CN102385030B - Device for testing dark resistance of solar cell - Google Patents
Device for testing dark resistance of solar cell Download PDFInfo
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- CN102385030B CN102385030B CN2011102856234A CN201110285623A CN102385030B CN 102385030 B CN102385030 B CN 102385030B CN 2011102856234 A CN2011102856234 A CN 2011102856234A CN 201110285623 A CN201110285623 A CN 201110285623A CN 102385030 B CN102385030 B CN 102385030B
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The invention relates to a device for testing the dark resistance of a solar cell. The device belongs to the technical field of the solar cell and is used for testing the dark resistance of a small-sized solar cell, and further solves the problems of complex structure, untight light shading and the like of the existing test device. The device for testing the dark resistance of the solar cell is technically characterized by comprising a dark box composed of a box body and a box cover, wherein a stepped chamber is arranged in the box body; the solar cell is arranged within the middle layer of the stepped chamber; a test probe is mounted on the box cover; and one end of the probe is in contact with the electrode of the solar cell, while the other end thereof is connected to a test instrumentso as to measure the dark resistance value of the solar cell. The device is simple in structure, good in tightness, and light tight; besides, the device is suitable for testing the solar cells different in size and shape.
Description
Technical field
The present invention relates to a kind of solar cell test equipment, belong to technical field of solar batteries, be particularly useful for testing the dark resistance of small size solar cell.
Background technology
Semiconductor is unglazed according to the time be dark attitude, this moment, material had dark conductance, was bright attitude when illumination is arranged, have bright electricity leads this moment, if give the semiconductor material impressed voltage, is commonly referred to dark current and light current., photocurrent is that the difference of light current and dark current claims.Silicon-based film solar cells dark conductance size is determined by carrier density and mobility.Dark conductance is more little, illustrate that battery defect is more few, and photosensitivity is more good, and therefore, for hull cell, dark conductance is the smaller the better, and the low light level of hull cell is also more good.The general dark resistance that adopts is measured the replacement dark conductance, weighs the low light level of battery with dark resistance numerical value.The equivalent electrical circuit (see figure 10) of solar cell, meets diode D1 and a resistance R p in parallel at constant current source Iph, meets a resistance in series Rs again.The diode forward conducting resistance is R=0, and the diode reverse off-resistances is infinitely great.Resistance in the dark test ideal conditions is current source light Iph=0.Under the situation of unglazed photograph, connect Rs battery one end with the positive test pencil of measurement instrument, negative test pencil connects the battery other end, records dark resistance.At present, the dark conductance equipment of measuring the large format hull cell generally adopts special-purpose checkout equipment, keithley617 model device as KEITHLEY company, in shading vacuum shielding chamber, use keithley617 type high resistant tester to measure dark resistance, this equipment price height, volume is big, need under the vacuum shielding environment, detect, be not suitable for detecting the solar battery sheet of small size, large quantities of quantity.Chinese patent 200980114442.6 discloses a kind of checkout equipment of solar cell, be that solar cell is placed on the transparent panel of upper surface in darkroom, the camera that is arranged in the darkroom is taken solar cell, when taking, switch on to solar cell, make battery carry out electroluminescence (EL), find out the zone that there is defective in solar cell.Chinese patent 201020166284.9 discloses the dark box solar cell of a kind of improved movement detector, this detector is to install to focus on photoconductive device in power shading blanket, the resistance power consumption of each battery sheet in the dark box is reduced within the permission power consumption, finds out the battery sheet that has defective more accurately.The checkout equipment that above-mentioned two patents adopt all is will be in magazine to find out the defective of battery to battery by illumination, is not separately for detection of the dark resistance value of battery.At present, the dark resistance checkout equipment of small size battery sheet generally is that five faces are in the light, one side is action pane, communicate with the outside, the test one side of battery sheet can not be put into magazine fully when therefore existing because of test, make magazine tight inadequately, light leakage phenomenon is arranged and cause test number instability, rework rate height.
Summary of the invention:
The present invention is directed to the current high precision simple machine that does not have to test separately the solar cell dark resistance, or simple and easy, technical matterss such as shading imprecision, design a kind of certain technical standard that satisfies, lucifuge is fit to test minitablets solar cell, to obtain the equipment of dark resistance numerical value accurately fully.
In order to realize above task, technical scheme of the present invention is: a kind of equipment of testing the solar cell dark resistance, comprise the magazine that is made of box body and lid, it is characterized in that being provided with in the described box body three layers of stepped appearance chamber, solar cell is placed in the middle layer of described stepped appearance chamber; On the described lid test probe is housed, lid is pressed together on the darkroom that constitutes sealing on the box body, and test probe contacts with the electrode of solar cell, records the dark resistance data transmission by test probe and gives test instrumentation.
The pin hole of installation testing probe is arranged on the lid, and test probe is a rubber-like probe, contacts with the positive and negative electrode of solar cell.
Step-like three layers of chamber are followed successively by hollow out layer, placed layer and embeding layer from the bottom to top, and solar cell to be measured is placed on the said placed layer.
Be respectively equipped with on lid and the box body and embed platform and embeding layer, by embedding the platform embedding tightly in embeding layer (2-3), constitute the lighttight darkroom of sealing.
The middle layer of stepped appearance chamber is placed layer, which is provided with the groove that picks and places solar cell.In order to be fit to detect the solar cell of different shape, the placed layer of stepped appearance chamber can be designed to rectangle, circle, polygon, abnormity or other irregular shapes.Simultaneously, for the ease of processing, the hollow out layer in the stepped appearance chamber can be designed to regular shapes such as circle or rectangle.
The stepped appearance chamber can also be designed to by dismountable mold insert structure, and the shape and size adjustable size of the placed layer of stepped appearance chamber mold insert.Embedding platform on the lid also is dismountable, and the mold insert respective outer side edges in the embedding platform on the lid and the box body is one.For the solar battery sheet of different size specification, only need to change the interior stepped appearance chamber mold insert of box body and the embedding platform on the lid.
Good effect is: the device structure of the test solar cell dark resistance of the present invention's design is simple, good airproof performance, light tight, be suitable for testing different size, difform solar cell, especially be applicable to and test the small size solar cell on a large scale, test simple, convenient, fast, the production efficiency height.For the solar cell of different size specification, the embedding platform and the stepped appearance chamber mold insert that only need to change on the lid get final product, and do not need integral replacing, and be easy to use, reduces material usage, saves cost.
Description of drawings:
Fig. 1: structural representation of the present invention.
Fig. 2: the structural representation of box body 2 among Fig. 1.
Fig. 3: the structural representation of lid 3 among Fig. 1.
The synoptic diagram of Fig. 4: embodiment one.
The synoptic diagram of Fig. 5: embodiment two.
Fig. 6: the structural representation of the embedding platform 3 ' among Fig. 5 on the lid 3.
Fig. 7: the structural representation of the stepped appearance chamber mold insert 2 ' of box body 2 among Fig. 5.
The synoptic diagram of Fig. 8: embodiment three.
Fig. 9: the vertical view of the box body 2 among Fig. 8.
Figure 10: the equivalent circuit diagram of solar cell.
Among the figure: 1 is solar cell, and 2 is box body, and 2 ' is stepped appearance chamber mold insert, and 3 is lid, and 3 ' is the dismountable embedding platform on the lid, and 4 is test probe, and 5 for connecting rotating shaft, and 6 is test instrumentation.
Embodiment:
The testing apparatus of solar cell dark resistance, comprise the magazine that is constituted by box body 2 and lid 3, be provided with three layers of stepped appearance chamber in the box body 2, this size of three layers increases from bottom to up gradually, bottom is hollow out layer 2-1, prevent solar cell surface directly and the bottom surface large tracts of land contact friction of box body, produce and scratch, the middle layer is battery sheet placed layer 2-2, this sheaf space is of a size of puts into the battery chip size, the upper strata is lid embeding layer 2-3, when lid 3 and box body 2 pressings, makes test probe 4 positions just in time contact with the positive and negative electrode of solar cell 1, have through hole on the lid, installation testing probe 4 in the through hole, the axle sleeve of probe reaches the outside surface of lid, is connected with test instrumentation 6 joints, probe is positioned at the inside of lid 3, be used for contacting the electrode of the inner solar battery sheet of placing, when lid is pressed together on the box body, constitute sealing, lighttight darkroom.During measurement, probe touches the test electrode of solar battery sheet, directly measures the dark resistance value by test instrumentation.
Embodiment one:
See Fig. 1, Fig. 2, the dark resistance checkout equipment is made up of box body 2, lid 3, test probe 4 and connection rotating shaft 5.Test probe 4 is rubber-like probes, be fixedly mounted on the lid 3, probe 4-2 is in lid 3 inside, and insert in the probe axle sleeve 4-1, probe axle sleeve 4-1 also reaches the outside, clamp the back by the chuck of multimeter 6 and measure dark resistance, connecting rotating shaft 5 links together by the axis hole 3-1 of lid 3 and the axis hole 2-5 of box body 2, and can rotate and make lid and box body be buckled into one, form the light tight magazine of a complete closed, the darkroom of present embodiment design is a rectangle box, the lid and the box body that are connected by rotating shaft constitute, be provided with a square chamber in the box body, box body 2 comprises three layers of step trough, be followed successively by hollow out layer 2-1 from top to bottom, placed layer 2-2 and embeding layer 2-3, the consistent size of placed layer 2-2 size and institute's shoot the sun energy battery sheet 1, at the long limit of placed layer 2-2 one side be convenient in addition the to take groove 2-4 of battery sheet 1, the platform of embedding 3-2 is arranged on the lid 3, close lid back embedding platform 3-2 and embeding layer 2-3 and fit in one, guarantee that probe 4-2 just in time is pressed in the electrode position of solar battery sheet 1, the other end of probe is connected with test instrumentation, during measurement, probe touches the test electrode of solar battery sheet, detects the dark resistance value by test instrumentation.
Embodiment two:
Embodiment three:
Embodiment is with embodiment 1, difference is that present embodiment is designed to hexagon with the placed layer 2-2 in the stepped appearance chamber of box body 2, be placed with the hexagon solar cell on it, for the ease of picking and placeing solar battery sheet 1, at the groove 2-4 that the long side direction of box body 2 arranges, the hollow out layer 2-1 in the stepped appearance chamber is designed to the easily circle of processing.Lid 3 is buckled into one with box body 2, and probe 4-2 contacts with the positive and negative electrode of solar battery sheet 1, detects the dark resistance value by test instrumentation.
The present invention also can test the dark resistance of circle, abnormity or other erose solar battery sheets 1, the stepped appearance chamber of box body and the embedding platform of lid also can be designed to the mold insert formula structure with embodiment two, to be applicable to the dark resistance of the solar cell of testing difformity and different size, the hollow out layer 2-1 of stepped appearance chamber can be designed to regular shapes such as easy circle of processing or rectangle.
Claims (11)
1. the testing apparatus of a solar cell dark resistance comprises the magazine that is made of box body (2) and lid (3), it is characterized in that being provided with the stepped appearance chamber in the described box body (2), and solar cell (1) is placed in the middle layer of described stepped appearance chamber; Test probe (4) is housed on the described lid, and said darkroom is sealed to form by lid (3) and box body (2); One end of test probe (4) contacts with the electrode of solar cell (1), and the other end of test probe (4) connects test instrumentation (6), measures solar cell (1) dark resistance value.
2. the testing apparatus of solar cell dark resistance according to claim 1 is characterized in that having on the described lid (3) through hole of installation testing probe (4), and this test probe (4) contacts with the positive and negative electrode of solar cell (1).
3. the testing apparatus of solar cell dark resistance according to claim 1, it is characterized in that establishing in the described box body (2) three layers of stepped appearance chambers, be followed successively by hollow out layer (2-1), placed layer (2-2) and embeding layer (2-3) from bottom to top, at placed layer (2-2) solar cell to be measured (1) arranged.
4. the testing apparatus of solar cell dark resistance according to claim 3, it is characterized in that being respectively equipped with on described lid (3) and the box body (2) embedding platform (3-2) and embeding layer (2-3), by embedding platform (3-2) embedding tightly in embeding layer (2-3), constitute the lighttight darkroom of sealing.
5. according to the testing apparatus of claim 1 or 3 described solar cell dark resistances, the middle layer that it is characterized in that described stepped appearance chamber is placed layer (2-2), which is provided with groove (2-4), and this placed layer is identical with solar cell to be measured (1) shape.
6. the testing apparatus of solar cell dark resistance according to claim 5 is characterized in that the stepped appearance chamber in the described box body is dismountable mold insert structure, the shape and size adjustable size of placed layer (2-2) in the middle of it.
7. the testing apparatus of solar cell dark resistance according to claim 6 is characterized in that the embedding platform (3-2) on the described lid (3) is dismountable, and the mold insert respective outer side edges in this embedding platform (3-2) and the box body is one.
8. the testing apparatus of solar cell dark resistance according to claim 1 is characterized in that described test probe (4) has axle sleeve (4-1), is installed in the through hole of cavity lid (3); One end of probe is positioned at box body, is connected with the positive and negative electrode of solar cell, and the other end is positioned at the lid outside surface, is connected with test instrumentation.
9. the testing apparatus of solar cell dark resistance according to claim 6 is characterized in that the placed layer (2-2) in the described stepped appearance chamber is rectangle, circle or special-shaped.
10. the testing apparatus of solar cell dark resistance according to claim 6 is characterized in that the rounded or rectangle of hollow out layer (2-1) in the described stepped appearance chamber.
11. the testing apparatus of solar cell dark resistance according to claim 6 is characterized in that the placed layer (2-2) in the described stepped appearance chamber is polygon.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN2011102856234A CN102385030B (en) | 2011-09-23 | 2011-09-23 | Device for testing dark resistance of solar cell |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2011102856234A CN102385030B (en) | 2011-09-23 | 2011-09-23 | Device for testing dark resistance of solar cell |
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| CN102385030A CN102385030A (en) | 2012-03-21 |
| CN102385030B true CN102385030B (en) | 2013-10-02 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104375077A (en) * | 2014-11-13 | 2015-02-25 | 歌尔声学股份有限公司 | Functional circuit test (FCT) tool, system and method |
| CN107783045A (en) * | 2016-08-30 | 2018-03-09 | 神讯电脑(昆山)有限公司 | Battery charging and discharging test device |
| CN107238804B (en) * | 2017-07-21 | 2024-01-05 | 无锡领声科技有限公司 | Temperature-controllable battery ultrasonic test box and test system |
| CN108519515A (en) * | 2018-03-30 | 2018-09-11 | 蚌埠国显科技有限公司 | Impedance detection device after a kind of LCD points silver paste |
| CN113067549A (en) * | 2021-03-26 | 2021-07-02 | 福建师范大学 | Physical characteristic comprehensive test system for electromagnetic and optical integrated test |
| CN116366004B (en) * | 2023-05-30 | 2023-09-15 | 国家电投集团云南国际电力投资有限公司 | Fault detection method, device and equipment of photovoltaic power generation system and storage medium |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN200968978Y (en) * | 2006-10-24 | 2007-10-31 | 曹文瑞 | Movable dark box solar cell detector |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2001345472A (en) * | 2000-03-29 | 2001-12-14 | Canon Inc | Method and equipment for inspecting solar cell module, and its manufacturing method, method and equipment for inspecting photovoltaic power generation system, and equipment for measuring insulation resistance and withstand voltage tester |
| JP2003028916A (en) * | 2001-07-16 | 2003-01-29 | Hirano Sangyo:Kk | Characteristics measuring instrument for solar battery |
| WO2009129030A2 (en) * | 2008-04-14 | 2009-10-22 | Applied Materials, Inc. | Solar parametric testing module and processes |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN200968978Y (en) * | 2006-10-24 | 2007-10-31 | 曹文瑞 | Movable dark box solar cell detector |
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| JP特开2003-28916A 2003.01.29 |
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