CN102446375B - Coin dynamic electromagnetic characteristic test method and system - Google Patents
Coin dynamic electromagnetic characteristic test method and system Download PDFInfo
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- CN102446375B CN102446375B CN201010298471.7A CN201010298471A CN102446375B CN 102446375 B CN102446375 B CN 102446375B CN 201010298471 A CN201010298471 A CN 201010298471A CN 102446375 B CN102446375 B CN 102446375B
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- 238000010998 test method Methods 0.000 title claims abstract description 7
- 238000012360 testing method Methods 0.000 claims abstract description 52
- 238000000034 method Methods 0.000 claims abstract description 12
- 230000008569 process Effects 0.000 claims abstract description 4
- 230000003534 oscillatory effect Effects 0.000 claims description 33
- 238000001914 filtration Methods 0.000 claims description 23
- 238000007493 shaping process Methods 0.000 claims description 20
- 230000008859 change Effects 0.000 claims description 12
- XOKSLPVRUOBDEW-UHFFFAOYSA-N pinane Chemical compound CC1CCC2C(C)(C)C1C2 XOKSLPVRUOBDEW-UHFFFAOYSA-N 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 238000005562 fading Methods 0.000 claims description 3
- 229930006728 pinane Natural products 0.000 claims description 3
- 238000000151 deposition Methods 0.000 claims description 2
- 230000005672 electromagnetic field Effects 0.000 claims description 2
- 230000010355 oscillation Effects 0.000 abstract 5
- 239000003990 capacitor Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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Abstract
The invention relates to a coin dynamic electromagnetic characteristic test method. A test coil is respectively put on both sides of a coil channel; the two coils are connected in series or parallel; two output lines are connected with the input end of an LC oscillation circuit; and after a coin enters, the frequency and amplitude of the alternating signal of the LC oscillation circuit are varied, and the variation is corresponding to the electromagnetic characteristic of the coin. Firstly, in the process that the coin enters the test coil and exits from the test coil, the frequency and amplitude variation process of the alternating signal of the LC oscillation circuit is recorded, and can also be displayed, stored and printed; secondly, the maximum variation amount Deltaf[m] of the alternating signal frequency of the LC oscillation circuit is measured, and the point time t[fm] of the maximum variation amount and the variation and SIGMA Deltaf within +/- 5-30ms (centered by t[fm]) can be measured; and thirdly, both the maximum variation amount DeltaV[m] of the alternating signal amplitude of the LC oscillation circuit and the point time t[vm] and amplitude attenuation rate V' of the maximum variation amount can be measured. The authenticity and value of the coin are recognized according to the parameters.
Description
One, technical field
The present invention relates to the dynamic electromagnetic signature method of testing of a kind of coin and system.It can enter coin test coil to withdrawing from test coil, and frequency, the changes in amplitude of LC oscillatory circuit are noted, and can show, store, print.It can extract series of parameters from the variation of noting, according to the true and false and the value of money of these parameter identification coins.
Two, background technology
For being different from the coin of other kind, show self-value of money and false proof, every kind of coin has the feature of oneself.The coin feature has two covers, and wherein a cover is visual signature, is called popular anti-counterfeiting characteristic again, comprises the size, color, material, decorative pattern of coin etc.Another set of is electromagnetic signature, is called expert's anti-counterfeiting characteristic again, comprises AC conductivity, maximum magnetic induction, remanent magnetism, coercive force, initial permeability, maximum permeability of dc conductivity, the coin of coin etc.Above coin electromagnetic signature all available static method is accurately measured its absolute value.New coin is carried out electromagnetic signature design, coin is carried out the electromagnetic signature analysis and coin quality detects, the common static mensuration.
Used Coin cleaning-sorting machine, subway ticket machine, public transport slot machine etc. are identified the coin electromagnetic signature and are all used dynamic measuring method in the specie flow field.Lay a test coil respectively in both sides, coin road, two coils or series connection link to each other, or in parallel linking to each other, and two output lines link to each other with the input end of a LC oscillatory circuit, and like this, the output terminal of LC oscillatory circuit is just exported an alternating signal.When true and false coin passes through test coil, action of alternating magnetic field in the coil is on coin, just induce current vortex in the coin, current vortex produces a secondary magnetic again, it and former magnetic field mutual superposition cause former magnetic field to change, make that magnetic flux changes in the test coil, thereby the complex impedance of test coil is changed, this variation causes shake frequency and the amplitude of alternating signal of pinane circuit of LC that corresponding the variation taken place.This variation is corresponding one by one with the electromagnetic signature of coin, so the variation of measuring alternating signal just is equivalent to measure the electromagnetic signature of coin, thereby reaches the purpose of debating the other coin true and false and value of money.
Eddy-current method Coin validator is early only identified coin according to LC oscillatory circuit alternating signal changes in amplitude maximal value, and coin is only identified according to the frequency change maximal value of LC oscillatory circuit in the port of current trend all Coin validator such as series.China Patent No.: ZL03113396.7, Coin validators such as German scan coin are then according to frequency variation and the changes in amplitude maximal value of LC oscillatory circuit, and namely two-dimentional variable quantity is identified coin.
Three, summary of the invention
The present invention seeks to: propose the dynamic electromagnetic signature method of testing of a kind of coin and system, attempt the more amounts relevant with the coin electromagnetic signature of integration test, react the electromagnetic signature of coin more comprehensively, further improve the coin recognizing method rate.
Technical solution of the present invention is: the dynamic electromagnetic signature method of testing of coin, lay a test coil respectively in both sides, coin road, the series connection of two coils links to each other or in parallel linking to each other, two output lines link to each other with the input end of a LC oscillatory circuit, after entering, coin make the shake frequency of alternating signal and the amplitude of pinane circuit of LC that corresponding the variation taken place, this variation is corresponding with the electromagnetic signature of coin, it is characterized in that: first, coin is entered test coil up to withdrawing from test coil, frequency and the changes in amplitude process record of LC oscillatory circuit alternating signal get off, and can show, storage, print this change procedure; The second, measure the maximum variation delta f of LC oscillatory circuit alternating signal frequency
m, and can measure the time point t of this maximum variable quantity
FmAnd with t
FmCentered by, change and ∑ Δ f in positive and negative 5-30ms a period of time; The 3rd, not only can measure the maximum variation delta V of LC oscillatory circuit alternating signal amplitude
m, and can measure the time point t of this maximum variable quantity
VmAnd amplitude fading rate V '.Data according to above-mentioned measurement are judged the true and false of coin.
When coin does not enter test coil, the frequency of single-chip microcomputer test LC oscillatory circuit, and the frequency f of shaping circuit output
0With the amplitude of LC oscillatory circuit alternating signal, and the voltage V of current rectifying and wave filtering circuit output
0, they have reflected when coin does not enter electromagnetic field, the original state of LC oscillatory circuit.
After coin entered test coil, single-chip microcomputer was opened wave-number counter, after the Δ t time, closed the wave number register, read the wave number f in the Δ t time
1, and the magnitude of voltage V of test current rectifying and wave filtering circuit
1Open the wave number register again, close the wave number register after the Δ t time again, measure f
2And V
2, withdraw from test coil up to coin.
Calculate: Δ f
i=f
i-f
of
iRefer to the wave number in certain Δ t time;
Δ V
i=V
i-V
oV
iThe magnitude of voltage that refers to current rectifying and wave filtering circuit in certain Δ t time;
Find out Δ f
iMiddle maximal value Δ f
mCorresponding time point t with it
Fm, calculate with t
FmCentered by, change and ∑ Δ f in positive and negative 10ms a period of time; Find out Δ V
iIn maximal value Δ V
mCorresponding time point t with it
VmCalculate attenuation rate V '=Δ V of the voltage V of current rectifying and wave filtering circuit
m-Δ V
Tvm+n Δ t
Each genuine note is corresponding one group of dynamic electromagnetic signature parameter, that is: Δ f all
m, t
Fm, variation and ∑ Δ f, Δ V
m, t
VmAnd V ', the electromagnetic signature parameter of each genuine note of every suit coin is stored in the single-chip microcomputer respectively by value of money.Measure one group of electromagnetic signature parameter of one piece of coin when single-chip microcomputer after, just this group parameter is compared with the electromagnetic signature parameter of genuine note in the internal memory.When the feature of this group electromagnetic signature parameter and a certain genuine note is close (considering certain error), it is genuine note that single-chip microcomputer is just declared this piece coin, and definite its value of money.As all not being inconsistent with the genuine note feature of depositing, then sentence it as counterfeit money.
The alternating signal change procedure that the present invention tests and parameter are corresponding to the electromagnetic signature of coin, so, the invention provides a kind of instrument that can analyze the coin electromagnetic signature, also provide new technical support for Coin cleaning-sorting machine, the Coin validator of developing high discrimination simultaneously.
The dynamic electromagnetic signature test macro of coin is characterized in that being made up of signal acquisition circuit, signal processing circuit and computer, and wherein signal acquisition circuit comprises test coil L1, L2, LC oscillatory circuit; Signal processing circuit comprises shaping circuit 5, current rectifying and wave filtering circuit 6, single-chip microcomputer 7.Wherein the signal output part of testing sensor L1, L2 connects the input end of LC oscillatory circuit; The output termination shaping circuit of LC oscillatory circuit, current rectifying and wave filtering circuit; The output terminal of shaping circuit, current rectifying and wave filtering circuit connects the input end of single-chip microcomputer, the USB mouth of the output termination computer of single-chip microcomputer, and another USB mouth of computer connects the USB mouth of printer.Test coil L1, L2 link to each other with the LC oscillatory circuit, produce alternating signal; Shaping circuit is put in order alternating signal and is square-wave signal, so that the single-chip microcomputer counting.Current rectifying and wave filtering circuit becomes voltage with the amplitude of alternating signal, so that the single-chip microcomputer sampling.Single-chip microcomputer is responsible for test and is made corresponding signal and handle, and by serial port, test result is passed to computer.Computer shows, stores, prints and finish.
Two test coils are in series or are associated.One termination oscillatory circuit transistor T, 1 collector of test coil, the common tie point place of other end connecting resistance R1, R2, capacitor C 1, C2, C3.
The output terminal of LC oscillator is the input end that resistance R 4 meets shaping circuit U1, and the LC oscillator output end connects the input end of current rectifying and wave filtering circuit, the i.e. base stage of transistor T 2 by capacitor C 5.
The output terminal of shaping circuit is the input end that the output terminal of shaping integrated circuit U1 connects single-chip microcomputer, i.e. " 11 " pin of single-chip microcomputer integrated circuit U3, and the output terminal of current rectifying and wave filtering circuit is " 2 " pin that the collector of transistor T 3 meets single-chip microcomputer integrated circuit U3.The output terminal of single-chip microcomputer is the USB interface that single-chip microcomputer integrated circuit " 17 " pin connects computer.The computer expert crosses another USB interface and connects printer.Test coil is positioned at two of coin road.
Finally, the result that single-chip microcomputer will be tested sends computer to by serial port, to pass data as follows:
1. a series of Δ f
i2. a series of Δ V
i3. original state f
0, V
04. the maximum variation delta f of frequency
mWith time point t
FmAnd change and ∑ Δ f; 5. the maximum variation delta V of amplitude
mWith time point t
Vm6. amplitude fading rate V '; 7. value of money.
Computer shows with a certain color all characteristic parameters with one piece of coin.A series of Δ f wherein
iWith Δ V
iBe shown as curve, other shows its value.Computer can be used several colors, shows the electromagnetic signature parameter of several pieces of coins simultaneously, is used for relatively, stores, prints.
3. beneficial effect, the present invention compared with prior art has following beneficial effect:
1. the present invention can enter coin test coil to withdrawing from test coil, and the change procedure of LC oscillatory circuit and shaping circuit and current rectifying and wave filtering circuit is noted, and can show, compare, store, print.
2. the present invention not only can measure the maximum frequency variation delta f that coin causes
m, and can measure Δ f
mThe time point t that occurs
Fm, and change and ∑ Δ f.
3. the present invention not only can measure the amplitude peak variation delta V that coin causes
m, and can measure Δ V
mThe time point t that occurs
Vm
Voltage attenuation rate V ' when 4. the present invention can measure coin and withdraws from test coil.
5. the present invention can use multiple color, shows the dynamic electromagnetic signature of many pieces of coins simultaneously, so that relatively.
Four, description of drawings
Fig. 1 is the schematic diagram of the dynamic electromagnetic signature test macro of coin of the present invention.Wherein have: coin road 1, coin 2, LC oscillatory circuit 4, shaping circuit 5, current rectifying and wave filtering circuit 6, single-chip microcomputer 7, computer 8, printer 9.
Fig. 2 is that test coil L1 of the present invention, L2 are installed in the synoptic diagram in the coin road of coin slot.Wherein have: coin slot 11, coin road 1, infrared synchronizing laser beam 14, test coil 15, true, counterfeit money go-on-go electromagnet 16.
Fig. 3 is electrical schematic diagram of the present invention.
Fig. 4 is the dynamic electromagnetic signature test macro of coin of the present invention frequency test curve
Fig. 5 is the test curve that voltage magnitude changes the AC impedance of in fact having reacted coin
Five, specific embodiments
The dynamic electromagnetic signature test macro of coin of the present invention is made up of signal acquisition circuit, signal processing circuit and computer, printer.Signal acquisition circuit comprises test coil L1, L2, LC oscillatory circuit 4; Signal processing circuit comprises shaping circuit 5, current rectifying and wave filtering circuit 6, single-chip microcomputer 7.The input end of the output termination LC oscillatory circuit 4 of test coil L1, L2 wherein, the output termination shaping circuit 5 of LC oscillatory circuit 4, current rectifying and wave filtering circuit 6.The output terminal of shaping circuit 5, current rectifying and wave filtering circuit 6 connects input end " 11 " and " 2 " of single-chip microcomputer 7 respectively.The output terminal of single-chip microcomputer 7 " 17 " connects the USB interface of computer.Sensor L1 and sensor L2 are in series, the current collection number of transistor T 1 in another termination oscillatory circuit 4 of sensor L2, the common tie point place of other end connecting resistance R1, the R2 of sensor L1, capacitor C 1, C2, C3.The output terminal of LC oscillator 4 is that resistance R 4 connects the input end that shaping circuit 5 is shaping integrated circuit U1, and the input end that the output terminal of while LC oscillator 4 also connects current rectifying and wave filtering circuit 6 is the base stage of transistor T 2.The output terminal of shaping circuit 5 is that the input end that the output terminal of shaping integrated circuit U1 connects single-chip microcomputer 7 is " 11 " pin of single-chip microcomputer integrated circuit U3, and the output terminal of current rectifying and wave filtering circuit 6 is " 2 " pin that the collector of transistor T 3 meets single-chip microcomputer integrated circuit U3.The output terminal of single-chip microcomputer 7 is that " 17 " pin of single-chip microcomputer integrated circuit U3 connects computer USB interface.The computer expert crosses another USB interface and connects the printer USB interface.
In reality with t
FmCentered by, variation all can in positive and negative 10ms a period of time.Δ t=1ms in the embodiment of the invention, V '=Δ V
m-Δ V
Tvm+n Δ tMiddle n=16.
Fig. 4, the 5th, the test result of 1.0 yuans of coins testing.Voltage magnitude changes the AC impedance in fact reacted coin among Fig. 5, so represent the variation of voltage magnitude variation with resistance ρ, ∑ Δ f=3795Hz wherein, Δ f
m=265Hz, t
Fm=17ms; Δ V
m=167 Ω, t
Vm=7ms and V '=18 Ω.
Claims (1)
1. the dynamic electromagnetic signature method of testing of coin, lay a test coil respectively in both sides, coin road, the series connection of two coils links to each other or in parallel linking to each other, two output lines link to each other with the input end of a LC oscillatory circuit, after entering, coin make the shake frequency of alternating signal and the amplitude of pinane circuit of LC that corresponding the variation taken place, this variation is corresponding with the electromagnetic signature of coin, it is characterized in that: the first, coin is entered test coil up to withdrawing from test coil, frequency and the changes in amplitude process record of LC oscillatory circuit alternating signal get off, and show, store, print this change procedure; The second, measure the maximum variable quantity △ of LC oscillatory circuit alternating signal frequency f
m, and can measure the time point t of this maximum variable quantity
FmAnd with t
FmCentered by, change and ∑ △ f in positive and negative 5-30ms a period of time; The 3rd, not only can measure the maximum variable quantity △ of LC oscillatory circuit alternating signal amplitude V
m, and can measure the time point t of this maximum variable quantity
VmAnd amplitude fading rate V'; According to the data of measuring the true and false of coin judged;
The dynamic electromagnetic signature test macro of coin is made up of signal acquisition circuit, signal processing circuit and computer, and signal acquisition circuit comprises test coil L1, L2, the LC oscillatory circuit; Signal processing circuit comprises shaping circuit, current rectifying and wave filtering circuit and single-chip microcomputer;
When coin does not enter test coil, the frequency of single-chip microcomputer test LC oscillatory circuit, and the frequency f of shaping circuit output
0With the amplitude of LC oscillatory circuit alternating signal, and the voltage V of current rectifying and wave filtering circuit output
0, reflected when coin does not enter electromagnetic field the original state of LC oscillatory circuit;
After coin entered test coil, single-chip microcomputer was opened wave-number counter, after the △ t time, closed the wave number register, read the wave number f in the △ t time
1, and the magnitude of voltage V of test current rectifying and wave filtering circuit
1Open the wave number register again, close the wave number register after the △ t time again, measure f
2And V
2, withdraw from test coil up to coin;
Calculate: △ f
i=f
i-f
of
iRefer to the wave number in certain △ t time;
△ V
i=V
i-V
oV
iThe magnitude of voltage that refers to current rectifying and wave filtering circuit in certain △ t time;
Find out △ f
iMiddle maximal value △ f
mCorresponding time point t with it
Fm, calculate with t
FmCentered by, change and ∑ △ f in positive and negative 10ms a period of time; Find out △ V
iIn maximal value △ V
mCorresponding time point t with it
VmCalculate the attenuation rate V'=△ V of the voltage V of current rectifying and wave filtering circuit
m-△ V
Tvm+n △ t
Each genuine note is corresponding one group of dynamic electromagnetic signature parameter, that is: △ f all
m, t
Fm, variation and ∑ △ f, △ V
m, t
VmAnd V', the electromagnetic signature parameter of each genuine note of every suit coin is stored in the single-chip microcomputer respectively by value of money; Measure one group of electromagnetic signature parameter of one piece of coin when single-chip microcomputer after, just this group parameter is compared with the electromagnetic signature parameter of genuine note in the internal memory; When the feature of this group electromagnetic signature parameter and a certain genuine note is close, wherein consider certain error, it is genuine note that single-chip microcomputer is just declared this piece coin, and definite its value of money; As all not being inconsistent with the genuine note feature of depositing, then sentence it as counterfeit money.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010298471.7A CN102446375B (en) | 2010-09-30 | 2010-09-30 | Coin dynamic electromagnetic characteristic test method and system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010298471.7A CN102446375B (en) | 2010-09-30 | 2010-09-30 | Coin dynamic electromagnetic characteristic test method and system |
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|---|---|
| CN102446375A CN102446375A (en) | 2012-05-09 |
| CN102446375B true CN102446375B (en) | 2013-08-21 |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102831691A (en) * | 2012-08-21 | 2012-12-19 | 上海海事大学 | Electromagnetic sensor-based coin sorting and counterfeit detecting device and sorting and counterfeit detecting method thereof |
| CN103679912A (en) * | 2012-09-20 | 2014-03-26 | 吉鸿电子股份有限公司 | Pipeline coin detection method |
| CN107610328A (en) * | 2016-07-12 | 2018-01-19 | 湖南中吉科技有限责任公司 | One kind moves back coin detecting system and moves back coin detection method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1346480A (en) * | 1999-03-30 | 2002-04-24 | 千禧企业有限公司 | Dual coil coin identifier |
| CN1445726A (en) * | 2003-05-08 | 2003-10-01 | 南京大学 | Coin recognizer |
| CN1488065A (en) * | 2001-08-27 | 2004-04-07 | 高见g电脑科技股份有限公司 | Device and method for identifying metal body |
| CN101819693A (en) * | 2010-04-23 | 2010-09-01 | 南开大学 | Intelligent coin currency value detecting system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4499964B2 (en) * | 2001-09-12 | 2010-07-14 | 日本金銭機械株式会社 | Coin identification device |
-
2010
- 2010-09-30 CN CN201010298471.7A patent/CN102446375B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1346480A (en) * | 1999-03-30 | 2002-04-24 | 千禧企业有限公司 | Dual coil coin identifier |
| CN1488065A (en) * | 2001-08-27 | 2004-04-07 | 高见g电脑科技股份有限公司 | Device and method for identifying metal body |
| CN1445726A (en) * | 2003-05-08 | 2003-10-01 | 南京大学 | Coin recognizer |
| CN101819693A (en) * | 2010-04-23 | 2010-09-01 | 南开大学 | Intelligent coin currency value detecting system |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2003-85612A 2003.03.20 |
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| CN102446375A (en) | 2012-05-09 |
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