the red binding post L of low-temperature test proficiency testing device of the present invention (also can select other temperature-detecting devices that satisfy the condition of defined in the method invention for use) and black post head N, load 220V ± 5%; (resistance of resistance R is about R=120K Ω to the alternating current of 50Hz ± 1%; Circuit lead cross-sectional area: 1.0mm); As shown in Figure 2, utilize the disclosed method and apparatus of the present invention to realize that the concrete steps of low-temperature test proficiency testing are:
1) the operating temperature point of the temperature controller 6 of preset low-temperature test proficiency testing device is T1; The temperature range of T1 is from-10 ℃ to-70 ℃; The temperature-sensing probe 3 of low-temperature test proficiency testing device is put into device experiment case 7 to be verified, open chamber 7, begin cooling from normal temperature;
When the internal temperature that 2) detects chamber 7 when temperature controller 6 dropped to above-mentioned preset operating temperature point T1, when promptly observing neon lamp 4 and extinguishing, record neon lamp 4 extinguished the flash test case internal temperature values of 7 this moments, promptly writes down unit temp value to be verified;
3) the Z value of the above-mentioned unit temp to be verified of calculating;
promptly adopts robust statistics Z than fraction method the unit temp value to be verified of record to be handled; When | Z|≤2; Judge that device experiment case 7 low-temperature test abilities to be verified are qualified, and then judge that validation laboratory of institute has the ability of carrying out low-temperature test.
Above-mentioned steps 3) median described in, standard I QR value obtain through following mode: the device of selecting (to be generally more than 20) more than 18 to be verified carries out step 1), 2 respectively) the corresponding unit temp value to be verified that obtains more than 18; Calculate the median and the standard I QR value of above-mentioned unit temp value to be verified more than 18, standard I QR value is the standardization interquartile range.
Be the experimental data of low-temperature test proficiency testing device of the present invention below:
The uniformity testing report of device
According to the requirement of this Design of device, each 100 in customized 1# sample (low-temperature test proficiency testing device) and 2# sample are therefrom randomly drawed 12 respectively and are used for uniformity testing, totally 24 samples, each sample repeated test 2 times.
Sample homogeneity assay data:
The 1# sample:
| Sample number into spectrum | Test value 1 (℃) | Test value 2 (℃) |
| 1 | ?-15.31 | ?-15.46 |
| 2 | ?-15.00 | ?-15.00 |
| 3 | ?-15.43 | ?-15.34 |
| 4 | ?-15.28 | ?-15.25 |
| 5 | ?-15.53 | ?-15.46 |
| 6 | ?-15.40 | ?-14.93 |
| 7 | ?-15.46 | ?-14.93 |
| 8 | ?-15.25 | ?-15.56 |
| 9 | ?-15.34 | ?-15.65 |
| 10 | ?-15.65 | ?-15.45 |
| 11 | ?-15.43 | ?-15.32 |
| 12 | ?-15.46 | ?-15.64 |
The 2# sample:
| Sample number into spectrum | Test value 1 (℃) | Test value 2 (℃) |
| 1 | ?-23.37 | ?-23.09 |
| 2 | ?-23.49 | ?-23.15 |
| 3 | ?-23.38 | ?-23.28 |
| 4 | ?-22.85 | ?-23.07 |
| 5 | ?-23.49 | ?-23.77 |
| 6 | ?-22.72 | ?-23.15 |
| 7 | ?-23.43 | ?-23.65 |
| 8 | ?-23.43 | ?-23.15 |
| 9 | ?-23.87 | ?-23.21 |
| 10 | ?-23.81 | ?-23.34 |
| 11 | ?-23.09 | ?-22.81 |
| 12 | ?-23.15 | ?-23.06 |
Sample homogeneity check analysis result:
1# sample one-way analysis of variance result
1.69＜F
0.05(11，12)＝2.72
The F statistics value that calculates is less than the F critical value, and when being illustrated in 0.05 level of significance, low-temperature test testing cassete 1# sample operating temperature is uniform.
2# sample one-way analysis of variance result
2.24＜F
0.25(11，12)＝2.72
The F statistics value that calculates is less than the F critical value, and when being illustrated in 0.05 level of significance, low-temperature test testing cassete 2# sample operating temperature is uniform.
Conclusion: low-temperature test proficiency testing device of the present invention satisfies uniformity requirement.
Low-temperature test proficiency testing device of the present invention makes an experiment like the requirement about " test Ab: the low-temperature test of non heat dissipating specimen temperature gradual change " in the standard according to GB/T 2423.1-2008 " electric and electronic product environmental test part 2: test method test A: low temperature ", IEC 60068-2-1:2007 " Environmental testing-Part 2-1:Tests-Test A:Cold " (Chinese is " environmental test-2-1 part: test-test A: low temperature ") or other associated class to the test of chamber.
The operating position of low-temperature test proficiency testing device of the present invention:
Use this device to carry out CNAS T0436 and T0530 totally 2 ability verifications; There are 123 families and 170 tame laboratories to participate in proficiency testing respectively; Shown in specifically seeing the following form; The median of all chamber test results of participating in the experiment and uniformity testing test value basically identical prove that this device has better practicability.
CNAS T0436 statistics
CNAS T0530 statistics
Apparatus of the present invention are simple in structure, and reusable cost is low more than 200,000 times, and volume is little, and convenient transportation is very suitable for various ability verifications.
The above embodiment of the present invention is not the qualification to protection domain of the present invention; Embodiment of the present invention is not limited thereto; According to foregoing of the present invention,, do not breaking away under the basic fundamental thought prerequisite of the present invention according to the ordinary skill knowledge and the customary means of this area; Modification, replacement or the change of other various ways that said structure of the present invention is made all drop within protection scope of the present invention.
Claims (7)
1. the method for an electric and electronic product low-temperature test proficiency testing is characterized in that, may further comprise the steps:
1) operating temperature of preset temperature pick-up unit point requires the temperature sensing medium rate temperature change≤1 ℃/min of temperature-detecting device, and it is inner that the temperature sensing device of temperature-detecting device is put into device to be verified, opens device operation cooling to be verified;
When the internal temperature that 2) detects device to be verified when temperature-detecting device drops to above-mentioned preset operating temperature point, write down the device to be verified internal temperature values of this moment, promptly write down unit temp value to be verified;
3) the Z value of the above-mentioned unit temp to be verified of calculating;
; During as
, judge that device low-temperature test ability to be verified is qualified.
2. the method for electric and electronic product low-temperature test proficiency testing according to claim 1; It is characterized in that: the median described in the step 3), standard I QR value obtain through following mode: select the device to be verified more than 18 to carry out step 1), 2 respectively) the corresponding unit temp value to be verified that obtains more than 18, calculate the median and the standard I QR value of above-mentioned unit temp value to be verified more than 18.
3. the method for electric and electronic product low-temperature test proficiency testing according to claim 2 is characterized in that: described temperature-detecting device is the electric temperature regulator compression-type temperature controller with fixing operating temperature point.
4. low-temperature test proficiency testing device of realizing claim 1 or 2 described methods; It is characterized in that: described low-temperature test proficiency testing device comprises the compression-type temperature controller with fixing operating temperature point; Be connected with temperature sensing device on the described temperature controller; The negative voltage input end of described temperature controller connects the negative exterior voltage input end through resistance, neon lamp successively, and the positive voltage input end of described temperature controller connects outside positive voltage input end.
5. low-temperature test proficiency testing device according to claim 4; It is characterized in that: described low-temperature test proficiency testing device also comprises box body; Described temperature controller is sealed in the box body; Described temperature sensing device passes box body and links to each other with external world's device to be verified, and described neon lamp, outside positive and negative voltage input end are arranged on the box body.
6. low-temperature test proficiency testing device according to claim 5 is characterized in that: described temperature controller is the electric temperature regulator compression-type temperature controller with fixing operating temperature point, and temperature sensing medium rate temperature change≤1 of said temperature controller ℃/min.
7. low-temperature test proficiency testing device according to claim 6 is characterized in that: described temperature sensing device is the kapillary temperature-sensing probe.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104344942A (en) * | 2014-10-24 | 2015-02-11 | 威凯检测技术有限公司 | Typical area environmental adaptability test method for LED (light emitting diode) street lamp |
| CN107356386A (en) * | 2017-06-22 | 2017-11-17 | 歌尔股份有限公司 | A kind of method that vibratory equipment confirms |
| CN111693798A (en) * | 2020-05-07 | 2020-09-22 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | High-low temperature test capability verification test box and high-low temperature test capability test method |
| CN112014653A (en) * | 2019-05-28 | 2020-12-01 | 山东交通学院 | Electrician electronic product low temperature test ability verification equipment |
| CN113484468A (en) * | 2021-06-25 | 2021-10-08 | 广州市广软科技有限公司 | Motor vehicle environmental protection detection analysis method and system based on quartile algorithm |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104344942A (en) * | 2014-10-24 | 2015-02-11 | 威凯检测技术有限公司 | Typical area environmental adaptability test method for LED (light emitting diode) street lamp |
| CN107356386A (en) * | 2017-06-22 | 2017-11-17 | 歌尔股份有限公司 | A kind of method that vibratory equipment confirms |
| CN112014653A (en) * | 2019-05-28 | 2020-12-01 | 山东交通学院 | Electrician electronic product low temperature test ability verification equipment |
| CN112014653B (en) * | 2019-05-28 | 2023-05-12 | 山东交通学院 | Low-temperature test capability verification equipment for electrical and electronic products |
| CN111693798A (en) * | 2020-05-07 | 2020-09-22 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | High-low temperature test capability verification test box and high-low temperature test capability test method |
| CN113484468A (en) * | 2021-06-25 | 2021-10-08 | 广州市广软科技有限公司 | Motor vehicle environmental protection detection analysis method and system based on quartile algorithm |
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| CN102494708B (en) | 2014-06-25 |
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Address after: 510663 Guangdong city of Guangzhou province Luogang District Tiantai Road No. 3 Applicant after: Vkan Certification and Testing Co., Ltd. Address before: 510663 Guangdong city of Guangzhou province Luogang District Tiantai Road No. 3 Applicant before: Guangzhou Vkan Certification & Testing Co.,Ltd. |
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Application publication date: 20120613 Assignee: Jiangsu Weinuo Testing Technology Co., Ltd. Assignor: Vkan Certification and Testing Co., Ltd. Contract record no.: X2019440000001 Denomination of invention: Method and device for verifying low-temperature test capacity of electric and electronic product Granted publication date: 20140625 License type: Common License Record date: 20190805 |