CN102456086A - Method for optimized evaluation of parameter influencing circuit board signal transmission quality - Google Patents

Method for optimized evaluation of parameter influencing circuit board signal transmission quality Download PDF

Info

Publication number
CN102456086A
CN102456086A CN2010105284980A CN201010528498A CN102456086A CN 102456086 A CN102456086 A CN 102456086A CN 2010105284980 A CN2010105284980 A CN 2010105284980A CN 201010528498 A CN201010528498 A CN 201010528498A CN 102456086 A CN102456086 A CN 102456086A
Authority
CN
China
Prior art keywords
parameter
group
experimental design
experiment
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2010105284980A
Other languages
Chinese (zh)
Inventor
苏晓芸
赖盈佐
李政宪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Original Assignee
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CN2010105284980A priority Critical patent/CN102456086A/en
Publication of CN102456086A publication Critical patent/CN102456086A/en
Pending legal-status Critical Current

Links

Images

Abstract

The invention provides a method for the optimized evaluation of a parameter influencing circuit board signal transmission quality. The method comprises the following steps of: establishing a first experimental design table of few experiment times, and obtaining eye diagram heights of each group of experiments in the first experimental design table through simulation experiments; and then fitting the empirical formula of the eye diagram heights through a mathematical regression algorithm according to the eye diagram heights. The method also comprises the steps of: establishing a second experimental design table by a full-factorial experiment method; calculating the eye diagram heights of each group of experiments in the second experimental design table according to the fitted formula; and selecting a plurality of groups of experiments each having the eye diagram height greater than 1 from the second experimental design table. The method further comprises the steps of calculating the average value of the eye diagram heights of each group of experiments among the plurality of groups of experiments selected and taking the values of m variables in the group of experiments having the maximal average value as the optimized values of the m variables. The method determines the optimized value of the parameter influencing the circuit board signal transmission quality by the experimental design method, thus facilitating more accurate and steady circuit board design.

Description

Influence the parameter optimization obtaining value method of circuit board signal transmission quality
Technical field
The present invention relates to the design field of circuit board, especially a kind of parameter optimization obtaining value method that influences the circuit board signal transmission quality.
Background technology
Quality is the key factor that electronics manufacturer keeps its market competitiveness, and the quality of electronic product often just can roughly determine in its initial design phase.Circuit board (print circuit board claims pcb board again) is the chief component of electronic product, and its design often directly influences the reliability and stability of signal transmission in the electronic product.Therefore, the design of circuit board plays an important role to the quality of electronic product.
In the design of circuit board, the length of each line segment that connects up, wiring layer are not, parameter such as each transmission line characteristic impedance all can influence the quality of signal transmission, thereby cause the reduction of electronic product quality.
Summary of the invention
In view of above content; Be necessary to propose a kind of parameter optimization obtaining value method that influences the circuit board signal transmission quality; It is through the definite optimization of parameters value that influences the circuit board signal transmission quality of method of experimental design, to carry out more accurately sane board design.
A kind of parameter optimization obtaining value method that influences the circuit board signal transmission quality comprises: m the parameter that influences certain parameter of circuit board signal transmission quality on the acquisition cuicuit plate in P components and parts; Each parameter in the above-mentioned m parameter is provided with n value; N value according to each parameter in this m parameter makes up the first experimental design table; Carry out simulated experiment according to the above-mentioned first experimental design table, test a resulting P eye height for every group that writes down in this first experimental design table; According to every group of P eye height that experiment obtains in the above-mentioned first experiment table, utilize a preset model formation, carry out regression Calculation through mathematical algorithm, simulate the experimental formula of P eye height; An above-mentioned m parameter is provided with the individual value of n ', and wherein, n ' is greater than n; The individual value of n ' according to each parameter in this m parameter makes up the second experimental design table; Utilize the experimental formula of P the eye height that above-mentioned match comes out, every group of experiment in this second experimental design table calculated, calculate P eye height of every group of experiment; P eye height of every group of experiment of coming out according to aforementioned calculation filters out P eye height all greater than 1 some groups of experiments from the second experimental design table; Calculate the mean value of P eye height of every group of experiment in this some groups of screening experiment; And pick out that maximum group experiment of mean value of being calculated, the value of m parameter during this group is tested is as the optimized value of this m parameter.
The parameter optimization obtaining value method that influences the circuit board signal transmission quality provided by the present invention confirms to influence the optimization of parameters value of circuit board signal transmission quality through method of experimental design; To carry out more accurately sane board design, the number of times of its experiment is few and efficient is high.In addition, this method can be carried out the value of parameter optimization simultaneously to a plurality of components and parts on the circuit board.
Description of drawings
Figure 1A-Figure 1B has demonstrated 4 parameters of the wiring line segment length of 9 internal memories and 3 kinds of values of each parameter on the circuit board for example.
Fig. 2 is the implementing procedure figure that the present invention influences the parameter optimization obtaining value method preferred embodiment of circuit board signal transmission quality.
Fig. 3 A-Fig. 3 B has demonstrated the first experimental design table that utilizes the reaction Surface Method to make up for example.
Fig. 4 has demonstrated every group of P eye height of testing that the first experimental design table is experimentized and obtains for example.
The experimental formula of P the eye height that the eye height that Fig. 5 A-Fig. 5 B has demonstrated a preset model formation for example and utilized this model formation to obtain according to Fig. 4 simulates.
Fig. 6 A-Fig. 6 B has demonstrated the second experimental design table that utilizes the total divisor experimental method to make up for example.
Fig. 7 has demonstrated the experimental formula of P the eye height that utilizes match among Fig. 5 for example to every group in the second experimental design table of Fig. 6 P eye height of testing the every group of experiment that calculates.
Fig. 8 has demonstrated P signal eye diagram height all greater than the screenings of 1 some groups experiments for example.
Fig. 9 has demonstrated confirming the parameter optimization value for example.
Embodiment
The parameter optimization obtaining value method that influences the circuit board signal transmission quality according to the invention is all or part ofly to be the basis with the computer programs process flow process; Carry out computer program through computing machine, the solution that the computing machine external data is controlled or handled by above-mentioned flow process establishment.
The length, wiring layer that the parameter that influences the circuit board signal transmission quality possibly comprise the line segment that respectively connects up not, each transmission line characteristic impedance etc.Below; Present embodiment is with shown in Figure 1A; 4 parameter A, B, C, the D of the wiring line segment length of a plurality of internal memory D0~D8 is example on the circuit board; Cooperate Fig. 2 to Fig. 9, introduce the parameter optimization value that the present invention influences the circuit board signal transmission quality, i.e. the solution of the optimization obtaining value method of parameter A, B, C, D.
Consulting shown in Figure 2ly, is the implementing procedure figure that the present invention influences the parameter optimization obtaining value method preferred embodiment of circuit board signal transmission quality.
Step S10 influences m parameter of certain parameter of circuit board signal transmission quality in P components and parts on the acquisition cuicuit plate.In the present embodiment, shown in Figure 1A, a said P components and parts are meant 9 internal memory D0~D8, and said m the parameter that influences the parameter of circuit board signal transmission quality is meant 4 kinds of parameter A, B, C, the D of the wiring line segment length of internal memory D0~D8 shown in Figure 1.
Step S11 is provided with n kind value with each parameter in the above-mentioned m parameter.In the present embodiment, shown in Figure 1B, the n of said each a parameter value is set to " 1 " respectively, " 0 " reaches " 1 " three kinds, reaches " 2000 " three kinds of values like " 3000 ", " 2500 " of length A.
Step S12 utilizes the reaction Surface Method, and the n kind value that accordings to each parameter in this m parameter makes up the first experimental design table.Shown in Fig. 3 A; Said reaction Surface Method be with wherein three parameters in m the parameter be three axially; Make up a cube,, make up the first experimental design table shown in Fig. 3 B according to the central point value of the mid point and/or the square on the summit of square, 12 limits.
Step S13 carries out simulated experiment according to the above-mentioned first experimental design table, tests a resulting P eye height for every group that writes down in this first experimental design table.Said eye pattern is the figure of being overlapped and being formed by many signal waveforms, the shape of its shape similar " eye "." eye " is big, and promptly eye height is big, and then the expression signal transmission quality is good, and " eye " is little, and promptly eye height is little, in the process of expression signal transmission interference is arranged.Should understand, a said P eye height is respectively the eye height of P signal that components and parts produce on the circuit board.EH0~EH8 that the P that said experiment an obtains eye height is as shown in Figure 4.
Step S14, P eye height according to every group in above-mentioned first experiment table experiment obtains utilizes a preset model formation, carries out regression Calculation through mathematical algorithm, simulates the experimental formula of P eye height.Said preset model formation is referring to shown in Fig. 5 A.In this model formation, b 0~bm + 1Be coefficient, A, B, C, D are meant 4 parameters of the wiring line segment length of above-mentioned internal memory D0~D8.It is said that to carry out experimental formula that regression Calculation simulates P eye height through mathematical algorithm be through calculating P group shown in Fig. 5 B (b of EH0~EH8) 0~b M+1Value, thereby obtain the formula of P group eye height.For example, according to the b that calculates 0~b M+1, on the circuit board the 4th components and parts (like internal memory D3) the eye height of generation signal, promptly the experimental formula of EH3 is:
EH=0.902431-0.00188A-0.0121B-0.04209C-0.00144D+0.090599A 2+0.014949B 2-0.0042C 2-0.0024D 2+0.004613AB+0.007087AC+0.001375AD+0.010163BC-0.00073BD+0.001975CD+e。
Step S15 is provided with n ' with an above-mentioned m parameter and plants value, and wherein, n ' is greater than n.As stated, said each parameter is set to " 1 " respectively, " 0 " reaches " 1 " three kinds of values, reaches " 2000 " three kinds of values like " 3000 ", " 2500 " of length A.Therefore; In the present embodiment; Shown in Fig. 6 A, said each parameter is set to " 1 ", " 0.5 ", " 0 " respectively, " 0.5 " reaches " 1 " five kinds of values, reaches " 2000 " five kinds of values like " 3000 ", " 2750 ", " 2500 ", " 2250 " of length A.
Step S16 utilizes the total divisor experimental method, and n ' the kind value according to each parameter in this m parameter makes up the second experimental design table.Said total divisor experimental method is the method that all states with all factors all experimentize.In the present embodiment, said total divisor experimental method is that all combinations that the n ' of each parameter in A, B, C, four parameters of D plants value are all experimentized.The second constructed experimental design table is shown in Fig. 6 B.
Step S17 utilizes the experimental formula of P the eye height that above-mentioned match comes out, and every group of experiment in this second experimental design table calculated, and calculates P eye height of every group of experiment as shown in Figure 7.For example, as shown in Figure 6 for first group in second experimental design table experiment, A, B, C, D are respectively " 1 ", " 1 ", " 1 ", " 1 ", and promptly the value of A, B, C, D is respectively " 3000 ", " 650 ", " 1300 ", " 300 ".The value of A, B, C, D is distinguished in the experimental formula of P eye height of substitution, obtained P eye height of this group experiment.
Step S18, P eye height of every group of coming out according to aforementioned calculation experiment, as shown in Figure 8, filter out P eye height all greater than 1 some groups of experiments.
Step S19 calculates the mean value of P eye height of every group of experiment in the experiment of this some groups of screening.
Step S20 picks out that maximum group experiment of mean value of being calculated, and shown in Fig. 9 dash area, this is organized the optimized value of the value of m parameter in the experiment as m parameter of certain parameter that influences the circuit board signal transmission quality.

Claims (6)

1. parameter optimization obtaining value method that influences the circuit board signal transmission quality is characterized in that this method comprises:
Influence m parameter of certain parameter of circuit board signal transmission quality on the acquisition cuicuit plate in P components and parts;
Each parameter in the above-mentioned m parameter is provided with n kind value;
N kind value according to each parameter in this m parameter makes up the first experimental design table;
Carry out simulated experiment according to the above-mentioned first experimental design table, test a resulting P eye height for every group that writes down in this first experimental design table;
According to every group of P eye height that experiment obtains in the above-mentioned first experiment table, utilize a preset model formation, carry out regression Calculation through mathematical algorithm, simulate the experimental formula of P eye height;
An above-mentioned m parameter is provided with n ' plants value, wherein, n ' is greater than n;
N ' according to each parameter in this m parameter plants value, makes up the second experimental design table;
Utilize the experimental formula of P the eye height that above-mentioned match comes out, every group of experiment in this second experimental design table calculated, calculate P eye height of every group of experiment;
P eye height of every group of experiment of coming out according to aforementioned calculation filters out P eye height all greater than 1 some groups of experiments from the second experimental design table;
Calculate the mean value of P eye height of every group of experiment in this some groups of screening experiment; And
Pick out that maximum group experiment of mean value of being calculated, the value of m parameter during this group is tested is as the optimized value of this m parameter.
2. the method for claim 1 is characterized in that, a said P components and parts are meant P internal memory on the circuit board, and said m the parameter that influences certain parameter of circuit board signal transmission quality is meant the m kind parameter of this P internal memory wiring line segment length.
3. the method for claim 1 is characterized in that, said n is 3.
4. the method for claim 1 is characterized in that, said n ' is 5.
5. the method for claim 1 is characterized in that, the said first experimental design table is to utilize the reaction Surface Method to make up.
6. the method for claim 1 is characterized in that, the said second experimental design table is to utilize the total divisor experimental method to make up.
CN2010105284980A 2010-11-02 2010-11-02 Method for optimized evaluation of parameter influencing circuit board signal transmission quality Pending CN102456086A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010105284980A CN102456086A (en) 2010-11-02 2010-11-02 Method for optimized evaluation of parameter influencing circuit board signal transmission quality

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010105284980A CN102456086A (en) 2010-11-02 2010-11-02 Method for optimized evaluation of parameter influencing circuit board signal transmission quality

Publications (1)

Publication Number Publication Date
CN102456086A true CN102456086A (en) 2012-05-16

Family

ID=46039272

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010105284980A Pending CN102456086A (en) 2010-11-02 2010-11-02 Method for optimized evaluation of parameter influencing circuit board signal transmission quality

Country Status (1)

Country Link
CN (1) CN102456086A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180137228A1 (en) * 2016-11-14 2018-05-17 Fujitsu Limited Simulation assist apparatus and simulation assist method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050201757A1 (en) * 2002-10-08 2005-09-15 Marc Bohn Method and arrangement for determining signal degradations in the presence of signal distortions
CN1758580A (en) * 2004-10-08 2006-04-12 鸿富锦精密工业(深圳)有限公司 Shake graph generating device and method
US20080232520A1 (en) * 2004-11-01 2008-09-25 Synopsys, Inc. Method and apparatus for eye-opening based optimization
CN101755389A (en) * 2007-07-20 2010-06-23 富士通株式会社 Signal transmission apparatus and method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050201757A1 (en) * 2002-10-08 2005-09-15 Marc Bohn Method and arrangement for determining signal degradations in the presence of signal distortions
CN1758580A (en) * 2004-10-08 2006-04-12 鸿富锦精密工业(深圳)有限公司 Shake graph generating device and method
US20080232520A1 (en) * 2004-11-01 2008-09-25 Synopsys, Inc. Method and apparatus for eye-opening based optimization
CN101755389A (en) * 2007-07-20 2010-06-23 富士通株式会社 Signal transmission apparatus and method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
刘烨铭: "高速多板系统信号完整性建模与仿真技术研究", 《中国优秀硕士学位论文全文数据库信息科技辑》, 15 July 2009 (2009-07-15) *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180137228A1 (en) * 2016-11-14 2018-05-17 Fujitsu Limited Simulation assist apparatus and simulation assist method

Similar Documents

Publication Publication Date Title
US7559045B2 (en) Database-aided circuit design system and method therefor
CN101986317B (en) Electronic whole set surface mounting technology production line virtual manufacturing system and realization method thereof
CN109086546B (en) Signal link signal quality evaluation method, device, equipment and readable storage medium
CN109783850A (en) The residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest
WO2020087874A1 (en) Reflow soldering simulation optimization method and system, computer storage medium, and device
CN104899372B (en) In conjunction with emulation and fail-safe analysis highly accelerated stress screeningtest profile construction method
CN112769507B (en) High-speed signal link transmission quality evaluation method and related equipment
CN109583526A (en) Two dimensional code application method, device and the storage medium of pcb board
CN110072166A (en) A kind of hardware adjustment method of digital microphone
US7925999B2 (en) Method of modifying vias connection of printed circuit boards
CN113778513A (en) Automatic generation method, device and equipment of PCB drilling program and storage medium
CN114266219B (en) Layout design optimization method and device suitable for PCBA (printed Circuit Board Assembly) process
CN113673199B (en) Design self-checking method, system and device for controllable depth drilling and storage medium
CN102456086A (en) Method for optimized evaluation of parameter influencing circuit board signal transmission quality
CN105722300A (en) Electroplating quality detection module, printed circuit board motherboard and electroplating quality detection method
CN104202906B (en) Circuit board connecting system
CN103808262B (en) The simulation of multi-hole position holes of products position repairs a die method
CN106685541A (en) WIFI product calibration test system and method based on wireless network mode
TW201300802A (en) System and method for analyzing group delay of signals based on PCB
CN105868889B (en) Method and system for improving production efficiency of circuit board
CN112180296A (en) Testing device and testing method for signal interconnection stability
JP2010147322A (en) Method of creating 3d mounting data of component mounting machine
CN105430918A (en) Manufacturing method of PCB
TWI303031B (en)
CN113191037B (en) Insertion loss prediction method based on form and position tolerance and terminal

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20120516