CN102455273B - Method for measuring atomic oxygen flux density - Google Patents

Method for measuring atomic oxygen flux density Download PDF

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Publication number
CN102455273B
CN102455273B CN201010523070.7A CN201010523070A CN102455273B CN 102455273 B CN102455273 B CN 102455273B CN 201010523070 A CN201010523070 A CN 201010523070A CN 102455273 B CN102455273 B CN 102455273B
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China
Prior art keywords
atomic oxygen
solar cell
flux density
piece
measuring
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Expired - Fee Related
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CN201010523070.7A
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Chinese (zh)
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CN102455273A (en
Inventor
刘向鹏
李涛
姜海富
赵雪
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Beijing Institute of Spacecraft Environment Engineering
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Beijing Institute of Spacecraft Environment Engineering
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Abstract

The invention discloses a method for measuring atomic oxygen flux density. According to the method, two solar cells of the same specification, serving as detector probes, are arranged at the same position in an atomic oxygen environment, the main surface of the first solar cell is coated with a semipermeable membrane, the second solar cell (reference solar cell) is not coated with a semipermeable membrane, the two solar cells are adhered to a substrate through a known solar cell array process, and the atomic oxygen flux density of the environment can be measured through measuring the change of two short-circuit currents. The detector probe used in the method are solar cells which are commonly used in satellites and have the advantages of no power consumption, light weight and small size. The method can be applied to any satellite, has advantages of generality, low price and reliability, can be used for monitoring an orbiting atomic oxygen environment of a spacecraft in real time and can provide data support for the reliability design of long-life spacecraft in a low earth orbit.

Description

The measuring method of atomic oxygen flux density
Technical field
The invention belongs to Space environment detection field, specifically, the present invention relates to a kind of method utilizing solar cell to measure atomic oxygen environment density.
Background technology
Atomic oxygen flux density can be measured by many technology, comprises the mass loss method of calibration sample, QCM (Quartz Crystal Microbalance) method (QCM), mass spectroscopy, electric resistance sensor method etc.These methods or extremely costliness, require recovery sample, or realize on spacecraft very complicated being difficult to.Therefore the method that proposition one is new, utilizes solar cell to carry out track atom oxygen flux density and measures.
Solar battery surface covers the semipermeable membrane material of one deck elemental oxygen sensitivity, such as polyimide film or amorphous carbon film.Semi-permeable diaphragm is under atomic oxygen environment effect, and transmitance changes.Semi-permeable diaphragm optical transmittance changes, and causes the change of solar cell short-circuit current, by measuring the change of battery short circuit electric current, obtains the flux density of atomic oxygen environment.
Summary of the invention
The object of the present invention is to provide a kind of measuring method of flux density of elemental oxygen, the method utilizes the impact of transmitance change on solar cell short-circuit current of semi-permeable diaphragm, thus completes the test of atomic oxygen flux density.
To achieve these goals, present invention employs following technical scheme:
A kind of measuring method of atomic oxygen flux density, the same position be included in atomic oxygen environment arranges the solar cell piece as detector probe of two same sizes, the first type surface semi-permeable diaphragm of first piece of cell piece carries out coated, and second piece of cell piece (reference solar cell sheet) does not cover semi-permeable diaphragm, two pieces of cell pieces are bonded on substrate by known solar battery array technique, two slotted lines are drawn respectively from two solar cell pieces, respective short-circuit current is measured, by measuring the change of battery short circuit electric current, obtain the flux density of atomic oxygen environment.
Preferably, described semi-permeable diaphragm is polyimide film or amorphous carbon film.
Preferably, described substrate is aluminium sheet, aluminum honeycomb panel etc.
The detector probe that measuring method of the present invention adopts is the solar cell that satellite is conventional, and idle, lightweight, volume is little.Can be used on any satellite, there is versatility, cheap, reliable, can realize spacecraft in-orbit atomic oxygen environment Real-Time Monitoring and for the Low Earth Orbit long-life spacecraft reliability design Data support is provided.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the measuring method of atomic oxygen flux density of the present invention.
Wherein, 1-reference solar cell sheet; 2-solar cell piece; 3-semi-permeable diaphragm.
Embodiment
Be described in detail referring to the measuring method of accompanying drawing to the flux density of elemental oxygen of the present invention, but this is only exemplary, be not intended to limit its protection domain, its protection domain is limited by the claim of enclosing.
As shown in Figure 1, the measuring method of the flux density of elemental oxygen of the present invention comprises employing two solar cell pieces, the coated semi-permeable diaphragm 3 of first type surface of first solar cell piece 2 is as polyimide film, amorphous carbon film, this solar cell piece corrodes under exposing atomic oxygen environment, the optical transmittance of semi-permeable diaphragm changes, and the short-circuit current of solar cell can change thereupon.Second piece of solar cell piece (reference solar cell sheet 1) does not cover semi-permeable diaphragm, corrodes, can eliminate the impact at temperature and illumination angle like this under atomic oxygen environment.Because the short-circuit current of solar cell is relevant with the transmitance of semi-permeable diaphragm, therefore, atomic oxygen erosion can affect the optical transmittance of semi-permeable diaphragm, closely affects the short-circuit current of solar cell.Wherein, described substrate is aluminium sheet, aluminum honeycomb panel etc.
Based on this, the measuring method of the present invention same position be specifically included in atomic oxygen environment arranges two solar cell pieces, the first type surface semi-permeable diaphragm of first piece of cell piece carries out coated, and second piece of cell piece (reference solar cell sheet) does not cover semi-permeable diaphragm, two pieces of cell pieces are bonded on substrate by known solar battery array technique, two slotted lines are drawn respectively from two solar cell pieces, respective short-circuit current is measured, by measuring the change of battery short circuit electric current, obtain the flux density of atomic oxygen environment.
Although be described in detail the specific embodiment of the present invention above and illustrate, but what should indicate is, we can make various changes and modifications above-mentioned embodiment, but these do not depart from spirit of the present invention and the scope described in appended claim.

Claims (2)

1. the measuring method of an atomic oxygen flux density, the same position be included in atomic oxygen environment arranges the solar cell piece as detector probe of two same sizes, the first type surface semi-permeable diaphragm of first piece of cell piece carries out coated, and second piece of cell piece does not cover semi-permeable diaphragm, two pieces of cell pieces are bonded on substrate by known solar battery array technique, from two pieces of solar cell pieces, draw two slotted lines respectively, respective short-circuit current is measured; By measuring the change of battery short circuit electric current, obtain the atomic oxygen flux density of atomic oxygen environment, wherein, described semi-permeable diaphragm is polyimide film or amorphous carbon film.
2. the method for claim 1, wherein described substrate is aluminium sheet or aluminum honeycomb panel.
CN201010523070.7A 2010-10-28 2010-10-28 Method for measuring atomic oxygen flux density Expired - Fee Related CN102455273B (en)

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CN102455273B true CN102455273B (en) 2015-04-08

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CN104375161B (en) * 2014-11-05 2017-02-15 北京卫星环境工程研究所 atomic oxygen beam energy testing system
KR102219619B1 (en) * 2016-02-03 2021-02-23 내셔날 인스티튜트 오브 어드밴스드 인더스트리얼 사이언스 앤드 테크놀로지 Standard gas barrier film
CN107748185A (en) * 2017-09-01 2018-03-02 兰州空间技术物理研究所 A kind of elemental oxygen fluence measuring method and atomic oxygen sensor
CN114609678B (en) * 2022-05-11 2022-08-19 兰州空间技术物理研究所 In-situ detector for dust deposition quality caused by lifting of spacecraft on lunar surface

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