CN102455415A - Voltage testing device and system - Google Patents
Voltage testing device and system Download PDFInfo
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- CN102455415A CN102455415A CN 201010523100 CN201010523100A CN102455415A CN 102455415 A CN102455415 A CN 102455415A CN 201010523100 CN201010523100 CN 201010523100 CN 201010523100 A CN201010523100 A CN 201010523100A CN 102455415 A CN102455415 A CN 102455415A
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- voltage
- power supply
- measured
- fet
- test device
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Abstract
The invention discloses a voltage testing device and a voltage testing system. The voltage testing device comprises a testing module; the testing module comprises a first testing circuit, a second testing circuit and a field effect tube; the first testing circuit comprises a first comparison chip, the positive input end of the first comparison chip is connected to a power supply to be tested and acquires one reference voltage, and the negative input end of the first comparison chip acquires the upper limit value of the preset voltage of the power supply to be tested; the second testing circuit comprises a second comparison chip, the negative input end of the second comparison chip is connected to the power supply to be tested and acquires the other reference voltage, and the positive input end of the second comparison chip acquires the lower limit value of the preset voltage of the power supply to be tested; and the output ends of both the first comparison chip and the second comparison chip are connected to the grid of the field effect tube, the source of the field effect tube is grounded, and the drain of the field effect tube outputs the testing results of the first comparison chip and the second comparison chip.
Description
Technical field
The present invention relates to a kind of voltage test device and system, relate in particular to a kind of voltage test device and system that power source voltage scope to be measured is tested of being used for.
Background technology
The power supply voltage range of supply unit is an important indicator of weighing its performance quality.After general supply unit manufacturing is accomplished, all need test its power supply voltage range.
Special-purpose power supply test instrument is generally adopted in the test of supply unit.Yet existing power supply test instrument great majority cost an arm and a leg, and make testing cost higher, and versatility is also relatively poor between the power supply test instrument of different model.
Summary of the invention
In view of above content, be necessary to provide a kind of cost lower, versatility is voltage test device preferably.
In addition, be necessary to provide a kind of system with this voltage test device.
A kind of voltage test device is used to test power source voltage scope to be measured and whether meets preset standard; Said voltage test device comprises test module; This test module comprises first test circuit, second test circuit and FET; This first test circuit comprises first comparable chip, and the positive input of this first comparable chip is connected to power supply to be measured, and obtains a reference voltage; The negative input of this first comparable chip obtains the higher limit of this power supply predeterminated voltage to be measured; This second test circuit comprises second comparable chip, and the negative input of this second comparable chip is connected to power supply to be measured, and obtains another reference voltage; The positive input of this second comparable chip obtains the lower limit of this power supply predeterminated voltage to be measured; The output terminal of this first comparable chip and second comparable chip all is connected to the grid of FET, the source ground of this FET, and the test result of first comparable chip and second comparable chip is exported in the drain electrode of this FET.
A kind of voltage testing system is used to test power source voltage scope to be measured and whether meets preset standard, and said voltage testing system comprises this voltage test device and computing machine.
Above-mentioned voltage testing system is respectively the higher limit and the lower limit of power supply predeterminated voltage to be measured through regulating the resistance of this first adjustable resistance and second adjustable resistance respectively, make the win voltage of voltage and the second comparable chip positive input of comparable chip negative input.So, the user is follow-up only need to observe the whether luminous of this light emitting diode, can learn just whether this power source voltage scope to be measured meets preset standard.Its testing cost is lower and versatility is higher, and is easy to use.
Description of drawings
Combine embodiment that the present invention is done further description with reference to the accompanying drawings.
Fig. 1 is the voltage testing system of preferred embodiments of the present invention and the functional block diagram of power supply to be measured.
Fig. 2 is the circuit diagram of control module in the voltage testing system shown in Figure 1.
Fig. 3 is the circuit diagram of switch module in the voltage testing system shown in Figure 1.
Fig. 4 is the circuit diagram of load blocks in the voltage testing system shown in Figure 1.
Fig. 5 is the circuit diagram of test module in the voltage testing system shown in Figure 1.
The main element symbol description
Switch module 13
Load blocks 14
Signal transmission pin USB_D
+, USB_D
-
Switch control pin P1.0
Control signal pin P1.1-P1.4
Receive signal pins TEST
Status pin STATUS
Power supply VCC
Resistance R 1-R4, R6-R8
The first adjustable resistance R5
The second adjustable resistance R9
Light emitting diode D1, D4
Diode D2-D3
Stabilivolt D5, D6
FET Q
0-Q
2
Relay K
0, K
2
The first coil-end L
0, L
2
The second coil-end L
1, L
3
Normal battle NO
0, NO
1
Common point COM
0, COM
1
Load selection circuit 141-144
The first comparable chip T1
The second comparable chip T2
Embodiment
Please with reference to Fig. 1, preferred embodiments of the present invention provides a kind of voltage testing system 100, and whether the voltage range that is used to test a power supply 200 to be measured meets preset standard.This voltage testing system 100 comprises voltage test device 10 and computing machine 20.
This voltage test device 10 comprises network interface 11, control module 12, switch module 13, load blocks 14 and test module 15.Said network interface 11 can be the prior USB interface, and it connects said control module 12 and computing machine 20, is used for instruction with said computing machine 20 and is transferred to said control module 12 and the output signal of said control module 12 is transferred to computing machine 20.
Please consult Fig. 2 in the lump, said control module 12 comprises control chip 121, and the model of this control chip 121 can be CY7C63803-SXC, comprises one group of signal transmission pin USB_D
+, USB_D
-, switch control pin P1.0, one group of control signal pin P1.1-P1.4, receive signal pins TEST and status pin STATUS.This signal transmission pin USB_D
+, USB_D
-All be connected to network interface 11,, and send test result to computing machine 20 in order to the instruction through network interface 11 receiving computers 20.This switch control pin P1.0 is connected to switch module 13, is used for the unlatching through switch module 13 these power supplys 200 to be measured of corresponding control and closes.This control signal pin P1.1-P1.4 is connected to load blocks 14, is used for power supply 200 to be measured is loaded different loads.This reception signal pins TEST is connected to test module 15, is used to receive the test result of this test module 15, and this test result is handled the back is sent to computing machine 20 through network interface 11 and shows.This status pin STATUS is connected to a power supply VCC through the light emitting diode D1 and the resistance R 1 of series connection, is used to show the duty of this control module 12.For example, when status pin STATUS exports a low level, said light emitting diode D1 conducting, it is normally luminous, shows this control module 12 operate as normal.
See also Fig. 3, this switch module 13 comprises FET Q
0And relay K
0, this FET Q
0Grid be connected to switch control pin P1.0, and be connected to power supply VCC through resistance R 2.This FET Q
0Source ground, this FET Q
0Drain electrode be connected to relay K
0The first coil-end L
0This relay K
0The second coil-end L
1Be connected to power supply VCC.This relay K
0Normal battle of NO
0And common point COM
0All be connected to power supply 200 to be measured.When switch control pin P1.0 exports a high level, said FET Q
0Conducting, and then make relay K
0Conducting is to open this power supply 200 to be measured.Otherwise, when switch control pin P1.0 exports a low level, said FET Q
0And relay K
0All end, said power supply 200 to be measured is closed.So, input to the switch control pin P1.0 of switch module 13 through control, can corresponding unlatching and close this power supply 200 to be measured.This relay K
0On also be connected with diode D2, be used to avoid relay K
0In the switching that starts and close, produce high back voltage, and then prevent FET Q
0Burn.
See also Fig. 4; This load blocks 14 comprises four groups of load selection circuit 141-144; The particular circuit configurations of each load selection circuit and switch module 13 are roughly the same, and its difference is that the grid of FET is to be connected to the control signal corresponding pin (like FET Q
1Grid be connected to control signal pin P1.1), the common point of relay then is connected to power supply to be measured 200 (like relay K through corresponding load
1Common point COM
1Be connected to power supply 200 to be measured through load RL1), the ground connection of often making war is repeated no more here.Said load blocks 14 is used for successively power supply 200 to be measured being loaded different loads according to the signal of said control signal pin transmission.In the present embodiment, be that 6 ohm of power are that 50 watts load is that example is explained with resistance.When wherein arbitrary control signal pin (like control signal pin P1.1) is exported high level, corresponding relays K
1Conducting, this moment, load blocks 14 was that 50 watts load RL1 is connected to power supply 200 to be measured with power; When the output of any two control signal pins (like control signal pin P1.1-P1.2) wherein high level, this load blocks 14 is that the load (RL1 and RL2) of 100W is connected to power supply 200 to be measured with power, and the like.
See also Fig. 5, test module 15 comprises first test circuit 151, second test circuit 152, FET Q
2And light emitting diode D4.This first test circuit 151 is used to test the higher limit of said power supply to be measured 200 voltages, and it comprises the first comparable chip T1.The model of this first comparable chip T1 can be LM393; Its positive input is connected to power supply 200 to be measured through resistance R 4; And through stabilivolt D5 ground connection; Voltage with will this power supply 200 to be measured is stabilized in a certain value (like 5.1V), and the positive input that exports the first comparable chip T1 to voltage as a reference.The negative input of this first comparable chip T1 is connected to power supply 200 to be measured through the first adjustable resistance R5, and makes the end ground connection of the adjustable resistance R5 that wins, and then regulates the voltage that this power supply 200 to be measured inputs to the first comparable chip T1 negative input.The output terminal of this first comparable chip T1 is connected to FET Q
2Grid, and be connected to power supply 200 to be measured through resistance R 6.This FET Q
2Source ground.This FET Q
2Drain electrode be connected to the negative electrode of light emitting diode D4.The anode of this light emitting diode Q4 is connected to power supply VCC through resistance R 7.This second test circuit 152 is used to test the lower limit of said power supply to be measured 200 voltages; Its particular circuit configurations and first test circuit, 151 structures are roughly the same; Difference is that the negative input of this second comparable chip T2 is to be connected to power supply 200 to be measured through resistance R 8; And through stabilivolt D6 ground connection, be stabilized in a certain value (like 5.1V) with voltage that will this power supply 200 to be measured, and the negative input that exports the second comparable chip T2 to is as another reference voltage.The positive input of this second comparable chip T2 then is connected to power supply 200 to be measured through the second adjustable resistance R9, repeats no more here.The voltage accuracy scope of the power supply to be measured 200 that the resistance of this first adjustable resistance R5 and the second adjustable resistance R9 can provide according to each manufacturer is regulated.For example regulate the first adjustable resistance R5 and the second adjustable resistance R9, make that the voltage that inputs to the first comparable chip T1 negative input is the higher limit of power supply 200 reference voltages to be measured; The voltage that inputs to the second comparable chip T2 positive input is the lower limit of power supply 200 reference voltages to be measured.If when the virtual voltage scope that records this power supply 200 to be measured satisfied this voltage accuracy scope, then this first comparable chip T1 and the second comparable chip T2 all exported a high level, make FET Q
2Conducting.This light emitting diode D4 conducting this moment is also luminous, and said FET Q
2The voltage of drain electrode place is low level.If the actual voltage range that records power supply 200 to be measured does not satisfy this voltage accuracy; The for example actual voltage that records power supply 200 to be measured is greater than this higher limit; During perhaps less than this lower limit, any comparable chip will be exported a low level among this first comparable chip T1 or the second comparable chip T2.At this moment, this FET Q
2To end, make that light emitting diode D4 will be not luminous, and said FET Q
2The voltage of drain electrode place is high level.This FET Q
2Drain electrode also be connected to the reception signal pins TEST of control module 12, be used for test result is sent to control module 12 through this pin, after this control module 12 receives these signals, will handle and through signal transmission pin USB_D it
+, USB_D
-Be transferred to network interface 11, and finally send computing machine 20 to and show.
To introduce the principle of work of the voltage testing system 100 of preferred embodiments of the present invention below in detail:
During test, at first the user is through computing machine 20 inputs one test instruction, and said control module 12 receives this test instruction through network interface 11, and gives switch module 13 and load blocks 14 according to this test instruction output control signal corresponding.Said switch module 13 receives these control signals, and corresponding startup or close this power supply 200 to be measured.After starting this power supply 200 to be measured, said control module 12 is given load blocks 14 through control signal pin P1.1-P1.4 output control signal corresponding, so that load blocks 14 loads different loads to power supply 200 to be measured successively.After having loaded corresponding load; The resistance that the user regulates this first adjustable resistance R5 and the second adjustable resistance R9 respectively according to power supply 200 preset voltage accuracy scopes to be measured makes the voltage of this first comparable chip T1 negative input and the voltage of the second comparable chip T2 positive input equal upper voltage limit value and the lower limit that this power supply 200 to be measured is preset respectively.Respectively the voltage range that is loaded with unequally loaded power supply 200 to be measured is tested through this test module 15 at last; And measurement result is sent to control module 12 through receiving signal pins TEST; After this control module 12 receives this signal, it is handled and transmit pin USB_D through signal
+, USB_D
-Be transferred to network interface 11; And finally send computing machine 20 to and show, make the user and to combine the whether luminous of light emitting diode D4 to judge whether the operating voltage range of power supply 200 to be measured under different loads meets preset standard according to said computing machine 20 result displayed.
Be appreciated that said power supply VCC can use power supply 200 to be measured to substitute.
Obviously; Voltage testing system 100 of the present invention is respectively the higher limit and the lower limit of power supply 200 predeterminated voltages to be measured through regulating the resistance of this first adjustable resistance R5 and the second adjustable resistance R9 respectively, make the win voltage of voltage and the second comparable chip T2 positive input of comparable chip T1 negative input.So, the user is follow-up only need to observe the whether luminous of this light emitting diode D4, can learn just whether the voltage range of this power supply 200 to be measured meets preset standard.In addition; This voltage testing system 100 is through being provided with control module 12; Can control automatically power supply 200 to be measured unlatching, close, and power supply to be measured 200 is loaded different loads, make this voltage testing system 100 to test the voltage range of the power supply to be measured 200 under the different loads respectively; Its testing cost is lower and versatility is higher, and is easy to use.
In addition, those skilled in the art also can make various modifications, interpolation and the replacement on other forms and the details in claim of the present invention scope of disclosure and spirit.Certainly, these all should be included within the present invention's scope required for protection according to the variations such as various modifications, interpolation and replacement that the present invention's spirit is made.
Claims (9)
1. a voltage test device is used to test power source voltage scope to be measured and whether meets preset standard; It is characterized in that: said voltage test device comprises test module; This test module comprises first test circuit, second test circuit and FET; This first test circuit comprises first comparable chip, and the positive input of this first comparable chip is connected to power supply to be measured, and obtains a reference voltage; The negative input of this first comparable chip obtains the higher limit of this power supply predeterminated voltage to be measured; This second test circuit comprises second comparable chip, and the negative input of this second comparable chip is connected to power supply to be measured, and obtains another reference voltage; The positive input of this second comparable chip obtains the lower limit of this power supply predeterminated voltage to be measured; The output terminal of this first comparable chip and second comparable chip all is connected to the grid of FET, the source ground of this FET, and the test result of first comparable chip and second comparable chip is exported in the drain electrode of this FET.
2. voltage test device as claimed in claim 1; It is characterized in that: the negative input of the positive input of this first comparable chip and second comparable chip is respectively through stabilivolt ground connection; With respectively with said power supply voltage stabilizing to be measured to reference voltage and said another reference voltage; The negative input of first comparable chip is connected to power supply to be measured through first adjustable resistance; And make an end ground connection of the adjustable resistance of winning, to obtain the higher limit of said power supply predeterminated voltage to be measured, the positive input of this second comparable chip is connected to power supply to be measured through second adjustable resistance; And make an end ground connection of second adjustable resistance, to obtain the lower limit of this power supply predeterminated voltage to be measured.
3. voltage test device as claimed in claim 1; It is characterized in that: said voltage test device comprises control module and switch module; Said control module comprises control chip; Said control chip comprises switch control pin, and this switch control pin is connected to switch module, is used for the unlatching through corresponding this power supply to be measured of control of switch module and closes.
4. voltage test device as claimed in claim 3 is characterized in that: said control chip comprises status pin, and this status pin is connected to a power supply through the light emitting diode and the resistance of series connection, is used to show the duty of this control module.
5. voltage test device as claimed in claim 4 is characterized in that: said switch module comprises FET and relay, and the grid of the FET of this switch module is connected to switch control pin; And be connected to this power supply, and the source ground of the FET of this switch module, the drain electrode of the FET of this switch module is connected to first coil-end of relay; Second coil-end of this relay is connected to power supply; The normal battle and the common point of this relay all are connected to power supply to be measured, when switch control pin output high level, and the FET conducting of said switch module; And then make the relay conducting, to open this power supply to be measured; Otherwise when switch control pin output low level, the FET and the relay of said switch module all end, said power-off to be measured.
6. voltage test device as claimed in claim 5; It is characterized in that: said voltage test device comprises load blocks; Said control chip comprises one group of control signal pin, and this control signal pin is connected to load blocks, is used for power supply to be measured is loaded different loads.
7. voltage test device as claimed in claim 6; It is characterized in that: said load blocks comprises four groups of load selection circuit; The particular circuit configurations of each load selection circuit is identical with switch module; The grid of the FET of each load selection circuit is connected to the control signal corresponding pin, and the common point of the relay of each load selection circuit is connected to power supply to be measured through corresponding load, normal battle of the ground connection of the relay of each load selection circuit.
8. a voltage testing system is used to test power source voltage scope to be measured and whether meets preset standard, it is characterized in that: said voltage testing system comprises like each described voltage test device and computing machine in the claim 1-7 item.
9. voltage testing system as claimed in claim 8; It is characterized in that: said voltage test device comprises network interface; This network interface is connected to computing machine, is used for instruction with computing machine and is transferred to said voltage test device and the output signal of voltage test device is transferred to computing machine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010523100 CN102455415A (en) | 2010-10-28 | 2010-10-28 | Voltage testing device and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010523100 CN102455415A (en) | 2010-10-28 | 2010-10-28 | Voltage testing device and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102455415A true CN102455415A (en) | 2012-05-16 |
Family
ID=46038824
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010523100 Pending CN102455415A (en) | 2010-10-28 | 2010-10-28 | Voltage testing device and system |
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|---|---|
| CN (1) | CN102455415A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102736038A (en) * | 2012-06-29 | 2012-10-17 | 浪潮电子信息产业股份有限公司 | Abnormal power supply accurate positioning and warning device |
| CN102798824A (en) * | 2012-08-13 | 2012-11-28 | 能极电源(深圳)有限公司 | Series connection monitoring circuit of power sources in parallel connection and realizing method thereof |
| CN105675961A (en) * | 2016-02-19 | 2016-06-15 | 广州市诚臻电子科技有限公司 | Voltage testing device and system capable of bearing high electromagnetic radiation field, and application |
| CN105911483A (en) * | 2016-04-18 | 2016-08-31 | 北京小米移动软件有限公司 | Power chip testing device and method |
| CN113495205A (en) * | 2020-03-18 | 2021-10-12 | 华为技术有限公司 | Circuit testing device |
| CN114236226A (en) * | 2021-12-20 | 2022-03-25 | 上海瑞浦青创新能源有限公司 | Voltage measurement circuit |
| CN115079019A (en) * | 2022-08-23 | 2022-09-20 | 北京索英电气技术有限公司 | Battery cell test protection system |
| CN116298473A (en) * | 2023-05-17 | 2023-06-23 | 湖南大学 | Non-contact measurement method, device, equipment and medium for chip pin voltage |
-
2010
- 2010-10-28 CN CN 201010523100 patent/CN102455415A/en active Pending
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102736038A (en) * | 2012-06-29 | 2012-10-17 | 浪潮电子信息产业股份有限公司 | Abnormal power supply accurate positioning and warning device |
| CN102798824A (en) * | 2012-08-13 | 2012-11-28 | 能极电源(深圳)有限公司 | Series connection monitoring circuit of power sources in parallel connection and realizing method thereof |
| CN105675961A (en) * | 2016-02-19 | 2016-06-15 | 广州市诚臻电子科技有限公司 | Voltage testing device and system capable of bearing high electromagnetic radiation field, and application |
| CN105911483A (en) * | 2016-04-18 | 2016-08-31 | 北京小米移动软件有限公司 | Power chip testing device and method |
| CN113495205A (en) * | 2020-03-18 | 2021-10-12 | 华为技术有限公司 | Circuit testing device |
| CN114236226A (en) * | 2021-12-20 | 2022-03-25 | 上海瑞浦青创新能源有限公司 | Voltage measurement circuit |
| CN115079019A (en) * | 2022-08-23 | 2022-09-20 | 北京索英电气技术有限公司 | Battery cell test protection system |
| CN116298473A (en) * | 2023-05-17 | 2023-06-23 | 湖南大学 | Non-contact measurement method, device, equipment and medium for chip pin voltage |
| CN116298473B (en) * | 2023-05-17 | 2023-08-08 | 湖南大学 | Non-contact measurement method, device, equipment and medium for chip pin voltage |
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
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Application publication date: 20120516 |