CN102426330A - LED testing device and LED testing method - Google Patents
LED testing device and LED testing method Download PDFInfo
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- CN102426330A CN102426330A CN2011103359972A CN201110335997A CN102426330A CN 102426330 A CN102426330 A CN 102426330A CN 2011103359972 A CN2011103359972 A CN 2011103359972A CN 201110335997 A CN201110335997 A CN 201110335997A CN 102426330 A CN102426330 A CN 102426330A
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Abstract
The invention discloses an LED testing device which comprises a photoelectric test analyzer host, an integrating sphere which is connected with the photoelectric test analyzer host, and a power supply which is connected with the photoelectric test analyzer host. The integrating sphere is provided with a positive electrode and a negative electrode. The positive electrode of the integrating sphere is connected with a positive electrode of the power supply, and the negative electrode of the integrating sphere is connected with a negative electrode of the power supply. The integrating sphere is provided with the positive electrode and the negative electrode, the positive electrode of the integrating sphere is connected with the positive electrode of the power supply, thus there is no need to use a clamp with a positive electrode and a negative electrode, the testing device is simplified, and testing efficiency is raised.
Description
Technical field
The present invention relates to a kind of LED proving installation and method, particularly a kind of LED proving installation and method with improvement structure.
Background technology
Illuminating high-capacity LED (Light Emitting Diode, light emitting diode) is a kind of new type light source, and the structure that electrode is positioned at the lamp body both sides is a kind of high-capacity LED structure of main flow.In the manufacture process of high power illumination, photoelectric parameter testing is one important operation, and the photoelectric comprehensive analyser that main at present employing contains integrating sphere is tested.Existing main flow testing scheme is following: the integrating sphere outside has an aperture, and test macro is equipped with a special test fixture that matches with aperture, and positive and negative two electrodes are arranged on this test fixture; The positive and negative electrode that connects the test macro power supply respectively; During test high-capacity LED is put into anchor clamps, the positive pole of LED connects the positive pole of test fixture, and the LED negative pole connects the negative pole of test fixture; To be placed with the aperture center of the grip alignment integrating sphere of LED then; Make the LED light-emitting area face the centre of sphere, test fixture is taken off from integrating sphere after read test data and bin number, and then take off LED from test fixture.
Existing test step is tested 1 LEDs and is needed through 6 steps: get LED and with the LED anchor clamps of packing into; With grip alignment integrating sphere aperture center, read LED photoelectric parameter and bin number, anchor clamps are taken off from integrating sphere; From anchor clamps, take out LED, LED is put into corresponding bin number magazine.Obvious existing test step step is many, and testing efficiency is low.
Therefore, need a kind of new technical scheme to address the above problem.
Summary of the invention
To above-mentioned existing in prior technology problem and shortage, the purpose of this invention is to provide a kind of LED proving installation of the LED of raising testing efficiency and use the LED method of testing of this LED proving installation.
For realizing above-mentioned purpose, LED proving installation of the present invention can adopt following technical scheme:
A kind of LED proving installation; Comprise photoelectricity test analyser main frame, the integrating sphere that links to each other with photoelectricity test analyser main frame and the power supply that links to each other with photoelectricity test analyser main frame equally; Said integrating sphere is provided with positive and negative electrode; And the positive electrode on this integrating sphere links to each other with the positive electrode of power supply, and the negative electrode on the integrating sphere links to each other with the negative electrode of power supply, and said integrating sphere is provided with aperture.
The present invention is compared with prior art: said integrating sphere is provided with positive and negative electrode, and the positive electrode on this integrating sphere links to each other with the positive electrode of power supply, thereby need not to use the anchor clamps with both positive and negative polarity, has simplified proving installation, has improved testing efficiency.
For realizing above-mentioned purpose, LED point powder method of the present invention can adopt following technical scheme:
A kind of LED method of testing of using the LED proving installation, this method may further comprise the steps:
(1), get LED and LED be close to the integrating sphere aperture, and the positive electrode of LED is linked to each other with the positive electrode of integrating sphere, the negative electrode of LED links to each other with the negative electrode of integrating sphere;
(2), read LED photoelectric parameter and bin number;
(3), LED is put into corresponding bin number magazine.
The present invention is compared with prior art: the positive electrode with LED when LED is close to the integrating sphere aperture links to each other with the positive electrode of integrating sphere; The negative electrode of LED links to each other with the negative electrode of integrating sphere; Thereby the positive and negative electrode of LED is connected with the positive and negative electrode of power supply; Thereby need not to re-use the anchor clamps gripping that is connected with power supply, saved operation steps, improved testing efficiency.
Description of drawings
Fig. 1 is the structural representation of LED proving installation of the present invention.
Embodiment
Below in conjunction with accompanying drawing and embodiment; Further illustrate the present invention; Should understand following embodiment only be used to the present invention is described and be not used in the restriction scope of the present invention; After having read the present invention, those skilled in the art all fall within the application's accompanying claims institute restricted portion to the modification of the various equivalent form of values of the present invention.
Please combine shown in Figure 1; The present invention discloses a kind of LED proving installation; Comprise photoelectricity test analyser main frame, the integrating sphere that links to each other with photoelectricity test analyser main frame and the power supply that links to each other with photoelectricity test analyser main frame equally, said integrating sphere is provided with positive and negative electrode, and the positive electrode on this integrating sphere links to each other with the positive electrode of power supply; Negative electrode on the integrating sphere links to each other with the negative electrode of power supply, and said integrating sphere is provided with aperture.
Use the LED method of testing of said LED proving installation may further comprise the steps:
(1), get LED and LED be close to the integrating sphere aperture, and the positive electrode of LED is linked to each other with the positive electrode of integrating sphere, the negative electrode of LED links to each other with the negative electrode of integrating sphere;
(2), read LED photoelectric parameter and bin number;
(3), LED is put into corresponding bin number magazine.
The present invention links to each other the positive electrode of LED when LED is close to the integrating sphere aperture with the positive electrode of integrating sphere; The negative electrode of LED links to each other with the negative electrode of integrating sphere; Thereby the positive and negative electrode of LED is connected with the positive and negative electrode of power supply; Thereby need not to re-use the anchor clamps gripping LED that is connected with power supply of available technology adopting, saved operation steps, improved testing efficiency.
Claims (2)
1. LED proving installation; It is characterized in that: comprise photoelectricity test analyser main frame, the integrating sphere that links to each other with photoelectricity test analyser main frame and the power supply that links to each other with photoelectricity test analyser main frame equally; Said integrating sphere is provided with positive and negative electrode; And the positive electrode on this integrating sphere links to each other with the positive electrode of power supply, and the negative electrode on the integrating sphere links to each other with the negative electrode of power supply, and said integrating sphere is provided with aperture.
2. one kind is used the LED method of testing of LED proving installation according to claim 1, and it is characterized in that: this method may further comprise the steps:
(1), get LED and LED be close to the integrating sphere aperture, and the positive electrode of LED is linked to each other with the positive electrode of integrating sphere, the negative electrode of LED links to each other with the negative electrode of integrating sphere;
(2), read LED photoelectric parameter and bin number;
(3), LED is put into corresponding bin number magazine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103359972A CN102426330A (en) | 2011-10-28 | 2011-10-28 | LED testing device and LED testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103359972A CN102426330A (en) | 2011-10-28 | 2011-10-28 | LED testing device and LED testing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102426330A true CN102426330A (en) | 2012-04-25 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011103359972A Pending CN102426330A (en) | 2011-10-28 | 2011-10-28 | LED testing device and LED testing method |
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| CN (1) | CN102426330A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102768346A (en) * | 2012-07-25 | 2012-11-07 | 台龙电子（昆山）有限公司 | Lamp testing jig for LED lamps of integral panel |
| CN102890249A (en) * | 2012-10-18 | 2013-01-23 | 桂林电子科技大学 | Accelerated test method of LED (light emitting diode) lighting lamp based on subsystem decomposition |
| CN104459569A (en) * | 2014-12-16 | 2015-03-25 | 常熟卓辉光电科技股份有限公司 | Led testing device |
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| CN201184839Y (en) * | 2008-04-28 | 2009-01-21 | 广州市光机电技术研究院 | Apparatus for detecting synthesis luminous characteristic of LED light source |
| CN201311322Y (en) * | 2008-09-28 | 2009-09-16 | 上海半导体照明工程技术研究中心 | Measurement system of LED instantaneous luminous flux driven by PWM |
| CN201413193Y (en) * | 2009-06-10 | 2010-02-24 | 北京领先空间商用色彩研究中心 | Detector of color measuring spectrometer |
| CN201429464Y (en) * | 2009-04-09 | 2010-03-24 | 张九六 | Automatic test spectrometer for united LED |
| CN101949989A (en) * | 2010-09-17 | 2011-01-19 | 上海北京大学微电子研究院 | LED leakage current test method under different wavelengths |
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- 2011-10-28 CN CN2011103359972A patent/CN102426330A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1959366A (en) * | 2006-11-30 | 2007-05-09 | 复旦大学 | Luminous flux measurement device of using standard light source in narrow beam for LED, and testing method |
| CN201184839Y (en) * | 2008-04-28 | 2009-01-21 | 广州市光机电技术研究院 | Apparatus for detecting synthesis luminous characteristic of LED light source |
| CN201311322Y (en) * | 2008-09-28 | 2009-09-16 | 上海半导体照明工程技术研究中心 | Measurement system of LED instantaneous luminous flux driven by PWM |
| CN201429464Y (en) * | 2009-04-09 | 2010-03-24 | 张九六 | Automatic test spectrometer for united LED |
| CN201413193Y (en) * | 2009-06-10 | 2010-02-24 | 北京领先空间商用色彩研究中心 | Detector of color measuring spectrometer |
| CN101949989A (en) * | 2010-09-17 | 2011-01-19 | 上海北京大学微电子研究院 | LED leakage current test method under different wavelengths |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102768346A (en) * | 2012-07-25 | 2012-11-07 | 台龙电子（昆山）有限公司 | Lamp testing jig for LED lamps of integral panel |
| CN102890249A (en) * | 2012-10-18 | 2013-01-23 | 桂林电子科技大学 | Accelerated test method of LED (light emitting diode) lighting lamp based on subsystem decomposition |
| CN104459569A (en) * | 2014-12-16 | 2015-03-25 | 常熟卓辉光电科技股份有限公司 | Led testing device |
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Application publication date: 20120425 |